Discrete device testing device

Abstract

The utility model discloses a discrete device testing device, particularly relates to the technical field of discrete device testing, and comprises a fixed station, two ends of the top of the fixed station are symmetrically provided with support plates; the testing assembly comprises a discrete device placing plate arranged between the inner sides of the two supporting plates, a pressing plate is arranged between the inner sides of the two supporting plates and close to the upper portion of the discrete device placing plate, and an electrode bottom plate is arranged between the inner sides of the two supporting plates and close to the lower portion of the discrete device placing plate. By arranging the fixing table, the supporting plate, the movable column, the connecting blocks, the driving mechanism and other structures, the movable column can drive the upper connecting block and the lower connecting block to get close to each other, and therefore the connecting blocks can drive the pressing plate and the electrode bottom plate to get close to each other and rapidly clamp the upper side and the lower side of the discrete device containing plate. And on the contrary, the pressing plate and the electrode bottom plate can be rapidly far away from the discrete device placing plate, operation is simple and convenient, rapid assembly testing is facilitated, and working efficiency is greatly improved.

Description

Technical Field

[0001] This utility model relates to the field of discrete device testing technology, and specifically to a discrete device testing device. Background Technology

[0002] The semiconductor industry has two main branches: integrated circuits and discrete devices. Discrete devices include semiconductor diodes, semiconductor transistors, special devices and sensors, sensitive devices, assembled piezoelectric crystals similar to semiconductor devices, and dedicated semiconductor components. Discrete devices are widely used in consumer electronics, computers and peripherals, network communications, automotive electronics, and LED displays. To ensure the quality of discrete devices, electrical testing is usually required.

[0003] Chinese patent CN102866318A discloses a "testing device for discrete chip packaged devices". This device places the devices under test in batches on a perforated limiting plate, and then clamps the pressure plate and electrode base plate on the upper and lower sides of the perforated limiting plate by multiple sets of fastening screws and wing nuts. After connecting the testing equipment, batch testing can be performed. However, the screw and nut connection method is inefficient during the assembly and testing process. It is not only cumbersome and inconvenient to install, but also difficult to disassemble, which greatly affects the testing efficiency of discrete devices. Utility Model Content

[0004] The purpose of this invention is to provide a discrete device testing device. By setting up a fixed platform, a support plate, a movable column, connecting blocks, and a driving mechanism, the movable column can drive the upper and lower connecting blocks to move closer to each other. This allows the connecting blocks to drive the pressure plate and the electrode base plate to move closer to each other and quickly clamp them on the upper and lower sides of the discrete device placement plate. Conversely, the pressure plate and the electrode base plate can also be quickly moved away from the discrete device placement plate. The operation is simple and convenient, facilitating rapid assembly and testing, and greatly improving work efficiency, thus solving the above-mentioned shortcomings in the technology.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a discrete device testing apparatus, comprising:

[0006] A fixed platform, wherein support plates are symmetrically arranged at both ends of the top of the fixed platform;

[0007] The test assembly includes a discrete element placement plate disposed between the inner sides of two support plates. A pressure plate is disposed between the inner sides of the two support plates near the top of the discrete element placement plate, and an electrode base plate is disposed between the inner sides of the two support plates near the bottom of the discrete element placement plate. Each of the two support plates has a cavity, and movable columns are symmetrically arranged on both sides of the cavity. A connecting block is fixed to the opposite end of each of the two movable columns. A slide rail matching the connecting block is provided on the inner side of the support plate. The ends of the two connecting blocks pass through the slide rail and are respectively connected to the pressure plate and the electrode base plate. A driving mechanism is provided on the support plate, and the driving mechanism is used to drive the movable columns to move towards or away from each other.

[0008] Preferably, the driving mechanism includes a gear rotatably connected to the middle of the cavity via a rotating shaft, racks meshing with the gear are provided on the inner sides of the two movable columns, and a second motor is fixed on the outer side of the support plate, with the output end of the second motor connected to the gear.

[0009] Preferably, both ends of the pressure plate and the electrode base plate are provided with a second slot facing the connecting block, and the end of the connecting block and located outside the support plate is connected to a second card plate, which can be inserted into the second slot.

[0010] Preferably, the two ends of the discrete device placement plate are symmetrically provided with first slots, and the inner middle of the two support plates is fixed with a first card plate, and the first card plate can be inserted into the first slot.

[0011] Preferably, the top side of the fixed platform is provided with a sliding cavity, and the two ends of the sliding cavity are symmetrically arranged with sliders that can move towards or away from each other, and the top ends of the two sliders are respectively fixedly connected to two support plates.

[0012] Preferably, the interior of the sliding cavity is rotatably connected to a bidirectional screw via a bearing, and the two sliders are symmetrically connected to the two ends of the bidirectional screw via threads. A first motor is fixed to one end of the fixed platform, and the output end of the first motor is connected to the bidirectional screw.

[0013] Preferably, both sides of the fixing platform are fixed with fixing plates, and the fixing plates are provided with fixing holes.

[0014] Preferably, a limiting block is fixed at the middle of the side wall of each of the two movable columns, and a limiting groove matching the limiting block is provided on the inner side of the cavity.

[0015] The technical effects and advantages provided by this utility model in the above technical solution are as follows:

[0016] By setting up a fixed platform, support plate, movable column, connecting block and drive mechanism, the movable column can drive the upper and lower connecting blocks to move closer to each other, so that the connecting blocks can drive the pressure plate and electrode base plate to move closer to each other and quickly clamp them on the upper and lower sides of the discrete device placement plate. Conversely, the pressure plate and electrode base plate can also be moved away from the discrete device placement plate quickly. The operation is simple and convenient, and it is easy to assemble and test quickly, which greatly improves work efficiency.

[0017] By setting up a sliding cavity, slider, and bidirectional screw between the fixed platform and the support plate, the two support plates can be controlled to move closer or further apart. At the same time, by inserting and cooperating the first clamping plate with the first clamping slot and the second clamping plate with the second clamping slot, the discrete device placement plate, pressure plate, and electrode base plate can be quickly assembled and disassembled. This allows for the selection of the appropriate discrete device placement plate, pressure plate, and electrode base plate according to the size and quantity of the device under test, greatly improving the applicability of the device. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this utility model. For those skilled in the art, other drawings can be obtained based on these drawings.

[0019] Figure 1 This is one of the overall structural schematic diagrams of this utility model;

[0020] Figure 2 This is the second schematic diagram of the overall structure of this utility model;

[0021] Figure 3 This is a schematic diagram of the connection between the fixed platform and the support plate of this utility model;

[0022] Figure 4 This is a longitudinal sectional view of the support plate of this utility model;

[0023] Figure 5 This is a longitudinal sectional view of the pressure plate, the separator placement plate, and the electrode base plate of this utility model.

[0024] Explanation of reference numerals in the attached figures:

[0025] 1. Fixed platform; 2. Sliding cavity; 3. Bidirectional screw; 4. Slider; 5. Support plate; 6. Separator placement plate; 7. Pressure plate; 8. Electrode base plate; 9. First clamping plate; 10. Second clamping plate; 11. First motor; 12. Fixed plate; 13. Cavity groove; 14. Gear; 15. Movable column; 16. Rack; 17. Second motor; 18. Limiting block; 19. Limiting groove; 20. Connecting block; 21. Slide rail; 22. First slot; 23. Second slot. Detailed Implementation

[0026] To enable those skilled in the art to better understand the technical solution of this utility model, the present utility model will be further described in detail below with reference to the accompanying drawings.

[0027] This utility model provides, for example Figures 1-5 The discrete device testing apparatus shown includes:

[0028] Fixed platform 1, with support plates 5 symmetrically arranged at both ends of the top of fixed platform 1;

[0029] Fixing plates 12 are fixed on both sides of the fixing platform 1, and fixing holes are provided on the fixing plates 12.

[0030] The test assembly includes a discrete element placement plate 6 disposed between the inner sides of two support plates 5. A pressure plate 7 is disposed above the discrete element placement plate 6 between the inner sides of the two support plates 5, and an electrode base plate 8 is disposed below the discrete element placement plate 6 between the inner sides of the two support plates 5. A cavity 13 is formed inside each of the two support plates 5. Movable columns 15 are symmetrically arranged on both sides inside the cavity 13. A connecting block 20 is fixed to the opposite end of each of the two movable columns 15. A slide 21 matching the connecting block 20 is formed inside the support plate 5. The ends of the two connecting blocks 20 pass through the slide 21 and are connected to the pressure plate 7 and the electrode base plate 8 respectively. A driving mechanism is provided on the support plate 5, and the driving mechanism is used to drive the movable columns 15 to move towards or away from each other. Based on this, the pressure plate 7, the discrete device placement plate 6, and the electrode base plate 8 all adopt the pressure plate, perforation limit, and electrode base plate disclosed in the patent document with patent number "CN102866318A" and patent name "a chip package discrete device testing device". The discrete device placement plate 6 is provided with multiple perforations for placing the device under test. The bottom of the pressure plate 7 is provided with multiple rubber pressure pillars facing the perforations. The electrode base plate 8 is provided with multiple electrode sheets facing the perforations.

[0031] The drive mechanism includes a gear 14 rotatably connected to the middle of the cavity 13 via a rotating shaft. The inner sides of the two movable columns 15 are provided with racks 16 that mesh with the gear 14. A second motor 17 is fixed to the outer side of the support plate 5. The output end of the second motor 17 is connected to the gear 14.

[0032] During testing, the devices under test (DUTs) can be placed in batches on the perforations of the discrete device placement plate 6. Then, by starting the second motor 17, the second motor 17 drives the gear 14 to rotate. The gear 14 then drives the racks 16 on both sides to move, causing the racks 16 to move the movable columns 15. The two movable columns 15 then move towards each other, and through the connecting block 20, they can respectively drive the pressure plate 7 and the electrode base plate 8 to move closer to each other. This allows the pressure plate 7 and the electrode base plate 8 to be quickly clamped on the upper and lower sides of the discrete device placement plate 6, so that the rubber pressure column on the pressure plate 7 presses against the DUT, and the bottom side of the DUT is pressed against the electrode plate. Finally, the batch testing of the DUTs can be completed by scanning the test equipment. Conversely, by driving the gear 14 to rotate in the opposite direction through the second motor 17, the pressure plate 7 and the electrode base plate 8 can be quickly moved away from the discrete device placement plate 6. The operation is simple and convenient, facilitating rapid assembly and testing, and greatly improving work efficiency.

[0033] Limiting blocks 18 are fixed at the middle of the side walls of the two movable columns 15, and limiting grooves 19 matching the limiting blocks 18 are provided on the inner side of the cavity 13.

[0034] Both ends of the pressure plate 7 and the electrode base plate 8 are provided with second slots 23 facing the connecting block 20. The end of the connecting block 20 and located outside the support plate 5 is connected to a second card 10, and the second card 10 can be inserted into the second slot 23.

[0035] The two ends of the discrete device placement plate 6 are symmetrically provided with first slots 22, and the inner middle of the two support plates 5 are fixed with first plates 9, and the first plates 9 can be inserted into the first slots 22.

[0036] A sliding cavity 2 is provided on the top side of the fixed platform 1. Sliding blocks 4 that can move towards or away from each other are symmetrically arranged at both ends inside the sliding cavity 2. The top ends of the two sliding blocks 4 are respectively fixedly connected to two support plates 5.

[0037] Inside the sliding cavity 2, a bidirectional screw 3 is rotatably connected via a bearing. Two sliders 4 are symmetrically connected to the two ends of the bidirectional screw 3 via threads. A first motor 11 is fixed at one end of the fixed platform 1, and the output end of the first motor 11 is connected to the bidirectional screw 3.

[0038] The first motor 11 drives the bidirectional screw 3 to rotate, which in turn drives the two sliders 4 to move towards or away from each other in the sliding cavity 2. The sliders 4 can move the support plate 5, thereby controlling the two support plates 5 to move closer or further apart. At the same time, the first locking plate 9 is inserted into the first locking slot 22, and the second locking plate 10 is inserted into the second locking slot 23, so that the discrete device placement plate 6, pressure plate 7 and electrode base plate 8 can be quickly assembled and disassembled. This allows for the selection of the appropriate discrete device placement plate 6, pressure plate 7 and electrode base plate 8 according to the size and quantity of the device under test, greatly improving the applicability of the device.

[0039] The foregoing description only illustrates certain exemplary embodiments of the present invention. Undoubtedly, those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A discrete device testing apparatus, characterized in that, include: A fixed platform (1) is provided with support plates (5) symmetrically arranged at both ends of the top of the fixed platform (1); The test assembly includes a discrete element placement plate (6) disposed between the inner sides of two support plates (5), a pressure plate (7) disposed between the inner sides of the two support plates (5) near the top of the discrete element placement plate (6), and an electrode base plate (8) disposed between the inner sides of the two support plates (5) near the bottom of the discrete element placement plate (6). Each of the two support plates (5) has a cavity (13) inside, and movable columns (15) are symmetrically arranged on both sides of the cavity (13). Each of the two movable columns (15) has a connecting block (20) fixed at the opposite end. The inner side of the support plate (5) has a slide (21) that matches the connecting block (20). The ends of the two connecting blocks (20) pass through the slide (21) and are connected to the pressure plate (7) and the electrode base plate (8) respectively. The support plate (5) is provided with a driving mechanism, which is used to drive the movable columns (15) to move towards or away from each other.

2. The discrete device testing apparatus according to claim 1, characterized in that: The drive mechanism includes a gear (14) rotatably connected to the middle of the cavity (13) via a rotating shaft. The inner sides of the two movable columns (15) are provided with racks (16) that mesh with the gear (14). A second motor (17) is fixed to the outer side of the support plate (5). The output end of the second motor (17) is connected to the gear (14).

3. The discrete device testing apparatus according to claim 1, characterized in that: Both ends of the pressure plate (7) and the electrode base plate (8) are provided with a second slot (23) facing the connecting block (20). The end of the connecting block (20) and located outside the support plate (5) is connected to a second card plate (10), and the second card plate (10) can be inserted into the second slot (23).

4. The discrete device testing apparatus according to claim 1, characterized in that: The two ends of the discrete device placement plate (6) are symmetrically provided with first slots (22), and the inner middle of the two support plates (5) are fixed with first plates (9), and the first plates (9) can be inserted into the first slots (22).

5. The discrete device testing apparatus according to claim 1, characterized in that: The top side of the fixed platform (1) is provided with a sliding cavity (2). The two ends of the sliding cavity (2) are symmetrically arranged with sliders (4) that can move towards or away from each other. The top ends of the two sliders (4) are respectively fixedly connected to two support plates (5).

6. The discrete device testing apparatus according to claim 5, characterized in that: The interior of the sliding cavity (2) is rotatably connected to a bidirectional screw (3) via a bearing. The two sliders (4) are symmetrically connected to the two ends of the bidirectional screw (3) via threads. One end of the fixed platform (1) is fixed with a first motor (11), and the output end of the first motor (11) is connected to the bidirectional screw (3).

7. The discrete device testing apparatus according to claim 1, characterized in that: Both sides of the fixed platform (1) are fixed with fixed plates (12), and the fixed plates (12) are provided with fixing holes.

8. The discrete device testing apparatus according to claim 1, characterized in that: Limiting blocks (18) are fixed at the middle of the side walls of the two movable columns (15), and a limiting groove (19) matching the limiting block (18) is provided on the inner side of the cavity (13).

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