Circuit board testing device and equipment

Abstract

The embodiment of the utility model provides a circuit board testing device and equipment, and relates to the technical field of circuit board testing. The circuit board testing device comprises a testing table, a driving assembly, a testing assembly and a guiding assembly, the testing table is provided with circuit board mounting grooves and guiding holes, and the circuit board mounting grooves and the guiding holes are arranged at intervals; the driving assembly is arranged on the test board, the test assembly comprises a mounting plate and a probe, the mounting plate and the test board are arranged at an interval and are connected with the driving assembly, and the probe is arranged on one side, close to the test board, of the mounting plate; the guide assembly comprises a first guide column and a second guide column, the first guide column penetrates through the mounting plate and is fixedly connected with the test board, and the second guide column is arranged on the side, close to the test board, of the mounting plate; the driving assembly is used for driving the mounting plate to move, so that the second guide columns extend into the guide holes, and the probes are in butt joint with the circuit board. Precise and stable butt joint of the probe and the circuit board can be ensured, and the test efficiency and the accuracy of a test result are improved.

Description

Technical Field

[0001] This utility model relates to the field of circuit board testing technology, and more specifically, to a circuit board testing device and equipment. Background Technology

[0002] A circuit board is a conductive plate used to connect and support electronic components. It typically consists of a substrate, conductors, and insulating layers. It plays a crucial role in signal transmission, power supply, and signal processing in electronic devices and is a core component of modern industrial equipment. Before assembly, circuit boards undergo electrical performance testing using testing equipment to ensure their proper use and operation.

[0003] However, existing testing equipment suffers from unstable and inaccurate docking with circuit boards, affecting testing efficiency and the accuracy of test results. Utility Model Content

[0004] The purpose of this invention is to provide a circuit board testing device and equipment that can ensure precise and stable connection between the probe and the circuit board, thereby improving testing efficiency and the accuracy of test results.

[0005] The embodiments of this utility model are implemented as follows:

[0006] In a first aspect, this utility model provides a circuit board testing device, comprising:

[0007] A test bench, wherein the test bench has a circuit board mounting slot and a guide hole, and the circuit board mounting slot and the guide hole are spaced apart;

[0008] A driving component, wherein the driving component is disposed on the test bench;

[0009] A test assembly, comprising a mounting plate and probes, wherein the mounting plate is spaced apart from the test stage and connected to the drive assembly, and the probes are disposed on the side of the mounting plate closer to the test stage; and

[0010] A guide assembly, comprising a first guide post and a second guide post, wherein the first guide post passes through the mounting plate and is fixedly connected to the test bench, and the second guide post is disposed on the side of the mounting plate near the test bench;

[0011] The driving component is used to drive the mounting plate to move relative to the first guide post, so that the second guide post extends into the guide hole and the probe docks with the circuit board in the circuit board mounting slot.

[0012] In an optional embodiment, the number of the first guide posts is multiple, and the multiple first guide posts are spaced apart; and / or,

[0013] The number of guide holes and the number of second guide posts are both multiple, with the multiple guide holes spaced apart and the circuit board mounting slot located between the multiple guide holes; the multiple second guide posts are spaced apart and correspond one-to-one with the multiple guide holes.

[0014] In an optional embodiment, the circuit board testing device further includes a first positioning plate, which is disposed on the test bench and has a circuit board mounting slot, and the guide hole is located on one side of the first positioning plate.

[0015] The test assembly further includes a second positioning plate, which is disposed on the side of the mounting plate near the test stage and corresponds to the first positioning plate. The probe is disposed on the side of the second positioning plate near the test stage.

[0016] In an optional embodiment, the first positioning plate is further provided with a fixing groove, and the bottom wall of the fixing groove is provided with the circuit board mounting groove;

[0017] The test assembly further includes a fixing block, which is disposed on the side of the second positioning plate near the test stage. The probe is disposed on the side of the fixing block near the test stage. The fixing block is used to be disposed in the fixing groove.

[0018] In an optional embodiment, the circuit board testing device further includes a support plate disposed on the test bench, and the first positioning plate is disposed on the side of the support plate away from the test bench.

[0019] In an optional embodiment, the circuit board testing device further includes a wiring assembly, which includes a terminal block and connecting wires. The terminal block is spaced apart from the mounting plate and located on the side of the mounting plate away from the test bench. The connecting wires are disposed on the terminal block and connected to the probes.

[0020] The guide assembly further includes a third guide post, the two ends of which are connected to the terminal block and the mounting plate, respectively.

[0021] In an optional implementation, there are multiple probes and multiple connecting wires, with each probe connected to a corresponding connecting wire; and / or,

[0022] The number of the third guide posts is multiple, and the multiple third guide posts are arranged at intervals.

[0023] In an optional embodiment, the driving assembly includes a bracket and a driving component. The bracket is disposed on the test bench, and the driving component is disposed on the bracket and spaced apart from the test bench. The driving component is connected to the mounting plate. The two ends of the first guide post are fixedly connected to the bracket and the test bench, respectively.

[0024] In an optional embodiment, the test assembly further includes a bushing that passes through the mounting plate, and the first guide post passes through the bushing.

[0025] Secondly, the present invention provides a circuit board testing device, including an image display device and the circuit board testing device described in any of the foregoing embodiments, wherein the image display device is electrically connected to the probe.

[0026] The beneficial effects of this utility model embodiment include:

[0027] The circuit board testing device includes a test stage, a drive assembly, a test assembly, and a guide assembly. The test stage has circuit board mounting slots and guide holes, which are spaced apart. The drive assembly is disposed on the test stage. The test assembly includes a mounting plate and probes. The mounting plate is spaced apart from the test stage and connected to the drive assembly. The probes are disposed on the side of the mounting plate closer to the test stage. The guide assembly includes a first guide post and a second guide post. The first guide post passes through the mounting plate and is fixedly connected to the test stage. The second guide post is disposed on the side of the mounting plate closer to the test stage. The drive assembly is used to drive the mounting plate to move relative to the first guide post, so that the second guide post extends into the guide hole and the probes align with the circuit board in the circuit board mounting slot.

[0028] In other words, the first guide post guides the mounting plate during movement, ensuring the stability of the probe's movement towards the circuit board mounting slot. Then, the second guide post further guides and positions the mounting plate, and by extending into the guide hole, it further ensures the stability of the mounting plate's movement. As is easily understood, once the second guide post is within the guide hole, the probe then mates with the circuit board in the mounting slot, ensuring precise alignment between the probe and the circuit board. Furthermore, the probe is less prone to wobbling during subsequent testing, exhibiting good stability, thereby improving testing efficiency and the accuracy of the test results.

[0029] The circuit board testing equipment includes a circuit board testing apparatus, which has all the beneficial effects of the circuit board testing apparatus. Attached Figure Description

[0030] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0031] Figure 1 This is a schematic diagram of the circuit board testing equipment provided in an embodiment of the present utility model;

[0032] Figure 2 This is a schematic diagram of the circuit board testing device provided in an embodiment of the present utility model;

[0033] Figure 3 This is a partial structural schematic diagram of the circuit board testing device provided in an embodiment of the present utility model;

[0034] Figure 4 A schematic diagram of the structure of the test component provided in an embodiment of this utility model;

[0035] Figure 5 A schematic diagram of the structure of the first positioning plate provided in an embodiment of this utility model.

[0036] Icons: 1000-Circuit board testing equipment; 100-Circuit board testing device; 10-Test platform; 11-Circuit board mounting slot; 12-Guide hole; 20-Drive assembly; 21-Bracket; 211-Limit block; 22-Drive component; 30-Test assembly; 31-Mounting plate; 32-Probe; 33-Second positioning plate; 34-Fixing block; 35-Sleeve; 40-Guide assembly; 41-First guide post; 42-Second guide post; 43-Third guide post; 50-First positioning plate; 51-Fixing slot; 60-Support plate; 70-Wiring assembly; 71-Terminal; 72-Connecting wire; 80-Foot pad; 200-Image display device; 201-Image processor; 202-Display screen. Detailed Implementation

[0037] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0038] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0039] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0040] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this utility model is in use. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first," "second," and "third," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0041] Furthermore, terms such as "horizontal" and "vertical" do not imply that components must be absolutely horizontal or suspended, but rather that they can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0042] In the description of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0043] As described in the background section, circuit boards require electrical performance testing using testing equipment before assembly to ensure their normal use and operation. However, existing testing equipment suffers from unstable and inaccurate mating with the circuit board, affecting testing efficiency and the accuracy of test results.

[0044] Based on this, please refer to Figures 1-5The present invention provides a circuit board testing device 100 and equipment, which can effectively improve the aforementioned technical problems. Specifically, it can ensure precise and stable connection between the probe 32 and the circuit board, thereby improving testing efficiency and the accuracy of test results. The circuit board testing device 100 and equipment will be described in detail below.

[0045] Please refer to Figure 1 , Figure 1 This is a schematic diagram of the circuit board testing equipment 1000 provided in this embodiment, combined with... Figure 1 The circuit board testing equipment 1000 includes a circuit board testing device 100 and an image display device 200. The circuit board testing device 100 is electrically connected to the image display device 200. The circuit board testing device 100 is used to test the circuit board and transmits the test signal to the image display device 200 through a data line. After processing the signal, the image display device 200 displays the current working status of the circuit board, thereby determining whether the circuit board is good or bad and whether it can be used and worked normally.

[0046] Please refer to Figure 2 and Figure 3 , Figure 2 This is a schematic diagram of the circuit board testing device 100 provided in this embodiment. Figure 3 This is a partial structural schematic diagram of the circuit board testing device 100 provided in this embodiment, combined with... Figure 2 and Figure 3 The circuit board testing device 100 includes a test table 10, a drive component 20, a test component 30, and a guide component 40. The test table 10 is used to place the circuit board. The drive component 20 is connected to the test component 30 and is used to drive the test component 30 to move in order to test the circuit board. The guide component 40 is used to provide guidance for the movement of the test component 30.

[0047] For details, please refer to Figure 4 , Figure 4 This is a schematic diagram of the structure of the test component 30 provided in this embodiment, combined with... Figures 2-4The test bench 10 has a circuit board mounting slot 11 and a guide hole 12, which are spaced apart. The drive assembly 20 is disposed on the test bench 10. The test assembly 30 includes a mounting plate 31 and a probe 32. The mounting plate 31 is spaced apart from the test bench 10 and is connected to the drive assembly 20. The probe 32 is disposed on the side of the mounting plate 31 near the test bench 10. The guide assembly 40 includes a first guide post 41 and a second guide post 42. The first guide post 41 passes through the mounting plate 31 and is fixedly connected to the test bench 10. The second guide post 42 is disposed on the side of the mounting plate 31 near the test bench 10. The drive assembly 20 is used to drive the mounting plate 31 to move relative to the first guide post 41 so that the second guide post 42 extends into the guide hole 12 and the probe 32 mates with the circuit board in the circuit board mounting slot 11.

[0048] In other words, the first guide post 41 guides the mounting plate 31 during its movement, ensuring the stability of the probe 32 as it moves toward the circuit board mounting slot 11. Then, the second guide post 42 further guides and positions the mounting plate 31, and by extending into the guide hole 12, it further ensures the stability of the mounting plate 31's movement. It is easy to understand that once the second guide post 42 is within the guide hole 12, the probe 32 then docks with the circuit board in the circuit board mounting slot 11, ensuring precise docking between the probe 32 and the circuit board. Furthermore, the probe 32 is less prone to shaking during subsequent testing, exhibiting good stability, thereby improving testing efficiency and the accuracy of test results.

[0049] Please combine them together Figures 1-4 The image display device 200 is electrically connected to the probe 32. Specifically, the image display device 200 includes an image processor 201 and a display screen 202. The image processor 201 is electrically connected to the probe 32, and the display screen 202 is electrically connected to the image processor 201. Understandably, after the probe 32 is connected to the circuit board, it can transmit electrical signals to the image processor 201 via a data cable. The image processor 201 converts the electrical signals into composite video signals, which are then transmitted to the display screen 202 via the data cable for display. This allows for a clear view of the current operating status of the circuit board, thereby determining its quality.

[0050] To further improve the moving stability of the mounting plate 31, the number of first guide posts 41 can be set to multiple, with multiple first guide posts 41 spaced apart.

[0051] It should be noted that in this embodiment, the number of first guide posts 41 is specifically two. Of course, in other embodiments, the number of first guide posts 41 can also be three, four, or five, etc.

[0052] In order to improve the stability and accuracy of the docking between the probe 32 and the circuit board during the movement of the mounting plate 31, the number of guide holes 12 and second guide posts 42 can also be set to multiple, with multiple guide holes 12 spaced apart and the circuit board mounting slot 11 located between multiple guide holes 12; multiple second guide posts 42 spaced apart and corresponding one-to-one with multiple guide holes 12.

[0053] It should be noted that in this embodiment, the number of guide holes 12 and second guide posts 42 is specifically four. Of course, in other embodiments, the number of guide holes 12 and second guide posts 42 can also be two, three, or five, etc. Figure 3 As shown, in this embodiment, the four guide holes 12 are arranged in pairs and located on both sides of the two pairs of circuit board mounting slots 11. Of course, the specific arrangement of the multiple guide holes 12 is not limited to this. In other embodiments, the multiple guide holes 12 can also be arranged around the periphery of the circuit board mounting slots 11 at intervals, etc. The specific setting position and arrangement method need to be determined according to the actual design requirements.

[0054] Please combine Figure 3 and Figure 4 The circuit board testing device 100 also includes a first positioning plate 50, which is disposed on the test table 10 and has a circuit board mounting groove 11. A guide hole 12 is located on one side of the first positioning plate 50. The test assembly 30 also includes a second positioning plate 33, which is disposed on the side of the mounting plate 31 near the test table 10 and corresponds to the first positioning plate 50. A probe 32 is disposed on the side of the second positioning plate 33 near the test table 10.

[0055] As is easily understood, during the movement of the drive assembly 20 towards the test stage 10, the second positioning plate 33 will correspond with the first positioning plate 50, serving a mutual positioning function and further improving test accuracy. Simultaneously, if the circuit board mounting slot 11 is deep, and the circuit board and probe 32 still have a certain depth after being positioned within the slot, the second positioning plate 33 will abut against the first positioning plate 50 to limit movement, preventing the mounting plate 31 from moving further towards the test stage 10, thereby preventing further movement of the probe 32 and potential damage to the circuit board.

[0056] Please refer to Figure 5 , Figure 5 This is a structural schematic diagram of the first positioning plate 50 provided in this embodiment, combined with... Figure 4 and Figure 5The first positioning plate 50 is also provided with a fixing groove 51, and the bottom wall of the fixing groove 51 is provided with a circuit board mounting groove 11; the test assembly 30 also includes a fixing block 34, which is located on the side of the second positioning plate 33 near the test table 10, and the probe 32 is located on the side of the fixing block 34 near the test table 10. The fixing block 34 is used to be set in the fixing groove 51.

[0057] The fixing block 34 facilitates the installation and replacement of the probe 32 and allows it to cooperate with the fixing slot 51. When the fixing block 34 is installed in the fixing slot 51, the probe 32 is located in the circuit board mounting slot 11. In this way, the fixing block 34 can be fixed in the fixing slot 51, further reducing the shaking of the probe 32 during subsequent testing, improving test stability, and thus further improving test efficiency and the accuracy of test results.

[0058] The circuit board testing device 100 also includes a support plate 60, which is disposed on the test bench 10. A first positioning plate 50 is disposed on the side of the support plate 60 away from the test bench 10. By setting the support plate 60, the first positioning plate 50 can be raised to a certain height, which can further facilitate the docking of the probe 32 with the circuit board during the movement. It can also support the first positioning plate 50, facilitate the alignment adjustment of the circuit board mounting slot 11 and the probe 32, and facilitate the replacement of the circuit board mounting slot 11, and also ensure the stability of the test.

[0059] Please continue to combine Figures 1-3 To facilitate the electrical connection between the probe 32 and the image processing device, in this embodiment, the circuit board testing device 100 further includes a wiring assembly 70. The wiring assembly 70 includes a terminal block 71 and a connecting wire 72. The terminal block 71 is spaced apart from the mounting plate 31 and is located on the side of the mounting plate 31 away from the test stage 10. The connecting wire 72 is disposed on the terminal block 71 and connected to the probe 32. The guide assembly 40 further includes a third guide post 43, the two ends of which are connected to the terminal block 71 and the mounting plate 31, respectively.

[0060] In other words, in this embodiment, the connecting wire 72 is specifically electrically connected to the image processing device. The terminal block 71 facilitates the installation of the connecting wire 72 and makes it easier for the image processing device to be electrically connected to the connecting guide. The third guide post 43 mainly serves to fix the terminal block 71.

[0061] It should be noted that in some feasible implementations, the terminal block 71 can also be configured to slide with the third guide post 43, thereby facilitating the adjustment of the distance between the terminal block 71 and the mounting plate 31, that is, to adapt to connecting wires 72 of different lengths.

[0062] Furthermore, to improve installation stability, the number of third guide posts 43 can be set to multiple, with the multiple third guide posts 43 spaced apart. It should be noted that in this embodiment, the number of third guide posts 43 is specifically four. Of course, in other embodiments, the number of third guide posts 43 can also be two, three, or five, etc.

[0063] In order to acquire different electrical signals, there are multiple probes 32 and multiple connecting wires 72, and multiple probes 32 are connected to multiple connecting wires 72 in a one-to-one correspondence.

[0064] Meanwhile, in order to achieve the acquisition of signals and display of stable image signals through the image display device 200, a shielded wire can also be soldered onto the terminal block 71. The shielded wire is connected to multiple connecting wires 72 at the same time, and the image display device 200 is electrically connected to the shielded wire.

[0065] Please continue to combine Figure 2 Specifically, the drive assembly 20 includes a bracket 21 and a drive component 22. The bracket 21 is disposed on the test bench 10, and the drive component 22 is disposed on the bracket 21 and spaced apart from the test bench 10. The drive component 22 is connected to the mounting plate 31. The two ends of the first guide post 41 are fixedly connected to the bracket 21 and the test bench 10, respectively. By fixing the first guide post 41 to both the bracket 21 and the test bench 10 simultaneously, the installation stability of the first guide post 41 can be improved, thereby further enhancing the stability of the mounting plate 31 during movement.

[0066] It should be noted that in this embodiment, the driving component 22 is specifically a push-pull quick clamp, which can be used to move the mounting plate 31 manually. Of course, in other embodiments, the driving component 22 can also be an electric push rod, a hydraulic cylinder, or an oil cylinder, etc.

[0067] Furthermore, in order to improve the stability of the mounting plate 31 sliding back and forth on the first guide post 41, the test assembly 30 also includes a bushing 35, which passes through the mounting plate 31 and the first guide post 41 passes through the bushing 35.

[0068] The bracket 21 is also equipped with a limiting block 211, and the two ends of the first guide post 41 are connected to the limiting block 211 and the test table 10, respectively. By setting the limiting block 211, the stability of the first guide post 41 is ensured, and the movement of the mounting plate 31 is also limited.

[0069] In addition, the circuit board testing device 100 also includes foot pads 80, which are located at the bottom of the test platform 10 to ensure the stability of the test platform 10.

[0070] In summary, the embodiments of this utility model provide a circuit board testing device 100 and equipment. The circuit board testing device 100 includes a test platform 10, a driving component 20, a testing component 30, and a guiding component 40. The test platform 10 has a circuit board mounting slot 11 and a guide hole 12, which are spaced apart. The driving component 20 is disposed on the test platform 10. The testing component 30 includes a mounting plate 31 and a probe 32. The mounting plate 31 is spaced apart from the test platform 10, and the mounting plate 31 is spaced apart from the driving component. The mounting plate 31 is connected to the test bench 10. The probe 32 is located on the side of the mounting plate 31 near the test bench 10. The guide assembly 40 includes a first guide post 41 and a second guide post 42. The first guide post 41 passes through the mounting plate 31 and is fixedly connected to the test bench 10. The second guide post 42 is located on the side of the mounting plate 31 near the test bench 10. The drive assembly 20 is used to drive the mounting plate 31 to move relative to the first guide post 41 so that the second guide post 42 extends into the guide hole 12 and the probe 32 docks with the circuit board in the circuit board mounting groove 11.

[0071] Understandably, the first guide post 41 guides the mounting plate 31 during its movement, ensuring the stability of the probe 32 as it moves toward the circuit board mounting slot 11. Then, the second guide post 42 further guides and positions the mounting plate 31, and by extending into the guide hole 12, it further ensures the stability of the mounting plate 31's movement. In other words, once the second guide post 42 is within the guide hole 12, the probe 32 then docks with the circuit board in the circuit board mounting slot 11, ensuring precise docking between the probe 32 and the circuit board. Furthermore, the probe 32 is less prone to shaking during subsequent testing, exhibiting good stability, thereby improving testing efficiency and the accuracy of the test results.

[0072] The circuit board testing equipment 1000 includes a circuit board testing device 100, which has all the functions and benefits of the circuit board testing device 100.

[0073] The above description is merely a specific embodiment of this utility model and is not intended to limit the utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A circuit board testing apparatus, characterized by comprising: The circuit board testing device (100) comprises a test table (10), a driving assembly (20), a test assembly (30) and a guiding assembly (40). The test table (10) is provided with a circuit board mounting groove (11) and a guiding hole (12), and the circuit board mounting groove (11) and the guiding hole (12) are arranged at intervals. The driving assembly (20) is arranged on the test table (10). The test assembly (30) comprises a mounting plate (31) and a probe (32), the mounting plate (31) is arranged at intervals with the test table (10), and the mounting plate (31) is connected with the driving assembly (20), the probe (32) is arranged on the side of the mounting plate (31) close to the test table (10). The guiding assembly (40) comprises a first guiding column (41) and a second guiding column (42), the first guiding column (41) is arranged through the mounting plate (31) and is fixedly connected with the test table (10), and the second guiding column (42) is arranged on the side of the mounting plate (31) close to the test table (10). The driving assembly (20) is used for driving the mounting plate (31) to move relative to the first guiding column (41), so that the second guiding column (42) extends into the guiding hole (12), and the probe (32) is connected with the circuit board in the circuit board mounting groove (11). The number of the first guiding column (41) is multiple, and the multiple first guiding columns (41) are arranged at intervals.

2. The circuit board testing apparatus according to claim 1, characterized by The number of the guiding hole (12) and the second guiding column (42) is multiple, the multiple guiding holes (12) are arranged at intervals, and the circuit board mounting groove (11) is located between the multiple guiding holes (12); and the multiple second guiding columns (42) are arranged at intervals and correspond to the multiple guiding holes (12) one by one. The circuit board testing device (100) further comprises a first positioning plate (50), the first positioning plate (50) is arranged on the test table (10), and the first positioning plate (50) is provided with the circuit board mounting groove (11), and the guiding hole (12) is located on one side of the first positioning plate (50).

3. The circuit board testing apparatus according to claim 1, wherein The test assembly (30) further comprises a second positioning plate (33), the second positioning plate (33) is arranged on the side of the mounting plate (31) close to the test table (10) and corresponds to the first positioning plate (50), and the probe (32) is arranged on the side of the second positioning plate (33) close to the test table (10). The first positioning plate (50) is further provided with a fixing groove (51), and the bottom wall of the fixing groove (51) is provided with the circuit board mounting groove (11).

4. The circuit board testing apparatus according to claim 3, wherein The test assembly (30) further comprises a fixing block (34), the fixing block (34) is arranged on the side of the second positioning plate (33) close to the test table (10), the probe (32) is arranged on the side of the fixing block (34) close to the test table (10), and the fixing block (34) is arranged in the fixing groove (51). ​ 5. The circuit board testing apparatus according to claim 3, wherein The circuit board testing device (100) further comprises a support plate (60), which is arranged on the testing table (10), and the first positioning plate (50) is arranged on the side of the support plate (60) away from the testing table (10).

6. The circuit board testing apparatus of claim 1, wherein The circuit board testing device (100) further comprises a wiring assembly (70), which comprises a wiring seat (71) and a connecting wire (72), the wiring seat (71) is arranged on the side of the mounting plate (31) away from the testing table (10), and the connecting wire (72) is arranged on the wiring seat (71) and connected with the probe (32). The guide assembly (40) further comprises a third guide column (43), and both ends of the third guide column (43) are connected with the wiring seat (71) and the mounting plate (31) respectively.

7. The circuit board testing apparatus of claim 6, wherein The number of the probe (32) and the connecting wire (72) is multiple, and multiple probes (32) and multiple connecting wires (72) are connected one by one; and / or, The number of the third guide column (43) is multiple, and multiple third guide columns (43) are arranged at intervals.

8. The circuit board testing apparatus of claim 1, wherein The driving assembly (20) comprises a bracket (21) and a driving piece (22), the bracket (21) is arranged on the testing table (10), the driving piece (22) is arranged on the bracket (21) and arranged at intervals with the testing table (10), and the driving piece (22) is connected with the mounting plate (31); both ends of the first guide column (41) are fixedly connected with the bracket (21) and the testing table (10) respectively.

9. The circuit board testing apparatus of claim 1, wherein The testing assembly (30) further comprises a shaft sleeve (35), the shaft sleeve (35) is arranged on the mounting plate (31), and the first guide column (41) is arranged on the shaft sleeve (35).

10. A circuit board testing apparatus, characterized by comprising: The circuit board testing device (100) comprises an image display device (200) and the circuit board testing device (100) of any one of claims 1-9, and the image display device (200) is electrically connected with the probe (32).

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