Inductor testing device

Abstract

The utility model relates to the technical field of inductor production, in particular to an inductor testing device, which comprises a testing mechanism and a transfer mechanism arranged on one side of the testing mechanism, and is characterized in that the testing mechanism comprises a supporting seat, a circuit board arranged on the supporting seat, a testing seat arranged on the circuit board and a plurality of testing probes arranged in the testing seat; the lower end of the test probe is electrically connected with the circuit board, and the top surface of the test seat is provided with a lower concave part; the test probe comprises a needle tube, a long needle head connected to one end of the needle tube, a short needle head connected to the other end of the needle tube, and a spring arranged in the needle tube. The test probe is provided with the long probe head and the short probe head, and the spring is arranged in the test probe, so that conduction can be realized when the test probe is in contact with a product, a buffer effect can be achieved, the product is prevented from being damaged due to overlarge contact pressure, the test accuracy is ensured, the service life is long, and the test cost is reduced.

Description

Technical Field

[0001] This utility model relates to the field of inductor manufacturing technology, and specifically to an inductor testing device. Background Technology

[0002] An inductor, also known as a choke, reactor, or dynamic reactor, is a component that converts electrical energy into magnetic energy and stores it. The structure of an inductor is similar to a transformer, but it has only one winding. Inductors have a certain inductance; they only impede changes in current. Inductors are widely used in various fields such as mechanical and electrical engineering. An inductor generally consists of a frame, coil winding, shielding, encapsulation material, and a magnetic core or iron core. Common inductors include magnetic ring inductors, color-coded inductors, surface-mount inductors, and molded inductors, each with different processing requirements. After processing, inductors need to be tested, including electrical performance testing and visual inspection, to determine if they meet the required specifications. Taking a common-mode chip inductor as an example, electrical testing is required after production. Currently, when testing common-mode chip inductors, probes or copper strips are generally used to establish conductivity with the inductor's pads. However, for smaller common-mode chip inductors, especially those with pad widths less than or equal to 0.35mm, existing probes require offset positioning and insertion, resulting in excessive end pressure that can easily damage the product. Using copper strips is also difficult to meet the impedance matching requirements of high-frequency parameters. Although vertical conductive adhesive is now used for testing, it has a short lifespan, is expensive, and has a high cost. Utility Model Content

[0003] To address the aforementioned problems, this invention provides an inductor testing device that can automatically sort inductors based on their specific defects.

[0004] This utility model is achieved using the following solution:

[0005] An inductor testing device includes a testing mechanism and a transfer mechanism disposed on one side of the testing mechanism. The testing mechanism includes a support base, a circuit board disposed on the support base, a test socket disposed on the circuit board, and a plurality of test probes disposed within the test socket. The lower ends of the test probes are electrically connected to the circuit board. The top surface of the test socket is provided with a recess for accommodating the product under test. The test probe includes a needle tube, a long needle connected to one end of the needle tube, a short needle connected to the other end of the needle tube, and a spring disposed inside the needle tube. One end of the spring is connected to the long needle, and the other end of the spring is connected to the short needle. The long needle protrudes from the bottom surface of the recess.

[0006] Furthermore, a transition slope is provided between the sidewall of the recessed portion and the top surface of the test seat.

[0007] Furthermore, the circuit board is provided with a plurality of pads, and the short tip of the test probe is electrically connected to the pads.

[0008] Furthermore, the test socket is provided with mounting holes for mounting test probes.

[0009] Furthermore, the mounting hole is a stepped hole, including a large-diameter section near the lower side of the test base and a small-diameter section near the upper side of the test base.

[0010] Furthermore, the transfer mechanism includes a transfer bracket, a fixed plate disposed on the transfer bracket, a horizontal moving component disposed on one side of the fixed plate, a vertical moving component connected to the horizontal moving component, a material picking component connected to the vertical moving component, and a drive component, wherein the drive component is drively connected to the vertical moving component.

[0011] Furthermore, the material handling assembly includes a connecting block connected to the vertical moving assembly, a mounting base connected to the connecting block, and a suction nozzle connected to the mounting base.

[0012] Furthermore, the horizontal movement component includes a guide rail arranged in a horizontal direction and a slider movably connected to the guide rail.

[0013] Furthermore, the vertical moving component includes a fixed block connected to a slider, a sliding rod movably connected to the fixed block, and the material picking component is connected to the lower end of the sliding rod.

[0014] Furthermore, the drive assembly includes a motor connected to the fixed plate, a connecting rod connected to the output end of the motor, and the connecting rod being connected to the upper end of the slide rod.

[0015] Compared with the prior art, the present invention has the following advantages:

[0016] This invention features a test socket on a circuit board, with a test probe inside. The test probe has a long needle tip and a short needle tip, and contains a spring. This allows for both conductivity and buffering when in contact with the product, preventing damage due to excessive contact pressure and ensuring test accuracy. Furthermore, this invention has a long service life and reduces testing costs. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of an inductor testing device provided by this utility model.

[0018] Figure 2 This is an exploded view of the testing mechanism of this utility model.

[0019] Figure 3 This is a schematic diagram of the test probe of this utility model.

[0020] Figure 4 This is a schematic diagram of the test stand of this utility model.

[0021] The image includes:

[0022] Test mechanism 1, support base 11, circuit board 12, solder pad 121, test base 13, test probe 14, needle tube 141, long needle 142, short needle 143, spring 144, recessed part 15, transition slope 16, mounting hole 17, transfer mechanism 2, transfer bracket 21, fixing plate 22, horizontal moving assembly 23, guide rail 231, slider 232, vertical moving assembly 24, fixing block 241, sliding rod 242, material picking assembly 25, connecting block 251, mounting base 252, suction nozzle 253, drive assembly 26, motor 261, connecting rod 262. Detailed Implementation

[0023] To facilitate understanding of this utility model by those skilled in the art, the present utility model will be further described in detail below with reference to specific embodiments and accompanying drawings.

[0024] Reference Figures 1 to 4 This embodiment provides an inductor testing device, including a testing mechanism and a transfer mechanism disposed on one side of the testing mechanism. The testing mechanism includes a support base, a circuit board disposed on the support base, a test socket disposed on the circuit board, and a plurality of test probes disposed within the test socket. The lower ends of the test probes are electrically connected to the circuit board. The top surface of the test socket has a recess for accommodating the product under test. In this embodiment, the test socket, circuit board, and support base can be fixed together by screws. The circuit board is wired according to the conventional LCR and S-parameter characteristics of the product under test. The material is usually FR4 and Rogers high-frequency board to match the corresponding LCR and S-parameter tests. Low loss is required. In addition, the surface mount area of ​​the circuit board uses copper thickness of more than 35um + tin plating or gold plating to further extend the service life. The circuit board has 8 holes: 4 outer positioning holes for fixing the circuit board to the support base, and 4 inner positioning holes for attaching the test socket to the support base.

[0025] The test probe includes a needle tube, a long needle connected to one end of the needle tube, a short needle connected to the other end of the needle tube, and a spring disposed inside the needle tube. One end of the spring is connected to the long needle, and the other end of the spring is connected to the short needle. The long needle protrudes from the bottom surface of the recessed portion. This test probe acts as a bridge between the circuit board and the device under test. With this structure, the needle tube outer diameter can be as small as 0.26mm, the working spring force is only 14g, and the frequency bandwidth meets 1dB@6GHz. It features small size, high precision, low loss, and no damage to solder pads, making it very suitable for testing small-volume chip common-mode inductors. The test probe of this invention solves the problems of large size, high pressure, and damage to solder pads in existing testing methods. It is made of high-hardness material and has a service life of up to 100,000 cycles, and can replace heavy-duty conductive adhesive.

[0026] A transition slope is provided between the sidewall of the recessed portion and the top surface of the test seat. The design of the transition slope allows the product to easily enter the slot without causing material jamming or damage to the solder pads.

[0027] The circuit board has several pads, and the short tip of the test probe is electrically connected to the pads. The short tip of the test probe must be kept in full-stroke elasticity for a long time, so that the end is always in contact with the circuit board pads, while the long tip is in a normally open state. The selection of probes should be based on the product structure to select different elastic forces and different end shapes to match the corresponding product tests.

[0028] The test socket is provided with mounting holes for mounting test probes. These mounting holes are stepped holes, comprising a larger diameter section near the lower side of the test socket and a smaller diameter section near the upper side. The stepped structure with the smaller hole at the top helps to limit the probe tube, preventing the test probe from flying out of the test socket under elastic force.

[0029] The transfer mechanism includes a transfer bracket, a fixed plate disposed on the transfer bracket, a horizontal moving component disposed on one side of the fixed plate, a vertical moving component connected to the horizontal moving component, a material picking component connected to the vertical moving component, and a drive component, wherein the drive component is drively connected to the vertical moving component.

[0030] The material handling assembly includes a connecting block connected to the vertical moving assembly, a mounting base connected to the connecting block, and a suction nozzle connected to the mounting base. The horizontal moving assembly includes a guide rail arranged in a horizontal direction and a slider movably connected to the guide rail. The vertical moving assembly includes a fixed block connected to the slider, a sliding rod movably connected to the fixed block, and the material handling assembly is connected to the lower end of the sliding rod.

[0031] The driving assembly includes a motor connected to the fixed plate and a connecting rod connected to the output end of the motor. The connecting rod is connected to the upper end of the slide rod. The connecting rod and the slide rod are connected by a rotating shaft. When the motor drives the connecting rod to rotate, the slide rod moves both vertically and horizontally under the drive of the connecting rod, thereby picking up the product from another position and placing it into the recessed area. In actual operation, the conveyor belt transports the product to the picking position of the transfer mechanism. The transfer mechanism picks up the product, places it into the recessed area of ​​the test seat, and then releases it for testing. Alternatively, two transfer mechanisms can be set up: one for placing the product to be tested and the other for removing the tested product.

[0032] This invention features a test socket on a circuit board, with a test probe inside. The test probe has a long needle tip and a short needle tip, and contains a spring. This allows for both conductivity and buffering when in contact with the product, preventing damage due to excessive contact pressure and ensuring test accuracy. Furthermore, this invention has a long service life and reduces testing costs.

[0033] In the description of this utility model, it should be understood that the indicated orientation or positional relationship is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this utility model and simplifying the description, and is not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. For example, "upper," "lower," "left," "right," etc. are only used to indicate relative positional relationships, and when the absolute position of the object being described changes, the relative positional relationship may also change accordingly.

[0034] The terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0035] In this utility model, unless otherwise explicitly specified and limited, the terms "connection," "fixed," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0036] Although the description of this utility model has been given in conjunction with the specific embodiments described above, it is obvious to those skilled in the art that many substitutions, modifications, and variations can be made based on the above description. Therefore, all such substitutions, modifications, and variations are included within the scope of the appended claims.

Claims

1. An inductor testing apparatus, characterized by, The utility model relates to a test mechanism, transfer mechanism set up one side at the test mechanism, the test mechanism includes support seat, the circuit board set up on the support seat, the test seat set up on the circuit board and a plurality of test probes set up in the test seat, the lower end of test probe and the circuit board electric connection, the top of test seat is provided with a lower concave part for containing the product to be tested, the test probe includes needle tube, the long needle head connected in one end of needle tube, the short needle head connected in the other end of needle tube, the spring set up in needle tube, one end of spring and long needle head are connected, the other end of spring and short needle head are connected, long needle head exposes from the bottom surface of lower concave part.

2. The inductor testing device of claim 1, wherein, The transition slope is arranged between the side wall of the lower concave part and the top surface of the test seat.

3. The inductor testing device of claim 1, wherein, The circuit board is provided with a plurality of pads, and the short needle head of the test probe is electrically connected with the pads.

4. The inductor testing device of claim 1, wherein, The test seat is provided with a mounting hole for mounting the test probe.

5. The inductor testing device of claim 4, wherein, The mounting hole is a stepped hole, including a large-diameter section close to the lower side of the test seat and a small-diameter section close to the upper side of the test seat.

6. The inductor testing device of claim 1, wherein, The transfer mechanism includes a transfer support, a fixed plate arranged on the transfer support, a horizontal moving assembly arranged on one side of the fixed plate, a vertical moving assembly connected with the horizontal moving assembly, a material taking assembly connected with the vertical moving assembly, and a driving assembly in transmission connection with the vertical moving assembly.

7. The inductor testing device of claim 6, wherein, The material taking assembly includes a connecting block connected with the vertical moving assembly, a mounting seat connected with the connecting block, and a suction nozzle connected with the mounting seat.

8. The inductor testing device of claim 6, wherein, The horizontal moving assembly includes a guide rail arranged in the horizontal direction, and a sliding block in moving connection with the guide rail.

9. The inductor testing device of claim 8, wherein, The vertical moving assembly includes a fixed block connected with the sliding block, a sliding rod in moving connection with the fixed block, and the material taking assembly connected with the lower end of the sliding rod.

10. The inductor testing device of claim 9, wherein, The driving assembly includes a motor connected with the fixed plate, and a connecting rod connected with the output end of the motor, and the connecting rod is connected with the upper end of the sliding rod.

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