Direct insertion type power semiconductor module test fixture

Abstract

The utility model discloses a direct insertion type power semiconductor module test fixture, which comprises two groups of clamping frames and two groups of clamping grooves, the two groups of clamping frames are symmetrically connected and installed up and down, the clamping grooves are arranged in the clamping frames, a plurality of groups of supporting blocks are symmetrically arranged in the clamping grooves at equal intervals, and the supporting blocks are arranged in the clamping grooves. The device comprises supporting blocks, clamping blocks are arranged in the supporting blocks, movable shafts are installed on the inner walls of the supporting blocks, the clamping blocks are movably connected with the supporting blocks through the movable shafts, springs are installed at the bottom ends of the clamping blocks, the springs are connected with the supporting blocks, and arc-shaped grooves are formed in the side walls of the clamping blocks. According to the utility model, a plurality of groups of semiconductors can be conveniently clamped in a linkage manner for synchronous testing, the testing position can be conveniently rotated and adjusted, the direct insertion type power semiconductors can be conveniently and rapidly discharged, and the testing flexibility is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to test fixture technical field, concretely is a straight insertion type power semiconductor module test fixture. BACKGROUND

[0002] ‌Semiconductor test is a technology in semiconductor equipment, and it mainly reflects the fault of semiconductor component assembly to the system, the purpose of semiconductor test is to ensure the reliability of component used in the system, reduce unnecessary loss, and the fault of semiconductor can be divided into fault, random fault and wear fault, the semiconductor test link is not only the finished product test after packaging, but also relates to the whole chip production process, so as to ensure that the chip meets the requirements, in order to better detect the semiconductor module, so a straight insertion type power semiconductor module test fixture is provided.

[0003] As disclosed in a straight insertion type power semiconductor module test fixture with the authorized announcement number CN220188573U, including the base and the detection platform installed on the upper end of the base, the upper end outer wall of the detection platform is equidistantly provided with a plurality of detection holes b to adapt to the pin of different semiconductor modules, the upper end of the base and located at the rear end of the detection platform is provided with a fixed frame, the front end of the fixed frame is provided with a driver, the lower end of the driver is fixedly connected with a driving rod, the lower end of the driving rod is drivingly connected with a compression plate, the front end outer wall of the base is provided with a control button close to the right side, the lower end of the compression plate is fixedly connected with a fixed plate, the front end outer wall of the fixed plate is embedded with a soft block, the inside of the soft block is provided with a partition groove to divide the soft block into multiple parts to adapt to different semiconductor module shapes;

[0004] Although it realizes that different semiconductor modules can be stably abutted and fixed by the fixed plate, the soft block and the partition groove;

[0005] But it does not solve the problem that the existing test fixture is not convenient for linkage clamping multiple groups of semiconductors for synchronous testing and convenient rotation adjustment of test position, which is not conducive to the rapid discharge of straight insertion type power semiconductor, and affects the flexibility of testing. UTILITY MODEL CONTENTS

[0006] The utility model aims at providing a straight insertion type power semiconductor module test fixture to solve the problem that the test fixture is not convenient for linkage clamping multiple groups of semiconductors for synchronous testing and convenient rotation adjustment of test position, which is not conducive to the rapid discharge of straight insertion type power semiconductor, and affects the flexibility of testing.

[0007] In order to achieve the above object, the utility model provides the following technical scheme: a straight insertion type power semiconductor module test fixture, including clamping frame and clamping groove, the clamping frame has two groups, and two sets of clamping frame are symmetrically connected and installed, the inside of clamping frame is all provided with clamping groove, the inside of clamping groove is all symmetrically installed with multiple sets of support block of equal interval, the inside of support block is all provided with clamping block, the inner wall of support block is all installed with movable shaft, and clamping block is movably connected with support block through movable shaft, the bottom of clamping block is all installed with spring, and spring is connected with support block, the lateral wall of clamping block is all installed with arc groove, the outer wall of clamping frame is all installed with multiple sets of second electric push rod of equal interval, the output of second electric push rod is all installed with second push arm, the outside of second push arm is all provided with moving frame, and moving frame is connected with second push arm, the lateral wall of moving frame is all symmetrically installed with three groups of moving rods of equal interval, and moving rod is slidably connected with clamping frame, the lateral wall of moving rod is all installed with multiple sets of protruding blocks of equal interval, and protruding block is slidably connected with clamping block, the outside of clamping frame is provided with rotary seat.

[0008] Preferably, a first motor is installed on the inner wall of the rotary seat, a first worm is installed on the output end of the first motor, and the first worm is movably connected with the rotary seat.

[0009] Preferably, a rotary shaft is movably installed in the rotary seat on one side of the first worm, and an integrated box is installed on the top end of the rotary shaft.

[0010] Preferably, a first worm wheel is sleeved on the surface of the rotary shaft, and the first worm and the first worm wheel are meshed with each other.

[0011] Preferably, a first electric push rod is symmetrically installed on the top end of the integrated box, and a first push arm is installed on the output end of the first electric push rod.

[0012] Preferably, a rotary box is installed on the top end of the first push arm, and a second motor is installed on the lateral wall of the rotary box.

[0013] Preferably, a second worm is installed on the output end of the second motor, and the second worm is movably connected with the rotary box, a turnover shaft is movably installed in the rotary box on one side of the second worm, and the turnover shaft extends to the outside of the rotary box and is connected with the clamping frame.

[0014] Preferably, a second worm wheel is sleeved on the surface of the turnover shaft, and the second worm and the second worm wheel are meshed with each other.

[0015] Compared with the prior art, the utility model have the advantages that: the test fixture not only realizes convenient linkage clamping multiple groups of semiconductors for synchronous testing and convenient rotation adjustment of testing position, but also improves the flexibility of testing.

[0016] (1) the second electric push rod moves the moving frame through the second push arm, the moving frame moves the moving rod, the moving rod moves the protruding block, the protruding block moves the clamping block to rotate around the movable shaft, so that the two groups of clamping blocks rotate towards each other, the clamping block clamps and fixes the straight insertion type power semiconductor through the arc-shaped groove, then the tester contacts the contact at the top end of the straight insertion type power semiconductor, and the tester completes the test, when the test is completed, the first push arm moves upwards through the first electric push rod, the clamping frame moves upwards through the rotating box driven by the first push arm, the second worm rotates through the second motor, the second worm drives the second worm wheel to rotate, the second worm wheel drives the turnover shaft to rotate, the turnover shaft drives the clamping frame to overturn, then the second electric push rod is turned off, the moving rod is reset through the second electric push rod, so that the two groups of clamping blocks are reset under the elastic action of the spring, the straight insertion type power semiconductor falls from the middle of the clamping block, and is quickly discharged, realizing convenient linkage clamping multiple groups of semiconductors for synchronous testing, and facilitating quick discharge of the straight insertion type power semiconductor.

[0017] (2) the first motor drives the first worm to rotate, the first worm drives the first worm wheel to rotate, the first worm wheel drives the integrated box to rotate through the rotating shaft, the integrated box drives the clamping frame to rotate, so as to adapt to different test positions, facilitating testing of the straight insertion type power semiconductor from different positions, realizing convenient rotation adjustment of the test position, and improving the flexibility of testing. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 It is three-dimensional structure schematic diagram of the utility model;

[0019] Figure 2 It is the front view section structure schematic diagram of the rotating seat of the utility model;

[0020] Figure 3 It is three-dimensional structure schematic diagram of the clamping frame of the utility model;

[0021] Figure 4 It is the side view section structure schematic diagram of the supporting block of the utility model;

[0022] Figure 5 It is the top view section structure schematic diagram of the rotating box of the utility model.

[0023] In the figure: 1, rotating seat; 2, integrated box; 3, clamping frame; 4, rotating box; 5, first push arm; 6, first electric push rod; 7, rotating shaft; 8, first worm; 9, clamping groove; 10, first worm wheel; 11, first motor; 12, second electric push rod; 13, second push arm; 14, moving frame; 15, clamping block; 16, protruding block; 17, moving rod; 18, supporting block; 19, spring; 20, movable shaft; 21, second motor; 22, overturning shaft; 23, second worm; 24, second worm wheel; 25, arc-shaped groove. DETAILED DESCRIPTION

[0024] In order to further illustrate the technical means and effects adopted by the utility model to achieve the predetermined utility model purposes, the specific embodiments, structures, features and effects according to the utility model are described in detail as follows in combination with the drawings and preferred embodiments.

[0025] Please refer to Figures 1-5 The utility model provides an embodiment: a straight insertion type power semiconductor module test fixture, including clamping frame 3 and clamping groove 9, clamping frame 3 has two groups, and two groups of clamping frame 3 are symmetrically connected and installed, the inside of clamping frame 3 is all provided with clamping groove 9, the inside of clamping groove 9 is all symmetrically installed with multiple groups of supporting blocks 18 of equal interval, the inside of supporting block 18 is all provided with clamping block 15, the inner wall of supporting block 18 is all installed with movable shaft 20, and clamping block 15 is movably connected with supporting block 18 through movable shaft 20, the bottom of clamping block 15 is all installed with spring 19, and spring 19 is connected with supporting block 18, the side wall of clamping block 15 is all installed with arc-shaped groove 25, the outer wall of clamping frame 3 is all installed with multiple groups of second electric push rod 12 of equal interval, second electric push rod 12 plays the role of power drive, the output end of second electric push rod 12 is all installed with second push arm 13, the outside of second push arm 13 is all provided with moving frame 14, and moving frame 14 is connected with second push arm 13, the side wall of moving frame 14 is all symmetrically installed with three groups of moving rods 17 of equal interval, and moving rod 17 is slidably connected with clamping frame 3, the side wall of moving rod 17 is all installed with multiple groups of protruding blocks 16 of equal interval, and protruding block 16 is slidably connected with clamping block 15, the outside of clamping frame 3 is provided with rotating seat 1;

[0026] First, the straight plug-in power semiconductor is sequentially inserted between the two groups of clamping blocks 15, and then the second electric push rod 12 is opened. The second electric push rod 12 drives the moving frame 14 to move through the second push arm 13. The moving frame 14 drives the moving rod 17 to move. The moving rod 17 drives the lug 16 to move. Under the sliding cooperation of the lug 16 and the clamping block 15, under the support of the support block 18, the lug 16 drives the clamping block 15 to rotate around the movable shaft 20, so that the two groups of clamping blocks 15 rotate towards each other. The clamping block 15 clamps and fixes the straight plug-in power semiconductor through the arc-shaped slot 25. Then the tester is in contact with the contact at the top end of the straight plug-in power semiconductor. The tester is used to complete the test. When the test is completed, the first electric push rod 6 is opened. The first electric push rod 6 drives the first push arm 5 to move upwards. The first push arm 5 drives the clamping frame 3 to move upwards through the rotating box 4. The second motor 21 is opened. The second motor 21 drives the second worm 23 to rotate. Under the mutual engagement of the second worm 23 and the second worm gear 24, the second worm 23 drives the second worm gear 24 to rotate. The second worm gear 24 drives the turnover shaft 22 to rotate. The turnover shaft 22 drives the clamping frame 3 to overturn. Then the second electric push rod 12 is closed. The second electric push rod 12 drives the moving rod 17 to reset, so that the two groups of clamping blocks 15 are reset under the elastic action of the spring 19. The straight plug-in power semiconductor falls from the middle of the clamping block 15 to quickly discharge it. The convenient linkage clamping multiple semiconductors for synchronous testing is realized, which facilitates the quick discharge of the straight plug-in power semiconductor;

[0027] A first motor 11 is mounted on the inner wall of the rotating seat 1. The first motor 11 serves as a power drive. A first worm 8 is mounted at the output end of the first motor 11. The first worm 8 is movably connected with the rotating seat 1. A rotating shaft 7 is movably mounted in the rotating seat 1 on one side of the first worm 8. An integrated box 2 is mounted at the top end of the rotating shaft 7.

[0028] A first worm gear 10 is sleeved on the surface of the rotating shaft 7. The first worm 8 and the first worm gear 10 are in meshing engagement. A first electric push rod 6 is symmetrically mounted at the top end of the integrated box 2. The first electric push rod 6 serves as a power drive. A first push arm 5 is mounted at the output end of the first electric push rod 6.

[0029] A rotating box 4 is mounted at the top end of the first push arm 5. A second motor 21 is mounted on the side wall of the rotating box 4. The second motor 21 serves as a power drive.

[0030] A second worm 23 is mounted at the output end of the second motor 21. The second worm 23 is movably connected with the rotating box 4. A turnover shaft 22 is movably mounted in the rotating box 4 on one side of the second worm 23. The turnover shaft 22 extends to the outside of the rotating box 4 and is connected with a clamping frame 3. A second worm gear 24 is sleeved on the surface of the turnover shaft 22. The second worm 23 and the second worm gear 24 are in meshing engagement.

[0031] The first motor 11 is opened, the first worm 8 is driven to rotate by the first motor 11, the first worm 8 drives the first worm wheel 10 to rotate under the mutual engagement of the first worm 8 and the first worm wheel 10, the integrated box 2 is driven to rotate by the first worm wheel 10 through the rotating shaft 7, the clamping frame 3 is driven to rotate by the integrated box 2, so as to adapt to different test positions, facilitate testing of the direct insertion type power semiconductor from different positions, and realize convenient rotation adjustment of the test position and improve the flexibility of the test.

[0032] Working principle: first, the direct insertion type power semiconductor is inserted between the two groups of clamping blocks 15 in turn, then the second electric push rod 12 is opened, the moving frame 14 is driven to move by the second electric push rod 12 through the second push arm 13, the moving rod 17 is driven to move by the moving frame 14, the lug 16 is driven to move by the moving rod 17, under the sliding cooperation of the lug 16 and the clamping block 15 and under the support of the support block 18, the clamping block 15 is driven to rotate around the movable shaft 20 by the lug 16, so that the two groups of clamping blocks 15 rotate towards each other, the direct insertion type power semiconductor is clamped and fixed by the clamping block 15 through the arc-shaped groove 25, then the tester is in contact with the contact at the top end of the direct insertion type power semiconductor, and the tester is used to complete the test, when the test is completed, the first push arm 5 is driven upward by the first electric push rod 6, the clamping frame 3 is driven upward by the first push arm 5 through the rotating box 4, the second worm 23 is driven to rotate by the second motor 21, the second worm wheel 24 is driven to rotate by the second worm 23, the turnover shaft 22 is driven to rotate by the second worm wheel 24, the clamping frame 3 is driven to overturn by the turnover shaft 22, then the second electric push rod 12 is closed, the moving rod 17 is reset by the second electric push rod 12, so that the two groups of clamping blocks 15 are reset under the elastic action of the spring 19, the direct insertion type power semiconductor falls from the middle of the clamping block 15, so as to quickly discharge it, the first worm 8 is driven to rotate by the first motor 11, the first worm wheel 10 is driven to rotate by the first worm 8, the integrated box 2 is driven to rotate by the first worm wheel 10 through the rotating shaft 7, the clamping frame 3 is driven to rotate by the integrated box 2, so as to adapt to different test positions, facilitate testing of the direct insertion type power semiconductor from different positions, and thus complete the use of the direct insertion type power semiconductor module test fixture.

[0033] The above merely describes preferred embodiments of the present application, and is not intended to limit the present application in any form. Although the present application has been disclosed with preferred embodiments, it is not intended to limit the present application. Any person skilled in the art can make minor changes or modifications to the disclosed technical content, or make equivalent embodiments with equivalent changes, without departing from the technical solution of the present application. Any modification, equivalent change or modification of the above embodiments, which does not depart from the technical solution of the present application, is still within the scope of the technical solution of the present application.

Claims

1. A direct pluggable power semiconductor module test fixture comprising a clamping frame (3) and a clamping slot (9), characterized in that: The clamping frame (3) has two groups, and the two groups of clamping frames (3) are symmetrically connected and installed, the inside of the clamping frame (3) is provided with a clamping groove (9), the inside of the clamping groove (9) is symmetrically provided with a plurality of groups of support blocks (18) at equal intervals, the inside of the support block (18) is provided with a clamping block (15), the inner wall of the support block (18) is provided with a movable shaft (20), and the clamping block (15) is movably connected with the support block (18) through the movable shaft (20), the bottom end of the clamping block (15) is provided with a spring (19), and the spring (19) is connected with the support block (18), the side wall of the clamping block (15) is provided with an arc-shaped groove (25), the outer wall of the clamping frame (3) is provided with a plurality of groups of second electric push rods (12) at equal intervals, the output end of the second electric push rod (12) is provided with a second push arm (13), the outside of the second push arm (13) is provided with a moving frame (14), and the moving frame (14) is connected with the second push arm (13), the side wall of the moving frame (14) is symmetrically provided with three groups of moving rods (17) at equal intervals, and the moving rod (17) is slidably connected with the clamping frame (3), the side wall of the moving rod (17) is provided with a plurality of groups of protrusions (16) at equal intervals, and the protrusion (16) is slidably connected with the clamping block (15), and the outside of the clamping frame (3) is provided with a rotating seat (1).

2. The direct pluggable power semiconductor module test fixture of claim 1, wherein: The inner wall of the rotating seat (1) is provided with a first motor (11), and the output end of the first motor (11) is provided with a first worm (8), and the first worm (8) is movably connected with the rotating seat (1).

3. A direct pluggable power semiconductor module test fixture according to claim 2, characterized in that: The inside of the rotating seat (1) on one side of the first worm (8) movably installs a rotating shaft (7), and the top end of the rotating shaft (7) installs an integrated box (2).

4. The direct pluggable power semiconductor module test fixture of claim 3, wherein: The surface of the rotating shaft (7) is provided with a first worm wheel (10), and the first worm (8) and the first worm wheel (10) are meshed with each other.

5. The direct pluggable power semiconductor module test fixture of claim 3, wherein: The top end of the integrated box (2) is symmetrically provided with a first electric push rod (6), and the output end of the first electric push rod (6) is provided with a first push arm (5).

6. A direct pluggable power semiconductor module test fixture according to claim 5, characterized in that: The top end of the first push arm (5) is provided with a rotating box (4), and the side wall of the rotating box (4) is provided with a second motor (21).

7. A direct pluggable power semiconductor module test fixture according to claim 6, characterized in that: The output end of the second motor (21) is provided with a second worm (23), and the second worm (23) is movably connected with the rotating box (4), and the inside of the rotating box (4) on one side of the second worm (23) movably installs a turnover shaft (22), and the turnover shaft (22) extends to the outside of the rotating box (4) and is connected with the clamping frame (3).

8. The direct pluggable power semiconductor module test fixture of claim 7, wherein: The surface of the turnover shaft (22) is provided with a second worm wheel (24), and the second worm (23) and the second worm wheel (24) are meshed with each other.

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