Test fixture and online test equipment
By introducing a swing structure and universal joint into the test fixture, the probe orientation can be adjusted, solving the problem that different sizes of PCBAs require different fixtures and reducing production costs.
Patent Information
- Application Number
- CN202423135153.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2026-01-02
- Estimated Expiration
- 2034-12-18
AI Technical Summary
Different sizes of PCBA require the development of different test fixtures, which increases production costs.
Design a test fixture comprising a swing structure, a probe, and a universal joint. The orientation of the probe is adjusted by the universal joint to make it applicable to PCBAs of different sizes, thereby achieving the connection between the probe and the test point.
This improved the versatility of the testing fixture and reduced production costs.
Smart Images
Figure CN223756798U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of online testing equipment, and in particular to a test fixture and online testing equipment. BACKGROUND
[0002] This section is intended to provide background or context to the embodiments of the application. The description herein is not admitted to be prior art merely by inclusion in this section.
[0003] In-circuit test (ICT) is a test method based on circuit structure. An in-circuit test system can test a printed circuit board assembly (PCBA) by contacting test points on the PCBA through a test fixture, applying current and voltage, and detecting open circuit, short circuit, and / or resistance of the PCBA. The in-circuit test system can quickly detect common defects such as open circuit and / or short circuit of the PCBA, and ensure basic circuit properties of the product.
[0004] In related technologies, different sizes of PCBA require corresponding test fixtures. Each type of PCBA requires a corresponding test fixture to be developed. The large number of test fixtures increases production costs. CONTENT OF THE INVENTION
[0005] Therefore, the embodiments of the present application aim to provide a test fixture and online testing equipment, which can reduce production costs.
[0006] The first aspect of the embodiments of the present application provides a test fixture, comprising:
[0007] a bed body;
[0008] a detection device comprising a swing structure, a probe, and a universal joint, the probe being arranged on the swing structure, the universal joint being arranged on the bed body, and the swing structure being connected to the universal joint.
[0009] In some embodiments, the detection device further comprises a carrier connected between the bed body and the universal joint, and the bed body and the carrier are detachably connected.
[0010] In some embodiments, the bed body has a plurality of mounting portions, and the carrier is detachably connected to any one of the mounting portions.
[0011] In some embodiments, the carrier has a plurality of fixed positions in the up-down direction, and the carrier can be fixed at any one of the fixed positions.
[0012] In some embodiments, the carrier is in a rod structure extending in the up-down direction, and the carrier is threadedly connected with the bed body.
[0013] In some embodiments, the swing structure comprises a support rod and a support frame, the support rod is connected with the universal joint, the probe is arranged on the support frame, and the support rod is movably connected with the support frame so that the axial direction of the probe is perpendicular to the horizontal plane.
[0014] In some embodiments, the support rod and the support frame are hinged.
[0015] In some embodiments, the probe is detachably connected with the swing structure.
[0016] In some embodiments, the probe is threadedly connected with the swing structure.
[0017] The second aspect of the embodiments of the present application provides an online testing device comprising the test fixture of any one of the preceding embodiments.
[0018] The test fixture provided by the embodiments of the present application can be used for different scales of PCBA, and the universality of the test fixture is improved, and the production cost is reduced. BRIEF DESCRIPTION OF DRAWINGS
[0019] Figure 1 A structural schematic diagram of the test fixture provided by some embodiments of the present application is shown;
[0020] Figure 2 A structural schematic diagram of the carrier, the universal joint and the support rod provided by some embodiments of the present application are assembled;
[0021] Figure 3 A structural schematic diagram of the carrier and the bed body provided by some embodiments of the present application are threadedly connected, wherein A represents a nut;
[0022] Figure 4 A structural schematic diagram of the probe and the support frame provided by some embodiments of the present application are threadedly connected, wherein B represents a nut.
[0023] REFERENCE SIGNS
[0024] A test fixture 100;
[0025] A bed body 10, a mounting portion 10a, a bottom plate 11, a top plate 12, and a support column 13;
[0026] A detection device 20, a carrier 21, a swing structure 22, a support rod 221, a support frame 222, a fixing hole 222a, a probe 23, and a universal joint 24. DETAILED DESCRIPTION
[0027] The embodiments of the present application will be further described in details below with reference to the drawings and embodiments. The following embodiments are used to illustrate the present application, but cannot be used to limit the scope of the present application.
[0028] The various specific technical features and embodiments described in the detailed description can be combined in any suitable manner in the non-contradictory case, for example, different specific technical features / embodiments can form different embodiments by combination. In order to avoid unnecessary repetition, various possible combinations of various specific technical features / embodiments in the present application are not described again. In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance. The present application will be further described in details below with reference to the drawings and embodiments.
[0029] In order to facilitate the understanding of the detection jig provided by the embodiments of the present application, the online testing equipment provided by the embodiments of the present application is described first:
[0030] The online testing equipment provided by the embodiments of the present application includes the test jig 100 in any one of the embodiments of the present application.
[0031] For example, the test jig 100 is electrically connected with the test points of the PCBA, and the test jig 100 is used to collect and transmit the electrical signals generated by the PCBA. The electrical signals include but are not limited to voltage, current, resistance or inductance, etc.
[0032] In some embodiments, the online testing equipment includes a test table, the bed body 10 of the test jig 100 is connected with the test table, and the test table has a placement surface for placing the PCBA. For example, in the projection plane perpendicular to the up-down direction, the projection range of the PCBA is located within the projection range of the bed body 10, so that the test jig 100 can test all test points of the PCBA.
[0033] In some embodiments, the online testing equipment includes a processing device, the test jig 100 is electrically connected with the processing device, and the processing device, the test jig 100 and the PCBA can form an electrical circuit. The processing device can be used to apply current and voltage, and the electrical signals generated by the PCBA are transmitted to the processing device through the test jig 100, and the processing device is used to collect and process the electrical signals.
[0034] In the related art, the positions of the test points of PCBA of different scales are different, and the positions of the probes of the test jig are usually fixed, so that a test jig needs to be developed for each type of PCBA to enable the probes to contact the test points.
[0035] Please refer to Figures 1 to 4The embodiment of the present application provides a test fixture 100, which comprises a bed body 10 and a detection device 20, the detection device 20 comprises a swing structure 22, a probe 23 and a universal joint 24, the probe 23 is arranged on the swing structure 22, the universal joint 24 is arranged on the bed body 10, and the swing structure 22 is connected with the universal joint 24.
[0036] The probe 23 is connected with test points of the PCBA, and the probe 23 is used for collecting electrical signals generated by the PCBA.
[0037] The universal joint 24 is arranged on the bed body 10, the swing structure 22 can rotate in any direction through the universal joint 24, so that the orientation of the probe 23 can be adjusted, and the probe 23 can be connected with test points of PCBA of different sizes. In this way, the test fixture 100 can be suitable for PCBA of different sizes, and the production cost is reduced.
[0038] The specific type of the universal joint 24 is not limited, for example, please refer to Figure 2 The universal joint 24 can be a ball type universal joint.
[0039] The test fixture 100 provided by the embodiment of the present application, the swing structure 22 can rotate in any direction through the universal joint 24, so that the orientation of the probe 23 can be adjusted, and the probe 23 can be connected with test points of PCBA of different sizes, so that the test fixture 100 can be suitable for PCBA of different sizes, the versatility of the test fixture 100 is improved, and the production cost is reduced.
[0040] In some embodiments, please refer to Figure 1 The bed body 10 comprises a bottom plate 11, a top plate 12 and a plurality of support columns 13, the bottom plate 11 and the top plate 12 are respectively connected with two ends of the support column 13 along the axial direction, the support column 13 plays a fixing role on the bottom plate 11 and the top plate 12, and the structural stability of the bed body 10 can be enhanced.
[0041] It should be noted that in the embodiment of the present application, the plurality of refers to the number including two and more than two.
[0042] In some embodiments, the detection device 20 further comprises a bearing 21, the bearing 21 is connected between the bed body 10 and the universal joint 24, and the bed body 10 and the bearing 21 are detachably connected. In this way, during the assembly of the test fixture 100, the detection device 20 can be assembled separately first, and then the detection device 20 is installed on the bed body 10 through the bearing 21, so that the assembly difficulty can be reduced, and the assembly efficiency is improved.
[0043] The bearing 21 is arranged on the bed body 10, and the detection device 20 is fixed to the bed body 10 through the bearing 21. The bearing 21 and the swing structure 22 are connected through the universal joint 24, for example, please refer to Figure 1The bearing 21 is connected with the universal joint 24 at an end of the bearing 21 in the axial direction away from the bed body 10, that is, the swing structure 22 is located at an end of the bearing 21 in the axial direction away from the bed body 10, the bearing 21 can be kept stationary, and the swing structure 22 can be rotated in any direction through the universal joint 24, so that the orientation of the probe 23 can be adjusted, and the probe 23 can be connected with test points of PCBAs of different sizes. In this way, the test fixture 100 can be suitable for PCBAs of different sizes, and the versatility of the test fixture 100 is improved.
[0044] In some embodiments, referring to Figure 1 The bed body 10 has a plurality of mounting portions 10a, and the bearing 21 is detachably connected with any one of the mounting portions 10a.
[0045] The mounting portion 10a plays a positioning role for the bearing 21. In this way, on the one hand, the position of the bearing 21 on the bed body 10 can be adjusted through the plurality of mounting portions 10a, so that the orientation of the swing structure 22 is adjusted, that is, the position of the probe 23 is adjusted, so that the probe 23 can contact test points of PCBAs of different sizes, and the versatility of the test fixture 100 is further improved. On the other hand, each mounting portion 10a can be provided with a corresponding bearing 21, so that a plurality of detection devices 20 can be arranged at the same time, that is, the test fixture 100 has a plurality of probes 23. In this way, for a PCBA having a plurality of test points, the plurality of probes 23 of the test fixture 100 correspond to the plurality of test points of the PCBA one by one, and the operation efficiency is improved.
[0046] In some embodiments, referring to Figure 1 and Figure 3 The mounting portion 10a can be a positioning hole penetrating through the bottom plate 11, and the bearing 21 can be arranged through the positioning hole, so as to facilitate the user to assemble and disassemble the bearing 21 and the bed body 10.
[0047] For example, the diameter of the positioning hole can be 10 mm, 12 mm, 14 mm, 16 mm, 18 mm, or 20 mm, etc.
[0048] In some embodiments, referring to Figure 1 The plurality of mounting portions 10a can be arranged in a matrix. That is, the mounting portions 10a on the bed body 10 are distributed in a certain order, so that the arrangement of the detection device 20 is relatively regular.
[0049] For example, the spacing between the two adjacent mounting portions 10a can be 10 mm, 12 mm, 14 mm, 16 mm, 18 mm, or 20 mm, etc.
[0050] In some embodiments, the carrier 21 has a plurality of fixed positions in the up-down direction, and the carrier 21 can be fixed at any one of the fixed positions. That is, by adjusting the fixed position of the carrier 21 in the up-down direction, the position of the swing structure 22 in the up-down direction is adjusted. In this way, the height of the probe 23 can be preliminarily adjusted so that the probe 23 is in good contact with the test points of the PCBA.
[0051] It should be noted that in the embodiments of the present application, down refers to the direction towards the ground, and up refers to the direction opposite to down.
[0052] In some embodiments, referring to Figure 2 and Figure 3 , the carrier 21 is in the form of a rod structure extending in the up-down direction, and the carrier 21 is threadedly connected with the bed body 10.
[0053] The carrier 21 is threadedly connected with the bed body 10, which not only facilitates the detachable connection of the carrier 21 with the bed body 10, but also allows the fixed position of the carrier 21 in the up-down direction to be adjusted by adjusting the connection position of the carrier 21 with the bed body 10. For example, if it is necessary to adjust the height of the detection device 20 upward, the carrier 21 can be rotated forward so that the carrier 21 moves upward until the carrier 21 moves to the target fixed position, and then the rotation can be stopped to complete the adjustment of the fixed position of the carrier 21; if it is necessary to adjust the height of the detection device 20 downward, the carrier 21 can be rotated reversely so that the carrier 21 moves downward until the carrier 21 moves to the target fixed position, and then the rotation can be stopped to complete the adjustment of the fixed position of the carrier 21. In addition, the carrier 21 in the form of a rod structure is convenient to hold, which facilitates the user to adjust the fixed position of the carrier 21 in the up-down direction.
[0054] Specifically, the mounting portion 10a is formed with a first internal thread, and the carrier 21 is formed with a first external thread matched with the first internal thread. By matching the first internal thread with the first external thread, the rotation of the carrier 21 can be converted into the lifting movement of the carrier 21, so that the carrier 21 can be fixed at any one of the fixed positions, and the operation is convenient.
[0055] In some embodiments, referring to Figure 1 , the swing structure 22 includes a support rod 221 and a support frame 222, the support rod 221 is connected with the universal joint 24, the probe 23 is arranged on the support frame 222, and the support rod 221 is movably connected with the support frame 222 so that the axial direction of the probe 23 is perpendicular to the horizontal plane.
[0056] For example, referring to Figure 1The support rod 221 is connected with the universal joint 24 at one end of the support rod 221 in the axial direction, and the support frame 222 is located at the other end of the support rod 221 away from the universal joint 24 in the axial direction. That is, the support rod 221 can be rotated in any direction through the universal joint 24, and the user can hold the support rod 221 and / or the support frame 222 to adjust the orientation of the probe 23, which is convenient to operate.
[0057] For example, the PCBA is placed on the placement surface, and the axial direction of the probe 23 is perpendicular to the horizontal plane, that is, the axial direction of the probe 23 is substantially perpendicular to the surface of the PCBA. In this way, on the one hand, the probe 23 can be more accurately aligned with the test points of the PCBA, reducing test errors caused by angle deviation. On the other hand, the contact between the probe 23 and the test points of the PCBA is more stable, preventing poor contact between the probe 23 and the test points of the PCBA from causing testing failure.
[0058] In some embodiments, the support rod 221 and the support frame 222 are hinged. In this way, the support frame 222 can be rotated relative to the support rod 221, and at the same time, the connection between the support frame 222 and the support rod 221 is stable and not prone to loosening, thereby maintaining the axial direction of the probe 23 perpendicular to the horizontal plane.
[0059] In some embodiments, the probe 23 is detachably connected with the swing structure 22. In this way, the probe 23 can be replaced, for example, in the case of damage or poor contact of the probe 23.
[0060] For example, the probe 23 is detachably connected with the support frame 222, so that the swing structure 22, the universal joint 24, the carrier 21 and the bed body 10 can be assembled first, and then the probe 23 is installed on the support frame 222, which reduces the assembly difficulty and improves the assembly efficiency.
[0061] In some embodiments, please refer to Figure 4 The support frame 222 is formed with a fixing hole 222a, and the probe 23 can pass through the fixing hole 222a, which facilitates the user to assemble and disassemble the probe 23 and the support frame 222, and to replace the probe 23 according to different sizes of the PCBA.
[0062] For example, the diameter of the fixing hole 222a can be 1.2mm, 1.5mm, 2mm, 2.5mm, 3mm, 3.5mm or 4mm, etc.
[0063] In some embodiments, please refer to Figure 1 The probe 23 is threadedly connected with the swing structure 22. For example, please refer to Figure 4The probe 23 is screwed with the support frame 222. The support frame 222 is formed with a second inner thread, and the probe 23 is formed with a second outer thread matched with the second inner thread. Through the cooperation of the second inner thread and the second outer thread, the rotation of the probe 23 can be converted into the lifting movement of the probe 23. In this way, the height of the probe 23 can be adjusted, so that the probe 23 is in good contact with the test points of the PCBA, and the poor contact between the probe 23 and the test points of the PCBA is prevented, so that the test cannot be performed.
[0064] In the description of the present specification, the description of the terms "one embodiment", "some embodiments" and "exemplary" means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the embodiments of the present application. In the present specification, the exemplary description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any suitable manner in any one or more embodiments or examples. In addition, the person skilled in the art can combine and combine the different embodiments or examples described in the present specification and the features of the different embodiments or examples without contradiction.
[0065] The various embodiments / embodiments provided by the present application can be combined with each other without contradiction. The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application can have various changes and variations. Any modification, equivalent replacement, improvement, etc. within the spirit and principles of the present application shall be included in the protection scope of the present application.
Claims
1. A test fixture, comprising: The test fixture comprises: a bed body; a detection device comprising a swing structure, a probe and a universal joint, the probe being arranged on the swing structure, the universal joint being arranged on the bed body, and the swing structure being connected with the universal joint.
2. The test fixture of claim 1, wherein, The detection device further comprises a carrier connected between the bed body and the universal joint, and the bed body and the carrier are detachably connected.
3. The test fixture of claim 2, wherein, The bed body has a plurality of mounting portions, and the carrier is detachably connected with any one of the mounting portions.
4. The test fixture of claim 2, wherein, The carrier has a plurality of fixing positions in the up-down direction, and the carrier can be fixed at any one of the fixing positions.
5. The test fixture of claim 4, wherein, The carrier has a rod-shaped structure extending in the up-down direction, and the carrier is threadedly connected with the bed body.
6. The test fixture of claim 1, wherein, The swing structure comprises a support rod and a support frame, the support rod is connected with the universal joint, the probe is arranged on the support frame, and the support rod is movably connected with the support frame so that the axial direction of the probe is perpendicular to the horizontal plane.
7. The test fixture of claim 6, wherein, The support rod and the support frame are hinged.
8. The test fixture of any one of claims 1 to 7, wherein, The probe is detachably connected with the swing structure.
9. The test fixture of any one of claims 1 to 7, wherein, The probe is threadedly connected with the swing structure.
10. An in-line testing apparatus characterized by, The test fixture comprises any one of claims 1 to 9.