Multifunctional phase-locked frequency synthesizer chip testing device

Abstract

The utility model discloses a multifunctional chip testing device for a phase-locked frequency synthesizer, and relates to the field of chip testing. Comprising a phase-locked frequency synthesizer chip circuit, an MCU instruction conversion unit, a frequency instruction input circuit, a frequency output test end, a current detection change-over switch, a liquid crystal display control unit, a control instruction change-over unit, a second digital source meter, a VDDO power supply change-over switch, a power supply change-over switch, an MCU change-over switch and a first digital source meter. According to the multifunctional phase-locked frequency synthesizer chip testing device of the utility model, a comprehensive and flexible testing platform is provided for a user by integrating various high-precision measuring instruments and digital source meters, and the multifunctional phase-locked frequency synthesizer chip testing device can help the user to deeply understand the working principle and performance indexes of a phase-locked frequency synthesizer chip, and can also be used for testing the phase-locked frequency synthesizer chip. And the method can provide powerful support for design optimization, performance evaluation and application type selection of the chip, is easy to operate, can provide a friendly user interface and abundant debugging tools, and is convenient for scientific research and teaching.

Description

Technical Field

[0001] This utility model relates to the field of chip testing, and in particular to a multifunctional phase-locked frequency synthesizer chip testing device. Background Technology

[0002] Phase-locked frequency synthesizer (PLL) chips are an important component of modern electronic systems, widely used in numerous fields such as communications, radar, electronic countermeasures, remote control and telemetry, and instrumentation, especially in satellite navigation and communications. In wireless electronic communication systems, the PLL chip is a core component of the radio frequency transceiver system.

[0003] Traditional phase-locked loop (PLL) frequency synthesizer chips often have limited functionality, making it difficult to meet the demands of complex systems for frequency diversity and high precision. Furthermore, for research and teaching purposes, there is a lack of a comprehensive experimental platform to deeply understand and verify the principles and applications of PLL technology.

[0004] Therefore, it is necessary to propose a multifunctional phase-locked frequency synthesizer chip testing device to solve the above problems. Utility Model Content

[0005] The main purpose of this invention is to provide a multifunctional phase-locked frequency synthesizer chip testing device, which can effectively solve the problems in the background art.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is as follows:

[0007] A multifunctional phase-locked loop (PLL) frequency synthesizer chip testing device includes a PLL frequency synthesizer chip circuit, an MCU instruction conversion unit, a frequency instruction input circuit, a frequency output test terminal, a current detection switching switch, an LCD display control unit, a control instruction switching unit, a second digital source meter, a VDDO power switching switch, a power switching switch, an MCU switching switch, and a first digital source meter. The PLL frequency synthesizer chip circuit is electrically connected to the VDDO power switching switch, the frequency output test terminal, the power switching switch, and the MCU instruction conversion unit. The power switching switch is electrically connected to the first digital source meter, and the first digital source meter is electrically connected to the MCU switching switch. The MCU switching switch is electrically connected to the control instruction switching unit and the MCU instruction conversion unit. The MCU instruction conversion unit is electrically connected to the frequency instruction input circuit and the control instruction switching unit. The frequency instruction input circuit is electrically connected to the control instruction switching unit. The control instruction switching unit is electrically connected to the LCD display control unit and the VDDO power switching switch. The VDDO power switching switch and the second digital source meter are electrically connected. The power switching switch is electrically connected to the current detection switching switch, and the current detection switching switch is electrically connected to the frequency output test terminal.

[0008] Preferably, the phase-locked frequency synthesizer chip circuit is a phase-locked frequency synthesizer circuit built with MS5351 as the main chip, used to test the performance of the phase-locked frequency synthesizer circuit. The input signal of the phase-locked frequency synthesizer chip circuit comes from the instruction of the MCU instruction conversion unit, the second digital source meter is used to power the circuit, and the output signal of the phase-locked frequency synthesizer chip circuit is tested by the frequency output test terminal.

[0009] Preferably, the MCU instruction conversion unit is used to provide frequency signals to the phase-locked frequency synthesizer chip circuit and receive instructions from the liquid crystal display control unit. The liquid crystal display control unit includes 100K, 1M, and 10M buttons. The frequency instruction input circuit includes three relays. The liquid crystal display control unit converts the instructions into electrical signals through the control instruction switching unit to control the output of the three relays of the frequency instruction input circuit, so as to achieve the purpose of transmitting signals to the MCU instruction conversion unit. The frequency instruction input circuit is used to convert the 100K, 1M, and 10M button instructions output by the phase-locked frequency lock of the liquid crystal display control unit into electrical signals that can be recognized by the MCU instruction conversion unit.

[0010] Preferably, the frequency output test terminal is used to test the output signal of the phase-locked frequency synthesizer chip circuit, and the current detection switch is used for frequency output detection of the phase-locked frequency synthesizer chip circuit to facilitate testing of the output current; the LCD display control unit includes an on button.

[0011] Preferably, the liquid crystal display control unit includes a liquid crystal display screen; the liquid crystal display screen is used to display the control interface of the test device, and the corresponding circuits are switched by touching different buttons. The liquid crystal display screen is used to control the chip power supply, frequency lock-in and phase lock-in output, phase offset, MCU power supply, VDDO power supply, and current detection. Among them, the chip power supply: pressing the "on" button on the liquid crystal display screen can supply the power supply of the first digital source meter to the 1 phase lock-in frequency synthesizer chip circuit, and pressing the "off" button on the liquid crystal display screen can disconnect the power supply of the first digital source meter from the 1 phase lock-in frequency synthesizer chip circuit.

[0012] Frequency and phase locked output: Pressing 100K, 1M, or 10M on the LCD screen will output three clock signals to the given frequency. Pressing the disconnect button on the LCD screen will turn off the output of the three clock signals.

[0013] Phase Shift: Press the connection button on the LCD screen, and the frequency synthesizer will output a phase-shifted frequency in the channel. Press the off button to restore the phase shift of the channel.

[0014] MCU Power Supply: Press the power button on the LCD screen to supply power to the MCU instruction conversion unit; press the power button on the LCD screen to turn off the power to the MCU instruction conversion unit.

[0015] VDDO power supply: Press the power button on the LCD screen to supply power to the phase-locked frequency synthesizer chip circuit; press the power button to turn off the power to the phase-locked frequency synthesizer chip circuit.

[0016] Current detection: Press the power button on the LCD screen. The phase-locked frequency synthesizer chip circuit will only provide the frequency output of the channel, which is convenient for testing the output current. Press the power button again to turn off the frequency output of the channel.

[0017] Preferably, the control command switching unit is used to convert the control commands of the liquid crystal display control unit into electrical signals that can be recognized by the frequency command input circuit, the current detection switching switch, the VDDO power switching switch, the power switching switch, and the MCU switching switch.

[0018] Preferably, the second digital source meter is used to provide the VDDO voltage to the phase-locked frequency synthesizer chip circuit.

[0019] Preferably, the VDDO power switching switch includes a relay 1 controlled by the LCD control unit, used to control whether the VDDO power supply of the phase-locked frequency synthesizer chip circuit is connected; the power switching switch includes a relay 2 controlled by the LCD control unit, used to switch the power supply of the phase-locked frequency synthesizer chip circuit; the MCU switching switch includes a relay 3 controlled by the LCD control unit, used to switch the power supply of the MCU instruction conversion unit; the first digital source meter is used to provide power for the MCU power supply of the phase-locked frequency synthesizer chip circuit and the MCU instruction conversion unit.

[0020] Compared with the prior art, the present invention has the following beneficial effects:

[0021] 1. This multifunctional phase-locked loop (PLL) frequency synthesizer chip testing device integrates various high-precision measuring instruments and digital source meters, providing users with a comprehensive and flexible testing platform. It not only helps users deeply understand the working principles and performance indicators of PLL frequency synthesizer chips, but also provides strong support for chip design optimization, performance evaluation, and application selection. Furthermore, it is easy to operate, offering a user-friendly interface and abundant debugging tools, facilitating research and teaching. By integrating various functional modules, it achieves comprehensive testing and control of PLL frequency synthesizer circuits, providing strong support for research, teaching, or product development. Attached Figure Description

[0022] Figure 1This is a schematic diagram of the overall structure of this utility model;

[0023] Figure 2 This is the PCB diagram of this utility model;

[0024] Figure 3 This is a test flowchart for this utility model;

[0025] Figure 4 This is a circuit diagram of the indicator lights and power supply of the system of this utility model;

[0026] Figure 5 This is a circuit diagram of the indicator lights and power supply of the system of this utility model;

[0027] Figure 6 This is a circuit diagram of the indicator lights and power supply of the system of this utility model;

[0028] Figure 7 This is the circuit diagram of the main control MCU of this utility model;

[0029] Figure 8 This is the circuit diagram of the main control MCU of this utility model;

[0030] Figure 9 This is the circuit diagram of the relay switching control of this utility model;

[0031] Figure 10 This is the circuit diagram of the relay switching control of this utility model;

[0032] Figure 11 This utility model provides a circuit diagram showing how the chip and MCU operating voltage of 5V are reduced to 3.3V via an LDO.

[0033] Figure 12 This is a circuit diagram showing how the second digital source meter of this utility model provides a chip driving voltage of 3.3V.

[0034] In the diagram: 1. Phase-locked frequency synthesizer chip circuit; 2. MCU instruction conversion unit; 3. Frequency instruction input circuit; 4. Frequency output test terminal; 5. Current detection switch; 6. LCD display control unit; 7. Control instruction switching unit; 8. Second digital source meter; 9. VDDO power switch; 10. Power switch; 11. MCU switch; 12. First digital source meter. Detailed Implementation

[0035] To make the technical means, creative features, objectives and effects of this utility model easier to understand, the present utility model will be further described below in conjunction with specific embodiments.

[0036] like Figures 1-12As shown, a multifunctional phase-locked frequency synthesizer chip testing device includes a phase-locked frequency synthesizer chip circuit 1, an MCU instruction conversion unit 2, a frequency instruction input circuit 3, a frequency output test terminal 4, a current detection switching switch 5, an LCD display control unit 6, a control instruction switching unit 7, a second digital source meter 8, a VDDO power switching switch 9, a power switching switch 10, an MCU switching switch 11, and a first digital source meter 12. The phase-locked frequency synthesizer chip circuit 1 is electrically connected to the VDDO power switching switch 9, the frequency output test terminal 4, the power switching switch 10, and the MCU instruction conversion unit 2. The power switching switch 10 is electrically connected to the first digital source meter 12. The first digital source meter 12 is electrically connected to the MCU switch 11. The MCU switch 11 is electrically connected to the control command switching unit 7 and the MCU command conversion unit 2. The MCU command conversion unit 2 is electrically connected to the frequency command input circuit 3 and the control command switching unit 7. The frequency command input circuit 3 is electrically connected to the control command switching unit 7. The control command switching unit 7 is electrically connected to the LCD display control unit 6 and the VDDO power switch 9. The VDDO power switch 9 is electrically connected to the second digital source meter 8. The power switch 10 is electrically connected to the current detection switch 5. The current detection switch 5 is electrically connected to the frequency output test terminal 4.

[0037] Phase-locked frequency synthesizer chip circuit 1 is a phase-locked frequency synthesizer circuit built with MS5351 as the main chip. It is used to test the performance of the phase-locked frequency synthesizer circuit. The input signal of phase-locked frequency synthesizer chip circuit 1 comes from the instruction of MCU instruction conversion unit 2. The second digital source meter 8 is used to power the circuit. The output signal of phase-locked frequency synthesizer chip circuit 1 is tested by frequency output test terminal 4.

[0038] The MCU instruction conversion unit 2 provides frequency signals to the phase-locked frequency synthesizer chip circuit 1 and receives instructions from the LCD display control unit 6. The LCD display control unit 6 includes 100K, 1M, and 10M buttons. The frequency instruction input circuit 3 includes three relays. The LCD display control unit 6 converts the instructions into electrical signals through the control instruction switching unit 7 to control the output of the three relays of the frequency instruction input circuit 3, thereby transmitting the signals to the MCU instruction conversion unit 2. The frequency instruction input circuit 3 converts the 100K, 1M, and 10M button instructions output by the phase-locked frequency control unit 6 into electrical signals that can be recognized by the MCU instruction conversion unit 2.

[0039] The frequency output test terminal 4 is used to test the output signal of the phase-locked frequency synthesizer chip circuit 1. The current detection switch 5 is used for frequency output detection of the phase-locked frequency synthesizer chip circuit 1 to facilitate testing of the output current. The LCD display control unit 6 includes an on button. In the current detection area of ​​the LCD display control unit 6: pressing the on button enables the phase-locked frequency synthesizer chip circuit 1 to provide the frequency output of the channel to facilitate testing of the output current. Pressing the on button again disables the frequency output of channel 1.

[0040] The LCD display control unit 6 includes an LCD screen; the LCD screen is used to display the control interface of the test device, and the corresponding circuits can be switched by touching different buttons. The LCD screen is used to control the chip power supply, frequency lock-in and phase lock-in output, phase offset, MCU power supply, VDDO power supply, and current detection. Among them, chip power supply: pressing the "on" button on the LCD screen can supply the power supply of the first digital source meter to the 1 phase lock-in frequency synthesizer chip circuit, and pressing the "off" button on the LCD screen can disconnect the power supply of the first digital source meter from the 1 phase lock-in frequency synthesizer chip circuit.

[0041] Frequency and phase locked output: Pressing 100K, 1M, or 10M on the LCD screen will output three clock signals to the given frequency. Pressing the disconnect button on the LCD screen will turn off the output of the three clock signals.

[0042] Phase Shift: Press the connection button on the LCD screen, and the frequency synthesizer will output a phase-shifted frequency in the channel. Press the off button to restore the phase shift of the channel.

[0043] MCU Power Supply: Pressing the "On" button on the LCD screen supplies power to the MCU of MCU Instruction Conversion Unit 2; pressing the "Off" button on the LCD screen turns off the power to the MCU of MCU Instruction Conversion Unit 2.

[0044] VDDO power supply: Press the power button on the LCD screen to supply power to the phase-locked frequency synthesizer chip circuit 1, and press the power button to disconnect the power to the phase-locked frequency synthesizer chip circuit 1.

[0045] Current detection: Press the power button on the LCD screen. The phase-locked frequency synthesizer chip circuit 1 will only provide the frequency output of the channel to facilitate the test of the output current. Press the power button again to turn off the frequency output of the channel.

[0046] The control command switching unit 7 is used to convert the control commands of the LCD display control unit 6 into electrical signals that can be recognized by the frequency command input circuit 3, the current detection switching switch 5, the VDDO power switching switch 9, the power switching switch 10, and the MCU switching switch 11.

[0047] The second digital source table 8 is used to provide the VDDO voltage to the phase-locked frequency synthesizer chip circuit 1.

[0048] VDDO power switching switch 9 includes one relay, controlled by the LCD control unit 6, and is used to control whether the VDDO power supply of the phase-locked frequency synthesizer chip circuit 1 is connected; power switching switch 10 includes one relay, controlled by the LCD control unit 6, and is used to switch the power supply of the phase-locked frequency synthesizer chip circuit 1; MCU switching switch 11 includes one relay, controlled by the LCD control unit 6, and is used to switch the power supply of the MCU instruction conversion unit 2; the first digital source meter 12 is used to provide power for the MCU power supply of the phase-locked frequency synthesizer chip circuit 1 and the MCU instruction conversion unit 2.

[0049] like Figure 3 As shown, this utility model is a multifunctional phase-locked loop frequency synthesizer chip testing device:

[0050] S1: Turning on the multi-functional phase-locked frequency synthesizer chip test device means connecting the power supply of the multi-functional phase-locked frequency synthesizer chip test device to the power socket of the experimental platform and turning on the power switch of the multi-functional phase-locked frequency synthesizer chip test device. At this time, the indicator lights on the experimental circuit board will light up, the screen will light up, and it will enter the working state.

[0051] S2: Connecting the first digital source meter and setting the test parameters means connecting the red terminal FORCE_HI of the first digital source meter to SOURCE1+ of the multi-functional phase-locked frequency synthesizer chip test device, and the black terminal FORCE_LO to SOURCE1- of the multi-functional phase-locked frequency synthesizer chip test device. Set the first digital source meter to voltage source and current detection mode, set the voltage to 5V, and limit the current to 100mA. At this time, the first digital source meter supplies power to the phase-locked frequency synthesizer chip circuit 1.

[0052] S3: Connecting the second digital source meter and setting the test parameters means connecting the red terminal FORCE_HI of the second digital source meter to SOURCE2+ of the multi-function phase-locked frequency synthesizer chip test device, and the black terminal FORCE_LO to SOURCE2- of the multi-function phase-locked frequency synthesizer chip test device. Set the source meter to voltage source and current detection mode, and set the voltage to 3.3V and current limit to 100mA. At this time, the second digital source meter provides VDDO voltage to the SP-PLL multi-function phase-locked frequency synthesizer chip MS5351 chip experimental kit.

[0053] S4: Connecting the test equipment oscilloscope refers to connecting the CH1 channel of the oscilloscope to the SMA1 of the multi-functional phase-locked frequency synthesizer chip test device via the BNC jumper; connecting the CH2 channel of the oscilloscope to the SMA2 of the multi-functional phase-locked frequency synthesizer chip test device via the BNC jumper.

[0054] S5: The test method for selecting the LCD screen refers to the operation of the LCD screen: click the chip power supply touch-to-start button, the MCU power supply touch-to-start button, and the VDDO touch-to-start button on the LCD screen.

[0055] S6: Enabling the frequency lock output test of the multi-functional phase-locked frequency synthesizer chip refers to observing the waveform and frequency readings of the oscilloscope. By sequentially touching the three buttons 100K, 1M, and 10M on the LCD screen, observe and record the frequency readings of the CH1 and CH2 channels of the oscilloscope.

[0056] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claims. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. A multifunctional phase-locked frequency synthesizer chip testing device, comprising a phase-locked frequency synthesizer chip circuit (1), an MCU instruction conversion unit (2), a frequency instruction input circuit (3), a frequency output test terminal (4), a current detection switching switch (5), a liquid crystal display control unit (6), a control instruction conversion unit (7), a second digital source table (8), a VDDO power supply switching switch (9), a power supply switching switch (10), an MCU switching switch (11) and a first digital source table (12), characterized in that: The phase-locked frequency synthesizer chip circuit (1) is electrically connected with a VDDO power switch (9), a frequency output test end (4), a power switch (10) and an MCU instruction conversion unit (2), the power switch (10) is electrically connected with a first digital source table (12), the first digital source table (12) is electrically connected with an MCU switch (11), the MCU switch (11) is electrically connected with a control instruction conversion unit (7) and the MCU instruction conversion unit (2), the MCU instruction conversion unit (2) is electrically connected with a frequency instruction input circuit (3) and the control instruction conversion unit (7), the frequency instruction input circuit (3) is electrically connected with the control instruction conversion unit (7), the control instruction conversion unit (7) is electrically connected with a liquid crystal display control unit (6) and the VDDO power switch (9), the VDDO power switch (9) and a second digital source table (8) are electrically connected, the power switch (10) is electrically connected with a current detection switch (5), and the current detection switch (5) is electrically connected with the frequency output test end (4).

2. The multi-functional phase-locked frequency synthesizer chip testing apparatus according to claim 1, wherein: The phase-locked frequency synthesizer chip circuit (1) is a phase-locked frequency synthesizer circuit built with MS5351 as a main chip, which is used for testing the performance of the phase-locked frequency synthesizer circuit, and the input signal of the phase-locked frequency synthesizer chip circuit (1) comes from the instruction of the MCU instruction conversion unit (2), and the second digital source table (8) is used for power supply of the circuit, and the output signal of the phase-locked frequency synthesizer chip circuit (1) is tested by the frequency output test end (4).

3. The multi-functional phase-locked frequency synthesizer chip testing apparatus according to claim 1, wherein: The MCU instruction conversion unit (2) is used for providing a frequency signal for the phase-locked frequency synthesizer chip circuit (1), receiving instructions from the liquid crystal display control unit (6), and the liquid crystal display control unit (6) includes 100K, 1M and 10M buttons, the frequency instruction input circuit (3) includes three-way relays, the liquid crystal display control unit (6) converts the instructions into electrical signals through the control instruction conversion unit (7) to control the three-way relay output of the frequency instruction input circuit (3), so as to achieve the purpose of transmitting the signal to the MCU instruction conversion unit (2); the frequency instruction input circuit (3) is used for converting the 100K, 1M and 10M button instructions of the frequency-locked phase-locked output of the liquid crystal display control unit (6) into electrical signals recognizable by the MCU instruction conversion unit (2).

4. The multi-functional phase-locked frequency synthesizer chip testing apparatus according to claim 1, wherein: The frequency output test end (4) is used for testing the output signal of the phase-locked frequency synthesizer chip circuit (1), the current detection switch (5) is used for frequency output detection of the phase-locked frequency synthesizer chip circuit (1), and is used for facilitating the test of output current; the liquid crystal display control unit (6) includes an opening button.

5. The multi-functional phase-locked frequency synthesizer chip testing apparatus according to claim 1, wherein: The liquid crystal display control unit (6) comprises a liquid crystal display screen; the liquid crystal display screen is used for displaying the control interface of the test device, and different buttons are touched to switch the corresponding circuit; the liquid crystal display screen is used for controlling the chip power supply, the frequency-locked phase-locked output, the phase shift, the MCU power supply, the VDDO power supply and the current detection; wherein the chip power supply: the power supply of the first digital source table is provided to the 1 phase-locked frequency synthesizer chip circuit by pressing the start button on the liquid crystal display screen; the power supply of the first digital source table is disconnected from the 1 phase-locked frequency synthesizer chip circuit by pressing the stop button on the liquid crystal display screen; The frequency-locked phase-locked output: three clock outputs are provided to the given frequency signal by pressing the 100K, 1M and 10M buttons on the liquid crystal display screen; the three clock signals are turned off by pressing the disconnect button on the liquid crystal display screen; The phase shift: the frequency synthesizer outputs a phase shift frequency on the channel by pressing the connect button on the liquid crystal display screen; the phase shift of the channel is restored by pressing the stop button; The MCU power supply: the MCU of the MCU instruction conversion unit (2) is powered by pressing the start button on the liquid crystal display screen; the power supply of the MCU of the MCU instruction conversion unit (2) is turned off by pressing the stop button on the liquid crystal display screen; The VDDO power supply: the phase-locked frequency synthesizer chip circuit (1) is powered by pressing the start button on the liquid crystal display screen; the phase-locked frequency synthesizer chip circuit (1) is powered off by pressing the stop button; The current detection: the phase-locked frequency synthesizer chip circuit (1) only provides the frequency output of the channel by pressing the start button on the liquid crystal display screen; the output current is tested; the phase-locked frequency synthesizer chip circuit (1) is turned off by pressing the start button again.

6. The multi-functional phase-locked frequency synthesizer chip testing apparatus according to claim 1, wherein: The control instruction conversion unit (7) is used for converting the control instruction of the liquid crystal display control unit (6) into a frequency instruction input circuit (3), a current detection switching switch (5), a VDDO power supply switching switch (9), a power supply switching switch (10), an MCU switching switch (11) and an MCU switching switch (11) which can recognize the electric signal.

7. The multi-functional phase-locked frequency synthesizer chip testing apparatus according to claim 1, wherein: The second digital source table (8) is used for providing the VDDO voltage of the phase-locked frequency synthesizer chip circuit (1).

8. The multi-functional phase-locked frequency synthesizer chip testing apparatus according to claim 1, wherein: The VDDO power supply switching switch (9) comprises a relay one controlled by the liquid crystal display control unit (6) and used for controlling whether the VDDO power supply of the phase-locked frequency synthesizer chip circuit (1) is connected; the power supply switching switch (10) comprises a relay two controlled by the liquid crystal display control unit (6) and used for switching the power supply of the phase-locked frequency synthesizer chip circuit (1); the MCU switching switch (11) comprises a relay three controlled by the liquid crystal display control unit (6) and used for switching the power supply of the MCU instruction conversion unit (2); the first digital source table (12) is used for providing the power supply of the phase-locked frequency synthesizer chip circuit (1) and the MCU of the MCU instruction conversion unit (2).

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