Test fixture with probe protection mechanism

Abstract

The utility model discloses a test fixture with a probe protection mechanism, and relates to the technical field of test fixtures. The jig comprises a jig body, wherein a carrier is fixedly matched with one side of the jig body; the two fixing plates are fixedly matched on one side of the jig body, one side of each fixing plate is in sliding fit with a T-shaped plate, a substrate is fixedly matched between the two T-shaped plates, and two probe bodies are fixedly matched at the bottom of the substrate; the U-shaped plate is clamped and matched on the peripheral side of the base plate, and a protection block is fixedly matched between the two ends of the U-shaped plate. According to the utility model, through the arrangement of the protection block, the protection block slides upwards under the action of the U-shaped plate, so that one end of the probe body slides out from the interior of the protection block, and a to-be-tested product on the upper side of the carrier is tested through the one end of the probe body, thereby improving the test effect of the probe body on the to-be-tested product.

Description

Technical Field

[0001] This utility model belongs to the field of test fixtures, specifically, it relates to a test fixture with a probe protection mechanism. Background Technology

[0002] With the rapid development of electronic products, the requirements for accurate testing of electrical performance parameters are becoming increasingly stringent, making the design of testing fixtures indispensable.

[0003] Patent application CN211669231U discloses a test fixture with a probe protection mechanism. Paragraph 0049 of the specification discloses that: the test fixture is provided with a probe protection mechanism, and the cutting block of the protection mechanism and the probe are mounted on the same substrate. When the test fixture is preparing to test an electronic product, during the process of moving from top to bottom, since the probe tip is between the bottom end of the substrate and the bottom end of the cutting block, the protection block of the buffer mechanism will contact the cutting block first, so the cutting block may protect the probe tip from being damaged. Moreover, the lower part of the protection block of the buffer mechanism corresponding to the cutting block contacts the cutting block during the process of the probe moving from top to bottom, which plays a buffering role and prevents the probe from being damaged due to excessive downward speed and damage to the cutting block.

[0004] However, in practical applications, a protective block is needed to protect the probe, reducing the risk of probe damage caused by damage to the cutting block. When the probe is testing the product, the protective block needs to be rotated to one side of the base before the probe can test the product on the carrier. This process affects the efficiency of the probe in testing the product.

[0005] To address these shortcomings, a test fixture with a probe protection mechanism is proposed. Utility Model Content

[0006] The technical problem to be solved by this utility model is to overcome the shortcomings of the prior art and provide a test fixture with a probe protection mechanism.

[0007] To solve the above-mentioned technical problems, the basic concept of the technical solution adopted by this utility model is as follows:

[0008] A test fixture with a probe protection mechanism includes a fixture body, wherein a carrier is fixedly fitted to one side of the fixture body;

[0009] Two fixing plates are fixedly fitted on one side of the fixture body. A T-shaped plate is slidably fitted on one side of the fixing plate. A base plate is fixedly fitted between the two T-shaped plates. Two probe bodies are fixedly fitted at the bottom of the base plate.

[0010] A U-shaped plate is snapped onto the periphery of the substrate, and a protective block is fixedly fitted between the two ends of the U-shaped plate. Two placement holes are opened on one side of the protective block, and the probe body is located inside the placement holes.

[0011] Optionally, a T-shaped groove is provided on one side of the fixing plate, and the T-shaped plate slides inside the T-shaped groove.

[0012] Optionally, a fixing block is fixedly fitted to one side of the T-shaped plate, and one side of the base plate is fixedly fitted to one end of the fixing block.

[0013] Optionally, a connecting plate is fixedly fitted between the two T-shaped plates, and one side of the connecting plate has a groove and a through hole communicating with the groove.

[0014] Optionally, a servo motor is fixedly fitted inside the through hole, a rotating shaft is fixedly fitted at the output end of the servo motor, a gear is fixedly fitted around the circumference of the rotating shaft, and multiple teeth are evenly distributed and fixedly fitted on one side of the fixture body, the teeth meshing with the gear.

[0015] Optionally, guide grooves are provided on both sides of the U-shaped plate, and a T-shaped retaining plate is slidably fitted inside the guide groove. Two springs are fixedly fitted between one side of the T-shaped retaining plate and one side of the U-shaped plate.

[0016] Optionally, one end of the T-shaped card plate is evenly distributed and fixedly fitted with multiple pointed tips, one end of which engages with one side of the substrate.

[0017] Optionally, the bottom of the fixture body is fixedly fitted with multiple support feet.

[0018] By adopting the above technical solution, this utility model has the following beneficial effects compared with the prior art. Of course, any product implementing this utility model does not necessarily need to achieve all of the following advantages at the same time:

[0019] The protective block is designed to slide upwards under the action of the U-shaped plate, allowing one end of the probe body to slide out from inside the protective block and perform testing on the product under test on the upper side of the carrier through one end of the probe body, thereby improving the testing effect of the probe body on the product under test.

[0020] The specific embodiments of this utility model will be described in further detail below with reference to the accompanying drawings. Attached Figure Description

[0021] The accompanying drawings described below are merely some embodiments. Those skilled in the art can obtain other drawings based on these drawings without any creative effort.

[0022] In the picture:

[0023] Figure 1 This is a three-dimensional structural diagram of an embodiment of the present utility model;

[0024] Figure 2 This is a schematic diagram of the substrate structure according to an embodiment of the present invention;

[0025] Figure 3 This is a schematic diagram of a T-shaped card plate structure according to an embodiment of the present invention;

[0026] Figure 4 This is a schematic diagram of the probe body structure according to an embodiment of the present invention.

[0027] The attached diagram lists the components represented by each number as follows:

[0028] Fixture body 100, support foot 101, carrier 102, fixing plate 103, T-slot 104, T-plate 105, connecting plate 106, groove 107, through hole 108, rotating shaft 109, gear 110, fixing block 111, base plate 112, probe body 113, U-shaped plate 114, guide groove 115, T-shaped clamping plate 116, spring 117, protective block 118, placement hole 119, teeth 120.

[0029] It should be noted that these accompanying drawings and textual descriptions are not intended to limit the scope of the present invention in any way, but rather to illustrate the concept of the present invention to those skilled in the art by referring to specific embodiments. Detailed Implementation

[0030] The present invention will now be described in further detail with reference to the accompanying drawings.

[0031] Please see Figure 1-4 As shown, this embodiment provides a test fixture with a probe protection mechanism, including a fixture body 100, and a carrier 102 is fixedly fitted to one side of the fixture body 100.

[0032] Two fixing plates 103 are fixedly fitted on one side of the fixture body 100. A T-shaped plate 105 is slidably fitted on one side of the fixing plate 103. A base plate 112 is fixedly fitted between the two T-shaped plates 105. Two probe bodies 113 are fixedly fitted at the bottom of the base plate 112.

[0033] A U-shaped plate 114 is snapped onto the periphery of the substrate 112. A protective block 118 is fixedly fitted between the two ends of the U-shaped plate 114. Two placement holes 119 are opened on one side of the protective block 118, and the probe body 113 is located inside the placement hole 119.

[0034] Working principle:

[0035] First, place the product to be tested on the upper side of the carrier 102, then slide the U-shaped plate 114 upward. The U-shaped plate 114 drives the protective block 118 to slide upward. One end of the probe body 113 slides out from the inside of the protective block 118 and positions the U-shaped plate 114 on the periphery of the substrate 112. Then slide the substrate 112 downward. The substrate 112 drives the probe body 113 to slide towards the product to be tested, and the product to be tested is tested through the probe body 113.

[0036] The protective block 118 is set so that it slides upward under the action of the U-shaped plate 114, so that one end of the probe body 113 slides out from the inside of the protective block 118 and performs testing on the product under test on the upper side of the carrier 102 through one end of the probe body 113, thereby improving the testing effect of the probe body 113 on the product under test.

[0037] To make the sliding process of the T-shaped plate 105 on one side of the T-shaped groove 104 more stable in this embodiment, the following structure is used for improvement, such as... Figure 1-4 As shown, in this embodiment, a T-shaped groove 104 is provided on one side of the fixing plate 103, and a T-shaped plate 105 is slidably fitted inside the T-shaped groove 104. A fixing block 111 is fixedly fitted on one side of the T-shaped plate 105, and one side of the base plate 112 is fixedly fitted on one end of the fixing block 111. A connecting plate 106 is fixedly fitted between the two T-shaped plates 105. A groove 107 and a through hole 108 communicating with the groove 107 are provided on one side of the connecting plate 106. A servo motor is fixedly fitted inside the through hole 108, and a rotating shaft 109 is fixedly fitted at the output end of the servo motor. Gears 110 are fixedly fitted around the periphery of the fixture body 100. Multiple teeth 120 are evenly distributed and fixedly fitted on one side of the fixture body 100. The teeth 120 mesh with the gears 110. Guide grooves 115 are provided on both sides of the U-shaped plate 114. T-shaped clamping plates 116 are slidably fitted inside the guide grooves 115. Two springs 117 are fixedly fitted between one side of the T-shaped clamping plate 116 and one side of the U-shaped plate 114. Multiple pointed tips are evenly distributed and fixedly fitted on one end of the T-shaped clamping plate 116. One end of the pointed tip fits into one side of the base plate 112. Multiple support feet 101 are fixedly fitted at the bottom of the fixture body 100.

[0038] In this embodiment, when in use, first pull the T-shaped clamp 116. The T-shaped clamp 116 slides inside the guide groove 115 and stretches the spring 117. One end of the T-shaped clamp 116 releases the positioning of the substrate 112. Then, slide the U-shaped plate 114 upward. The U-shaped plate 114 drives the protective block 118 to slide upward. The protective block 118 drives the placement hole 119 to slide around the probe body 113. Then, start the servo motor. The output end of the servo motor drives the gear 110 to rotate through the rotating shaft 109. Because the gear 110 meshes with the teeth 120, the connecting plate 106 drives the T-shaped plate 105 to slide inside the T-shaped groove 104 under the action of the gear 110. The T-shaped plate 105 drives the substrate 112 to slide downward through the fixing block 111. The substrate 112 drives the probe body 113 to test the product under test on the upper side of the carrier 102.

[0039] The T-shaped groove 104 is provided so that the T-shaped plate 105 can slide inside the T-shaped groove 104 under the action of the connecting plate 106, and the T-shaped groove 104 guides the sliding direction of the T-shaped plate 105, reducing the problem of the T-shaped plate 105 tilting during sliding and improving the stability of the T-shaped plate 105 during sliding.

[0040] This utility model is not limited to the above-described embodiments. Anyone should know that structural changes made under the guidance of this utility model, and any technical solutions that are the same as or similar to this utility model, fall within the protection scope of this utility model. Technical aspects, shapes, and structures not described in detail in this utility model are all publicly known technologies.

Claims

1. A test fixture having a protection mechanism for a probe, characterized by, Include: The jig body (100), one side of the jig body (100) is fixedly matched with the carrier (102); Two fixed plates (103) are fixedly matched on one side of the jig body (100), one side of the fixed plate (103) is slidably matched with a T-shaped plate (105), a base plate (112) is fixedly matched between two T-shaped plates (105), and two probe bodies (113) are fixedly matched at the bottom of the base plate (112); The U-shaped plate (114) is clamped on the circumferential side of the base plate (112), the protection block (118) is fixedly matched between the two ends of the U-shaped plate (114), two placing holes (119) are formed on one side of the protection block (118), and the probe body (113) is located in the placing hole (119).

2. The test fixture having a protection mechanism for probes according to claim 1, wherein, One side of the fixed plate (103) is provided with a T-shaped groove (104), and the T-shaped plate (105) is slidably matched in the T-shaped groove (104).

3. The test fixture having a protection mechanism for probes according to claim 1, wherein, One side of the T-shaped plate (105) is fixedly matched with a fixed block (111), and one side of the base plate (112) is fixedly matched on one end of the fixed block (111).

4. The test fixture having a protection mechanism for probes according to claim 1, wherein, Two T-shaped plates (105) are fixedly matched with a connecting plate (106), and one side of the connecting plate (106) is provided with a groove (107) and a through hole (108) communicated with the groove (107).

5. The test fixture having a protection mechanism for probes according to claim 4, wherein, The through hole (108) is fixedly matched with a servo motor, the output end of the servo motor is fixedly matched with a rotating shaft (109), the circumferential side of the rotating shaft (109) is fixedly matched with a gear (110), and the one side of the jig body (100) is uniformly fixedly matched with a plurality of teeth (120). The gear (110) is engaged with the gear (110).

6. The test fixture having a protection mechanism for probes according to claim 1, wherein, Both sides of the U-shaped plate (114) are provided with guide grooves (115), the T-shaped clamping plate (116) is slidably matched in the guide groove (115), and two springs (117) are fixedly matched between one side of the T-shaped clamping plate (116) and one side of the U-shaped plate (114).

7. The test fixture having a protection mechanism for probes according to claim 6, wherein, Multiple sharp ends are uniformly fixedly matched on one end of the T-shaped clamping plate (116), and one end of the sharp end is matched with one side of the base plate (112).

8. The test fixture having a protection mechanism for probes according to claim 1, wherein, Multiple supporting legs (101) are fixedly matched at the bottom of the jig body (100).

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