Test tool and test system

Abstract

The utility model discloses a testing tool and a testing system, and relates to the technical field of testing, the testing tool comprises an interface assembly, a signal processing assembly, a first connecting end and a second connecting end, the interface assembly is used for accessing an SIM card to be tested; the signal processing assembly is electrically connected with the interface assembly; the first connecting end is electrically connected with the signal processing assembly and is used for accessing a function test module; the second connecting end is electrically connected with the signal processing assembly and is used for accessing a parameter modification tool; the signal processing component is used for establishing a data path between the interface component and the first connecting end; or the data path establishing module is used for establishing a data path between the interface component and the second connecting end. The utility model aims to realize automatic operation of rewriting and testing processes in the SIM card testing process, reduce manual operation, improve user experience and reduce testing cost.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing, in particular to a test tool and a test system. BACKGROUND

[0002] During the test process of a module project, different types of SIM cards are tested, and the files in the SIM cards need to be modified to check whether the function test module can normally register online when using the SIM card. There are two traditional test schemes: scheme one is to use a mechanical arm to plug and unplug the SIM card, modify the parameter data of different types of SIM cards in advance, and then use the mechanical arm to test the SIM card. Scheme two is to manually plug and rewrite the SIM card. However, scheme one using the mechanical arm needs to write the SIM card in advance, requires a large number of SIM cards, and has high cost. Scheme two using manual plugging and rewriting of the SIM card consumes a large amount of labor. CONTENT OF THE UTILITY MODEL

[0003] The main purpose of the present application is to provide a test tool and a test system, which aims to realize automatic operation of rewriting and test process in the test process of the SIM card, reduce manual operation, improve user experience, and reduce test cost.

[0004] To achieve the above purpose, the utility model provides a test tool, the test tool includes:

[0005] An interface component is used for accessing a SIM card to be tested.

[0006] A signal processing component is electrically connected with the interface component.

[0007] A first connection end is electrically connected with the signal processing component and is used for accessing a function test module.

[0008] A second connection end is electrically connected with the signal processing component and is used for accessing a parameter modification tool.

[0009] The signal processing component is used for establishing a data path between the interface component and the first connection end, or establishing a data path between the interface component and the second connection end.

[0010] In an embodiment, the signal processing component includes:

[0011] A control chip has a controlled end for accessing a selection signal.

[0012] A switch, which comprises a common terminal, a controlled terminal, a first terminal and a second terminal, the common terminal is electrically connected with the interface assembly, the controlled terminal is electrically connected with the control terminal of the control chip, the first terminal is electrically connected with the first connecting terminal, and the second terminal is electrically connected with the second connecting terminal;

[0013] The control chip is used for controlling the switch to turn on the path between the common terminal and the first terminal according to the selection signal, so as to output the parameter data of the SIM card under test to the functional test module; or controlling the switch to turn on the path between the common terminal and the second terminal, so as to receive the parameter data output by the parameter modification tool and output the parameter data to the SIM card under test.

[0014] In an embodiment, the signal processing assembly comprises:

[0015] A control chip, the input terminal of the control chip is electrically connected with the interface assembly, the output terminal of the control chip is respectively electrically connected with the first connecting terminal and the second connecting terminal, and the controlled terminal of the control chip is used for accessing a selection signal;

[0016] The control chip is used for controlling the interface assembly to be electrically connected with the first connecting terminal according to the selection signal, so as to output the parameter data of the SIM card under test to the functional test module; or controlling the interface assembly to be electrically connected with the second connecting terminal according to the selection signal, so as to receive the parameter data output by the parameter modification tool and output the parameter data to the SIM card under test.

[0017] In an embodiment, the interface assembly comprises a SIM card slot.

[0018] In an embodiment, the signal processing assembly has a signal terminal for accessing a selection signal.

[0019] In an embodiment, the test tool further comprises:

[0020] A host computer interface assembly for accessing an external terminal; the host computer interface assembly is electrically connected with the signal terminal of the signal processing assembly;

[0021] The signal processing assembly is used for accessing the selection signal output by the external terminal through the host computer interface assembly, and controlling the interface assembly to be electrically connected with the first connecting terminal according to the selection signal, so as to output the parameter data of the SIM card under test to the functional test module; or controlling the interface assembly to be electrically connected with the second connecting terminal according to the selection signal, so as to receive the parameter data output by the parameter modification tool and output the parameter data to the SIM card under test.

[0022] In an embodiment, the host computer interface assembly comprises:

[0023] a USB interface, electrically connected with a signal end of the signal processing component;

[0024] a USB-to-serial chip, an input end of which is electrically connected with the USB interface, and an output end of which is electrically connected with the signal processing component;

[0025] the USB-to-serial chip is configured to perform signal conversion on the selection signal input by the host computer interface component and output a serial port signal to the signal processing component.

[0026] The utility model provides a kind of test system, and the test system includes the test tool described in any one of the above.

[0027] In an embodiment, the test system further comprises:

[0028] a function test module, electrically connected with the first connection end of the test tool; configured to receive parameter data of the SIM card under test, to determine the working state of the SIM card under test according to the parameter data;

[0029] a parameter modification tool, electrically connected with the second connection end of the test tool; configured to output the parameter data to the SIM card under test, to modify the parameter data of the SIM card under test;

[0030] an external terminal, communicatively connected with the test tool, and having a control end electrically connected with a controlled end of the function test module and a controlled end of the parameter modification tool;

[0031] the external terminal is configured to output a selection signal to the test tool, to cause the signal processing component to establish a data path between the interface component and the first connection end according to the received selection signal, or to establish a data path between the interface component and the second connection end;

[0032] and to control the working state of the function test module or the parameter modification tool according to the selection signal.

[0033] In an embodiment, the function test module is configured to output a first feedback signal to the external terminal when determining the working state of the SIM card under test according to the parameter data.

[0034] The parameter modification tool is configured to output a second feedback signal to the external terminal when the modification of the parameter data of the SIM card under test is completed.

[0035] The utility model provides a test tool, test tool includes interface component, signal processing component, first connecting end and second connecting end, interface component is used for accessing the SIM card of measuring, signal processing component with interface component electricity is connected, first connecting end with signal processing component electricity is connected for accessing function test module, second connecting end with signal processing component electricity is connected for accessing parameter modification tool, signal processing component is used for establishing the data path between interface component and first connecting end, or, for establishing the data path between interface component and second connecting end.

[0036] In practical application, when needing to test the SIM card, first, the SIM card is electrically connected with the interface component, so that the test tool accesses the SIM card, then the signal processing component establishes the data path between the interface component and the second connecting end, to receive the parameter data output by the parameter modification tool, and output the parameter data to the SIM card of measuring, to complete the modification of the corresponding parameter in the SIM card of measuring, finally, the signal processing component establishes the data path between the interface component and the first connecting end, to output the parameter data of the SIM card of measuring to the function test module, to test the function of the SIM card of measuring, for example, to test whether the SIM card of measuring can register online normally. In this way, the rewriting and automatic operation of the test process in the SIM card test are realized, manual operation is reduced, and user experience is improved. In addition, compared with the mechanical arm in the related art for plugging and unplugging the SIM card, the test cost is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0037] In order to more clearly illustrate the technical scheme in the embodiments of the utility model or the prior art, the drawings needed to be used in the embodiment or the prior art description will be briefly introduced below, and obviously, the drawings in the following description are only some embodiments of the utility model, and for those skilled in the art, other drawings can be obtained according to the structure shown in these drawings without creative labor.

[0038] Figure 1 It is the module schematic view of the embodiment of the utility model test tool,

[0039] Figure 2 It is the module schematic view of another embodiment of the utility model test tool,

[0040] Figure 3 It is the module schematic view of still another embodiment of the utility model test tool,

[0041] Figure 4 It is the module schematic view of still another embodiment of the utility model test tool,

[0042] Figure 5A module schematic view of another embodiment of the test tool of the utility model;

[0043] Figure 6 A module schematic view of another embodiment of the test tool of the utility model;

[0044] Figure 7 A module schematic view of an embodiment of the test system of the utility model;

[0045] Figure 8 A pin schematic view of an embodiment of the SIM card.

[0046] Explanation of reference numerals:

[0047] 10, interface assembly; 20, signal processing assembly; 30, first connection end; 40, second connection end; 50, host computer interface assembly; 11, SIM card slot; 21, control chip; 22, switch; 51, USB interface; 52, USB-to-serial chip; 100, function test module; 200, parameter modification tool; 300, external terminal.

[0048] The utility model discloses the realization, functional characteristics and advantages will be further described with reference to the embodiment, with the attached drawing. Specific embodiments

[0049] The technical scheme in the embodiments of the utility model will be described clearly and completely in the attached drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by the ordinary skill in the art without creative labor belong to the protection scope of the utility model.

[0050] In addition, the description such as "first", "second" in the utility model is only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features limited by "first", "second" can explicitly or implicitly include at least one feature. In addition, the technical scheme of each embodiment can be combined with each other, but it must be based on the realization of the ordinary skill in the art, when the combination of technical schemes appears contradictory or unachievable, it should be considered that the combination of technical schemes does not exist, and is not within the protection scope required by the utility model.

[0051] During the module project test process, different types of SIM cards are tested, the files in the SIM card need to be modified, and the function test module 100 is checked whether it can be normally registered online when using the SIM card. There are two traditional test schemes: scheme one is to insert and pull out the SIM card through a mechanical arm, modify the parameter data of different types of SIM cards in advance, and then use the mechanical arm to test the insertion and pulling out of the SIM card. Scheme two is to manually insert and pull out / rewrite the SIM card. However, scheme one using the mechanical arm needs to write the SIM card in advance, and a large number of SIM cards are needed, the cost of the mechanical arm is high, and the precision requirement of the mechanical arm is high due to the small SIM card slot, which increases the design difficulty. Scheme two needs to consume a large amount of manpower through manual insertion and pulling out and rewriting of the SIM card.

[0052] It should be noted that there are currently tools and programs that can modify and burn SIM cards. This tool / program (parameter modification tool 200) needs to insert the SIM card into the corresponding card slot. The module project test needs to insert the SIM card into the card slot of the function test module 100 for different SIM card identification. Referring to Figure 8 , the SIM card has six different pins, and the device (such as the parameter modification tool 200 or the function test module 100) connected to the SIM card connects the pins on the SIM card through the pins in the SIM card slot 11 to read the corresponding parameter data.

[0053] Therefore, referring to Figure 1 , the utility model provides a kind of test tool, and the test tool includes:

[0054] Interface component 10 is used to access the SIM card to be tested;

[0055] Signal processing component 20, the signal processing component 20 is electrically connected with the interface component 10;

[0056] First connection end 30, electrically connected with the signal processing component 20, is used to access function test module 100;

[0057] Second connection end 40, electrically connected with the signal processing component 20, is used to access parameter modification tool 200;

[0058] The signal processing component 20 is used to establish the data path between the interface component 10 and the first connection end 30;Or, for establishing the data path between the interface component 10 and the second connection end 40.

[0059] In the embodiment, the interface assembly 10 comprises a SIM card slot 11. The signal processing assembly 20 can be implemented by a main controller, such as an MCU, a DSP (Digital Signal Process), an FPGA (Field Programmable Gate Array), a PLC, a SOC (System On Chip), etc.

[0060] Specifically, when the SIM card needs to be tested, the test tool, the SIM card to be tested, the functional test module 100, and the parameter modification tool 200 need to be connected first, i.e. the SIM card to be tested is inserted into the SIM card slot 11 of the test tool, and the card slot is designed to be connected to the parameter modification tool 200 and the functional test module 100 at the same time. The signal processing assembly 20 can establish a data path between the interface assembly 10 and the second connection end 40, so that the user can modify or update the specific parameter data (such as APN setting, network configuration, etc.) in the SIM card through the parameter modification tool 200 and output to the SIM card to be tested. These modifications are to simulate different network environments or test conditions to test the performance of the SIM card to be tested. In addition, the signal processing assembly 20 can also establish a data path between the interface assembly 10 and the first connection end 30, and start the functional test of the SIM card to be tested by the functional test module 100, including but not limited to registering the network (such as verifying whether the functional test module 100 can successfully register to the mobile network), data transmission (checking whether the functional test module 100 can normally access the Internet and testing its data transmission performance), short message service (such as testing the short message receiving and sending function), voice call, etc.

[0061] Optionally, the signal processing assembly 20 has a first connection end 30 for accessing a selection signal.

[0062] In the embodiment, the signal processing assembly 20 can be connected with the external terminal 300 through a signal end to access the selection signal output by the external terminal 300. In this way, the tester or the developer can send the selection signal to the signal end through the user interface of the external terminal 300, or the tester or the developer can store the related control program in the memory of the external terminal 300 in advance, so that the control device of the external terminal 300 executes the control program stored in the memory when the test system is started, and outputs the corresponding selection signal. The selection signal includes a modification selection signal and a test selection signal. When the signal processing assembly 20 receives the modification selection signal, the data path between the interface assembly 10 and the second connection end 40 is established, so that the tester or the developer can modify the parameter data of the to-be-tested SIM card through the parameter modification tool 200 and write the parameter data into the to-be-tested SIM card. When the signal processing assembly 20 receives the test selection signal, the data path between the interface assembly 10 and the first connection end 30 is established, so that the tester or the developer can test the function of the to-be-tested SIM card through the function test module 100, that is, the function test module 100 reads the parameter data in the to-be-tested SIM card.

[0063] It should be noted that the parameter modification tool 200 and the function test module 100 can be respectively connected with the external terminal 300. When the rewriting of the parameter data of the to-be-tested SIM card through the parameter modification tool 200 is completed, the parameter modification tool 200 can output a feedback signal to the external terminal 300, so that the external terminal 300 outputs the test selection signal to the control assembly when receiving the feedback signal, to establish the data path between the interface assembly 10 and the first connection end 30, and test the performance of the to-be-tested SIM card.

[0064] In actual application, the test tool of the application can insert a SIM card into the parameter modification tool 200 and the function test module 100 at the same time, and control the test tool through the external terminal 300, so as to realize the automatic operation of the process of modifying the SIM card to the test network. In this way, manual operation is reduced, and user experience is improved. In addition, compared with the mechanical arm for inserting and pulling the SIM card in the related art, the test cost is reduced.

[0065] In another embodiment of the utility model, referring to Figure 2 , the signal processing assembly 20 includes:

[0066] The control chip 21 is used to access the selection signal.

[0067] A switch 22 is electrically connected to the interface assembly 10, the control chip 21, the first connection end 30 and the second connection end 40.

[0068] The control chip 21 is configured to control the switch 22 to connect the first connection end 30 and the second connection end 40 according to the selection signal, so as to output the parameter data of the SIM card to be tested to the functional test module 100, or to receive the parameter data output by the parameter modification tool 200 and output the parameter data to the SIM card to be tested.

[0069] In the embodiment, the control chip 21 is implemented by using the above-mentioned main controller. The switch 22 can be implemented by using an analog switch, a relay or a multiplexer. In the embodiment, a single-pole double-throw switch can be selected to provide reliable electrical connection performance.

[0070] According to the above-mentioned embodiment, the control chip 21 is responsible for analyzing the selection signal (including the modification selection signal and the test selection signal) received from the external terminal 300 (for example, a PC), and sending a control instruction to the switch 22 according to the selection signal.

[0071] Specifically, when the test system is started, the control chip 21 performs a self-checking program to ensure that the hardware is working properly, and is ready to receive the selection signal from the external terminal 300 through the first connection end 30. The external terminal 300 (for example, a PC) sends the selection signal to the control chip 21, and the control chip 21 processes the selection signal to obtain the content of the selection signal, and determines whether the data of the SIM card is to be output to the functional test module 100 or the parameter data is to be written into the SIM card. In this way, the control chip 21 can send a control instruction to the switch 22 according to the analysis result of the selection signal, so that the switch 22 connects the first connection end 30 and the second connection end 40. For example, if the control chip 21 receives the test selection signal, it indicates that the selection signal instructs to perform the functional test, and the control chip 21 commands the switch 22 to electrically connect the first connection end 30 and the second connection end 40, so as to ensure that the data of the SIM card to be tested only flows to the functional test module 100. If the control chip 21 receives the modification selection signal, it indicates that the selection signal instructs to modify the parameter data of the SIM card, and the control chip 21 outputs a corresponding control command to the switch 22 to electrically connect the first connection end 30 and the second connection end 40, so as to receive the parameter data output by the parameter modification tool 200 and write these data into the SIM card.

[0072] It should be noted that once the correct data path is selected according to the selection signal, the data transmission process begins. Whether it is to read data from the SIM card to the function test module 100 or to obtain updated parameters from the parameter modification tool 200 and write them back to the SIM card, the entire operation process is controlled by the external terminal 300, realizing automatic operation, reducing manual operation, improving user experience, and ensuring data security and accuracy. In addition, during the entire test process, the control chip 21 can upload real-time data to the external terminal 300 through the first connection end 30, so that the control device of the external terminal 300 monitors the test process and records all related data and results, which can generate a test report, facilitating the staff to summarize the problems found in the test process and timely processing.

[0073] The selection of the data path is controlled by sending a selection signal through the external terminal 300 (such as a PC), avoiding the frequent manual insertion and removal of the SIM card or manual configuration of the device in the traditional method, greatly improving the test efficiency. That is, automated operation reduces the possibility of human error, ensuring that each test is accurately performed according to the predetermined process. In addition, the control chip 21 can flexibly adjust the data path according to different selection signals, supporting multiple test scenarios, such as function testing and parameter modification, making the entire system more versatile and easy to expand. Compared with the complex mechanical arm solution, the design uses relatively simple electronic components, not only reducing hardware costs, but also reducing maintenance problems caused by mechanical component aging or wear.

[0074] In an embodiment of the present application, referring to Figures 3-4 , the signal processing assembly 20 includes:

[0075] The control chip 21, the input end of the control chip 21 is electrically connected with the interface assembly 10, the output end of the control chip 21 is respectively electrically connected with the first connection end 30 and the second connection end 40, and the controlled end of the control chip 21 is used for accessing the selection signal;

[0076] The control chip 21, for controlling the interface assembly 10 to be electrically connected with the first connection end 30 according to the selection signal, so as to output the parameter data of the SIM card under test to the function test module 100; or, controlling the interface assembly 10 to be electrically connected with the second connection end 40 according to the selection signal, so as to receive the parameter data output by the parameter modification tool 200, and output the parameter data to the SIM card under test.

[0077] In the embodiment, the control chip 21 is provided with a multiplexing function and a state detection function. The control chip 21 has enough I / O pins to manage the electrical connection between the switch 22, the interface assembly 10, the first connection end 30 (electrically connected to the function test module 100), and the second connection end 40 (electrically connected to the parameter modification tool 200).

[0078] In combination with the above embodiment, when the test system is started, the control chip 21 first performs a self-checking program to confirm that all hardware connections are working properly to ensure the normal progress of the test work. After initialization, the control chip 21 enters a state of being ready to receive a selection signal from the external terminal 300. At the same time, the control chip 21 continuously monitors the states of the first connection end 30 and the second connection end 40. If it is detected that a new device is connected to either end, the current connection state is recorded, and the path between the interface assembly 10 and the connection end of the connected device is turned on. If it is detected that devices are connected to both ends, i.e., the first connection end 30 is connected to the function test module 100, and the second connection end 40 is connected to the parameter modification tool 200, the control chip 21 can determine the data path according to the selection signal received last time. Alternatively, the path between the interface assembly 10 and the second connection end 40 is turned on first to modify the parameter data of the SIM card under test through the parameter modification tool 200 and write the parameter data into the SIM card under test. Then, the data path between the interface assembly 10 and the first connection end 30 is established to test the function of the SIM card under test through the function test module 100, i.e., the function test module 100 reads the parameter data in the SIM card under test.

[0079] In the embodiment, even if no selection signal is received, the control chip 21 can select to establish a corresponding data path based on the known connection states of the first connection end 30 and the second connection end 40. For example, when it is detected that only the function test module 100 is connected, the data path to the function test module 100 is enabled by default; when it is detected that only the parameter modification tool 200 is connected, the data path to the parameter modification tool 200 is enabled by default. In addition, if it is found during the test that a connection is disconnected, the control chip 21 can respond immediately, re-detect the existing connection state, and adjust the data path to adapt to the new situation.

[0080] Through the above design, the embodiment realizes a flexible data path management scheme, simplifies the hardware structure, and improves the reliability and user experience of the test system. The control chip 21 can actively detect the connection state of the device and select a corresponding data path for data transmission according to the connection state. In this way, the reliability and efficiency of the test system are improved, the possibility of manual intervention is reduced, and the accuracy and consistency of the test results are enhanced.

[0081] In an embodiment, reference is made to Figure 5The test tool further comprises:

[0082] The host computer interface component 50 is configured to access the external terminal 300.

[0083] The signal processing component 20 is configured to receive the selection signal output by the external terminal 300 via the host computer interface component 50, and control the interface component 10 to be electrically connected to the first connection end 30 according to the selection signal, so as to output the parameter data of the SIM card to be tested to the functional test module 100, or control the interface component 10 to be electrically connected to the second connection end 40 according to the selection signal, so as to receive the parameter data output by the parameter modification tool 200 and output the parameter data to the SIM card to be tested.

[0084] In the embodiment, the host computer interface component 50 can be implemented by using a USB interface, an Ethernet interface or a PCIE interface. The host computer interface component 50 is configured to access the external terminal 300 (such as a PC), and serve as a bridge for communication with the test tool, so that the external terminal 300 can send the selection signal to the signal processing component 20, and the signal processing component 20 can upload the test data to the external terminal 300.

[0085] It should be noted that, since most of the existing embedded systems and microcontrollers support serial communication (UART) by default, but do not directly support USB communication. Therefore, in order to enable these devices to communicate with modern computers (which are usually equipped with only USB ports), an intermediate layer is required to convert the two different communication protocols. Data is converted between USB and UART in both directions, so that the signal processing component 20 can receive and respond to the selection signal from the external terminal 300.

[0086] Reference Figure 6 The host computer interface component 50 comprises:

[0087] The USB interface 51 is electrically connected to the signal end of the signal processing component 20.

[0088] The USB-to-serial chip 52 is electrically connected to the USB interface 51, and the output end of the USB-to-serial chip 52 is electrically connected to the signal processing component 20.

[0089] The USB-to-serial chip 52 is configured to convert the selection signal accessed by the host computer interface component 50 and output a serial port signal to the signal processing component 20.

[0090] In the embodiment, the USB interface 51 is used to connect the external terminal 300 (such as a PC) with the test tool, that is, the external terminal 300 can be electrically connected with the test tool through a USB line, and the USB-to-serial chip 52 is located between the USB interface 51 and the signal processing assembly 20, and is responsible for converting the selection signals received by the USB interface 51 into serial communication signals (UART) so that the signal processing assembly 20 can correctly parse the selection signals. In combination with the above embodiment, the signal processing assembly 20 includes a control chip 21 and a switching switch 22. The control chip 21 is responsible for receiving the serial signals received from the USB-to-serial chip 52 and sending corresponding control instructions to the switching switch 22; the switching switch 22 switches between two different data paths according to the instructions of the control chip 21. When the test system starts, the external terminal 300 (such as a PC) sends selection signals to the USB-to-serial chip 52 through the USB interface 51. The USB-to-serial chip 52 converts the received USB signals into serial communication signals (UART) and sends them to the control chip 21 in the signal processing assembly 20 through its output end to control the switching switch 22 to turn on the path between the interface assembly 10 and the second connection end 40, that is, to realize the electrical connection between the SIM card slot 11 and the parameter modification tool 200. At this time, the external terminal 300 (such as a PC) can output corresponding control instructions to control the parameter modification tool 200 to modify the corresponding parameter data in the SIM card, and when the rewriting is completed, the PC outputs corresponding selection signals to the control chip 21 to make the control chip 21 control the switching switch 22 to turn off the path between the interface assembly 10 and the second connection end 40 and turn on the path between the interface assembly 10 and the first connection end 30, and at the same time, the PC controls the functional test module 100 to recognize the parameter data in the SIM card and perform performance testing.

[0091] In the embodiment, the SIM card is inserted into the SIM card slot 11, and the pins of the SIM card are distributed to the first connection end 30 and the second connection end 40 for output through the control chip 21 and the related hardware circuit. Since the USB port can use a USB line to connect the test tool with the PC, the PC controls the test tool to output the SIM card to the first connection end 30 and the second connection end 40 through the USB interface 51 and the USB-to-serial chip 52, and ensures that only one path works.

[0092] In actual application, the USB-to-serial chip 52 improves the problem that the existing embedded system and microcontroller usually only support UART and do not directly support USB. Through the USB-to-serial chip 52, bidirectional data conversion can be performed between the USB and the UART, the practicability of the test tool is improved, the signal processing assembly 20 can correctly receive and process the selection signals from the external terminal 300, and thus the reliability of the test work is improved.

[0093] The utility model provides a kind of test system, the test system includes above-mentioned test tool.

[0094] Reference Figure 7 The test system further includes:

[0095] The functional test module 100 is electrically connected with the first connecting end 30 of the test tool; it is used to receive the parameter data of the SIM card to be measured, to determine the working state of the SIM card to be measured according to the parameter data;

[0096] The parameter modification tool 200 is electrically connected with the second connecting end 40 of the test tool; it is used to output parameter data to the SIM card to be measured, to modify the parameter data of the SIM card to be measured;

[0097] The external terminal 300 is in communication connection with the test tool, and the control end of the external terminal 300 is electrically connected with the controlled end of the functional test module 100 and the controlled end of the parameter modification tool 200 respectively;

[0098] The external terminal 300 is used to output selection signal to the test tool, so that the signal processing assembly 20 establishes the data path between the interface assembly 10 and the first connecting end 30 according to the received selection signal; alternatively, the data path between the interface assembly 10 and the second connecting end 40 is established.

[0099] And, it is used to control the working state of the functional test module 100 or the parameter modification tool 200 according to the selection signal.

[0100] The functional test module 100 is used to output first feedback signal to external terminal 300 in the case of determining the working state of the SIM card to be measured according to the parameter data;

[0101] The parameter modification tool 200 is used to output second feedback signal to external terminal 300 in the case of completing the modification of the parameter data of the SIM card to be measured.

[0102] In the present embodiment, the test tool accesses the external terminal 300 (such as a PC) via the USB interface 51, the functional test module 100 is electrically connected to the first connection end 30 of the test tool, for receiving parameter data of the SIM card under test, and determining the working state of the SIM card under test according to the data. For example, it can perform test items such as network registration, data transmission, etc., to verify whether the functions of the SIM card are normal. The parameter modification tool 200 is electrically connected to the second connection end 40 of the test tool, for outputting parameter data to the SIM card under test, to modify the corresponding parameters in the SIM card. This can include operations such as updating APN settings, changing operator configurations, etc. It should be noted that the PC is connected to the test tool through a USB line, and the PC is electrically connected to the controlled end of the functional test module 100 and the controlled end of the parameter modification tool 200 respectively.

[0103] In combination with the above embodiments, the external terminal 300 is configured to output a corresponding selection signal to the test tool according to a pre-stored control program or a user-triggered instruction, so that the signal processing component 20 establishes a data path between the interface component 10 and the first connection end 30 (for functional testing) or between the interface component 10 and the second connection end 40 (for parameter modification) according to the received selection signal. Meanwhile, the external terminal 300 can also control the working state of the functional testing module 100 or the parameter modification tool 200 according to the selection signal, such as starting / stopping the test or confirming the completion of parameter modification. When the test system is started, the control chip 21 executes a self-checking program to ensure that all hardware is working properly and is ready to receive the selection signal from the host computer interface component 50. The functional testing module 100 and the parameter modification tool 200 also enter a preparation state and wait to receive the control command from the PC. When the test personnel or the R&D personnel send a selection signal to the USB interface 51 through the external terminal 300 (such as a PC), the selection signal is converted into a serial communication signal by the USB-to-serial chip 52 and then output to the control chip 21. The control chip 21 sends a corresponding control instruction to the switch 22 according to the selection signal, so that the switch 22 turns on the path between the common end and the first end or the path between the common end and the second end. For example, if the selection signal indicates that the functional test is to be performed, the control chip 21 controls the switch 22 to electrically connect the common end and the first end; if the selection signal indicates that the SIM card parameter is to be modified, the control chip 21 controls the switch 22 to electrically connect the common end and the second end. In the parameter modification mode, the parameter modification tool 200 writes new parameter data into the SIM card to be tested. When the rewriting is completed, the parameter modification tool 200 outputs a second feedback signal to the external terminal 300, so that the user can determine through the external terminal 300 that the parameter data has been modified and send a selection signal again through the external terminal 300 to make the control chip 21 switch to the functional test mode. In the functional test mode, the functional testing module 100 starts to receive the parameter data from the SIM card to be tested and executes the predetermined test items according to the data. In addition, the functional testing module 100 is electrically connected with the PC, so that the results generated during the test can be uploaded back to the external terminal 300 in real time. For example, the functional testing module 100 outputs a first feedback signal to the external terminal 300 to inform the user that the test is completed and the test results can be viewed, in the case that the working state of the SIM card to be tested is determined according to the parameter data. It can be understood that after completing a rewriting and test process, the external terminal 300 can send a reset signal to the control chip 21, or reset the system as needed to prepare for the next round of test.

[0104] Specifically, the XSIM test system in the embodiment aims to test the network registration under different PLMNs (Public Land Mobile Network) by modifying the IMSI (International Mobile Subscriber Identity) in the SIM card. In the SIM card, the PLMN information is stored in the IMSI. The IMSI is a unique identifier used to identify the user in the SIM card. During the test, the PLMN of the SIM card can be modified by modifying the IMSI. That is, the SIM card is tried to be registered to the specified PLMN, and the network registration result is reported. First, a blank, rewritable SIM card is inserted into the SIM card slot 11. Then the PC connects the USB interface 51 of the XSIM test tool through the USB line, and the PC runs the pre-written program to output the parameter data of the SIM card to the second connection end 40. At this time, the SIM card modification tool (parameter modification tool 200) recognizes the SIM card, and the PC controls the SIM card modification tool to modify the IMSI of the SIM card. This step actually changes the PLMN information stored in the SIM card to simulate the network environment of different operators. After the modification is completed, the PC continues to run the pre-written program or receives the control instruction input by the operator to control the test tool to output the signal of the SIM card to the first connection end 30, at which time the function test module 100 recognizes the SIM card. The function test module 100 starts to receive the parameter data from the SIM card, and tries to register the SIM card to the specified PLMN. After successful registration, the function test module 100 reports the network registration to the PC, including but not limited to whether the registration is successful, signal strength and other information, so that one test is completed. The test system can repeat the above steps to rewrite different IMSIs, so as to achieve the purpose of testing the network registration of the SIM card under different PLMNs.

[0105] In practical application, the automatic operation selection reduces manual intervention and significantly improves test efficiency. Moreover, the intuitive operation process and real-time monitoring function improve the overall work efficiency of the test system and user satisfaction. In addition, precise control of the behavior of the SIM card under different PLMNs ensures that each test is carried out in a controlled environment, and the test project is quickly switched, thereby shortening the test period.

[0106] It is worth noting that, since the test system of the application includes the test tool described above, the embodiments of the test system of the application include all technical solutions of all embodiments of the test tool, and the technical effects achieved are also exactly the same, which will not be repeated here.

[0107] The above is only an optional embodiment of the present application, and does not limit the patent range of the present application. Any equivalent mechanism transformation made by using the content of the present application specification and drawings, or direct / indirect application in other related technical fields under the inventive concept of the present application is included in the scope of the present application.

Claims

1. A test tool, characterized by, The test tool comprises: an interface component for accessing the SIM card under test; a signal processing component electrically connected to the interface component; a first connection end electrically connected to the signal processing component for accessing a function test module; a second connection end electrically connected to the signal processing component for accessing a parameter modification tool; the signal processing component is configured to establish a data path between the interface component and the first connection end, or to establish a data path between the interface component and the second connection end.

2. The test tool of claim 1, wherein, The signal processing component comprises: a control chip, the control end of the control chip being configured to access a selection signal; a switch, the switch comprising a common end, a control end, a first end and a second end, the common end being electrically connected to the interface component, the control end being electrically connected to the control end of the control chip, the first end being electrically connected to the first connection end, and the second end being electrically connected to the second connection end; the control chip is configured to control the switch to turn on a path between the common end and the first end according to the selection signal, so as to output the parameter data of the SIM card under test to the function test module, or to control the switch to turn on a path between the common end and the second end, so as to receive the parameter data output by the parameter modification tool and output the parameter data to the SIM card under test.

3. The test tool of claim 1, wherein, The signal processing component comprises: a control chip, the input end of the control chip being electrically connected to the interface component, the output end of the control chip being electrically connected to the first connection end and the second connection end respectively, and the control end of the control chip being configured to access a selection signal; the control chip is configured to control the interface component to be electrically connected to the first connection end according to the selection signal, so as to output the parameter data of the SIM card under test to the function test module, or to control the interface component to be electrically connected to the second connection end according to the selection signal, so as to receive the parameter data output by the parameter modification tool and output the parameter data to the SIM card under test.

4. The test tool of claim 1, wherein, The interface component comprises a SIM card slot.

5. The test tool of any one of claims 1 to 4, wherein, The signal processing component has a signal end for accessing a selection signal.

6. The test tool of claim 5, wherein, The test tool further comprises: a host computer interface component for accessing an external terminal; the host computer interface component is electrically connected to the signal end of the signal processing component; the signal processing component is configured to access the selection signal output by the external terminal through the host computer interface component, and to control the interface component to be electrically connected to the first connection end according to the selection signal, so as to output the parameter data of the SIM card under test to the function test module, or to control the interface component to be electrically connected to the second connection end according to the selection signal, so as to receive the parameter data output by the parameter modification tool and output the parameter data to the SIM card under test.

7. The test tool of claim 6, wherein, The host computer interface component comprises: a USB interface, the USB interface being electrically connected to the signal end of the signal processing component; A USB-to-serial chip, an input end of the USB-to-serial chip being electrically connected with the USB interface, and an output end of the USB-to-serial chip being electrically connected with the signal processing component; The USB-to-serial chip is configured to convert and output a serial port signal to the signal processing component after signal conversion of the selection signal input by the host computer interface component.

8. A test system, characterized by The test system comprises the test tool according to any one of claims 1 to 7.

9. The test system of claim 8, wherein, The test system further comprises: a function test module, the function test module being electrically connected with the first connection end of the test tool, and being configured to receive parameter data of the SIM card to be tested, and determine the working state of the SIM card to be tested according to the parameter data; a parameter modification tool, the parameter modification tool being electrically connected with the second connection end of the test tool, and being configured to output the parameter data to the SIM card to be tested, and modify the parameter data of the SIM card to be tested; an external terminal, the external terminal being communicatively connected with the test tool, and a control end of the external terminal being electrically connected with a controlled end of the function test module and a controlled end of the parameter modification tool; the external terminal is configured to output a selection signal to the test tool, so that the signal processing component establishes a data path between the interface component and the first connection end according to the received selection signal, or establishes a data path between the interface component and the second connection end; and control the working state of the function test module or the parameter modification tool according to the selection signal.

10. The test system of claim 9, wherein, The function test module is configured to output a first feedback signal to the external terminal when the working state of the SIM card to be tested is determined according to the parameter data; The parameter modification tool is configured to output a second feedback signal to the external terminal when the modification of the parameter data of the SIM card to be tested is completed.

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