High-efficiency test structure for IGBT (Insulated Gate Bipolar Translator) module

Abstract

The utility model belongs to the technical field of IGBT production, and provides an IGBT module high-efficiency test structure, which comprises a rack large plate and a test machine, the rack large plate is fixedly provided with a test machine fixing assembly used for fixing the test machine, the rack large plate is provided with a mounting plate, and the mounting plate is fixedly provided with a hollow rotating platform driven by a servo motor. The objective of the utility model is to solve the technical problem of low testing efficiency caused by high equipment investment cost and low running speed during testing in the prior art. Compared with the prior art, the single-station jacking mechanism has the beneficial effects that the single-station jacking mechanism at a fixed position is realized, the manufacturing and electrical control cost is greatly reduced, and meanwhile, the consistency and the stability of a test platform or a material preparation platform during jacking are ensured; the rotation inertia of the mechanism is reduced, and the rotation speed is accelerated, so that the positions of the tested IGBT and the untested IGBT can be rapidly switched, and the overall test efficiency is improved.

Description

Technical Field

[0001] This utility model belongs to the field of IGBT production technology, and in particular relates to a high-efficiency test structure for IGBT modules. Background Technology

[0002] With the advancement of technology and industrial development, IGBT modules have become crucial components in the field of power electronics. Various IGBT modules are increasingly evolving towards higher efficiency, higher reliability, higher integration, and lower cost. Static testing equipment for IGBT modules, as an essential piece of equipment in power electronics laboratories, is no exception.

[0003] Insulated Gate Bipolar Transistor (IGBT) is a common semiconductor device that combines the advantages of metal oxide semiconductor field-effect transistors (MOSFETs) and bipolar transistors. It has a series of advantages such as high input impedance, low control power, simple drive circuit, high switching speed, high current density, low saturation voltage drop, and strong current handling capability.

[0004] IGBT modules need to be tested one by one before leaving the factory. Existing testing devices have the following shortcomings: 1. The mechanisms are repetitive, and the debugging costs of the mechanisms and electrical controls are high; 2. The overall mass is large, resulting in a large rotational inertia of the mechanism, which leads to a slow rotation speed and seriously affects the testing efficiency. Utility Model Content

[0005] The purpose of this invention is to provide a high-efficiency test structure for IGBT modules, aiming to solve the technical problems of high equipment investment costs and slow operation speed during testing, which lead to low testing efficiency in the prior art.

[0006] This utility model is implemented as follows: a high-efficiency testing structure for IGBT modules includes a frame plate and a testing machine. A testing machine fixing component for fixing the testing machine is fixedly installed on the frame plate. A mounting plate is provided on the frame plate, and a hollow rotating platform driven by a servo motor is fixedly installed on the mounting plate. The hollow rotating platform is provided with two sets of cantilever arms, and a testing platform and a material preparation platform are slidably installed on the two sets of cantilever arms respectively. A servo lifting module for pushing the testing platform and the material preparation platform to move is provided on the frame plate. An adjustment component for adjusting the position of the mounting plate is provided on the frame plate.

[0007] A further technical solution: The hollow rotating platform is provided with a sliding guide assembly for installing the test platform and the material preparation platform.

[0008] A further technical solution: Both sets of cantilever arms of the hollow rotating platform are equipped with buffer spring assemblies to maintain the stress of the mechanism.

[0009] A further technical solution: The test platform is provided with a fixture plate, which is connected to the test platform by pins and magnets, and the fixture plate and the fixture are connected by an adjustable slot hole.

[0010] Further technical solution: The servo lifting module includes a servo module, which is fixedly mounted on the mounting plate and drives the adapter plate to move. A support plate is fixedly mounted on the adapter plate, and a lifting block is fixedly mounted on the end of the support plate away from the adapter plate. The lifting block is used in conjunction with a contact block fixedly mounted on the test platform and the material preparation platform.

[0011] Further technical solution: The servo lifting module also includes a fixing plate, which is fixedly mounted on the mounting plate and used to fix the servo module. Multiple sets of triangular lifting mechanism reinforcing plates are fixedly mounted on the fixing plate.

[0012] A further technical solution: The adjustment component includes a support plate, which is fixedly installed on the frame plate. An adjustment screw is rotatably installed on the support plate, and the adjustment screw drives the adjustment plate to move. The adjustment plate is fixedly connected to the mounting plate.

[0013] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0014] 1. By using a servo lifting module to lift the test platform or material preparation platform at a fixed position, a single-station lifting mechanism with a fixed position is realized, which significantly reduces the cost of manufacturing and electrical control. At the same time, it ensures the consistency and stability of the test platform or material preparation platform during lifting, reduces the differences between different platforms during lifting, and improves the stability of IGBT testing.

[0015] 2. By using a hollow rotating platform, the mass and height of the mechanism are significantly reduced, thereby reducing the moment of inertia and increasing the rotation speed. This allows for a rapid switch between tested and untested IGBTs, improving overall testing efficiency. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0017] Figure 2 This is a schematic diagram of the test fixing component in this utility model.

[0018] Figure 3 This is a schematic diagram of the hollow rotating platform of this utility model.

[0019] Figure 4 This is a schematic diagram of the adjustment component in this utility model.

[0020] Figure 5 This is a schematic diagram of the servo lifting module in this utility model.

[0021] Figure 6 This is a schematic diagram of the buffer spring assembly in this utility model.

[0022] In the attached diagram: 1. Frame plate; 2. Testing machine fixing assembly; 3. Testing machine; 4. Testing platform; 5. Lifting mechanism reinforcing plate; 6. Contact block; 7. Adjustment assembly; 8. Servo lifting module; 9. Servo motor; 10. Lifting block; 11. Hollow rotating platform; 12. Material preparation platform; 13. Buffer spring assembly; 14. Sliding guide assembly; 15. Servo module; 16. Adjusting screw; 17. Fixing plate; 18. Adapter plate; 19. Support plate; 20. Mounting plate; 21. Support plate; 22. Adjusting plate. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0024] The specific implementation of this utility model will be described in detail below with reference to specific embodiments.

[0025] like Figures 1-6 As shown, this utility model provides a high-efficiency test structure for IGBT modules, including a frame plate 1 and a test machine 3. A test machine fixing component 2 for fixing the test machine 3 is fixedly installed on the frame plate 1. A mounting plate 20 is provided on the frame plate 1. A hollow rotating platform 11 driven by a servo motor 9 is fixedly installed on the mounting plate 20. The hollow rotating platform 11 is provided with two sets of cantilever arms, and a test platform 4 and a material preparation platform 12 are slidably installed on the two sets of cantilever arms respectively. A servo lifting module 8 for pushing the test platform 4 and the material preparation platform 12 to move is provided on the frame plate 1. An adjustment component 7 for adjusting the position of the mounting plate 20 is provided on the frame plate 1.

[0026] In practical application, this embodiment first adjusts the position of the mounting plate 20 using the adjusting component 7 according to the test conditions, so that the hollow rotating platform 11 is in a suitable test position. After adjustment, the test can be carried out. The test steps are as follows:

[0027] S1. The robotic arm removes the tested product from the preparation platform 12 and repositions the product to be tested.

[0028] S2. The hollow rotating platform 11 driven by the servo motor 9 moves and rotates 180 degrees to exchange the positions of the material preparation platform 12 and the test platform 4, thus completing the position conversion between the product to be tested and the product that has been tested.

[0029] S3. The test platform 4 is driven to rise by the servo lifting module 8. The test platform 4 moves along the sliding guide component 14 and sends the IGBT to be tested into the test machine 3 for product testing.

[0030] S4. After the test is completed, the servo lifting module 8 is reset, and the test platform 4 descends to the initial position along the sliding guide component 14 due to its own weight, thus completing the test cycle.

[0031] The servo lifting module 8 lifts the test platform 4 or the material preparation platform 12 at a fixed position, realizing a single-station lifting mechanism in a fixed position. This significantly reduces manufacturing and electrical control costs, while ensuring consistency and stability during the lifting of the test platform 4 or the material preparation platform 12, reducing differences between different platforms during lifting, and improving the stability of IGBT testing. The hollow rotating platform 11 significantly reduces the mass and height of the mechanism, thereby reducing the rotational inertia and accelerating the rotation speed. This allows for rapid switching between tested and untested IGBTs, improving overall testing efficiency.

[0032] Specifically, the test machine 3 is connected to the guide mechanism of the test machine fixing component 2, and the test machine 3 is fixed by the adjusting screw and quick clamp. The Y-direction position of the test machine 3 can be adjusted by the combined action of the adjusting screw and quick clamp, which facilitates the product adjustment and alignment between the test machine 3 and the test platform 4.

[0033] like Figure 1 , Figure 3 As shown, this utility model provides a high-efficiency test structure for IGBT modules. A sliding guide assembly 14 for installing the test platform 4 and the material preparation platform 12 is provided on the cantilever of the hollow rotating platform 11.

[0034] Specifically, both sets of cantilever arms of the hollow rotating platform 11 are equipped with buffer spring assemblies 13 for maintaining the stress of the mechanism.

[0035] In practical applications, this embodiment guides and restricts the movement of the test platform 4 and the material preparation platform 12 through the sliding guide component 14, thereby ensuring that the test platform 4 and the material preparation platform 12 move in a straight line and that the IGBT is in the correct position for testing. The buffer spring component 13 deforms and generates stress when the product enters the test machine 3, thereby always having a certain stress to keep the mechanism stable and increasing the reliability of the product entering the test machine 3.

[0036] In one example of this utility model, the sliding guide component 14 is a linear guide rail, but it can also be a guide shaft or other components with guiding functions. The linear guide rail guides the movement of the test platform 4 and the material preparation platform 12, ensuring the stability of the test platform 4 and the material preparation platform 12 during movement.

[0037] like Figure 3 As shown, this utility model provides a high-efficiency test structure for IGBT modules. A fixture plate is provided on the test platform 4. The fixture plate is connected to the test platform 4 by pins and magnets. The fixture plate and the fixture are connected by an adjustable slot-shaped hole.

[0038] In practical applications, this embodiment allows for adjustable positioning of the product in the X direction and the testing machine 3 in the Y direction, thanks to the adjustable slotted hole connection between the fixture plate and the fixture. This ensures that the alignment between the product and the testing machine 3 is adjustable, thus eliminating misalignment caused by mechanical errors.

[0039] like Figure 1 , Figure 3 and Figure 5 As shown, this utility model provides a high-efficiency test structure for IGBT modules. The servo lifting module 8 includes a servo module 15, which is fixedly mounted on the mounting plate 20 and drives the adapter plate 18 to move. A support plate 19 is fixedly mounted on the adapter plate 18, and a lifting block 10 is fixedly mounted on the end of the support plate 19 away from the adapter plate 18. The lifting block 10 is used in conjunction with the contact block 6 fixedly mounted on the test platform 4 and the material preparation platform 12.

[0040] Specifically, the servo lifting module 8 also includes a fixing plate 17, which is fixedly mounted on the mounting plate 20 and used to fix the servo module 15. Multiple sets of triangular lifting mechanism reinforcing plates 5 are fixedly mounted on the fixing plate 17.

[0041] In practical application, the servo module 15 drives the adapter plate 18 to move. The adapter plate 18 drives the lifting block 10 to move via the support plate 19. When the lifting block 10 moves upward, it contacts the contact block 6. Then, the lifting block 10 can push the test platform 4 or the material preparation platform 12 upward via the contact block 6. When the lifting block 10 moves downward, the test platform 4 and the material preparation platform 12 move downward under the action of gravity, thereby realizing the lifting operation of the test platform 4 and the material preparation platform 12. The servo module 15 improves the stability of the test platform 4 and the material preparation platform 12 when they rise. The fixed plate 17 and the lifting mechanism reinforcing plate 5 increase the installation strength of the servo module 15, thereby improving the stability of the servo module 15 when it is working.

[0042] In one example of this utility model, the servo module 15 can also be replaced by other components that can actively change length, such as electric cylinders or pneumatic cylinders. Lifting by the servo module 15 improves the stability of the test platform 4 and the material preparation platform 12 when they rise.

[0043] like Figure 1 , Figure 3 and Figure 4As shown, this utility model provides a high-efficiency test structure for an IGBT module. The adjustment component 7 includes a support plate 21, which is fixedly installed on the frame plate 1. An adjustment screw 16 is rotatably installed on the support plate 21. The adjustment screw 16 drives the adjustment plate 22 to move, and the adjustment plate 22 is fixedly connected to the mounting plate 20.

[0044] In practical application, rotating the adjusting screw 16 drives the adjusting plate 22 to move, thereby moving the mounting plate 20. The mounting plate 20 then moves the hollow rotating platform 11, allowing the hollow rotating platform 11 and the testing machine 3 to be positioned relative to the robotic gripper, with the position of the robotic gripper as a reference.

[0045] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

[0046] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A high efficiency test structure for IGBT modules, comprising a rack panel (1) and a test machine (3), characterized in that, The rack big board (1) is fixedly installed with a test machine fixing assembly (2) for fixing a test machine (3), the rack big board (1) is provided with a mounting plate (20), the mounting plate (20) is fixedly installed with a hollow rotating platform (11) driven by a servo motor (9), the hollow rotating platform (11) is provided with two groups of cantilever arms, and a test platform (4) and a standby material platform (12) are slidably installed on the two groups of cantilever arms respectively, the rack big board (1) is provided with a servo jacking module (8) for pushing the test platform (4) and the standby material platform (12) to move, and the rack big board (1) is provided with an adjusting assembly (7) for adjusting the position of the mounting plate (20). The cantilever arm of the hollow rotating platform (11) is provided with a sliding guide assembly (14) for installing the test platform (4) and the standby material platform (12). The two groups of cantilever arms of the hollow rotating platform (11) are provided with buffer spring assemblies (13) for keeping the stress of the mechanism.

2. The high efficiency test structure for an IGBT module of claim 1, wherein, The test platform (4) is provided with a jig plate connected with the test platform (4) through a pin and a magnet, and the jig plate and the jig are connected in a slotted hole adjustable connection.

3. The high efficiency test structure for an IGBT module of claim 1, wherein, The servo jacking module (8) comprises a servo module (15), the servo module (15) is fixedly installed on the mounting plate (20) and drives a adapter plate (18) to move, the adapter plate (18) is fixedly installed with a support plate (19), one end of the support plate (19) away from the adapter plate (18) is fixedly installed with a lifting block (10), and the lifting block (10) is used in cooperation with a contact block (6) fixedly installed on the test platform (4) and the standby material platform (12).

4. The high efficiency test structure for an IGBT module of claim 3, wherein, The servo jacking module (8) further comprises a fixed plate (17), the fixed plate (17) is fixedly installed on the mounting plate (20) and used for fixing the servo module (15), and a plurality of triangular structure jacking mechanism reinforcing plates (5) are fixedly installed on the fixed plate (17).

5. The high efficiency test structure for an IGBT module of claim 1, wherein, The adjusting assembly (7) comprises a support plate (21) fixedly installed on the rack big board (1), a adjusting screw (16) rotatably installed on the support plate (21), the adjusting screw (16) drives a adjusting plate (22) to move, and the adjusting plate (22) is fixedly connected with the mounting plate (20).

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