Battery piece testing device
By designing the structure of the test plate and pressing component in the cell testing device, stable contact between the conductive protrusions and the test points is ensured, solving the problem of poor contact in cell testing and improving the accuracy and consistency of the test.
Patent Information
- Application Number
- CN202520288985.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-21
- Publication Date
- 2025-12-09
- Estimated Expiration
- 2035-02-21
AI Technical Summary
In existing technologies, during cell testing, it is impossible to effectively guarantee the stability of the contact between each protrusion and the pad or grid line, resulting in inaccurate test results.
A testing device was designed, including a test plate and a pressing component. The conductive protrusions are arranged opposite to the pressing component, and their orthogonal projections along the thickness direction overlap. The pressing component is pressed on the second side of the battery cell to ensure that the conductive protrusions are in close contact with the test points. Structures such as elastic probes are used to improve contact stability.
This achieves tight and stable contact between the conductive protrusion and the test point, avoiding poor contact and improving the accuracy and repeatability of the test results.
Smart Images
Figure CN223652226U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of photovoltaic technology, and in particular to a testing device. Background Technology
[0002] When performing IV (current-voltage) and EL (electroluminescence) tests on solar cells, a testing device must be used.
[0003] In related technologies, the testing device includes a lower test plate with multiple conductive protrusions. During testing, the protrusions contact the pads or grid lines on the surface of the solar cell.
[0004] However, during actual testing of solar cells, it is impossible to effectively guarantee the stability of the contact between each protrusion and its corresponding pad or grid line. Poor contact between the protrusion and its corresponding pad or grid line will affect the accuracy of the test results. Utility Model Content
[0005] This invention provides a testing device that aims to at least solve the problem in the prior art that the stability of the contact between each protrusion and the corresponding pad or grid line cannot be effectively guaranteed during actual testing of battery cells.
[0006] This utility model embodiment provides a testing device, including:
[0007] The test board includes a plurality of conductive protrusions spaced apart at least along a first direction, wherein the top surface of the conductive protrusions is a contact area along the direction away from the test board.
[0008] At least a plurality of pressing components are arranged at intervals along a first direction, the pressing components are positioned opposite to the test plate, and the pressing surface near the test plate is the pressing area;
[0009] Along the thickness direction of the test plate, the orthographic projection of each contact area and the orthographic projection of the pressing area at least partially overlap.
[0010] Optionally, the multiple conductive protrusions and multiple pressing elements are also arranged at intervals along a second direction, which intersects with the first direction.
[0011] Optionally, the press-fit element is positioned above the top surface of the conductive protrusion.
[0012] Optionally, the orthographic projection of the pressing area along the thickness direction of the test plate can be circular, elliptical, or rectangular.
[0013] Optionally, the overlap area between the orthographic projection of the contact area and the orthographic projection of the pressing area is at least 20% of the orthographic projection area of the contact area.
[0014] Optionally, along the thickness direction of the test plate, the orthographic projection of each pressing area at least partially overlaps with the orthographic projection of N1 of the contact areas, where N1 is greater than or equal to 1.
[0015] Optionally, N1 is 2-10.
[0016] Optionally, when N1 is greater than or equal to 3, along the first direction, the N1 conductive bumps include two edge conductive bumps and at least one intermediate conductive bump;
[0017] The orthographic projection of each pressing area completely overlaps with the orthographic projection of the contact area of the middle conductive protrusion, and the overlapping area with the orthographic projection of the contact area of the edge conductive protrusion is at least 20% of the orthographic projection area of the contact area of the edge conductive protrusion.
[0018] Optionally, the press-fit part is a flexible probe, and / or the conductive protrusion is a flexible probe.
[0019] Optionally, along the first direction, the distance between two adjacent pressed parts is greater than or equal to 0.3 mm and less than or equal to 2 mm.
[0020] Optionally, the testing device is used for electrical performance testing of the solar cell, and the conductive protrusion is used to make electrical contact with the test point of the solar cell; the solar cell has several current collector grid lines, and the test point is the area on the current collector grid line used to contact the conductive protrusion, or the test point is the connection part connected to the current collector grid line.
[0021] In this embodiment of the invention, during battery cell testing, multiple pressing components are pressed onto the second side of the battery cell, ensuring that the test points on the first side of the battery cell are in close and stable contact with the conductive protrusions in the test plate. Furthermore, along the thickness direction of the test plate, the orthographic projection of each contact area at least partially overlaps with the orthographic projection of the pressing area. This means that the contact points between each conductive protrusion and its corresponding test point are subjected to pressure from the pressing components, ensuring that each conductive protrusion is in close and stable contact with its corresponding test point. This avoids situations where some conductive protrusions are not in stable contact with their corresponding test points due to the lack of pressure from the pressing components, thus preventing poor contact between some conductive protrusions and the test points.
[0022] The above description is only an overview of the technical solution of this utility model. In order to better understand the technical means of this utility model, it can be implemented according to the contents of the specification. In order to make the above and other objects, features and advantages of this utility model more obvious and easy to understand, the following are specific embodiments of this utility model. Attached Figure Description
[0023] Figure 1 This is a schematic diagram of the structure of the battery cell testing device provided in an embodiment of the present invention;
[0024] Figure 2 A front view schematic diagram of the pressing component array, test plate, and battery cell provided in an embodiment of this utility model;
[0025] Figure 3 A top view of the press-fit column, conductive protrusion column, and battery cell provided in an embodiment of this utility model. Figure 1 ;
[0026] Figure 4 A top view of the press-fit column, conductive protrusion column, and battery cell provided in an embodiment of this utility model. Figure 2 ;
[0027] Figure 5 This is a top view of the press-fit assembly and battery cells provided in an embodiment of the present invention.
[0028] Figure label:
[0029] 1-Pressing component row, 11-Pressing component, 111-Probe head, 1111-Pressing area, 2-Test plate, 21-Conductive protrusion row, 211-Conductive protrusion, 3-Adsorption base plate, 4-Vacuum adsorption connector, 5-Transparent cover plate, 6-Battery cell, 61-Current collector grid line, 62-Pad. Detailed Implementation
[0030] Exemplary embodiments of the present invention will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
[0031] The testing equipment is used to test the performance of individual solar cells, specifically for IV and EL testing. IV testing primarily measures the current-voltage characteristic curves of the solar cell under different illumination and temperature conditions to evaluate key parameters such as conversion efficiency and power output. During IV testing, light is shone onto the second side of the solar cell through a light source to simulate sunlight, testing the cell's performance under illumination. For EL testing, a forward bias voltage is applied to the solar cell, causing it to emit photons. An EL imaging device then captures an image of the solar cell.
[0032] In related technologies, testing devices include a lower test plate with multiple conductive protrusions. During testing, these protrusions contact the pads or grid lines on the surface of the solar cell. However, in actual solar cell testing, it is impossible to guarantee the stability of contact between all protrusions and their corresponding pads or grid lines. Poor contact between protrusions and their corresponding pads or grid lines can affect the accuracy of the test results. To address these issues, this utility model provides a solar cell testing device, which is described in detail below.
[0033] Reference Figures 1 to 5 This utility model discloses a testing device, including a test plate 2 and a plurality of pressing members 11 arranged at least at intervals along a first direction. The test plate 2 includes a plurality of conductive protrusions 211 arranged at least at intervals along the first direction. Along the direction away from the test plate, the top surface of the conductive protrusions 211 is the contact area. The pressing members 11 are disposed opposite to the conductive protrusions 211, and the pressing surface near the conductive protrusions 211 is the pressing area 1111.
[0034] In some embodiments, along the thickness direction of the test plate 2, the orthographic projection of each contact area at least partially overlaps with the orthographic projection of the pressing area 1111. When the testing device is applied to test the battery cell 6, multiple pressing members 11 press against the second surface of the battery cell 6, making the test points on the first surface of the battery cell 6 in tight and stable contact with the conductive protrusions 211 in the test plate 2. Furthermore, the contact points between each conductive protrusion 211 and the corresponding test point are all subject to the pressure of the pressing member 11, ensuring that each conductive protrusion 211 is in tight and stable contact with the corresponding test point. This avoids the situation where some conductive protrusions 211 are not in stable contact with the corresponding test point due to the lack of pressure from the pressing member 11 at their contact points, thus preventing poor contact between some conductive protrusions and the test point.
[0035] In some embodiments, the solar cell 6 has a plurality of current collector grid lines 61, i.e., fine grids. The test point is a region on the current collector grid line 61 for contacting the conductive protrusion 211, or the test point is a connection portion connected to the current collector grid line 61. The connection portion can be a pad 62 or a thickened section connected to the current collector grid line 61. Multiple conductive protrusions 211 correspond one-to-one with multiple test points. When the test point is a pad 62 connected to the current collector grid line 61, multiple conductive protrusions 211 correspond one-to-one with multiple pads 62. The solar cell 6 can also be a back-contact solar cell, where the first side of the solar cell 6 can be the back side of the solar cell 6, and the second side of the solar cell 6 can be the front side of the solar cell. The positive and negative grid lines of the back contact cell are both located on the back side of the back contact cell. With the increase in the number of grid lines on the back side, when the test point is the area on the pad 62 or the current collector grid line 61, the contact area between the conductive protrusion 211 and the test point will be smaller than that of a conventional cell with a main grid. It is necessary to increase the overlap of the contact area and the pressing area to improve the stability of the contact between the conductive protrusion 211 and the cell 6, so as to improve the test accuracy.
[0036] In some embodiments, a plurality of press-fit members 11 are located above the top surface of the conductive protrusions. The conductive protrusions 211 protrude from the upper surface of the test plate 2 facing the press-fit members 11. The contact area of the conductive protrusions 211 can be all the area of the conductive protrusions 211 facing the top surface of the press-fit members 11, or it can be a portion of the top surface. During the testing of the battery cell 6, the battery cell 6 is located between the plurality of press-fit members 11 and the test plate 2, and the conductive protrusions 211 are electrically connected to the test points on the battery cell 6 to test the performance of the battery cell 6.
[0037] The pressing component 11 can be an elastic probe, a pressing post, a pressing strip, a pressing block, a holding gripper, a lower pressing plate, or a transparent glass plate, etc. The pressing component 11 only presses on the first side of the battery cell 6 and is not electrically connected to the battery cell 6. In some embodiments, the pressing component 11 is an elastic probe, which can prevent the battery cell 6 from cracking. When the pressing component 11 is an elastic probe, the pressing component 11 includes a probe head 111, and the pressing area is the lower surface of the test plate 2 facing the probe head 111. The orthographic projection of the pressing area 1111 in each pressing component 11 overlaps with the orthographic projection of the contact area in at least one conductive protrusion 211. The first direction can be referenced. Figures 2 to 5 The direction indicated by arrow B in the middle.
[0038] In some embodiments, the plurality of conductive protrusions 211 and the plurality of pressing members 11 are also arranged at intervals along a second direction, which intersects with the first direction.
[0039] In some embodiments, the second direction is perpendicular to the first direction, and the second direction can be referenced. Figures 3 to 5The direction indicated by arrow C. Multiple conductive protrusions 211 spaced apart along the first direction form a conductive protrusion row 21, and multiple pressing members 11 spaced apart along the first direction form a pressing member row 1. That is, the extending directions of the conductive protrusion row 21 and the pressing member row 1 are consistent with the first direction. Both the multiple pressing member rows 1 and the multiple conductive protrusion rows 21 are spaced apart along the second direction, and each pressing member row 1 corresponds one-to-one with a single conductive protrusion row 21. The conductive protrusion rows 21 can be divided into positive conductive protrusion rows and negative conductive protrusion rows.
[0040] In some embodiments, the shape of the orthographic projection of the pressing area 1111 along the thickness direction of the test plate 2 is circular, elliptical, or rectangular.
[0041] In some embodiments, refer to Figure 3 and Figure 5 In conventional pressed parts 11, the shape of the pressing area 1111 is circular. In this embodiment, the shape of the pressing area 1111 is set to circular based on considerations such as light blocking area, force uniformity and material.
[0042] In some embodiments, refer to Figure 4 The pressing region 1111 itself has a length direction and a width direction. The pressing region 1111 includes two first sides arranged opposite each other along the length direction of the pressing region 1111 and two second sides arranged opposite each other along the width direction of the pressing region 1111. The shape of the pressing region 1111 is rectangular. When the shape of the orthographic projection of the pressing region 1111 is rectangular, the width of the pressing region 1111 can be designed to be smaller, thereby helping to reduce the shading area of the multiple pressing parts 11 that block the light above the battery cell 6.
[0043] In other embodiments, the shape of the orthographic projection of the pressing area 1111 can also be a rectangle with rounded corners, a trapezoid, a parallelogram, an oblong shape, etc.
[0044] In some embodiments, along the thickness direction of the test plate 2, the orthographic projection of the pressing area 1111 in each pressing member 11 at least partially overlaps with the orthographic projection of the contact area of N1 conductive protrusions 211, where N1 is greater than or equal to 1.
[0045] In this embodiment, each pressing member 11 corresponds to N1 conductive protrusions 211. The number of conductive protrusions 211 corresponding to each pressing member 11 can be equal. In this case, the total number of pressing members 11 is 1 / N1 of the total number of conductive protrusions 211.
[0046] For example, when each pressing member 11 has two conductive protrusions 211, the total number of pressing members 11 is half the total number of conductive protrusions 211. When each pressing member 11 has three conductive protrusions 211, the total number of pressing members 11 is one-third the total number of conductive protrusions 211. When each pressing member 11 has four conductive protrusions 211, the total number of pressing members 11 is one-quarter the total number of conductive protrusions 211.
[0047] In some embodiments, N1 is 2-10. When N1 is greater than or equal to 2, each pressing member 11 corresponds to at least two conductive protrusions 211. Compared to a one-to-one correspondence between pressing members 11 and conductive protrusions 211, the number of pressing members 11 can be reduced, thus lowering the cost of the equipment. Furthermore, increasing the contact area can improve the stability of pressing and can accommodate different shapes of the orthographic projection of the pressing area 1111, achieving uniform force distribution and reducing the light-blocking effect of the pressing area.
[0048] In some embodiments, N1 is 2-4, and each pressing member 11 corresponds to 2-4 conductive protrusions 211. Along the thickness direction of the test plate 2, the orthographic projection of the pressing area 1111 in each pressing member 11 at least partially overlaps with the orthographic projection of the contact area in each of the 2-4 conductive protrusions 211. For example, when N1 is 2, along the thickness direction of the test plate 2, the orthographic projection of the pressing area 1111 in each pressing member 11 overlaps with the orthographic projection of the contact area in each of the two conductive protrusions 211 by at least 20% of the area. In this embodiment, each pressing member 11 corresponds to 2-4 conductive protrusions 211. While reducing the number of pressing members 11, the pressing area 1111 has a good size and area, which can reduce the shading area of multiple pressing members 11 blocking the light above the battery cell 6, thereby reducing the test error caused by the light blocking of multiple pressing members 11 and ensuring the battery
[0049] The accuracy of IV and EL tests on slice 6.
[0050] In some embodiments, when N1 is greater than or equal to 3, along the first direction, N1 conductive protrusions 211 include two edge conductive protrusions and at least one intermediate conductive protrusion; the orthographic projection of each pressing region 1111 completely overlaps with the orthographic projection of the contact region of the intermediate conductive protrusion, and the overlapping area with the orthographic projection of the contact region of the edge conductive protrusion accounts for at least 20% of the orthographic projection area of the contact region of the edge conductive protrusion.
[0051] Each pressing region 1111 corresponds to N1 conductive protrusions 211. Among the N1 conductive protrusions 211 corresponding to a pressing region 1111, the edge conductive protrusions are the conductive protrusions 211 that are close to the edge of the pressing region 1111 along the first direction. The middle conductive protrusion is the conductive protrusion located between two edge conductive protrusions among the N1 conductive protrusions 211.
[0052] Reference Figure 3 When N1 is 3, the three conductive protrusions 211 include two edge conductive protrusions and one middle conductive protrusion. Along the thickness direction of the test plate 2, the orthographic projection of each pressing area 1111 completely overlaps with the orthographic projection of the contact area of one middle conductive protrusion, and the overlapping area with the orthographic projection of the contact area of the two edge conductive protrusions is at least 20% of the orthographic projection area of the contact area of the edge conductive protrusion.
[0053] When N1 is 3 and the test point is pad 62, each pressed component 11 corresponds to three pads 62. Along the thickness direction of the test board 2, the orthographic projection of each pressed area 1111 completely overlaps with the orthographic projection of one pad 62, and overlaps with the orthographic projection of the other two pads 62 by at least 20% of the area.
[0054] When N1 is 4, the four conductive protrusions 211 include two edge conductive protrusions and two middle conductive protrusions. Along the thickness direction of the test plate 2, the orthographic projection of the pressing area 1111 in each pressing component 11 completely overlaps with the orthographic projection of the contact area of the two middle conductive protrusions, and the overlapping area with the orthographic projection of the contact area of the two edge conductive protrusions accounts for at least 20% of the orthographic projection area of the contact area of the edge conductive protrusions.
[0055] When N1 is 5, refer to Figure 4 The five conductive protrusions 211 include two edge conductive protrusions and three middle conductive protrusions. The orthographic projection of each pressing area 1111 completely overlaps with the orthographic projection of the contact area of the three middle conductive protrusions, and also completely overlaps with the orthographic projection of the contact area of the two edge conductive protrusions.
[0056] Each pressing component 11 optimally corresponds to one of the three conductive protrusions 211. In this configuration, the pressing area 1111 has a good size and area, resulting in a smaller area of light obstruction from the multiple pressing components 11 above the solar cell 6. This leads to higher accuracy in the IV and EL tests of the solar cell 6 and higher consistency in repeated tests. Furthermore, when the orthographic projection of each pressing area 1111 overlaps with 50% of the orthographic projection of the contact area of the two edge conductive protrusions, the size of the pressing area 1111 is minimized while ensuring that the pressing area 1111 presses against the contact points of the three conductive protrusions 211 and their corresponding test points.
[0057] It should be noted that the number of conductive protrusions 211 corresponding to some of the pressed parts 11 may also be different.
[0058] For example, the number of conductive protrusions 211 corresponding to one press-fit part 11 is two, and the number of conductive protrusions 211 corresponding to one press-fit part 11 is three.
[0059] In some embodiments, along the first direction, the diameter of the pressed region 1111 is less than or equal to the total length of the adjacent N1 conductive protrusions 211.
[0060] The cross-sectional shape of the conductive protrusion 211 can be circular. In this case, the total length of the N1 conductive protrusions 211 is equal to N1×D1+(N1-1)×L1, where D1 is the diameter of the conductive protrusion 211 and L1 is the distance between two adjacent conductive protrusions 211 along the first direction. In this embodiment, the diameter of the pressing area 1111 is less than or equal to the total length of the N1 conductive protrusions 211. While ensuring that the pressing area 1111 presses against the contact points of the N1 conductive protrusions 211 and the corresponding test points, the size of the pressing area 1111 can be minimized as much as possible, thereby reducing the shading area of the multiple pressing components 11 that blocks the light above the battery cell 6.
[0061] In some embodiments, refer to Figure 4 The width of the pressing area 1111 along the second direction is greater than or equal to the dimension of the conductive protrusion 211 along the second direction, and less than twice the dimension of the conductive protrusion 211 along the second direction.
[0062] Preferably, the width of the pressing area 1111 along the second direction is less than or equal to 1.5 times the width of the conductive protrusion 211 along the second direction. In this embodiment, the smaller width of the pressing area 1111 reduces the area of light blocked by the multiple pressing members 11 above the battery cell 6, thereby reducing the test error caused by the light blocking by the multiple pressing members 11 and ensuring the test accuracy of the battery cell 6.
[0063] In some embodiments, along the first direction, the distance between two adjacent pressing parts 11 is greater than or equal to 0.3 mm and less than or equal to 2 mm. In this case, the number of pressing parts satisfies the stability of the pressing, and at the same time, it can leave enough installation space for the installation of each pressing part 11, which is conducive to the installation of the pressing part 11.
[0064] It should be noted that, along the first direction, the distance between two adjacent pressing parts 11 is specifically the center-to-center distance between two adjacent probe heads 111.
[0065] In some embodiments, the conductive protrusion is an elastic probe.
[0066] In some embodiments, the battery cell testing apparatus further includes a transparent cover plate 5, and a plurality of pressing members 11 are disposed on the side of the transparent cover plate 5 near the test plate 2. The transparent cover plate 5 is made of a transparent material with a light transmittance greater than or equal to 90%, such as quartz, glass, or organic polymer materials. A plurality of probe sleeves may be disposed on the transparent cover plate 5, and the pressing members 11 may be mounted on the probe sleeves by springs.
[0067] In some embodiments, the test plate 2 has a vacuum adsorption function to adsorb the battery cell 6 onto its upper surface. The test plate 2 has multiple adsorption holes. The battery cell testing device also includes an adsorption base plate 3 and a vacuum generator. The test plate 2 is disposed on the adsorption base plate 3, which has adsorption channels communicating with the multiple adsorption holes. The adsorption base plate 3 also has an adsorption interface communicating with the adsorption channels. A vacuum adsorption connector 4 is installed on the adsorption interface, and the vacuum generator is connected to the vacuum adsorption connector 4 via a vacuum pipeline.
[0068] In some embodiments, the battery cell testing device further includes a first lifting component and a second lifting component. The first lifting component is connected to the transparent cover plate 5 and is used to drive the transparent cover plate 5 to move up and down. The second lifting component is connected to the adsorption base plate 3 and is used to drive the test plate 2 and the adsorption base plate 3 to move up and down.
[0069] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.
[0070] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims. All of these forms are within the protection scope of the present invention.
Claims
1. A testing device, characterized in that, include: The test board includes a plurality of conductive protrusions spaced apart at least along a first direction, wherein the top surface of the conductive protrusions is a contact area along a direction away from the test board. At least a plurality of pressing members are arranged at intervals along the first direction, the pressing members are disposed opposite to the conductive protrusion, and the pressing surface near the conductive protrusion is the pressing area; Wherein, along the thickness direction of the test plate, the orthographic projection of each contact area and the orthographic projection of the pressing area at least partially overlap.
2. The testing apparatus according to claim 1, characterized in that, The plurality of conductive protrusions and the plurality of pressing members are also arranged at intervals along a second direction, which intersects the first direction.
3. The testing apparatus according to claim 1, characterized in that, The press-fit component is disposed above the top surface of the conductive protrusion.
4. The testing apparatus according to claim 1, characterized in that, Along the thickness direction of the test plate, the orthographic projection of the pressing area is circular, elliptical, or rectangular.
5. The testing apparatus according to claim 1, characterized in that, The overlap area between the orthographic projection of the contact area and the orthographic projection of the pressing area is at least 20% of the orthographic projection area of the contact area.
6. The testing apparatus according to claim 1, characterized in that, Along the thickness direction of the test plate, the orthographic projection of each of the pressing areas at least partially overlaps with the orthographic projections of N1 of the contact areas, where N1 is greater than or equal to 1.
7. The testing apparatus according to claim 6, characterized in that, N1 is 2-10.
8. The testing apparatus according to claim 6 or 7, characterized in that, When N1 is greater than or equal to 3, along the first direction, N1 of the conductive bumps include two edge conductive bumps and at least one intermediate conductive bump; The orthographic projection of each of the pressing regions completely overlaps with the orthographic projection of the contact region of the intermediate conductive protrusion, and the overlapping area with the orthographic projection of the contact region of the edge conductive protrusion accounts for at least 20% of the orthographic projection area of the contact region of the edge conductive protrusion.
9. The testing apparatus according to claim 1, characterized in that, The press-fit component is an elastic probe, and / or the conductive protrusion is an elastic probe.
10. The testing apparatus according to claim 1, characterized in that, Along the first direction, the distance between two adjacent pressed parts is greater than or equal to 0.3 mm and less than or equal to 2 mm.
11. The testing apparatus according to claim 1, characterized in that, The testing device is used for testing the electrical performance of the battery cell, and the conductive protrusion is used to make electrical contact with the test point of the battery cell. The battery cell includes a plurality of current collector grid lines, and the test point is a region on the current collector grid line that is used to contact the conductive protrusion, or the test point is a connection part connected to the current collector grid line.