Probe device and laser-induced sintering system

Abstract

The utility model provides a probe device and a laser-induced sintering system, the probe device comprises a probe row, at least one probe module is arranged on the probe row, and the probe module comprises a first probe unit and second probe units arranged on the two sides of the first probe unit. Auxiliary grids in the middle of the surface of a battery piece are pressed by first probes which are arranged in a staggered mode in all first probe sets in the first probe unit, auxiliary grids at the two ends are pressed by second probes which are arranged in a staggered mode in all second probe sets in the second probe unit, the number of the second probe sets is larger than that of the first probe sets, and the number of the second probe sets is larger than that of the first probe sets in the length direction of the probe row. The section length of the first contact part of the first probe is larger than that of the second contact part of the second probe, so that when laser-induced sintering is carried out on the battery piece, the auxiliary grids at the two ends of the battery piece are pressed by the finer second contact part, the blackening phenomenon of the edge of the battery piece is reduced, and the contact performance of the edge of the battery piece is effectively improved.

Description

Technical Field

[0001] This application belongs to the field of photovoltaic module manufacturing technology, specifically, it relates to a probe device and a laser-induced sintering system. Background Technology

[0002] To reduce the contact resistance of solar cells, existing technologies employ laser-induced sintering. This involves using a laser to excite charge carriers in the cell, which then flow in a directed manner under the influence of a reverse voltage from an external electric field to form a circuit. When the circuit current flows through the metal-semiconductor interface, a significant thermal effect is generated due to the relatively high contact resistance between the metal and semiconductor. This further promotes the mutual diffusion between the metal and semiconductor, resulting in excellent contact characteristics after sintering.

[0003] When using existing probe structures to apply reverse voltage to OBB solar cells and perform laser-induced sintering by laser scanning, poor contact occurs at the cell edges. After laser-induced sintering, the cell edges turn black, affecting the power generation efficiency and appearance of the resulting photovoltaic modules. Utility Model Content

[0004] In view of this, this application provides a probe device and a laser-induced sintering system, such that during laser-induced sintering, the sub-grids in the middle of the solar cell are pressed by staggered first probes, and the sub-grids at both ends are pressed by more densely staggered second probes, effectively improving the contact performance of the solar cell edges and increasing the power generation efficiency of the photovoltaic module.

[0005] A probe device includes a probe array, wherein at least one probe module is provided on the probe array, and each probe module includes a first probe unit and a second probe unit disposed on both sides of the first probe unit along the length direction of the probe array.

[0006] The first probe unit includes multiple rows of first probe groups. Each first probe group includes multiple first probes arranged along the length of the probe row. The first probes of adjacent rows of first probe groups are staggered. The first probe has a first contact portion that contacts the battery cell.

[0007] The second probe unit includes multiple rows of second probe groups. Each second probe group includes multiple second probes arranged along the length of the probe group. The second probes of adjacent rows of second probe groups are staggered. The second probes have a second contact portion that contacts the battery cell.

[0008] The number of second probe groups in each second probe unit is greater than the number of first probe groups in each first probe unit, and the cross-sectional length of the first contact portion along the probe row length direction is greater than the cross-sectional length of the second contact portion along the probe row length direction.

[0009] The staggered first contact portion and staggered second contact portion in the same probe module can at least press down all the sub-gates outside the two outermost sub-gates on each side of the battery cell.

[0010] Preferably, each of the first contact portion and each of the second contact portions can press down at least one sub-gate, and the number of sub-gates that the second contact portion can press down is less than the number of sub-gates that the first contact portion can press down.

[0011] Preferably, when the probe array is pressed down to make the first contact portion and the second contact portion contact the battery cell, the staggered first contact portion and the staggered second contact portion in the same probe module can press down all the sub-gates on the surface of the battery cell.

[0012] Preferably, half of the cross-sectional length of the second contact portion along the length direction of the probe array is less than the straight-line distance between the edge of the cell and the sub-gate near the edge of the cell.

[0013] Preferably, the linear spacing between two adjacent first contact portions in each first probe group is less than the cross-sectional length of the first contact portion along the length direction of the probe array;

[0014] The linear spacing between two adjacent second contacts in each second probe group is less than the cross-sectional length of the second contact along the length of the probe array.

[0015] The laser-induced sintering system provided in this application includes a support platform, an electrical input module and a laser module. The electrical input module includes a power supply, electrodes for connecting to the power supply and a probe device as described above.

[0016] The probe device contacts the upper surface of the battery cell, the electrode contacts the lower surface of the battery cell, a reverse voltage is applied to the battery cell placed on the support platform through the electrical input module, and the laser module emits a laser beam to scan the battery cell.

[0017] Preferably, the probe array is electrically connected to the first polarity of the power supply, and the electrode is electrically connected to the second polarity of the power supply.

[0018] Preferably, the electrode includes a conductive portion disposed on the support platform and a conductive connector connected to the power source. The conductive connector can be electrically connected to the conductive portion, and the conductive portion is in contact with the lower surface of the battery cell.

[0019] Preferably, the conductive part is a conductive plate, the size of the conductive plate is greater than or equal to the size of the battery cell, and the conductive connector is in contact with the area of ​​the conductive plate other than the battery cell.

[0020] Preferably, the support platform has a hollowed-out portion, and the electrode is disposed below the hollowed-out portion, allowing the electrode to pass through the hollowed-out portion and contact the lower surface of the battery cell.

[0021] The beneficial effects of this application are: the sub-grids in the middle of the solar cell are pressed by the staggered first probes, and the sub-grids at both ends are pressed by the staggered second probes. The number of the second probe groups is greater than the number of the first probe groups, and the cross-sectional length of the second contact part along the length of the probe group is smaller than the cross-sectional length of the first contact part along the length of the probe group. This makes the sub-grids at both ends of the solar cell pressed by finer probes, reducing the blackening phenomenon of EL at the edge of the solar cell, thereby effectively improving the contact performance at the edge of the solar cell and improving the power generation efficiency of the photovoltaic module. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments or prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0023] The structures, proportions, sizes, etc., shown in the accompanying drawings are only for the purpose of assisting those skilled in the art in understanding and reading the content disclosed in the specification, and are not intended to limit the implementation conditions of this application. Therefore, they have no substantial technical significance. Any modifications to the structure, changes in the proportions, or adjustments to the size should still fall within the scope of the technical content disclosed in this application, provided that they do not affect the effects and purposes that this application can produce.

[0024] Figure 1 A perspective view of the probe device provided in this application;

[0025] Figure 2 This is a schematic diagram showing the distribution of the probes when the probe device is pressed onto the solar cell;

[0026] Figure 3 This is a schematic diagram of a laser-induced sintering system.

[0027] In the figure: 10-Probe device; 11-Probe row; 12-First probe unit; 121-First probe; 122-First contact part; 13-Second probe unit; 131-Second probe; 132-Second contact part; 20-Battery cell; 21-Sub-grid; 30-Supporting platform; 40-Laser module; 50-Power supply; 60-Electrode; 61-Conductive part; 62-Conductive connector. Detailed Implementation

[0028] The embodiments of this application will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0029] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0030] When performing laser-induced sintering on OBB solar cells (hereinafter referred to as cells), a probe device is required to press down all the sub-grids on the surface of the cell to apply a reverse voltage. To prevent the outermost probe of the probe device from contacting the conductive part under the cell and causing a short circuit, a gap is usually left between the outermost probe and the edge of the cell after the probe device is pressed onto the cell. This results in the sub-grids at the edge of the cell not being in direct contact with the probes. The current path of the sub-grids at the edge of the cell is longer, and the leakage at the edge is more serious. This leads to poor contact at the edge of the cell when using existing probe devices for laser-induced sintering.

[0031] It is understood that the cell edge mentioned in this application refers to both sides of the cell along a direction perpendicular to the extension direction of the sub-busbar (the length direction of the probe array when the probe device is pressed on the cell).

[0032] Example 1:

[0033] refer to Figure 1-3 This embodiment provides a probe device 10, including a probe row 11, at least one probe module on the probe row 11, and each probe module includes a first probe unit 12 and a second probe unit 13 disposed on both sides of the first probe unit 12 along the length direction of the probe row 11.

[0034] The first probe unit 12 and the second probe units 13 at both ends are arranged adjacent to each other. When the probe device 10 presses on the battery cell 20, the sub-gate 21 in the middle of the battery cell 20 is pressed by the first probe unit 12, and the sub-gate 21 at both ends of the battery cell 20 is pressed by the second probe unit 13.

[0035] A single probe module can be set on the probe array 11 to press down the sub-grid 21 on a single cell 20. Alternatively, two or more probe modules can be set side by side on the probe array 11 along its length to press down the sub-grid 21 on two or more cells 20 simultaneously. In other words, one probe module corresponds to one cell 20.

[0036] Specifically, the first probe unit 12 includes multiple rows of first probe groups. Preferably, the multiple rows of first probe groups are parallel to each other. Each row of first probe groups includes multiple first probes 121 arranged along the length direction of the probe row 11. The first probes 121 of adjacent rows of first probe groups are staggered. The first probe 121 has a first contact portion 122 that contacts the battery cell 20.

[0037] The second probe unit 13 includes multiple rows of second probe groups. Preferably, the multiple rows of second probe groups are parallel to each other. Each row of second probe groups includes multiple second probes 131 arranged along the length direction of the probe row 11. The second probes 131 of adjacent rows of second probe groups are staggered. The second probe 131 has a second contact portion 132 that contacts the battery cell 20.

[0038] It is understandable that, since the second probe unit is arranged on both sides of the first probe unit along the length direction of the probe array 11, when the probe device 10 presses on the battery cell 20, the sub-gate 21 located at the junction of the first probe unit and the second probe unit is preferably pressed by the corresponding first contact portion 122 and second contact portion 132 at the same time, thereby ensuring that the sub-gate 21 at the junction of the first probe unit and the second probe unit can be pressed by the corresponding probe.

[0039] In this embodiment, the number of rows of the second probe group in each second probe unit is greater than the number of rows of the first probe group in each first probe unit. The number of rows for the first probe group and the second probe group can be set according to the actual situation. For example, in this embodiment, it can be set as follows: Figure 2 The diagram shows two rows of first probe groups and four rows of second probe groups.

[0040] Appendix Figure 2 An exemplary schematic diagram shows the distribution of probes on the solar cell 20, with the probe device 10 pressed against it. (See reference...) Figure 2 The cross-sectional length of the first contact portion 122 along the length direction of the probe array 11 is greater than the cross-sectional length of the second contact portion 132 along the length direction of the probe array 11.

[0041] In this embodiment, each first contact portion 122 and each second contact portion 132 can press down at least one sub-gate 21 of the battery cell 20, and the number of sub-gates 21 that the second contact portion 132 can press down is less than the number of sub-gates 21 that the first contact portion 122 can press down.

[0042] Through the above design, during laser-induced sintering of the solar cell, along the length direction of the probe array 11, the sub-gates 21 at both ends of the solar cell 20 are pressed by the finer second contact portion 132, which reduces the blackening phenomenon of EL (Electroluminescent) at the edge of the solar cell 20, thereby effectively improving the contact performance of the edge of the solar cell 20, improving the power generation efficiency of the photovoltaic module, and improving the appearance of the photovoltaic module.

[0043] The number of sub-gates 21 that each first contact portion 122 and each second contact portion 132 can press can be set according to the actual situation, for example, as follows: Figure 2 Each of the first contact portions 122 shown can press down four sub-gates 21, and each of the second contact portions 132 can press down two sub-gates 21.

[0044] When the probe device 10 presses on the battery cell 20, the first contact portion 122 of the first probe 121 in each first probe group of the same probe module presses down all the sub-gates 21 in the middle of the battery cell 20, and the second contact portion 132 of the second probe 131 in each second probe group presses down the sub-gates 21 at both ends of the battery cell 20, so that all the sub-gates 21 on the surface of the battery cell 20 except for the two outermost sub-gates on each side are pressed down by the corresponding probes.

[0045] It is understandable that "all sub-grids 21 on the surface of the solar cell 20, except for the two outermost sub-grids on each side, are pressed by the corresponding probes" means that when the probe device 10 presses on the solar cell 20, two sub-grids 21 on each side of the solar cell 20 are not pressed by the second contact portion 132, or one sub-grid 21 on each side of the solar cell 20 is not pressed by the second contact portion 132, or two sub-grids 21 on one side of the solar cell 20 are not pressed by the second contact portion 132 and one sub-grid 21 on the other side of the solar cell 20 is not pressed by the second contact portion 132, or one sub-grid 21 on one side of the solar cell 20 is not pressed by the second contact portion 132, or all sub-grids 21 on the surface of the solar cell 20 are pressed by the first contact portion 131 and the second contact portion 132. All of these situations can reduce the blackening phenomenon of the solar cell 20 edge EL during laser-induced sintering and improve the contact performance of the solar cell 20 edge.

[0046] In a preferred embodiment, when the probe device 10 presses on the battery cell 20, the staggered first contact portion 122 and staggered second contact portion 132 in the same probe module can press down all the sub-gates 21 on the surface of the battery cell 20.

[0047] To ensure that all sub-grids 21 on the surface of the solar cell 20 are pressed down by the corresponding probes, and to prevent the second contact portion 132 from contacting the conductive portion below the solar cell 20 and causing a short circuit, this embodiment can be designed such that half of the cross-sectional length of the second contact portion 132 along the length direction of the probe array 11 is less than the straight-line distance between the edge of the solar cell 20 and the sub-grids 21 near the edge of the solar cell 20. Furthermore, this design can also prevent fragmentation of the edge of the solar cell 20 caused by the pressure of the second probe 131 pressing down.

[0048] Specifically, the straight-line distance between the edge of the battery cell 20 and the sub-gate 21 near the edge of the battery cell 20 can be increased so that half of the cross-sectional length of the second contact portion 132 along the length direction of the probe array 11 is less than the straight-line distance between the edge of the battery cell 20 and the sub-gate 21 near the edge of the battery cell 20. Alternatively, the cross-sectional length of the second contact portion 132 along the length direction of the probe array 11 can be further reduced to achieve the above objective.

[0049] In this embodiment, the cross-sectional lengths of the first contact portion 122 and the second contact portion 132 along the length direction of the probe array 11 are not specifically limited. As long as the cross-sectional length of the second contact portion 132 along the length direction of the probe array 11 is less than the cross-sectional length of the first contact portion 122 along the length direction of the probe array 11, such that the number of sub-gates 21 that each second contact portion 132 can press is less than the number of sub-gates 21 that each first contact portion 122 can press, and half of the cross-sectional length of the second contact portion 132 along the length direction of the probe array 11 is less than the straight-line distance between the edge of the battery cell 20 and the sub-gate 21 near the edge of the battery cell 20, it is acceptable.

[0050] Continue to refer to Figure 2 The straight-line distance between two adjacent first contact portions 122 in each first probe group is less than the cross-sectional length of the first contact portion 122 along the length direction of the probe row 11;

[0051] The linear spacing between two adjacent second contact portions 132 of each second probe group is less than the cross-sectional length of the second contact portion 132 along the length direction of the probe row 11.

[0052] It is understood that, in this embodiment, all the first contact portions 122 preferably have the same cross-sectional shape and cross-sectional length along the length direction of the probe array 11, and all the second contact portions 132 preferably have the same cross-sectional shape and cross-sectional length along the length direction of the probe array 11.

[0053] By setting the straight-line distance between two adjacent first contact portions 122 of each first probe group to be less than the cross-sectional length of the first contact portion 122 along the length direction of the probe row 11, the first probes 121 in each first probe group can be staggered to press down all the sub-gates 21 in the middle of the battery cell 20.

[0054] Similarly, by setting the straight-line distance between two adjacent second contact portions 132 of each second probe group to be less than the cross-sectional length of the second contact portion 132 along the length direction of the probe row 11, the second probes 131 in each second probe group can be staggered to press down all the sub-gates 21 on the surface of the cell 20 except for the two outermost sub-gates 21 on each side.

[0055] The cross-sections of the first contact portion 122 and the second contact portion 132 can both be circular, square, or other shapes. Alternatively, the cross-sections of the first contact portion 122 and the second contact portion 132 can be different shapes, for example, the cross-section of the first contact portion 122 can be circular and the cross-section of the second contact portion 132 can be square. Preferably, in this embodiment, the cross-sections of the first contact portion 122 and the second contact portion 132 are both circular.

[0056] When the cross-sections of the first contact portion 122 and the second contact portion 132 are both circular, the cross-sectional length of the first contact portion 122 along the length direction of the probe array 11 refers to the diameter of the cross-section of the first contact portion 122, and the cross-sectional length of the second contact portion 132 along the length direction of the probe array 11 refers to the diameter of the cross-section of the second contact portion 132.

[0057] Example 2:

[0058] This embodiment provides a laser-induced sintering system, referencing... Figure 3 It includes a support platform 30, an electrical input module and a laser module 40. The electrical input module includes a power supply 50 and electrodes 60 and probe devices 10 for connecting to the power supply 50.

[0059] The probe device 10 can contact the upper surface of the battery cell 20, and the electrode 60 can contact the lower surface of the battery cell 20. A reverse voltage is applied to the battery cell 20 placed on the support platform 30 through the electrical input module, and the laser module 40 emits a laser beam to scan the battery cell 20.

[0060] The probe device 10 presses down the sub-grid 21 on the upper surface of the battery cell 20. The probe array 11 is electrically connected to the first polarity of the power supply 50 via a wire 70, and the electrode 60 is electrically connected to the second polarity of the power supply 50, thus forming a circuit. When the power supply 50 is activated, a reverse voltage can be applied to the battery cell 20 through the probe device 10 and the electrode 60. In this embodiment, the first polarity can be negative and the second polarity positive.

[0061] like Figure 3 As shown, the electrode 60 includes a conductive part 61 disposed on the support platform 30 and a conductive connector 62 connected to the power supply 50. The conductive connector 62 can be electrically connected to the conductive part 61, and the conductive part 61 is in contact with the lower surface of the battery cell 20.

[0062] Specifically, it also includes a drive mechanism (not shown in the figure). Under the action of the drive mechanism, the conductive connector 62 moves up and down. When it is necessary to apply a reverse voltage to the battery cell 20, the drive mechanism drives the conductive connector 62 to move downward until it contacts the conductive part 61. During this process, the probe device 10 can be pressed down to the upper surface of the battery cell 20 under the action of the same drive mechanism. That is, under the action of the drive mechanism, the conductive connector 62 contacts the conductive part 61, and each first contact part 122 and each second contact part 132 contacts each sub-gate 21 on the upper surface of the battery cell 20. The drive structure can be a Z-axis drive module or other drive structures that can achieve the purpose of this embodiment, which will not be described in detail here.

[0063] Of course, the probe device 10 and the conductive connector 62 can also be driven independently by separate driving mechanisms. Alternatively, the conductive connector 62 can always be electrically connected to the conductive part 61. When it is necessary to apply a reverse voltage to the battery cell 20, the probe device 10 is pressed down onto the upper surface of the battery cell 20 under the action of the driving mechanism, so that all the sub-grids 21 on the upper surface of the battery cell 20 are pressed by the first contact part 122 and the second contact part 132.

[0064] In this embodiment, the conductive part 61 can be disposed on the support platform 30 in various ways. For example, at least a portion of the surface of the support platform 30 may serve as the conductive part 61. Specifically, the entire support platform 30 may be made of conductive material, and the battery cell 20 may be placed directly on the conductive support platform 30. Alternatively, only the portion of the surface of the support platform 30 in contact with the battery cell 20 may be made of conductive material. In this embodiment, it is preferable that the portion of the surface of the support platform 30 in contact with the battery cell 20 is made of conductive material.

[0065] In addition, it can also be like Figure 3 The conductive part 61 shown is a conductive plate. The conductive plate is placed on the support platform 30. The size of the conductive plate is greater than or equal to the size of the battery cell 20. The battery cell 20 is placed on the conductive plate so that the lower surface of the battery cell 20 contacts the conductive plate. The conductive connector 62 contacts the area on the conductive plate other than the battery cell 20.

[0066] The conductive connector 62 includes at least one conductive post; that is, to achieve electrical connection, the conductive connector 62 only needs to have at least one contact that connects to the conductive part 61. Preferably, there are four conductive posts, which are separately arranged on both sides of the battery cell 20.

[0067] Furthermore, the conductive part 61 is preferably made of copper, which has good conductivity and is relatively inexpensive.

[0068] In addition to the above embodiments, this embodiment also provides another embodiment. Specifically, the support platform 30 has a hollow portion, and the electrode 60 is disposed below the hollow portion. Under the action of the driving mechanism, the electrode 60 moves upward, and the electrode 60 can pass through the hollow portion and directly contact the lower surface of the battery cell 20. The electrode 60 may include at least one strip-shaped conductive electrode, or it may include at least one conductive post or conductive plate, as long as it can enable the lower surface of the battery cell 20 to be electrically connected to the power supply 50.

[0069] The various embodiments in this specification are described in a progressive, parallel, or combined manner. Each embodiment focuses on its differences from other embodiments, and similar or identical parts between embodiments can be referred to interchangeably. For the apparatuses disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple, and relevant parts can be referred to the method section.

[0070] It should be noted that, in the description of this application, the terms "upper," "lower," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. When a component is considered to be "connected" to another component, it can be directly connected to the other component or there may be a component centrally located at the same time.

[0071] It should also be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that an article or apparatus comprising a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such an article or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the article or apparatus that includes the aforementioned element.

[0072] The above description of the disclosed embodiments enables those skilled in the art to make or use this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A probe device, characterized in that, The device includes a probe array, wherein at least one probe module is provided on the probe array, and each probe module includes a first probe unit and a second probe unit disposed on both sides of the first probe unit along the length direction of the probe array. The first probe unit includes multiple rows of first probe groups. Each first probe group includes multiple first probes arranged along the length of the probe row. The first probes of adjacent rows of first probe groups are staggered. The first probe has a first contact portion that contacts the battery cell. The second probe unit includes multiple rows of second probe groups. Each second probe group includes multiple second probes arranged along the length of the probe group. The second probes of adjacent rows of second probe groups are staggered. The second probes have a second contact portion that contacts the battery cell. The number of second probe groups in each second probe unit is greater than the number of first probe groups in each first probe unit, and the cross-sectional length of the first contact portion along the probe row length direction is greater than the cross-sectional length of the second contact portion along the probe row length direction. The staggered first contact portion and staggered second contact portion in the same probe module can at least press down all the sub-gates outside the two outermost sub-gates on each side of the battery cell.

2. The probe device according to claim 1, characterized in that, Each of the first contact portion and each of the second contact portions can press down at least one sub-gate, and the number of sub-gates that the second contact portion can press down is less than the number of sub-gates that the first contact portion can press down.

3. The probe device according to claim 2, characterized in that, When the probe array is pressed down to make the first contact portion and the second contact portion contact the battery cell, the staggered first contact portion and the staggered second contact portion in the same probe module can press down all the sub-gates on the surface of the battery cell.

4. A probe device according to claim 3, characterized in that, The second contact portion has a cross-sectional length along the probe array length direction that is less than half the straight-line distance between the edge of the cell and the sub-grid near the edge of the cell.

5. A probe device according to any one of claims 1-4, characterized in that, The linear spacing between two adjacent first contact portions in each first probe group is less than the cross-sectional length of the first contact portion along the length of the probe array. The linear spacing between two adjacent second contacts in each second probe group is less than the cross-sectional length of the second contact along the length of the probe array.

6. A laser-induced sintering system, comprising a support platform, an electrical input module, and a laser module, characterized in that, The electrical input module includes a power supply, electrodes for connecting to the power supply, and a probe device according to any one of claims 1-5; The probe device contacts the upper surface of the battery cell, the electrode contacts the lower surface of the battery cell, a reverse voltage is applied to the battery cell placed on the support platform through the electrical input module, and the laser module emits a laser beam to scan the battery cell.

7. A laser-induced sintering system according to claim 6, characterized in that, The probe array is electrically connected to the first polarity of the power supply, and the electrode is electrically connected to the second polarity of the power supply.

8. A laser-induced sintering system according to claim 6, characterized in that, The electrode includes a conductive portion disposed on the support platform and a conductive connector connected to the power source. The conductive connector can be electrically connected to the conductive portion, and the conductive portion is in contact with the lower surface of the battery cell.

9. A laser-induced sintering system according to claim 8, characterized in that, The conductive part is a conductive plate, the size of which is greater than or equal to the size of the battery cell, and the conductive connector is in contact with the area of ​​the conductive plate other than the battery cell.

10. A laser-induced sintering system according to claim 6, characterized in that, The support platform has a hollow section, and the electrode is disposed below the hollow section. The electrode can pass through the hollow section and contact the lower surface of the battery cell.

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