Testing device and testing system
By designing alternating insulating and conductive supports, combined with the electrical contact and fixing mechanism of the test probes and nozzles, the problem of IBC battery testing was solved, enabling reliable electrical performance testing of IBC batteries and improving the adaptability and accuracy of the test.
Patent Information
- Application Number
- CN202422962194.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-02
- Publication Date
- 2025-12-09
- Estimated Expiration
- 2034-12-02
AI Technical Summary
Existing technologies are insufficient for effectively testing the electrical performance of IBC cells, especially since the complex structure of gridless IBC cells requires sophisticated testing equipment.
A testing device was designed, comprising alternating insulating and conductive supports, equipped with test probes and a suction nozzle. The test probes are used for electrical contact, and the suction nozzle is used to counteract forces. The suction nozzle is retractable and movable, and works with a vacuum device to fix the battery in place, ensuring that the battery does not move during the test.
This method enables reliable electrical performance testing of IBC batteries, avoids battery movement during testing, and improves the adaptability and accuracy of the testing device.
Smart Images
Figure CN223650709U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] Embodiments of the present disclosure relate to the field of battery testing, and in particular to a testing device and a testing system. BACKGROUND
[0002] IBC (Interdigitated Back Contact) is a new type of structure battery in which the emitter electrode and the base electrode are both arranged on the back of the battery. The positive and negative electrodes of the IBC battery are distributed on the back of the battery, and there is strict physical isolation between the positive and negative electrodes, which can prevent short circuit caused by conduction of the negative electrode.
[0003] For IBC batteries, the shorter the motion path of the carrier is, the better it is, which can reduce the recombination speed of the carrier and thus improve the conversion efficiency of the battery. Therefore, IBC batteries tend to be designed with multiple main grids and auxiliary grids, and the carriers collected by the auxiliary grids are uniformly converged to the main grids. The main grids are connected in series by welding to form an IBC assembly.
[0004] IBC batteries include main grid type IBC batteries and main grid free type IBC batteries. The main grids of the main grid type IBC batteries are alternately distributed, and the number of main grids is twice that of the traditional PERC battery when the transmission path is the same. Moreover, the design of the main grids is various, and the number of main grids is large and not uniform. The structure of the main grid free type IBC battery is more complex, and the testing device is required to be high.
[0005] It is necessary to provide a testing device to facilitate testing of back contact batteries. CONTENT OF THE INVENTION
[0006] Embodiments of the present disclosure provide a testing device and a testing system, which can facilitate testing of back contact batteries.
[0007] According to some embodiments of the present disclosure, the present disclosure provides a testing device for testing a back contact battery, which includes: a plurality of insulating supports and a plurality of conductive supports arranged alternately; a plurality of rows of test probes arranged at intervals, each row of test probes being fixed on the conductive support, and one end of the test probe away from the conductive support being used for abutting against the back contact battery; a plurality of rows of suction nozzles arranged at intervals, each row of suction nozzles being fixed on the insulating support, one end of the suction nozzle away from the insulating support being used for abutting against the back contact battery, and the suction nozzle being movable in the direction towards or away from the insulating support.
[0008] In some embodiments, the test probe comprises: a main body part for being fixed with the conductive support, the main body part being provided with a containing space; and a test part slidingly fixed on a side of the main body part away from the conductive support and moving towards the containing space under a force state.
[0009] In some embodiments, the width of the test part gradually increases in a direction in which the main body part points to the test part.
[0010] In some embodiments, the test probe further comprises: a reset device fixed in the containing space and abutting against the test part, the reset device being compressed under the force state and returning to the original state after the test is completed.
[0011] In some embodiments, the suction nozzle comprises: a nesting part fixed with the insulating support, the nesting part being provided with an expansion space, and a plurality of through holes arranged along the extension direction of the nesting part being arranged on the side wall of the nesting part; and a clamping part located in the expansion space, the side wall of the clamping part being provided with a clamping protrusion for clamping with the through hole to fix the clamping part in the nesting part.
[0012] In some embodiments, further comprising: an air extraction device in communication with the suction nozzle for extracting vacuum from the contact surface of the suction nozzle and the back contact battery.
[0013] In some embodiments, the number of the suction nozzles is greater than or equal to the total sum of the forces applied by all the test probes to the back contact battery divided by the suction force provided by each suction nozzle.
[0014] In some embodiments, one row of the suction nozzles is arranged between every two adjacent rows of the test probes.
[0015] In some embodiments, in the direction in which the conductive support is arranged, two adjacent test probes in the same row are staggered with each other.
[0016] According to some embodiments of the present disclosure, another aspect of the present disclosure provides a test system for testing a back contact battery, comprising: a plurality of insulating supports and a plurality of conductive supports arranged alternately; a plurality of test probes arranged in a plurality of rows at intervals, each row of the test probes being fixed on the conductive support, and an end of the test probe away from the conductive support being used to abut against the back contact battery; a plurality of suction nozzles arranged in a plurality of rows at intervals, each row of the suction nozzles being fixed on the insulating support, and an end of the suction nozzle away from the insulating support being used to abut against the back contact battery, and the suction nozzle being movable in a direction towards or away from the insulating support; and a test machine, electrically connected with the test probe, for acquiring an electrical signal of the back contact battery and judging an electrical performance of the back contact battery.
[0017] The technical solution provided by the embodiments of the present disclosure has at least the following advantages: the test probe is used to make electrical contact with the gate line of the back contact battery, so as to acquire the electrical performance of the back contact battery; the suction nozzle is used to adsorb the back contact battery, so as to offset the force applied to the back contact battery by the test probe during the test, to avoid the movement of the back contact battery during the test; and the suction nozzle is movable in a direction towards or away from the insulating support, so as to improve the adaptability of the suction nozzle and the test probe. BRIEF DESCRIPTION OF DRAWINGS
[0018] One or more embodiments are illustrated by way of example in the drawings that are for illustrative purposes only, and not for the purposes of limiting the embodiments, unless otherwise specifically stated herein. The drawings in the accompanying drawings are not necessarily to scale, unless otherwise specifically stated herein. In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or in the prior art, the drawings needed in the embodiments will be briefly introduced as follows. Obviously, the drawings in the following description should not be construed as restrictive to the present disclosure, and other drawings can be obtained by those skilled in the art without creative effort.
[0019] Figure 1 A structural schematic diagram of a test device provided by an embodiment of the present disclosure;
[0020] Figure 2 A structural schematic diagram of a test probe provided by an embodiment of the present disclosure;
[0021] Figure 3 A structural schematic diagram of a suction nozzle provided by an embodiment of the present disclosure;
[0022] Figure 4 A structural schematic diagram of a test probe in contact with a back contact battery provided by an embodiment of the present disclosure;
[0023] Figure 5A top view of a test probe and a test support provided by an embodiment of the present disclosure. DETAILED DESCRIPTION
[0024] As known from the background, the current testing method for the back contact solar cell requires a high-transmittance optical glass to be placed on the front surface, which functions to limit the displacement of the back contact solar cell while avoiding affecting the illumination of the light. However, the surface of the glass will be dirty during use, thereby affecting the light transmittance of the glass and causing the received light intensity of the back contact solar cell to be less than AM1.5 during testing, which affects the testing efficiency of the solar cell.
[0025] In the embodiment of the present disclosure, the test probe is used to make electrical contact with the grid lines of the back contact solar cell, thereby obtaining the electrical performance of the back contact solar cell. The suction nozzle is used to adsorb the back contact solar cell, thereby offsetting the force applied to the back contact solar cell by the test probe during testing, so as to avoid the movement of the back contact solar cell during testing, thereby canceling the setting of the front optical glass. In addition, the suction nozzle can be moved towards or away from the insulating support, which can also improve the adaptability of the suction nozzle and the test probe.
[0026] In the description of the embodiments of the present disclosure, the technical terms "first", "second", and the like are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present disclosure, the meaning of "a plurality of" is two or more, unless otherwise explicitly and specifically limited.
[0027] In this document, the reference to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present disclosure. The appearance of this phrase in various places in the specification does not necessarily all refer to the same embodiment, nor is it necessarily mutually exclusive of other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with each other.
[0028] In the description of the embodiments of the present disclosure, the term "and / or" is only a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which can represent: A exists, A and B exist, and B exists. In addition, the character " / " in this document generally represents a "or" relationship between the front and rear associated objects.
[0029] In the description of the embodiments of the present disclosure, the term "a plurality of" refers to two or more (including two), and similarly, "a plurality of groups" refers to two or more groups (including two groups), and "a plurality of pieces" refers to two or more pieces (including two pieces).
[0030] In the description of the embodiments of the present disclosure, the technical terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship shown in the drawings, which are only for the convenience of describing the embodiments of the present disclosure and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the embodiments of the present disclosure.
[0031] In the description of the embodiments of the present disclosure, unless otherwise explicitly specified and limited, the technical terms "mounting", "connecting", "connecting", "fixing" and the like should be understood broadly, for example, can be fixedly connected, or can be detachably connected, or can be integrated; can be mechanically connected, or can be electrically connected; can be directly connected, or can be indirectly connected through an intermediate medium, or can be the internal communication of two elements or the interaction relationship between two elements. For those skilled in the art, the specific meaning of the above terms in the embodiments of the present disclosure can be understood according to the specific circumstances.
[0032] In the corresponding drawings of the embodiments of the present disclosure, in order to better understand and facilitate the description, the thickness and area of the layer are enlarged. When describing that a component (such as a layer, a film, a region or a substrate) is on or on the surface of another component, the component can be "directly" on the surface of the other component, or there can be a third component between the two components. On the contrary, when describing that a component is on the surface of another component or a component surface is formed or provided with another component, it means that there is no third component between the two components. In addition, when describing that a component is "formed substantially" on another component, it means that the component is not formed on the entire surface (or front surface) of the other component, nor is it formed on the edge of the entire surface.
[0033] In the description of the embodiments of the present disclosure, when a certain component "includes" another component, unless otherwise specified, other components are not excluded and other components can also be further included. In addition, when a layer, film, region or plate and the like component is referred to as "on / over" another component, it can be "directly on" another component (i.e. between the surface of another component and another component without other components), or another component can exist therebetween. In addition, when a layer, film, region, plate and the like component is "directly on" another component, or when a layer, film, region, plate and the like component is on the surface of another component, it means that there is no other component therebetween.
[0034] The terminology used in the description of the various described embodiments herein is for the purpose of describing particular embodiments only and is not intended to be limiting. As used in the description of the various embodiments and the appended claims, the phrase "the component" is intended to mean both "the component" and "at least one of the components" unless otherwise indicated. In other words, the phrase "the component" is intended to mean "one or more of the components" or "one or more of the components." Also, as used in the description of the various embodiments, the phrase "the component" is intended to mean "one or more of the components," unless otherwise indicated.
[0035] Embodiments of the present disclosure will be described in detail below with reference to the drawings. However, it should be understood that the technical details presented in the embodiments of the present disclosure are for the purpose of better understanding the present disclosure by the reader. However, the technical solutions claimed by the present disclosure can be implemented even without these technical details and based on various changes and modifications of the following embodiments.
[0036] Reference Figures 1 to 4 wherein, Figure 1 a structural schematic diagram of a test device provided by an embodiment of the present disclosure, Figure 2 a structural schematic diagram of a test probe provided by an embodiment of the present disclosure, Figure 3 a structural schematic diagram of a suction nozzle provided by an embodiment of the present disclosure, Figure 4 a structural schematic diagram of a test probe contacting a back contact battery provided by an embodiment of the present disclosure; Figure 5 a top view of a test probe and a test support provided by an embodiment of the present disclosure.
[0037] In some embodiments, the test device for testing a back contact battery includes: a plurality of insulating supports 100 and a plurality of conductive supports 101 arranged alternately.
[0038] In some embodiments, the test device can further include: a plurality of rows of test probes 102 arranged at intervals, each row of test probes 102 being fixed on the conductive support 101, and the end of the test probe 102 away from the conductive support 101 being used for abutting against the back contact battery.
[0039] In some embodiments, the test device can further include: a plurality of rows of suction nozzles 103 arranged at intervals, each row of suction nozzles 103 being fixed on the insulating support 100, the end of the suction nozzle 103 away from the insulating support 100 being used for abutting against the back contact battery, and the suction nozzle 103 being movable in the direction towards or away from the insulating support 100.
[0040] The test probe 102 in the embodiments of the present disclosure is used to make electrical contact with the grid lines of the back contact battery, so as to obtain the electrical performance of the back contact battery, and the suction nozzle 103 is used to adsorb the back contact battery, so as to offset the force applied to the back contact battery by the test probe 102 during the test, so as to avoid the movement of the back contact battery during the test. In addition, the suction nozzle 103 can move towards or away from the insulating support 100, and the adaptability of the suction nozzle 103 and the test probe 102 can be improved.
[0041] Reference Figure 2 In some embodiments, the test probe 102 can include a main body 112 for fixing with the conductive support 101, and the main body 112 is provided with a containing space; and a test part 122 slidingly fixed on the side of the main body 112 away from the conductive support 101 and moving towards the containing space under the force state. That is, the test probe 102 can be telescopic in the direction of approaching or moving away from the conductive support 101, and during the test, the test probe 102 continuously moves towards the surface of the back contact battery, and when the test probe 102 contacts the surface of the back contact battery, the test part 122 moves towards the containing space, and when the test part 122 moves to the bottom of the containing space and no longer moves, the test probe 102 applies pressure to the back contact battery. In this way, on the one hand, the length of the test probe 102 can be adjusted to adapt to different test conditions, and on the other hand, the reliability of the abutment between the test probe 102 and the back contact battery can be ensured, so as to avoid the disengagement between the test probe 102 and the back contact battery.
[0042] In some embodiments, the width of the test part 122 gradually increases in the direction of the main body 112 pointing to the test part 122. On the one hand, the maximum distance of the test part 122 moving towards the main body 112 can be limited, and on the other hand, the contact area of the test part 122 and the back contact battery can be increased.
[0043] In some embodiments, the length of the contact surface of the test portion 122 for contacting the back contact battery can be 0.1mm to 0.3mm, such as 0.15mm, 0.2mm or 0.25mm, etc., and the width of the contact surface of the test portion 122 for contacting the back contact battery can be 0.1mm to 0.3mm, such as 0.15mm, 0.2mm or 0.25mm, etc. For the test portion 122, the length and width of the contact surface of the test portion 122 for contacting the back contact battery affect the contact area of the back contact battery. The greater the length and width of the contact surface of the test portion 122 for contacting the back contact battery, the smaller the contact resistance during testing. However, the greater the length and width of the contact surface of the test portion 122 for contacting the back contact battery, the greater the contact area of the test portion 122 for contacting the back contact battery, which can cause the test portion 122 to contact different types of grid lines when contacting the back contact battery, resulting in short circuit between the test portion 122 and the back contact battery. Therefore, setting the length and width of the contact surface of the test portion 122 for contacting the back contact battery to be 0.1mm to 0.3mm can increase the contact area of the test portion 122 for contacting the back contact battery while avoiding affecting the reliability of the test.
[0044] In some embodiments, the test probe 102 further comprises a reset device 132 fixed in the accommodation space and abutting against the test portion 122. The reset device 132 is compressed in the stressed state and returns to the original state after the test is completed. For the reset device 132, the test portion 122 can be returned to the original state after the test is completed, facilitating the next test.
[0045] Furthermore, for the reset device 132, during the test, the test portion 122 moves towards the accommodation space. When the test portion 122 abuts against the reset device 132, the reset device 132 is compressed and exerts an elastic force on the test portion 122. Thus, when the test portion 122 moves a certain distance towards the reset device 132, the elastic force exerted by the reset device 132 can tightly contact the test probe 102 and the back contact battery, avoiding the test probe 102 and the back contact battery being spaced apart and causing poor contact between the test probe 102 and the back contact battery.
[0046] Reference Figure 3 In some embodiments, the suction nozzle 103 can comprise a nesting portion 113 fixed with the insulating support 100, a telescopic space being arranged in the nesting portion 113, and a plurality of through holes 133 arranged along the extension direction of the nesting portion 113 being arranged on the side wall of the nesting portion 113; a clamping portion 123 being arranged in the telescopic space, a clamping protrusion 143 being arranged on the side wall of the clamping portion 123, and the clamping protrusion 143 being used for clamping with the through holes 133 to fix the clamping portion 123 in the nesting portion 113.
[0047] For the suction nozzle 103, the clamping portion 123 is clamped in the nesting portion 113. When the length of the suction nozzle 103 needs to be adjusted, the clamping protrusion 143 can be pressed to deform the clamping protrusion 143. Then the length of the suction nozzle 103 can be adjusted by moving the clamping portion 123 up and down. When the length of the suction nozzle 103 is adjusted, the pressing of the clamping protrusion 143 is stopped, and the clamping protrusion 143 is aligned with the through hole 133 of the nesting portion 113. The clamping protrusion 143 protrudes from the through hole 133 to fix the clamping portion 123 in the nesting portion 113.
[0048] By setting the nesting portion 113 and the clamping portion 123, the length of the suction nozzle 103 can be adjusted to match different test conditions, thereby improving the adaptability of the test device.
[0049] With reference to the foregoing description Figures 1 to 4 In some embodiments, a row of suction nozzles 103 is arranged between every two adjacent rows of test probes 102. The two adjacent rows of test probes 102 are separated by the suction nozzles 103. On the one hand, the short circuit between the two adjacent rows of test probes 102 can be avoided. On the other hand, the suction nozzles 103 can provide sufficient suction force to avoid displacement of the back contact battery during the test.
[0050] In some embodiments, an air extraction device (not shown) can be further included, which is in communication with the suction nozzles 103 and is used to extract air from the contact surface of the suction nozzles 103 and the back contact battery. The air extraction device can continuously extract air from the space between the suction nozzles 103 and the back contact battery, thereby continuously providing suction force to avoid the back contact battery from being detached from the suction nozzles 103, and to avoid the back contact battery from slipping off the test probes 102 during the test, thereby avoiding test abnormalities.
[0051] In some embodiments, the number of suction nozzles 103 is greater than or equal to the total force applied by all the test probes 102 to the back contact battery divided by the suction force provided by each suction nozzle 103. For example, the test probes 102 provide a force of 1N when in close contact with the back contact battery. There are a total of 30 test probes 102. During the test, the back contact battery will be subjected to a total force of 30N from the test probes 102. Therefore, the suction nozzles 103 need to provide a force greater than or equal to 30N to avoid the back contact battery from slipping off the test probes 102. Therefore, by setting the number of suction nozzles 103 to be greater than or equal to the total force applied by all the test probes 102 to the back contact battery divided by the suction force provided by each suction nozzle 103, the back contact battery can be prevented from slipping off the test probes 102 during the test, thereby avoiding test abnormalities.
[0052] For the back contact cell with main grid, the test probe 102 provided by the embodiment of the present disclosure can be directly in contact with the main grid for electrical connection, and the suction nozzle 103 can be directly opposite to the space between the main grids, so as to fix the back contact cell, thereby avoiding the movement of the back contact cell during the test.
[0053] Compared with the back contact cell without main grid, the back contact cell with main grid is more convenient during the test. The interval between adjacent main grids is larger than the interval between adjacent sub-grids of the back contact cell without main grid. For the test device, the larger the interval is, the larger the area of the contact surface between the test probe and the back contact cell can be set, and the more convenient the alignment of the test device is.
[0054] For the back contact cell without main grid, the test device needs to be aligned with the sub-grid. However, the interval between the sub-grids of the back contact cell without main grid is small. Therefore, the area of the contact surface between the test probe and the back contact cell needs to be reduced, so as to avoid that one test probe is connected to two sub-grids with different polarities at the same time. However, the reduction of the area will increase the contact resistance and result in inaccurate test results. Based on this, the embodiment of the present disclosure sets the two test probes 102 adjacent to each other on the same row to be staggered with each other.
[0055] Reference Figure 4 and Figure 5 In some embodiments, in the direction along which the conductive support 101 is arranged, the two test probes 102 adjacent to each other on the same row are staggered with each other. In this way, the same test probe 102 can be prevented from contacting the grid lines with different doping types at the same time during the test, so as to avoid the short circuit during the test. Moreover, a larger space can be left between the test probes 102 staggered with each other, so as to further increase the area of the test probe 102 for contact with the back contact cell.
[0056] In the embodiment of the present disclosure, the test probe 102 is used to electrically contact the grid line of the back contact cell, so as to obtain the electrical performance of the back contact cell. The suction nozzle 103 is used to adsorb the back contact cell, so as to offset the force applied to the back contact cell by the test probe 102 during the test, so as to avoid the movement of the back contact cell during the test. Moreover, the suction nozzle 103 can be moved towards or away from the insulating support 100, so as to further improve the adaptability of the suction nozzle 103 and the test probe 102.
[0057] Another embodiment of the present disclosure further provides a test system, which can include the test device described above. The test system provided by the embodiment of the present disclosure will be described below. It should be noted that the same or corresponding contents as the above embodiments can refer to the above embodiments, which will not be described herein.
[0058] In some embodiments, the test system can include a plurality of insulating supports and a plurality of conductive supports arranged alternately.
[0059] The test system can further include a plurality of test probes arranged in a plurality of rows at intervals, each row of test probes being fixed on a conductive support, and an end of the test probe away from the conductive support being used to abut against the back contact battery.
[0060] The test system can further include a plurality of suction nozzles arranged in a plurality of rows at intervals, each row of suction nozzles being fixed on an insulating support, and an end of the suction nozzle away from the insulating support being used to abut against the back contact battery, and the suction nozzle being movable in a direction towards or away from the insulating support.
[0061] The test system can further include a test machine electrically connected to the test probes, for acquiring an electrical signal of the back contact battery and judging an electrical performance of the back contact battery.
[0062] The test probe is used to make electrical contact with the electrode of the back contact battery, the suction nozzle is used to avoid slipping between the test probe and the back contact battery during the test, and the test machine is used to acquire the electrical performance of the back contact battery, so that the test of the back contact battery can be completed, and the distance between the insulating support and the conductive support can be adjusted, so that the test system can also be used to test back contact batteries of different sizes, thereby improving the versatility of the test system.
[0063] In some embodiments, the test system further includes a light source for irradiating the front surface of the back contact battery, so that the test probe and the test machine judge the quality of the back contact battery by acquiring the electrical performance of the back contact battery.
[0064] In some embodiments, the insulating support and the conductive support can be connected to the machine by a tooling, for example, can be fixed on the test machine, so as to facilitate the connection between the conductive support and the test machine.
[0065] Those skilled in the art can understand that the above-mentioned embodiments are specific embodiments for implementing the present disclosure, and in actual application, various changes can be made in form and details without departing from the spirit and scope of the embodiments of the present disclosure. Any person skilled in the art can make various modifications and changes without departing from the spirit and scope of the embodiments of the present disclosure, therefore the protection scope of the embodiments of the present disclosure should be subject to the scope defined by the claims.
Claims
1. A testing device for testing a back contact cell, characterized in that, The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases.
2. The test device of claim 1, wherein, The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises:
3. The test device of claim 2, wherein, a body part for fixing with the conductive support, and a containing space is arranged in the body part; 4. The test device of claim 2, wherein, a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases.
5. The test device of claim 1, wherein, The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises:
6. The test device of claim 1, wherein, a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress.
7. The test device of claim 1, wherein, In the direction of the body part pointing to the test part, the width of the test part gradually increases.
8. The test device of claim 1, wherein, The test probe further comprises:
9. The test device of claim 1, wherein, a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed.
10. A test system for testing back contact cells, characterized by, The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part for fixing with the conductive support, and a containing space is arranged in the body part; a test part slidingly fixed on one side of the body part away from the conductive support, and moving towards the containing space under stress. In the direction of the body part pointing to the test part, the width of the test part gradually increases. The test probe further comprises: a reset device fixed in the containing space and abutting against the test part, and the reset device is compressed under stress and returns to the original state after the test is completed. The test probe comprises: a body part