Adapter and three-dimensional scanning system thereof

Abstract

The utility model discloses an adapter and a three-dimensional scanning system thereof, the adapter is used for measuring the position of a sphere center in three-dimensional scanning, and the adapter comprises an adapter main body. The adapter body is provided with at least one marking surface and at least three contact surfaces used for being in contact with an object to be measured, the at least one marking surface is provided with a marking point, all the contact surfaces form a measuring space used for containing the object to be measured, and each contact surface is provided with a preset spatial position relative to the marking point; the three-dimensional scanning system comprises the adapter. Through the arrangement, the detection convenience of the sphere center is improved, so that the acquisition efficiency of the sphere center position is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of three-dimensional scanning measurement, in particular to an adapter and a three-dimensional scanning system thereof. BACKGROUND

[0002] The three-dimensional scanning system is a measurement technology that uses a scanner to capture the light spot, stripe or image on the surface of an object by using laser, structured light or photogrammetry principle, calculates the spatial position and forms a three-dimensional model of the object.

[0003] The existing three-dimensional scanning system needs a scanner to completely scan the spherical structure to accurately obtain the spatial position of the ball center. However, in the actual measurement process, due to the installation conditions of the spherical structure, the scanner cannot completely scan the spherical structure, for example, the spherical structure installed in the groove or the spherical structure too close to the surrounding parts. The working conditions around the spherical structure will cause interference with the complete scanning of the scanner, thereby increasing the difficulty of obtaining the spatial position of the ball center and reducing the efficiency of obtaining the ball center position. In addition, in the prior art, the three-dimensional scanning system needs to model the spherical structure after the scanner scans the spherical structure, and then calculate the ball center position of the spherical structure, which further reduces the efficiency of obtaining the ball center position.

[0004] Therefore, how to improve the efficiency of obtaining the ball center position is a technical problem that needs to be solved by those skilled in the art. CONTENT OF THE INVENTION

[0005] In order to solve the problems in the prior art, the purpose of the present application is to provide an adapter and a three-dimensional scanning system thereof, which can improve the efficiency of obtaining the ball center position.

[0006] To achieve the above purpose, the technical scheme adopted by the present application is as follows:

[0007] An adapter for measuring the position of the ball center in three-dimensional scanning, the adapter comprising an adapter main body. The adapter main body has at least one marking surface and at least three contact surfaces for contacting with the object to be measured. The at least one marking surface is provided with a marking point, and all the contact surfaces form a measurement space for accommodating the object to be measured. Each contact surface has a preset spatial position relative to the marking point.

[0008] Further, any two contact surfaces are perpendicular to each other.

[0009] Further, any two contact surfaces are not coplanar.

[0010] Further, the marking point is located on the marking surface or is detachably connected with the marking surface.

[0011] Furthermore, all the marked points form a marked point group, and the marked point group can be mapped to a unique code; there are marked points on at least two marked surfaces.

[0012] Furthermore, the adapter includes an adapter body having at least one marking surface with marking points, and a contact groove for contacting the object to be tested is formed within the adapter body. The contact groove has an opening for the object to be tested to enter, and the inner wall of the contact groove is curved. The inner wall of the contact groove has a preset spatial position relative to the marking points.

[0013] Furthermore, the inner wall of the contact groove is a hemispherical surface or a spherical cap.

[0014] Furthermore, the marker point is located on the marker surface or is detachably connected to the marker surface.

[0015] Furthermore, multiple marking surfaces are located outside the contact groove; all marking points constitute a marking point group, and the marking point group can be mapped to a unique code; there are marking points on at least two marking surfaces.

[0016] To achieve the above objectives, this application adopts the following technical solution:

[0017] A three-dimensional scanning system includes the adapter described above.

[0018] The aforementioned adapter and its 3D scanning system allow the adapter to contact the object under test. By scanning the marked points on the adapter, the spatial position of the sphere's center can be obtained. This simplifies the acquisition of the sphere's center coordinates, improves the convenience of sphere center detection, and consequently increases the efficiency of obtaining the sphere's center position. Furthermore, the 3D scanning system eliminates the need to model the object under test to obtain its center position, further enhancing the efficiency of center position acquisition. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the combination of a first adapter and the object under test provided in an embodiment of this application.

[0020] Figure 2 This is a schematic diagram of the structure of the first adapter provided in the embodiments of this application.

[0021] Figure 3 This is a schematic diagram of a second type of adapter and the object under test provided in an embodiment of this application.

[0022] Figure 4 This is a schematic cross-sectional view of the first combination of the second adapter and the object under test provided in the embodiments of this application.

[0023] Figure 5 This is a schematic cross-sectional view of a second combination of a second adapter and a test object provided in an embodiment of this application. Detailed Implementation

[0024] To enable those skilled in the art to better understand the present application, the technical solutions in specific embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings.

[0025] It should be noted that the terms "first," "second," and similar terms used in this application specification and claims do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Similarly, "a" or "one," and similar terms do not indicate a quantity limitation, but rather indicate the presence of at least one. "A plurality" or "several" indicates at least two. Unless otherwise stated, terms such as "front," "back," "left," "right," "lower," and / or "upper" are for illustrative purposes only and are not limited to a location or spatial orientation. Terms such as "comprising" or "including" indicate that the elements or objects preceding "comprising" encompass the elements or objects listed following "comprising" or "including" and their equivalents, and do not exclude other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect.

[0026] The singular forms “a,” “the,” and “the” used in this application specification and appended claims are also intended to include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used herein refers to and includes any or all possible combinations of one or more of the associated listed items.

[0027] like Figure 1 and Figure 2 As shown, this application provides an adapter 100 for measuring the position of a sphere's center in a 3D scan. The adapter 100 includes an adapter body 11 for contacting an object 200 to be measured. The adapter body 11 also has marker points 12. Specifically, the adapter body 11 has at least one marker surface 112 and at least three contact surfaces 111 for contacting the object 200 to be measured, all of which form a measurement space for accommodating the object 200. More specifically, each contact surface 111 has a preset spatial position relative to the marker point 12.

[0028] In this application, the object to be tested 200 may be a sphere, a hemispherical structure, or part of a sphere.

[0029] In this embodiment, since the adapter body 11 has at least three contact surfaces 111, when the spherical or hemispherical object to be measured 200 is placed in the measurement space, the object to be measured 200 contacts each contact surface 111 of the adapter body 11, so that the contact surface 111 can limit the object to be measured 200, thereby fixing the relative position of the contact surface 111 and the object to be measured 200, and fixing the relative position of the contact surface 111 and the center position of the object to be measured 200. Then, the center position of the corresponding object to be measured 200 can be obtained through parameters such as the diameter or radius of the object to be measured 200, so as to realize the measurement of the center position and improve the efficiency of obtaining the center position of the object to be measured 200.

[0030] For example, given the diameter of the object to be measured 200, the adapter 100 is placed on the object to be measured 200 so that each contact surface 111 of the adapter body 11 contacts the object to be measured 200. By scanning the spatial position of the marker point 12 and according to the mapping relationship between each contact surface 111 and the preset spatial position of the marker point 12, the actual spatial position of the contact surface 111 can be obtained, thereby obtaining the position of the center of the sphere of the object to be measured 200 with a known diameter.

[0031] When an interferometric scanner scans the object under test (DUT) 200 in a surrounding environment, it may result in the inability to acquire the parameters of DUT 200. The above-described configuration avoids this issue. Simply place the adapter 100 on DUT 200, ensuring contact between DUT 200 and each contact surface 111 of the adapter 100. By scanning the spatial positions of the marked points 12 on the adapter 100, the center position of the DUT 200 can be obtained. This reduces the difficulty of acquiring the center position and improves the efficiency of obtaining it. Furthermore, it eliminates the need for 3D modeling of DUT 200 to acquire the center position, further enhancing the efficiency of obtaining it.

[0032] It should be noted that the contact position between the object under test 200 and each contact surface 111 is on the corresponding contact surface 111, so as to facilitate the establishment of a geometric relationship between the contact surface 111 and the object under test 200, thereby obtaining the position of the center of the sphere of the object under test 200.

[0033] In one implementation, any two contact surfaces 111 are perpendicular to each other. With this configuration, when the object to be measured 200 is placed in the measurement space, the contact surfaces 111 can limit the position of the object to be measured 200, thereby restricting the relative position of the center position of the object to be measured 200 and the contact surfaces 111, which is beneficial for measuring the center position of the object to be measured 200.

[0034] As another implementation, any two contact surfaces 111 are not coplanar. This arrangement avoids the adapter 11 being unable to restrict the position of the object under test 200 due to the two contact surfaces 111 being coplanar, thus preventing the inability to measure the center position of the object under test 200. Furthermore, the angle between any two contact surfaces 111 can be adjusted according to the working conditions of the object under test 200 to avoid interference between the working conditions around the object under test 200 and the adapter 100, thereby facilitating contact between the adapter 100 and the object under test 200 and further improving the convenience of detecting the center position of the object under test 200.

[0035] In one implementation, when the scanner measures the spatial position of the adapter 100, the marker point 12 can output identification data and positioning data. The identification data is used to bind to the type of the adapter 100, so that when scanning the marker point 12, the type of the object 200 to be measured can be identified, thereby enabling the retrieval of data from the database that matches the type of the object 200. For example, the adapter 100 of this application is capable of measuring the center of a sphere.

[0036] Furthermore, the positioning data is used to obtain the spatial coordinates of marker point 12. Since the relative position of marker point 12 and contact surface 111 is fixed, after obtaining the spatial coordinates of marker point 12, the actual spatial position of contact surface 111 on adapter 100 can be obtained through the mapping relationship between the positions of marker point 12 and contact surface 111. Then, through the mapping relationship between contact surface 111 and the center of the sphere of the object under test 200, the position of the center of the sphere of the object under test 200 can be obtained given the diameter of the object under test 200. This enables rapid acquisition of the center of the sphere position, thereby improving the efficiency of measuring the center of the sphere position of the object under test 200.

[0037] It should be noted that the mapping relationship between the marker point 12 and the contact surface 111 can be obtained by scanning with a 3D scanner. Specifically, the 3D scanner scans the adapter 100 to obtain a model of the adapter 100, and then obtains the mapping relationship between the marker point 12 and the contact surface 111 through the model of the adapter 100.

[0038] In this embodiment, the marker point 12 is located on or detachably connected to the marker surface 112. This configuration allows the connection between the marker point 12 and the marker surface 112 to be adjusted according to the actual working conditions surrounding the object under test 200. This prevents interference between the marker point 12 and the surrounding conditions, thus avoiding the inability to scan the marker point 12. Consequently, the adapter 100 can be adapted to detect objects under test 200 under different working conditions, thereby improving the practicality of the adapter 100.

[0039] It should be noted that when the marker point 12 and the marker surface 112 are detachably connected, the marker point 12 can be installed on an object of any structure, and the object and the marker surface 112 are detachably connected. It is only necessary to ensure that the relative position of the marker point 12 and the marker surface 112 is fixed, so that after scanning the spatial position of the marker point 12, the spatial position of the contact surface 111 can be obtained according to the mapping relationship between the relative positions of the marker point 12 and the contact surface 111.

[0040] It should be noted that each contact surface 111 has a preset spatial position relative to the marker point 12, so that after the 3D scanner obtains the positioning data of the marker point 12, it can obtain the spatial position of the contact surface 111 according to the mapping relationship between the marker point 12 and the contact surface 111.

[0041] As an optional implementation, the marking surface 112 and the contact surface 111 are not coplanar. This arrangement avoids the marking point 12 from being unable to be scanned due to the marking surface 112 and the contact surface 111 being coplanar.

[0042] In this embodiment, all marker points 12 constitute a marker point group, and the marker point group can be mapped to a unique code. Specifically, all or some of the marker points 12 on the marker point group can be mapped to a unique code. That is, in this application, the type of adapter 100 can be identified by scanning all marker points 12, thereby obtaining which object 200 the adapter 100 is used to measure; alternatively, some marker points 12 can be scanned to match some marker points 12 with the marker points 12 in the marker point group to obtain the adapter 100 corresponding to some marker points 12, thereby obtaining which object 200 the adapter 100 is used to measure.

[0043] As an alternative implementation, there are marker points 12 on at least two marker surfaces 112. With the above settings, the marker points 12 can be distributed on different marker surfaces 112, so that the scanned image of the marker points 12 can have depth information, which is beneficial for better obtaining the spatial position of the marker points 12.

[0044] like Figure 3 , Figure 4 and Figure 5As shown, in another embodiment, the adapter body 11 has at least one marking surface 112, and a marking point 12 is provided on the at least one marking surface 112. A contact groove 113 for contacting the object to be measured 200 is formed within the adapter body 11, and the contact groove 113 has an opening through which the object to be measured 200 can enter. Specifically, the inner wall of the contact groove 113 is curved, and the inner wall of the contact groove 113 has a preset spatial position relative to the marking point 12. With this configuration, the contact groove 113 can restrict the position of the object to be measured 200, thereby fixing the relative position of the contact groove 113 and the object to be measured 200, and further fixing the relative position of the contact groove 113 and the center of the object to be measured 200. Therefore, the center position of the object to be measured 200 can be obtained through parameters such as the diameter or radius of the object to be measured, thus realizing the measurement of the center position.

[0045] For example, given the diameter of the object to be measured 200, the adapter 100 is placed on the object to be measured 200 so that the contact groove 113 of the adapter body 11 contacts the object to be measured 200, thereby limiting the relative position of the center position of the object to be measured 200 and the adapter body 11. By scanning the spatial position of the marker point 12 and according to the mapping relationship between the contact groove 113 and the preset spatial position of the marker point 12, the actual spatial position of the contact groove 113 can be obtained, thereby obtaining the center position of the object to be measured 200 with a known diameter, which helps to improve the efficiency of obtaining the center position of the object to be measured 200.

[0046] Specifically, the inner wall of the contact groove 113 is a hemisphere or a spherical cap. A spherical cap is a curved surface formed by cutting a sphere with a plane, and its area is smaller than that of the hemisphere. The radius corresponding to the inner wall of the contact groove 113 is defined as R1, and the radius of the object under test 200 is defined as R2. It should be noted that R1 in this application is less than or equal to R2, so that the relative position of the contact groove 113 and the object under test 200 is fixed, thereby facilitating the determination of the center position of the object under test 200 based on the mapping relationship between their relative positions.

[0047] Specifically, when R1 equals R2, the center position of the sphere of the object under test 200 is the same as the center position of the sphere corresponding to the inner wall of the contact groove 113. After the scanner scans the spatial position of the marker point 12, the center position of the sphere of the object under test 200 can be obtained according to the mapping relationship between the marker point 12 and the contact groove 113. When R1 is less than R2, the spherical surface of the object under test 200 abuts against the opening of the contact groove 113, thereby limiting the relative position between the object under test 200 and the contact groove 113, and thus limiting the relative position between the center of the sphere of the object under test 200 and the marker point 12. Consequently, the center position of the sphere of the object under test 200 can be obtained according to the mapping relationship between the opening of the contact groove 113 and the center of the sphere of the object under test 200.

[0048] It should be noted that, since the inner wall of the contact groove 113 has a preset spatial position relative to the marker point 12, so that the position of the groove opening of the contact groove 113 is fixed relative to the marker point 12, when the adapter 100 contacts the object under test 200, after obtaining the spatial position of the marker point 12 through the 3D scanner, the position of the groove opening of the contact groove 113 can be obtained through the mapping relationship between the groove opening of the contact groove 113 and the marker point 12. This is beneficial for establishing a geometric relationship between the groove opening of the contact groove 113 and the object under test 200 to measure the center position of the sphere of the object under test 200, thereby improving the efficiency of obtaining the center position of the object under test 200.

[0049] As one implementation, multiple marking surfaces 112 are located outside the contact groove 113, which can prevent the marking points 12 from being unscanned.

[0050] In this embodiment, all marker points 12 constitute a marker point group, and the marker point group can be mapped to a unique code. Specifically, all or some of the marker points 12 on the marker point group can be mapped to a unique code. That is, in this application, the type of adapter 100 can be identified by scanning all marker points 12, thereby obtaining which object 200 the adapter 100 is used to measure; alternatively, some marker points 12 can be scanned to match some marker points 12 with the marker points 12 in the marker point group to obtain the adapter 100 corresponding to some marker points 12, thereby obtaining which object 200 the adapter 100 is used to measure.

[0051] As an alternative implementation, there are marker points 12 on at least two marker surfaces 112. With the above settings, the marker points 12 can be distributed on different marker surfaces 112, so that the scanned image of the marker points 12 can have depth information, which is beneficial for better obtaining the spatial position of the marker points 12.

[0052] This application also provides a three-dimensional scanning system, which includes the adapter 100 described above, so that the three-dimensional scanning system can obtain the center position of the object 200 to be measured.

[0053] For example, the adapter body 11 has three contact surfaces 111.

[0054] When the adapter 100 comes into contact with the object under test 200, the scanning system scans the marker points 12 on the adapter 100. Through the identification data of the marker points 12, the 3D scanning system can identify whether the object under test 200 is a sphere or a hemisphere, and can retrieve the mapping relationship between the marker points 12 and the contact surface 111 from the database. Based on the positioning data of the marker points 12, the 3D scanning system obtains the spatial position of the marker points 12, and according to the mapping relationship between the marker points 12 and the contact surface 111, the spatial position of the contact surface 111 can be obtained. Knowing the diameter or radius of the object to be measured 200, the mapping relationship between the center of the sphere of the object to be measured 200 and the marker point 12 can be obtained according to the mapping relationship between the marker point 12 and the contact surface 111. This allows for the determination of the relative spatial position between the center of the sphere of the object to be measured 200 and the marker point 12, thus enabling the determination of the center of the sphere of the object to be measured 200. Therefore, the adapter 100 can be used to measure the center of the sphere of the object to be measured under complex working conditions, simplifying the acquisition of the spatial position of the center of the object to be measured 200 and improving the efficiency of obtaining the center of the sphere. Furthermore, it eliminates the need for a 3D model of the object to be measured 200 before measuring its center of the sphere, further improving the efficiency of obtaining the center of the sphere of the object to be measured 200.

[0055] It should be understood that those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.

Claims

1. An adapter for measuring the position of the center of a sphere in a three-dimensional scanning system, the adapter comprising: an adapter body having at least one marking surface and at least three contact surfaces for contacting an object to be measured, at least one of the marking surfaces having a marking point disposed thereon, all of the contact surfaces forming a measurement space for receiving the object to be measured, each of the contact surfaces having a predetermined spatial position relative to the marking point.

2. The adapter of claim 1, wherein: any two of the contact surfaces are perpendicular to each other.

3. The adapter of claim 1, wherein: any two of the contact surfaces are not coplanar.

4. The adapter of claim 1, wherein: the marking point is disposed on or detachably connected to the marking surface.

5. The adapter of claim 1, wherein: all of the marking points form a marking point group, the marking point group being capable of being mapped with a unique code; and at least two of the marking surfaces have the marking points.

6. An adapter for measuring the position of the center of a sphere in a three-dimensional scanning system, the adapter comprising: an adapter body having at least one marking surface, at least one of the marking surfaces having a marking point disposed thereon, the adapter body having a contact groove formed therein for contacting an object to be measured, the contact groove having a groove opening for receiving the object to be measured, an inner wall of the contact groove being curved, the inner wall of the contact groove having a predetermined spatial position relative to the marking point.

7. The adapter of claim 6, wherein: the inner wall of the contact groove is a semi-spherical surface or a spherical cap.

8. The adapter of claim 6, wherein: the marking point is disposed on or detachably connected to the marking surface.

9. The adapter of claim 6, wherein: a plurality of the marking surfaces are located outside the contact groove; all of the marking points form a marking point group, the marking point group being capable of being mapped with a unique code; and at least two of the marking surfaces have the marking points.

10. A three-dimensional scanning system, the three-dimensional scanning system comprising the adapter of any one of claims 1 to 9. ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​

Images