Test experiment device for characteristic frequency of transistor

Abstract

The utility model discloses a transistor characteristic frequency test experiment device, which relates to the field of transistor characteristic frequency test experiments and comprises a first input module, a test module, a liquid crystal display module, a first measurement module, a second input module and a second measurement module. The test module is electrically connected with the first input module, the second input module, the liquid crystal display module, the first measurement module and the second measurement module. According to the transistor characteristic frequency test experimental device, the high-precision digital source meter is adopted to realize direct test of the transistor characteristic frequency and indirect test of the transistor characteristic frequency through gain bandwidth product, the high-precision digital source meter can be adopted for measurement, the output signal is stable and accurate, and the test efficiency is high. Errors generated in the testing process can be automatically calibrated, compensated and corrected, it is ensured that the accuracy and reliability of a testing result are not prone to being affected by environmental factors, and the reliability of the testing result is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the testing experiment field of transistor characteristic frequency, especially relates to a transistor characteristic frequency testing experiment device. BACKGROUND

[0002] When the working frequency of the transistor exceeds the cutoff frequency f beta or f alpha, the current amplification factor beta value will drop with the increase of the frequency. The characteristic frequency f T refers to the working frequency of the transistor when the beta value drops to 1. If the use frequency exceeds the frequency range of the transistor in the use process, the amplification characteristics of the transistor will be significantly deteriorated, and even cannot be used. The deterioration of the transistor amplification characteristics is caused by the fact that the current amplification factor of the transistor starts to drop when the signal frequency exceeds a certain value, therefore, the characteristic frequency test of the transistor is particularly important in the actual application process.

[0003] The characteristic frequency test method of the transistor mainly uses the gain bandwidth product method to test, and the existing problems are that the hardware structure causes the test frequency to be not high, only the transistors with low frequency can be tested, the transistors with high frequency cannot be tested, the test method is single, and the characteristic frequency of the transistor cannot be directly tested.

[0004] Therefore, it is necessary to provide a transistor characteristic frequency test experiment device to solve the above problems. UTILITY MODEL CONTENTS

[0005] The main purpose of the utility model is to provide a transistor characteristic frequency test experiment device, which can effectively solve the problems in the background art.

[0006] To achieve the above purpose, the technical scheme adopted by the utility model is:

[0007] A transistor characteristic frequency test experiment device, comprising a first input module, a test module, a liquid crystal display module, a first measurement module, a second input module, a second measurement module, a test main loop module, a test external lead-out point module, a state indicating lamp module, a power supply and filter module, a connection terminal and interface indicating lamp module, the test module is electrically connected with the first input module, the second input module, the liquid crystal display module, the first measurement module and the second measurement module, the state indicating lamp module is used for showing the test state through the indicating lamp during the test experiment, the power supply and filter module is used for controlling the test power supply and filter, the connection terminal and interface indicating lamp module is used for showing the connection state of the connection terminal and interface through the indicating lamp, the test main loop module is used for controlling the main loop of the device during the test experiment, and the test external lead-out point module is used for controlling the external lead-out point of the device during the test experiment.

[0008] Preferably, the first input module comprises at least one signal generator for generating signals required for testing, and the signal generator can generate signals of different frequencies and amplitudes to simulate the actual working state of the transistor, and the first input module outputs the signals to the transistor to be tested in the test module through the BNC socket of the signal input interface of the test module.

[0009] Preferably, the test module comprises a test fixture, a transistor characteristic frequency test circuit and a signal input interface; the test fixture is used for installing and fixing the transistor to be tested; the transistor characteristic frequency test circuit is the core part of the test module, and the test circuit is used for measuring the transistor in various ways to determine its characteristic frequency; and the signal input interface is the input part of the test module and is used for providing input signals to the transistor, and the quality and stability of the input signals directly affect the accuracy of the test results.

[0010] Preferably, the liquid crystal display module comprises at least one liquid crystal display screen for displaying test waveforms and results in real time, and the liquid crystal display screen adopts a high-resolution display panel for clearly displaying test data and waveforms, and the liquid crystal display module also provides a user interface for facilitating user operation and setting.

[0011] Preferably, the first measurement module comprises at least one multi-channel oscilloscope for collecting signals generated by the transistor to be tested, and the multi-channel oscilloscope can simultaneously collect waveform data of multiple signal channels to improve test efficiency; and the second input module comprises at least one digital source table for applying different voltage and current excitations to the transistor to simulate different working conditions, and the digital source table is used for providing accurate voltage and current control to ensure the stability and consistency of test conditions.

[0012] Preferably, the second measurement module comprises at least one digital source table for accurate measurement of output signals, and by measuring parameters such as current and voltage at the output end of the transistor, performance indicators such as gain, efficiency and distortion can be obtained.

[0013] Compared with the prior art, the utility model has the advantages of the following:

[0014] The transistor characteristic frequency test experimental device adopts a high-precision digital source table to realize direct test of the transistor characteristic frequency and indirect test of the transistor characteristic frequency through the gain-bandwidth product, can measure with the high-precision digital source table, the output signal is stable and accurate, can automatically calibrate, compensate and correct errors generated in the test process, ensures the accuracy and reliability of the test results and is not easy to be affected by environmental factors, improves the reliability of the test results, can quickly replace different transistors, makes the test process more flexible, can adapt to transistor test requirements of different types and specifications, reduces the time and labor cost required for replacing the transistor, and improves the test efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 is the overall structure schematic diagram of the utility model;

[0016] Figure 2 is the PCB diagram of the utility model;

[0017] Figure 3 is the flow chart of the utility model;

[0018] Figure 4 is the circuit diagram of the test main loop module of the utility model;

[0019] Figure 5 is the circuit diagram of the test external lead-out point module of the utility model;

[0020] Figure 6 is the circuit diagram of the state indicating lamp module of the utility model;

[0021] Figure 7 is the circuit diagram of the first measurement module and the second measurement module of the utility model;

[0022] Figure 8 is the circuit diagram of the power supply and filter module of the utility model;

[0023] Figure 9 is the circuit diagram of the connection terminal and interface indicating lamp module of the utility model.

[0024] In the drawing: 1, first input module;2, test module;3, liquid crystal display module;4, first measurement module;5, second input module;6, second measurement module. DETAILED DESCRIPTION

[0025] In order to make the technical means, creative features, purposes and effects realized by the utility model easy to understand, the utility model is further described below in combination with specific embodiments.

[0026] As shown in Figures 1-9 A transistor characteristic frequency test experimental device, comprising a first input module 1, a test module 2, a liquid crystal display module 3, a first measurement module 4, a second input module 5, and a second measurement module 6, wherein the test module 2 is electrically connected with the first input module 1, the second input module 5, the liquid crystal display module 3, the first measurement module 4, and the second measurement module 6.

[0027] The first input module 1 comprises at least one signal generator for generating signals required for testing, and the signal generator can generate signals of different frequencies and amplitudes for simulating the actual working state of the transistor. The first input module 1 outputs the signals to the transistor to be tested in the test module 2 through the BNC socket of the signal input interface of the test module 2.

[0028] Test module 2 includes a test fixture, a transistor characteristic frequency test circuit, and a signal input interface. The test fixture is used to install and fix the transistor under test. The transistor characteristic frequency test circuit is the core part of the test module. The test circuit is used to perform various measurements on the transistor to determine its characteristic frequency. The signal input interface is the input part of the test module, which is used to provide input signals to the transistor. The quality and stability of the input signal directly affect the accuracy of the test results.

[0029] The LCD display module 3 includes at least one LCD screen for real-time display of test waveforms and results. The LCD screen uses a high-resolution display panel to clearly display test data and waveforms. The LCD display module also provides a user interface for convenient operation and settings.

[0030] The first measurement module 4 includes at least one multi-channel oscilloscope for acquiring signals generated by the transistor under test. The multi-channel oscilloscope can simultaneously acquire waveform data from multiple signal channels to improve testing efficiency. The second input module 5 includes at least one digital source meter for applying different voltage and current excitations to the transistor to simulate different operating conditions. The digital source meter is used to provide precise voltage and current control to ensure the stability and consistency of test conditions.

[0031] The second measurement module 6 includes at least one digital source meter for accurate measurement of the output signal. By measuring parameters such as current and voltage at the transistor output terminal, its performance indicators, such as gain, efficiency, and distortion, can be obtained.

[0032] It should be noted that this utility model is an experimental device for testing the characteristic frequency of a transistor. When using it... Figure 3 As shown, turn on the switch of the experimental device and insert the transistor to be tested into the test socket of the test board;

[0033] Connect the FORC1HI port of the first digital source meter to the banana jack SMU1+ of the test module, and connect the PEAK port to the banana jack GND of the test module. Connect the FORC1HI port of the second digital source meter to the banana jack SMU2+ of the test module, and connect the PEAK port to the banana jack GND of the test module. Set the test parameters according to the test requirements.

[0034] To set the static operating point of a transistor according to its static operating circuit diagram, it is necessary to adjust the input signals and output load resistance parameters of the first and second digital source meters in order to put the transistor in a suitable operating state.

[0035] With the static operating point set appropriately, a small AC signal is generated using the signal generator of the first input module to test the voltage value of VBE.

[0036] Under the premise of setting the static working point reasonably and inputting AC small signal, the transistor can be equivalent to a linear two-port circuit, and h is calculated according to the following formula:

[0037]

[0038] R1 is a resistor;

[0039] h is calculated according to the following formula by indirectly testing c through testing the voltage t of R2:

[0040]

[0041] The transistor characteristic frequency T is calculated by measuring the transistor cutoff frequency T and using the "gain bandwidth product" method.

[0042] β, and the gain bandwidth product is calculated according to the following formula:

[0043] T: fT=h×β;

[0044] The h×β value obtained by using the above steps can be used to calculate the transistor characteristic frequency T.

[0045] The basic principle and main features of the utility model and the advantages of the utility model are shown and described. It should be understood by those skilled in the art that the utility model is not limited by the above embodiments, and the above embodiments and descriptions in the specification are only to illustrate the principle of the utility model, and various changes and improvements can be made to the utility model without departing from the spirit and scope of the utility model. These changes and improvements all fall within the scope of the utility model claimed. The scope of protection of the utility model is defined by the appended claims and their equivalents.

Claims

1. A transistor characteristic frequency test experimental device, comprising a first input module (1), a test module (2), a liquid crystal display module (3), a first measurement module (4), a second input module (5), a second measurement module (6), a test main loop module, a test external connection point module, a state indicating lamp module, a power supply and filter module, a connection terminal and interface indicating lamp module, characterized in that: The test module (2) is electrically connected with the first input module (1), the second input module (5), the liquid crystal display module (3), the first measurement module (4) and the second measurement module (6), the state indicating lamp module is used for displaying the test state through the indicating lamp during the test experiment, the power supply and filtering module is used for controlling the test power supply and filtering, the connecting terminal and interface indicating lamp module is used for displaying the connection state of the connecting terminal and interface through the indicating lamp, the test main circuit module is used for controlling the main circuit of the device during the test experiment, and the test external lead-out point module is used for controlling the external lead-out point of the device during the test experiment. ​ 2. The transistor characteristic frequency test experimental device according to claim 1, characterized in that: The first input module (1) comprises at least one signal generator, which is used for generating signals required for testing, and the signal generator can generate signals with different frequencies and amplitudes, which are used for simulating the actual working state of the transistor, and the first input module (1) outputs the signals to the transistor to be tested through the BNC socket of the signal input interface of the test module (2).

3. The experimental device for testing the characteristic frequency of a transistor according to claim 1, characterized in that: The test module (2) comprises a test fixture, a transistor characteristic frequency test circuit and a signal input interface; the test fixture is used for installing and fixing the transistor to be tested; the transistor characteristic frequency test circuit is the core part of the test module, and the test circuit is used for measuring the transistor to determine its characteristic frequency; The input part of the signal input interface test module is used for providing input signals to the transistor, and the quality and stability of the input signals directly affect the accuracy of the test results.

4. The transistor characteristic frequency test experimental apparatus according to claim 1, characterized by: The liquid crystal display module (3) comprises at least one liquid crystal display screen, which is used for displaying test waveforms and results in real time; the liquid crystal display screen adopts a high-resolution display panel, which is used for clearly displaying test data and waveforms; and the liquid crystal display module also provides a user interface, which is convenient for users to operate and set.

5. The experimental device for testing the characteristic frequency of a transistor according to claim 1, characterized in that: The first measurement module (4) comprises at least one multi-channel oscilloscope, which is used for collecting signals generated by the transistor to be tested; the multi-channel oscilloscope can simultaneously collect waveform data of multiple signal channels, so as to improve the test efficiency; The second input module (5) comprises at least one digital source table, which is used for applying different voltage and current excitations to the transistor to simulate different working conditions; the digital source table is used for providing accurate voltage and current control, so as to ensure the stability and consistency of the test conditions.

6. The transistor characteristic frequency test experimental apparatus according to claim 1, characterized by: The second measurement module (6) comprises at least one digital source table, which is used for accurately measuring output signals; by measuring the current and voltage parameters of the transistor output end, the performance indicators such as gain, efficiency and distortion can be obtained.

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