Large-current testing mechanism

Abstract

The utility model discloses a heavy current testing mechanism, which comprises a base, the top of the base is fixedly connected with a frame, the frame is provided with two lifting mechanisms, each lifting mechanism comprises a hydraulic rod fixedly connected with the frame, the output end of each hydraulic rod is fixedly connected with a lifting plate, and the output end of each lifting plate is fixedly connected with a motor. The bottom of the lifting plate is fixedly connected with two testing copper columns, the two testing copper columns are jointly and fixedly connected with a conductive copper plate, two testing mechanisms are arranged on the base, and four sets of buffering mechanisms are arranged on the top of the base. According to the utility model, two products can be tested at the same time, the testing efficiency is improved, and the arranged buffer mechanism can protect the testing copper column and the copper plate which are in contact with each other, so that damage caused by long-term testing of the testing copper column and the copper plate is avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to product testing technical field especially relates to a big current test mechanism. BACKGROUND

[0002] When producing products, the products need to be tested by big current, so a big current test mechanism is needed.

[0003] The existing big current test mechanism is a single product test mechanism, the single cycle test time is longer, the test efficiency is lower, and the production capacity cannot meet the existing demand; when testing, the test copper column and the copper plate are in rigid contact, long-term testing can cause the test copper column to deform or the copper plate to be damaged, affecting the test effect; to solve the above problems, a big current test mechanism is provided in the application. UTILITY MODEL CONTENT

[0004] The utility model discloses a kind of big current test mechanisms to solve the shortcomings in prior art, and the test mechanism can test two products simultaneously, improve the test efficiency, and the buffer mechanism set can protect the test copper column and copper plate contacted, avoid that both are damaged by long-term test.

[0005] To achieve the above object, the utility model adopts the following technical scheme:

[0006] A kind of big current test mechanism, including base, the top of the base is fixedly connected with frame, two lifting mechanisms are equipped on the frame, the lifting mechanism includes the hydraulic rod fixedly connected with frame, the output end of the hydraulic rod is fixedly connected with lifting plate, the bottom of the lifting plate is fixedly connected with two test copper columns, two test copper columns are fixedly connected with conductive copper plate in common, two test mechanisms are equipped on the base, the test mechanism includes the battery fixedly connected with the side wall of base, the positive and negative pole of the battery is fixedly connected with first lead wire, one of the first lead wire is fixedly connected with first copper plate, the second copper plate is equipped above the base, the second copper plate is fixedly connected with second lead wire, the top of the base is equipped with four groups of buffer mechanism.

[0007] Preferably, the buffer mechanism includes the lower plate fixedly connected with the top of base, the top of the lower plate is fixedly connected with four guide telescopic rods, four guide telescopic rods are fixedly connected with upper plate in common, the support plate is fixedly connected on the base, the support plate is equipped with the annular fixedly connected therewith, buffer member is fixedly connected between the lower plate and the upper plate in common.

[0008] Preferably, the first copper plate and the second copper plate are respectively arranged on the top of the corresponding upper plate and fixedly connected therewith.

[0009] Preferably, the top of the first copper plate and the top of the second copper plate are both provided with a groove, which is located directly below the test copper column.

[0010] Preferably, the four guide telescopic rods are arranged in a rectangular shape.

[0011] Preferably, the buffer comprises a telescopic rod and a spring, both ends of the telescopic rod are fixedly connected with the lower plate and the upper plate respectively, the spring is sleeved on the output end of the telescopic rod, and both ends of the spring are fixedly connected with the telescopic rod and the upper plate respectively.

[0012] Compared with the prior art, the utility model has the advantages that:

[0013] 1. The staff connects one end of the first wire and the second wire with two ends of the product to be tested respectively, provides the electric quantity through the battery connected on the first wire, forms the passage of the battery, the first wire, the first copper plate, the left test copper column, the conductive copper plate, the right test copper column, the second copper plate, the second wire, the test product, the first wire and the battery, realizes the test of large current, can test two products simultaneously, and improves the test efficiency.

[0014] 2. The test copper column presses the first copper plate and the second copper plate, in the process, the first copper plate and the second copper plate slightly move downwards to drive two upper plates to move downwards, the guide telescopic rod synchronously shrinks, the telescopic rod telescopes and the spring compresses, the first copper plate and the second copper plate are tightly abutted with the bottom of the test copper column, the passage of the first copper plate and the left test copper column and the passage of the second copper plate and the right test copper column are completed, the smoothness of the circuit is guaranteed, the buffer mechanism is arranged and can protect the test copper column and the copper plate in contact, and damage caused by long-term test of the two is avoided.

[0015] In summary, the test mechanism can test two products simultaneously, improves the test efficiency, and the buffer mechanism can protect the test copper column and the copper plate in contact, and avoid damage caused by long-term test of the two. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a first structure schematic view of the large-current test mechanism proposed in the utility model;

[0017] Figure 2 It is a second structure schematic view of the large-current test mechanism proposed in the utility model;

[0018] Figure 3 It is a first part structure schematic view of the large-current test mechanism proposed in the utility model;

[0019] Figure 4 It is a second part schematic view of the large-current test mechanism proposed in the utility model;

[0020] Figure 5 A third part of a large current test mechanism is provided in the utility model.

[0021] In the drawing: 1 base, 2 frame, 3 hydraulic rod, 4 lifting plate, 5 conductive copper plate, 6 test copper column, 7 first wire, 8 first copper plate, 9 recess, 10 second copper plate, 11 second wire, 12 lower plate, 13 guide telescopic rod, 14 upper plate, 15 support plate, 16 circular ring, 17 buffer. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the utility model will be apparently and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments.

[0023] Referring to Figures 1-5 A large current test mechanism, including base 1, the top of base 1 is fixedly connected with frame 2, frame 2 is equipped with two lifting mechanisms, and the lifting mechanism includes hydraulic rod 3 fixedly connected with frame 2, the output end of hydraulic rod 3 is fixedly connected with lifting plate 4, the bottom of lifting plate 4 is fixedly connected with two test copper columns 6, and two test copper columns 6 are fixedly connected with conductive copper plate 5 in common, and two test copper columns 6 can be electrically connected through conductive copper plate 5.

[0024] Base 1 is equipped with two test mechanisms, and the test mechanism includes battery fixedly connected with the side wall of base 1, the battery is provided with a switch, and the positive and negative poles of the battery are fixedly connected with first wire 7, one of first wire 7 is fixedly connected with first copper plate 8, the upper side of base 1 is equipped with second copper plate 10, second copper plate 10 is fixedly connected with second wire 11, first wire 7 and second wire 11 are connected with the two ends of the product respectively, the large current of the product is tested, first copper plate 8 and second copper plate 10 are respectively arranged at the top of the corresponding upper plate 14 and fixedly connected with the same, the top of first copper plate 8 and the top of second copper plate 10 are both provided with recess 9, and recess 9 is arranged directly below test copper column 6, test copper column 6 is inserted into recess 9, so that test copper column 6 abuts against the top of first copper plate 8 and second copper plate 10, and first copper plate 8 and second copper plate 10 are slightly moved downward.

[0025] The top of the base 1 is provided with four sets of buffer mechanisms, the buffer mechanisms comprise a lower plate 12 fixedly connected with the top of the base 1, the top of the lower plate 12 is fixedly connected with four guide telescopic rods 13, the positions of the four guide telescopic rods 13 are distributed in a rectangular shape, the four guide telescopic rods 13 are commonly fixedly connected with an upper plate 14, the base 1 is fixedly connected with a supporting plate 15, the supporting plate 15 is provided with a circular ring 16 fixedly connected therewith in a penetrating mode, the test copper column 6 can penetrate the inner wall of the circular ring 16, the lower plate 12 and the upper plate 14 are commonly fixedly connected with a buffer piece 17, the buffer piece 17 comprises a telescopic rod and a spring, the two ends of the telescopic rod are fixedly connected with the lower plate 12 and the upper plate 14 respectively, the spring is sleeved on the output end of the telescopic rod, and the two ends of the spring are fixedly connected with the telescopic rod and the upper plate 14 respectively, when the test copper column 6 abuts against the top of the first copper plate 8 and the second copper plate 10, the first copper plate 8 and the second copper plate 10 drive the upper plate 14 to move downwards, in the process, the guide telescopic rods 13 are telescopically extended, the telescopic rod is telescopically extended and the spring is contracted, the bottom of the test copper column 6 abuts against the top of the first copper plate 8 and the second copper plate 10, and a subsequent current forming path is formed.

[0026] In the utility model, one end of the first wire 7 and the second wire 11 is respectively connected with two ends of a product to be tested by a staff, the battery connected with the first wire 7 provides electricity, a path is formed by the battery, the first wire 7, the first copper plate 8, the left test copper column 6, the conductive copper plate 5, the right test copper column 6, the second copper plate 10, the second wire 11, the test product, the first wire 7 and the battery, and the test of a large current is realized; the hydraulic rod 3 is started, the output end of the hydraulic rod 3 drives the lifting plate 4, the two test copper columns 6 and the conductive copper plate 5 to move downwards until the two test copper columns 6 penetrate the inner walls of the corresponding circular rings 16 respectively, with the two test copper columns 6 continuing to move downwards, the bottoms of the two test copper columns 6 are respectively inserted into the grooves 9, the first copper plate 8 and the left test copper column 6 abut against each other, and the second copper plate 10 and the right test copper column 6 abut against each other, in the process of abutting against each other, the test copper column 6 presses the first copper plate 8 and the second copper plate 10, in the process, the first copper plate 8 and the second copper plate 10 slightly move downwards and drive the two upper plates 14 to move downwards, the guide telescopic rods 13 are synchronously contracted, the telescopic rod is telescopically extended and the spring is compressed, the first copper plate 8 and the second copper plate 10 are in close abutment with the bottoms of the test copper columns 6, the path of the first copper plate 8 and the left test copper column 6 and the path of the second copper plate 10 and the right test copper column 6 are completed, the smoothness of the circuit is ensured, the test of two products can be completed at a time, and after the test, whether the products work normally can be observed, and whether the quality meets the requirements can be judged.

Claims

1. A high current testing mechanism comprising a base (1), characterized in that, The top of the base (1) is fixedly connected with a frame (2), two lifting mechanisms are arranged on the frame (2), two test mechanisms are arranged on the base (1), and four buffer mechanisms are arranged on the top of the base (1); The lifting mechanism comprises a hydraulic rod (3) fixedly connected with the frame (2), an output end of the hydraulic rod (3) is fixedly connected with a lifting plate (4), the bottom of the lifting plate (4) is fixedly connected with two test copper columns (6), and the two test copper columns (6) are fixedly connected with a conductive copper plate (5) in common; The test mechanism comprises a battery fixedly connected with the side wall of the base (1), the positive and negative electrodes of the battery are fixedly connected with first wires (7), one of the first wires (7) is fixedly connected with a first copper plate (8), a second copper plate (10) is arranged above the base (1), and the second copper plate (10) is fixedly connected with a second wire (11).

2. The high current test mechanism of claim 1, wherein, The buffer mechanism comprises a lower plate (12) fixedly connected with the top of the base (1), four guide telescopic rods (13) are fixedly connected with the top of the lower plate (12) in common, an upper plate (14) is fixedly connected with the four guide telescopic rods (13) in common, a supporting plate (15) is fixedly connected with the base (1), a circular ring (16) is arranged in penetrating mode and fixedly connected with the supporting plate (15), and a buffer piece (17) is fixedly connected with the lower plate (12) and the upper plate (14) in common.

3. The high current test mechanism of claim 1, wherein, The first copper plate (8) and the second copper plate (10) are arranged on the top of the corresponding upper plate (14) in a fixed mode respectively.

4. The high current test mechanism of claim 1, wherein, The top of the first copper plate (8) and the top of the second copper plate (10) are both provided with a groove (9), and the groove (9) is arranged directly below the test copper column (6).

5. The high current test mechanism of claim 2, wherein, The positions of the four guide telescopic rods (13) are distributed in a rectangular mode.

6. The high current test mechanism of claim 2, wherein, The buffer piece (17) comprises a telescopic rod and a spring, both ends of the telescopic rod are fixedly connected with the lower plate (12) and the upper plate (14) respectively, the spring is sleeved on the output end of the telescopic rod, and both ends of the spring are fixedly connected with the telescopic rod and the upper plate (14) respectively.

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