Circuit for preventing virtual connection and leakage connection of battery voltage
By introducing a battery voltage anti-loose connection circuit into the battery capacity testing equipment, and using a probe structure and operational amplifier circuit to amplify the signal, the safety accidents caused by abnormal voltage sampling are solved, achieving safe and reliable cell testing and reducing costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-03
- Publication Date
- 2026-03-27
AI Technical Summary
Existing battery capacity testing equipment is prone to overcharging or over-discharging of battery cells when the voltage sampling is abnormal, which can lead to safety accidents such as fires. In addition, it is costly and has complex circuitry.
A battery voltage anti-loose connection circuit is adopted, including a probe structure, an operational amplifier circuit, an MCU chip, and a resistor. When the voltage signal through the probe structure is loosely connected, the signal flows through the resistor and is amplified by the operational amplifier circuit before being sent to the MCU chip, ensuring that the signal is not distorted and preventing the issuance of erroneous instructions.
It effectively prevents overshoot and over-discharge accidents caused by poor voltage sampling connection, reduces costs without damaging the original circuit structure, and achieves safe and reliable cell testing.
Smart Images
Figure CN224052376U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the technical field of battery capacity grading test, especially a battery voltage false connection and missing connection prevention circuit. BACKGROUND
[0002] With the development of new energy, the application field of batteries is more and more extensive, and the market demand for batteries is also more and more large, in order to meet the demand of large quantity battery production, all battery manufacturers use multi-channel battery capacity grading equipment to detect the capacity of large capacity.
[0003] At present, the capacity grading detection equipment adopts the four-wire system voltage sampling of the thimble, samples and returns the control of the measured battery, and once the voltage sampling appears abnormal, it is easy to cause the battery to overcharge or overdischarge and cause fire and other serious production accidents. UTILITY MODEL CONTENTS
[0004] The technical problem to be solved by the utility model is to provide a battery voltage false connection and missing connection prevention circuit in view of the deficiencies of the prior art.
[0005] To solve the above technical problems, the utility model adopts the following technical scheme.
[0006] A battery voltage false connection and missing connection prevention circuit is used for collecting the voltage of a battery, comprising a battery capacity grading test device, a probe structure, an operational amplifier circuit, an MCU chip, a resistor R3 and a resistor R6; the battery capacity grading test device is connected with the battery through the probe structure, one end of the operational amplifier circuit is connected with one end of the probe structure, the other end is connected with the MCU chip, the other end of the MCU chip is connected with the battery capacity grading test device, one end of the resistor R3 is connected with I+ of the probe structure, the other end is connected with the operational amplifier circuit, one end of the resistor R6 is connected with I- of the probe structure, the other end is connected with the operational amplifier circuit.
[0007] A preferred scheme is that the probe structure comprises a movable thimble, a compression spring, a movable baffle and a copper column, the compression spring is movably sleeved outside the copper column and is used for driving the movable thimble to move.
[0008] The battery voltage false connection and missing connection prevention circuit provided by the embodiment of the utility model has at least the following beneficial effects: when the voltage sampling of the probe structure is invalid, the battery cell voltage sampling signal is a false voltage, the signal given to the MCU chip through the operational amplifier circuit is a false voltage, and the MCU chip issues an error instruction. When this situation occurs, the voltage line of the probe structure is false connected, the battery cell sampling signal flows through R3 and R6 to the operational amplifier circuit from I+ and I-, and the signal is amplified and given to the MCU chip, so that the sampling signal cannot be distorted no matter how, and the occurrence of battery cell overcharge and overdischarge and the like is greatly avoided. The overcharge and overdischarge safety accidents caused by false connection of voltage sampling can be prevented. The cost is low, the circuit is simple, the original circuit structure is not damaged while the function is increased.
[0009] The above description is only a summary of the technical scheme of the utility model, in order to more clearly understand the technical means of the utility model, the content of the specification can be implemented, and in order to make the above and other purposes, characteristics and advantages of the utility model more obvious and easy to understand, the following preferred embodiments are described in detail, and the drawings are as follows. BRIEF DESCRIPTION OF DRAWINGS
[0010] Fig. 1 It is the schematic diagram of the utility model;
[0011] Fig. 2 It is the schematic diagram of the probe structure in the utility model;
[0012] Fig. 3 It is the schematic diagram of the probe structure and the battery cell when they are in contact. DETAILED DESCRIPTION
[0013] In order to explain the idea and purpose of the application, the application will be further described in combination with the drawings and specific embodiments.
[0014] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terms used in the specification of the application are only for the purpose of describing specific embodiments and are not intended to limit the application; the specification and claims of the application and the above drawing description of the terms "include" and "have" and any modification thereof are intended to cover non-exclusive inclusion. The specification and claims of the application or the above drawing of the terms "first", "second", "left", "right" and the like are used to distinguish different objects, not to describe a specific order.
[0015] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.
[0016] like Figs. 1-3 As shown, a battery voltage anti-loose connection circuit is used to collect the voltage of a battery cell 5. It includes a battery cell capacity testing device 1, a probe structure 2, an operational amplifier circuit 3, an MCU chip 4, resistors R3 and R6. The battery cell capacity testing device 1 is connected to the battery cell 5 via the probe structure 2. One end of the operational amplifier circuit 3 is connected to one end of the probe structure 2, and the other end is connected to the MCU chip 4. The other end of the MCU chip 4 is connected to the battery cell capacity testing device 1. One end of the resistor R3 is connected to the I+ pin of the probe structure 2, and the other end is connected to the operational amplifier circuit 3. One end of the resistor R6 is connected to the I- pin of the probe structure 2, and the other end is connected to the operational amplifier circuit 3.
[0017] like Figs. 1-3 As shown, the cell capacity testing equipment 1 acquires voltage through the probe structure 2, amplifies the signal through the operational amplifier circuit 3, and sends it to the MCU chip 4 to control the current and time of the host computer, thereby controlling the capacity of the cell 5.
[0018] like Figs. 1-3 As shown, when the voltage sampling of probe structure 2 fails, the voltage sampling signal of cell 5 is a virtual voltage. The signal sent to MCU chip 4 through operational amplifier circuit 3 is also a virtual voltage, causing MCU chip 4 to issue incorrect instructions. When this occurs, the voltage lines of probe structure 2 are loosely connected. The sampling signal of cell 5 flows from I+ and I- through R3 and R6 to operational amplifier circuit 3. After signal amplification, it is sent to MCU chip 4, ensuring that the sampling signal will not be distorted regardless of the situation, greatly avoiding overshooting and over-discharge of cell 5.
[0019] like Figs. 1-3 As shown, this design can prevent overshoot and over-discharge safety accidents caused by poor voltage sampling connections. It is low-cost, has a simple circuit, and adds functionality without damaging the original circuit structure.
[0020] like Figs. 1-3 As shown, the probe structure 2 includes a movable ejector pin 21, a compression spring 22, a movable baffle 23, and a copper pillar 24. The compression spring 22 is movably sleeved on the copper pillar 24 to drive the movable ejector pin 21 to move.
[0021] like Figs. 1-3As shown, by pressing the probe structure 2, the movable ejector pin 21 is ejected and collects the voltage of the electrode lug of the battery cell, thereby performing automatic control of charging and discharging of the battery cell.
[0022] The above is the specific embodiment of the present application, it should be pointed out that, for those skilled in the technical field, without departing from the principles of the present application, can make a number of improvements and refinements, these improvements and refinements also as the protection scope of the present application.
Claims
1. A battery voltage false connection miss connection circuit for collecting the voltage of a battery cell, characterized in that, The battery cell capacity test device comprises a probe structure, an operational amplifier circuit, an MCU chip, a resistor R3 and a resistor R6; the battery cell capacity test device is connected with the battery cell through the probe structure; one end of the operational amplifier circuit is connected with one end of the probe structure, and the other end is connected with the MCU chip; the other end of the MCU chip is connected with the battery cell capacity test device; one end of the resistor R3 is connected with I+ of the probe structure, and the other end is connected with the operational amplifier circuit; one end of the resistor R6 is connected with I- of the probe structure, and the other end is connected with the operational amplifier circuit.
2. The battery voltage anti-false connection missing connection circuit according to claim 1, characterized by, The probe structure comprises a movable ejector pin, a compression spring, a movable baffle and a copper column; the compression spring is movably sleeved outside the copper column and used for driving the movable ejector pin to move.