Clamp for testing chip resistor

Abstract

The utility model discloses a clamp for testing a chip resistor, and relates to the technical field of clamps for testing chip resistors. The clamp for testing the chip resistor comprises a base, a testing seat is arranged at the top of the base, and an auxiliary mechanism is arranged on one side of the testing seat. According to the clamp for testing the chip resistor, by arranging the lower pressing plate, when the chip resistor needs to be tested in an auxiliary manner, one end of the chip resistor is firstly in contact with the lower pressing plate and the inclined surface of the clamping plate, then the clamping plate is pushed to one side of the connecting rod, and at the moment, the clamping plate is pressed to slide down; after the chip resistor reaches a proper position, the traction force of the traction spring enables the clamping plate to clamp the chip resistor upwards, then the lower pressing plate is pressed downwards, the lower pressing plate drives the sleeve rod to press downwards, at the moment, the compression spring is compressed until the lower pressing plate and the clamping plate drive the clamped chip resistor to make contact with the elastic guide plate, and the test is completed. The device is convenient for assisting the chip resistor in testing.

Description

TECHNICAL FIELD

[0001] The utility model belongs to the technical field of the fixture for chip resistance test, specifically relates to a fixture for chip resistance test. BACKGROUND

[0002] Chip resistance is one of metal glass glaze resistors, it is the resistor that mixes metal powder and glass glaze powder, adopts silk screen printing method and prints on the substrate. Its appearance is usually a black small square, and the numbers or codes indicating resistance value and other related parameters are marked on it. It is a commonly used electronic component in surface mount technology, mainly used on the circuit board of electronic products to realize current limiting, voltage dividing and other functions.

[0003] The prior art does not have the structure of quickly testing the chip resistance when in use, so that the existing chip resistance is mostly tested by contacting the red and black pen of the multimeter with the two ends of the chip resistance, the red and black pen is difficult to accurately contact the two ends of the chip resistance due to the small size of the chip resistance and the absence of the fixture, and it is too cumbersome to test a large number of chip resistances. Based on the technical deficiencies, the utility model designs a fixture for chip resistance test. UTILITY MODEL CONTENT

[0004] To solve the above problems existing in the prior art, the utility model provides a fixture for chip resistance test, which has the characteristics of quickly testing the chip resistance.

[0005] To achieve the above purpose, the utility model provides the following technical scheme: a fixture for chip resistance test, comprising a base, a test seat is arranged on the top of the base, an auxiliary mechanism is arranged on one side of the test seat;

[0006] The auxiliary mechanism comprises a pressing plate, a connecting rod, a sliding groove, a traction spring, a clamping plate, a limiting groove, a sleeve rod, a compression spring and a sleeve, the pressing plate is arranged on the top of the base, the bottom of the pressing plate is fixedly connected with the connecting rod, the connecting rod is provided with the sliding groove on one side, the connecting rod is provided with the traction spring in the inside, the clamping plate is slidably connected with the connecting rod on one side, the limiting groove is arranged on the upper surface of the clamping plate, the bottom of the connecting rod is fixedly connected with the sleeve rod, the lower surface of the sleeve rod is movably connected with the compression spring, and the outer surface of the sleeve rod is provided with the sleeve.

[0007] As a preferred technical scheme of the fixture for chip resistance test of the utility model, the bottom of the base is fixedly connected with a supporting leg, the top of the base is provided with a controller, one side of the controller is provided with a control panel, and the top of the base is provided with a bearing seat.

[0008] As a kind of patch resistor test fixture preferred technical scheme of the utility model, the top of test seat is provided with test groove, the inside of test seat is provided with elastic guide plate.

[0009] As a kind of patch resistor test fixture preferred technical scheme of the utility model, lower pressing plate is arranged at the top of test seat, and traction spring is arranged at the top of clamping plate.

[0010] As a kind of patch resistor test fixture preferred technical scheme of the utility model, clamping plate is slidably connected at the bottom of lower pressing plate, and clamping plate is slidably connected in the inside of sliding slot.

[0011] As a kind of patch resistor test fixture preferred technical scheme of the utility model, sleeve rod is slidably connected at the top of bearing seat, and sleeve rod is slidably connected in the inside of sleeve.

[0012] As a kind of patch resistor test fixture preferred technical scheme of the utility model, compression spring is movably clamped in the inside of sleeve, and sleeve is fixedly connected in the inside of bearing seat.

[0013] As a kind of patch resistor test fixture preferred technical scheme of the utility model, elastic guide plate is arranged in the inside of test groove, and test seat is arranged at the top of bearing seat.

[0014] Compared with prior art, the utility model has the advantages that:

[0015] 1、The utility model discloses in using, when needing to assist patch resistor to test, first, the end of patch resistor is contacted with the inclined surface of lower pressing plate and clamping plate, then pushes to one side of connecting rod, at this time, clamping plate slides down under pressure, and the traction force of traction spring makes clamping plate upwards to the patch resistor when the patch resistor reaches suitable position and is clamped, then press down lower pressing plate, so that lower pressing plate drives sleeve rod to press down, at this time, compression spring is compressed, until lower pressing plate and clamping plate drive the patch resistor of clamping contact elastic guide plate and complete test, the device is convenient for assisting patch resistor to test. ACCURACY OF DRAWINGS

[0016] The accompanying drawings are included to provide a further understanding of the utility model, and constitute a part of specification, and with the embodiment of the utility model, be used for explaining the utility model, do not constitute the limitation to the utility model.In the drawings:

[0017] Figure 1 It is base structure schematic view of the utility model;

[0018] Figure 2 It is controller structure schematic view of the utility model;

[0019] Figure 3The utility model discloses a test seat structure schematic view.

[0020] Figure 4 The utility model discloses an elastic guide plate structure schematic view.

[0021] Figure 5 The utility model discloses an auxiliary mechanism structure schematic view.

[0022] In the drawing: 1, base; 101, support foot; 102, controller; 103, control panel; 104, bearing seat; 2, test seat; 201, test groove; 202, elastic guide plate; 3, auxiliary mechanism; 301, lower pressing plate; 302, connecting rod; 303, sliding slot; 304, traction spring; 305, clamping plate; 306, limiting groove; 307, sleeve rod; 308, compression spring; 309, sleeve. DETAILED DESCRIPTION

[0023] The technical scheme in the embodiments of the utility model will be apparently and completely described below with the drawings in the embodiments of the utility model, and apparently, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by the ordinary skill in the art without creative work belong to the range of the utility model protection.

[0024] Embodiment 1

[0025] Please refer to Figures 1-5 The utility model provides following technical scheme: a kind of clamp for chip resistor test, including base 1, the top of base 1 is provided with test seat 2, one side of test seat 2 is provided with auxiliary mechanism 3.

[0026] The bottom of base 1 is fixedly connected with support foot 101, the top of base 1 is provided with controller 102, one side of controller 102 is provided with control panel 103, the top of base 1 is provided with bearing seat 104.

[0027] The top of test seat 2 is provided with test groove 201, the inside of test seat 2 is provided with elastic guide plate 202.

[0028] Elastic guide plate 202 is arranged in the inside of test groove 201, test seat 2 is arranged at the top of bearing seat 104.

[0029] It needs to be further explained that: the top of the base 1 is provided with a controller 102 and a control panel 103, a bearing seat 104 and a test seat 2 are arranged on one side of the controller 102, the test seat 2 is connected with the controller 102 through the bearing seat 104, the test work of the test seat 2 is controlled through the control panel 103, and the test result of the test seat 2 is observed, an auxiliary mechanism 3 is arranged on the top of the bearing seat 104, and the auxiliary mechanism 3 is arranged to facilitate auxiliary chip resistance test.

[0030] Embodiment 2

[0031] Please refer to Figures 3-5 The utility model provides the following technical scheme:

[0032] The auxiliary mechanism 3 includes a pressing plate 301, a connecting rod 302, a sliding groove 303, a traction spring 304, a clamping plate 305, a limiting groove 306, a sleeve rod 307, a compression spring 308 and a sleeve 309, the pressing plate 301 is arranged on the top of the base 1, the bottom of the pressing plate 301 is fixedly connected with the connecting rod 302, one side of the connecting rod 302 is provided with the sliding groove 303, the inside of the connecting rod 302 is provided with the traction spring 304, one side of the connecting rod 302 is slidably connected with the clamping plate 305, the upper surface of the clamping plate 305 is provided with the limiting groove 306, the bottom of the connecting rod 302 is fixedly connected with the sleeve rod 307, the lower surface of the sleeve rod 307 is movably connected with the compression spring 308, and the outer surface of the sleeve rod 307 is provided with the sleeve 309.

[0033] The pressing plate 301 is arranged on the top of the test seat 2, and the traction spring 304 is arranged on the top of the clamping plate 305.

[0034] The clamping plate 305 is slidably connected to the bottom of the pressing plate 301, and the clamping plate 305 is slidably connected to the inside of the sliding groove 303.

[0035] The sleeve rod 307 is slidably connected to the top of the bearing seat 104, and the sleeve rod 307 is slidably connected to the inside of the sleeve 309.

[0036] The compression spring 308 is movably connected to the inside of the sleeve 309, and the sleeve 309 is fixedly connected to the inside of the bearing seat 104.

[0037] Further need to be explained is that: one end of the patch resistor is contacted with the inclined surface of the pressing plate 301 and the clamping plate 305, then the clamping plate 305 is pushed to one side of the connecting rod 302, at this time, the clamping plate 305 is pressed and slides downward, the patch resistor reaches the appropriate position, the traction force of the traction spring 304 makes the clamping plate 305 upwardly clamp the patch resistor, then the pressing plate 301 is pressed downwardly, the pressing plate 301 drives the sleeve rod 307 to press downwardly, at this time, the compression spring 308 is compressed, until the pressing plate 301 and the clamping plate 305 drive the clamped patch resistor to contact the elastic guide plate 202 to complete the test, and the pressing plate 301, the clamping plate 305 and the elastic guide plate 202 can adapt to patch resistors of different sizes to test.

[0038] Working principle: when the patch resistor test fixture is used, the controller 102 and the control panel 103 are arranged on the top of the base 1, the bearing seat 104 and the test seat 2 are arranged on one side of the controller 102, the test seat 2 is connected with the controller 102 through the bearing seat 104, the test work of the test seat 2 is controlled through the control panel 103, and the test result of the test seat 2 is observed, the auxiliary mechanism 3 is arranged on the top of the bearing seat 104, and the auxiliary mechanism 3 is arranged to facilitate auxiliary patch resistor testing.

[0039] When the patch resistor needs to be tested, one end of the patch resistor is contacted with the inclined surface of the pressing plate 301 and the clamping plate 305, then the clamping plate 305 is pushed to one side of the connecting rod 302, at this time, the clamping plate 305 is pressed and slides downward, the patch resistor reaches the appropriate position, the traction force of the traction spring 304 makes the clamping plate 305 upwardly clamp the patch resistor, then the pressing plate 301 is pressed downwardly, the pressing plate 301 drives the sleeve rod 307 to press downwardly, at this time, the compression spring 308 is compressed, until the pressing plate 301 and the clamping plate 305 drive the clamped patch resistor to contact the elastic guide plate 202 to complete the test, and the pressing plate 301, the clamping plate 305 and the elastic guide plate 202 can adapt to patch resistors of different sizes to test.

[0040] Finally, it should be noted that: the above is only the preferred embodiment of the present application, and is not used to limit the present application, although the present application has been described in detail with reference to the foregoing embodiments, for those skilled in the art, the technical solutions recorded in the foregoing embodiments can be modified, or some technical features can be replaced. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A clip for testing a chip resistor, comprising a base (1), characterized in that: The top of the base (1) is provided with a test seat (2), one side of the test seat (2) is provided with an auxiliary mechanism (3); The auxiliary mechanism (3) comprises a pressing plate (301), a connecting rod (302), a sliding groove (303), a traction spring (304), a clamping plate (305), a limiting groove (306), a sleeve rod (307), a compression spring (308) and a sleeve (309), the pressing plate (301) is arranged at the top of the base (1), the bottom of the pressing plate (301) is fixedly connected with the connecting rod (302), one side of the connecting rod (302) is provided with the sliding groove (303), the inside of the connecting rod (302) is provided with the traction spring (304), one side of the connecting rod (302) is slidably connected with the clamping plate (305), the upper surface of the clamping plate (305) is provided with the limiting groove (306), the bottom of the connecting rod (302) is fixedly connected with the sleeve rod (307), the lower surface of the sleeve rod (307) is movably connected with the compression spring (308), the outer surface of the sleeve rod (307) is provided with the sleeve (309).

2. The clip for testing a chip resistor according to claim 1, wherein: The bottom of the base (1) is fixedly connected with a supporting leg (101), the top of the base (1) is provided with a controller (102), one side of the controller (102) is provided with a control panel (103), the top of the base (1) is provided with a bearing seat (104).

3. The clip for testing a chip resistor according to claim 1, wherein: The top of the test seat (2) is provided with a test groove (201), the inside of the test seat (2) is provided with an elastic guide plate (202).

4. The clip for testing a chip resistor according to claim 1, wherein: The pressing plate (301) is arranged at the top of the test seat (2), and the traction spring (304) is arranged at the top of the clamping plate (305).

5. The clip for testing a chip resistor according to claim 1, wherein: The clamping plate (305) is slidably connected to the bottom of the pressing plate (301), and the clamping plate (305) is slidably connected to the inside of the sliding groove (303).

6. The clip for testing a chip resistor according to claim 1, wherein: The sleeve rod (307) is slidably connected to the top of the bearing seat (104), and the sleeve rod (307) is slidably connected to the inside of the sleeve (309).

7. The clip for testing a chip resistor according to claim 1, wherein: The compression spring (308) is movably connected to the inside of the sleeve (309), and the sleeve (309) is fixedly connected to the inside of the bearing seat (104).

8. The clip for testing a chip resistor according to claim 3, wherein: The elastic guide plate (202) is arranged in the test groove (201), and the test seat (2) is arranged on the top of the bearing seat (104).

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