Semiconductor test probe inspection jig suitable for various sizes
By designing a testing fixture for semiconductor test probes of various sizes, the problem of ineffective clamping of probes of different sizes in existing technologies has been solved, achieving efficient and accurate testing results.
Patent Information
- Application Number
- CN202422652078.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-31
- Publication Date
- 2026-01-06
- Estimated Expiration
- 2034-10-31
AI Technical Summary
In the prior art, the existing technology cannot efficiently solve the problem of poor adaptability of semiconductor test probes of different sizes. The existing technology cannot simultaneously clamp probes of different sizes and cannot effectively clamp them, resulting in poor detection effect of probes of different sizes.
A semiconductor test probe inspection fixture suitable for various sizes was designed, including a first fixture and a second fixture with sliding rail assembly. The fixture is provided with multiple V-grooves of different sizes, and is equipped with a telescopic push rod and a flexible inner liner to ensure effective clamping of probes of different sizes.
This invention enables the testing of probes of various sizes using a single fixture, improving testing efficiency and accuracy and ensuring the reliability of test results.
Smart Images
Figure CN223769480U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of semiconductor testing technology, specifically relating to a testing fixture for semiconductor test probes of various sizes. Background Technology
[0002] Semiconductor test probes are widely used in electronics, aerospace, military, and medical fields. The products are relatively mature, and the technology is developing rapidly. Currently, a complete semiconductor test probe industry chain has been formed in China. When semiconductor test probes leave the factory, they undergo dimensional (mainly outer diameter) inspection during random sampling. This inspection involves vertically placing the semiconductor test probe in a clamping fixture for fixation, then placing the fixture on an instrument to inspect the probe's dimensions. However, most existing clamping fixtures use multiple pairs of V-grooves of the same size to hold the semiconductor test probes. Such fixtures often only effectively clamp semiconductor test probes of one size. When clamping other sizes, they are often mismatched, resulting in a loose clamping effect and making it difficult to ensure the semiconductor test probes are held vertically. Utility Model Content
[0003] The purpose of this invention is to provide a semiconductor test probe inspection fixture suitable for various sizes, solving the problem that existing clamping fixtures can only effectively clamp semiconductor test probes of one size, and are often not compatible when clamping semiconductor test probes of other sizes.
[0004] To achieve the above objectives, the technical solution adopted by this utility model is as follows: a semiconductor test probe inspection fixture suitable for various sizes, including a base, on which a pair of slide rails are provided, and a first clamp and a second clamp are slidably mounted on the pair of slide rails. On opposite sides of the first clamp and the second clamp, a plurality of first V-grooves and a plurality of second V-grooves of different sizes are respectively provided; the plurality of first V-grooves and the plurality of second V-grooves are arranged opposite each other, and the sizes of the opposite pair of first V-grooves and second V-grooves are matched; a push rod is placed on the other side of the first clamp and the second clamp, and the push rod is telescopically mounted on a base, which is mounted on the base.
[0005] As a preferred technical solution of this utility model, the push rod is threadedly assembled in the base.
[0006] As a preferred technical solution of this utility model, the first clamp and the second clamp are provided with connecting shafts at both ends.
[0007] As a preferred technical solution of this utility model, a flexible liner is provided on the inner side of the first V-shaped groove.
[0008] As a preferred technical solution of this utility model, a flexible liner is provided on the inner side of the second V-shaped groove.
[0009] The beneficial effects of this utility model are: the inspection fixture for semiconductor test probes of various sizes is designed with V-grooves of various sizes and shapes to effectively clamp semiconductor test probes of different sizes, ensuring that the external dimensions of semiconductor test probes of various sizes can be inspected with one fixture. This not only greatly improves work efficiency, but also ensures the accuracy of test results, and has good prospects for market promotion and use. Attached Figure Description
[0010] The accompanying drawings, which are included to provide a further understanding of the present invention and constitute a part of this invention, illustrate exemplary embodiments of the present invention and, together with the description thereof, serve to explain the present invention and do not constitute an undue limitation thereof. In the drawings:
[0011] Figure 1 This is a schematic diagram of the upper protective plate in the semiconductor test probe inspection fixture applicable to various sizes according to this utility model.
[0012] In the figure, 1. base, 2. first clamp, 3. connecting shaft, 4. second clamp, 5. second V-groove, 6. first V-groove, 7. base, 8. push rod. Detailed Implementation
[0013] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.
[0014] In the description of this utility model, the use of "first" and "second" is only for the purpose of distinguishing technical features and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features or the order of the technical features.
[0015] In the description of this utility model, unless otherwise explicitly defined, terms such as "setting," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this utility model in conjunction with the specific content of the technical solution.
[0016] like Figure 1As shown, this utility model discloses a semiconductor test probe inspection fixture applicable to various sizes, including a base 1. A pair of slide rails 9 are provided on the base 1, and a first clamp 2 and a second clamp 4 are slidably mounted on the pair of slide rails 9. On opposite sides of the first clamp 2 and the second clamp 4, multiple first V-grooves 6 and multiple second V-grooves 5 of different sizes are respectively provided. The multiple first V-grooves 6 and multiple second V-grooves 5 are arranged opposite each other, and the sizes of the opposite pair of first V-grooves 6 and second V-grooves 5 are matched. A push rod 8 is placed on the other side of the first clamp 2 and the second clamp 4. The push rod 8 is threaded into a base 7, and the base 7 is mounted on the base 1.
[0017] During operation, the semiconductor test probe is placed in a pair of first V-grooves 6 and second V-grooves 5 that match its external dimensions. Then, rotating the two screws 8 causes them to extend and push the first clamp 2 and second clamp 4 closer together until the first V-grooves 6 and second V-grooves 5 clamp the semiconductor test probe. At this point, the semiconductor test probe inspection fixture, suitable for various sizes, can be moved to the testing instrument for the next step of dimensional inspection. Alternatively, only one screw 8 can be rotated to push the first clamp 2 closer to the second clamp 4, or vice versa, for clamping. After inspection, the screw 8 can be rotated in the opposite direction to move the first clamp 2 and / or the second clamp 4 along the slide rail, separating them and allowing the semiconductor test probe to be removed.
[0018] The first clamp 2 and the second clamp 4 are provided with connecting shafts 3 at both ends. Springs can be connected between the two connecting shafts 3 to further fix them and ensure better clamping effect.
[0019] The inner sides of the first V-groove 6 and the second V-groove 5 are both provided with flexible inner linings, which can contain the semiconductor test probes and prevent the placement and clamping from causing damage to the semiconductor test probes.
[0020] Therefore, compared with the prior art, the semiconductor test probe inspection fixture of this utility model, which is applicable to various sizes, can effectively clamp semiconductor test probes of different sizes by designing V-grooves of various sizes and shapes. This ensures that the external dimensions of semiconductor test probes of various sizes can be inspected by a single fixture, which not only greatly improves work efficiency but also ensures the accuracy of test results, and has good prospects for market promotion and use.
[0021] The foregoing description illustrates and describes several preferred embodiments of the utility model. However, as previously stated, it should be understood that the utility model is not limited to the forms disclosed herein and should not be construed as excluding other embodiments. It can be used in various other combinations, modifications, and environments, and can be altered within the scope of the utility model concept described herein through the foregoing teachings or the technology or knowledge in related fields. Any modifications and variations made by those skilled in the art that do not depart from the spirit and scope of the utility model should be within the protection scope of the appended claims.
Claims
1. A semiconductor test probe inspection fixture suitable for use with probes of various sizes, comprising: The utility model provides a kind of double-sided clamp, including base (1), the base (1) is provided with a pair of slide rail (9), the first clamp (2) and the second clamp (4) are slidably equipped on the pair of slide rail (9), the opposite side of the first clamp (2) and the second clamp (4) is respectively provided with multiple first V-shaped grooves (6) of different sizes and multiple second V-shaped grooves (5) of different sizes;Multiple first V-shaped grooves (6) and multiple second V-shaped grooves (5) are oppositely arranged, and the size of the opposite pair of first V-shaped grooves (6) and second V-shaped grooves (5) is matched;The other side of the first clamp (2) and the second clamp (4) is placed with push rod (8), the push rod (8) is telescopically arranged on base (7), and the base (7) is arranged on the base (1).
2. The semiconductor test probe inspection tool for multiple sizes according to claim 1, wherein, The push rod (8) is threadedly assembled in the base (7).
3. The semiconductor test probe inspection tool for multiple sizes according to claim 2, wherein, The first clamp (2) and the second clamp (4) are provided with connecting shafts (3) at both ends.
4. The semiconductor test probe inspection tool for multiple sizes according to claim 3, wherein, The inner side of the first V-shaped groove (6) is provided with a flexible lining.
5. The semiconductor test probe inspection tool for multiple sizes according to claim 4, wherein, The inner side of the second V-shaped groove (5) is provided with a flexible lining.