Device for automatically simulating power supply and ground short circuit
By designing an automatic power supply and ground short-circuit simulation device, and employing multiple test channels and control modules, the problem of low efficiency in traditional manual testing is solved, achieving efficient and accurate circuit testing, reducing costs and time, and making it suitable for product development and mass production testing.
Patent Information
- Application Number
- CN202423153546.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-20
- Publication Date
- 2026-02-10
- Estimated Expiration
- 2034-12-20
AI Technical Summary
Traditional manual circuit testing methods are time-consuming, labor-intensive, and inefficient, failing to meet the automotive electronics manufacturing industry's demands for efficient and rapid product development and mass production testing, and are also costly.
Design an automatic power supply and ground short-circuit simulation device. Employ multiple test channels, each including a control module and a relay module. Combined with a main control module and a microcontroller, it enables simultaneous testing of multiple circuits and displays the test status via indicator lights.
It improves testing speed and accuracy, reduces the investment of human and material resources, lowers testing costs, ensures the reliability and consistency of test results, and shortens the time to market for new products.
Smart Images

Figure CN223897615U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of power supply and ground short circuit testing, and in particular to an automatic simulation device for power supply and ground short circuits. Background Technology
[0002] In the automotive electronics manufacturing industry, ensuring product reliability is crucial for early-stage product development and testing, guaranteeing that products function correctly even under various fault conditions in real-world vehicle environments. However, in actual testing, the sheer number of circuits requiring testing makes traditional manual methods—such as using multimeters, oscilloscopes, or specialized circuit acquisition equipment to test each circuit individually—not only time-consuming and labor-intensive but also inefficient. This leads to a surge in demand for testing tools and equipment, resulting in high purchase costs and significant consumption of human and material resources. As product functions become increasingly diversified and project types expand, these traditional testing methods are no longer sufficient to meet the demands of efficient and rapid product development and mass production testing. There is an urgent need to introduce automated testing equipment to optimize testing processes, improve efficiency, reduce costs, and ensure product reliability and usability. Utility Model Content
[0003] To perform power supply or ground short-circuit tests on multiple circuits simultaneously using a single device, this invention proposes an automatic power supply and ground short-circuit simulation device for simulating power supply and ground short-circuit tests on multiple circuits under test. The simulation device includes multiple test channels; each test channel corresponds one-to-one with the circuit under test; each test channel includes:
[0004] The first circuit includes a first control module and a first relay module;
[0005] The first control module includes a first control unit and a second control unit; the first relay module includes the coil of the first relay TX33, and its corresponding first normally closed contact, second normally closed contact, first normally open contact and second normally open contact;
[0006] The second circuit includes a second control module and a second relay module; the second relay module includes: the coil of the second relay TX1, and its corresponding third normally closed contact, fourth normally closed contact, third normally open contact and fourth normally open contact;
[0007] Output pin PORT1; where:
[0008] The first control unit is used to receive the first external signal CTR3. When the first external signal CTR3 is high, the first control unit controls the coil of the first relay TX33 to be energized, and the first normally open contact and the second normally open contact close. At this time, the relay is connected to the positive power supply and outputs through the output terminal of the second control unit. When the first external signal CTR3 is low, the coil of the first relay TX33 is not energized, and the first normally closed contact and the second normally closed contact remain closed. At this time, the relay is connected to the ground signal and outputs through the output terminal of the second control unit.
[0009] The second control module is used to connect to the second external signal CTR2_P1. When the second external signal CTR2_P1 is high, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay is connected to the positive power supply or ground signal output by the output terminal of the second control unit, and outputs to the corresponding circuit under test through the output pin PORT1.
[0010] Furthermore, each test channel also includes:
[0011] The self-test circuit includes a third control module and a third relay module; the third relay module includes the coil of the third relay TX2, and its corresponding fifth normally closed contact, sixth normally closed contact, fifth normally open contact and sixth normally open contact;
[0012] The third control module is used to receive the third external signal CTR1_P1. When the third external signal CTR1_P1 is low, the fifth normally closed contact and the sixth normally closed contact remain closed. At this time, the output pin is connected to the load. When the third external signal CTR1_P1 is high, the third control module controls the coil of the third relay TX2 to be energized, and the fifth normally open contact and the sixth normally open contact close. At this time, the output pin switches from being connected to the load to being connected to the self-test pin SIG1.
[0013] The SIG1 pin is used to feed back the signal output by the output pin to the main control module.
[0014] Furthermore, each test channel also includes: an indicator light control module;
[0015] The indicator light control module includes:
[0016] The power supply short circuit indicator circuit is used to indicate that the corresponding test channel is currently in a power supply short circuit test state;
[0017] The short-circuit-to-ground indicator circuit is used to indicate that the corresponding test channel is currently in a short-circuit-to-ground test state;
[0018] The first indicator control unit is used to receive the first external signal CTR3 and the second external signal CTR2_P1; and when both the first external signal CTR3 and the second external signal CTR2_P1 are at a high level, it outputs positive power to the power short circuit function indicator circuit to make the indicator light in the power short circuit function indicator circuit light up.
[0019] The second indicator control unit is used to receive the fourth external signal *CTR3 and the second external signal CTR2_P1; and when both the fourth external signal *CTR3 and the second external signal CTR2_P1 are at a high level, it outputs a positive power supply to the ground short-circuit function indicator circuit, causing the indicator light in the ground short-circuit function indicator circuit to light up; the fourth external signal *CTR3 is the level signal output by the first external signal CTR3 after passing through an inverter.
[0020] Furthermore, in the first circuit:
[0021] The first control module includes an eighth zero transistor U80, a third Zener diode ZD33, and a seventh nine inverter U79A; wherein:
[0022] The first pin GATE of the eighth zero transistor U80 is connected to the input terminal of the seventh nine inverter U79A and then connected to the first external signal CTR3. The third pin SOURCE is grounded and simultaneously connected to the positive terminal of the third Zener diode ZD33. The negative terminal of the third Zener diode ZD33 is connected to the fourth pin and the second pin of the eighth zero transistor U80 in sequence and then connected to one end of the coil of the first relay TX33. The output terminal of the seventh nine inverter U79A is used to output the fourth external signal *CTR3 to the second indicator control unit.
[0023] In the first relay module:
[0024] The other end of the coil of the first relay TX33 is connected to a +12V power supply; normally open contacts 4 and 5 of the first relay TX33 are connected to the positive power supply, and normally closed contacts 2 and 7 of the first relay TX33 are connected to the ground signal POWER_GND; common contacts 3 and 6 of the first relay TX33 are connected to the second control unit; in the first relay TX33:
[0025] Common contact 3 and normally closed contact 2 form the first normally closed contact, and common contact 6 and normally closed contact 7 form the second normally closed contact;
[0026] Common contact 3 and normally open contact 4 form the first normally open contact, and common contact 6 and normally open contact 5 form the second normally open contact.
[0027] Furthermore, in the second circuit:
[0028] The second control module includes: a second transistor U2 and a first Zener diode ZD1; the first pin GATE of the second transistor U2 is connected to the second external signal CTR2_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the first Zener diode ZD1; the negative terminal of the first Zener diode ZD1 is connected to the fourth pin and the second pin of the second transistor U2 in sequence, and then connected to one end of the coil of the second relay TX1.
[0029] In the second relay module:
[0030] The other end of the coil of the second relay TX1 is connected to a +12V power supply;
[0031] The normally open contacts 4 and 5 of the second relay TX1 are connected to the output terminal SHOPT of the second control unit, and the common contacts 3 and 6 of the second relay TX1 are connected to the output pin PORT1; in the second relay TX1:
[0032] Common contact 3 and normally closed contact 2 form the third normally closed contact, and common contact 6 and normally closed contact 7 form the fourth normally closed contact;
[0033] Common contact 3 and normally open contact 4 form the third normally open contact, and common contact 6 and normally open contact 5 form the fourth normally open contact.
[0034] Furthermore, in the self-test circuit:
[0035] The third control module includes: a third transistor U3 and a second Zener diode ZD2; the first pin GATE of the third transistor U3 is connected to the third external signal CTR1_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the second Zener diode ZD2; the negative terminal of the second Zener diode ZD2 is connected to the fourth pin and the second pin of the third transistor U3 in sequence, and then connected to one end of the coil of the third relay TX2.
[0036] In the third relay module:
[0037] The other end of the coil of the third relay TX2 is connected to a +12V power supply;
[0038] The normally closed contacts 2 and 7 of the third relay TX2 are connected to the load, and the normally open contacts 4 and 5 are both connected to one end of the fifth resistor R5; the other end of the fifth resistor R5 is connected to one end of the first resistor R1 and then connected to the main control module through the self-test pin SIG1; the other end of the first resistor R1 is grounded; the common contacts 3 and 6 of the third relay TX2 are connected to the output pin PORT1; in the third relay TX2:
[0039] Common contact 3 and normally closed contact 2 form the fifth normally closed contact, and common contact 6 and normally closed contact 7 form the sixth normally closed contact;
[0040] Common contact 3 and normally open contact 4 form the fifth normally open contact, and common contact 6 and normally open contact 5 form the sixth normally open contact.
[0041] Furthermore, in the indicator light control module:
[0042] The first indicator control unit includes: a NAND gate U11A and a thirteenth chip U13; the first input terminal of the NAND gate U11A is connected to the first external signal CTR3, the second input terminal is connected to the second external signal CTR2_P1, and the output terminal is connected to the input terminal IN of the thirteenth chip U13; the output terminal OUT of the thirteenth chip U13 is connected to the power short-circuit function indicator circuit, and the ground terminal GED is grounded;
[0043] The second indicator control unit includes: a NAND gate U11B and a fourteenth chip U14; the first input terminal of the NAND gate U11B is connected to the fourth external signal *CTR3, the second input terminal is connected to the second external signal CTR2_P1, and the output terminal is connected to the input terminal IN of the fourteenth chip U14; the output terminal OUT of the fourteenth chip U14 is connected to the short-circuit to ground function indicator circuit, and the ground terminal GED is grounded.
[0044] Furthermore, the simulation device also includes:
[0045] The main control module, and the first and second microcontrollers connected to the main control module;
[0046] The main control module is used to control the first microcontroller to send a second external signal CTR2_P1 to the second control module in each test channel; it is also used to control the second microcontroller to send a third external signal CTR1_P1 to the third control module in each test channel.
[0047] Compared with the prior art, the present invention has at least the following beneficial effects:
[0048] (1) The simulation device described in this utility model includes: multiple test channels; each test channel corresponds one-to-one with the circuit under test; each test channel includes a first circuit and a second circuit and an output pin PORT1; wherein: the second control module is used to connect to the second external signal CTR2_P1; when the second external signal CTR2_P1 is high, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay connects to the positive power supply or ground signal output by the output terminal of the second control unit, and outputs to the corresponding circuit under test through the output pin PORT1; it can simultaneously handle the power supply short circuit and ground short circuit simulation test of multiple circuits under test, reducing manual intervention and test costs, and improving test speed and accuracy; this is not only applicable to the product development stage, but also applicable to mass production testing, greatly shortening the time to market for new products;
[0049] (2) This utility model utilizes a combination of a main control module, a microcontroller and a relay module to precisely control the state transition of each test channel (such as connecting to a positive power supply or ground signal), ensuring the consistency and repeatability of test conditions, thereby improving the reliability of test results.
[0050] (3) This utility model introduces a self-testing circuit, which can verify the status of the output pins without changing the external connection, ensuring the normal operation of the device itself, and also providing convenience for troubleshooting.
[0051] (4) This utility model displays the working status (power short circuit or ground short circuit) of each test channel in real time through the indicator light control module, so that the operator can intuitively understand the current test process, increasing the transparency of operation and user experience;
[0052] (5) Compared with traditional manual testing methods, the equipment of this application reduces the required human and material resources and lowers the procurement cost of professional testing instruments; in addition, since the testing process is more efficient and accurate, it indirectly reduces the risk of product rework or recall due to testing errors. Attached Figure Description
[0053] Figure 1 This is a circuit diagram of the first circuit in an embodiment of this utility model;
[0054] Figure 2 This is a circuit diagram of the second circuit and the self-test circuit in an embodiment of this utility model;
[0055] Figure 3 This is a circuit diagram of the first indicator light control unit in an embodiment of this utility model;
[0056] Figure 4 This is a circuit diagram of the second indicator light control unit in an embodiment of this utility model;
[0057] Figure 5 This is a circuit diagram of the power supply short-circuit function indicator circuit and the ground short-circuit function indicator circuit in the embodiments of this utility model;
[0058] Figure 6 This is a circuit diagram of the power supply circuit in an embodiment of this utility model;
[0059] Figure 7 This is a circuit diagram of the first microcontroller in an embodiment of this utility model;
[0060] Figure 8 This is a circuit diagram of the second microcontroller in an embodiment of this utility model;
[0061] Figure 9 This is a circuit diagram of the working status indicator light of the simulation device in this embodiment of the utility model;
[0062] Figure 10 This is a circuit diagram of the main control module in an embodiment of this utility model. Detailed Implementation
[0063] The following are specific embodiments of the present invention, which are described in conjunction with the accompanying drawings. However, the present invention is not limited to these embodiments.
[0064] To perform power supply or ground short-circuit tests on multiple circuits simultaneously using a single device, this invention proposes an automatic power supply and ground short-circuit simulation device for simulating power supply and ground short-circuit tests on multiple circuits under test. The simulation device includes multiple test channels, each corresponding to a circuit under test.
[0065] Each test channel includes:
[0066] The first circuit includes a first control module and a first relay module;
[0067] The first control module includes a first control unit and a second control unit; the first relay module includes the coil of the first relay TX33, and its corresponding first normally closed contact, second normally closed contact, first normally open contact and second normally open contact;
[0068] like Figure 1 As shown, in the first circuit:
[0069] The first control module includes an eighth zero transistor U80, a third Zener diode ZD33, and a seventh nine inverter U79A; wherein:
[0070] The first pin GATE of the eighth zero transistor U80 is connected to the input terminal of the seventh nine inverter U79A and then connected to the first external signal CTR3. The third pin SOURCE is grounded and simultaneously connected to the positive terminal of the third Zener diode ZD33. The negative terminal of the third Zener diode ZD33 is connected to the fourth pin and the second pin of the eighth zero transistor U80 in sequence and then connected to one end of the coil of the first relay TX33. The output terminal of the seventh nine inverter U79A is used to output the fourth external signal *CTR3 to the second indicator control unit.
[0071] In the first relay module:
[0072] The other end of the coil of the first relay TX33 is connected to a +12V power supply; normally open contacts 4 and 5 of the first relay TX33 are connected to the positive power supply, and normally closed contacts 2 and 7 of the first relay TX33 are connected to the ground signal POWER_GND; common contacts 3 and 6 of the first relay TX33 are connected to the second control unit; in the first relay TX33:
[0073] Common contact 3 and normally closed contact 2 form the first normally closed contact, and common contact 6 and normally closed contact 7 form the second normally closed contact;
[0074] Common contact 3 and normally open contact 4 form the first normally open contact, and common contact 6 and normally open contact 5 form the second normally open contact.
[0075] The second circuit includes a second control module and a second relay module; the second relay module includes: the coil of the second relay TX1, and its corresponding third normally closed contact, fourth normally closed contact, third normally open contact and fourth normally open contact;
[0076] like Figure 2 As shown, in the second circuit:
[0077] The second control module includes: a second transistor U2 and a first Zener diode ZD1; the first pin GATE of the second transistor U2 is connected to the second external signal CTR2_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the first Zener diode ZD1; the negative terminal of the first Zener diode ZD1 is connected to the fourth pin and the second pin of the second transistor U2 in sequence, and then connected to one end of the coil of the second relay TX1.
[0078] In the second relay module:
[0079] The other end of the coil of the second relay TX1 is connected to a +12V power supply;
[0080] The normally open contacts 4 and 5 of the second relay TX1 are connected to the output terminal SHOPT of the second control unit, and the common contacts 3 and 6 of the second relay TX1 are connected to the output pin PORT1; in the second relay TX1:
[0081] Common contact 3 and normally closed contact 2 form the third normally closed contact, and common contact 6 and normally closed contact 7 form the fourth normally closed contact;
[0082] Common contact 3 and normally open contact 4 form the third normally open contact, and common contact 6 and normally open contact 5 form the fourth normally open contact.
[0083] The simulation device also includes:
[0084] like Figure 10 The main control module shown, and the modules connected to the main control module as shown... Figure 7 The first microcontroller shown is as follows Figure 8 The second microcontroller shown;
[0085] It should be noted that the analog device of this utility model can simultaneously test 64 circuits under test, that is, the analog device of this utility model includes 64 test channels.
[0086] This embodiment Figure 7 It includes two first microcontrollers, where CTR2_P1 to CTR2_P16 are second external signals. However, this invention is not limited to two first microcontrollers. The specific number of first microcontrollers is set based on the number of test channels.
[0087] This embodiment Figure 8 It includes two second microcontrollers, where CTR1_P1 to CTR1_P16 are third external signals. However, this invention is not limited to two second microcontrollers. The specific number of second microcontrollers is set based on the number of test channels.
[0088] The main control module is used to control the first microcontroller to send a second external signal CTR2_P1 to the second control module in each test channel; it is also used to control the second microcontroller to send a third external signal CTR1_P1 to the third control module in each test channel.
[0089] Output pin PORT1; where:
[0090] The first control unit is used to receive the first external signal CTR3. When the first external signal CTR3 is high, the first control unit controls the coil of the first relay TX33 to be energized, and the first normally open contact and the second normally open contact close. At this time, the relay is connected to the positive power supply and outputs through the output terminal of the second control unit. When the first external signal CTR3 is low, the coil of the first relay TX33 is not energized, and the first normally closed contact and the second normally closed contact remain closed. At this time, the relay is connected to the ground signal and outputs through the output terminal of the second control unit.
[0091] The second control module is used to connect to the second external signal CTR2_P1. When the second external signal CTR2_P1 is high, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay is connected to the positive power supply or ground signal output by the output terminal of the second control unit, and outputs to the corresponding circuit under test through the output pin PORT1.
[0092] Each test channel also includes:
[0093] The self-test circuit includes a third control module and a third relay module; the third relay module includes the coil of the third relay TX2, and its corresponding fifth normally closed contact, sixth normally closed contact, fifth normally open contact and sixth normally open contact;
[0094] like Figure 2 As shown, in the self-test circuit:
[0095] The third control module includes: a third transistor U3 and a second Zener diode ZD2; the first pin GATE of the third transistor U3 is connected to the third external signal CTR1_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the second Zener diode ZD2; the negative terminal of the second Zener diode ZD2 is connected to the fourth pin and the second pin of the third transistor U3 in sequence, and then connected to one end of the coil of the third relay TX2.
[0096] In the third relay module:
[0097] The other end of the coil of the third relay TX2 is connected to a +12V power supply;
[0098] The normally closed contacts 2 and 7 of the third relay TX2 are connected to the load, and the normally open contacts 4 and 5 are both connected to one end of the fifth resistor R5; the other end of the fifth resistor R5 is connected to one end of the first resistor R1 and then connected to the main control module through the self-test pin SIG1; the other end of the first resistor R1 is grounded; the common contacts 3 and 6 of the third relay TX2 are connected to the output pin PORT1; in the third relay TX2:
[0099] Common contact 3 and normally closed contact 2 form the fifth normally closed contact, and common contact 6 and normally closed contact 7 form the sixth normally closed contact;
[0100] Common contact 3 and normally open contact 4 form the fifth normally open contact, and common contact 6 and normally open contact 5 form the sixth normally open contact.
[0101] The third control module is used to receive the third external signal CTR1_P1. When the third external signal CTR1_P1 is low, the fifth normally closed contact and the sixth normally closed contact remain closed. At this time, the output pin is connected to the load. When the third external signal CTR1_P1 is high, the third control module controls the coil of the third relay TX2 to be energized, and the fifth normally open contact and the sixth normally open contact close. At this time, the output pin switches from being connected to the load to being connected to the self-test pin SIG1.
[0102] The SIG1 pin is used to feed back the signal output by the output pin to the main control module.
[0103] This invention introduces a self-test circuit, which can verify the status of the output pins without changing the external connections, ensuring the normal operation of the device itself, and also providing convenience for troubleshooting.
[0104] For power supply short circuits and ground short circuits, based on Figure 1 and Figure 2 As shown, in detail:
[0105] For power supply short circuits, including:
[0106] 1. Set CTR3 signal to high level:
[0107] The main control module sends a high-level first external signal CTR3 to the first control unit of the first circuit;
[0108] After the GATE pin of the eighth zero transistor U80 in the first control unit receives the high-level signal of CTR3, U80 is turned on.
[0109] When U80 is turned on, the coil of the first relay TX33 is energized. The first normally open contact and the second normally open contact of the first relay TX33 are closed, which turns on SHORT and POWER, and POWER is connected to the +12V power supply.
[0110] 2. Set the CTR2_P1 signal to high level:
[0111] The main control module sends a high-level second external signal CTR2_P1 to the second control module of the second circuit through the first microcontroller.
[0112] After the GATE pin of the second transistor U2 in the second control module receives the high-level signal CTR2_P1, U2 is turned on.
[0113] When U2 is turned on, the coil of the second relay TX1 is energized, the third normally open contact and the fourth normally open contact are closed, and PORT1 and SHORT are turned on.
[0114] 3. Set the CTR1_P1 signal to low level:
[0115] The main control module sends a low-level third external signal CTR1_P1 to the third control module of the self-test circuit through the second microcontroller.
[0116] After the GATE pin of the third transistor U3 in the third control module receives the low-level signal CTR1_P1, U3 does not conduct.
[0117] U3 is not conducting, so the coil of the third relay TX2 is not energized. The fifth and sixth normally closed contacts remain closed, and LOAD1 and PORT1 are conducting. LOAD1 is +12V.
[0118] 4. Continue for 1 minute:
[0119] During this period, LOAD1 remains at +12V.
[0120] 5. Set the CTR2_P1 signal to low level:
[0121] The main control module sets CTR2_P1 to a low level through the first microcontroller, so the GATE pin of the second transistor U2 is no longer powered, and U2 is not turned on.
[0122] When the coil of the second relay TX1 is de-energized, the third and fourth normally open contacts open, PORT1 and SHORT disconnect, completing the power supply short-circuit test.
[0123] Short circuit to ground includes:
[0124] 1. Set CTR3 signal to low level:
[0125] The main control module sends a low-level first external signal CTR3 to the first control unit of the first circuit.
[0126] After the GATE pin of the eighth zero transistor U80 in the first control unit receives the low-level signal of CTR3, U80 does not conduct.
[0127] U80 is not conducting, so the coil of the first relay TX33 is not energized. The first normally closed contact and the second normally closed contact remain closed. SHORT and POWER_GND are conducting, and POWER_GND is grounded.
[0128] 2. Set the CTR2_P1 signal to high level:
[0129] The main control module sends a high-level second external signal CTR2_P1 to the second control module of the second circuit through the first microcontroller.
[0130] After the GATE pin of the second transistor U2 in the second control module receives the high-level signal CTR2_P1, U2 is turned on.
[0131] When U2 is turned on, the coil of the second relay TX1 is energized, the third normally open contact and the fourth normally open contact are closed, and PORT1 and SHORT are turned on.
[0132] 3. Set the CTR1_P1 signal to low level:
[0133] The main control module sends a low-level third external signal CTR1_P1 to the third control module of the self-test circuit through the second microcontroller.
[0134] After the GATE pin of the third transistor U3 in the third control module receives the low-level signal CTR1_P1, U3 does not conduct.
[0135] U3 is not conducting, so the coil of the third relay TX2 is not energized. The fifth and sixth normally closed contacts remain closed, and LOAD1 and PORT1 are conducting. LOAD1 is POWER_GND 0V.
[0136] 4. Continue for 1 minute:
[0137] During this period, LOAD1 remains at POWER_GND 0V.
[0138] 5. Set the CTR2_P1 signal to low level:
[0139] The main control module sets CTR2_P1 to a low level through the first microcontroller, so the GATE pin of the second transistor U2 is no longer powered, and U2 is not turned on.
[0140] When the coil of the second relay TX1 is de-energized, the third and fourth normally open contacts open, PORT1 and SHORT disconnect, completing the short-circuit test to ground.
[0141] Each test channel also includes: an indicator light control module;
[0142] The indicator light control module includes: such as Figure 5 The power supply short-circuit function indicator circuit and the ground short-circuit function indicator circuit are shown.
[0143] Figure 5The image shows 16 sets of indicator circuits, each corresponding to a test channel; these indicator circuits include power supply short-circuit function indicator circuits and ground short-circuit function indicator circuits; it should be noted that... Figure 5 Although 16 sets of indicator circuits are shown, the number of indicator circuits is not limited to these 16 sets. The specific number of indicator circuits is set based on the number of test channels. Among them, R1 and L1 represent one set of indicator circuits.
[0144] in:
[0145] The power supply short circuit indicator circuit, when illuminated, indicates that the corresponding test channel is currently in a power supply short circuit test state;
[0146] The short-circuit-to-ground indicator circuit, when illuminated, indicates that the corresponding test channel is currently in a short-circuit-to-ground test state;
[0147] In the indicator light control module:
[0148] like Figure 3 As shown, the first indicator control unit includes: a NAND gate U11A and a thirteenth chip U13; the first input terminal of the NAND gate U11A is connected to the first external signal CTR3, the second input terminal is connected to the second external signal CTR2_P1, and the output terminal is connected to the input terminal IN of the thirteenth chip U13; the output terminal OUT of the thirteenth chip U13 is connected to the power short-circuit function indicator circuit, and the ground terminal GED is grounded;
[0149] like Figure 4 As shown, the second indicator control unit includes: a NAND gate U11B and a fourteenth chip U14; the first input terminal of the NAND gate U11B is connected to the fourth external signal *CTR3, the second input terminal is connected to the second external signal CTR2_P1, and the output terminal is connected to the input terminal IN of the fourteenth chip U14; the output terminal OUT of the fourteenth chip U14 is connected to the short-circuit to ground function indicator circuit, and the ground terminal GED is grounded.
[0150] The first indicator control unit is used to receive the first external signal CTR3 and the second external signal CTR2_P1; and when both the first external signal CTR3 and the second external signal CTR2_P1 are at a high level, it outputs positive power to the power short circuit function indicator circuit to make the indicator light in the power short circuit function indicator circuit light up.
[0151] The second indicator control unit is used to receive the fourth external signal *CTR3 and the second external signal CTR2_P1; and when both the fourth external signal *CTR3 and the second external signal CTR2_P1 are at a high level, it outputs a positive power supply to the ground short-circuit function indicator circuit, causing the indicator light in the ground short-circuit function indicator circuit to light up; the fourth external signal *CTR3 is the level signal output by the first external signal CTR3 after passing through an inverter.
[0152] The simulation device in this embodiment also includes:
[0153] like Figure 6 The power supply circuit shown is used to provide positive power (+12V power) to the analog equipment and 5V power to the main control module, the first microcontroller and the second microcontroller.
[0154] like Figure 9 The circuit diagram shown is for the operating status indicator lights of the analog device, which are used to display the operating status of the analog device through indicator lights.
[0155] The simulation device described in this utility model includes: multiple test channels; each test channel corresponds one-to-one with the circuit under test; each test channel includes a first circuit, a second circuit, and an output pin PORT1; wherein: the second control module is used to connect to a second external signal CTR2_P1; when the second external signal CTR2_P1 is high, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact close. At this time, the relay connects to the positive power supply or ground signal output by the output terminal of the second control unit, and outputs to the corresponding circuit under test through the output pin PORT1; it can simultaneously handle power supply short circuit and ground short circuit simulation tests of multiple circuits under test, reducing manual intervention and testing costs, and improving testing speed and accuracy; this is not only applicable to the product development stage, but also to mass production testing, greatly shortening the time to market for new products.
[0156] This utility model embodiment also proposes an automatic simulation method for power supply and ground short circuits, including:
[0157] Automatic simulation of power supply short circuit:
[0158] The main control module sends a high-level first external signal CTR3 to the first control unit of the first circuit in each test channel;
[0159] After receiving the high-level first external signal CTR3, the first control unit controls the coil of the first relay TX33 to be energized, causing the first normally open contact of the first relay TX33 to close with the second normally open contact; at this time, the first relay TX33 is connected to the positive power supply and outputs through the output terminal of the second control unit;
[0160] The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first microcontroller;
[0161] After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, causing the third normally open contact and the fourth normally open contact to close. At this time, the second relay TX1 is connected to the positive power supply of the output terminal of the second control unit, and outputs positive power to the corresponding circuit under test through the output pin PORT1.
[0162] Simulation of automatic ground short circuit:
[0163] The main control module sends a low-level first external signal CTR3 to the first control unit of the first circuit in each test channel;
[0164] After the first control unit receives the low-level first external signal CTR3, the coil of the first relay TX33 is de-energized, and the first normally closed contact and the second normally closed contact of the first relay TX33 remain closed; at this time, the first relay TX33 is connected to the ground signal and output through the output terminal of the second control unit;
[0165] The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first microcontroller;
[0166] After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, causing the third normally open contact and the fourth normally open contact to close. At this time, the second relay TX1 is connected to the ground signal at the output terminal of the second control unit and outputs positive power to the corresponding circuit under test through the output pin PORT1.
[0167] The simulation method also includes level detection of the output pin:
[0168] When simulating automatic power supply short circuit or automatic ground short circuit, the main control module controls the second microcontroller to send a high-level third external signal CTR1_P1 to the third control module in each test channel. At this time, the coil of the third relay TX2 is energized, and the fifth normally open contact and the sixth normally open contact of the third relay TX2 are closed. The output pin is switched from being connected to the load to being connected to the self-test pin SIG1.
[0169] The main control module analyzes the level signal input to the SIG1 pin to determine whether the corresponding output pin is outputting normally. When simulating an automatic power supply short circuit, if the level signal input to the SIG1 pin is a positive power supply, the output is normal. When simulating an automatic ground short circuit, if the level signal input to the SIG1 pin is a ground signal, the output is normal.
[0170] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in this utility model embodiment are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.
[0171] Furthermore, in this utility model, the use of terms such as "first," "second," and "a" is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this utility model, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0172] In this utility model, unless otherwise explicitly specified and limited, the terms "connection," "fixing," etc., should be interpreted broadly. For example, "fixing" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.
[0173] Furthermore, the technical solutions of the various embodiments of this utility model can be combined with each other, but only if they are based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.
Claims
1. A device for automatically simulating short circuits to power supply and ground, characterized in that, Used to simulate power supply short circuit and ground short circuit tests on multiple circuits under test; The simulation device includes: multiple test channels; each test channel corresponds one-to-one with the circuit under test; each test channel includes: The first circuit includes a first control module and a first relay module; The first control module includes a first control unit and a second control unit; the first relay module includes the coil of the first relay TX33, and its corresponding first normally closed contact, second normally closed contact, first normally open contact and second normally open contact; The second circuit includes a second control module and a second relay module; the second relay module includes: the coil of the second relay TX1, and its corresponding third normally closed contact, fourth normally closed contact, third normally open contact and fourth normally open contact; Output pin PORT1; where: The first control unit is used to receive the first external signal CTR3. When the first external signal CTR3 is high, the first control unit controls the coil of the first relay TX33 to be energized, and the first normally open contact and the second normally open contact close. At this time, the relay is connected to the positive power supply and outputs through the output terminal of the second control unit. When the first external signal CTR3 is low, the coil of the first relay TX33 is not energized, and the first normally closed contact and the second normally closed contact remain closed. At this time, the relay is connected to the ground signal and outputs through the output terminal of the second control unit. The second control module is used to connect to the second external signal CTR2_P1. When the second external signal CTR2_P1 is high, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay is connected to the positive power supply or ground signal output by the output terminal of the second control unit, and outputs to the corresponding circuit under test through the output pin PORT1.
2. The automatic power supply and ground short-circuit simulation device according to claim 1, characterized in that, Each test channel also includes: The self-test circuit includes a third control module and a third relay module; the third relay module includes the coil of the third relay TX2, and its corresponding fifth normally closed contact, sixth normally closed contact, fifth normally open contact and sixth normally open contact; The third control module is used to receive the third external signal CTR1_P1. When the third external signal CTR1_P1 is low, the fifth normally closed contact and the sixth normally closed contact remain closed. At this time, the output pin is connected to the load. When the third external signal CTR1_P1 is high, the third control module controls the coil of the third relay TX2 to be energized, and the fifth normally open contact and the sixth normally open contact close. At this time, the output pin switches from being connected to the load to being connected to the self-test pin SIG1. The SIG1 pin is used to feed back the signal output by the output pin to the main control module.
3. The automatic power supply and ground short-circuit simulation device according to claim 2, characterized in that, Each test channel also includes an indicator light control module; The indicator light control module includes: The power supply short circuit indicator circuit is used to indicate that the corresponding test channel is currently in a power supply short circuit test state; The short-circuit-to-ground indicator circuit is used to indicate that the corresponding test channel is currently in a short-circuit-to-ground test state; The first indicator control unit is used to receive the first external signal CTR3 and the second external signal CTR2_P1; and when both the first external signal CTR3 and the second external signal CTR2_P1 are at a high level, it outputs positive power to the power short circuit function indicator circuit to make the indicator light in the power short circuit function indicator circuit light up. The second indicator control unit is used to receive the fourth external signal *CTR3 and the second external signal CTR2_P1; and when both the fourth external signal *CTR3 and the second external signal CTR2_P1 are at a high level, it outputs a positive power supply to the ground short-circuit function indicator circuit, causing the indicator light in the ground short-circuit function indicator circuit to light up; the fourth external signal *CTR3 is the level signal output by the first external signal CTR3 after passing through an inverter.
4. The automatic power supply and ground short-circuit simulation device according to claim 3, characterized in that, In the first circuit: The first control module includes an eighth zero transistor U80, a third Zener diode ZD33, and a seventh nine inverter U79A; wherein: The first pin GATE of the eighth zero transistor U80 is connected to the input terminal of the seventh nine inverter U79A and then connected to the first external signal CTR3. The third pin SOURCE is grounded and simultaneously connected to the positive terminal of the third Zener diode ZD33. The negative terminal of the third Zener diode ZD33 is connected to the fourth pin and the second pin of the eighth zero transistor U80 in sequence and then connected to one end of the coil of the first relay TX33. The output terminal of the seventh nine inverter U79A is used to output the fourth external signal *CTR3 to the second indicator control unit. In the first relay module: The other end of the coil of the first relay TX33 is connected to a +12V power supply; normally open contacts 4 and 5 of the first relay TX33 are connected to the positive power supply, and normally closed contacts 2 and 7 of the first relay TX33 are connected to the ground signal POWER_GND; common contacts 3 and 6 of the first relay TX33 are connected to the second control unit; in the first relay TX33: Common contact 3 and normally closed contact 2 form the first normally closed contact, and common contact 6 and normally closed contact 7 form the second normally closed contact; Common contact 3 and normally open contact 4 form the first normally open contact, and common contact 6 and normally open contact 5 form the second normally open contact.
5. The automatic power supply and ground short-circuit simulation device according to claim 4, characterized in that, In the second circuit: The second control module includes: a second transistor U2 and a first Zener diode ZD1; the first pin GATE of the second transistor U2 is connected to the second external signal CTR2_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the first Zener diode ZD1; the negative terminal of the first Zener diode ZD1 is connected to the fourth pin and the second pin of the second transistor U2 in sequence, and then connected to one end of the coil of the second relay TX1. In the second relay module: The other end of the coil of the second relay TX1 is connected to a +12V power supply; The normally open contacts 4 and 5 of the second relay TX1 are connected to the output terminal SHOPT of the second control unit, and the common contacts 3 and 6 of the second relay TX1 are connected to the output pin PORT1; in the second relay TX1: Common contact 3 and normally closed contact 2 form the third normally closed contact, and common contact 6 and normally closed contact 7 form the fourth normally closed contact; Common contact 3 and normally open contact 4 form the third normally open contact, and common contact 6 and normally open contact 5 form the fourth normally open contact.
6. The automatic power supply and ground short-circuit simulation device according to claim 5, characterized in that, In the self-test circuit: The third control module includes: a third transistor U3 and a second Zener diode ZD2; the first pin GATE of the third transistor U3 is connected to the third external signal CTR1_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the second Zener diode ZD2; the negative terminal of the second Zener diode ZD2 is connected to the fourth pin and the second pin of the third transistor U3 in sequence, and then connected to one end of the coil of the third relay TX2. In the third relay module: The other end of the coil of the third relay TX2 is connected to a +12V power supply; The normally closed contacts 2 and 7 of the third relay TX2 are connected to the load, and the normally open contacts 4 and 5 are both connected to one end of the fifth resistor R5; the other end of the fifth resistor R5 is connected to one end of the first resistor R1 and then connected to the main control module through the self-test pin SIG1; the other end of the first resistor R1 is grounded; the common contacts 3 and 6 of the third relay TX2 are connected to the output pin PORT1; in the third relay TX2: Common contact 3 and normally closed contact 2 form the fifth normally closed contact, and common contact 6 and normally closed contact 7 form the sixth normally closed contact; Common contact 3 and normally open contact 4 form the fifth normally open contact, and common contact 6 and normally open contact 5 form the sixth normally open contact.
7. The automatic power supply and ground short-circuit simulation device according to claim 6, characterized in that, In the indicator light control module: The first indicator control unit includes: a NAND gate U11A and a thirteenth chip U13; the first input terminal of the NAND gate U11A is connected to the first external signal CTR3, the second input terminal is connected to the second external signal CTR2_P1, and the output terminal is connected to the input terminal IN of the thirteenth chip U13; the output terminal OUT of the thirteenth chip U13 is connected to the power short-circuit function indicator circuit, and the ground terminal GED is grounded; The second indicator control unit includes: a NAND gate U11B and a fourteenth chip U14; the first input terminal of the NAND gate U11B is connected to the fourth external signal *CTR3, the second input terminal is connected to the second external signal CTR2_P1, and the output terminal is connected to the input terminal IN of the fourteenth chip U14; the output terminal OUT of the fourteenth chip U14 is connected to the short-circuit to ground function indicator circuit, and the ground terminal GED is grounded.
8. The automatic power supply and ground short-circuit simulation device according to claim 6, characterized in that, The simulation device also includes: The main control module, and the first and second microcontrollers connected to the main control module; The main control module is used to control the first microcontroller to send a second external signal CTR2_P1 to the second control module in each test channel; it is also used to control the second microcontroller to send a third external signal CTR1_P1 to the third control module in each test channel.