Testing device for processor mainboard

Abstract

The utility model relates to the technical field of processor main boards, and discloses a processor main board testing device which comprises a testing table, a containing groove is formed in the top of the testing table, a testing disc is rotatably connected in the containing groove, four sliding grooves are formed in the top of the testing disc and are annularly and uniformly arranged, clamping plates are slidably connected in the four sliding grooves, and the clamping plates are arranged in the containing groove. L-shaped plates are slidably connected to the two sides of the four clamping plates, the two L-shaped plates are fixedly connected to the interior of the testing disc, adjusting columns are fixedly connected to the bottoms of the four clamping plates, moving mechanisms used for moving the clamping plates are arranged on the surfaces of the four adjusting columns, clamping pads are fixedly connected to one sides of the four clamping plates, and a rotating mechanism used for rotating the testing disc is arranged at the bottom of the testing disc. The top of one side, close to the test disc, of the test board is fixedly connected with a support frame, and the bottom of the support frame is provided with a test mechanism for testing the mainboard. Through the arrangement of the clamping plates, the phenomenon that the surface of the test board is inconvenient to clean can be avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to processor mainboard technical field especially relates to a processor mainboard test device. BACKGROUND

[0002] Through the retrieval, the patent of Chinese patent authorization number CN221726182 U discloses a kind of processor mainboard test device, including test table, the lower end of the test table four corners is fixedly connected with support leg, the lower end of the test table middle part is fixedly connected with positive and negative motor, the output of the positive and negative motor penetrates the lower end of test table and is fixedly connected with rotating structure, the upper end of the rotating structure is fixedly connected with sticky board, the upper end of the test table rear side middle part is fixedly connected with L-shaped plate, the lower end of the L-shaped plate front part is fixedly connected with lighting structure, the front end upper portion of the L-shaped plate is fixedly connected with lighting switch.The utility model discloses a kind of processor mainboard test device, by being provided with rotating structure and lighting structure, make processor mainboard when testing not manually adjust test direction by artificial, facilitate processor mainboard adjustment test position, increase the flexibility of processor mainboard adjustment test direction, avoid the light shadow of processor mainboard when testing, reduce the observation blind area when testing.

[0003] The processor mainboard test device in the above patent can fix the mainboard by the sticky board when in use, but with the passage of time, dust, sundries and the like can accumulate on the surface of the sticky board, which is inconvenient to clean and can affect the effect of continued use, therefore, the problem needs to be solved. UTILITY MODEL CONTENT

[0004] The utility model aims at solving the shortcomings in the prior art and provides a processor mainboard test device.

[0005] To achieve the above object, the utility model adopts the following technical scheme:

[0006] A kind of processor mainboard test device, including test table, the top of the test table is equipped with receiving slot, the receiving slot inside is rotatably connected with test disc, the top of the test disc is equipped with four sliding slots, and four sliding slots are evenly arranged in annular, four The inside of the sliding slot is slidably connected with clamping plate, the two sides of four clamping plates are slidably connected with L plate, two L plates are fixedly connected in test disc inside, four The bottom of the clamping plate is fixedly connected with adjusting column, four The surface of the adjusting column is equipped with moving mechanism for moving clamping plate, one side of four The clamping plate is fixedly connected with clamping pad, the bottom of the test disc is equipped with rotating mechanism for rotating test disc, the top of the test table side close to test disc is fixedly connected with support frame, the bottom of the support frame is equipped with test mechanism for testing mainboard, by the setting of clamping plate, the phenomenon that the surface of test table is inconvenient to clean can be avoided.

[0007] As a further scheme of the utility model, the moving mechanism comprises an adjusting disc, the adjusting disc is rotationally connected inside the test disc, an adjusting groove is formed in the top of the side of the adjusting disc close to the adjusting column, the adjusting column is slidingly connected inside the adjusting groove, a second motor is fixed at the bottom of the test disc, and the adjusting disc is fixedly connected to the output shaft of the second motor.

[0008] As a further scheme of the utility model, the rotating mechanism comprises a supporting groove, the supporting groove is formed inside the storage groove, a supporting ring is slidingly connected inside the supporting groove, the supporting ring is fixedly connected to the surface of the test disc, a gear ring is fixedly connected to the bottom of the test disc, a gear is matched to the surface of the gear ring, a first motor is fixedly connected to the bottom of the gear, and the first motor is fixedly connected inside the storage groove.

[0009] As a further scheme of the utility model, the test mechanism comprises two hydraulic rods, the two hydraulic rods are fixedly connected to the top of the supporting frame, the same first adjusting box is fixedly connected to the bottom of the two hydraulic rods, a first screw rod is rotationally connected inside the first adjusting box, a third motor is fixedly connected to one side of the first adjusting box, the first screw rod is fixedly connected to the output shaft of the third motor, a second adjusting box is sleeved on the surface of the first screw rod, a first screw rod nut is arranged on the surface of the side of the second adjusting box close to the first screw rod, the first screw rod nut and the first screw rod are arranged in a matched mode, a fourth motor is fixedly connected to one side of the second adjusting box, a second screw rod is fixedly connected to the output shaft of the fourth motor, and a test main body is sleeved on the surface of the second screw rod.

[0010] The utility model discloses the beneficial effects are:

[0011] 1. The utility model discloses a technical scheme that the clamping plate is used to clamp and fix the mainboard, so that the phenomenon that the surface of the test table is inconvenient to clean can be avoided, thereby effectively solving the problem that the surface of the sticking plate will accumulate dust, sundries and the like with the lapse of time, and the effect problem that the continued use is possibly affected, four adjusting grooves are formed in the top of the adjusting disc, the adjusting column is slidingly connected inside the four adjusting grooves, the clamping plate is installed on the top of the four adjusting columns, and the clamping plate slides inside the test disc, so that the clamping plate can move when the adjusting disc drives the adjusting groove to rotate under the limitation of the test disc, so that the four clamping plates can clamp and fix the mainboard. DRAWINGS

[0012] Figure 1The utility model provides a kind of overall structure schematic diagram of testing arrangement for processor mainboard is proposed;

[0013] Figure 2 A side structure schematic diagram of testing arrangement for processor mainboard is proposed for the utility model;

[0014] Figure 3 A rotating mechanism schematic diagram of testing arrangement for processor mainboard is proposed for the utility model;

[0015] Figure 4 A moving mechanism schematic diagram of testing arrangement for processor mainboard is proposed for the utility model;

[0016] Figure 5 A test mechanism schematic diagram of testing arrangement for processor mainboard is proposed for the utility model.

[0017] In the drawing: 1, test table; 2, test disc; 3, clamping plate; 4, support frame; 101, storage groove; 102, support groove; 201, support ring; 202, sliding slot; 203, gear ring; 204, gear; 205, first motor; 301, clamping pad; 302, adjusting column; 303, L plate; 304, adjusting disc; 305, adjusting groove; 306, second motor; 401, hydraulic rod; 402, first adjusting box; 403, first screw rod; 404, third motor; 405, second adjusting box; 406, first screw rod nut; 407, second screw rod; 408, test main body; 409, second screw rod nut; 410, fourth motor. Specific embodiments

[0018] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments.

[0019] Reference Figures 1-5The application discloses a kind of processor mainboard test device, including test table 1, test table 1 top is equipped with receiving groove 101, receiving groove 101 inside is rotatably connected with test disc 2, test disc 2 top is equipped with four sliding grooves 202, and four sliding grooves 202 are evenly arranged in annular, four sliding grooves 202 inside are slidably connected with clamping plate 3, four clamping plates 3 two sides are slidably connected with L plate 303, two L plates 303 are fixedly connected in test disc 2 inside, four clamping plates 3 bottom are fixedly connected with adjusting column 302, by the setting of adjusting column 302, clamping plate 3 can be moved, four adjusting columns 302 surface are equipped with the moving mechanism for moving clamping plate 3, four clamping plates 3 one side are fixedly connected with clamping pad 301, test disc 2 bottom is equipped with the rotating mechanism for rotating test disc 2, test table 1 is fixedly connected with support frame 4 on test disc 2 side top close, support frame 4 bottom is equipped with the test mechanism for testing mainboard, by the setting of clamping plate 3, it can avoid the phenomenon that test table 1 surface is inconvenient to clean.

[0020] Preferably, the moving mechanism includes adjusting disc 304, adjusting disc 304 is rotatably connected in test disc 2 inside, adjusting disc 304 is equipped with adjusting groove 305 on adjusting column 302 side top close, adjusting column 302 is slidably connected in adjusting groove 305 inside, test disc 2 bottom is fixed with second motor 306, adjusting disc 304 is fixedly connected on second motor 306 output shaft, by the setting of adjusting groove 305, clamping plate 3 can be moved.

[0021] Preferably, the rotating mechanism includes support groove 102, support groove 102 is equipped in receiving groove 101 inside, support groove 102 inside is slidably connected with support ring 201, support ring 201 is fixedly connected on test disc 2 surface, test disc 2 bottom is fixedly connected with gear ring 203, gear ring 203 surface is matched with gear 204, gear 204 bottom is fixedly connected with first motor 205, first motor 205 is fixedly connected in receiving groove 101 inside, by the setting of gear ring 203, test disc 2 can be rotated.

[0022] Preferably, the test mechanism comprises two hydraulic rods 401, both of which are fixedly connected to the top of the support frame 4, and the bottom of the two hydraulic rods 401 is fixedly connected with the same first adjusting box 402, the first adjusting box 402 is rotatably connected with the first lead screw 403 inside, one side of the first adjusting box 402 is fixedly connected with the third motor 404, the first lead screw 403 is fixedly connected to the output shaft of the third motor 404, the first lead screw 403 is sleeved with the second adjusting box 405, the second adjusting box 405 is provided with the first lead screw nut 406 on the surface near one side of the first lead screw 403, and the first lead screw nut 406 is arranged in cooperation with the first lead screw 403, one side of the second adjusting box 405 is fixedly connected with the fourth motor 410, the output shaft of the fourth motor 410 is fixedly connected with the second lead screw 407, the second lead screw 407 is sleeved with the test main body 408, and the position of the test main body 408 can be adjusted through the arrangement of the lead screw, and the test main body 408 is provided with the second lead screw nut 409 on the surface near one side of the second lead screw 407, and the second lead screw nut 409 is arranged in cooperation with the second lead screw 407, and the mainboard can be tested through the arrangement of the test main body 408.

[0023] Working principle: in use, the mainboard to be tested is placed on the top of the test disc 2, then the second motor 306 is started, the adjusting disc 304 is installed on the output shaft of the second motor 306, so that when the second motor 306 is started, the adjusting disc 304 will rotate, four adjusting grooves 305 are formed in the top of the adjusting disc 304, and the adjusting columns 302 are slidably connected in the four adjusting grooves 305, the clamping plates 3 are installed on the top of the four adjusting columns 302, and the clamping plates 3 slide in the test disc 2, so that under the limitation of the test disc 2, when the adjusting disc 304 drives the adjusting grooves 305 to rotate, the clamping plates 3 can move, so that the four clamping plates 3 can clamp and fix the mainboard, the test main body 408 is arranged on the top of the test disc 2, and the mainboard can be tested through the test main body 408 after the mainboard is fixed, and the gear ring 203 is installed on the bottom of the test disc 2 and matches with the gear 204 on the output shaft of the first motor 205, so that in the process of testing, the test disc 2 can be rotated by the first motor 205, so as to achieve the purpose of adjusting the mainboard.

[0024] The above is only a preferred specific embodiment of the present application, but the protection scope of the present application is not limited to this, any skilled person in the art can make equivalent replacement or change according to the technical scheme and the inventive concept of the present application within the technical range disclosed by the present application, which should be covered in the protection scope of the present application.

Claims

1. A testing apparatus for a processor motherboard, comprising a test bench (1), characterized in that, The test bench (1) has a storage slot (101) on its top. A test plate (2) is rotatably connected inside the storage slot (101). The test plate (2) has four sliding grooves (202) on its top, and the four sliding grooves (202) are evenly arranged in a ring. A clamping plate (3) is slidably connected inside each of the four sliding grooves (202). An L-plate (303) is slidably connected to both sides of each of the four clamping plates (3). Two of the L-plates (303) are fixedly connected inside the test plate (2). Each clamping plate (3) has an adjusting column (302) fixedly connected to its bottom. Each of the four adjusting columns (302) has a moving mechanism for moving the clamping plate (3). Each of the four clamping plates (3) has a clamping pad (301) fixedly connected to one side. The test plate (2) has a rotating mechanism for rotating the test plate (2) at its bottom. The test platform (1) has a support frame (4) fixedly connected to its top side near the test plate (2). The support frame (4) has a test mechanism for testing the main board at its bottom.

2. The testing apparatus for a processor motherboard according to claim 1, characterized in that, The moving mechanism includes an adjusting plate (304), which is rotatably connected to the inside of the test plate (2). An adjusting groove (305) is provided on the top of the adjusting plate (304) near the adjusting column (302). The adjusting column (302) is slidably connected to the inside of the adjusting groove (305). A second motor (306) is fixed at the bottom of the test plate (2), and the adjusting plate (304) is fixedly connected to the output shaft of the second motor (306).

3. The testing apparatus for a processor motherboard according to claim 1, characterized in that, The rotating mechanism includes a support groove (102) which is opened inside the storage groove (101). A support ring (201) is slidably connected inside the support groove (102). The support ring (201) is fixedly connected to the surface of the test disk (2). A gear ring (203) is fixedly connected to the bottom of the test disk (2). A gear (204) is fitted on the surface of the gear ring (203). A first motor (205) is fixedly connected to the bottom of the gear (204). The first motor (205) is fixedly connected to the inside of the storage groove (101).

4. The testing apparatus for a processor motherboard according to claim 1, characterized in that, The testing mechanism includes two hydraulic rods (401), both of which are fixedly connected to the top of the support frame (4). The bottom of the two hydraulic rods (401) is fixedly connected to the same first adjustment box (402). The first adjustment box (402) is rotatably connected to a first lead screw (403), and a third motor (404) is fixedly connected to one side of the first adjustment box (402).

5. The testing apparatus for a processor motherboard according to claim 4, characterized in that, The first lead screw (403) is fixedly connected to the output shaft of the third motor (404). A second adjustment box (405) is sleeved on the surface of the first lead screw (403). A first lead screw nut (406) is provided on the surface of the second adjustment box (405) near the first lead screw (403). The first lead screw nut (406) and the first lead screw (403) are configured to cooperate with each other. A fourth motor (410) is fixedly connected to one side of the second adjustment box (405).

6. The testing apparatus for a processor motherboard according to claim 5, characterized in that, The output shaft of the fourth motor (410) is fixedly connected to a second lead screw (407). A test body (408) is sleeved on the surface of the second lead screw (407). A second lead screw nut (409) is provided on the surface of the test body (408) near the second lead screw (407). The second lead screw nut (409) and the second lead screw (407) are configured to cooperate with each other.

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