Device for measuring overlapping width of base material
By installing a substrate overlap width measuring device on the asphalt waterproof membrane production line, and using a ruler and length measuring instrument to detect the substrate overlap width in real time, the problem of inaccurate online measurement in existing technologies has been solved, achieving precise control and improving product quality.
Patent Information
- Application Number
- CN202520121105.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-17
- Publication Date
- 2026-01-13
- Estimated Expiration
- 2035-01-17
AI Technical Summary
Existing technology cannot accurately measure the overlap width in real time on the asphalt waterproof membrane production line, resulting in non-standard overlap widths during production and causing product quality problems.
A substrate overlap width measuring device was designed, including a ruler body, a length measuring instrument and a reference component. It can detect and adjust the overlap width of the substrate in real time on the production line. The reference component abuts against the edge of the substrate and moves to the overlap width line position. The measurement is assisted by a laser to achieve precise control.
This enables real-time detection and timely adjustment of substrate overlap width on the production line, avoiding the lag in adjustment after offline measurement, and improving product quality and work efficiency.
Smart Images
Figure CN223795938U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of production control technology for asphalt waterproof membranes, and more specifically, to a substrate overlap width measuring device. Background Technology
[0002] The PE film (PE: polyethylene) on the upper surface of the asphalt waterproof membrane has two auxiliary overlap lines on each side. Production control requires these lines to be 10cm from the end. Currently, there is no device for measuring the overlap width on-line in asphalt membrane production because other equipment on the production line obstructs the flow, and the membrane moves suspended above the line at a speed of 35-50m / min. Existing measuring devices cannot measure accurately and promptly on-line; measurements can only be taken after the membrane has come off the production line using a ruler.
[0003] However, there is a distance of about 200m from the PE film coating to the production line. After the product comes off the line, the measurement is taken and feedback is sent to the relevant personnel for adjustment. The adjustment is delayed and cannot be guaranteed to be corrected in one go. As a result, the overlap width cannot be accurately controlled during production, resulting in the production of products with non-standard overlap width. Utility Model Content
[0004] One objective of this invention is to provide a new technical solution for a substrate overlap width measuring device, which can at least solve the problems in the prior art such as the inability to measure overlap width in real time on the production line and the inability to accurately control and adjust the overlap width of roll materials in a timely manner.
[0005] In a first aspect, this utility model provides a substrate overlap width measuring device, comprising: a ruler body, the ruler body being arranged opposite to the substrate at a distance, wherein the substrate has a pre-set overlap width line; a length measuring instrument, the length measuring instrument being movably mounted on the ruler body to detect the overlap width of the substrate; and a reference member, the reference member being connected to the length measuring instrument, the reference member being switchable between a first state and a second state. When the reference member is in the first state, the reference member is opened, the reference member abuts against the edge of the substrate, and the length measuring instrument is zeroed; when the reference member is in the second state, the reference member is closed, and the length measuring instrument moves to a position corresponding to the overlap width line.
[0006] Optionally, the reference component includes a first movable plate and a second movable plate. The first movable plate is connected to the length measuring instrument, and the second movable plate is hinged to the first movable plate via a hinge knob. When the reference component is in the first state, the second movable plate is open relative to the first movable plate; when the reference component is in the second state, the second movable plate is closed relative to the first movable plate.
[0007] Optionally, the first movable plate is provided with a laser. When the reference member is in the second state, the second movable plate closes relative to the first movable plate, and the laser is turned on so that the laser emitted by the laser corresponds to the position of the overlap width line.
[0008] Optionally, the reference member is a telescopic rod, which can extend when in the first state and retract when in the second state.
[0009] Optionally, when the reference member is in the second state, the reference member has a gap with the surface of the substrate.
[0010] Optionally, the reference component is fixedly connected to or threadedly connected to the length measuring instrument.
[0011] Optionally, the scale body is provided with a first limiting block and a second limiting block, the first limiting block and the second limiting block are distributed at intervals, and the length measuring instrument can move between the first limiting block and the second limiting block.
[0012] Optionally, mounting plates are provided at both ends of the scale body.
[0013] Optionally, the mounting plate is an L-shaped plate.
[0014] Optionally, the length measuring instrument is a digital display measuring instrument.
[0015] The substrate overlap width measuring device of this utility model can be directly installed on the production line. The reference component is used to determine the initial overlap width of the substrate, and the length measuring instrument is used to detect the overlap width of the substrate in real time. This facilitates precise control and timely adjustment of the substrate overlap width, ensuring that the substrate overlap width on the production line is qualified, avoiding the lag caused by adjustment after measurement, improving the yield of finished products, and enhancing the work efficiency of the staff.
[0016] Other features and advantages of the present invention will become clear from the following detailed description of exemplary embodiments of the present invention with reference to the accompanying drawings. Attached Figure Description
[0017] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments of the present invention and, together with their description, serve to explain the principles of the present invention.
[0018] Figure 1 This is a schematic diagram of a substrate overlap width measuring device according to an embodiment of the present utility model;
[0019] Figure 2This is another structural schematic diagram of the substrate overlap width measuring device according to an embodiment of the present utility model;
[0020] Figure 3 This is a side view of the substrate overlap width measuring device according to an embodiment of the present utility model;
[0021] Figure 4 This is a top view of the substrate overlap width measuring device according to an embodiment of the present utility model.
[0022] Figure label:
[0023] Scale body 10;
[0024] Length measuring instrument 20;
[0025] Reference component 30; First movable plate 31; Second movable plate 32; Hinge knob 33;
[0026] Laser 40;
[0027] First limiting block 51; Second limiting block 52;
[0028] Mounting plate 60. Detailed Implementation
[0029] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that, unless otherwise specifically stated, the relative arrangement, numerical expressions, and values of the components and steps set forth in these embodiments do not limit the scope of the present invention.
[0030] The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the invention or its application or use.
[0031] Techniques, methods, and equipment known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and equipment should be considered part of the specification.
[0032] In all the examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values.
[0033] It should be noted that similar labels and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be discussed further in subsequent figures.
[0034] In the specification and claims of this utility model, the terms "first" and "second" may explicitly or implicitly include one or more of those features. In the description of this utility model, unless otherwise stated, "multiple" means two or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.
[0035] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and other terms indicating orientation or positional relationships are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.
[0036] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.
[0037] The substrate overlap width measuring device according to an embodiment of the present invention is described in detail below with reference to the accompanying drawings.
[0038] like Figures 1 to 4 As shown, the substrate overlap width measuring device according to an embodiment of the present utility model includes a ruler body 10, a length measuring instrument 20, and a reference component 30.
[0039] Specifically, the scale body 10 is arranged opposite to the substrate at a distance, wherein the substrate has a pre-set overlap width line. The length measuring instrument 20 is movably mounted on the scale body 10 to detect the overlap width of the substrate. The reference element 30 is connected to the length measuring instrument 20 and can be switched between a first state and a second state. When the reference element 30 is in the first state, the reference element 30 is open and abuts against the edge of the substrate, and the length measuring instrument 20 is zeroed. When the reference element 30 is in the second state, the reference element 30 is closed, and the length measuring instrument 20 moves to the position corresponding to the overlap width line of the reference element 30.
[0040] In other words, the substrate overlap width measuring device according to the embodiments of this utility model is mainly used for real-time measurement of the overlap width of the substrate. See also Figures 1 to 4 The substrate overlap width measuring device of this utility model mainly consists of a ruler body 10, a length measuring instrument 20, and a reference component 30. Among them, as shown... Figures 1 to 4 As shown, the scale body 10 can be installed on the production line. The scale body 10 is arranged opposite to the substrate at a distance, and the scale body 10 is provided with measuring scales (see...). Figure 3 and Figure 4 The substrate has pre-set overlap width lines; for example, two overlap lines are pre-set on each side of the substrate to assist in construction. The substrate can be the PE film (PE: polyethylene) on the surface of the asphalt waterproof membrane or other types of membranes that require overlap width.
[0041] like Figure 1 and Figure 3 As shown, the length measuring instrument 20 is movably mounted on the scale body 10. The length measuring instrument 20 has buttons for zeroing, switching units, and counting. The length measuring instrument 20 is mainly used to detect the overlap width of the substrate. A reference component 30 is connected to the length measuring instrument 20 and can switch between a first state and a second state. When the reference component 30 is in the first state, it can be opened and moved to a position abutting the edge of the substrate. At this time, the length measuring instrument 20 can be zeroed. "Opening" in this invention can be understood as unfolding or extending. When the reference component 30 is in the second state, it is closed, and the length measuring instrument 20 is moved to a position corresponding to the preset overlap width line. At this time, the measurement value displayed on the length measuring instrument 20 is the overlap width value of the substrate. Similarly, the overlap width can be measured in real time on the other side of the substrate using the same method.
[0042] Therefore, the substrate overlap width measuring device according to the present invention can be directly installed on the production line. The reference component 30 is used to determine the initial overlap width of the substrate, and the length measuring instrument 20 is used to detect the overlap width of the substrate in real time. This facilitates precise control of the overlap width of the substrate and timely adjustment, ensuring that the overlap width of the substrate on the production line is qualified, avoiding the lag caused by adjustment after measurement after the product is taken off the line, improving the yield of finished products, and increasing the work efficiency of the staff.
[0043] According to one embodiment of the present invention, the reference member 30 includes a first movable plate 31 and a second movable plate 32. The first movable plate 31 is connected to the length measuring instrument 20, and the second movable plate 32 is hinged to the first movable plate 31 through a hinge knob 33. When the reference member 30 is in the first state, the second movable plate 32 is open relative to the first movable plate 31; when the reference member 30 is in the second state, the second movable plate 32 is closed relative to the first movable plate 31.
[0044] In other words, such as Figure 1 and Figure 2 As shown, the reference component 30 mainly consists of a first movable plate 31 and a second movable plate 32. The first movable plate 31 is connected to the length measuring instrument 20, and the second movable plate 32 is hinged to the first movable plate 31 via a hinge knob 33. The reference component 30 is installed directly below the length measuring instrument 20. The first movable plate 31 and the second movable plate 32 are connected via the hinge knob 33. The first movable plate 31 is opened when confirming the end position of the roll material (substrate), and the second movable plate 32 is closed when confirming the overlap position.
[0045] In this invention, when the substrate is transported horizontally on the production line, the substrate overlap width measuring device is located above the substrate. When the substrate is transported vertically on the production line, the substrate overlap width measuring device is located in front of the substrate. With the reference piece 30 in its first state, the second movable plate 32 opens relative to the first movable plate 31, making the first and second movable plates 31 perpendicular to the plane of the substrate (the reference piece 30 is at a 90° angle to the substrate surface), and the reference piece 30 abuts against the edge of the substrate. At this time, the zeroing button of the length measuring instrument 20 can be pressed to zero the length measuring instrument 20 value. Then, the length measuring instrument 20 can be moved to align the reference piece 30 on the length measuring instrument 20 with the overlap width line of the substrate.
[0046] With the reference component 30 in the second state, the second movable plate 32 is closed relative to the first movable plate 31 to ensure that the reference component 30 can be aligned with the overlap width line of the substrate. At this time, the measurement value displayed on the length measuring instrument 20 is the overlap width value of the substrate. During the transfer of the substrate on the production line, when the overlap width of the substrate deviates, the overlap width of the substrate can be adjusted in time according to the measurement value on the length measuring instrument 20. This facilitates precise control and timely adjustment of the overlap width of the substrate, ensuring that the overlap width of the substrate on the production line is qualified and avoiding the lag caused by adjustment after measurement after the substrate is taken off the line.
[0047] According to one embodiment of the present invention, a laser 40 is provided in the first movable plate 31. When the reference member 30 is in the second state, the second movable plate 32 closes relative to the first movable plate 31, and the laser 40 opens so that the laser emitted by the laser 40 corresponds to the position of the overlap width line.
[0048] In other words, such as Figure 2 As shown, a laser 40 can be installed inside the first movable plate 31 of the reference component 30. When the reference component 30 is in the second state, the second movable plate 32 closes relative to the first movable plate 31, and the laser 40 is turned on, so that the laser emitted by the laser 40 can be aligned with the overlap width line of the substrate, which more intuitively helps the staff to judge whether there is a deviation in the overlap width of the substrate, and further improves the measurement accuracy of the overlap width of the substrate.
[0049] According to one embodiment of the present invention, the reference member 30 is a telescopic rod. When the reference member 30 is in a first state, the reference member 30 can be extended; when the reference member 30 is in a second state, the reference member 30 can be retracted.
[0050] In other words, the reference component 30 can also be a telescopic rod. In the first state, the reference component 30 can extend to abut the edge of the substrate. At this time, the zeroing button on the length measuring instrument 20 can be pressed to reset the reading to zero. In the second state, the reference component 30 can retract to ensure alignment with the overlap width line of the substrate. The measurement value displayed on the length measuring instrument 20 is the overlap width of the substrate. During the substrate's transport on the production line, if the overlap width deviates, the overlap width can be adjusted promptly based on the measurement value on the length measuring instrument 20. This facilitates precise control and timely adjustment of the substrate's overlap width, ensuring that the overlap width of the substrate on the production line is qualified and avoiding the lag caused by adjustments after measurement.
[0051] Of course, in addition to the movable plate or telescopic rod structure, the reference component 30 can also adopt other similar structures. As long as the structure can meet the actual needs of this utility model, it should fall within the protection scope of this utility model. It will not be described in detail in this utility model.
[0052] According to one embodiment of the present invention, when the reference member 30 is in the second state, there is a gap between the reference member 30 and the surface of the substrate, ensuring that when the reference member 30 is in the second state, the length of the reference member 30 is slightly less than the distance between the ruler body 10 and the production line roll (substrate), preventing interference between the substrate and the reference member 30 during the transmission process.
[0053] According to one embodiment of the present invention, such as Figure 1 and Figure 2 As shown, the reference component 30 and the length measuring instrument 20 can be fixedly connected or threadedly connected, facilitating the connection between the reference component 30 and the length measuring instrument 20. Of course, the connection method between the reference component 30 and the length measuring instrument 20 can be specifically set according to actual needs, and will not be described in detail in this utility model.
[0054] According to one embodiment of the present invention, the scale body 10 is provided with a first limiting block 51 and a second limiting block 52, the first limiting block 51 and the second limiting block 52 are distributed at intervals, and the length measuring instrument 20 can move between the first limiting block 51 and the second limiting block 52.
[0055] In other words, such as Figures 1 to 4As shown, a first limiting block 51 and a second limiting block 52 can be provided on the scale body 10. The first limiting block 51 and the second limiting block 52 can be distributed at intervals on the scale body 10. The length measuring instrument 20 can move within the limited range between the first limiting block 51 and the second limiting block 52 to ensure that the length measuring instrument 20 does not collide with other equipment on the production line.
[0056] According to one embodiment of the present invention, such as Figures 1 to 3 As shown, mounting plates 60 are respectively provided on the two ends of the scale body 10. The scale body 10 can be fixedly installed on the production line by the two mounting plates 60, for example, installed on the back side of the film coating roller, so as to ensure that the substrate overlap width measuring device can measure the substrate overlap width in real time on the production line, which facilitates accurate control of the substrate overlap width and timely adjustment, ensuring that the substrate overlap width on the production line is qualified, and avoiding the lag caused by adjustment after measurement after the line is completed.
[0057] According to one embodiment of the present invention, such as Figures 1 to 3 As shown, the mounting plate 60 can be configured as an L-shaped plate to facilitate the installation and fixation of the substrate overlap width measuring device on the production line. Of course, the specific shape of the mounting plate 60 can be specifically set according to actual needs, and will not be described in detail in this utility model.
[0058] According to one embodiment of this utility model, the length measuring instrument 20 can be a digital display measuring instrument, ensuring that the measurement of the overlap width of the substrate is more intelligent and more accurate.
[0059] In use, the substrate overlap width measuring device of this utility model is first moved to the first limiting block 51, the reference piece 30 is opened, and it is slid to the other side until the reference piece 30 contacts the end of the roll product (substrate) on the production line (reference piece 30 is in the first state). At this time, the value of the length measuring instrument 20 is zeroed, and the reference piece 30 is closed. At this time, the length of the reference piece 30 is slightly less than the distance between the ruler body 10 and the roll product on the production line. The length measuring instrument 20 is continued to be slid until the reference piece 30 reaches the PE film overlap line on the upper surface of the roll product on the production line (reference piece 30 is in the second state). At this time, the value of the length measuring instrument 20 is the overlap width measurement data. The overlap width on the other side of the substrate can be measured in the same way, and will not be described in detail in this utility model.
[0060] In summary, the substrate overlap width measuring device according to the present invention can be directly installed on the production line. The reference component 30 is used to determine the initial overlap width of the substrate, and the length measuring instrument 20 is used to detect the overlap width of the substrate in real time. This facilitates precise control of the overlap width of the substrate and timely adjustment, ensuring that the overlap width of the substrate on the production line is qualified, avoiding the lag caused by adjustment after measurement after the product is taken off the line, improving the yield of finished products, and increasing the work efficiency of the staff.
[0061] Of course, those skilled in the art can understand and implement other structures and working principles of the substrate overlap width measuring device, and will not be described in detail in this utility model.
[0062] Although specific embodiments of the present invention have been described in detail by way of examples, those skilled in the art should understand that the above examples are for illustrative purposes only and are not intended to limit the scope of the present invention. Those skilled in the art should understand that modifications can be made to the above embodiments without departing from the scope and spirit of the present invention. The scope of the present invention is defined by the appended claims.
Claims
1. A substrate overlap width measuring device, characterized in that, include: A ruler body (10) is arranged opposite to the substrate at a distance, wherein the substrate has a pre-set overlap width line; Length measuring instrument (20), which is movably mounted on the ruler body (10) to detect the overlap width of the substrate; A reference component (30) is connected to the length measuring instrument (20). The reference component (30) can be switched between a first state and a second state. When the reference component (30) is in the first state, the reference component (30) is opened and abuts against the edge of the substrate, and the length measuring instrument (20) is zeroed. When the reference component (30) is in the second state, the reference component (30) is closed, and the length measuring instrument (20) moves to the position of the reference component (30) corresponding to the overlap width line.
2. The substrate overlap width measuring device according to claim 1, characterized in that, The reference component (30) includes a first movable plate (31) and a second movable plate (32). The first movable plate (31) is connected to the length measuring instrument (20), and the second movable plate (32) is hinged to the first movable plate (31) via a hinge knob (33). When the reference component (30) is in the first state, the second movable plate (32) is open relative to the first movable plate (31); when the reference component (30) is in the second state, the second movable plate (32) is closed relative to the first movable plate (31).
3. The substrate overlap width measuring device according to claim 2, characterized in that, The first movable plate (31) is equipped with a laser (40). When the reference member (30) is in the second state, the second movable plate (32) closes relative to the first movable plate (31), and the laser (40) is turned on so that the laser emitted by the laser (40) corresponds to the position of the overlap width line.
4. The substrate overlap width measuring device according to claim 1, characterized in that, The reference member (30) is a telescopic rod. When the reference member (30) is in the first state, the reference member (30) can extend; when the reference member (30) is in the second state, the reference member (30) can retract.
5. The substrate overlap width measuring device according to claim 1, characterized in that, When the reference member (30) is in the second state, the reference member (30) has a gap with the surface of the substrate.
6. The substrate overlap width measuring device according to claim 1, characterized in that, The reference component (30) is fixedly connected or threadedly connected to the length measuring instrument (20).
7. The substrate overlap width measuring device according to claim 1, characterized in that, The main body (10) of the scale is provided with a first limiting block (51) and a second limiting block (52), the first limiting block (51) and the second limiting block (52) are spaced apart, and the length measuring instrument (20) can move between the first limiting block (51) and the second limiting block (52).
8. The substrate overlap width measuring device according to claim 1, characterized in that, Mounting plates (60) are provided on both ends of the main body (10) of the ruler.
9. The substrate overlap width measuring device according to claim 8, characterized in that, The mounting plate (60) is an L-shaped plate.
10. The substrate overlap width measuring device according to claim 1, characterized in that, The length measuring instrument (20) is a digital display measuring instrument.