Voltage aging performance index test clamp capable of adapting to capacitors of different specifications

Abstract

The utility model discloses a voltage aging performance index test fixture capable of adapting to capacitors of different specifications, which comprises a four-claw finger cylinder, a probe mounting plate, elastic telescopic probes and a limit plate, the four-claw finger cylinder is fixedly connected on a workbench, the upper end of each finger of the four-claw finger cylinder is fixedly connected with the elastic telescopic probe, and the limit plate is fixedly connected with the probe mounting plate. The limiting plate is fixedly connected to the workbench through a stand column, the middle of the upper end face of the limiting plate is provided with a limiting groove for containing a three-end capacitor, the four sides of the limiting groove are symmetrically provided with guide grooves for the elastic telescopic probes to penetrate through, and the limiting plate right opposite to the probe mounting plate is provided with receding holes. The limiting groove is of a groove structure defined by four symmetrical limiting blocks in four directions, and the position of each limiting block is adjusted through an adjusting strip-shaped hole and an adjusting screw. Limiting grooves of different sizes can be arranged, the three-terminal capacitor testing device is suitable for testing three-terminal capacitors of different sizes, the cost of testing equipment is reduced, and adjustment is convenient and fast.

Description

Technical Field

[0001] This utility model relates to a test fixture for voltage aging performance indicators of capacitors of different specifications, and belongs to the technical field of voltage aging test of three-terminal capacitors. Background Technology

[0002] The aging performance test of three-terminal capacitors usually requires placing them in an aging oven and baking them at a set temperature for a set time. Then, the three-terminal capacitors are connected to a capacitor voltage aging performance tester for aging performance testing. Three-terminal capacitors are surface-mount type, and the industry common method is to manually connect them to several terminals for measurement. This method is time-consuming and labor-intensive, difficult for one person to operate, and has poor test accuracy and reliability. If a test socket is used for testing, it is difficult to intuitively judge the reliability of electrical contact because the test contact points are located inside. Utility Model Content

[0003] The technical problem to be solved by this utility model is to provide a test fixture for voltage aging performance indicators of capacitors of different specifications. The measurement is time-saving and labor-saving, and can be operated by one person. The accuracy and stability of the test are greatly improved, and the reliability of electrical contact can be intuitively judged.

[0004] The technical solution adopted by this utility model is as follows: A test fixture for voltage aging performance indicators of capacitors of different specifications, including a four-claw finger cylinder, a probe mounting plate, elastic telescopic probes, and a limiting plate. The four-claw finger cylinder is fixedly connected to the workbench. The probe mounting plate is an inverted T-shaped plate structure. The upper end face of each finger of the four-claw finger cylinder is fixedly connected to the bottom plate of the probe mounting plate. Elastic telescopic probes are fixedly connected to the vertical plate of the probe mounting plate. The four elastic telescopic probes can contact the four end faces of the three-terminal capacitor. The limiting plate is fixedly connected to the workbench by a column, and a limiting groove for placing the three-terminal capacitor is provided in the middle of the upper end face. An avoidance hole is provided on the limiting plate opposite to the probe mounting plate. The avoidance hole can ensure the range of radial movement of the vertical plate of the probe mounting plate. The limiting groove adopts a groove structure formed by four symmetrical limiting blocks in four directions. Each limiting block is provided with two adjustment strip holes. After the adjustment screw passes through the adjustment strip holes, the limiting block is locked on the limiting plate. Each limiting block is provided with a guide groove through which the elastic telescopic probe passes.

[0005] Furthermore, a limiting groove is provided at the position of the limiting block corresponding to the aforementioned limiting plate. One end of the limiting groove is connected to the avoidance hole, and the other end extends to the center of the limiting plate.

[0006] Furthermore, the vertical plate of the probe mounting plate is one-third the length of the bottom plate of the probe mounting plate, and the vertical plate is arranged inside the bottom plate, with the upper surface of the bottom plate being lower than the bottom surface of the limiting plate.

[0007] Furthermore, the width of the aforementioned clearance hole is greater than the width of the probe mounting plate base.

[0008] Furthermore, the workbench is provided with a measured placement slot and a placement slot to be measured on the left and right sides, respectively. The height of the measured placement slot and the placement slot to be measured is similar to that of the limiting plate, and square frame holes are provided at the bottom.

[0009] Furthermore, the aforementioned four-claw finger cylinder is connected to a foot-operated pneumatic switch.

[0010] Furthermore, the base plate of the aforementioned probe mounting plate is provided with two symmetrical strip-shaped through holes, and two screws are used to pass through the strip-shaped through holes to fix the probe mounting plate to the fingers of the four-claw finger cylinder.

[0011] The beneficial effects of this utility model are as follows: Compared with the prior art, this utility model sets four limiting blocks on the limiting plate to form a limiting groove for placing a three-terminal capacitor, and sets an adjustment strip-shaped through hole to arrange limiting grooves of different sizes, thereby accommodating the testing of three-terminal capacitors of different sizes as much as possible, reducing the cost of testing equipment, and making adjustment convenient and quick; the elastic telescopic probe contacts the electrodes of the three-terminal capacitor from four sides, which allows for a direct view of the reliability of the contact between the probe and the capacitor; the use of a performance index testing fixture to fix the three-terminal capacitor and connect it to the performance index tester for testing greatly improves the accuracy and reliability of the test, saves time and effort, and greatly reduces labor intensity and labor. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the modules of a three-terminal capacitor voltage aging test system;

[0013] Figure 2 This is a schematic diagram of the front cross-sectional structure of the performance testing fixture;

[0014] Figure 3 This is a top view of the performance testing fixture.

[0015] Figure 4 This is a top view of the structure at the limiting plate.

[0016] Figure 5 This is a top view of the limiting plate structure (excluding the probes at two locations).

[0017] Figure 6 This is a side view of the baking module.

[0018] Figure 7 This is a front view structural diagram of the baking module;

[0019] Figure 8 This is a schematic diagram of the installation structure of the circuit board and base of the baking module;

[0020] Figure 9This is a schematic diagram of a three-terminal capacitor viewed from below. Detailed Implementation

[0021] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0022] Example 1: As Figure 2-5As shown, a test fixture for voltage aging performance of capacitors of different specifications includes a four-claw finger cylinder 201, a probe mounting plate 202, elastic telescopic probes 203, and a limiting plate 204. The four-claw finger cylinder 201 is fixedly connected to the workbench 206. The probe mounting plate 202 has an inverted T-shaped plate structure. The upper end face of each finger 205 of the four-claw finger cylinder 201 is fixedly connected to the base plate of the probe mounting plate 202. Elastic telescopic probes 203 are fixedly connected to the vertical plate of the probe mounting plate 202. The four elastic telescopic probes 203 can contact the four test pins of the three-terminal capacitor 103. The limiting plate 204 is fixedly connected to the workbench 206 via a column 207. The upper end face of the plate 202 has a limiting groove 208 for placing a three-terminal capacitor 103 in the middle. The limiting groove 208 has guide grooves 209 symmetrically arranged on its four sides for the elastic telescopic probes 203 to pass through. The limiting plate 204 opposite the probe mounting plate 202 has clearance holes 210 to ensure the radial movement range of the vertical plate of the probe mounting plate 202. Four elastic telescopic probes 203 are connected to a capacitor aging performance tester for the three-terminal capacitor. The limiting groove 208 is formed by four symmetrical limiting blocks 219 in four directions. Each limiting block 219 has two adjustment slots 218. Adjusting screws 217 are used to pass through the adjustment slots 218 to adjust the limiting groove. Position blocks 219 are locked onto limiting plates 204. Each limiting block 219 has a guide groove 209 through which elastic telescopic probes 203 pass. This invention features four limiting blocks forming a limiting groove for placing a three-terminal capacitor on the limiting plate, and includes adjustable strip-shaped through holes to accommodate different sized limiting grooves. This allows for testing of as many three-terminal capacitors as possible, reducing the cost of the testing equipment and providing convenient and quick adjustment. In use, the baked three-terminal capacitor to be tested is held in the limiting groove using tweezers. The four-claw finger cylinder is activated, and the four elastic telescopic probes, driven inward by the four fingers, contact the four electrodes of the three-terminal capacitor, enabling... The test fixture with this structure secures the three-terminal capacitor electrodes and facilitates inspection of contact reliability. The elastic structure also protects the electrodes from damage caused by excessive force. This design allows for the fixing of the three-terminal capacitor in the test fixture and its connection to the performance testing instrument, significantly improving test accuracy and reliability. The test is time-saving and labor-saving, greatly reducing labor intensity and workload. The vertical plate of the probe mounting plate 202 has a length one-third that of the base plate, and the vertical plate is positioned inside the base plate. The upper surface of the base plate is lower than the bottom surface of the limiting plate 204. This structure facilitates the vertical plate's movement around the clearance hole, and the clearance hole width is greater than the base plate width, making it convenient to adjust the position of the probe mounting plate 202.

[0023] In order to meet the testing needs of as many three-terminal capacitor models as possible, a limiting groove 220 is provided at the position of the limiting block 219 corresponding to the limiting plate 204. One end of the limiting groove 220 is connected to the clearance hole 210, and the other end extends to the center of the limiting plate 204.

[0024] To facilitate the handling and placement of the three-terminal capacitor under test, the workbench 206 is provided with a tested placement slot 211 and a test placement slot 212 on the left and right sides, respectively. The height of the tested placement slot 211 and the test placement slot 212 is similar to that of the limiting plate 204, and a square frame hole 213 is provided at the bottom of each slot. During testing, the baked three-terminal capacitor is placed in the test placement slot 212 on the right side, and tweezers are used to hold the three-terminal capacitor and place it into the limiting slot. After the test is completed, the three-terminal capacitor is held in place with tweezers.

[0025] To facilitate the start-up control of the four-claw finger cylinder, the four-claw finger cylinder 201 is connected to a foot pedal pneumatic switch 214 via an air supply pipe. Stepping on the foot pedal pneumatic switch makes operation convenient, time-saving, and labor-saving. The foot pedal pneumatic switch is connected to the air source. Stepping on the foot pedal pneumatic switch starts the four fingers of the four-claw finger cylinder to move radially and synchronously, so that the elastic telescopic probes contact the four end electrodes of the three-terminal capacitor. Releasing the foot pedal pneumatic switch causes the four fingers of the four-claw finger cylinder to drive the four elastic telescopic probes away from the three-terminal capacitor, completing the test.

[0026] To enable radial position adjustment of the probe mounting plate 202 and facilitate rapid position adjustment for different test devices placed on different limiting plates, the base plate of the probe mounting plate 202 has two symmetrical strip-shaped through holes 216. Two screws 215 are used to pass through the strip-shaped through holes 216 to fix the elastic telescopic probe mounting plate 202 to the fingers of the four-claw finger cylinder 201. Loosening the screws, adjusting to the appropriate position, and then tightening the screws completes the radial adjustment.

[0027] Example 2: As Figure 1-9 As shown, a three-terminal capacitor voltage aging test system includes a baking module and a performance testing module. The baking module is used to heat and age the three-terminal capacitor for a set time, and the performance testing module is used to test the capacitor aging performance indicators after baking. The performance testing module uses a performance testing fixture to clamp and fix the three-terminal capacitor. By aging and baking the three-terminal capacitor through the baking module, and then fixing it with the performance indicator testing fixture and connecting it to the performance indicator tester for testing, the accuracy and reliability of the test are greatly improved, and the test is time-saving and labor-saving, greatly reducing labor intensity and labor force.

[0028] The performance testing fixture includes a four-claw finger cylinder 201, a probe mounting plate 202, elastic telescopic probes 203, and a limiting plate 204. The four-claw finger cylinder 201 is fixedly connected to the workbench 206. The probe mounting plate 202 has an inverted T-shaped plate structure. The upper end face of each finger 205 of the four-claw finger cylinder 201 is fixedly connected to the bottom plate of the probe mounting plate 202. Elastic telescopic probes 203 are fixedly connected to the vertical plate of the probe mounting plate 202. The four elastic telescopic probes 203 can contact the four test pins of the three-terminal capacitor 103. The limiting plate 204 is fixedly connected to the workbench 206 by a column 207, and a limiting groove 208 for placing the three-terminal capacitor 103 is provided in the middle of the upper end face. The limiting groove 208 has guide grooves 209 symmetrically arranged on the four sides for the elastic telescopic probes 203 to pass through. The probe mounting plate 202 faces the... The limiting plate 204 is provided with a clearance hole 210, which can ensure the range of radial movement of the vertical plate of the probe mounting plate 202. Four elastic telescopic probes 203 are connected to the capacitor aging performance index tester of the three-terminal capacitor. In use, the baked three-terminal capacitor to be tested is held in the limiting groove with tweezers. The four-claw finger cylinder is activated. Under the inward driving action of the four fingers, the four elastic telescopic probes contact the four electrodes of the three-terminal capacitor, which can achieve reliable electrical contact and facilitate the inspection of contact reliability. The elastic structure can also protect the electrodes of the three-terminal capacitor and avoid damage caused by excessive force. The test fixture with this structure fixes the three-terminal capacitor and connects it to the performance index tester for testing, which greatly improves the accuracy and reliability of the test, saves time and effort, and greatly reduces labor intensity and labor.

[0029] To facilitate the handling and placement of the three-terminal capacitor under test, the workbench 206 is provided with a tested placement slot 211 and a test placement slot 212 on the left and right sides, respectively. The height of the tested placement slot 211 and the test placement slot 212 is similar to that of the limiting plate 204, and a square frame hole 213 is provided at the bottom of each slot. During testing, the baked three-terminal capacitor is placed in the test placement slot 212 on the right side, and tweezers are used to hold the three-terminal capacitor and place it into the limiting slot. After the test is completed, the three-terminal capacitor is held in place with tweezers.

[0030] To facilitate the start-up control of the four-claw finger cylinder, the four-claw finger cylinder 201 is connected to a foot pedal pneumatic switch 214 via an air supply pipe. Stepping on the foot pedal pneumatic switch makes operation convenient, time-saving, and labor-saving. The foot pedal pneumatic switch is connected to the air source. Stepping on the foot pedal pneumatic switch starts the four fingers of the four-claw finger cylinder to move radially and synchronously, so that the elastic telescopic probes contact the four end electrodes of the three-terminal capacitor. Releasing the foot pedal pneumatic switch causes the four fingers of the four-claw finger cylinder to drive the four elastic telescopic probes away from the three-terminal capacitor, completing the test.

[0031] To enable radial position adjustment of the probe mounting plate 202 and facilitate rapid position adjustment for placing different test devices on different limit plates, the base plate of the probe mounting plate 202 is provided with two symmetrical strip-shaped through holes 216. Two screws 215 are used to pass through the strip-shaped through holes 216 to fix the elastic telescopic probe mounting plate 202 to the fingers of the four-claw finger cylinder 201. Loosening the screws, adjusting to the appropriate position, and then tightening the screws completes the rapid adjustment of the radial position. The adjustment is convenient and quick, and can adapt to the usage requirements of different products after adjustment.

[0032] The baking module includes a circuit board 101 and a baking test stand 102. Multiple baking test stands 102 are mounted on the circuit board 101. The top surface of each baking test stand 102 has multiple slots 105 for placing three-terminal capacitors 103. These slots 105 are connected in parallel to the positive and negative terminals of a power supply. Each slot 105 is connected in series with a current-limiting resistor 106 and an indicator light 107. The current-limiting resistor 106 and the indicator light 107 are mounted on the circuit board 101 next to the slot 105. The circuit board 101 is placed inside the oven 112. Each slot uses a single circuit to ensure accurate inspection voltage. An indicator light is added to each slot; when the product has good contact, the light illuminates; when the light goes out, a short circuit is detected. This enables visual inspection and inspection of the baking process, improving inspection accuracy and efficiency. It solves problems such as incomplete product aging, defective products flowing to customers, and the inability to inspect the aging process. Furthermore, to extend the lifespan of the indicator lights, a current-limiting resistor is added before each indicator light to prevent excessive current from burning it out.

[0033] To facilitate feeding into the oven for baking, the positive and negative terminals are connected to two conductive pins 104 respectively. The two conductive pins 104 are located on the rear side of the base 108. The circuit board 101 is fixedly connected to the base 108. The base 108 rests in the slot 109 on the oven 112. The slot 109 has multiple layers. Each layer of slot 109 has a socket 110 on the rear wall panel of the oven 112. The two holes on the socket 110 are connected to the two conductive pins 104. After this structure is pushed into the oven slot, the positive and negative terminals of the socket are automatically connected, reducing cable routing. The base provides support, resulting in better stability and preventing the circuit board from being affected.

[0034] To improve support stability and facilitate use in the oven, the base 108 includes side seats 801 and a base plate 802. Two side seats 801 are used, which are fixedly connected to the front and rear ends of the base plate 802 respectively. The circuit board 101 is fixedly connected to the top of the two side seats 801. Multiple support columns 803 are arranged between the two side seats 801. The two ends of the support columns 803 are fixedly connected to the base plate 802 and the circuit board 101 respectively. This structure provides stable and reliable support. The side seats 801 have a convex structure. The two side seats are arranged opposite each other on their convex sides. The base plate and the circuit board are both arranged on the steps formed by the opposite arrangement. This structure has better stability.

[0035] To facilitate pulling out of the oven, a handle 804 is provided on the front end face of the side seat 801.

[0036] To ensure reliable conductive connections, the bottom of the placement slot 105 is equipped with pads for connecting the positive and negative terminals of the three-terminal capacitor, and two symmetrical elastic plates are provided on the side, which can hold the three-terminal capacitor in place.

[0037] The test method of the three-terminal capacitor voltage aging test system includes the following steps:

[0038] 1) Place the three-terminal capacitor to be tested into the placement slot;

[0039] 2) Insert the base into the oven and connect the conductive pin to the socket;

[0040] 3) Set the oven temperature, start the oven, and once it reaches the aging test temperature range, turn on the power supply.

[0041] 4) When the set baking time is reached, observe whether the indicator light is on. If the indicator light is off, it is determined that the three-terminal capacitor corresponding to the indicator light is short-circuited.

[0042] 5) After removing the three-terminal capacitor with the indicator light showing normal operation, place it in the limiting groove, start the four-claw finger cylinder, drive the elastic telescopic probe to contact the four side pads of the three-terminal capacitor, connect to the capacitor aging performance index tester, and perform aging performance index test on the baked three-terminal capacitor.

[0043] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the protection scope of the claims.

Claims

1. A test fixture for voltage aging performance indicators of capacitors of different specifications, characterized in that, The device includes a four-claw finger cylinder (201), a probe mounting plate (202), elastic telescopic probes (203), and a limiting plate (204). The four-claw finger cylinder (201) is fixedly connected to the worktable (206). The probe mounting plate (202) has an inverted T-shaped plate structure. The upper end face of each finger (205) of the four-claw finger cylinder (201) is fixedly connected to the bottom plate of the probe mounting plate (202). Elastic telescopic probes (203) are fixedly connected to the vertical plate of the probe mounting plate (202). The four elastic telescopic probes (203) can contact the four-terminal pin end faces of the three-terminal capacitor (103). The limiting plate (204) is fixedly connected to the worktable (206) through a column (207), and the upper end... A limiting groove (208) for placing a three-terminal capacitor (103) is provided in the middle of the surface. A clearance hole (210) is provided on the limiting plate (204) directly opposite the probe mounting plate (202). The clearance hole (210) can ensure the range of radial movement of the vertical plate of the probe mounting plate (202). The limiting groove (208) is formed by four symmetrical limiting blocks (219) in four directions. Each limiting block (219) is provided with two adjustment strip holes (218). After the adjustment screw (217) passes through the adjustment strip hole (218), the limiting block (219) is locked on the limiting plate (204). Each limiting block (219) is provided with a guide groove (209) through which the elastic telescopic probe (203) passes.

2. The voltage aging performance test fixture for capacitors of different specifications according to claim 1, characterized in that, A limiting groove (220) is provided at the position of the limiting block (219) corresponding to the limiting plate (204). One end of the length of the limiting groove (220) is connected to the clearance hole (210), and the other end extends to the center of the limiting plate (204).

3. The voltage aging performance test fixture for capacitors of different specifications according to claim 1, characterized in that, The vertical plate of the probe mounting plate (202) is one-third the length of the bottom plate of the probe mounting plate (202) and the vertical plate is arranged inside the bottom plate. The upper surface of the bottom plate is lower than the bottom surface of the limiting plate (204).

4. A test fixture for voltage aging performance indicators of capacitors of different specifications as described in claim 3, characterized in that, The width of the clearance hole (210) is greater than the width of the base plate of the probe mounting plate (202).

5. A test fixture for voltage aging performance indicators of capacitors of different specifications as described in claim 1, characterized in that, The workbench (206) has a measured placement slot (211) and a placement slot to be measured (212) on the left and right sides respectively. The height of the measured placement slot (211) and the placement slot to be measured (212) is similar to that of the limiting plate (204), and a square frame hole (213) is provided at the bottom.

6. A test fixture for voltage aging performance indicators of capacitors of different specifications according to claim 1, characterized in that, The four-claw finger cylinder (201) is connected to a foot pedal pneumatic switch (214).

7. A test fixture for voltage aging performance indicators of capacitors of different specifications as described in claim 1, characterized in that, The base plate of the probe mounting plate (202) is provided with two symmetrical strip-shaped through holes (216). Two screws (215) are used to pass through the strip-shaped through holes (216) to fix the probe mounting plate (202) to the fingers of the four-claw finger cylinder (201).

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