Intermittent power-on endurance test device for high-voltage silicon stack

Abstract

The utility model relates to a high voltage silicon stack intermittent power-on endurance test device, which comprises a human-computer interface, a controller, a temperature module, a constant current source module and a silicon stack mounting seat, and is characterized in that the controller is electrically connected with the human-computer interface and the constant current source module, the constant current source module is electrically connected with the silicon stack mounting seat, the temperature module is electrically connected with the controller, and the constant current source module is electrically connected with the silicon stack mounting seat. The high-voltage silicon stack is mounted on the silicon stack mounting seat, and the temperature module is connected to the high-voltage silicon stack through thermocouple monitoring. The device has the advantages that the controller is controlled by a PLC program, and automation of the control process is achieved; a human-computer interface is adopted, so that parameter setting is convenient, data are digitized, and reading, recording and storage are facilitated; the constant current source provides stable test current to ensure that test parameters are reliable and accurate; the sensing capability of the temperature module to the junction temperature of the chip and the control of temperature measurement, the lowest temperature and the highest temperature are stable; the silicon stack mounting seat is reasonable in structural design, ensures that the lead of the high-voltage silicon stack is quickly clamped and disassembled and is stably clamped, and prevents the problem of virtual connection in a test.

Description

TECHNICAL FIELD

[0001] The utility model relates to a semiconductor chip testing equipment field, concretely relates to a high pressure silicon pile intermittent energization endurance test device. BACKGROUND

[0002] High pressure silicon pile intermittent energization endurance test is a kind of test for evaluating the long-term stability and reliability of high pressure silicon pile under the condition of repeated on-off electricity.This test is crucial to ensure the performance of high pressure silicon pile in practical applications, especially in high-voltage DC power supply, electric welding machine, electrophoresis equipment and other applications.

[0003] At present, there is no perfect test related device, according to the current development of high pressure silicon pile, iteration, and higher use requirements, a kind of high pressure silicon pile intermittent energization endurance test device is developed, through the device test, the quality of the chip of high pressure silicon pile, long service life, enriches the parameter data. UTILITY MODEL CONTENT

[0004] In order to solve the above technical problems, the utility model provides a kind of high pressure silicon pile intermittent energization endurance test device, clever design, reasonable and compact structure, satisfy test demand.

[0005] The technical scheme of the utility model:

[0006] High pressure silicon pile intermittent energization endurance test device, it includes human-computer interface, controller, temperature module, constant current source module, silicon pile mounting seat, controller electric connection human-computer interface, controller electric connection constant current source module, constant current source module electric connection silicon pile mounting seat, temperature module electric connection controller, high pressure silicon pile is installed on the top of silicon pile mounting seat, temperature module is connected on the top of high pressure silicon pile through thermocouple monitoring.

[0007] The temperature module includes thermometer and thermocouple, the thermometer is electrically connected with the thermocouple, and the thermocouple is fixed on the outside of the chip plastic package of the high pressure silicon pile by binding tape.

[0008] The constant current source module is a constant current source module that stably provides more than 10 times the rated current of the high pressure silicon pile.The constant current source module is a device that outputs a constant current, and the current size is adjustable.

[0009] The silicon pile mounting seat comprises an insulating base, electrode columns, a sliding sleeve, a spring, an upper clamping block, a lower clamping block and a screw, the insulating base is provided with at least two electrode columns, each electrode column is provided with a semicircular groove near one side of the upper end, the electrode column at the upper end of the semicircular groove forms the upper clamping block, the lower clamping block is slidably arranged in the semicircular groove and has a gap between the upper end of the lower clamping block and the inner side of the upper end of the semicircular groove, and the outer side of the lower clamping block is provided with a threaded hole; the sliding sleeve is hollow in the middle and is closed at the upper end, the sliding sleeve is provided with a semicircular notch at one side in the middle, the semicircular notch is communicated with the hollow hole, and the sliding sleeve is provided with a circular hole at the position below the semicircular notch; the sliding sleeve is slidably arranged on the upper end of the electrode column, and a spring is arranged between the bottom of the hollow hole of the sliding sleeve and the upper end of the electrode column; and the screw is screwed into the threaded hole of the lower clamping block through the circular hole of the sliding sleeve.

[0010] The upper and lower heights of the semicircular groove are greater than the upper and lower heights of the semicircular notch; after the lower clamping block is fixed with the sliding sleeve through the screw, the upper end of the lower clamping block is flush with the bottom of the semicircular notch.

[0011] The upper end of the electrode column is provided with a circular groove in the middle for positioning and clamping the lower end of the spring.

[0012] The utility model discloses the advantages are:

[0013] 1, the controller adopts PLC program control, realizes the automation of control process;

[0014] 2, HMI man -machine interface, parameter setting is convenient, data digitization is convenient for reading, record and save;

[0015] 3, the constant current source provides stable test current, guarantees the reliable and accurate test parameter;

[0016] 4, temperature module, the perception ability of chip junction temperature, and the control precision of temperature measurement and lowest temperature, highest temperature;

[0017] 5, the silicon pile mounting seat structure design is reasonable, guarantees the lead of high -voltage silicon pile and can be quickly clamped, disassembles, and clamps stable, effectively prevents the problem of virtual connection in the test. ACCURACY

[0018] Fig. 1 It is the system schematic diagram of the utility model.

[0019] Fig. 2 It is the schematic diagram of the silicon pile mounting seat of the utility model.

[0020] Fig. 3 It is the upper end cross section schematic diagram of the electrode column of the silicon pile mounting seat of the utility model. CONCRETE IMPLEMENTATION

[0021] Refer to the attached Figs. 1-3, the high-voltage silicon stack intermittent power endurance test device, it includes human-computer interface 1, controller 2, temperature module 3, constant current source module 4, silicon stack mounting seat 5, controller 2 is electrically connected human-computer interface 1, controller 2 is electrically connected constant current source module 4, constant current source module 4 is electrically connected silicon stack mounting seat 5, temperature module 3 is electrically connected controller 2, high-voltage silicon stack 6 is installed on silicon stack mounting seat 5, temperature module 3 is connected on high-voltage silicon stack 6 by thermocouple 32 monitoring.

[0022] Temperature module 3 includes thermometer 31, thermocouple 32, thermometer 31 is electrically connected thermocouple 32, thermocouple 32 is fixed on the outside of the chip plastic package of high-voltage silicon stack 6 by bundling belt.

[0023] Constant current source module 4 is the constant current source module 4 that stably provides the current of 10 times or more than the rated current of high-voltage silicon stack 6.

[0024] Silicon stack mounting seat 5 includes insulating base 51, electrode column 52, sliding sleeve 53, spring 54, upper clamping block 55, lower clamping block 56, screw 57, at least two electrode columns 52 are installed on the upper surface of insulating base 51, each electrode column 52 is provided with semicircular groove 521 near the upper end side, the upper end part of semicircular groove 521 forms upper clamping block 55, lower clamping block 56 is slidably located in semicircular groove 521, and the upper end of lower clamping block 56 has a certain gap with the inside of the upper end of semicircular groove 521, and the outside of lower clamping block 56 is designed with a threaded hole; sliding sleeve 53 is hollow in the middle and closed at the upper end, one semicircular notch 531 is formed in one side of the middle of sliding sleeve 53, and the semicircular notch 531 is communicated with the hollow hole, a circular hole is formed in the upper surface of sliding sleeve 53 below the semicircular notch, spring 54 is supported and installed between the bottom of the hollow hole of sliding sleeve 53 and the upper end of electrode column 52, and screw 57 is screwed into the threaded hole of lower clamping block 56 after passing through the circular hole of sliding sleeve 53.

[0025] The upper and lower heights of semicircular groove 521 are greater than the upper and lower heights of semicircular notch 531, and the upper end of lower clamping block 56 is flush with the bottom of semicircular notch 531 after being fixed with sliding sleeve 53 by screw 57.

[0026] The upper end of electrode column 52 is provided with a circular recess for positioning and clamping the lower end of spring 54.

[0027] The operation method of the high-voltage silicon stack 6 intermittent power endurance test device is adopted,

[0028] Step one, first, install the high-voltage silicon stack 6 to be measured on silicon stack mounting seat 5, and fix thermocouple 32 of temperature module 3 on the outside of the chip plastic package of high-voltage silicon stack 6 by bundling belt.

[0029] Step two, set parameters in human-computer interface 1:

[0030] Constant current source module 4 provides ≥ 10 times rated current to high voltage silicon stack 6;

[0031] Set room temperature as the lowest temperature; increase 110 DEG C on the basis of room temperature, and set as the maximum temperature;

[0032] When the temperature detected by thermocouple 32 reaches the maximum temperature, the constant current source output is closed until the temperature cools to room temperature, the constant current source output is closed, and the cycle is repeated, and the cycle number is set to 5000 times;

[0033] Step three, human-computer interface 1 clicks start test, human-computer interface 1 transmits instructions to controller 2, and controller 2 controls constant current source module 4 and temperature module 3 to work, and automatic test is carried out until the test is completed, and automatic stop is carried out.

[0034] In step three, once the high voltage silicon stack is short-circuited or broken under the action of high current, the high voltage silicon stack is unqualified, the high voltage silicon stack does not generate heat, once the temperature module monitors that the high voltage silicon stack does not generate temperature change in a cycle time, a signal is transmitted to the controller, the controller controls the cycle test to stop, and the controller controls the sound and light alarm to issue an alarm.

[0035] When the utility model is used,

[0036] 1, the controller adopts PLC program control, and automation is realized in the control process;

[0037] 2, HMI human-computer interface, parameter setting is convenient, data is digitized, and reading, recording and saving are facilitated;

[0038] 3, constant current source provides stable test current (900mA), and reliable and accurate test parameters are guaranteed;

[0039] 4, temperature module, the sensing ability of chip junction temperature, and the control precision of temperature measurement and the lowest temperature 20.0 DEG C, the highest temperature 130.0 DEG C;

[0040] The device uses the rated current value of more than 10 times to electrify the high-voltage silicon pile to make it heat, and the electrification heating starts from room temperature 20 DEG C to the surface temperature of (20 DEG C + 110 DEG C) 130 DEG C, and then the constant current source output is closed, and the natural cooling is carried out to 20 DEG C (1 cycle); 5000 cycles are carried out. After the above-mentioned 5000 times of large current impact, the 110 DEG C temperature difference changes, and the on-off test is repeated many times, so that the high-voltage silicon pile is ensured not to break down and not to short circuit. The high-voltage silicon pile intermittent electrification endurance test device belongs to a newly developed high-voltage silicon pile reliability test device and is domestically initiated for the first time. The utility model is mainly used for the reliability test of the high-voltage silicon pile, and an important physical index is added to the high-temperature resistance performance parameter of the high-voltage silicon pile.

Claims

1. A high-voltage silicon pile interrupter endurance test device, characterized by, It includes human-computer interface, controller, temperature module, constant current source module, silicon pile mounting seat, the controller is electrically connected with the human-computer interface, the controller is electrically connected with the constant current source module, the constant current source module is electrically connected with the silicon pile mounting seat, the temperature module is electrically connected with the controller, the high-voltage silicon pile is installed on the silicon pile mounting seat, and the temperature module is connected on the high-voltage silicon pile through a thermocouple monitoring.

2. The high-voltage silicon pile interrupter endurance test device according to claim 1, characterized by The temperature module includes a thermometer and a thermocouple, the thermometer is electrically connected with the thermocouple, and the thermocouple is fixed on the outside of the chip plastic package of the high-voltage silicon pile through a binding tape.

3. The high-voltage silicon pile interrupter endurance test device according to claim 1, characterized by The constant current source module is a constant current source module capable of stably providing a current of more than 10 times the rated current of the high-voltage silicon pile.

4. The high-voltage silicon pile interrupter endurance test device according to claim 1, characterized by The silicon pile mounting seat includes an insulating base, an electrode column, a sliding sleeve, a spring, an upper clamping block, a lower clamping block and a screw, at least two electrode columns are installed on the upper surface of the insulating base, a semicircular groove is formed in the side of each electrode column close to the upper end, the upper end of the electrode column in the semicircular groove forms the upper clamping block, the lower clamping block is slidably located in the semicircular groove and has a gap between the upper end of the lower clamping block and the inner side of the upper end of the semicircular groove, and a threaded hole is designed on the outer side of the lower clamping block; the sliding sleeve has a hollow hole in the middle and a closed upper end, a semicircular notch is formed in one side of the middle of the sliding sleeve, the semicircular notch is communicated with the hollow hole, and a circular hole is formed in the upper surface of the sliding sleeve below the semicircular notch; the sliding sleeve is slidably sleeved on the upper end of the electrode column, and a spring is arranged between the bottom of the hollow hole of the sliding sleeve and the upper end of the electrode column; and the screw is screwed into the threaded hole of the lower clamping block through the circular hole of the sliding sleeve.

5. The high-voltage silicon pile interrupter endurance test device according to claim 4, characterized by The upper and lower heights of the semicircular groove are greater than the upper and lower heights of the semicircular notch; after the lower clamping block is fixed with the sliding sleeve through the screw, the upper end of the lower clamping block is flush with the bottom of the semicircular notch.

6. The high-voltage silicon pile interrupter endurance test device according to claim 4, characterized by A circular groove is arranged in the middle of the upper end of the electrode column for positioning and clamping the lower end of the spring.

7. The high-voltage silicon pile interrupter endurance test device according to claim 1, characterized by A sound and light alarm is further arranged on the human-computer interface, and the controller is electrically connected with the sound and light alarm.

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