Insertion loss testing device

Abstract

The utility model provides an insertion loss testing device which comprises a base, a testing part and a placing part. The testing part is suitable for connecting a testing probe. The placing part is suitable for placing electronic equipment. The testing part is in sliding connection with the base so that the testing part can move in the vertical direction relative to the placing part, and the testing part and / or the placing part are / is in sliding connection with the base so that the testing part and the placing part can move relatively in the first horizontal direction perpendicular to the vertical direction. According to the scheme of the utility model, the test process is more convenient, and risks such as data errors caused by different locking degrees are avoided. Therefore, the insertion loss testing device provided by the utility model can enable the insertion loss testing operation to be convenient and the testing reliability to be high.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of insertion loss measurement, particularly relates to a plug loss testing device. BACKGROUND

[0002] In the related art, the plug loss test uses SMA measurement method, that is, personnel uses screwdriver to tighten the SMA probe on the plug loss coupon, which has the risk of long time consumption and data error caused by different locking degrees, and when the product has multiple test points, the traditional test method further increases the disadvantages of long time consumption and the difficulty in unifying the locking effect. UTILITY MODEL CONTENT

[0003] The utility model discloses a plug loss testing device, which can make plug loss test operation convenient and has high test reliability.

[0004] To achieve the above-mentioned purpose, the utility model embodiment adopts the following technical scheme:

[0005] The plug loss testing device is used for testing the insertion loss of an electronic device, and comprises:

[0006] a base;

[0007] a test part adapted to connect a test probe;

[0008] a placing part adapted to place the electronic device;

[0009] The test part is slidingly connected to the base to enable the test part to move in a vertical direction relative to the placing part, and the test part and / or the placing part are slidingly connected to the base to enable the test part and the placing part to move relative to each other in a first horizontal direction perpendicular to the vertical direction.

[0010] In some embodiments, the placing part comprises a placing member and a positioning member, the placing member forms a first slot and a second slot that are in communication with each other, the first slot is used for placing the electronic device, and the positioning member is located in the second slot and is configured to abut against the electronic device located in the first slot in a direction perpendicular to the vertical direction.

[0011] In some embodiments, the second horizontal direction is perpendicular to both the first horizontal direction and the vertical direction, the size of the first slot along the first horizontal direction is greater than the size along the second horizontal direction, the number of the positioning members is multiple, at least one positioning member can abut against the electronic device along the first horizontal direction, and at least two positioning members can abut against the electronic device along the second horizontal direction.

[0012] In some embodiments, the height of the positioning member is lower than the height of the upper end surface of the placing member.

[0013] In some embodiments, the insertion loss testing device further comprises a test probe fixedly connected to the test part, and the test probe is provided with a positioning protrusion, and the placement part is provided with a plurality of positioning holes arranged along the first horizontal direction, and the positioning protrusion can extend into one of the positioning holes along the vertical direction.

[0014] In some embodiments, the placement part is slidably connected to the base, and the placement part is provided with a plurality of scales arranged along the first horizontal direction, and each scale corresponds to one of the positioning holes.

[0015] In some embodiments, the insertion loss testing device further comprises a support part and a test probe and a radio frequency wire connected to each other, the test probe is fixedly connected to the test part, the support part comprises a support block and a pressing block, the support block is provided with a groove, one end of the radio frequency wire is connected to the test probe, and the other end of the radio frequency wire is arranged in the groove and is abutted by the pressing block.

[0016] In some embodiments, as viewed along the first horizontal direction, the radio frequency wire extends along the vertical direction, and the second horizontal direction is perpendicular to the first horizontal direction and the vertical direction, and as viewed along the second horizontal direction, the radio frequency wire extends along an axis parallel to the second horizontal direction.

[0017] In some embodiments, the insertion loss testing device further comprises a test probe and a radio frequency wire connected to each other, the test probe is fixedly connected to the test part, one end of the radio frequency wire is connected to the test probe, and the test part comprises a connecting block, a first plate body, a first connecting rod and a second connecting rod, the connecting block is adapted to connect the test probe, the second horizontal direction is perpendicular to the first horizontal direction and the vertical direction, the first connecting rod and the second connecting rod are arranged along the second horizontal direction, the upper sides of the first connecting rod and the second connecting rod are connected to the first plate body, the lower sides of the first connecting rod and the second connecting rod are connected to the test part, the first plate body, the test part, the first connecting rod and the second connecting rod jointly form an accommodation opening, and as viewed along the first horizontal direction, the radio frequency wire is located in the accommodation opening.

[0018] In some embodiments, the test part comprises a first plate body, a second plate body and a plurality of elastic members, as viewed along a direction perpendicular to the vertical direction, the elastic members are symmetrically distributed on both sides of the first plate body and the second plate body, the first plate body is connected to the test part, and the elastic members are connected between the first plate body and the second plate body, so that the second plate body can move and drive the first plate body under the driving force along the vertical direction.

[0019] Compared with the prior art, the utility model has the advantages of:

[0020] The plug loss testing device of the utility model discloses a base, test part and the placement part. The test part is suitable for connecting the test probe. The placement part is suitable for placing the electronic equipment. The test part is slidably connected with the base, so that the test part moves along the vertical direction relative to the placement part. The test part and / or the placement part is slidably connected with the base, so that the test part and the placement part move relative to each other along the first horizontal direction perpendicular to the vertical direction. In the scheme of the utility model, on the one hand, the test action of the test probe can be facilitated by the sliding of the test part along the vertical direction. On the other hand, the test probe can be switched between multiple test positions by the relative movement of the test part and the placement part along the first horizontal direction. Compared with the test mode relying on manual tightening of personnel in the related art, the scheme of the utility model can make the test process more convenient, and avoid the risk of data error caused by different locking degrees. Therefore, the plug loss testing device of the utility model can facilitate plug loss testing operation and has high test reliability. BRIEF DESCRIPTION OF DRAWINGS

[0021] In order to more clearly illustrate the technical scheme in the embodiments of the utility model or the prior art, the drawings needed to be used in the embodiment or the prior art description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the utility model, and other drawings can be obtained according to the structures shown in the drawings without creative labor for those skilled in the art.

[0022] Figure 1 It is a perspective view of the plug loss testing device provided in an embodiment of the utility model combined with the electronic equipment.

[0023] Figure 2 It is a perspective view of the placement part combined with the base provided in an embodiment of the utility model.

[0024] Figure 3 It is a front view of the support part provided in an embodiment of the utility model.

[0025] Figure 4 It is a perspective view of the support part provided in an embodiment of the utility model.

[0026] Figure 5 It is a front view of the plug loss testing device provided in an embodiment of the utility model.

[0027] Figure 6 It is a side view of the plug loss testing device provided in an embodiment of the utility model.

[0028] EXPLANATION OF DRAWINGS:

[0029] 100 - plug loss testing device;

[0030] 110 - base;

[0031] 120-test part; 121-connecting block; 122-first plate body; 123-first connecting rod; 124-second connecting rod; 125-second plate body; 126-receiving opening; 127-elastic member;

[0032] 130-placing part; 131-placing member; 1311-first slot; 1312-second slot; 132-positioning member; 133-positioning hole; 134-scale;

[0033] 140-test probe; 141-positioning protrusion;

[0034] 150-supporting part; 151-supporting block; 1511-slot body; 152-pressing block;

[0035] 160-radio frequency line;

[0036] 200-electronic device;

[0037] X-first horizontal direction;

[0038] Y-second horizontal direction;

[0039] Z-vertical direction.

[0040] The implementation, functional features and advantages of the utility model will be further described with reference to the drawings in combination with embodiments. DETAILED DESCRIPTION

[0041] The technical solutions in the embodiments of the utility model will be clearly and completely described in combination with the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.

[0042] It should be noted that if the embodiments of the utility model involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement condition, etc. between components in a certain posture, and if the certain posture changes, the directional indications also change accordingly.

[0043] In addition, if the description of "first", "second" and the like is involved in the embodiments of the utility model, the description of "first", "second" and the like is only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features limited by "first", "second" can be explicitly or implicitly included at least one of the features. In addition, if "and / or", "and / or" or "and / or" appears in the whole text, it means that the three parallel schemes are included, for example, "A and / or B" includes A scheme, or B scheme, or A and B scheme. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the realization of the ordinary skilled in the art, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, and is not within the protection scope required by the utility model.

[0044] In the related art, the insertion loss test uses SMA measurement method, that is, personnel uses screwdriver to tighten SMA probe on the insertion loss coupon, there are risks such as long time consumption and data error caused by different locking degrees, when the product has multiple test points, the long time consumption of the traditional test method is further increased, and the locking effect is difficult to unify.

[0045] Therefore, referring to Figures 1-6 In the embodiments of the utility model, a kind of insertion loss test device 100 is provided for testing the connection port of electronic equipment 200. Wherein, insertion loss is the insertion loss, it refers to the signal power loss caused by various factors of electronic equipment 200 when passing through electronic equipment 200, which can be expressed in decibel (dB), the smaller insertion loss, the smaller signal attenuation, the better performance of electronic equipment 200. The result of insertion loss test can evaluate the signal transmission quality of electronic equipment 200, or evaluate the manufacturing quality of electronic equipment 200, or provide basis for the design related to electronic equipment 200, for example, when designing communication system, electronic equipment 200 etc., need to understand insertion loss characteristics, so as to reasonably select component and carry out system optimization. Exemplarily, electronic equipment 200 suitable for insertion loss test device 100 can be finished product, such as communication equipment, computer equipment, audio equipment, medical equipment, industrial control equipment etc.;It can also be a spare part, such as circuit board, module assembly, insertion loss coupon etc. Wherein, insertion loss coupon refers to test sample or sample plate for testing insertion loss. In the field of electronic circuit, communication equipment, radio frequency system etc., in order to accurately measure and evaluate the insertion loss performance of certain element, module or circuit board, insertion loss coupon is specially designed and made.

[0046] Specifically, referring to Figures 1-2The insertion loss test device 100 comprises a base 110, a test part 120 and a placing part 130. The base 110 can serve as the base part of the insertion loss test device 100, and thus the base 110 can have any suitable structure shape according to requirements. The test part 120 is adapted to be connected with a test probe 140. The test probe 140 can be a radio frequency probe or an optical probe. The radio frequency probe is mainly used for the insertion loss test of high frequency signals. It can accurately measure the amplitude and phase of signals in a higher frequency range, so as to calculate the insertion loss value. The optical probe can measure the intensity, wavelength and other parameters of optical signals, so as to calculate the insertion loss of an optical communication system.

[0047] Referring to Figures 1-2 The placing part 130 is adapted to place an electronic device 200. The placing part 130 can be fixedly connected with the electronic device 200 in any suitable way such as clamping, clamping, magnetic attraction, etc. or can only be used to support the electronic device 200. Based on the above-mentioned test part 120 and placing part 130, in order to facilitate the connection between the test probe 140 and the electronic device 200, the test part 120 is slidingly connected with the base 110, so that the test part 120 moves along the vertical direction Z relative to the placing part 130. At the same time, in order to facilitate the adjustment of the relative position between the test probe 140 and the electronic device, the test part 120 and / or the placing part 130 are slidingly connected with the base 110, so that the test part 120 and the placing part 130 move relative to each other along the first horizontal direction X perpendicular to the vertical direction Z. It can be understood that, on the one hand, by sliding the test part 120 along the vertical direction Z, the test probe 140 connected to the test part 120 can be pressed downward relative to the electronic device 200, and the test probe 140 can be inserted into the electronic device 200 to perform the insertion loss test. After the test is completed, the test probe 140 can move upward to exit the electronic device 200. On the other hand, by relative movement of the test part 120 and the placing part 130 along the first horizontal direction X, the test probe 140 can be switched between multiple test positions. The test positions can be multiple test points on the same electronic device 200, or can be multiple test points of multiple electronic devices 200 arranged along the first horizontal direction X. In combination with the above-mentioned sliding connection, the movement of the test probe 140 along the vertical direction Z and the switching of the test positions can be more convenient, which greatly saves the time cost of the test. At the same time, during the test, the test part 120 drives the test probe 140 to press downward to insert into the electronic device 200, and at this time the test part 120 can abut against the placing part 130 to play a positioning role. Therefore, the scheme of the utility model does not need to additionally tighten the test probe 140 to the electronic device 200, thereby avoiding the risk of data error caused by different locking degrees, so that the reliability of the insertion loss test is higher.

[0048] It can be seen that the insertion loss test device 100 of the utility model includes a base 110, a test part 120 and a placing part 130. The test part 120 is suitable for connecting a test probe 140. The placing part 130 is suitable for placing an electronic device 200. The test part 120 is slidingly connected to the base 110 so that the test part 120 moves along the vertical direction Z relative to the placing part 130, and the test part 120 and / or the placing part 130 are slidingly connected to the base 110 so that the test part 120 moves relative to the placing part 130 along the first horizontal direction X perpendicular to the vertical direction Z. In the scheme of the utility model, on the one hand, the test action of the test probe 140 can be facilitated by the sliding of the test part 120 along the vertical direction Z; on the other hand, the test probe 140 can be switched between multiple test positions by the relative movement of the test part 120 and the placing part 130 along the first horizontal direction X. Compared with the test mode relying on manual tightening of personnel in the related art, the scheme of the utility model can make the test process more convenient, and avoid the risk of data error caused by different locking degrees. Therefore, the insertion loss test device 100 of the utility model can facilitate the insertion loss test operation and has high test reliability.

[0049] For the specific structure of the placing part 130, see Figures 1-2 In some embodiments, the placing part 130 includes a placing piece 131 and a positioning piece 132, and the placing piece 131 forms a first groove 1311 and a second groove 1312 that communicate with each other. The first groove 1311 is used for placing the electronic device 200, and the positioning piece 132 is located in the second groove 1312. Along a direction perpendicular to the vertical direction Z, the positioning piece 132 is configured to be able to abut against the electronic device 200 located in the first groove 1311. It can be understood that the first groove 1311 and the second groove 1312 are both groove bodies 1511 formed by recessed structures of the placing piece 131 itself, and after the electronic device 200 is placed in the first groove 1311, the positioning piece 132 in the second groove 1312 beside the first groove 1311 can abut against and position the electronic device 200, so as to facilitate the insertion loss test operation. A gasket can be provided in the first groove 1311 to adapt to the thickness size of different electronic devices 200.

[0050] Based on the above-mentioned first groove 1311 and second groove 1312, in order to position the test piece along the vertical direction Z by the abutment between the test piece and the upper end surface of the placing piece 131 after the test piece is pressed down, see Figures 1-2 and Figure 5 In some embodiments, the height of the positioning piece 132 is lower than the height of the upper end surface of the placing piece 131. The above-mentioned arrangement makes the positioning piece 132 arranged in the second groove 1312 not interfere with the abutment between the test piece and the upper end surface of the placing piece 131, and thus the above-mentioned test piece positioning operation is more convenient.

[0051] Further, based on the first slot 1311 and the second slot 1312 set as above, see Figures 1-2 In some embodiments, the first slot 1311 has a dimension along a first horizontal direction X that is greater than a dimension along a second horizontal direction Y that is perpendicular to the first horizontal direction X and the vertical direction Z. In other words, the first slot 1311 can be a long slot 1511, and the dimension of the first slot 1311 along the arrangement direction of the plurality of test points (or the plurality of electronic devices 200) is longer. Based on this, in some embodiments, the number of positioning members 132 is a plurality, at least one positioning member 132 can abut the electronic device 200 along the first horizontal direction X, and at least two positioning members 132 can abut the electronic device 200 along the second horizontal direction Y. It can be understood that the side of the first slot 1311 with the longer dimension (the side along the first horizontal direction X) can be provided with a plurality of positioning members 132, and the side of the first slot 1311 with the shorter dimension (the side along the second horizontal direction Y) can be provided with at least one positioning member 132. Thus, after the electronic device 200 is placed in the first slot 1311, the side of the electronic device 200 with the longer dimension can be abutted by the plurality of positioning members 132, and the side with the shorter dimension can be abutted by the at least one positioning member 132. In order to simplify the positioning structure, in some embodiments, the number of positioning members 132 facing the electronic device 200 along the first horizontal direction X is less than the number of positioning members 132 facing the electronic device 200 along the second horizontal direction Y.

[0052] Referring to Figures 1-4In some embodiments, the insertion loss testing device 100 further includes a test probe 140. The type and arrangement of the test probe 140 can be referred to the foregoing embodiments. To facilitate the positioning of the test probe 140 relative to the electronic device 200, in some embodiments, the test probe 140 is fixedly connected to the testing unit 120. The test probe 140 is provided with a positioning protrusion 141, and the placement unit 130 is provided with a plurality of positioning holes 133 arranged along the first horizontal direction X. The positioning protrusion 141 can extend into one of the positioning holes 133 along the vertical direction Z. It is understood that each positioning hole 133 can correspond to each test position that needs to be tested. Through the cooperation between the positioning protrusion 141 and the positioning hole 133, the positioning of the test probe 140 can be facilitated, and the positioning protrusion 141 can maintain a stable position after extending into the positioning hole 133, thereby ensuring the accuracy of the test. To make the positioning of the test probe 140 more balanced and stable, in some embodiments, the number of positioning protrusions 141 and positioning holes 133 are both multiple, and each is symmetrically arranged with respect to the center of the test probe 140. Depending on the requirements, both the positioning protrusion 141 and the positioning hole 133 can be of any suitable shape. In one specific embodiment, based on the test points of the electronic device 200, six positioning holes 133 are provided on each side of the placement part 130. The spacing between each positioning hole 133 is 5.8 mm, the hole diameter is 1.5 mm, the hole depth is 4 mm, and the left-right spacing is 25.25 mm, so that the positioning protrusion 141 of the test probe 140 can be inserted into the positioning hole 133. In some embodiments, along the direction perpendicular to the vertical direction Z, the size of the positioning protrusion 141 can be equal to the size of the positioning hole 133; in other embodiments, along the direction perpendicular to the vertical direction Z, the size of the positioning protrusion 141 can be smaller than the size of the positioning hole 133. Conversely, in other embodiments, the test probe 140 is provided with an opening structure, and the placement part 130 is provided with a plurality of protrusion structures arranged along the first horizontal direction X. The aforementioned opening structure can be fitted onto one of the protrusion structures along the vertical direction Z.

[0053] To facilitate alignment of the positioning protrusion 141 with the positioning hole 133 during switching between test positions, see [reference needed]. Figures 1-2In some embodiments, the placing part 130 is slidingly connected with the base 110, and the placing part 130 is provided with a plurality of scales 134 arranged along the first horizontal direction X, each scale 134 corresponding to each positioning hole 133. It can be understood that, in the process of sliding the placing part 130 relative to the base 110 and the testing part 120 along the first horizontal direction X, by aligning the reference point of the placing part 130 and the testing part 120 (or the reference point of the base 110), the placing part 130 can be quickly slid to a position where the positioning protrusion 141 is aligned with the corresponding positioning hole 133. Taking the testing part 120 as an example, the reference point of the testing part 120 (or the reference point of the base 110) can be a structural feature of the testing part 120 itself, such as a side edge of the testing part 120 located at an end; or an engraved indication arrow, etc.

[0054] Referring to Figures 3-4 In some embodiments, the insertion loss testing device 100 further comprises a supporting part 150 and a testing probe 140 and a radio frequency wire 160 connected with each other. The radio frequency wire 160 is used for transmission of high-frequency signals in order to test the insertion loss of the electronic device 200. In order to avoid shaking of the testing probe 140 during the testing process and affect the accuracy of the testing, in some embodiments, the testing probe 140 is fixedly connected with the testing part 120 (which can be screw connection, bolt connection, buckle connection, etc.), the supporting part 150 comprises a supporting block 151 and a pressing block 152, the supporting block 151 is provided with a groove 1511, one end of the radio frequency wire 160 is connected with the testing probe 140, and the other end of the radio frequency wire 160 is arranged in the groove 1511 and is abutted by the pressing block 152. It can be understood that the supporting block 151 and the pressing block 152 can jointly clamp one end of the radio frequency wire 160 (which can be connected with the test cable of the PNA machine), so as to play a fixing role. Specifically, the supporting block 151 and the pressing block 152 can be detachably connected, such as screw connection, bolt connection, clamping, etc., so that the supporting block 151 and the pressing block 152 can be separated from each other first, and then one end of the radio frequency wire 160 is placed in the groove 1511, and then the supporting block 151 and the pressing block 152 are connected with each other. It should be noted that one end of the radio frequency wire 160 can be a part of the end of the radio frequency wire 160 along the length direction, or a part close to the end, which is not limited here. In order to make the radio frequency wire 160 more balanced and stable, the connection structure between the supporting block 151 and the pressing block 152 can be symmetrically arranged relative to the center of the radio frequency wire 160.

[0055] Referring to Figures 3-4 In some embodiments, the radio frequency wire 160 comprises a plurality of cables, in order to enable the cables to be stably supported, the cross section of the groove 1511 can be a plurality of tooth-shaped structures in a wave shape, and the plurality of cables can be correspondingly arranged in the plurality of tooth-shaped structures, so that the clamping action of the supporting block 151 and the pressing block 152 on the radio frequency wire 160 is more stable.

[0056] Based on the above-mentioned support part 150, see Figures 5-6 In some embodiments, as viewed along the first horizontal direction X, the radio frequency wire 160 extends along the vertical direction Z, and as viewed along the second horizontal direction Y perpendicular to the first horizontal direction X, the radio frequency wire 160 extends in a curved manner around an axis parallel to the second horizontal direction Y. In one aspect, the above-mentioned arrangement is combined with the arrangement that the test part 120 moves relative to the placement part 130 along the vertical direction Z, so that during the up-and-down movement of the test part 120, one end of the radio frequency wire 160 is connected to the test part 120 and moves with the movement of the test part 120, and the other end of the radio frequency wire 160 is fixed in the groove 1511, so that the part of the radio frequency wire 160 that is compressed can serve as the movement fulcrum of the radio frequency wire 160, making the movement of the radio frequency wire 160 more stable. During the above-mentioned movement, only the end of the radio frequency wire 160 connected to the test part 120 makes up-and-down folding movement, while the rest is relatively fixed, and at the same time, it does not produce left-and-right flipping phenomenon, so that the radio frequency wire 160 is relatively stable during this movement, thereby reducing the force borne by the radio frequency wire 160, increasing the service life of the radio frequency wire 160, avoiding measurement fluctuation, making the transmission of the signal stable, and making the test result reliable. More specifically, in some embodiments, the placement part 130 is slidingly connected to the base 110, and the test part 120 is fixed relative to the base 110, at this time, only the sliding of the placement part 130 along the first horizontal direction X is used to align the test probe 140 with the test position, which can further avoid the shaking of the radio frequency wire 160, so as to ensure the reliability of the test result.

[0057] Based on the above-mentioned test probe 140 and radio frequency wire 160 defined in the embodiments, see Figure 5, in some embodiments, the testing unit 120 includes a connection block 121, a first plate body 122, a first connecting rod 123, and a second connecting rod 124. The first connecting rod 123 and the second connecting rod 124 are arranged at intervals along the second horizontal direction Y. The connection block 121 is adapted to connect the test probe 140. The upper sides of the first connecting rod 123 and the second connecting rod 124 are both connected to the first plate body 122, and the lower sides of the first connecting rod 123 and the second connecting rod 124 are both connected to the testing unit 120. The first plate body 122, the testing unit 120, the first connecting rod 123, and the second connecting rod 124 jointly surround to form a receiving opening 126. It can be understood that the first plate body 122, the testing unit 120, the first connecting rod 123, and the second connecting rod 124 are connected pairwise and jointly surround to form a "mouth" - shaped structure, and the receiving opening 126 is the opening part in the middle of the "mouth" - shaped structure. Based on this, in some embodiments, when observing along the first horizontal direction X, the RF cable 160 is located within the receiving opening 126. Through the above - mentioned arrangement, the user can reach into the receiving opening 126 to operate the RF cable 160, and there are no obstacles around the RF cable 160, so that the operation of assembling the test probe 140 and the RF cable 160 is more convenient.

[0058] To facilitate the stable stress state of the test probe 140 when it is pressed down, refer to Figure 5 , in some embodiments, the testing unit 120 includes a first plate body 122, a second plate body 125, and a plurality of elastic members 127 (the elastic members 127 can specifically be springs). Along the direction perpendicular to the vertical direction Z, the elastic members 127 are symmetrically distributed on both sides of the first plate body 122 and the second plate body 125. Figure 1 , Figure 5 , Figure 6 In the embodiment shown, the number of elastic members 127 is 4. Among them, 2 elastic members 127 are connected to one side of the first plate body 122 and the second plate body 125 along the second horizontal direction Y, and the other 2 elastic members 127 are connected to the other side of the first plate body 122 and the second plate body 125 along the second horizontal direction Y. The first plate body 122 is connected to the testing unit 120, and the elastic members 127 are connected between the first plate body 122 and the second plate body 125, so that after the second plate body 125 receives a driving force, it can move along the vertical direction Z and带动 the first plate body 122. It can be understood that the first plate body 122 can directly receive the driving action from the user (or other driving devices) along the vertical direction Z. Also, because the elastic members 127 are connected between the first plate body 122 and the second plate body 125, when the first plate body 122 is pressed down, the pressure can be transmitted to the second plate body 125 through the elastic members 127. The elastic members 127 can avoid uneven force. Thereafter, the pressure transmitted through the elastic members 127 further drives the test probe 140 to insert into the test point of the electronic device 200.

[0059] The above are only preferred embodiments of the present application, and do not limit the patent range of the present application, and any equivalent structural transformation made by using the content of the present application specification and drawings, or direct / indirect application in other related technical fields are included in the patent protection range of the present application.

Claims

1. An insertion loss test set-up for testing the insertion loss of an electronic device, characterized in that, The insertion loss test device comprises: a base; a test portion adapted to connect a test probe; a placement portion adapted to place the electronic device; wherein the test portion is slidingly connected to the base to enable the test portion to move relative to the placement portion along a vertical direction, and the test portion and / or the placement portion is slidingly connected to the base to enable the test portion and the placement portion to move relative to each other along a first horizontal direction perpendicular to the vertical direction.

2. The insertion loss test device according to claim 1, wherein the placement portion comprises a placement member and a positioning member, the placement member forms a first slot and a second slot which are in communication with each other, the first slot is used to place the electronic device, and the positioning member is located in the second slot and is configured to abut the electronic device located in the first slot along a direction perpendicular to the vertical direction.

3. The insertion loss test device according to claim 2, wherein a second horizontal direction is perpendicular to both the first horizontal direction and the vertical direction, the first slot has a dimension along the first horizontal direction which is greater than a dimension along the second horizontal direction, and the positioning member has a plurality of positioning members, at least one of the positioning members is capable of abutting the electronic device along the first horizontal direction, and at least two of the positioning members are capable of abutting the electronic device along the second horizontal direction.

4. The insertion loss test device according to claim 2, wherein the height of the positioning member is lower than the height of the upper end surface of the placement member.

5. The insertion loss test device according to claim 1, wherein the insertion loss test device further comprises a test probe, the test probe is fixedly connected to the test portion, the test probe is provided with a positioning protrusion, the placement portion is provided with a plurality of positioning holes arranged along the first horizontal direction, and the positioning protrusion is capable of extending into one of the positioning holes along the vertical direction.

6. The insertion loss test device according to claim 5, wherein the placement portion is slidingly connected to the base, and the placement portion is provided with a plurality of scales arranged along the first horizontal direction, each of the scales corresponds to one of the positioning holes.

7. The insertion loss test device according to claim 1, wherein the insertion loss test device further comprises a support portion and a test probe and a radio frequency line which are connected to each other, the test probe is fixedly connected to the test portion, the support portion comprises a support block and a pressing block, the support block is provided with a slot, and one end of the radio frequency line is connected to the test probe and the other end of the radio frequency line is arranged in the slot and is abutted by the pressing block.

8. The insertion loss test device according to claim 7, wherein when viewed along the first horizontal direction, the radio frequency line extends along a vertical direction, a second horizontal direction is perpendicular to both the first horizontal direction and the vertical direction, and when viewed along the second horizontal direction, the radio frequency line extends in a curved manner around an axis which is parallel to the second horizontal direction.

9. The insertion loss test device according to claim 1, wherein The insertion loss test device further comprises a test probe and a radio frequency line connected with each other, the test probe is fixedly connected with the test part, one end of the radio frequency line is connected with the test probe, the test part comprises a connecting block, a first plate body, a first connecting rod and a second connecting rod, the connecting block is adapted to connect the test probe, a second horizontal direction is perpendicular to the first horizontal direction and the vertical direction, the first connecting rod and the second connecting rod are arranged in the second horizontal direction, the upper side of the first connecting rod and the second connecting rod is connected with the first plate body, the lower side of the first connecting rod and the second connecting rod is connected with the test part, the first plate body, the test part, the first connecting rod and the second connecting rod jointly form a containing opening, and the radio frequency line is located in the containing opening in the first horizontal direction.

10. The insertion loss test device according to claim 1, wherein, The test part comprises a first plate body, a second plate body and a plurality of elastic members, each of the elastic members is symmetrically distributed on both sides of the first plate body and the second plate body in a direction perpendicular to the vertical direction, the first plate body is connected with the test part, and the elastic members are connected between the first plate body and the second plate body, so that the second plate body can move and drive the first plate body under the driving force in the vertical direction.

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