Testing device for high-load impact and surge pulse

Abstract

A testing device for high-load impact and surge pulse comprises a control box, a testing seat arranged on the control box and a testing plate clamped on the testing seat and used for installing an element to be tested. The test seat comprises a test seat body, a test cavity extending downwards from the top surface of the test seat body and a plurality of test probe assemblies arranged in the test cavity at intervals, each test probe assembly comprises two test probes oppositely arranged in the test cavity, and a plurality of conductive strip assemblies are arranged on the test plate at intervals. The plurality of conductive strip assemblies are in one-to-one correspondence with the plurality of test probe assemblies, each conductive strip assembly comprises a first conductive strip and a second conductive strip which are respectively opposite to the two test probes, and two ends of the test element are respectively connected with the first conductive strip and the second conductive strip; compared with an existing test mode, the test mode provided by the utility model has the advantages that the safety risk caused by an external lead is avoided, and meanwhile, the problem of low efficiency of the existing test mode is avoided; therefore, the test efficiency is improved, and the test safety can be ensured at the same time.

Description

TECHNICAL FIELD

[0001] The utility model belongs to the field of electronic component performance testing device, specifically relates to a kind of testing device for high load impact and surge pulse. BACKGROUND

[0002] With the high-speed development of electronic information technology, electronic components for surface mounting technology are used in large quantities in electronic complete machines, among which the demand for chip type film fixed resistors is the largest, accounting for more than 45% of the entire chip type component. The anti-pulse and anti-surge series is one of the most important chip type thick film fixed resistors, mainly used in important modules such as power supply, motor, engine and generator of various military and civilian equipment, playing an important role in current limiting, lightning protection and surge resistance to ensure the stable and safe operation of military equipment. Therefore, it is necessary to use anti-pulse and anti-surge chip type thick film fixed resistors in the corresponding circuit modules.

[0003] One of the most important performance indicators of anti-pulse and anti-surge chip type thick film fixed resistors is the surge pulse resistance performance of the resistor, which is the source of the resistor name, but there is no unified and convenient test platform at present. Basically, it can only be simply soldered on the board and then two leads are soldered, and each test either measures one and then re-solders one, or must repeatedly connect the leads, which is not safe and efficient; further improvement is needed. SUMMARY

[0004] The utility model aims at overcoming the shortcomings of prior art, and provides a kind of testing device for high load impact and surge pulse.

[0005] The utility model adopts the following technical scheme:

[0006] A testing device for high load impact and surge pulse, comprising a control box, a test seat arranged on the control box and a test plate for mounting a to-be-tested element clamped on the test seat, the test seat comprises a test seat body, a test cavity extending downward from the top surface of the test seat body and a plurality of test probe assemblies arranged at intervals in the test cavity, the test probe assembly comprises two test probes arranged oppositely in the test cavity, a plurality of conductive strip assemblies are arranged at intervals on the test plate, and the plurality of conductive strip assemblies are one-to-one opposite to the plurality of test probe assemblies, the conductive strip assembly comprises a first conductive strip and a second conductive strip opposite to the two test probes respectively, and the two ends of the to-be-tested element are connected to the first conductive strip and the second conductive strip respectively.

[0007] Further, the test probe comprises a probe body arranged in the test cavity and two contact sections arranged oppositely on the top of the probe body and contactable with the first conductive strip or the second conductive strip, and the test plate is clamped between the two contact sections, so that the two contact sections are contactable with the first conductive strip or the second conductive strip respectively.

[0008] Further, the first conductive strip comprises a first welding segment arranged on one side of the test board, and two first conductive segments arranged oppositely at lower ends of the first welding segment and connected with the two contact segments respectively.

[0009] Further, the second conductive strip comprises a second welding segment arranged on the same side of the first welding segment and located at an upper end of the first welding segment, two second conductive segments arranged on the other side of the test board and connected with the two contact segments oppositely respectively, and a connecting segment connected between the second welding segment and the two second conductive segments, and the two ends of the to-be-tested element are connected with the first welding segment and the second welding segment respectively.

[0010] Further, the connecting segment comprises two conductive holes arranged at intervals on the second welding segment and connected with the two second conductive segments respectively, and two conductive coatings arranged on inner walls of the conductive holes and connected with the second welding segment and the opposite second conductive segment respectively.

[0011] Further, the test cavity is formed with a mounting groove extending outward from an inner wall thereof for mounting the test probe, the probe body is fixed in the mounting groove, and the contact segment is located outside the mounting groove.

[0012] Further, the control box comprises a control box body, a controller arranged in the control box body, four wiring ports arranged at intervals on the control box body and connected with the controller, and an adjusting assembly arranged on the control box body and connected with the controller.

[0013] Further, the adjusting assembly comprises an adjusting knob arranged on the control box body and connected with the controller, and a plurality of indicating scales circumferentially distributed on the control box body and located outside a circumferential periphery of the adjusting knob, and the plurality of indicating scales are one-to-one opposite to the plurality of test probe assemblies, so as to test the plurality of to-be-tested elements on the test board one by one.

[0014] As can be seen from the above description of the utility model, compared with the prior art, the utility model has the beneficial effects that: by limiting the structure of the test device, the plurality of to-be-tested elements are welded on the test board, and then inserted into the test seat, so that the test of the to-be-tested elements can be started, compared with the existing test method, the safety risk caused by the external lead is avoided, and the problem of low efficiency of the existing test method is also avoided; the test efficiency is improved, and the safety of the test is also guaranteed; in addition, the application is not limited to testing the impulse resistance and the surge resistance, and the connected pulse generator can be replaced by a direct current power supply, that is, it can be used for overload test, and the application range is wide;

[0015] The overall test device can be flexibly adapted to various sizes of surge resistors, impulse resistors and resistors with high load demand that need to be tested, and the test is convenient and fast, and there is no need to worry about the safety problem caused by the test voltage exceeding the safe voltage. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 Structure diagram of control box Figure One ;

[0017] Figure 2 Structure diagram of control box Figure Two ;

[0018] Figure 3 Structure diagram of test seat

[0019] Figure 4 Structure diagram of test plate Figure One ;

[0020] Figure 5 Structure diagram of test plate Figure Two ;

[0021] In the figure, 1-control box, 2-test seat, 3-test plate, 4-first conductive strip, 5-second conductive strip, 6-component to be tested, 11-control box body, 12-wiring port, 13-adjustment assembly, 131-adjustment knob, 132-indication scale, 21-test seat body, 22-test cavity, 221-mounting groove, 23-test probe assembly, 24-test probe, 241-probe body, 242-contact section, 41-first welding section, 42-first conductive section, 51-second welding section, 52-second conductive section, 53-connection section, 531-conductive hole, 532-conductive coating. DETAILED DESCRIPTION

[0022] The utility model will be further described below through specific embodiments.

[0023] Referring to Figures 1 to 5 Fig. 1, a test device for high-load impact and surge pulse includes a control box 1, a test seat 2 arranged on the control box 1, and a test plate 3 arranged on the test seat 2 for mounting a component to be tested 6.

[0024] The test seat 2 includes a test seat body 21 arranged on the control box 1, a test cavity 22 extending downward from the top surface of the test seat body 21, and a plurality of test probe assemblies 23 arranged at intervals in the test cavity 22. Specifically, the test probe assembly 23 includes two test probes 24 arranged oppositely in the test cavity 22, and the test probe 24 includes a probe body 241 arranged in the test cavity 22 and two contact sections 242 arranged oppositely on the top of the probe body 241. Further, the test cavity 22 is formed with a mounting groove 221 extending outward from the inner wall thereof for mounting the test probe 24. The probe body 241 is fixed in the mounting groove 221, and the contact section 242 is located outside the mounting groove 221 and connected with the probe body 241.

[0025] The test plate 3 is clamped between the two contact sections 242 arranged oppositely, because the test probe 24 is made of metal material, so that it has a certain elasticity to clamp and fix the test plate 3 in the test seat 2; specifically, a plurality of conductive strip assemblies are arranged at intervals on the test plate 3, and the plurality of conductive strip assemblies are one-to-one opposite to the plurality of test probe assemblies 23, wherein the conductive strip assembly includes a first conductive strip 4 and a second conductive strip 5 respectively opposite to the two test probes 24; when the test plate 3 is clamped in the test cavity 22, the two test probes 24 arranged oppositely are respectively in contact with the first conductive strip 4 and the second conductive strip 5 to realize electrical connection.

[0026] The first conductive strip 4 includes a first welding section 41 arranged on one side of the test plate 3 and two first conductive sections 42 arranged oppositely at the lower end of the first welding section 41 and respectively connected with the two contact sections 242.

[0027] The second conductive strip 5 includes a second welding section 51 arranged on the upper end of the first welding section 41 on the same side as the first welding section 41, two second conductive sections 52 arranged on the other side of the test plate 3 and respectively connected with the two contact sections 242, and a connecting section 53 connected between the second welding section 51 and the two second conductive sections 52, and the two ends of the to-be-tested element 6 are respectively welded on the first welding section 41 and the second welding section 51 during testing; specifically, the connecting section 53 includes two conductive holes 531 arranged at intervals on the second welding section 51 and respectively connected with the two second conductive sections 52, and two conductive coatings 532 arranged on the inner walls of the conductive holes 531 to connect the second welding section 51 with the opposite second conductive sections 52, so as to ensure the electrical connection between the second welding section 51 and the two second conductive sections 52; in actual use, the number of conductive holes 531 can also be increased according to the use requirements to ensure the electrical connection between the second welding section 51 and the two second conductive sections 52.

[0028] The control box 1 comprises a control box body 11, a controller arranged in the control box body 11, four wire connection ports 12 arranged on the control box body 11 and connected with the controller, and an adjusting assembly 13 arranged on the control box body 11 and connected with the controller, specifically, the adjusting assembly 13 comprises an adjusting knob 131 arranged on the control box body 11 and connected with the controller and a plurality of indicating scales 132 circumferentially arranged on the control box body 11 and located outside the periphery of the adjusting knob 131, wherein the plurality of indicating scales 132 are in one-to-one correspondence with the plurality of test probe assemblies 23, so as to test the plurality of to-be-tested elements 6 on the test board 1 one by one; further, the four wire connection ports 12 are arranged in a matrix on the control box body 11; further, the controller can be a commonly used controller in an electronic component testing device, and no further description is made herein to the specific selection thereof; further, the control box body 11 adopts an insulating wooden structure, and the wires are protected inside, so as to avoid the safety risk caused by the exposure of the circuit wires; when in use, the test board 3 with the to-be-tested elements 6 of various sizes welded thereon is inserted into the test seat 2, the work station is safely switched through the adjusting knob 131, and then the test can be performed; the overall testing device can be flexibly adapted to various sizes of surge-resistant resistors, pulse-resistant resistors and resistors with various high-load requirements to be tested, and the test is convenient and fast, and no safety problem caused by the test voltage exceeding the safe voltage needs to be worried about.

[0029] The test process is specifically as follows:

[0030] Step one, the plurality of to-be-tested elements 6 are welded on the test board 3 one by one, so that the two ends of the to-be-tested elements 6 are connected with the opposite first welding section 41 and second welding section 51 respectively, then the test board 3 with the to-be-tested elements 6 welded thereon is inserted into the test seat 2 and clamped in the test cavity 22 under the action of the oppositely arranged test probe 24, at this time, the two contact sections 242 of the test probe 24 are in contact connection with the opposite first conductive section 42 or second conductive section 52 respectively;

[0031] Step two, the positive electrode of the pulse generator is connected to the lower left wire connection port, the negative electrode is connected to the lower right wire connection port, the positive electrode of the oscilloscope voltage probe is connected to the upper left wire connection port, and the negative electrode is connected to the upper right wire connection port;

[0032] Step three, the adjusting knob 131 is rotated to the corresponding indicating scale 132, the pulse generator is started, and the to-be-tested element 6 corresponding to the scale is tested; the above operation is repeated to test the plurality of to-be-tested elements 6 on the test board 3 one by one.

[0033] The above testing device can be used not only for the test of the surge-resistant and pulse-resistant chip resistors, but also for other chip resistors, which only need to select different testing instruments.

[0034] The application can start to test the to-be-tested element 6 by limiting the structure of the testing device, welding a plurality of to-be-tested elements 6 on the testing plate 3, and then inserting the testing plate 3 into the testing seat 2. Compared with the existing testing method, the safety risk caused by the external lead is avoided, and the problem of low efficiency of the existing testing method is avoided. The testing efficiency is improved, and the safety of the testing is also guaranteed. In addition, the application is not limited to testing the impulse resistance and the surge resistance. The connected pulse generator can be replaced by a direct current power supply, that is, the application can be used for overload testing, and the application range is wide.

[0035] The above is only a preferred embodiment of the application, and therefore cannot limit the range of the application. Equivalent changes and modifications made according to the application range and the content of the specification should still be within the scope of the application.

Claims

1. A test device for high load impact and surge pulses, characterized by: The utility model relates to a control box, test seat set on the control box and test board for installing the component to be tested clamped on the test seat, the test seat includes test seat body, test cavity extending downward from the top surface of test seat body and multiple test probe assemblies arranged in the test cavity, the test probe assembly includes two test probes arranged oppositely in the test cavity, multiple conductive strip assemblies are arranged on the test board, and the multiple conductive strip assemblies are one-to-one opposite to the multiple test probe assemblies, the conductive strip assembly includes first conductive strip and second conductive strip opposite to the two test probes respectively, and the two ends of the component to be tested are connected with the first conductive strip and the second conductive strip respectively.

2. A testing device for high load surge and impulse pulses as claimed in claim 1 wherein: The test probe includes probe body arranged in the test cavity and two contact sections arranged oppositely on the top of the probe body and connected with the first conductive strip or the second conductive strip, and the test board is clamped between the two contact sections, so that the two contact sections are connected with the first conductive strip or the second conductive strip respectively.

3. A test device for high load surge and impulse pulses as claimed in claim 2, wherein: The first conductive strip includes first welding section arranged on one side of the test board and two first conductive sections arranged oppositely at the lower end of the first welding section and connected with the two contact sections respectively.

4. A testing device for high load surge and impulse pulses as claimed in claim 3 wherein: The second conductive strip includes second welding section arranged on the upper end of the first welding section on the same side of the first welding section, two second conductive sections arranged on the other side of the test board and connected with the two contact sections oppositely and connecting section connected between the second welding section and the two second conductive sections, and the two ends of the component to be tested are connected with the first welding section and the second welding section respectively.

5. A testing device for high load surge and impulse pulses as claimed in claim 4, wherein: The connecting section includes two conductive holes arranged oppositely on the second welding section and connected with the two second conductive sections respectively and two conductive coatings arranged on the inner wall of the conductive hole and connected with the second welding section and the opposite second conductive section respectively.

6. A testing device for high load surge and impulse pulses as defined in claim 2, wherein: The test cavity is formed with mounting groove extending outward from the inner wall for mounting the test probe, the probe body is fixed in the mounting groove, and the contact section is located outside the mounting groove.

7. The testing device for high load surge and impulse pulses of claim 1, wherein: The control box includes control box body, controller arranged in the control box body, four wiring ports arranged oppositely on the control box body and connected with the controller and adjusting assembly arranged on the control box body and connected with the controller.

8. A testing device for high load surge and impulse pulses according to claim 7, characterized in that: The adjusting assembly includes adjusting knob arranged on the control box body and connected with the controller and multiple indicating scales circumferentially distributed on the control box body and located outside the circumferential of the adjusting knob, the multiple indicating scales are one-to-one opposite to the multiple test probe assemblies, and the multiple components to be tested on the test board are tested one by one.

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