Vibration measurement device used in semiconductor transmission process
By designing a device including a frame, a conveyor belt, a vibration amplification rod, and rollers, the vibration amplitude is amplified and the pressure difference is adjusted, thus solving the problem of inaccurate vibration measurement during semiconductor transmission and achieving higher precision measurement and stability assessment.
Patent Information
- Application Number
- CN202520224456.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-13
- Publication Date
- 2025-12-23
- Estimated Expiration
- 2035-02-13
AI Technical Summary
In existing semiconductor transmission processes, vibration measurements are not accurate enough, making it difficult to effectively assess the stability and reliability of semiconductor devices.
A vibration measurement device was designed, including a frame, a conveyor belt, a vibration amplification rod, a telescopic rod, a connecting rod, and rollers. The vibration amplitude is amplified by lever principle, and the roller pressure is adjusted by slider, hook, connecting rope, bearing plate, and counterweight to reduce the vibration amplitude difference. The vibration amplitude is judged by pointer and scale line, and the vibration data is recorded by electronic drawing board and stylus.
It improves the convenience and accuracy of vibration measurement, reduces measurement errors, and ensures the stability and reliability of semiconductor devices during transmission.
Smart Images
Figure CN223710823U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to a semiconductor transmission technical field especially relates to a kind of vibration measuring device for in the process of semiconductor transmission. BACKGROUND
[0002] Semiconductor is a kind of substance between conductor and insulator, its conductivity is easily controlled, and is usually used as element material of information processing.
[0003] Vibration measurement in the process of semiconductor transmission is an important link to ensure the quality and reliability of semiconductor device, some semiconductor devices are more precise after production, in the transmission process, vibration can affect the performance and life of semiconductor device, therefore, vibration measurement helps to evaluate the stability and reliability of semiconductor device in transmission process, so as to ensure the quality and performance of final product, when existing transmission belt is used to transmit semiconductor, the vibration amplitude of semiconductor on part of transmission belt is small, which is inconvenient for vibration measurement, so that the measurement result is not accurate enough.
[0004] Therefore, we propose a kind of vibration measuring device for in the process of semiconductor transmission. UTILITY MODEL CONTENT
[0005] In view of the above problems, the utility model provides a kind of vibration measuring device for in the process of semiconductor transmission, with the slight vibration of semiconductor transmission can be amplified, so that vibration measurement is more convenient, and improves measurement precision.
[0006] The technical scheme of the utility model is: including rack, the middle part of the rack is equipped with transmission belt, the side wall of the rack is rotatably connected with vibration amplification rod, one end of the vibration amplification rod is fixedly connected with telescopic rod, the other end of the telescopic rod is fixedly connected with connecting rod, the bottom of the side wall of the connecting rod is rotatably connected with gyro wheel.
[0007] Through the above structure, the slight vibration of semiconductor transmission can be amplified, so that vibration measurement is more convenient, and improves measurement precision.
[0008] In further technical scheme, the middle part of the vibration amplification rod is slidably connected with sliding block, the bottom of the sliding block is fixedly connected with hook, the bottom of the hook is detachably installed with connecting rope, the bottom of the connecting rope is fixedly connected with bearing disc, the top of the bearing disc is detachably installed with multiple counterweights.
[0009] When semiconductor is transmitted, the case that transmission belt vibration amplitude at gyro wheel and semiconductor vibration amplitude difference is too large caused by too large pressure of gyro wheel to transmission belt is reduced.
[0010] In a further technical solution, a frosted groove is formed in the middle of the vibration amplification rod, a sliding rod is slidingly connected to the middle of the sliding block, a frosted block is fixedly connected to the end of the sliding rod, and a spring is installed in the middle of the sliding rod.
[0011] Through the above structure, the situation that the vibration measurement result is inaccurate due to the sliding offset of the sliding block can be reduced.
[0012] In a further technical solution, a fixed plate is fixedly connected to the side wall of the rack, a pointer is fixedly connected to the end of the vibration amplification rod away from the telescopic rod, and a plurality of scale lines are formed in the side wall of the fixed plate.
[0013] The position relationship between the pointer and the scale lines can be used to conveniently judge the vibration amplitude.
[0014] In a further technical solution, a drawing board is installed on the side wall of the fixed plate, and a drawing pen is installed in the middle of the pointer.
[0015] The trace on the drawing board can be used to conveniently judge the vibration amplitude in a period of time by referring to the scale lines.
[0016] In a further technical solution, a fixed rod is fixedly connected to the side wall of the connecting rod, and a baffle is fixedly connected to the other end of the fixed rod.
[0017] The deviated semiconductor can be guided, the collision between the semiconductor and the roller can be reduced, and the transmission of the semiconductor is affected.
[0018] In a further technical solution, the drawing board can use an electronic drawing product, and the drawing pen can use a touch pen.
[0019] Through the above arrangement, the waste of materials can be reduced, and the use of the device is more convenient.
[0020] The beneficial effects of the utility model are:
[0021] 1. Through the arrangement of the rack, the transmission belt, the vibration amplification rod, the telescopic rod, the connecting rod and the roller, the slight vibration during the transmission of the semiconductor can be amplified, so that the vibration measurement is more convenient, and the measurement accuracy is improved.
[0022] 2. Through the arrangement of the sliding block, the hook, the connecting rope, the bearing disc and the counterweight, the situation that the vibration amplitude difference between the transmission belt at the roller and the semiconductor is too large due to the excessive pressure of the roller on the transmission belt during the transmission of the semiconductor can be reduced. BRIEF DESCRIPTION OF DRAWINGS
[0023] Figure 1 is the overall structure schematic diagram of the utility model embodiment;
[0024] Figure 2 This is a schematic diagram of the structure of the vibration amplification rod according to an embodiment of the present invention;
[0025] Figure 3 This is a schematic diagram of the slider structure according to an embodiment of the present invention;
[0026] Figure 4 This is a schematic diagram of the structure of the drawing board according to an embodiment of this utility model;
[0027] Figure 5 This is a schematic diagram of the structure of the baffle in an embodiment of this utility model.
[0028] Explanation of reference numerals in the attached figures:
[0029] 1. Frame; 12. Conveyor belt; 13. Vibration amplification rod; 14. Telescopic rod; 15. Connecting rod; 16. Roller; 2. Slider; 21. Hook; 22. Connecting rope; 23. Bearing plate; 24. Counterweight; 3. Frosting groove; 31. Sliding rod; 32. Frosting block; 33. Spring; 4. Fixing plate; 41. Pointer; 42. Scale line; 5. Drawing board; 51. Pen; 6. Fixing rod; 61. Baffle. Detailed Implementation
[0030] The embodiments of this utility model will be further described below with reference to the accompanying drawings.
[0031] Example:
[0032] like Figures 1-5 As shown, the device includes a frame 1, a conveyor belt 12 installed in the middle of the frame 1, a vibration amplification rod 13 rotatably connected to the side wall of the frame 1, a telescopic rod 14 fixed to one end of the vibration amplification rod 13, a connecting rod 15 fixed to the other end of the telescopic rod 14, and a roller 16 rotatably connected to the bottom of the side wall of the connecting rod 15.
[0033] The working principle of the above technical solution is as follows:
[0034] Semiconductors are placed on a conveyor belt 12 and transported by the operation of the conveyor belt 12. When the conveyor belt 12 vibrates during operation, the vibration is transmitted to one end of the vibration amplification rod 13 through the roller 16 above the conveyor belt 12. Under the action of the lever, the other end of the vibration amplification rod 13 swings synchronously. Since the distances between the two ends of the vibration amplification rod 13 and the pivot point of the vibration amplification rod 13 are different, and the end with the telescopic rod 14 is closer to the pivot point, the swing amplitude of the end of the vibration amplification rod 13 away from the telescopic rod 14 is greater than the swing amplitude of the end of the vibration amplification rod 13 with the telescopic rod 14. This amplifies the vibration amplitude, making it easier to measure the vibration amplitude. Through the above structure, the slight vibration during semiconductor transport can be amplified, making vibration measurement more convenient and improving measurement accuracy.
[0035] In another embodiment, as shown in the figure, the middle part of the vibration amplification rod 13 is slidingly connected with a sliding block 2, the bottom of the sliding block 2 is fixedly connected with a hook 21, the bottom of the hook 21 is detachably installed with a connecting rope 22, the bottom of the connecting rope 22 is fixedly connected with a bearing disc 23, and the upper side of the bearing disc 23 is detachably installed with a plurality of counterweights 24. Figure 3 According to the weight of the semiconductor being transported, the position of the sliding block 2 is adjusted along the vibration amplification rod 13, and the number of counterweights 24 is adjusted. After the adjustment of the sliding block 2 is completed, the pressure of the roller 16 on the conveying belt 12 is approximately the same as the pressure of the semiconductor on the conveying belt 12, so that when the semiconductor is being transported, the situation that the vibration amplitude of the conveying belt 12 at the roller 16 is greatly different from the vibration amplitude of the semiconductor is reduced due to the excessive pressure of the roller 16 on the conveying belt 12.
[0036] In another embodiment, as shown in the figure, the middle part of the vibration amplification rod 13 is slidingly connected with a sliding block 2, the bottom of the sliding block 2 is fixedly connected with a hook 21, the bottom of the hook 21 is detachably installed with a connecting rope 22, the bottom of the connecting rope 22 is fixedly connected with a bearing disc 23, and the upper side of the bearing disc 23 is detachably installed with a plurality of counterweights 24.
[0037] Figure 3 According to the weight of the semiconductor being transported, the position of the sliding block 2 is adjusted along the vibration amplification rod 13, and the number of counterweights 24 is adjusted. After the adjustment of the sliding block 2 is completed, the pressure of the roller 16 on the conveying belt 12 is approximately the same as the pressure of the semiconductor on the conveying belt 12, so that when the semiconductor is being transported, the situation that the vibration amplitude of the conveying belt 12 at the roller 16 is greatly different from the vibration amplitude of the semiconductor is reduced due to the excessive pressure of the roller 16 on the conveying belt 12.
[0038] In another embodiment, as shown in the figure, the middle part of the vibration amplification rod 13 is slidingly connected with a sliding block 2, the bottom of the sliding block 2 is fixedly connected with a hook 21, the bottom of the hook 21 is detachably installed with a connecting rope 22, the bottom of the connecting rope 22 is fixedly connected with a bearing disc 23, and the upper side of the bearing disc 23 is detachably installed with a plurality of counterweights 24.
[0039] According to the weight of the semiconductor being transported, the position of the sliding block 2 is adjusted along the vibration amplification rod 13, and the number of counterweights 24 is adjusted. After the adjustment of the sliding block 2 is completed, the pressure of the roller 16 on the conveying belt 12 is approximately the same as the pressure of the semiconductor on the conveying belt 12, so that when the semiconductor is being transported, the situation that the vibration amplitude of the conveying belt 12 at the roller 16 is greatly different from the vibration amplitude of the semiconductor is reduced due to the excessive pressure of the roller 16 on the conveying belt 12. Figure 4 In another embodiment, as shown in the figure, the side wall of the rack 1 is fixedly connected with a fixed plate 4, the end of the vibration amplification rod 13 away from the telescopic rod 14 is fixedly connected with a pointer 41, and the side wall of the fixed plate 4 is provided with a plurality of scale lines 42.
[0040] When the vibration amplification rod 13 swings, the pointer 41 will swing with the end of the vibration amplification rod 13. At this time, the vibration amplitude can be conveniently judged according to the positional relationship between the pointer 41 and the scale lines 42.
[0041] Figure 4 In another embodiment, as shown in the figure, the side wall of the fixed plate 4 is installed with a drawing board 5, and the middle part of the pointer 41 is installed with a brush 51.
[0042] With the swinging of the pointer 41, the brush 51 will draw traces on the drawing board 5. The staff can conveniently judge the vibration amplitude in a period of time according to the traces on the drawing board 5 and the scale lines 42.
[0043] In another embodiment, such as Figure 5 As shown, a fixing rod 6 is fixedly connected to the side wall of the connecting rod 15, and a baffle 61 is fixedly connected to the other end of the fixing rod 6.
[0044] During semiconductor transport, the semiconductor may deviate on the transport belt 12 due to vibration and collide with the vibration amplification rod 13. By setting the baffle 61, the deviated semiconductor can be guided, reducing the occurrence of collision between the semiconductor and the roller 16 and reducing the impact on the semiconductor transport.
[0045] In another embodiment, such as Figure 4 As shown, drawing board 5 can use electronic drawing products, and pen 51 can use a stylus.
[0046] It can reduce material waste and make the device more convenient to use.
[0047] The above embodiments merely illustrate specific implementations of this utility model, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of this utility model patent. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model.
Claims
1. A vibration measurement device for semiconductor transmission processes, comprising a frame (1), characterized in that: A conveyor belt (12) is installed in the middle of the frame (1). A vibration amplification rod (13) is rotatably connected to the side wall of the frame (1). A telescopic rod (14) is fixed to one end of the vibration amplification rod (13). A connecting rod (15) is fixed to the other end of the telescopic rod (14). A roller (16) is rotatably connected to the bottom of the side wall of the connecting rod (15).
2. The vibration measurement device for semiconductor transmission process according to claim 1, characterized in that: A slider (2) is slidably connected to the middle of the vibration amplification rod (13). A hook (21) is fixed to the bottom of the slider (2). A connecting rope (22) is detachably installed at the bottom of the hook (21). A bearing plate (23) is fixed to the bottom of the connecting rope (22). Multiple counterweights (24) are detachably installed above the bearing plate (23).
3. The vibration measurement device for semiconductor transmission process according to claim 2, characterized in that: The vibration amplification rod (13) has a frosted groove (3) in the middle, the slider (2) is slidably connected to a sliding rod (31) in the middle, the end of the sliding rod (31) is fixed with a frosted block (32), and a spring (33) is installed in the middle of the sliding rod (31).
4. The vibration measuring device for semiconductor transmission process according to claim 1, characterized in that: A fixing plate (4) is fixed to the side wall of the frame (1), and a pointer (41) is fixed to the end of the vibration amplification rod (13) away from the telescopic rod (14). Multiple scale lines (42) are opened on the side wall of the fixing plate (4).
5. A vibration measuring device for semiconductor transmission process according to claim 4, characterized in that: A drawing board (5) is installed on the side wall of the fixing plate (4), and a drawing pen (51) is installed in the middle of the pointer (41).
6. The vibration measuring device for semiconductor transmission process according to claim 1, characterized in that: A fixing rod (6) is fixedly connected to the side wall of the connecting rod (15), and a baffle (61) is fixedly connected to the other end of the fixing rod (6).
7. A vibration measuring device for semiconductor transmission process according to claim 5, characterized in that: The drawing board (5) can be an electronic drawing product, and the pen (51) can be a stylus.