Probe device

Abstract

The utility model provides a probe device, and relates to the technical field of laser cutting. The probe device comprises a substrate, a probe mechanism and a measuring assembly, a shell assembly in the probe mechanism is fixedly arranged on the substrate, a probe body is movably arranged in the shell assembly in the vertical direction, in the detection state, the probe body can stretch out of the shell assembly through a first through hole, and a position adjusting assembly and the probe assembly are correspondingly arranged; the measuring assembly comprises an infrared geminate transistor, the infrared geminate transistor and the probe mechanism are correspondingly arranged on the substrate, and the infrared geminate transistor is in induction fit with the detection auxiliary bulge in the probe assembly so as to detect the relative position of the target object; when the probe body makes contact with the target object, the probe body moves upwards, the detection auxiliary protrusion is made to be matched with the infrared geminate transistors to sense the position of the target object, and after detection is completed, the position adjusting assembly can drive the probe body to restore to the detection state. The probe device is simple in structure, and the production cost and the use cost can be reduced.

Description

TECHNICAL FIELD

[0001] The utility model relates to laser cutting technical field especially relates to a probe device. BACKGROUND

[0002] Laser cutting technology can reduce processing time and processing cost, and the precision of laser cutting technology is high, and the cutting surface is smooth without burr, so laser cutting technology is widely used in the cutting field. The existing laser cutting machine confirms the distance between the laser cutting head and the target object through the probe mechanism before cutting, but the existing probe mechanism is not only complex in structure and control system, but also high in production cost. Moreover, the existing probe mechanism needs to be frequently calibrated by the operator during the measurement process, which is tedious to operate, resulting in increased use cost. UTILITY MODEL CONTENT

[0003] The utility model aims at providing a kind of probe device, the probe device simple structure can reduce production cost and use cost.

[0004] To achieve this purpose, the utility model adopts the following technical solutions:

[0005] Probe device, applied to laser cutting machine, for detecting the position of target object, comprising:

[0006] Base plate, fixedly arranged on the laser cutting machine;

[0007] Probe mechanism, including shell assembly, probe assembly and position adjustment assembly, the shell assembly is fixedly arranged on the base plate, the probe body in the probe assembly is movably arranged in the shell assembly along the up-down direction, and in detection state, the lower end of the probe assembly can be extended outside the shell assembly through the first through hole in the shell assembly, and the position adjustment assembly is arranged corresponding to the shell assembly;

[0008] Measurement assembly, including infrared pair tube, the infrared pair tube is arranged corresponding to the probe mechanism on the base plate, and is inductively matched with the detection auxiliary protrusion in the probe assembly to detect the relative position of the target object;

[0009] When the probe body contacts the target object, the probe body moves upward, so that the detection auxiliary protrusion cooperates with the infrared pair tube to induct the position of the target object, and after detection, the position adjustment assembly can drive the probe assembly to return to the detection state.

[0010] As a further technical solution, the measurement assembly further includes a distance sensor, which is arranged corresponding to the probe body on the base plate or the shell assembly, and the distance sensor is used to induct the moving distance of the probe body relative to the shell assembly.

[0011] As a further technical solution, the position adjusting assembly comprises a first magnet and a second magnet, the probe assembly further comprises a probe slider, the probe slider is movably arranged in the shell assembly in the up-down direction, and the probe body and the detection auxiliary protrusion are fixedly arranged on the probe slider.

[0012] The first magnet is fixedly arranged on the shell assembly and arranged close to the first through hole, and the second magnet is fixedly arranged on the probe slider. After detection is completed, the first magnet and the second magnet are magnetically matched to make the probe body return to the detection state.

[0013] As a further technical solution, the position adjusting assembly further comprises a third magnet, the third magnet is arranged on the shell assembly corresponding to the first magnet, and the third magnet is arranged directly above the first magnet. After detection is completed, the third magnet and the second magnet are magnetically matched, so that the probe body can be gathered in the shell assembly.

[0014] As a further technical solution, the first magnet and the third magnet are embedded in the rear wall of the shell body of the shell assembly, and the second magnet is embedded in the side wall of the probe slider close to the first magnet.

[0015] As a further technical solution, the shell assembly further comprises a cover, the cover is arranged on the opening end of the shell body, the probe body and the probe slider are arranged in the shell body, the detection auxiliary protrusion extends out of the shell body through the second through hole on the rear wall, and is inductively matched with the infrared pair tube.

[0016] As a further technical solution, the shell body is provided with a guide through slot extending in the up-down direction, and the probe slider is provided with a guide protrusion, the guide protrusion is slidably connected to the guide through slot.

[0017] As a further technical solution, the first side wall of the shell body is provided with a avoiding hole, the avoiding hole is arranged opposite to the first through hole, and the upper end of the probe body can extend above the shell body through the avoiding hole.

[0018] As a further technical solution, the position adjusting assembly comprises a tension spring, the tension spring is sleeved on the probe body, one end of the tension spring is fixedly connected to the middle part of the probe body, and the other end is fixedly connected to the second side wall of the shell body. After detection is completed, the tension spring is retracted to make the probe body return to the detection state.

[0019] As a further technical scheme, the position adjusting assembly further comprises a convergence auxiliary cylinder, which is arranged on the first side wall of the shell body opposite to the first through hole;

[0020] The side wall of the convergence auxiliary cylinder is provided with a clamping interface, and the upper end of the probe body is provided with an elastic clamping piece, which can be clamped in the clamping interface, so that the probe body can be converged in the shell assembly.

[0021] Compared with the prior art, the probe device provided by the utility model has the following technical advantages:

[0022] Since the substrate is fixedly arranged on the laser cutting machine, the shell assembly in the probe mechanism is fixedly connected to the substrate, the probe body in the probe assembly is movably arranged in the shell assembly in the up-down direction and can be extended out of the shell assembly, the detection auxiliary protrusion in the probe mechanism is inductively matched with the infrared pair tube, and the position adjusting assembly can drive the probe body to return to the detection state. Therefore, when detecting the position of the target object, the laser cutting machine drives the substrate to move downward, so that the shell assembly and the probe assembly move downward, until the lower end of the probe body contacts the target object; then, with the downward movement of the substrate and the shell assembly, the probe assembly moves upward relative to the shell assembly, in this process, the detection auxiliary protrusion is in signal communication with the infrared pair tube, and the position of the target object is grasped according to the communication state of the detection auxiliary protrusion and the infrared pair tube; then, the position adjusting assembly can drive the probe body to move, so that the lower end of the probe body extends out of the shell assembly, so that the probe body returns to the detection state, so as to facilitate the next position measurement; therefore, the process of calibrating the probe assembly by the operator can be removed, the position detection effect of the target object is ensured, and the use cost is reduced. At the same time, the probe device only comprises the substrate, the probe mechanism and the infrared pair tube, the mechanical structure is simple, and the position of the target object can be sensed through the inductive matching of the detection auxiliary protrusion and the infrared pair tube, so that the detection system is simple, and the production cost is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the utility model, the following will briefly introduce the drawings needed to be used in the description of the embodiments of the utility model. Obviously, the drawings in the following description are only some embodiments of the utility model, and for those skilled in the art, other drawings can also be obtained according to the contents of the embodiments of the utility model and these drawings without creating laboriously.

[0024] Figure 1 It is the exploded view of the first embodiment of the probe device provided by the utility model embodiment;

[0025] Figure 2 It is the structural schematic view of the shell body of the probe device provided by the utility model embodiment.

[0026] Figure 3 Figure 2 is a partial structure schematic view of a second embodiment of the probe device provided by the embodiments of the present application.

[0027] In the drawings:

[0028] 100, substrate;

[0029] 200, probe mechanism; 211, shell body; 2111, rear wall; 2112, first side wall; 2113, second side wall; 2101, first through hole; 2102, second through hole; 2103, guide through slot; 2104, avoiding hole; 220, probe assembly; 221, probe body; 2211, elastic clamping piece; 2212, auxiliary connecting table; 222, detection auxiliary protrusion; 223, probe sliding block; 2231, guide protrusion; 230, position adjustment assembly; 231, first magnet; 232, second magnet; 233, third magnet; 234, tension spring; 235, collection auxiliary cylinder; 2351, clamping port;

[0030] 310, infrared pair tube. DETAILED DESCRIPTION

[0031] Before any embodiments of this application are explained in detail, it is to be understood that the application is not limited in its application to the details of construction and the arrangement of components set forth in the following description or illustrated in the above-described accompanying drawings.

[0032] In this application, the terms "including", "containing", "having" or any other similar words are intended to cover a non-exclusive inclusion, so that a process, method, article or device including a series of elements does not only include those elements, but also includes other elements not explicitly listed, or further includes elements inherent to such a process, method, article or device. Without more limitations, the element defined by the statement "including a" does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0033] In this application, the term "and / or", is a description of the association relationship between the associated objects, which means that there can be three kinds of relationships. For example, A and / or B, can represent: A exists alone, A and B exist together, B exists alone, these three cases. In addition, the character " / " in the present application generally represents that the front and rear associated objects are a "and / or" relationship.

[0034] In this application, the terms "connect," "couple," "coupled," "mount," and "mounting" can be direct or indirect, and can include mechanical, electrical, and / or logical connectivity. In addition, "connect" and "coupled" are not restricted to physical or mechanical connections or couplings, and can include electrical connectivity or couplings.

[0035] In this application, those of ordinary skill in the art will appreciate that the use of relative terms (e.g., "about," "approximately," "substantially," etc.) in connection with a quantity or condition will be understood to include the stated value and possess the meaning indicated by the context. For example, the relative terms include at least the degree of error associated with measuring the particular quantity by the particular measuring instrument, tolerance, etc. associated with the particular value. Such terms are also to be construed to disclose a range defined by the two endpoints. The relative terms can refer to a percentage (e.g., 1%, 5%, 10% or more) of the indicated value plus or minus. Values stated without the use of relative terms should also be disclosed as specific values with tolerances. In addition, "substantially" when used in expressing relative angular positional relationships (e.g., substantially parallel, substantially perpendicular) can refer to plus or minus a number of degrees (e.g., 1 degree, 5 degrees, 10 degrees or more) from the indicated angle.

[0036] In this application, those of ordinary skill in the art will appreciate that a function performed by a component can be performed by one component, multiple components, one part, or multiple parts. Similarly, a function performed by a part can be performed by one part, one component, or multiple parts in combination.

[0037] In this application, the terms "upper," "lower," "left," "right," "front," "back," and the like refer to the orientation and position as shown in the drawings, and should not be interpreted as limiting the embodiments of the present application. In addition, it should be understood that when an element is referred to as being connected to or on another element, it can be directly connected to or on another element, or indirectly connected to or on another element via intervening elements. It should also be understood that the terms "upper," "lower," "left," "right," "front," "back," etc. can refer to a positive orientation, or can be interpreted as a lateral orientation. For example, "lower" can include directly below, left below, right below, front below, and back below, etc.

[0038] In particular, the terms "connect," "couple," "coupled," "mount," and "mounting" can be direct or indirect, and can include mechanical, electrical, and / or logical connectivity. In addition, "connect" and "coupled" are not restricted to physical or mechanical connections or couplings, and can include electrical connectivity or couplings. Figure 1 and Figure 3The probe device provided by the embodiment is applied to a laser cutting machine and used for detecting the position of a target object. The probe device has a simple structure and can reduce production cost and use cost. Specifically, the probe device comprises a substrate 100, a probe mechanism 200 and a measurement assembly. The substrate 100 is fixedly arranged on the laser cutting machine. The probe mechanism 200 comprises a shell assembly, a probe assembly 220 and a position adjustment assembly 230. The shell assembly is fixedly arranged on the substrate 100. The probe body 221 in the probe assembly 220 is movably arranged in the shell assembly in the up-down direction. In the detection state, the lower end of the probe assembly 220 can extend out of the shell assembly through the first through hole 2101 in the shell assembly. The position adjustment assembly 230 is arranged correspondingly to the probe assembly 220. The measurement assembly comprises an infrared pair tube 310. The infrared pair tube 310 is arranged on the substrate 100 correspondingly to the probe mechanism 200 and is in sensing cooperation with the detection auxiliary protrusion 222 in the probe assembly 220 to detect the relative position of the target object. When the probe body 221 contacts the target object, the probe body 221 moves upward, so that the detection auxiliary protrusion 222 cooperates with the infrared pair tube 310 to sense the position of the target object. After the detection is completed, the position adjustment assembly 230 can drive the probe assembly 220 to return to the detection state.

[0039] Since the substrate 100 is fixedly arranged on the laser cutting machine, the shell assembly in the probe mechanism 200 is fixedly connected to the substrate 100. The probe body 221 in the probe assembly 220 is movably arranged in the shell assembly in the up-down direction and can extend out of the shell assembly. The detection auxiliary protrusion 222 in the probe mechanism 200 is in sensing cooperation with the infrared pair tube 310. The position adjustment assembly 230 can drive the probe body 221 to return to the detection state. Therefore, when the position of the target object is detected, the laser cutting machine drives the substrate 100 to move downward, so that the shell assembly and the probe assembly 220 move downward until the lower end of the probe body 221 contacts the target object. Then, with the downward movement of the substrate 100 and the shell assembly, the probe assembly 220 moves upward relative to the shell assembly. In this process, the detection auxiliary protrusion 222 is in signal communication with the infrared pair tube 310. According to the communication state of the detection auxiliary protrusion 222 and the infrared pair tube 310, the position of the target object is grasped. Then, the position adjustment assembly 230 can drive the probe body 221 to move, so that the lower end of the probe body 221 extends out of the shell assembly, thereby returning the probe body 221 to the detection state, so as to facilitate the position measurement in the next time. Therefore, the process of calibrating the probe assembly 220 by an operator can be removed, the position detection effect of the target object is ensured, and the use cost is reduced. Meanwhile, the probe device only comprises the substrate 100, the probe mechanism 200 and the infrared pair tube 310. The mechanical structure is simple. The position of the target object can be sensed through the sensing cooperation between the detection auxiliary protrusion 222 and the infrared pair tube 310. The detection system is simple, and thus the production cost is reduced.

[0040] Preferably, the measuring assembly further comprises a distance sensor (not shown in the figure) arranged on the base plate 100 or the housing assembly corresponding to the probe body 221, and the distance sensor is used to sense the moving distance of the probe body 221 relative to the housing assembly. The moving distance of the probe body 221 relative to the housing assembly is sensed by the distance sensor to grasp the position of the target object, ensure the detection effect, and cooperate with the infrared pair tube 310 to improve the accuracy of position detection, thereby improving the application range of the probe device.

[0041] In some other embodiments, only the infrared pair tube 310 or the distance sensor can be arranged; or a displacement sensor is additionally arranged; or only the displacement sensor is arranged.

[0042] Two embodiments of the position adjusting assembly 230 are provided in the present embodiment, and the details are as follows:

[0043] The first kind:

[0044] Preferably, the position adjusting assembly 230 comprises a first magnet 231 and a second magnet 232, and the probe assembly 220 further comprises a probe slider 223 movably arranged in the housing assembly in the up-down direction, and the probe body 221 and the detection auxiliary protrusion 222 are fixedly arranged on the probe slider 223; the first magnet 231 is fixedly arranged on the housing assembly and arranged close to the first through hole 2101, and the second magnet 232 is fixedly arranged on the probe slider 223; after the detection is completed, the first magnet 231 and the second magnet 232 magnetically cooperate to make the probe body 221 return to the detection state.

[0045] Specifically combined Figure 1 In the present embodiment, the first magnet 231 and the second magnet 232 are both arranged in the shape of a round cake; in the detection state, the first magnet 231 and the second magnet 232 magnetically cooperate, and the first magnet 231 and the second magnet 232 are concentrically arranged; when the position of the target object is detected, the laser cutting machine drives the base plate 100 to move downward, so that the housing assembly and the probe assembly 220 move downward, until the lower end of the probe body 221 contacts the target object; then, with the downward movement of the base plate 100 and the housing assembly, the probe assembly 220 moves upward relative to the housing assembly, so that the probe body 221 and the second magnet 232 move upward synchronously, at the same time, the detection auxiliary protrusion 222 is in signal communication with the infrared pair tube 310 to realize the position detection of the target object; after the position detection of the target object is completed, the first magnet 231 and the second magnet 232 attract each other, so that the first magnet 231 and the second magnet 232 are concentric again to drive the probe body 221 to move downward and extend out of the housing assembly, so that the probe body 221 returns to the detection state, avoiding frequent calibration during the measurement process, so as to facilitate the next position measurement.

[0046] Preferably, the position adjusting assembly 230 further comprises a third magnet 233, which is arranged in the housing assembly corresponding to the first magnet 231, and the third magnet 233 is arranged directly above the first magnet 231. After the detection is completed, the third magnet 233 and the second magnet 232 magnetically cooperate to enable the probe body 221 to be retracted into the housing assembly.

[0047] Specifically combined Figure 1 As shown, the third magnet 233 is also arranged in the form of a pie; after the measurement is completed, the substrate 100 and the housing assembly continue to move downward, so that the probe assembly 220 continues to move upward relative to the housing assembly. In this process, the second magnet 232 is upwardly misaligned relative to the first magnet 231 and is disengaged from the first magnet 231. Then, the second magnet 232 is attracted by the third magnet 233 and drives the probe body 221 to continue to move upward until the third magnet 233 and the second magnet 232 remain concentric. At this time, the probe body 221 is retracted into the housing assembly, thereby avoiding damage to the probe body 221 caused by external components in a non-working state. When the next position measurement is needed, the probe body 221 is moved downward to disengage the second magnet 232 from the third magnet 233 until the second magnet 232 and the first magnet 231 are concentric again, so that the probe body 221 is in a detection state. In some other embodiments, the first magnet 231, the second magnet 232 and the third magnet 233 can also be arranged in other shapes according to actual conditions, not limited to the pie shape in the present embodiment.

[0048] Preferably, in the present embodiment, the first magnet 231 and the third magnet 233 are embedded in the rear wall 2111 of the shell body 211 of the housing assembly, and the second magnet 232 is embedded in the side wall of the probe slider 223 close to the first magnet 231. This ensures that the second magnet 232 magnetically cooperates with the first magnet 231 and the third magnet 233 under corresponding conditions, improves the installation strength of the first magnet 231 and the third magnet 233, and improves the space utilization in the housing assembly. In some other embodiments, the first magnet 231 and the third magnet 233 can also be embedded in other side walls extending in the upward and downward directions in the shell body 211, and the second magnet 232 is arranged corresponding to the probe slider 223.

[0049] Preferably, the housing assembly further comprises a cover (not shown in the figure), which is arranged on the open end of the shell body 211. The probe body 221 and the probe slider 223 are arranged in the shell body 211. The detection auxiliary protrusion 222 extends out of the shell body 211 through the second through hole 2102 in the rear wall 2111 and is in sensing cooperation with the infrared pair tube 310.

[0050] The probe body 221 and the probe slider 223 are arranged in the shell body 211, and the cover body is arranged at the opening end of the shell body 211, so as to reduce the influence of external parts on the probe body 221 and the probe slider 223, thereby guaranteeing the detection effect and prolonging the service life. The second through hole 2102 is arranged as an elongated hole extending in the up-down direction, the probe body 221 is fixedly arranged on the probe slider 223, and the detection auxiliary protrusion 222 arranged on the probe slider 223 passes through the second through hole 2102 and is inductive cooperation with the infrared pair tube 310, so as to guarantee the position detection effect, and the detection auxiliary protrusion 222 cooperates with the second through hole 2102 to guide the probe body 221 and the probe slider 223 to always move in the up-down direction along the predetermined route, thereby guaranteeing the movement stability of the probe body 221.

[0051] In other embodiments, the infrared pair tube 310 can also be fixedly arranged on the inner side of the other side wall extending in the up-down direction in the shell body 211, and the second through hole 2102 does not need to be arranged on the rear wall 2111, so that the detection auxiliary protrusion 222 can be inductive cooperation with the infrared pair tube 310.

[0052] Preferably, the guide through slot 2103 extending in the up-down direction is arranged on the shell body 211, and the guide protrusion 2231 is arranged on the probe slider 223, and the guide protrusion 2231 is slidingly connected to the guide through slot 2103.

[0053] In combination Figure 1 and Figure 3 As shown in the drawings, in the embodiment, two guide through slots 2103 are arranged on the shell body 211, and the two guide through slots 2103 are respectively arranged on the two side walls arranged in the width direction in the shell body 211, two guide protrusions 2231 are correspondingly arranged on the probe slider 223, and the two guide protrusions 2231 are slidingly arranged in the two guide through slots 2103 one by one, thereby limiting the relative position of the probe body 221 and the probe slider 223 in the width direction and the depth direction of the shell body 211, and guiding the probe body 221 and the probe slider 223 to always move in the up-down direction along the predetermined route, thereby guaranteeing the movement stability of the probe body 221.

[0054] In other embodiments, the number and arrangement position of the guide through slot 2103 are not limited to the embodiment, and can be adaptively adjusted according to actual needs, and the number and arrangement position of the guide protrusion 2231 are adaptively arranged with the guide through slot 2103.

[0055] Preferably, the first side wall 2112 of the shell body 211 is provided with an avoiding hole 2104, the avoiding hole 2104 is arranged opposite to the first through hole 2101, and the upper end of the probe body 221 can extend above the shell body 211 through the avoiding hole 2104.

[0056] Specifically combined Figure 1 And Figure 2 As shown, in this way, on the one hand, the avoidance hole 2104 is guided in cooperation with the upper end of the probe body 221, further improving the guiding effect of the probe body 221 and the probe slider 223, thereby further improving the stability and detection accuracy of the probe body 221 during position detection; on the other hand, since the upper end of the probe body 221 can extend above the shell body 211 through the avoidance hole 2104, the length of the probe body 221 can be appropriately increased, thereby increasing the range of position detection of the probe device to improve its applicability.

[0057] The second kind is:

[0058] The other features of the second embodiment are the same, and the difference is only in the position adjusting assembly 230. Specifically, the position adjusting assembly 230 includes a tension spring 234, the tension spring 234 is sleeved on the probe body 221, one end of the tension spring 234 is fixedly connected to the middle part of the probe body 221, and the other end is fixedly connected to the second side wall 2113 of the shell body 211. After detection, the tension spring 234 retracts to restore the probe body 221 to the detection state.

[0059] Specifically combined Figure 3 As shown, in order to improve the connection stability of the tension spring 234, the middle part of the probe body 221 is provided with an auxiliary connecting table 2212, one end of the tension spring 234 is fixedly connected to the auxiliary connecting table 2212, and the other end is fixedly connected to the second side wall 2113; in the detection state, the tension spring 234 is automatically retracted to the original state; when detecting the position of the target object, the laser cutting machine drives the substrate 100 to move downward, so that the shell assembly and the probe assembly 220 move downward, until the lower end of the probe body 221 contacts the target object; then, with the downward movement of the substrate 100 and the shell assembly, the probe assembly 220 moves upward relative to the shell assembly, so that the tension spring 234 is stretched under stress, and at the same time, the detection auxiliary protrusion 222 is in signal communication with the infrared pair tube 310, to realize the position detection of the target object; when the position detection of the target object is completed, the probe body 221 is no longer in contact with the target object, the tension spring 234 is no longer stretched and starts to automatically rebound, and drives the probe body 221 to move downward, until the tension spring 234 is automatically retracted to the original state, at this time the probe body 221 moves downward and extends out of the shell assembly, and returns to the detection state, so as to facilitate the next position measurement.

[0060] Preferably, the position adjustment assembly 230 further includes a convergence auxiliary tube 235, which is disposed opposite to the first through hole 2101 on the first side wall 2112 of the shell body 211; a snap-fit ​​interface 2351 is provided on the side wall of the convergence auxiliary tube 235, and an elastic snap-fit ​​member 2211 is provided at the upper end of the probe body 221. After the elastic snap-fit ​​member 2211 snaps into the snap-fit ​​interface 2351, the probe body 221 can be converged within the shell assembly.

[0061] Specific combination Figure 3 As shown, the convergence auxiliary tube 235 extends vertically. After the measurement is completed, the substrate 100 and the housing assembly continue to move downwards, causing the probe assembly 220 to move upwards relative to the housing assembly. During this process, the tension spring 234 is continuously stretched, and the upper end of the probe body 221 is inserted into the convergence auxiliary tube 235. With the cooperation of the probe body 221 and the inner wall of the convergence auxiliary tube 235, the elastic locking member 2211 is compressed towards the axis of the probe body 221. As the probe body 221 moves upwards, when the elastic locking member 2211 is aligned with the card interface 2351, the elastic locking member 2211... 11. No longer under compressive force, the probe begins to rebound autonomously and engages with the locking interface 2351. At this time, the probe body 221 is retracted within the housing assembly, preventing damage to the probe body 221 from external components when not in operation. When the next position measurement is required, open the cover and press the elastic locking member 2211 towards the axis of the probe body 221 to disengage it from the locking interface 2351. Then, the tension spring 234, no longer under external force, begins to rebound autonomously until it retracts to its original state, allowing the probe body 221 to be in the detection state again. To further improve convenience, the end face of the elastic locking member 2211 facing away from the probe body 221 is designed as a hemispherical or arc-shaped surface. Alternatively, the locking interface 2351 can be provided at the upper end of the probe body 221, and the elastic locking member 2211 can be provided on the inner wall of the retraction auxiliary cylinder 235 corresponding to the locking interface 2351.

[0062] In other embodiments, a first magnet 231 may be embedded in the rear wall 2111 of the shell body 211 corresponding to the first through hole 2101, and a second magnet 232 may be embedded in the side wall of the probe slider 223 near the first magnet 231. Through the magnetic cooperation between the first magnet 231 and the first magnet 232, the probe body 221 can autonomously return to the detection state during the position detection process. A retraction auxiliary cylinder 235 with a card interface 2351 is provided on the first side wall 2112 of the shell body 211 opposite to the first through hole 2101. An elastic snap-fit ​​member 2211 is provided at the upper end of the probe body 221. The elastic snap-fit ​​member 2211 snaps into the card interface 2351. In the non-working state, the probe body 221 is retracted into the shell assembly to avoid damage to the probe body 221 by external components.

[0063] Obviously, the above embodiments of the present application are merely examples for clearly illustrating the present application, and are not intended to limit the embodiments of the present application. For those skilled in the art, various obvious changes, re-adjustments and substitutions can be made without departing from the protection scope of the present application. Here, it is not necessary and impossible to enumerate all the embodiments. Any modification, equivalent substitution and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application claims.

Claims

1. A probe device, applied in a laser cutting machine, used to detect the position of a target object, characterized in that, include: The substrate (100) is fixedly disposed on the laser cutting machine; The probe mechanism (200) includes a housing assembly, a probe assembly (220), and a position adjustment assembly (230). The housing assembly is fixedly disposed on the substrate (100). The probe body (221) in the probe assembly (220) is movably disposed in the housing assembly in the vertical direction. In the detection state, the lower end of the probe assembly (220) can extend out of the housing assembly through the first through hole (2101) in the housing assembly. The position adjustment assembly (230) is correspondingly disposed with the probe assembly (220). The measuring component includes an infrared pair (310), which is disposed on the substrate (100) corresponding to the probe mechanism (200) and engages with the detection auxiliary protrusion (222) in the probe assembly (220) to detect the relative position of the target object. When the probe body (221) comes into contact with the target object, the probe body (221) moves upward, so that the detection auxiliary protrusion (222) cooperates with the infrared pair tube (310) to sense the position of the target object. After the detection is completed, the position adjustment component (230) can drive the probe component (220) to return to the detection state.

2. The probe device according to claim 1, characterized in that, The measuring component further includes a distance sensor, which is disposed on the substrate (100) or the housing assembly corresponding to the probe body (221), and the distance sensor is used to sense the movement distance of the probe body (221) relative to the housing assembly.

3. The probe device according to claim 1, characterized in that, The position adjustment component (230) includes a first magnet (231) and a second magnet (232). The probe component (220) also includes a probe slider (223). The probe slider (223) is movably disposed in the housing component in the vertical direction. The probe body (221) and the detection auxiliary protrusion (222) are fixedly disposed on the probe slider (223). The first magnet (231) is fixedly disposed on the housing assembly and is located near the first through hole (2101). The second magnet (232) is fixedly disposed on the probe slider (223). After the detection is completed, the first magnet (231) and the second magnet (232) magnetically cooperate to restore the probe body (221) to the detection state.

4. The probe device according to claim 3, characterized in that, The position adjustment component (230) further includes a third magnet (233), which is disposed on the housing component corresponding to the first magnet (231), and the third magnet (233) is disposed directly above the first magnet (231). After the detection is completed, the third magnet (233) and the second magnet (232) magnetically cooperate to make the probe body (221) retract into the housing component.

5. The probe device according to claim 4, characterized in that, The first magnet (231) and the third magnet (233) are embedded in the rear wall (2111) of the shell body (211) in the shell assembly, and the second magnet (232) is embedded in the side wall of the probe slider (223) near the first magnet (231).

6. The probe device according to claim 5, characterized in that, The housing assembly also includes a cover that covers the opening of the housing body (211), the probe body (221) and the probe slider (223) are disposed inside the housing body (211), and the detection auxiliary protrusion (222) extends out of the housing body (211) through the second through hole (2102) on the rear wall (2111) and engages with the infrared sensor (310).

7. The probe device according to claim 6, characterized in that, The shell body (211) is provided with a guide groove (2103) extending in the vertical direction, and the probe slider (223) is provided with a guide protrusion (2231), which is slidably connected to the guide groove (2103).

8. The probe device according to claim 5, characterized in that, An obstacle hole (2104) is provided on the first sidewall (2112) of the shell body (211). The obstacle hole (2104) is disposed opposite to the first through hole (2101). The upper end of the probe body (221) can extend out above the shell body (211) through the obstacle hole (2104).

9. The probe device according to claim 1, characterized in that, The position adjustment assembly (230) includes a tension spring (234), which is sleeved on the probe body (221). One end of the tension spring (234) is fixedly connected to the middle of the probe body (221), and the other end is fixedly connected to the second side wall (2113) of the shell body (211) in the housing assembly. After the detection is completed, the tension spring (234) retracts so that the probe body (221) returns to the detection state.

10. The probe device according to claim 9, characterized in that, The position adjustment assembly (230) further includes a convergence auxiliary tube (235), which is disposed on the first side wall (2112) of the shell body (211) opposite to the first through hole (2101); The side wall of the convergence auxiliary tube (235) is provided with a card interface (2351), and the upper end of the probe body (221) is provided with an elastic snap-fit ​​(2211). After the elastic snap-fit ​​(2211) is snapped into the card interface (2351), the probe body (221) can be converged into the housing assembly.

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