IV probe row for BC battery production
By designing an IV probe array suitable for BC cell production, the problem of poor detection effect of the detection equipment was solved, and stable contact and efficient detection of BC cell silicon wafers were achieved, thereby improving production quality and capacity.
Patent Information
- Application Number
- CN202520224171.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-12
- Publication Date
- 2026-01-23
- Estimated Expiration
- 2035-02-12
AI Technical Summary
The existing BC battery production process lacks a stable and suitable IV probe array, resulting in poor detection performance of the testing equipment and affecting production quality and capacity.
An IV probe array comprising a mounting frame and elastic probes was designed. The mounting frame has a square mounting platform and a temperature control detection hole in the middle. The elastic probes pass through the probe slots and are distributed in an array for IV detection of BC cell silicon wafers. Combined with voltage point and temperature control monitoring, stable contact and detection are achieved.
This IV probe array enables stable contact detection of BC cell silicon wafers, improving detection accuracy and production quality, and enhancing production efficiency.
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Figure CN223829285U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of silicon wafer production, and in particular to an IV probe array for BC cell production. Background Technology
[0002] Photovoltaic silicon wafers (hereinafter referred to as silicon wafers) are the core component of solar power generation systems and also the most valuable part. The function of silicon wafers is to convert solar energy into electrical energy, which is then stored in batteries or used directly as a power source. BC cells, short for Back Contact Batteries, are an advanced solar cell technology. Their characteristic feature is that the emitter, surface field, and metal electrodes are all located on the back of the cell and arranged in an interdigitated pattern. During the production of silicon wafers for these modules, IV testing is required. Probes and circuits collect current and voltage signals for software analysis to test their energy storage capacity. This testing requires a corresponding IV probe array. Utility Model Content
[0003] One objective of this invention is to provide an IV probe array for BC battery production, which has stable performance, reasonable structure, and is suitable for use in BC battery production testing equipment.
[0004] To achieve this objective, the present invention adopts the following technical solution:
[0005] An IV probe array for BC battery production includes a mounting frame and several elastic probes. A square mounting platform is provided in the middle of the mounting frame. Several probe slots are provided on the square mounting platform along the vertical direction. The probe slots are evenly spaced and parallel to each other. The elastic probes pass through the probe slots. There are two voltage points on each side of the square mounting platform. The voltage points are located on the elastic probes. A temperature control detection hole is provided at the center of the mounting frame. The temperature control detection hole is used to monitor changes in silicon wafer imaging.
[0006] As a preferred technical solution, the elastic probe includes a needle sleeve and a needle head. The lower end of the needle sleeve is provided with a mounting position, and the upper end of the needle head is inserted into the mounting position. The needle head moves elastically back and forth.
[0007] As a preferred technical solution, the lower periphery of the needle sleeve is provided with a circular protrusion, which is engaged with the upper end of the square mounting platform.
[0008] As a preferred technical solution, the middle part of the mounting frame protrudes upward, and the square mounting platform is located in the middle of the protruding part.
[0009] As a preferred technical solution, mounting holes are provided at both ends of the mounting frame.
[0010] As a preferred technical solution, the elastic probes are distributed in an array, with equal spacing between each column of elastic probes and equal spacing between each row of elastic probes.
[0011] The beneficial effects of this utility model are as follows: It provides an IV probe array for BC battery production. This IV probe array for BC battery production performs IV detection on the silicon wafers of BC batteries during the production process. The entire board drives all elastic probes to contact the silicon wafers, and the elastic contact protects the silicon wafers. The detected voltage and current are converted into performance parameters as a standard for judging the quality of the silicon wafers, which is conducive to improving production quality and increasing production capacity. Attached Figure Description
[0012] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments.
[0013] Figure 1 This is a schematic diagram of the overall structure of an IV probe array for BC battery production, as described in the embodiment.
[0014] Figure 2 This is a top view of an IV probe array for BC battery production as described in the embodiment;
[0015] Figure 3 This is a first cross-sectional view of an IV probe array for BC battery production as described in the embodiment;
[0016] Figure 4 This is a second cross-sectional view of an IV probe array for BC battery production as described in the embodiment;
[0017] Figure 5 This is an exploded view of the elastic probe described in the embodiment.
[0018] Figures 1 to 5 middle:
[0019] 1. Mounting frame; 2. Flexible probe; 3. Square mounting platform; 4. Voltage point; 5. Temperature control detection hole; 6. Needle sleeve; 7. Needle tip; 8. Circular protrusion; 9. Mounting hole. Detailed Implementation
[0020] The technical solution of this utility model will be further described below with reference to the accompanying drawings and specific embodiments.
[0021] like Figures 1 to 5As shown in this embodiment, an IV probe array for BC battery production includes a mounting frame 1 and several elastic probes 2. A square mounting platform 3 is provided in the middle of the mounting frame 1. Several probe slots are provided on the square mounting platform 3 along the vertical direction. The probe slots are evenly distributed and parallel to each other. The elastic probes 2 pass through the probe slots. There are two voltage points 4 on each side of the square mounting platform 3. The voltage points 4 are located on the elastic probes 2. A temperature control detection hole 5 is provided at the center of the mounting frame 1. The temperature control detection hole 5 is used to monitor the imaging changes of the silicon wafer.
[0022] The mounting frame 1 is a separate unit. During molding, the middle is a square mounting platform 3. A through probe groove is opened along the top and bottom of the middle position. The elastic probe 2 passes through the probe groove. The position of the temperature control detection hole 5 is a dedicated hole for the infrared probe to monitor the imaging changes of the silicon wafer. When the entire mounting frame 1 moves up and down, the elastic probe 2 makes elastic contact with the silicon wafer of the BC battery, thereby realizing IV detection.
[0023] The elastic probe 2 includes a needle sleeve 6 and a needle 7. The lower end of the needle sleeve 6 is provided with an installation position, and the upper end of the needle 7 is inserted into the installation position. The needle 7 moves elastically back and forth, and the needle 7 is inserted from the lower end of the needle sleeve 6 to form an elastic structure.
[0024] The lower outer periphery of the needle sleeve 6 is provided with a circular protrusion 8, which is engaged with the upper end of the square mounting platform 3, effectively preventing the elastic probe 2 from retracting too far upward and thus limiting its position.
[0025] In terms of specific structure, the middle of the mounting frame 1 protrudes upwards, and the square mounting platform 3 is located in the middle of the protrusion, which makes it easier to make the elastic probe 2 contact the silicon wafer.
[0026] Mounting holes 9 are provided at both ends of the mounting frame 1, through which the entire IV probe array is installed to the corresponding mechanism or equipment.
[0027] On this IV probe array, the elastic probes 2 are distributed in an array. The spacing between each column of elastic probes 2 is equal, and the spacing between each row of elastic probes 2 is equal. The array distribution can also be changed according to actual use.
[0028] It should be stated that the above-described specific embodiments are merely preferred embodiments of this utility model and the technical principles applied thereto. Within the scope of the technology disclosed in this utility model, any variations or substitutions that are easily conceived by those skilled in the art should be covered within the protection scope of this utility model.
Claims
1. An IV probe array for BC battery production, characterized in that, The device includes a mounting frame and several elastic probes. A square mounting platform is provided in the middle of the mounting frame. Several probe slots are provided on the square mounting platform along the vertical direction. The probe slots are evenly spaced and parallel to each other. The elastic probes pass through the probe slots. There are two voltage points on each side of the square mounting platform. The voltage points are located on the elastic probes. A temperature control detection hole is provided at the center of the mounting frame. The temperature control detection hole is used to monitor changes in silicon wafer imaging.
2. The IV probe array for BC battery production according to claim 1, characterized in that, The elastic probe includes a needle sleeve and a needle tip. The lower end of the needle sleeve is provided with a mounting position, and the upper end of the needle tip is inserted into the mounting position. The needle tip moves elastically back and forth.
3. The IV probe array for BC battery production according to claim 2, characterized in that, The lower periphery of the needle sleeve is provided with a circular protrusion, which is engaged with the upper end of the square mounting platform.
4. The IV probe array for BC battery production according to claim 1, characterized in that, The mounting frame has an upward bulge in the middle, and the square mounting platform is located in the middle of the bulge.
5. An IV probe array for BC battery production according to claim 1, characterized in that, Mounting holes are provided at both ends of the mounting frame.
6. The IV probe array for BC battery production according to claim 1, characterized in that, The elastic probes are distributed in an array, with equal spacing between each column and equal spacing between each row.
Citation Information
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