SMC plug-in test tool

By designing an SMC plug-in testing fixture, automated testing is achieved using communication lines, test leads, and download cables. This solves the problem of high risk of misoperation caused by manual replacement of test leads in existing technologies, and improves testing safety and efficiency.

CN224019906UActive Publication Date: 2026-03-20NR ELECTRIC CO LTD +2
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-12
Publication Date
2026-03-20

AI Technical Summary

Technical Problem

The existing SMC plug-in testing environment requires manual replacement of test cables depending on the hardware port of the test object, which leads to a high risk of misoperation and cannot meet the testing needs of production and engineering maintenance.

Method used

Design an SMC plug-in testing fixture that uses communication cables, test leads, and download cables to connect the debugger, programmable source, and test platform to achieve automated testing, avoid manual wiring, and support different forms of testing for various SMC plug-ins.

Benefits of technology

It improves testing safety and efficiency, reduces the risk of human error, and meets the needs of various applications in manufacturing and engineering maintenance.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN224019906U_ABST
    Figure CN224019906U_ABST
Patent Text Reader

Abstract

The utility model discloses an SMC plug-in test tool. The SMC plug-in test tool comprises a communication line used for transmitting communication signals; the test lead is used for transmitting analog quantity and switching value signals; the downloading line is used for transmitting an SMC plug-in program file to be tested; the test platform is used for installing an SMC plug-in to be tested; the test platform is connected with a communication plug-in set in the debugging instrument through a communication line, is connected with an output plug-in and a sampling plug-in set in the debugging instrument through a test lead, and is connected with a downloading plug-in set in the debugging instrument through a downloading line; the debugging instrument is connected with a set program control source through a communication line and a test wire. The SMC plug-in testing device can flexibly support different forms of testing of various SMC plug-ins, manual wiring is not needed in the testing process, and testing safety and testing efficiency are improved.
Need to check novelty before this filing date? Find Prior Art

Description

TECHNICAL FIELD

[0001] The utility model belongs to the electric power system test technical field, concretely relates to a kind of SMC plug-in testing tool. BACKGROUND

[0002] In the production link, SMC plug-in of various types needs to be tested in the relay protection automation equipment of electric power system, to check its hardware function and interface normality.The existing SMC plug-in test environment needs to be manually replaced according to the different hardware ports of test object Test line, and each board card test needs to be manually connected again, which is prone to misoperation, leading to safety accident;Manual control program control source output and wiring, the safety risk is great, and it has been unable to meet the production and engineering maintenance test demand. UTILITY MODEL CONTENT

[0003] To solve the deficiency in prior art, the utility model provides a kind of SMC plug-in testing tool, different forms of test of various SMC plug-ins can be flexibly supported, and reconnection is not needed in the test process, which improves test safety and test efficiency.

[0004] To achieve the above purpose, the technical scheme applied by the utility model is as follows: a kind of SMC plug-in testing tool, comprising: communication line for transmitting communication signal;Test lead for transmitting analog quantity, switch quantity signal;Download line for transmitting the program file of SMC plug-in to be tested;Test platform for installing SMC plug-in to be tested;Test platform is connected with the communication plug-in set in debugging instrument using communication line, is connected with the opening plug-in and sampling plug-in set in debugging instrument using test lead, is connected with the download plug-in set in debugging instrument using download line;Debugging instrument is connected with the set program control source using communication line and test lead.

[0005] Further, the test platform comprises: a base for carrying the SMC plug-in to be tested;Probe for connecting the external port of SMC plug-in to be tested is arranged on the base;Test platform external terminal connected with the probe.

[0006] Further, the base is further provided with manual driving mechanism or hydraulic driving mechanism for driving the probe to connect or disconnect with the external port of SMC plug-in to be tested.

[0007] Further, the debugging instrument comprises a plurality of opening plug-ins and sampling plug-ins;The program control source comprises a plurality of direct current program control sources and alternating current program control sources;A plurality of opening plug-ins, sampling plug-ins, direct current program control sources and alternating current program control sources are connected with test platform external terminal to form power supply test loop, voltage and current sampling test loop, PT100 / NTC sampling test loop, opening-in and opening-out test loop, bypass switch driving feedback test loop and IGBT driving feedback test loop.

[0008] Further, the power supply test circuit comprises: an open-out plug-in configured in the debugging instrument and a direct current program-controlled source configured in the program-controlled source; a relay K1 of the open-out plug-in is connected with a port DC_V+ of the direct current program-controlled source on one side and connected with a power supply interface PWR+ of the SMC plug-in to be tested through a test platform external terminal on the other side; a relay K2 of the open-out plug-in is connected with a port DC_V- of the direct current program-controlled source on one side and connected with a power supply interface PWR- of the SMC plug-in to be tested through a test platform external terminal on the other side.

[0009] Further, the voltage and current sampling test circuit comprises: the open-out plug-in configured in the debugging instrument and a direct current program-controlled source two and an alternating current program-controlled source configured in the program-controlled source; the direct current voltage sampling test circuit, a relay K3, a relay K5 and a relay K7 of the open-out plug-in are connected with a port DC_V+ of the direct current program-controlled source two on one side and connected with a port power supply sampling+, a direct current capacitor sampling+ and a bypass capacitor sampling+ of the SMC plug-in to be tested through test platform external terminals on the other side; a relay K4, a relay K6 and a relay K8 of the open-out plug-in are connected with a port DC_V- of the direct current program-controlled source two on one side and connected with a port power supply sampling-, a direct current capacitor sampling- and a bypass capacitor sampling- of the SMC plug-in to be tested through test platform external terminals on the other side; the alternating current voltage and current sampling test circuit, a relay K1 of the open-out plug-in two is connected with a port AC_V+ of the alternating current program-controlled source on one side and connected with a port alternating current voltage sampling+ of the SMC plug-in to be tested through a test platform external terminal on the other side; a relay K2 of the open-out plug-in two is connected with a port AC_V- of the alternating current program-controlled source on one side and connected with a port alternating current voltage sampling- of the SMC plug-in to be tested through a test platform external terminal on the other side; a relay K3 of the open-out plug-in two is connected with a port AC_I+ of the alternating current program-controlled source on one side and connected with a port alternating current current sampling+ of the SMC plug-in to be tested through a test platform external terminal on the other side; a relay K4 of the open-out plug-in two is connected with a port AC_I- of the alternating current program-controlled source on one side and connected with a port alternating current current sampling- of the SMC plug-in to be tested through a test platform external terminal on the other side.

[0010] Further, the PT100 / NTC sampling test circuit comprises: the open-out plug-in configured in the debugging instrument; a relay K9 of the open-out plug-in is connected with a port PT100 / NTC+ of the sensor PT100 / NTC and one end of a resistor R1 on one side and connected with the other end of the resistor R1 on the other side; a relay K10 of the open-out plug-in is connected with a port PT100 / NTC- of the sensor PT100 / NTC and one end of a resistor R2 on one side; the other end of the resistor R2 is connected with the other side of the relay K9.

[0011] Further, the open-in and open-out test loop comprises: a sampling plug-in one arranged in the debugging instrument; a port active open-out 1+ of the sampling plug-in one is connected with a port active open-out 1+ of the test platform external terminal P2; a port active open-out 1- of the sampling plug-in one is connected with a port active open-out 1- of the test platform external terminal P2; a port passive open-out 2+ of the test platform external terminal P2 is connected with a port open-in 1+ of the test platform external terminal P1, a port passive open-out 2- of the test platform external terminal P2 is connected with one of the ports GND of the test platform external terminal P1, a port passive open-out 3+ of the test platform external terminal P2 is connected with a port open-in 2+ and a port open-in 3+ of the test platform external terminal P1, and a port passive open-out 3- of the test platform external terminal P2 is connected with the other two ports GND of the test platform external terminal P1.

[0012] Further, the bypass switch driving feedback test loop comprises: an open-out plug-in one and a sampling plug-in two arranged in the debugging instrument; a direct current program-controlled source two arranged in the program-controlled source; a relay K11 of the open-out plug-in one is connected with a port DC_V+ of the direct current program-controlled source two through a resistance R3 on one side, and is connected with a positive electrode of a thyristor SCR on the other side, at the same time, is connected with a port KGA of the SMC plug-in to be tested through a test platform external terminal, and a negative electrode of the thyristor SCR is grounded; a relay K12 of the open-out plug-in one is connected with a port DC_V- of the direct current program-controlled source two on one side, and is connected with a port GND of the SMC plug-in to be tested through a test platform external terminal on the other side; a 1# port and a 2# port of the sampling plug-in two are connected with a port KGA and a port GND of the SMC plug-in to be tested through test platform external terminals respectively.

[0013] Further, the IGBT drive feedback test loop comprises: an opening plug-in two, a sampling plug-in one and a sampling plug-in two arranged in the debugging instrument; the relay K5 of the opening plug-in two is connected with the port C1 and the port E1 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the relay K6 of the opening plug-in two is connected with the port C2 and the port E2 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the relay K7 of the opening plug-in two is connected with the port C3 and the port E3 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the relay K8 of the opening plug-in two is connected with the port C4 and the port E4 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 3# port, the 5# port, the 7# port and the 9# port of the sampling plug-in one are connected with the ports E1-E4 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 4# port, the 6# port, the 8# port and the 10# port of the sampling plug-in one are connected with the ports G1-G4 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 3# port, the 5# port, the 7# port and the 9# port of the sampling plug-in two are connected with the ports IGBT1_30V+ to IGBT4_30V+ of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 4# port, the 6# port, the 8# port and the 10# port of the sampling plug-in two are connected with the port GND of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform.

[0014] Compared with the prior art, the utility model discloses to the following beneficial effects: the utility model discloses that the communication line connection is used for the transmission of communication signals between the code scanning gun and the debugging instrument, the debugging instrument is connected with the program control source and the test platform through the communication line and transmits communication signals, the debugging instrument is connected with the program control source and the test platform through the test lead and transmits analog quantity and switch quantity signals, the debugging instrument is connected with the test platform through the download line and transmits the program file of the SMC plug-in to be tested, can support the test of different forms of various SMC plug-ins flexibly, and manual wiring is not needed in the test process, thereby improving test safety and test efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is the structural principle schematic drawing of a kind of SMC plug-in test tool provided in the embodiments of the utility model;

[0016] Figure 2 It is the principle diagram of power supply test loop in the embodiments of the utility model;

[0017] Figure 3Is the principle diagram of the voltage current sampling test circuit in the embodiment of the utility model, wherein, (a) is the direct current voltage current sampling test circuit, (b) is the alternating voltage current sampling test circuit;

[0018] Figure 4 Is the principle diagram of the PT100 / NTC sampling test circuit in the embodiment of the utility model;

[0019] Figure 5 Is the principle diagram of the incoming-outgoing test circuit in the embodiment of the utility model, wherein, (a) is the circuit principle diagram of the incoming-outgoing test circuit in the test platform external terminal, (b) is the circuit principle of sampling plug-in one Figure 1 ;

[0020] Figure 6 Is the principle diagram of the bypass switch drive feedback test circuit in the embodiment of the utility model, wherein, (a) is the circuit principle diagram of relay K11, (b) is the circuit principle diagram of outgoing plug-in one, (c) is the circuit principle diagram of sampling plug-in two Figure 1 ;

[0021] Figure 7 Is the principle diagram of the IGBT drive feedback test circuit in the embodiment of the utility model, wherein, (a) is the circuit principle diagram of outgoing plug-in two, (b) is the circuit principle diagram of sampling plug-in one Figure 2 , (c) is the circuit principle diagram of sampling plug-in two Figure 2 ;

[0022] Figure 1 In the embodiment of the utility model, 1, debugging instrument;2, program-controlled source;3, test tool;31, communication line;32, test lead;33, download line;34, test platform;4, code scanning gun;5, SMC plug-in to be measured. Specific implementation

[0023] The utility model will be further described below in conjunction with the drawings. The following embodiments are only used to more clearly illustrate the technical scheme of the utility model, and cannot limit the protection scope of the utility model.

[0024] As Figure 1 shown, an SMC plug-in test tool, comprising: communication line 31 for transmitting communication signals;Test lead 32 for transmitting analog signals and switching signals;Download line 33 for transmitting program files of SMC plug-in to be measured;Test platform 34 for installing SMC plug-in to be measured;Test platform 34 is connected with the communication plug-in set in debugging instrument 1 by communication line 31, is connected with outgoing plug-in and sampling plug-in set in debugging instrument 1 by test lead 32, and is connected with download plug-in set in debugging instrument 1 by download line 33;Debugging instrument 1 is connected with set program-controlled source 2 by communication line 31 and test lead 32 respectively.

[0025] The utility model discloses, test tool 3 mainly includes test platform 34 and three kinds of wires of test wire 32, communication line 31 and download line 33. Test wire 32 is used for analog quantity, switch quantity signal transmission, connects debugging instrument 1, program control source 2, test platform 34, and is welded with test holder or banana head plug, realizes the intercommunication of SMC plug-in hardware interface test loop. Communication line 31 is used for the transmission of communication signal, and is connected with debugging instrument 1, program control source 2, scanning code gun 4, test platform 34 to realize the information exchange of debugging instrument 1 to program control source 2, receive the SMC plug-in information scanned by scanning code gun 4, with the communication of SMC plug-in 5 to be measured. Download line 33 is used for the transmission of SMC plug-in program file to be measured, and is connected with debugging instrument 1 and test platform 34 to realize the automatic download of SMC plug-in program to be measured. Among them, communication line 31 and download line 33 adopt the shielded twisted pair, and are separately bundled, do not mix with test wire 32.

[0026] Test platform 34 is composed of base, probe, connecting line, external terminal. The base provides the bearing function for SMC plug-in, and adopts manual mechanism or automatic hydraulic mechanism to make the probe on the base contact SMC plug-in external interface terminal and probe point, and conduct the test loop. The connecting line is used for connecting the probe and test platform external terminal, and then the test platform external terminal is inserted into the test wire holder, and the test loop of the whole test tool is connected. Among them, the test platform external terminal uses the aviation plug structure, realizes the stable connection with the test wire holder. The distribution of aviation plug pin has enough gap, meets the welding requirement, prevents the short circuit of welding point and mutual interference.

[0027] The control method of test platform 34 is divided into automatic and manual two. The automatic test platform adopts hydraulic mechanism, when testing SMC plug-in, after scanning code gun 4 scans the bar code of SMC plug-in to be measured, debugging instrument 1 automatically drives hydraulic mechanism, and the plug-in to be measured is transmitted to the base of test platform, and after pressing the test probe, automatic test is carried out. Manual test platform needs to place SMC plug-in 5 to be measured to the base of test platform, and after pressing the probe by manual mechanism, the bar code of plug-in or liquid crystal key is scanned, and debugging instrument 1 is started to test automatically. The automatic test platform is used for the production test of manufacturing unit in-line, and the manual test platform is used for the test of factory sampling, reinspection and engineering site.

[0028] The debugging instrument 1 comprises several outgoing plug-ins and sampling plug-ins; the program-controlled source 2 comprises several direct current program-controlled sources and alternating current program-controlled sources; the several outgoing plug-ins, sampling plug-ins, direct current program-controlled sources and alternating current program-controlled sources are connected with the external terminals of the test platform respectively to form a power supply test loop, a voltage and current sampling test loop, a PT100 / NTC sampling test loop, an incoming and outgoing test loop, a bypass switch driving feedback test loop and an IGBT driving feedback test loop. In the utility model, the specific quantity of the communication plug-in n1, the outgoing plug-in n2, the sampling plug-in n3 and the program-controlled source n4 is determined according to the test requirement.

[0029] As shown in Figure 2 The power supply test loop comprises the outgoing plug-in one arranged in the debugging instrument and the direct current program-controlled source one arranged in the program-controlled source; one side of the relay K1 of the outgoing plug-in one is connected with the port DC_V+ of the direct current program-controlled source one, and the other side is connected with the power supply interface PWR+ of the SMC plug-in to be tested through the external terminal of the test platform; one side of the relay K2 of the outgoing plug-in one is connected with the port DC_V- of the direct current program-controlled source one, and the other side is connected with the power supply interface PWR- of the SMC plug-in to be tested through the external terminal of the test platform.

[0030] The input end of the power supply test loop is the program-controlled source direct current voltage output interface, the output end is the SMC power supply interface, and the middle is turned on and turned off through the debugging instrument outgoing plug-in control loop.

[0031] As shown in Figure 3 The voltage and current sampling test loop comprises the outgoing plug-in one arranged in the debugging instrument and the direct current program-controlled source two and the alternating current program-controlled source arranged in the program-controlled source.

[0032] The direct current voltage sampling test loop: one side of the relay K3, the relay K5 and the relay K7 of the outgoing plug-in one is connected with the port DC_V+ of the direct current program-controlled source two, and the other side is connected with the port power supply sampling+, direct current capacitor sampling+ and bypass capacitor sampling+ of the SMC plug-in to be tested through the external terminal of the test platform respectively; one side of the relay K4, the relay K6 and the relay K8 of the outgoing plug-in one is connected with the port DC_V- of the direct current program-controlled source two, and the other side is connected with the port power supply sampling-, direct current capacitor sampling- and bypass capacitor sampling- of the SMC plug-in to be tested through the external terminal of the test platform respectively.

[0033] The direct current voltage sampling test loop comprises three kinds of sampling test loops of power supply output voltage, direct current capacitor voltage and bypass capacitor voltage. The inputs of the three kinds of direct current voltage sampling test loops are the same direct current voltage output port of the same program-controlled source, and are sequentially applied to the collection ports of the SMC plug-in power supply output voltage, direct current capacitor voltage and bypass capacitor voltage through the outgoing plug-in switching output of the debugging instrument, and cannot be turned on at the same time during switching.

[0034] The relay K1 of the opening-out plug-in two is connected with the port AC_V+ of the AC program-controlled source, the other side is connected with the port AC voltage sampling+ of the SMC plug-in to be tested through the external terminal of the test platform; the relay K2 of the opening-out plug-in two is connected with the port AC_V- of the AC program-controlled source, the other side is connected with the port AC voltage sampling- of the SMC plug-in to be tested through the external terminal of the test platform; the relay K3 of the opening-out plug-in two is connected with the port AC_I+ of the AC program-controlled source, the other side is connected with the port AC current sampling+ of the SMC plug-in to be tested through the external terminal of the test platform; the relay K4 of the opening-out plug-in two is connected with the port AC_I- of the AC program-controlled source, the other side is connected with the port AC current sampling- of the SMC plug-in to be tested through the external terminal of the test platform.

[0035] The AC voltage and current sampling test loop is connected with the AC voltage and current ports of the program-controlled source, is output to the AC voltage and current collection ports of the SMC plug-in through the opening-out plug-in of the debugging instrument.

[0036] As shown in Figure 4 The PT100 / NTC sampling test loop includes the opening-out plug-in one arranged in the debugging instrument; the relay K9 of the opening-out plug-in one is connected with the port PT100 / NTC+ of the sensor PT100 / NTC and one end of the resistor R1, and the other side is connected with the other end of the resistor R1; the relay K10 of the opening-out plug-in one is connected with the port PT100 / NTC- of the sensor PT100 / NTC and one end of the resistor R2; the other end of the resistor R2 is connected with the other side of the relay K9.

[0037] The PT100 / NTC sampling test loop simulates the external temperature change by switching the resistance value of the external series resistance, that is, the resistance is connected in series with the external port of the SMC plug-in for testing. The K9 relay node of the opening-out plug-in is controlled by the debugging instrument to open and close, the resistance of the PT100 / NTC loop is changed, and the correctness test of the PT100 / NTC sampling is realized.

[0038] As shown in Figure 5As shown, the input / output test circuit includes: sampling plug-in 1 configured in the debugger; active output port 1+ of sampling plug-in 1 is connected to active output port 1+ of external terminal P2 of the test platform; active output port 1- of sampling plug-in 1 is connected to active output port 1- of external terminal P2 of the test platform; passive output port 2+ of external terminal P2 of the test platform is connected to input port 1+ of external terminal P1 of the test platform; passive output port 2- of external terminal P2 of the test platform is connected to one of the GND ports of external terminal P1 of the test platform; passive output port 3+ of external terminal P2 of the test platform is connected to input ports 2+ and 3+ of external terminal P1 of the test platform; and passive output port 3- of external terminal P2 of the test platform is connected to two of the GND ports of external terminal P1 of the test platform.

[0039] The input test circuit is for active input testing, and the output test circuit includes both passive and active output testing. The active output port of the SMC plug-in is connected to the sampling plug-in socket of the debugger via a test lead for voltage sampling and judgment. The passive output port is connected in series with the active input port via a test lead for internal coordination testing. When the passive output port is closed, the active input port is activated, and the SMC plug-in detects the active input displacement.

[0040] like Figure 6 As shown, the bypass switch drive feedback test circuit includes: output plug-in one and sampling plug-in two configured in the debugger; DC flow control source two configured in the programmable source; one side of relay K11 of output plug-in one is connected to the DC_V+ port of DC flow control source two through resistor R3, and the other side is connected to the positive terminal of the SCR device. At the same time, it is connected to the port KGA of the SMC plug-in under test through the external terminal of the test platform, and the negative terminal of the SCR device is grounded; one side of relay K12 of output plug-in one is connected to the DC_V- port of DC flow control source two, and the other side is connected to the port GND of the SMC plug-in under test through the external terminal of the test platform; ports 1# and 2# of sampling plug-in two are connected to ports KGA and GND of the SMC plug-in under test through the external terminal of the test platform, respectively.

[0041] The bypass switch drive feedback test circuit requires applying a DC voltage at the bypass switch drive feedback port to create a forward bias voltage between the SCR anode and cathode. A resistor is then connected in series to generate a sustaining current when the SCR is turned on. The SCR trigger signal is provided by the FPGA chip inside the SMC module. To further verify whether the SCR is correctly turned on, the SCR forward voltage needs to be measured. The SCR port is connected to the debugging instrument's sampling module. When the SCR is not turned on, the debugging instrument's sampling module acquires a high voltage, which is the output voltage of the programmable source; when the SCR is turned on, the port voltage drops to 0, and the sampling module acquires a voltage of 0.

[0042] likeFigure 7 As shown, the IGBT drive feedback test loop comprises: an opening plug-in two, a sampling plug-in one and a sampling plug-in two arranged in the debugging instrument; the relay K5 of the opening plug-in two is connected with the port C1 and the port E1 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the relay K6 of the opening plug-in two is connected with the port C2 and the port E2 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the relay K7 of the opening plug-in two is connected with the port C3 and the port E3 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the relay K8 of the opening plug-in two is connected with the port C4 and the port E4 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 3# port, the 5# port, the 7# port and the 9# port of the sampling plug-in one are connected with the ports E1-E4 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 4# port, the 6# port, the 8# port and the 10# port of the sampling plug-in one are connected with the ports G1-G4 of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 3# port, the 5# port, the 7# port and the 9# port of the sampling plug-in two are connected with the ports IGBT1_30V+ to IGBT4_30V+ of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform; the 4# port, the 6# port, the 8# port and the 10# port of the sampling plug-in two are connected with the port GND of the IGBT drive loop in the SMC plug-in to be tested through the external terminals of the test platform.

[0043] During the test, the capacitive load is simulated by connecting the capacitors in series between the G and E ports of the IGBT drive loop, the IGBT drive loop C and E terminals are short-circuited by the opening plug-in of the debugging instrument, and the IGBT drive loop is triggered to flip under the premise that the SMC plug-in receives the test instruction of the debugging instrument to control the IGBT drive loop to output a square wave with a fixed frequency of 1kHz and a duty cycle of 0.5, and the terminal voltage between G and E measured by the sampling plug-in of the debugging instrument is-2~2V. At this time, the C and E terminal connection is disconnected by controlling the opening plug-in, the SMC plug-in generates an IGBT fault alarm signal, and the debugging instrument can read the alarm information of the SMC to be tested through the serial communication line to make a judgment.

[0044] The utility model discloses a plurality of hardware interface test loop is designed, can realize automatic and manual control, supports various SMC plug-in automatic test, can effectively solve the problem that the SMC plug-in test environment needs to change test line frequently and SMC plug-in test compatibility is poor, improves the compatibility and test efficiency of test, reduces the security risk of manual line change, satisfies the use demand of various occasions of manufacture and engineering.

[0045] The above merely is the preferred implementation manner of the present application, and it should be noted that, for the ordinary skilled in the art, without departing from the technical principles of the present application, a number of improvements and deformations can be made, and these improvements and deformations should also be considered as the protection scope of the present application.

Claims

1. An SMC plug-in testing fixture, characterized in that, include: Communication lines used for transmitting communication signals; Test leads used for transmitting analog and digital signals; Download cable used to transfer the SMC plugin program file to be tested; A test platform for installing the SMC plugin under test; The test platform is connected to the communication plug-in set in the debugger via a communication cable, to the output plug-in and sampling plug-in set in the debugger via a test wire, and to the download plug-in set in the debugger via a download cable; the debugger is connected to the set programmable source via a communication cable and a test wire.

2. The SMC plug-in testing fixture according to claim 1, characterized in that, The testing platform includes: A base for supporting the SMC plugin under test; Probes are mounted on the base for connecting to the external port of the SMC plug-in under test. External terminals of the test platform connected to the probe.

3. The SMC plug-in testing fixture according to claim 2, characterized in that, The base is also equipped with a manual or hydraulic drive mechanism for connecting or disconnecting the probe from the external port of the SMC plug-in under test.

4. The SMC plug-in testing fixture according to claim 2, characterized in that, The debugger includes several output plug-ins and sampling plug-ins; the programmable source includes several direct flow control sources and alternating flow control sources. Several output plug-in modules, sampling plug-in modules, direct current control sources, and alternating current control sources are connected to the external terminals of the test platform to form a power supply test circuit, a voltage and current sampling test circuit, a PT100 / NTC sampling test circuit, an input-output test circuit, a bypass switch drive feedback test circuit, and an IGBT drive feedback test circuit.

5. The SMC plug-in testing fixture according to claim 4, characterized in that, The power supply test circuit includes: an output plug-in configured in the debugger and a direct current flow control source configured in the programmable source; One side of relay K1 of plug-in 1 is connected to the DC_V+ port of DC flow control source 1, and the other side is connected to the power interface PWR+ of the SMC plug-in under test through the external terminal of the test platform. One side of relay K2 of plug-in 1 is connected to the DC_V- port of DC flow control source 1, and the other side is connected to the power interface PWR- of the SMC plug-in under test through the external terminal of the test platform.

6. The SMC plug-in testing fixture according to claim 4, characterized in that, The voltage and current sampling test circuit includes: an output plug-in 1 configured in the debugger and a DC flow control source 2 and an AC flow control source configured in the programmable source; DC voltage sampling test circuit One side of relays K3, K5, and K7 of plug-in 1 is connected to the DC_V+ port of DC flow control source 2, and the other side is connected to the port power sampling +, DC capacitor sampling +, and bypass capacitor sampling + of the SMC plug-in under test through the external terminals of the test platform, respectively. One side of relays K4, K6, and K8 of plug-in 1 is connected to the DC_V- port of DC flow control source 2, and the other side is connected to the port power sampling-, DC capacitor sampling-, and bypass capacitor sampling- of the SMC plug-in under test through the external terminals of the test platform, respectively. AC voltage and current sampling test circuit One side of relay K1 of plug-in 2 is connected to the AC_V+ port of the AC flow control source, and the other side is connected to the AC voltage sampling+ port of the SMC plug-in under test through the external terminal of the test platform. One side of relay K2 of plug-in 2 is connected to the AC_V- port of the AC flow control source, and the other side is connected to the AC voltage sampling port of the SMC plug-in under test through the external terminal of the test platform. One side of relay K3 of plug-in 2 is connected to the AC_I+ port of AC flow control source, and the other side is connected to the AC current sampling+ port of the SMC plug-in under test through the external terminal of the test platform. One side of relay K4 of plug-in 2 is connected to the AC_I- port of the AC flow control source, and the other side is connected to the AC current sampling port of the SMC plug-in under test through the external terminal of the test platform.

7. The SMC plug-in testing fixture according to claim 4, characterized in that, The PT100 / NTC sampling test circuit includes: an output plug-in configured in the debugger; Connect one side of relay K9 of plug-in 1 to port PT100 / NTC+ of sensor PT100 / NTC and one end of resistor R1, and connect the other side to the other end of resistor R1. Connect one side of relay K10 of plug-in 1 to port PT100 / NTC- of sensor PT100 / NTC and one end of resistor R2; connect the other end of resistor R2 to the other side of relay K9.

8. The SMC plug-in testing fixture according to claim 4, characterized in that, The input / output test circuit includes: a sampling plug-in configured in the debugger; The active output port 1+ of sampling plug-in 1 is connected to the active output port 1+ of external terminal P2 of the test platform; The active output port 1 of sampling plug-in 1 is connected to the active output port 1 of external terminal P2 of the test platform; The passive output port 2+ of the external terminal P2 of the test platform is connected to the input port 1+ of the external terminal P1 of the test platform. The passive output port 2 of external terminal P2 of the test platform is connected to one of the GND ports of external terminal P1 of the test platform. The passive output port 3+ of external terminal P2 of the test platform is connected to the input ports 2+ and 3+ of external terminal P1 of the test platform. The passive output port 3 of the external terminal P2 of the test platform is connected to the second and third ports GND of the external terminal P1 of the test platform.

9. The SMC plug-in testing fixture according to claim 4, characterized in that, The bypass switch drive feedback test circuit includes: output plug-in one and sampling plug-in two configured in the debugger; and direct current flow control source two configured in the programmable source. One side of relay K11 of plug-in 1 is connected to the DC_V+ port of DC flow control source 2 through resistor R3, and the other side is connected to the positive terminal of the SCR device. At the same time, it is connected to the port KGA of the SMC plug-in under test through the external terminal of the test platform, and the negative terminal of the SCR device is grounded. One side of relay K12 of plug-in 1 is connected to the DC_V- port of DC flow control source 2, and the other side is connected to the GND port of the SMC plug-in under test through the external terminal of the test platform. Ports 1 and 2 of sampling plug-in 2 are connected to ports KGA and GND of the SMC plug-in under test via external terminals of the test platform, respectively.

10. The SMC plug-in testing fixture according to claim 4, characterized in that, The IGBT drive feedback test loop includes: output plug-in two, sampling plug-in one, and sampling plug-in two configured in the debugger; The relay K5 of plug-in 2 is connected to ports C1 and E1 of the IGBT drive circuit in the SMC plug-in under test through external terminals of the test platform. The relay K6 of plug-in 2 is connected to ports C2 and E2 of the IGBT drive circuit in the SMC plug-in under test through external terminals of the test platform. The relay K7 of plug-in 2 is connected to ports C3 and E3 of the IGBT drive circuit in the SMC plug-in under test through external terminals of the test platform. The relay K8 of plug-in 2 is connected to ports C4 and E4 of the IGBT drive circuit in the SMC plug-in under test via external terminals of the test platform. Ports 3, 5, 7, and 9 of sampling plug-in 1 are connected to ports E1 to E4 of the IGBT drive circuit in the SMC plug-in under test via external terminals of the test platform. Ports 4, 6, 8, and 10 of sampling plug-in 1 are connected to ports G1 to G4 of the IGBT drive circuit in the SMC plug-in under test via external terminals of the test platform. Ports 3, 5, 7, and 9 of sampling plug-in 2 are connected to the ports IGBT1_30V+ to IGBT4_30V+ of the IGBT drive circuit in the SMC plug-in under test via external terminals of the test platform, respectively. Ports 4, 6, 8, and 10 of sampling plug-in 2 are connected to the GND port of the IGBT drive circuit in the SMC plug-in under test through the external terminals of the test platform.