Pluggable communication interface on-off control device and testing device

Abstract

The utility model discloses a pluggable communication interface on-off control device and a testing device. The interface on-off control device comprises a control port; at least one pair of a first data port and a second data port connected to each other; the signal end of the second data port is connected with the first data port through the first switch; the power supply end of the second data port is connected with the driving power supply through the protection circuit; two ends of the protection circuit are connected in parallel with a second switch for shielding the protection circuit; the protection circuit is connected with the driving power supply through the switch controller; and the control circuit is connected with the control port, the first switch and the switch controller, and the control circuit is used for controlling the states of the first switch and the switch controller according to a control signal sent by the test terminal. According to the interface on-off control device, millisecond-level accurate time sequence control is realized, the power supply channel is thoroughly cut off when the data channel between the test terminal and the to-be-tested object is cut off, and the influence of a power supply signal on data acquisition of the to-be-tested object is avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to computer test equipment technical field especially, relates to a kind of pluggable communication interface on-off control device and testing device. BACKGROUND

[0002] In the research and development and production process of electronic wearable devices, medical sensors and Internet of Things terminals, high-precision sampling of mV-level weak signals (such as bioelectric signals, environmental sensor outputs, etc.) is often required. Such devices are usually connected to an upper computer (such as a PC) through a USB interface to achieve data transmission and debugging.

[0003] During debugging and production, the traditional method requires manual plugging and unplugging of the USB cable to physically disconnect or connect the channel between the object to be tested and the test terminal. However, manual operation is inefficient and cannot disconnect at precise time points. Moreover, repeated plugging and unplugging can cause interface wear and tear, increasing maintenance costs.

[0004] In addition, during reliability testing of the object to be tested in the laboratory, the USB hot plug needs to be simulated to evaluate the product's ability to withstand electrical overstress (EOS). The existing technology uses manual plugging and unplugging, which is inefficient and cannot achieve high-frequency testing. There are also mechanical arm plugging methods, but the equipment is large in size and high in cost, and it is difficult to record electrical parameters synchronously. There are also software-controlled on-off methods, but they can only disconnect the data signal (D+ / D-), and cannot isolate the power supply (Vbus), resulting in a deviation between the test results and the actual plugging scenario. UTILITY MODEL CONTENT

[0005] The utility model aims to solve the above technical problems by providing a pluggable communication interface on-off control device and testing device that supports automated testing and simultaneously controls the on-off of data and power supply at the interface of the object to be tested.

[0006] To achieve the above-mentioned purpose, the utility model provides a pluggable communication interface on-off control device for testing the communication connection between the test terminal and the object to be tested. The control device includes:

[0007] a control port;

[0008] at least one pair of first and second data ports connected to each other, the first data port and the control port are used to connect with the test terminal in a pluggable manner, and the second data port is used to connect with the object to be tested in a pluggable manner;

[0009] the signal end of the second data port is connected to the first data port through a first switch;

[0010] The power supply end of the second data port is connected with a driving power supply through a protection circuit, and the protection circuit is used for preventing the spurious signal in the driving power supply from entering the second data port;

[0011] A second switch is connected in parallel across the protection circuit and used for shielding the protection circuit;

[0012] The protection circuit is connected with the driving power supply through a switch controller;

[0013] A control circuit is connected with the control port, the first switch and the switch controller, and the control circuit is used for controlling the states of the first switch and the switch controller according to the control signal sent by the test terminal.

[0014] Preferably, the driving power supply is provided by the data port of the test terminal connected with the first data port or an external power supply independent of the test terminal.

[0015] Preferably, the power input end of the protection circuit is connected with one of the power supply end of the first data port and the external power supply through a selection switch.

[0016] Preferably, the switch controller comprises a relay switch and a relay controller, the relay switch is connected between the driving power supply and the protection circuit, one end of the relay controller is connected with the control circuit, and the other end of the relay controller is connected with the relay switch.

[0017] Preferably, the control port, the first data port and the second data port are USB ports.

[0018] The utility model also provides a kind of test device, it includes test terminal and interface on-off control device, and the interface on-off control device includes control port, at least one pair of first data port and second data port connected with each other and control circuit;The control port and the first data port are connected with the test terminal in pluggable mode, and the second data port is connected with the object to be measured in pluggable mode;

[0019] The signal end of the second data port is connected with the first data port through a first switch;

[0020] The power supply end of the second data port is connected with a driving power supply through a protection circuit, and the protection circuit is used for preventing the spurious signal in the driving power supply from entering the second data port;

[0021] A second switch is connected in parallel across the protection circuit and used for shielding the protection circuit;

[0022] The protection circuit is connected with the driving power supply through a switch controller;

[0023] The control circuit is connected with the control port, the first switch and the switch controller, and is configured to control states of the first switch and the switch controller according to a control signal sent by the test terminal.

[0024] The control circuit is connected with the control port, the first switch and the switch controller, and is configured to control states of the first switch and the switch controller according to a control signal sent by the test terminal.

[0025] Preferably, the control port and the first data port are connected with the same or two different data ports on the test terminal.

[0026] Preferably, a power input end of the protection circuit is connected with one of a power supply end of the first data port and an external power supply through a selection switch.

[0027] Preferably, the switch controller comprises a relay switch and a relay controller, the relay switch is connected between the driving power supply and the protection circuit, one end of the relay controller is connected with the control circuit, and the other end of the relay controller is connected with the relay switch.

[0028] Preferably, the control port, the first data port and the second data port are all USB ports.

[0029] Compared with the prior art, the pluggable communication interface on-off control device provided by the technical scheme of the utility model can receive instructions of a test terminal through a control circuit, control a first switch (data signal on-off) and a switch controller (power supply isolation) in real time, realize millisecond-level accurate timing control, completely cut off a power supply channel when a data channel between the test terminal and an object to be tested is disconnected, avoid the influence of a power supply signal on data collection of the object to be tested, and further interfere with debugging of the object to be tested. In addition, through the setting of a second switch, the impact of a noise signal on the object to be tested can be simulated in hot plug life test, and the influence of hot plug on the object to be tested can be accurately evaluated. BRIEF DESCRIPTION OF DRAWINGS

[0030] Figure 1 It is a circuit principle diagram of a test device in one embodiment of the utility model.

[0031] Figure 2 It is a circuit principle diagram of a test device in another embodiment of the utility model. DETAILED DESCRIPTION

[0032] In order to explain the technical content, the structural features, the purposes and the effects of the utility model in detail, the utility model will be described in detail below in combination with the embodiments and the drawings.

[0033] The embodiment discloses a test device for sampling and measuring micro-voltage signal data and reliability detection.

[0034] As Figure 1 The test device comprises a test terminal and an interface on-off control device 100. The test terminal can be a PC or other customized terminal, and the interface on-off control device 100 is used to connect the object to be tested with the test terminal and control the connection state of the two, including the data connection state and the power connection state.

[0035] The interface on-off control device 100 comprises a control port D0, at least one pair of first and second data ports D1 and D2 connected with each other and a control circuit MCU. The control circuit MCU can be realized by a single-chip microcomputer.

[0036] The control port D0 and the first data port D1 are connected with the test terminal in a pluggable manner, and the second data port D2 is connected with the object to be tested in a pluggable manner.

[0037] The signal end of the second data port D2 is connected with the first data port D1 through a first switch K1. Therefore, the data channel (D+ / D-) between the second data port D2 and the first data port D1 can be controlled by controlling the on / off state of the first switch K1.

[0038] The power end (Vbus) of the second data port D2 is connected with the driving power source through a protection circuit EOS. The protection circuit EOS is used to prevent the spurious signal (such as a surge signal) in the driving power source from entering the second data port D2. The specific configuration of the protection circuit is well known to those skilled in the art, and will not be described here.

[0039] In the production debugging process, the power signal enters the second data port D2 through the protection circuit EOS to provide power supply for the second data port D2. Therefore, the protection circuit EOS filters out the spurious signal in the power signal, avoiding the influence of the spurious signal on the data transmission of the second data port D2.

[0040] The protection circuit EOS is connected with a second switch K2 in parallel at both ends, which is used to shield the protection circuit EOS. Therefore, the protection circuit EOS can be selected to be connected or not connected to the power circuit of the second data port D2 by controlling the on / off state of the second switch K2. Specifically, the second switch K2 is opened to connect the protection circuit EOS to the circuit of the second data port D2 for production debugging. For the plugging reliability test of the object to be tested, the second switch K2 is closed to bypass the protection circuit EOS.

[0041] The protection circuit EOS is connected with the driving power supply through the switch controller U, so that the protection circuit EOS provides or disconnects the power signal to the second data port D2 by controlling the state of the switch controller U.

[0042] The control circuit MCU is connected with the control port DO, the first switch K1 and the switch controller U, and the control circuit MCU is used for controlling the state of the first switch K1 and the switch controller U according to the control signal sent by the test terminal.

[0043] Specifically, the control port DO, the first data port D1 and the second data port D2 are all USB ports.

[0044] On the other hand, the control port DO and the first data port D1 can be connected with the test terminal through the same data port on the test terminal. In use, a port expander can be connected on the data port of the test terminal, and the control port DO and the first data port D1 are respectively connected with different interfaces on the port expander, so that the control port DO and the first data port D1 respectively receive different signals at different time points by controlling the timing state of the data port on the test terminal connected with the port expander.

[0045] In addition, the control port DO and the first data port D1 can also be connected with two different data ports on the test terminal. In this way, the operation is more convenient, and the editing of the test program is also facilitated.

[0046] Next, taking the control port DO and the first data port D1 connected with two different data ports on the test terminal as an example, the working principle of the test device is described.

[0047] First of all, it should be pointed out that the two different data ports on the test terminal are port A and port B respectively. The control port DO in the interface on-off control device 100 is connected with the port B, the first data port D1 is connected with the port A, and the second data port D2 is connected with the object to be tested.

[0048] The test device is used in the production debugging scene:

[0049] 1. The test terminal sends the on-off instruction to the control port DO through the port B, so that the control circuit MCU controls the first switch K1 to be in the closed state and controls the switch controller U to connect the power supply path of the protection circuit EOS after receiving the instruction. At this time, the second switch K2 can be controlled to be in the open state manually or automatically, so that the object to be tested and the test terminal establish communication connection.

[0050] 2、Test terminal sends sampling instruction to first data port D1 through port A, which is received by the object under test through second data port D2, preparing for data sampling;

[0051] 3、Test terminal sends disconnecting instruction to control port D0 through port B, then control circuit MCU receives the instruction, controls first switch K1 to be in open state, and controls switch controller U to disconnect the power supply path of protection circuit EOS, so that the data channel and power supply channel between the object under test and test terminal are disconnected;

[0052] 4、Wait for a preset time, during which the object under test completes data sampling;

[0053] 5、When the preset time is up, test terminal sends connecting instruction to control port D0 through port B, then control circuit MCU receives the instruction, controls first switch K1 to be in closed state, and controls switch controller U to connect the power supply path of protection circuit EOS, so that the object under test and test terminal establish communication connection;

[0054] 6、Test terminal sends data transmission instruction to first data port D1 through port A, and the object under test transmits the collected data to test terminal through second data port D2, first switch K1, first data port D1 and port A.

[0055] 7、Test terminal analyzes and processes the obtained sampling data.

[0056] The above test device is used in the plug-in test scene:

[0057] 1、Close second switch K2 to bypass protection circuit EOS, so as to detect the plug-in reliability of the object under test without protection.

[0058] 2、Test terminal sends connecting instruction to control port D0 through port B, then control circuit MCU receives the instruction, controls first switch K1 to be in closed state, and controls switch controller U to connect the power supply path of second data port D2, so that the object under test and test terminal establish communication connection;

[0059] 3、Test terminal sends handshake command to first data port D1 through port A, which reaches the object under test through first switch K1 and second data port D2;

[0060] If the data returned by the object under test is abnormal, it indicates that the object under test has functional abnormality (generally caused by transient voltage pulse on the line during hot plug-in process);

[0061] If the data returned by the object under test is normal, the next test process is entered.

[0062] 4、the test terminal sends a disconnect command to the control port D0 through the port B, then the control circuit MCU receives the command and controls the first switch K1 to be in the off state, and controls the switch controller U to disconnect the power supply path of the second data port D2, so that the data channel and the power supply channel between the test terminal and the object under test are disconnected.

[0063] 5、determine whether the test number reaches the set value, if yes, receive the test, if not, return to step 2.

[0064] Thus, the interface on-off control device 100 receives the command of the test terminal through the control circuit MCU, controls the first switch K1 (data signal on-off) and the switch controller U (power supply isolation) in real time, realizes millisecond-level accurate timing control, and completely cuts off the power supply channel when disconnecting the data channel between the test terminal and the object under test, avoids the influence of the power supply signal on the data collection of the object under test, and further interferes with the debugging of the object under test. In addition, through the setting of the second switch K2, the impact of the noise signal on the object under test can be simulated in the hot plug life test, and the influence of the hot plug on the object under test can be accurately evaluated.

[0065] On the other hand, the driving power supply is provided by the data port (i.e. port A) of the test terminal connected to the first data port D1. In this way, the circuit is simple and easy to implement.

[0066] However, the power supply output by the data port of the test terminal often has the problem of insufficient power supply, especially when the test terminal serves multiple objects under test through multiple data ports, the power voltage obtained by the first data port D1 will also have the problem of insufficient voltage. To this end, the driving power supply can also be an external power supply VCC independent of the test terminal, such as a battery or a switching power supply independent of the test terminal.

[0067] For example, as shown in Figure 2 , the interface on-off control device 100 is configured with two pairs of first data ports D1 and second data ports D2. Then, the port B on the test terminal is connected with the control port D0, the port A1 on the test terminal is connected with one of the first data ports D1, and the port A2 on the test terminal is connected with the other first data port D1. The control circuit MCU is connected with the two first switches K1 and the two switch controllers U between the two pairs of first data ports D1 and second data ports D2. In addition, the external power supply VCC is connected with the input terminals of the two protection circuits EOS at the same time.

[0068] On the other hand, the power input end of the protection circuit EOS is connected with one of the power supply end of the first data port D1 and the external power supply VCC through the selection switch K3. Through the setting of the selection switch K3, the user can select to use the external power supply VCC or the power supply provided by the data port of the test terminal according to the actual demand.

[0069] On the other hand, the switch controller U includes a relay switch U2 and a relay controller U1, the relay switch U2 is connected between the driving power supply and the protection circuit EOS, one end of the relay controller U1 is connected with the control circuit MCU, and the other end of the relay controller U1 is connected with the relay switch U2. In the embodiment, through the setting of the relay switch U2 and the relay controller U1, the control circuit MCU is isolated from the power supply circuit, and the interference of the power supply entering the protection circuit EOS to the control circuit MCU can be avoided.

[0070] The above only discloses the preferred embodiments of the utility model, of course cannot with this to limit the utility model right scope, therefore the equivalent change made in the utility model application patent scope still belongs to the range covered by the utility model.

Claims

1. A pluggable communication interface on / off control device, used for testing the communication connection between a terminal and a test object, characterized in that, The control device includes: Control port; At least one pair of first data ports and second data ports connected to each other, wherein the first data port and the control port are used to be pluggably connected to the test terminal, and the second data port is used to be pluggably connected to the object under test; The signal terminal of the second data port is connected to the first data port via the first switch; The power supply terminal of the second data port is connected to the drive power supply through a protection circuit, which is used to prevent noise signals in the drive power supply from entering the second data port. A second switch for shielding the protection circuit is connected in parallel across both ends of the protection circuit. The protection circuit is connected to the drive power supply via a switch controller; A control circuit is provided, which is connected to the control port, the first switch, and the switch controller. The control circuit is used to control the state of the first switch and the switch controller according to the control signal sent by the test terminal.

2. The pluggable communication interface on / off control device according to claim 1, characterized in that, The driving power is provided by the data port of the test terminal connected to the first data port or by an external power supply independent of the test terminal.

3. The pluggable communication interface on / off control device according to claim 2, characterized in that, The power input terminal of the protection circuit can be connected to either the power terminal of the first data port or the external power supply via a selection switch.

4. The pluggable communication interface on / off control device according to claim 1, characterized in that, The switch controller includes a relay switch and a relay controller. The relay switch is connected between the drive power supply and the protection circuit. One end of the relay controller is connected to the control circuit, and the other end of the relay controller is connected to the relay switch.

5. The pluggable communication interface on / off control device according to claim 1, characterized in that, The control port, the first data port, and the second data port are all USB ports.

6. A testing apparatus, characterized in that, The device includes a test terminal and an interface on / off control device. The interface on / off control device includes a control port, at least one pair of first data ports and second data ports connected to each other, and a control circuit. The control port and the first data ports are pluggable to the test terminal, and the second data port is pluggable to the object under test. The signal terminal of the second data port is connected to the first data port via the first switch; The power supply terminal of the second data port is connected to the drive power supply through a protection circuit, which is used to prevent noise signals in the drive power supply from entering the second data port. A second switch for shielding the protection circuit is connected in parallel across both ends of the protection circuit. The protection circuit is connected to the drive power supply via a switch controller; The control circuit is connected to the control port, the first switch and the switch controller, and the control circuit is used to control the state of the first switch and the switch controller according to the control signal sent by the test terminal; The control circuit is connected to the control port, the first switch, and the switch controller. The control circuit is used to control the state of the first switch and the switch controller according to the control signal sent by the test terminal.

7. The testing apparatus according to claim 6, characterized in that, The control port and the first data port are connected to the same or two different data ports on the test terminal.

8. The testing apparatus according to claim 6, characterized in that, The power input terminal of the protection circuit can be connected to either the power terminal of the first data port or an external power supply via a selection switch.

9. The testing apparatus according to claim 6, characterized in that, The switch controller includes a relay switch and a relay controller. The relay switch is connected between the drive power supply and the protection circuit. One end of the relay controller is connected to the control circuit, and the other end of the relay controller is connected to the relay switch.

10. The testing apparatus according to claim 6, characterized in that, The control port, the first data port, and the second data port are all USB ports.

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