Display panel and display device

Abstract

The utility model provides a display panel and a display device, the display panel comprises a display area and a peripheral area surrounding the display area, the peripheral area comprises a binding side located on at least one side of the display area and a non-binding side except the binding side, and the binding side is bound and connected with a driving circuit; wherein a first temperature measurement line is arranged in the peripheral area and located on the non-binding side, the driving circuit comprises a first temperature measurement circuit, the first temperature measurement line is connected with the first temperature measurement circuit, and the first temperature measurement circuit is used for obtaining first temperature measurement information of the first temperature measurement line; and / or, a second temperature measurement line is arranged in the peripheral area, the second temperature measurement line is located on the binding side, the driving circuit comprises a second temperature measurement circuit, the second temperature measurement line is connected with the second temperature measurement circuit, and the second temperature measurement circuit is used for obtaining second temperature measurement information of the second temperature measurement line. According to the display panel and the display device, poor display can be improved.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of display, and in particular, to a display panel and a display device. BACKGROUND

[0002] The competition of smart phones is increasingly fierce, and high screen ratio and high brightness have become the goal pursued by major manufacturers. However, in the related art, in order to achieve the requirements of high screen ratio and high brightness, some display problems occur. CONTENT

[0003] In order to solve at least one of the technical problems in the prior art, the embodiments of the present disclosure provide a display panel and a display device.

[0004] The technical solutions provided by the embodiments of the present disclosure are as follows:

[0005] In a first aspect, the embodiments of the present disclosure provide a display panel, comprising a substrate, the substrate comprising a display area and a peripheral area surrounding the display area, the peripheral area comprising a binding side located at at least one side of the display area and a non-binding side other than the binding side, and a driving circuit is connected to the binding side; wherein,

[0006] A first temperature measurement line is arranged in the peripheral area, the first temperature measurement line is located at the non-binding side, the driving circuit comprises a first temperature measurement circuit, the first temperature measurement line is connected to the first temperature measurement circuit, and the first temperature measurement circuit is configured to obtain first temperature measurement information of the first temperature measurement line; and / or,

[0007] A second temperature measurement line is arranged in the peripheral area, the second temperature measurement line is located at the binding side, the driving circuit comprises a second temperature measurement circuit, the second temperature measurement line is connected to the second temperature measurement circuit, and the second temperature measurement circuit is configured to obtain second temperature measurement information of the second temperature measurement line.

[0008] Illustratively, the first temperature measurement line comprises a first signal input end, a first signal output end, and a first main body trace located between the first signal input end and the first signal output end, the first signal input end and the first signal output end are both arranged at the binding side, and the first main body trace is configured to be arranged around the periphery of the display area.

[0009] Illustratively, the first temperature measurement circuit is configured to obtain the first temperature measurement information of the first temperature measurement line based on resistance change information of the first temperature measurement line.

[0010] The first temperature measurement circuit includes a first voltage input circuit, a first voltage dividing resistor circuit and a first signal processing unit, and the first temperature measurement line includes a first signal input end and a first signal output end.

[0011] The first voltage input circuit is connected to the first signal input end, and the first voltage input circuit is configured to input a first predetermined voltage to the first temperature measurement line.

[0012] The first signal output end is connected to the first voltage dividing resistor circuit.

[0013] The first signal processing unit is connected to the first voltage dividing resistor circuit, and the first signal processing unit is configured to process the electrical signal from the first voltage dividing resistor circuit to obtain the first temperature measurement information.

[0014] The resistance value of the first temperature measurement line is R1, and the resistance value of the connecting lead in the first temperature measurement circuit except the first temperature measurement line and the first voltage dividing resistor circuit is r1, where R1 is 10-100 times of r1.

[0015] R1 is 1KΩ-100KΩ, and r1 is 10-1000Ω.

[0016] The first predetermined voltage is 6V.

[0017] The driving circuit further includes a display driving circuit configured to control display driving voltage and display timing, the display driving circuit is connected to the first temperature measurement circuit, and the display driving circuit is configured to adjust the display driving voltage and display timing based on the first temperature measurement information.

[0018] The display driving circuit is specifically configured to:

[0019] When the current temperature value of the first temperature measurement line is less than a first upper limit temperature threshold and greater than a first lower limit temperature threshold, the pixel circuit is driven at an initial display driving voltage and an initial timing duty cycle.

[0020] When the current temperature value of the first temperature measurement line is greater than or equal to the first upper limit temperature threshold, the display driving voltage is reduced compared to the initial display driving voltage.

[0021] When the current temperature value of the first temperature measurement line is less than or equal to the first lower limit temperature threshold, the display timing duty cycle is increased compared to the initial timing duty cycle.

[0022] The array substrate gate driving circuit is further provided on the unbound side of the peripheral region, and the first temperature measurement line is located in the periphery of the array substrate gate driving circuit.

[0023] Exemplarily, the non-bonding side of the peripheral region is further provided with a grounding line, and the grounding line is located outside the first temperature measuring line.

[0024] Exemplarily, the second temperature measuring line comprises a second signal input end, a second signal output end, and a second main body trace between the second signal input end and the second signal output end, and the second main body trace is configured as a serpentine trace formed by multiple times of winding and bending from the second signal input end to the second signal output end.

[0025] Exemplarily, the driving circuit comprises a driving chip and a circuit board, and the bonding side is provided with a plurality of first bonding pins for bonding connection of the circuit board, and the second signal input end and the second signal output end are connected to the first temperature measuring circuit through the corresponding two first bonding pins respectively.

[0026] Exemplarily, the second temperature measuring line and the driving chip at least partially overlap in the orthographic projection on the substrate, and in the direction perpendicular to the substrate, the second temperature measuring line is located between the driving chip and the substrate.

[0027] Exemplarily, the bonding side is further provided with a plurality of second bonding pins for bonding connection of the driving chip; wherein, in the direction from the display region to the bonding side, the second main body trace is located between the second bonding pins and the display region, and the second signal input end and the second signal output end pass through the gap between the second bonding pins to be connected to the second temperature measuring circuit on the circuit board.

[0028] Exemplarily, the driving circuit comprises a backlight driving circuit for driving a backlight module, the backlight driving circuit is connected with the second temperature measuring circuit, and the backlight driving circuit is configured to adjust a backlight driving signal based on the second temperature information.

[0029] Exemplarily, the backlight driving circuit is configured to specifically reduce the backlight current relative to an initial backlight current when the current temperature value of the second temperature measuring line is greater than or equal to a second upper limit temperature threshold.

[0030] Exemplarily, the second temperature measuring circuit comprises a second voltage input circuit, a second voltage dividing resistor circuit and a second signal processing unit, and the second temperature measuring line comprises a second signal input end and a second signal output end; wherein,

[0031] the second voltage input circuit is connected to the second signal input end, and the second voltage input circuit is used for inputting a second predetermined voltage to the second temperature measuring line;

[0032] The second signal output end is connected to the second voltage dividing resistor circuit.

[0033] The second signal processing unit is connected to the second voltage dividing resistor circuit, and the second signal processing unit is configured to process the electrical signal from the second voltage dividing resistor circuit to obtain the second temperature measurement information.

[0034] Exemplarily, the resistance value of the second temperature measurement line is R2, and the resistance value of the connecting lead wire in the second temperature measurement circuit except the second temperature measurement line and the second voltage dividing resistor circuit is r2, where R2 is 10-100 times of r2.

[0035] Exemplarily, R2 is 1KΩ-100KΩ; and r2 is 10-1000Ω.

[0036] Exemplarily, the second predetermined voltage is 6V.

[0037] Exemplarily, at least the non-binding side is provided with a light sensing thin film transistor for detecting ambient brightness, and the driving circuit includes a display driving circuit.

[0038] The display driving circuit is connected to the light sensing thin film transistor and the first temperature measurement circuit, and is configured to:

[0039] Pre-storing a corresponding relationship between the temperature of the light sensing thin film transistor and the brightness correction value;

[0040] Obtaining brightness detection information based on the light sensing thin film transistor;

[0041] Obtaining a brightness correction value according to the first temperature measurement information and the corresponding relationship;

[0042] Correcting the brightness detection information based on the brightness correction value to obtain actual brightness information.

[0043] In a second aspect, the embodiments of the present disclosure provide a display device, which includes:

[0044] The display panel as described above; and

[0045] A backlight module arranged on the non-display side of the display panel, the backlight module including a lamp plate, the lamp plate being arranged on the binding side, and the second temperature measurement line being arranged in position corresponding to the lamp plate in a direction perpendicular to the substrate.

[0046] In a third aspect, the embodiments of the present disclosure provide a driving method of a display device, applied to the display device as described above, and the driving method includes:

[0047] acquire first temperature measurement information of the first temperature measurement line; and / or, acquire second temperature measurement information of the second temperature measurement line;

[0048] drive the display device based on the first temperature measurement information and / or the second temperature measurement information.

[0049] For example, the driving of the display device based on the first temperature measurement information and / or the second temperature measurement information specifically includes:

[0050] adjusting the display driving voltage and display timing based on the first temperature measurement information.

[0051] For example, the adjusting of the display driving voltage and display timing based on the first temperature measurement information specifically includes:

[0052] when the current temperature value of the first temperature measurement line is less than a first upper limit temperature threshold and greater than a first lower limit temperature threshold, driving the pixel circuit with an initial display driving voltage and an initial timing duty cycle;

[0053] when the current temperature value of the first temperature measurement line is greater than or equal to the first upper limit temperature threshold, reducing the display driving voltage compared to the initial display driving voltage;

[0054] when the current temperature value of the first temperature measurement line is less than or equal to the first lower limit temperature threshold, increasing the display timing duty cycle compared to the initial timing duty cycle.

[0055] For example, the driving of the display device based on the first temperature measurement information and / or the second temperature measurement information specifically includes:

[0056] adjusting a backlight driving signal based on the second temperature measurement information.

[0057] For example, the adjusting of the backlight driving signal based on the second temperature measurement information specifically includes:

[0058] when the current temperature value of the second temperature measurement line is greater than or equal to a second upper limit temperature threshold, reducing the backlight current relative to an initial backlight current.

[0059] For example, the driving of the display device based on the first temperature measurement information and / or the second temperature measurement information specifically includes:

[0060] pre-storing a correspondence between the temperature of the light-sensing thin film transistor and a brightness correction value;

[0061] acquiring brightness detection information based on the light-sensing thin film transistor;

[0062] acquiring a brightness correction value according to the first temperature measurement information and the correspondence;

[0063] correct the luminance detection information based on the luminance correction value to obtain actual luminance information.

[0064] In a fourth aspect, the embodiments of the present disclosure provide a driving circuit of a display device, comprising a memory and a processor, the memory is configured to store an executable program, and the processor is configured to run the executable program to implement the steps of the driving method of the display device.

[0065] In a fifth aspect, the embodiments of the present disclosure provide a computer readable storage medium, the computer readable storage medium stores an executable program, and the executable program is run by a processor to implement the steps of the driving method of the display device.

[0066] The beneficial effects brought by the embodiments of the present disclosure are as follows:

[0067] In the above scheme, the first temperature measurement line is arranged on the non-bound side of the display panel, and the first temperature measurement circuit is arranged on the driving circuit to obtain the first temperature measurement information of the first temperature measurement line; and / or the second temperature measurement line is arranged on the bound side of the display panel, and the second measurement circuit is arranged on the driving circuit to obtain the second temperature measurement information of the second temperature measurement line. The first temperature measurement information obtained can detect the temperature change on the non-bound side of the display panel, and the second temperature measurement information obtained can detect the temperature change on the bound side of the display panel. Based on these temperature measurement information, the display driving strategy can be adaptively adjusted to improve the display defects caused by temperature influence. BRIEF DESCRIPTION OF DRAWINGS

[0068] Figure 1 A structural schematic diagram of a display panel in some embodiments of the present disclosure is shown;

[0069] Figure 2 A structural schematic diagram of a display panel in some embodiments of the present disclosure is shown;

[0070] Figure 3 A structural schematic diagram of a display panel in some embodiments of the present disclosure is shown; Figure 1 A local structural schematic diagram at the position of middle frame line E is shown;

[0071] Figure 4 A local structural schematic diagram at the position of middle frame line E is shown; Figure 1 A local structural schematic diagram at the position of middle frame line G is shown;

[0072] Figure 5 A local structural schematic diagram at the position of middle frame line G is shown; Figure 1 A local structural schematic diagram at the position of middle frame line P is shown;

[0073] Figure 6 A local structural schematic diagram at the position of middle frame line P is shown; Figure 1 A local structural schematic diagram at the position of middle frame line Q is shown; A local structural schematic diagram at the position of middle frame line Q is shown;

[0074] Figure 7 schematic diagram of a local structure at a position of a frame line F; Figure 2 schematic diagram of a local structure at a position of a frame line F;

[0075] Figure 8 schematic diagram of a local structure at a position of a frame line F;

[0076] Figure 9 schematic diagram of a local structure at a position of a frame line F;

[0077] Figure 10 schematic diagram of a local structure at a position of a frame line F;

[0078] Figure 11 schematic diagram of a local structure at a position of a frame line F;

[0079] Figure 12 schematic diagram of a local structure at a position of a frame line F;

[0080] Figure 13 schematic diagram of a local structure at a position of a frame line F;

[0081] Figure 14 schematic diagram of a local structure at a position of a frame line F;

[0082] Figure 15 schematic diagram of a local structure at a position of a frame line F; DETAILED DESCRIPTION

[0083] In order to make the objects, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions of the embodiments of the present disclosure will be described clearly and completely below with reference to the drawings of the embodiments of the present disclosure. Obviously, the described embodiments are only some but not all of the embodiments of the present disclosure. Based on the described embodiments of the present disclosure, all other embodiments obtained by those of ordinary skill in the art without creative effort belong to the scope of the present disclosure.

[0084] Unless otherwise defined, technical terms or scientific terms used in the present disclosure shall have the meanings that can be commonly understood by a person having ordinary skills in the art to which the present disclosure belongs. The terms "first", "second", and similar terms, used in the present disclosure do not necessarily mean any order, number, or importance, but are used to distinguish different components. Also, the terms "one", "a", or "the" and similar terms do not mean quantity limitation, but mean that there is at least one. The terms "include", "comprise", and similar terms mean that the elements or objects before the terms encompass the elements or objects listed after the terms and equivalents thereof, and do not exclude other elements or objects. The terms "connect" and "couple" and similar terms do not mean physical or mechanical connection only, but can include electrical connection, whether direct or indirect. The terms "upper", "lower", "left", "right", and the like are used only to indicate relative positional relationships, and when the absolute positions of the described objects are changed, the relative positional relationships can also be changed accordingly.

[0085] The terms "parallel", "perpendicular", and "same" and the like used in the embodiments of the present disclosure include the strict "parallel", "perpendicular", "same" and the like, and "approximately parallel", "approximately perpendicular", "approximately same" and the like with a certain tolerance, which, considering the measurement and the tolerance related to the measurement of a specific value (for example, the limitation of the measurement system), means within the acceptable deviation range for the specific value determined by a person having ordinary skills in the art. For example, "approximately" can mean within one or more standard deviations, or within 3% or 5% of the value.

[0086] In addition, in this document, unless otherwise defined, the terms "substantially", "essentially", "approximately", and "about" are used to describe and account for small variations. When used with an event or circumstance, these terms can cover the event or circumstance that occurs exactly, as well as the event or circumstance that occurs approximately. For example, when used with a numerical value, these terms can include a range of variation of the numerical value less than or equal to 10%, such as less than or equal to ±5%, less than or equal to ±4%, less than or equal to ±3%, less than or equal to ±2%, less than or equal to ±1%, less than or equal to ±0.5%, less than or equal to ±0.1%, less than or equal to ±0.05%. The term "substantially coplanar" can mean that two surfaces are arranged along the same plane within the micrometer range, for example, within 40 μm, 30 μm, 20 μm, 10 μm, or 1 μm along the same plane.

[0087] It should be understood that, in the exemplary embodiments of the present disclosure, when a layer or element is referred to as being on another layer or substrate, it can be that the layer or element is directly on the other layer or substrate, or there can be an intermediate layer between the layer or element and the other layer or substrate. "A and B are arranged in the same layer" means that A and B are formed by the same film forming process for forming a film layer of a specific pattern, and are formed by a one-time patterning process using the same mask plate.

[0088] Before the display panel and display device provided by the embodiments of the present disclosure are described in detail, the related art is described as follows:

[0089] In the related art, in order to achieve the requirements of high screen ratio and high brightness, some display problems occur.

[0090] The present inventor has found that one of the reasons for the above problems is that:

[0091] Taking a liquid crystal display product as an example, a higher screen ratio can be achieved by compressing the line width, line spacing, etc. on the display panel, or by improving the module process capability. In order to achieve high brightness, the display brightness can be improved by increasing the light transmittance of the display panel or increasing the backlight brightness. However, this will lead to an increase in cost. If both high brightness and no increase in cost are to be achieved, there are two solutions in the related art: one is to continue to improve the transmittance of the display panel. In this way, the design requirements of the display panel will be higher, almost reaching the limit of design, thereby causing some display problems. The second is to use single-crystal high-voltage LED lamps in the backlight module to improve the backlight brightness. However, compared with ordinary LED lamps, single-crystal high-voltage LED lamps have a much higher temperature rise, which can cause wrinkling problems of optical film materials. As can be seen, whether it is to achieve a higher screen ratio or to achieve high brightness, some display problems will occur.

[0092] In addition, when the display panel works in a high-temperature or low-temperature environment, the characteristics of the thin film transistor (TFT) will be affected by the temperature, and various display malfunctions will occur. In particular, when the display panel is already in the limit of design, display malfunctions are more likely to occur. For example, Crosstalk malfunctions are prone to occur when working at high temperatures; low-temperature startup and low-temperature operation can have NG risks when working at low temperatures.

[0093] In addition, in a high-temperature environment, the temperature of the integrated driving circuit (TDDIIC) is relatively high when it is working. In the case of ultra-low power consumption (ultra-LC), a dark shadow defect can occur on the bonding side (DP).

[0094] Therefore, in order to improve at least one of the above technical problems in the related art, the embodiments of the present disclosure provide a display panel and a display device.

[0095] AsFigure 1 As shown, the display panel provided by the embodiments of the present disclosure includes a substrate 100, the substrate 100 includes a display area AA and a peripheral area B surrounding the display area AA, the peripheral area B includes a binding side B1 located at at least one side of the display area AA, and a non-binding side B2 except the binding side B1, and the driving circuit 200 is connected to the binding side B1.

[0096] For example, as shown in the following figure, Figure 1 In some embodiments, the peripheral area B includes one binding side B1 located at one side of the display area AA, and the non-binding side B2 can be located at the other three sides of the display area AA. Figure 1 For example, as shown in the following figure, the binding side B1 can be located at the lower side of the display area AA, and the non-binding side B2 can be located at the upper, left and right sides of the display area AA. However, it is not limited thereto. In other embodiments, the peripheral area B can also include two binding sides B1, for example, two binding sides B1 can be located at opposite sides of the display area AA, and the other two sides are the non-binding side B2 of the display area AA.

[0097] In some embodiments, a first temperature measurement line TS1 is arranged in the peripheral area B, the first temperature measurement line TS1 is located at the non-binding side B2, the driving circuit 200 includes a first temperature measurement circuit 210, the first temperature measurement line TS1 is connected to the first temperature measurement circuit 210, and the first temperature measurement circuit 210 is used to obtain first temperature measurement information of the first temperature measurement line TS1.

[0098] In this way, the first temperature measurement information obtained can detect the temperature change of the non-binding side B2 on the display panel, and then the display driving strategy can be adaptively adjusted, which can avoid crosstalk or NG and other defects caused by the display panel in a high-temperature or low-temperature working environment.

[0099] In other embodiments, a second temperature measurement line TS2 is arranged in the peripheral area B, the second temperature measurement line TS2 is located at the binding side B1, the driving circuit 200 includes a second temperature measurement circuit 220, the second temperature measurement line TS2 is connected to the second temperature measurement circuit 220, and the second temperature measurement circuit 220 is used to obtain second temperature measurement information of the second temperature measurement line TS2.

[0100] In this way, the second temperature measurement information obtained can detect the temperature change of the binding side B1 on the display panel, and then the display driving strategy can be adaptively adjusted, and since the driving circuit 200 is connected to the binding side B1, display defects caused by the temperature of the driving circuit 200 on the binding side B1 can be avoided.

[0101] In some example embodiments, the first temperature sensing line TS1 can be disposed on the non-bound side B2, and the second temperature sensing line TS2 can be disposed on the bound side B1 at the same time. In this way, the display defects caused by the temperature influence on the bound side B1 can be solved, and the display defects caused by the high or low temperature working environment of the display panel can be improved.

[0102] The first temperature sensing line TS1 and / or the second temperature sensing line TS2 are disposed on the peripheral region B, and will not cause any influence on the display.

[0103] In some example embodiments, as shown in Figure 1 The first temperature sensing line TS1 includes a first signal input end TS11, a first signal output end TS12, and a first main body trace TS13 between the first signal input end TS11 and the first signal output end TS12, the first signal input end TS11 and the first signal output end TS12 are both disposed on the bound side B1, and the first main body trace TS13 is configured to be disposed around the periphery of the display region AA.

[0104] In this way, the first temperature sensing line TS1 can be connected to the first temperature sensing circuit 210 through the first signal input end TS11 and the first signal output end TS12 on the bound side B1, and the first temperature sensing line TS1 is arranged around the display region AA, so that the working temperature of the entire display panel can be more accurately detected. It can be understood that the trace mode of the first temperature sensing line TS1 is not limited thereto.

[0105] In addition, in some example embodiments, the first temperature sensing circuit 210 is configured to obtain first temperature sensing information of the first temperature sensing line TS1 based on the resistance change information of the first temperature sensing line TS1.

[0106] The first temperature sensing line TS1 can be a trace made of metal materials such as aluminum, copper, or molybdenum, etc. The resistance value of the metal trace can change with the change of temperature. Therefore, the first temperature sensing information can be accurately obtained based on the resistance change of the first temperature sensing line TS1.

[0107] Please refer to Figure 8 and Figure 9 In some example embodiments, the first temperature sensing circuit 210 includes a first voltage input circuit 211, a first voltage dividing resistor circuit 212, and a first signal processing unit 213, and the first temperature sensing line TS1 includes a first signal input end TS11 and a first signal output end TS12; wherein,

[0108] The first voltage input circuit 211 is connected to the first signal input end TS11, and is configured to input a first predetermined voltage to the first temperature measurement line TS1; the first signal output end TS12 is connected to the first voltage dividing resistor circuit 212; and the first signal processing unit 213 is connected to the first voltage dividing resistor circuit 212, and is configured to process the electrical signal from the first voltage dividing resistor circuit 212 to obtain the first temperature measurement information.

[0109] In the above scheme, the first temperature measurement line TS1 is connected to the driving circuit 200 at both ends, wherein the first signal input end TS11 is configured as an input voltage end, and the first signal output end TS12 is connected to the first signal processing unit 213 through the first voltage dividing resistor circuit 212. In this way, the resistance of the first temperature measurement line TS1 changes with the change of temperature, and the resistance voltage dividing in the first temperature measurement circuit 210 changes accordingly. The first signal processing unit 213 obtains the resistance voltage dividing change signal of the first temperature measurement line TS1, and calculates the current temperature of the first temperature measurement line TS1, thereby realizing the temperature detection of the first temperature measurement line TS1.

[0110] Figure 14 The test resistance of the metal trace changes with the change of temperature. As shown in Figure 14 For example, the temperature change range is-20℃-80℃, and the resistance value of the metal trace changes by about 1K ohm. As shown in Figure 15 After the normalization correction of the test data, the resistance of the metal trace changes with the change of temperature in a substantially linear relationship. If the resistance is too large, the resistance value of the first temperature measurement line TS1 changes too small with the change of temperature, and the first temperature measurement circuit 210 can not be able to collect the resistance change data.

[0111] In the actual first temperature measurement circuit 210, the first temperature measurement circuit 210 further includes a connection lead wire in addition to the first temperature measurement line TS1 and the first voltage dividing resistor circuit 212, and the temperature detection accuracy is affected by the resistance value of the connection lead wire.

[0112] As shown in Figure 10 The resistance value of the first temperature measurement line TS1 is set as R1, the resistance value of the first connection lead wire 214 in the first temperature measurement circuit 210 in addition to the first temperature measurement line TS1 and the first voltage dividing resistor circuit 212 is r1=r11+r12, and R0 is the voltage dividing resistance in the first voltage dividing resistor circuit 212.

[0113] According to the voltage dividing formula of the voltage dividing circuit: It can be seen that the smaller the resistance ratio of the resistance r1 of the first connecting lead 214, the smaller the influence on temperature detection. Therefore, in order to ensure the temperature detection accuracy of the first temperature detection circuit 210, the resistance value of the first temperature detection line TS1 can be controlled to be 10-100 times of the resistance value r1 of the connecting lead.

[0114] When the resistance value ratio of the connecting lead is R1 / r1=10, the error increases by about 5℃ when the temperature changes by 50℃; when R1 / r1=100, the error increases by about 0.5℃ when the temperature changes by 50℃. Therefore, the resistance value r1 of the first connecting lead 214 can be 10-1000Ω. At the same time, if the resistance of the first connecting lead 214 is too large, the current will be too small, which may exceed the ADC (Analog-to-Digital Converter, ADC) voltage detection range of the driving circuit 200 (the ADC voltage detection range is generally 0-5V). Therefore, in summary, the resistance value of the first temperature detection line TS1 can be 1KΩ-100KΩ. For example, in some embodiments, the resistance value of the first temperature detection line TS1 at room temperature can be 6.3KΩ.

[0115] In addition, without increasing the external voltage, the power supply of the first temperature detection circuit 210 can use a power supply voltage (VSP voltage), in other words, the first voltage input circuit 211 can be a power supply voltage circuit. For example, the first predetermined voltage input by the first voltage input circuit 211 to the first temperature detection line TS1 can be 6V.

[0116] The ADC voltage detection range of the driving circuit 200 is generally 0-5V. The first voltage dividing resistor 215 in the first voltage dividing resistor circuit 212 can also be designed to be 1KΩ-100KΩ. In this way, when the temperature changes from -20℃ to 80℃, the voltage change range of the first voltage dividing resistor 215 is about 1-3V, which falls within the ADC voltage detection range of the driving circuit 200.

[0117] In addition, in some exemplary embodiments, as shown in Figure 8 The driving circuit 200 further includes a display driving circuit 230 for controlling the display driving voltage and the display timing. The display driving circuit 230 is connected to the first temperature detection circuit 210, and the display driving circuit 230 is configured to adjust the display driving voltage and the display timing based on the first temperature detection information. In this way, the adaptive adjustment of the display panel can be realized based on the temperature change obtained by the first temperature detection information.

[0118] For example, the display driving circuit 230 is specifically configured to:

[0119] when the current temperature value T0 of the first temperature sensing line TS1 is less than the first upper limit temperature threshold T1 and greater than the first lower limit temperature threshold T2, driving the pixel circuit with an initial display driving voltage and an initial timing duty cycle;

[0120] when the current temperature value T0 of the first temperature sensing line TS1 is greater than or equal to the first upper limit temperature threshold T1, reducing the display driving voltage compared to the initial display driving voltage;

[0121] when the current temperature value T0 of the first temperature sensing line TS1 is less than or equal to the first lower limit temperature threshold T2, increasing the display timing duty cycle compared to the initial timing duty cycle.

[0122] In some exemplary embodiments, the non-bound side B2 of the peripheral area B is further provided with an array substrate gate drive circuit (Gate of Active, GOA). The first temperature sensing line TS1 is arranged on the non-bound side B2 and located at the periphery of the GOA circuit 300, and the first temperature sensing line TS1 is mainly used for detecting the temperature of the GOA circuit 300.

[0123] In order to improve the transmittance of the display panel and achieve high-brightness display, the width of the wire in the display panel is designed to be close to the limit. If the timing duty cycle (CLK duty) is set according to the conventional timing, a serious sensor horizontal stripe (sensor horizontal stripe) will occur.

[0124] In order to solve the above-mentioned sensor horizontal stripe problem, it is necessary to greatly reduce the timing duty cycle (CLK duty). When CLKduty is too small, the display panel cannot be normally started in a low-temperature environment. If the normal start of the display panel is ensured by increasing the gate voltage (Gate voltage), the power consumption will be greatly increased, which does not meet the current low-power consumption requirement. Therefore, in a low-temperature environment, the normal start of the display panel can be ensured by increasing the timing duty cycle (CLK duty).

[0125] When the display panel operates in a high-temperature environment, high-temperature crosstalk (Crosstalk) defects and bound side B1 (DP) shadow defects are prone to occur. Therefore, for the high-temperature crosstalk and DP shadow defects, the above-mentioned solution is improved by reducing the display driving voltage, for example, reducing the display driving voltage VGLO (Vertical Gate Line On) and the Gate voltage. At the same time, reducing the display driving voltage VGLO and the Gate voltage can also reduce the power consumption.

[0126] The driving process of the display panel in the above-mentioned solution can be as follows:

[0127] After the display panel is powered on, the first temperature measuring line TS1 detects the temperature of the GOA circuit 300 in real time, and the first upper temperature threshold T1 and the first lower temperature threshold T2 are preset in the driving circuit 200; when the current temperature value T0 of the first temperature measuring line TS1 is greater than or equal to the first upper temperature threshold T1, it is determined that the current display panel is working in a high-temperature environment, and the driving circuit 200 can change the related register setting in linkage to reduce the display driving voltage until the current temperature value T0 of the first temperature measuring line TS1 is detected to be greater than the first lower temperature threshold T2 and less than the first upper temperature threshold T1, and then the driving circuit 200 automatically restores the display driving voltage to the initial setting value, that is, the initial display driving voltage;

[0128] When the current temperature value T0 of the first temperature measuring line TS1 is less than or equal to the first lower temperature threshold T2, it is determined that the current display panel is working in a low-temperature environment, and the driving circuit 200 changes the related register setting in linkage to improve the timing duty cycle to ensure the normal start of the display panel, until the current temperature value T0 of the first temperature measuring line TS1 is detected to be greater than the first lower temperature threshold T2 and less than the first upper temperature threshold T1, and then the driving circuit 200 automatically restores to the initial timing duty cycle.

[0129] In some embodiments, as shown in Figure 1 , Figure 3 and Figure 7 , the first temperature measuring line TS1 is located at the periphery of the GOA circuit 300. In addition, the non-bonding side B2 of the peripheral area B is also provided with a ground line (GND) 600, and the ground line 600 is located at the periphery of the first temperature measuring line TS1.

[0130] In addition, as shown in Figure 7 , the non-bonding side B2 of the peripheral area B is also provided with a common voltage (Vcom) signal line 400, which can provide a reference voltage for pixel display to ensure that the display substrate can correctly and stably display images, thereby optimizing the image quality and avoiding distortion. Wherein, the first temperature measuring line TS1 can be located at the periphery of the common voltage signal line 400.

[0131] In addition, in some exemplary embodiments, as shown in Figure 8 and Figure 9As shown, the second temperature measuring line TS2 includes a second signal input end TS21, a second signal output end TS22, and a second main body trace TS23 between the second signal input end TS21 and the second signal output end TS22, and the second main body trace TS23 is configured as a serpentine trace formed by multiple times of winding back and forth from the second signal input end TS21 to the second signal output end TS22.

[0132] In this way, the second temperature measuring line TS2 can be connected to the second temperature measuring circuit 220 through the second signal input end TS21 and the second signal output end TS22 on the binding side B1, and the second temperature measuring line TS2 is configured as a serpentine trace, so that the length of the second temperature measuring line TS2 can be increased as much as possible in a small space to increase the resistance of the second temperature measuring line TS2. It can be understood that the wiring mode of the second temperature measuring line TS2 is not limited thereto.

[0133] In addition, it should be noted that the driving circuit 200 can include a driving chip (IC) 201 bound to the binding side B1, and a circuit board (FPC) 202, the second temperature measuring line TS2 and the driving chip 201 are at least partially overlapped in the orthographic projection on the substrate 100, and in the direction perpendicular to the substrate 100, the second temperature measuring line TS2 is located between the driving chip 201 and the substrate 100. In this way, the second temperature measuring line TS2 can more accurately reflect the temperature of the driving chip 201. Of course, it can be understood that the arrangement position of the second temperature measuring line TS2 is not limited thereto.

[0134] In some embodiments, as shown in Figure 1 , Figure 4 and Figure 5 , the binding side B1 is provided with a plurality of first binding pins 410 for binding and connecting the circuit board 202, and the second signal input end TS21 and the second signal output end TS22 are respectively connected to the first temperature measuring circuit 210 through the corresponding two first binding pins 410.

[0135] As shown in Figure 4 and Figure 5 , the binding side B1 is also provided with a plurality of second binding pins 420 for binding and connecting the driving chip 201; wherein, in the direction from the display area AA to the binding side B1, the second main body trace TS23 is located between the second binding pin 420 and the display area AA, and the second signal input end TS21 and the second signal output end TS22 pass through the gap between the second binding pin 420 to connect to the second temperature measuring circuit 220 on the circuit board 202.

[0136] It is understood that the connection method between the second temperature measuring line TS2 and the second temperature measuring circuit 220 is not limited to this.

[0137] Furthermore, in some exemplary embodiments of this disclosure, the driving circuit 200 includes a backlight driving circuit 240 for driving the backlight module, the backlight driving circuit 240 being connected to the second temperature measuring circuit 220, and the backlight driving circuit 240 being configured to adjust the backlight driving signal based on the second temperature measuring information.

[0138] For example, the backlight driving circuit 240 is configured to: reduce the backlight current relative to the initial backlight current when the current temperature value T0 of the second temperature measuring line TS2 is greater than or equal to the second upper limit temperature threshold.

[0139] like Figure 12 As shown, when the display panel 10 and the backlight module 20 are assembled to form a display device, the backlight module 20 may include a lamp board 21, on which lamp beads 22 are provided. The lamp board 21 may be located on the bonding side B1, and in the direction perpendicular to the substrate 100, the second temperature measuring line TS2 is positioned corresponding to the position of the lamp board 21.

[0140] Using the above solution, the lamp port temperature of the backlight module 20 can be detected through the second temperature measuring line TS2 and the second temperature measuring circuit 220. When the lamp port temperature is too high, the backlight current is reduced to solve the problem of film wrinkling caused by the excessive lamp port temperature.

[0141] For example, such as Figure 8 and Figure 9 As shown, the second temperature measuring circuit 220 includes a second voltage input circuit 221, a second voltage divider resistor circuit 222, and a second signal processing unit 223. The second temperature measuring line TS2 includes a second signal input terminal TS21 and a second signal output terminal TS22.

[0142] The second voltage input circuit 221 is connected to the second signal input terminal TS21, and the second voltage input circuit 221 is used to input a second predetermined voltage onto the second temperature measuring line TS2; the second signal output terminal TS22 is connected to the second voltage divider resistor circuit 222; the second signal processing unit 223 is connected to the second voltage divider resistor circuit 222, and the second signal processing unit 223 is used to process the electrical signal from the second voltage divider resistor circuit 222 to obtain the second temperature measurement information.

[0143] In the above scheme, the two ends of the second temperature sensing line TS2 are connected to the driving circuit 200, wherein the second signal input terminal TS21 serves as the input voltage terminal, and the second signal output terminal TS22 is connected to the second signal processing unit 223 through the second voltage divider resistor circuit 222. Thus, as the temperature changes, the resistance of the second temperature sensing line TS2 changes, and the voltage division in the second temperature sensing circuit 220 changes accordingly. The second signal processing unit 223 acquires the voltage division change signal of the second temperature sensing line TS2 to calculate the current temperature of the second temperature sensing line TS2, thereby realizing the temperature detection of the second temperature sensing line TS2.

[0144] Figure 14 The figure shows the test resistance of the metal trace as a function of temperature.

[0145] like Figure 14 As shown, taking a temperature range of -20℃ to 80℃ as an example, the resistance of the metal trace changes by approximately 1K ohms. Meanwhile, as... Figure 15 As shown, after normalizing the test data, the resistance of the metal trace changes approximately linearly with temperature. If the resistance is too high, the resistance value of the second temperature sensing line TS2 will change too little with temperature, and the second temperature sensing circuit 220 may not be able to collect the resistance change data. In the actual second temperature sensing circuit 220, the second temperature sensing circuit 220 also includes a second connecting lead 224 in addition to the second temperature sensing line TS2 and the second voltage divider resistor circuit 222. The temperature detection accuracy will be affected by the resistance value of the second connecting lead 224.

[0146] Please see Figure 11 As shown, the resistance value of the second temperature measuring line TS2 is set to R2, and the resistance value of the second connecting lead 224 in the second temperature measuring circuit 220 other than the second temperature measuring line TS2 and the second voltage divider resistor circuit 222 is r2 = r21 + r22. R0 is the voltage divider resistor in the second voltage divider resistor circuit 222.

[0147] According to the voltage divider formula for a voltage divider circuit: It is known that the smaller the resistance value r2 of the second connecting lead 224, the smaller its impact on temperature detection. Therefore, in order to ensure the temperature detection accuracy of the second temperature measuring circuit 220, the resistance value of the second temperature measuring line TS2 can be controlled to be 10 to 100 times the resistance value r2 of the second connecting lead 224.

[0148] When the resistance value of the second connecting lead 224 accounts for R2 / r2=10, the error increases by about 5℃ when the temperature changes by 50℃; when R2 / r2=100, the error increases by about 0.5℃ when the temperature changes by 50℃. Therefore, the resistance value r2 of the connecting lead can be 10-1000Ω.

[0149] Meanwhile, if the resistance value r2 of the second connecting lead 224 is too large, the current will be too small, which can exceed the ADC (Analog-to-Digital Converter) voltage detection range of the driving circuit 200 (the ADC voltage detection range is generally 0-5V).

[0150] Therefore, in summary, the resistance value of the first temperature measuring line TS1 can be 1KΩ-100KΩ. For example, in some embodiments, the resistance value of the first temperature measuring line TS1 at room temperature can be 4.6KΩ.

[0151] In addition, without increasing the applied voltage, the power supply of the second temperature measuring circuit 220 can use a power supply voltage (VSP voltage). In other words, the second voltage input circuit 221 can be a power supply voltage circuit. For example, the second predetermined voltage input by the second voltage input circuit 221 to the second temperature measuring line TS2 can be 6V.

[0152] The ADC voltage detection range of the driving circuit 200 is generally 0-5V. The second voltage dividing resistor 225 in the second voltage dividing resistor circuit 222 can also be designed to be 1KΩ-100KΩ. In this way, when the temperature changes from -20℃ to 80℃, the voltage change range of the second voltage dividing resistor 225 is about 1-3V, which falls within the ADC voltage detection range of the driving circuit 200.

[0153] In some embodiments, the first voltage dividing resistor circuit 212 in the first temperature measuring circuit 210 can be arranged on the circuit board 202, and the first signal processing unit 213 can be arranged on the driving chip 201; similarly, the second voltage dividing resistor circuit 222 in the second temperature measuring circuit 220 can be arranged on the circuit board 202, and the second signal processing unit 223 can be arranged on the driving chip 201. However, it is not limited thereto.

[0154] In addition, the first voltage dividing resistor circuit 212 and the second voltage dividing resistor circuit 222 can be connected to the first signal processing unit 213 and the second signal processing unit 223, respectively, through the corresponding two first binding pins 410 (such as the DMY_A12 and DMY_A11 pins in the figure).

[0155] In addition, in some exemplary embodiments, as shown in FIG. 4, the first temperature measuring line TS1 and the second temperature measuring line TS2 can be connected to the first binding pin 410 (such as the DMY_A12 pin in the figure) and the second binding pin 420 (such as the DMY_A11 pin in the figure) of the driving chip 201, respectively. Figure 2As shown, at least a light-sensing thin-film transistor 500 is provided at the non-bound side B2 for detecting ambient brightness. For example Figure 2 As shown, the light-sensing thin-film transistor 500 can be provided at the opposite side of the bound side B1. The light-sensing thin-film transistor 500 can be integrated in the display panel 10. However, it is not limited thereto.

[0156] The light-sensing function of the light-sensing thin-film transistor 500 is used to realize ALS (Ambient Light Sensor) detection. The specific ALS detection principle is as follows: due to the light-sensing characteristics of the thin-film transistor, the drain current of the thin-film transistor changes with temperature. By detecting the change of the drain current of the light-sensing thin-film transistor 500 under different light, the illuminance of the ambient light can be calculated.

[0157] However, the change of the drain current of the thin-film transistor is not only affected by light, but also by temperature. The higher the temperature, the greater the change of the drain current of the thin-film transistor. Therefore, when the display panel 10 works in a high-temperature environment, the detection accuracy of the ambient light will drift, and the lower the ambient light illuminance, the greater the drift. In practical applications, in a low-illuminance, high-temperature working environment, the accuracy drift of ALS detection exceeds 15% of the allowable range (Spec).

[0158] In order to improve the above problems, in some embodiments of the present disclosure, as shown in Figure 8 As shown, the driving circuit 200 further comprises a display driving circuit 230; wherein the display driving circuit 230 is connected with the light-sensing thin-film transistor 500 and the first temperature measuring circuit 210 respectively, and the display driving circuit 230 is configured to:

[0159] Pre-storing the corresponding relationship between the temperature of the light-sensing thin-film transistor 500 and the brightness correction value;

[0160] Obtaining brightness detection information based on the light-sensing thin-film transistor 500;

[0161] Obtaining a brightness correction value according to the first temperature measurement information and the corresponding relationship;

[0162] Correcting the brightness detection information based on the brightness correction value to obtain actual brightness information.

[0163] Using the above scheme, real-time temperature detection can be performed based on the first temperature measuring line TS1 set on the non-bonding side B2. The photosensitive thin-film transistor 500 for ALS detection can be set in the peripheral area B and located on the opposite side of the bonding side B1. The first temperature measuring line TS1 can be located on the periphery of the photosensitive thin-film transistor 500 to accurately detect the temperature of the photosensitive thin-film transistor 500. The correspondence between the temperature of the photosensitive thin-film transistor 500 and the brightness correction value is pre-stored in the display driving circuit 230. When brightness detection information is actually obtained based on the photosensitive thin-film transistor 500, the brightness correction value can be obtained according to the first temperature measurement information and the correspondence. The brightness correction value is then incorporated into the ALS detection algorithm to eliminate the influence of temperature on the accuracy of ALS detection and improve the accuracy of ALS detection.

[0164] It should be noted that the photosensitive thin-film transistor 500 is close to the first temperature measuring line TS1, and there are no heat-generating devices around them. Therefore, the temperature detected by the first temperature measuring line TS1 can actually reflect the temperature of the photosensitive thin-film transistor 500.

[0165] like Figure 7 As shown, in some embodiments, the Vcom signal line 400 may be located between the photosensitive thin-film transistor 500 and the first temperature measurement line TS1.

[0166] In addition, other peripheral wiring such as electrostatic rings may be provided in the peripheral area B, and the arrangement of peripheral wiring in the peripheral area B is not limited to this.

[0167] In some embodiments, obtaining the brightness correction value based on the first temperature measurement information and the corresponding relationship specifically includes:

[0168] According to different preset temperature ranges, the corresponding relationship is divided into N piecewise functions, and the leakage current of the photosensitive sensor in each piecewise function has a linear relationship with the temperature;

[0169] Calculate the slope Kn of each of the N piecewise functions according to the formula Kn=(In+1-In) / 5;

[0170] Based on the slope and the resistance value of the first temperature measuring line TS1, the corresponding brightness correction value for each temperature range is calculated.

[0171] The photosensitive thin-film transistor 500 can be an a-Si thin-film transistor. Taking an a-Si thin-film transistor as an example, the schematic diagram of the leakage current of the photosensitive thin-film transistor 500 as a function of temperature is shown in the figure. The leakage current curve of the photosensitive thin-film transistor 500 as a function of temperature within a certain temperature range under low illumination is divided into N segments. The relationship between leakage current and temperature in each segment can be considered as a linear relationship, resulting in N piecewise functions with corresponding leakage current values ​​from I1 to In+1. The slopes of the curves corresponding to the N piecewise functions are K1 to KN, where Kn = (In+1 - In) / 5.

[0172] Let the current temperature detected by the first temperature sensing line TS1 be T0, and the ALS detection sampling resistance value be R. 采样 Then, the brightness correction value affected by temperature change in ALS detection can be calculated as F(T0). Therefore, based on the actual light sensing value F(G) of ALS detection, the brightness correction value F(T0) affected by temperature can be subtracted to obtain the corrected accurate actual brightness value F, that is, F = F(G) - F(T0).

[0173] like Figure 13 As shown, taking the temperature range of 25℃ to 70℃ as an example, the corresponding leakage current values ​​are I1 to I10, and the brightness correction values ​​F(T0) corresponding to the 9 piecewise functions are as follows:

[0174] When T0 < 25℃, F(T0) = 0

[0175] When T0 = 25℃~30℃, F(T0) = [(T0-25) / K1+I1-I1]×R 采样 ;

[0176] When T0 = 30℃~35℃, F(T0) = [(T0-30) / K2+I2-I1]×R 采样 ;

[0177] When T0=35℃~40℃, F(T0)=[(T0-35) / K3+I3-I1]×R 采样 ;

[0178] When T0=40℃~45℃, F(T0)=[(T0-40) / K4+I4-I1]×R 采样 ;

[0179] When T0 = 45℃~50℃, F(T0) = [(T0-45) / K5+I5-I1]×R 采样 ;

[0180] When T0 = 50℃~55℃, F(T0) = [(T0-50) / K6+I6-I1]×R 采样 ;

[0181] T0= 55℃~60℃, F(T0) = [(T0-55) / K7 + I7 - I1] * R 采样 ;

[0182] T0= 60℃~65℃, F(T0) = [(T0-60) / K8 + I8 - I1] * R 采样 ;

[0183] T0=>65℃, F(T0) = [(T0-65) / K9 + I9 - I1] * R 采样 .

[0184] It should be noted that the above is only an example, and the value of n is not limited. The larger the value of n, the finer the curve division, and the higher the detection accuracy.

[0185] In addition, in some exemplary embodiments, the display panel 10 includes a gate metal layer on the substrate 100, and a pattern of the gate metal layer can include a gate, a gate line, etc., wherein the first temperature measurement line TS1 and the second temperature measurement line TS2 can be located on the gate metal layer. However, it is not limited thereto.

[0186] In addition, as Figure 12 indicated, the display device provided by the embodiment of the present disclosure also includes:

[0187] The display panel 10 provided by the embodiment of the present disclosure; and

[0188] The backlight module 20 provided on the non-display side of the display panel 10, wherein the backlight module 20 includes a lamp plate 21, the lamp plate 21 is provided on the binding side B1, and in a direction perpendicular to the substrate 100, the second temperature measurement line TS2 is arranged corresponding to the position of the lamp plate 21.

[0189] The display device includes but is not limited to a smart phone, a display, a notebook computer, a tablet computer, an electronic photo frame, a driving recorder, a smart wearable device, and other devices with display functions. Other essential components of the display device should be understood by those skilled in the art, and are not described here. It should not be considered as a limitation on the present disclosure.

[0190] Since the principle of solving the problem of the display device is similar to the principle of solving the problem of the above-mentioned display panel 10, the embodiments of the display device provided by the embodiment of the present disclosure can refer to the above-mentioned embodiments of the display panel 10 provided by the embodiment of the present disclosure, and will not be described here.

[0191] In addition, the embodiment of the present disclosure provides a driving method of a display device, which is applied to the display device of the embodiment of the present disclosure, and the driving method includes:

[0192] Step S01, obtaining first temperature measurement information of the first temperature measurement line TS1; and / or, obtaining second temperature measurement information of the second temperature measurement line TS2;

[0193] Step S02, driving the display device based on the first temperature measurement information and / or the second temperature measurement information.

[0194] Exemplarily, the above step S02 specifically comprises: adjusting the display driving voltage and display timing based on the first temperature measurement information.

[0195] Exemplarily, the above step S02 specifically comprises:

[0196] Step S021, when the current temperature value T0 of the first temperature measurement line TS1 is less than a first upper limit temperature threshold T1 and greater than a first lower limit temperature threshold T2, driving the pixel circuit with an initial display driving voltage and an initial timing duty cycle;

[0197] Step S022, when the current temperature value T0 of the first temperature measurement line TS1 is greater than or equal to the first upper limit temperature threshold T1, reducing the display driving voltage compared with the initial display driving voltage;

[0198] Step S023, when the current temperature value T0 of the first temperature measurement line TS1 is less than or equal to the first lower limit temperature threshold T2, increasing the display timing duty cycle compared with the initial timing duty cycle.

[0199] Exemplarily, the above step S02 specifically further comprises: adjusting the backlight driving signal based on the second temperature measurement information.

[0200] Exemplarily, the above step S02 specifically comprises:

[0201] When the current temperature value T0 of the second temperature measurement line TS2 is greater than or equal to a second upper limit temperature threshold, reducing the backlight current relative to an initial backlight current;

[0202] When the current temperature value T0 of the second temperature measurement line TS2 is less than the second upper limit temperature threshold, driving the backlight module 20 with the initial backlight current.

[0203] Exemplarily, the above step S02 specifically further comprises:

[0204] Pre-storing a corresponding relationship between the temperature of the light-sensing thin film transistor 500 and a brightness correction value;

[0205] Obtaining brightness detection information based on the light-sensing thin film transistor 500;

[0206] Obtaining a brightness correction value according to the first temperature measurement information and the corresponding relationship;

[0207] correct the luminance detection information based on the luminance correction value to obtain actual luminance information.

[0208] Since the problem-solving principle of the driving method of the display device is similar to the problem-solving principle of the display panel 10, the embodiments of the driving method of the display device provided by the embodiments of the present disclosure can refer to the embodiments of the display panel 10 provided by the embodiments of the present disclosure, which will not be repeated here.

[0209] In addition, the embodiments of the present disclosure provide a driving circuit 200 of a display device, comprising a memory for storing an executable program and a processor configured to run the executable program to implement the steps of the driving method of the display device as described above.

[0210] In addition, the embodiments of the present disclosure provide a computer-readable storage medium, which stores an executable program, and the executable program is run by a processor to implement the steps of the driving method of the display device as described above.

[0211] The computer-readable storage medium described above, since the computer program stored in the memory thereof is executed by the processor to implement the steps in the above-mentioned method embodiments, by analogy, it can refer to the embodiments of the display panel 10 provided by the embodiments of the present disclosure, which will not be repeated here.

[0212] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by a computer program instructing related hardware, and the computer program can be stored in a non-volatile computer readable storage medium. When the computer program is executed, it can include the processes of the above-mentioned method embodiments. Any reference to memory, storage, database or other medium used in the embodiments provided by the present disclosure can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory or optical memory, etc. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.

[0213] The following points need to be explained:

[0214] (1) The drawings of the embodiments of the present disclosure only relate to the structures involved in the embodiments of the present disclosure, and other structures can be referred to the general design.

[0215] (2) In the drawings used to describe the embodiments of the present disclosure, the thickness of a layer or region is exaggerated or reduced for clarity, i.e., the drawings are not drawn according to the actual scale. It can be understood that when an element such as a layer, film, region or substrate is referred to as being "on" or "under" another element, it can be "directly" on or under the other element or there can be an intermediate element.

[0216] (3) In the case of no conflict, the embodiments of the present disclosure and the features in the embodiments can be combined with each other to obtain new embodiments.

[0217] The above is only a specific embodiment of the present disclosure, but the protection scope of the present disclosure is not limited thereto, and the protection scope of the present disclosure should be subject to the protection scope of the claims.

Claims

1. A display panel, characterized by, The display panel comprises a substrate, the substrate comprises a display area and a peripheral area surrounding the display area, the peripheral area comprises a binding side on at least one side of the display area and a non-binding side other than the binding side, and a driving circuit is connected to the binding side; A first temperature measurement line is arranged in the peripheral area, the first temperature measurement line is located on the non-binding side, the driving circuit comprises a first temperature measurement circuit, the first temperature measurement line is connected to the first temperature measurement circuit, and the first temperature measurement circuit is used to obtain first temperature measurement information of the first temperature measurement line; and / or A second temperature measurement line is arranged in the peripheral area, the second temperature measurement line is located on the binding side, the driving circuit comprises a second temperature measurement circuit, the second temperature measurement line is connected to the second temperature measurement circuit, and the second temperature measurement circuit is used to obtain second temperature measurement information of the second temperature measurement line.

2. The display panel of claim 1, wherein, The first temperature measurement line comprises a first signal input end, a first signal output end, and a first main body trace between the first signal input end and the first signal output end, the first signal input end and the first signal output end are arranged on the binding side, and the first main body trace is arranged around the periphery of the display area.

3. The display panel of claim 1, wherein, The first temperature measurement circuit is configured to obtain the first temperature measurement information of the first temperature measurement line based on resistance change information of the first temperature measurement line.

4. The display panel of claim 3, wherein, The first temperature measurement circuit comprises a first voltage input circuit, a first voltage dividing resistance circuit, and a first signal processing unit, and the first temperature measurement line comprises a first signal input end and a first signal output end; wherein The first voltage input circuit is connected to the first signal input end, and is used to input a first predetermined voltage to the first temperature measurement line; The first signal output end is connected to the first voltage dividing resistance circuit; The first signal processing unit is connected to the first voltage dividing resistance circuit, and is used to process an electrical signal from the first voltage dividing resistance circuit to obtain the first temperature measurement information.

5. The display panel of claim 4, wherein, The resistance value of the first temperature measurement line is R1, and the resistance value of a connecting lead wire in the first temperature measurement circuit other than the first temperature measurement line and the first voltage dividing resistance circuit is r1, wherein R1 is 10-100 times of r1.

6. The display panel of claim 5, wherein, R1 is 1KΩ-100KΩ; r1 is 10-1000Ω.

7. The display panel of claim 4, wherein, The first predetermined voltage is 6V.

8. The display panel of claim 1, wherein, The driving circuit further comprises a display driving circuit for controlling a display driving voltage and a display timing, the display driving circuit is connected to the first temperature measurement circuit, and the display driving circuit is configured to adjust the display driving voltage and the display timing based on the first temperature measurement information.

9. The display panel of claim 8, wherein, The display driving circuit is specifically configured to: when the current temperature value of the first temperature measurement line is less than a first upper limit temperature threshold and greater than a first lower limit temperature threshold, drive the pixel circuit with an initial display driving voltage and an initial timing duty cycle; when the current temperature value of the first temperature measurement line is greater than or equal to the first upper limit temperature threshold, reduce the display driving voltage compared with the initial display driving voltage; When the current temperature value of the first temperature measuring line is less than or equal to the first lower temperature threshold, the display timing duty cycle is increased compared with the initial timing duty cycle.

10. The display panel of claim 1, wherein, The non-bound side of the peripheral region is further provided with an array substrate gate drive circuit, and the first temperature measuring line is located in the periphery of the array substrate gate drive circuit.

11. The display panel of claim 1, wherein, The non-bound side of the peripheral region is further provided with a ground line, and the ground line is located in the periphery of the first temperature measuring line.

12. The display panel of claim 1, wherein, The second temperature measuring line comprises a second signal input end, a second signal output end, and a second main body trace located between the second signal input end and the second signal output end, and the second main body trace is configured as a serpentine trace formed by multiple times of winding and bending from the second signal input end to the second signal output end.

13. The display panel of claim 12, wherein, The driving circuit comprises a driving chip and a circuit board, and the bound side is provided with a plurality of first binding pins for binding and connecting the circuit board, and the second signal input end and the second signal output end are connected to the first temperature measuring circuit through the corresponding two first binding pins respectively.

14. The display panel of claim 13, wherein, The second temperature measuring line and the driving chip are at least partially overlapped in the orthographic projection on the substrate, and in the direction perpendicular to the substrate, the second temperature measuring line is located between the driving chip and the substrate.

15. The display panel of claim 14, wherein, The bound side is further provided with a plurality of second binding pins for binding and connecting the driving chip; wherein, in the direction from the display region to the bound side, the second main body trace is located between the second binding pins and the display region, and the second signal input end and the second signal output end pass through the gap between the second binding pins to be connected to the second temperature measuring circuit on the circuit board.

16. The display panel of claim 1, wherein, The driving circuit comprises a backlight driving circuit for driving a backlight module, the backlight driving circuit is connected with the second temperature measuring circuit, and the backlight driving circuit is configured to adjust a backlight driving signal based on the second temperature measuring information.

17. The display panel of claim 16, wherein, The backlight driving circuit is configured to specifically reduce the backlight current relative to the initial backlight current when the current temperature value of the second temperature measuring line is greater than or equal to a second upper temperature threshold.

18. The display panel of claim 1, wherein, The second temperature measuring circuit comprises a second voltage input circuit, a second voltage dividing resistor circuit and a second signal processing unit, and the second temperature measuring line comprises a second signal input end and a second signal output end; wherein, The second voltage input circuit is connected to the second signal input end, and the second voltage input circuit is used for inputting a second predetermined voltage to the second temperature measuring line; The second signal output end is connected to the second voltage dividing resistor circuit; The second signal processing unit is connected with the second voltage dividing resistor circuit, and the second signal processing unit is used for processing the electrical signal from the second voltage dividing resistor circuit to obtain the second temperature measuring information.

19. The display panel of claim 18, wherein, The resistance value of the second temperature measuring line is R2, and the resistance value of the connecting lead in the second temperature measuring circuit except the second temperature measuring line and the second voltage dividing resistor circuit is r2, wherein R2 is 10-100 times of r2.

20. The display panel of claim 19, wherein, R2 is 1KΩ-100KΩ; r2 is 10-1000Ω.

21. The display panel of claim 18, wherein, The second predetermined voltage is 6V.

22. The display panel of claim 1, wherein, At least on the non-bonding side, a light-sensing thin film transistor for detecting ambient brightness is provided, and the driving circuit comprises a display driving circuit; The display driving circuit is connected with the light-sensing thin film transistor and the first temperature measuring circuit respectively, and is configured to: Pre-storing a corresponding relationship between the temperature of the light-sensing thin film transistor and a brightness correction value; Obtaining brightness detection information based on the light-sensing thin film transistor; Obtaining a brightness correction value according to the first temperature measuring information and the corresponding relationship; Correcting the brightness detection information based on the brightness correction value to obtain actual brightness information.

23. A display device comprising: The display panel comprises: The display panel according to any one of claims 1 to 22; The backlight module provided on the non-display side of the display panel, wherein the backlight module comprises a lamp plate, the lamp plate is provided on the bonding side, and the second temperature measuring line is arranged corresponding to the position of the lamp plate in the direction perpendicular to the substrate. ​

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