Integrated circuit chip test protection seat
By using clamps, springs, and rubber pads to secure the chip in the chip test protective holder, and combining this with heat sinks and fans for active cooling, the problems of unstable chip mounting and low heat dissipation efficiency are solved, achieving stable testing and extending chip lifespan.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- TIANJIN TIANYUYANG TECHNOLOGY CO LTD
- Filing Date
- 2025-03-05
- Publication Date
- 2026-04-10
AI Technical Summary
Existing chip test protective brackets are unstable and easily damage the chips. They also have low natural heat dissipation efficiency, especially under high power consumption conditions, which makes it difficult to dissipate heat effectively, affecting test accuracy and chip lifespan.
The chip is secured using clamps, springs, and rubber pads, and actively cooled by heat sinks and cooling fans, achieving stable chip fixation and rapid cooling.
It improves the stability of chip mounting, ensures the accuracy and safety of testing, shortens the testing cycle, extends chip life, reduces operational difficulty and cost, and meets diverse heat dissipation needs.
Smart Images
Figure CN224109505U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to chip detection auxiliary tool technical field especially relates to a kind of integrated circuit chip test protection seat. BACKGROUND
[0002] Integrated circuit chip is a kind of electronic device containing billions of tiny components, is positioned and processed on silicon raw material substrate precisely, to realize small size, high reliability and low power consumption and so on Excellent characteristics, widely used in electronic products, integrated circuit chip is usually subjected to strict quality control and detection after production completion, since chip volume is too small, therefore chip is usually placed on the base with protection function.
[0003] Protection seat is equipped with clamping slot, the edge or pin portion of chip can be clamped into these clamping slots, to realize the fixation of chip, the chip test protection seat of prior art mainly relies on natural heat dissipation, its shell is generally made of material with certain heat conductivity, such as plastic or metal, heat generated by chip is conducted to surrounding air through protection seat shell, and the surface area design of protection seat also considers certain heat dissipation demand, and heat is dissipated using air natural convection.
[0004] Clamping slot fixation mode is unable to tightly fix chip due to the manufacturing tolerance of chip and clamping slot, and loose condition occurs, and then the accuracy of test is influenced, in the process of installing or dismounting chip, chip is easily damaged if operation is improper, the efficiency of natural heat dissipation mode is very low, for the large amount of heat generated by high-power chip, this mode is difficult to dissipate heat in time and effectively, especially when carrying out complex test, chip long-time high-load work, heat will accumulate around chip, leading to that chip temperature is too high, and natural convection heat dissipation is highly dependent on the temperature and air flow condition of surrounding environment, if test environment temperature is higher or air flow is not smooth, heat dissipation effect will be greatly discounted, and chip cannot be guaranteed to work at appropriate temperature, in view of the above problems, therefore, a kind of integrated circuit chip test protection seat is proposed. UTILITY MODEL CONTENTS
[0005] The utility model aims at providing a kind of integrated circuit chip test protection seat, solve the stability of fixed chip in background art is limited, chip is easily damaged, and the problem that natural heat dissipation mode is needed to dissipate heat to chip.
[0006] In order to achieve the above object, the utility model provides the following technical scheme: an integrated circuit chip test protection seat, including the protection seat, both sides inner walls of the protection seat are all connected with the moving shell slidingly, the inner wall side of the moving shell is connected with the fixed clamp rotatably, the bottom of one side of the fixed clamp is fixedly connected with the first rubber pad, the bottom of one side of the fixed clamp is fixedly connected with the fixed rod, the inner wall of the fixed rod and the lock shell is through and is connected slidingly, the outer wall of the fixed rod is equipped with the first spring, one side of the first spring is fixedly connected with one side of the lock shell, one side of the fixed rod is fixedly connected with the second rubber pad, one side of the second rubber pad is fixedly connected with the other side of the first spring, the top rear end of the protection seat is provided with the protection cover, one side of the protection cover is provided with cooling assembly for cooling the chip.
[0007] Through adopting the above technical scheme, the chip extrudes the second rubber pad, drives the fixed rod to move, extrudes the spring and pushes the fixed clamp, the moving shell limits the fixed clamp, the fixed clamp rotates to fix the chip, the first and second rubber pads prevent the chip from being scratched, and the integrity of the chip is ensured.
[0008] As a further description of the above technical scheme: the cooling assembly includes a fixed seat, the inner wall of the protection cover is slidingly connected around the fixed seat, and uniformly distributed cooling fins are fixedly connected to one side of the protection cover.
[0009] Through adopting the above technical scheme, the fixed seat fixes the cooling fins inside the protection cover, the cooling fins absorb the heat generated by the chip and dissipate the heat.
[0010] As a further description of the above technical scheme: the inner walls of both sides of the protection cover are fixedly connected with uniformly distributed cooling fans.
[0011] Through adopting the above technical scheme, the cooling fans take out the heat dissipated by the cooling fins, and realize rapid cooling of the chip.
[0012] As a further description of the above technical scheme: the inner walls of both sides of the protection cover are fixedly connected with uniformly distributed cooling fans.
[0013] Through adopting the above technical scheme, when the cooling fins are replaced, the button is pressed, the button drives the pin and extrudes the third spring, the lock shell can be taken out, and the fixed seat can be taken out.
[0014] As a further description of the above technical scheme: the inner walls of both sides of the protection cover are fixedly connected with uniformly distributed cooling fans.
[0015] Through adopting the above technical scheme, the pin hole prevents the steel ball from falling out of the lock shell.
[0016] As a further description of the above technical solution: the inner wall of the lock box is slidably connected with the outer wall of the lock shell.
[0017] By adopting the above technical scheme, when the pin moves, the steel ball is extruded into the lock hole in the lock box, so as to fix the fixed seat and the protective cover.
[0018] As a further description of the above technical solution: the inner wall of the lock box is slidably connected with the outer wall of the lock shell.
[0019] By adopting the above technical scheme, moving the push rod extrudes the second spring to drive the moving shell to move the fixed clamp, so as to realize the chip taking out.
[0020] As a further description of the above technical solution: the inner wall of the lock box is slidably connected with the outer wall of the lock shell.
[0021] By adopting the above technical scheme, the function of the chip is to process signals and perform calculations, and to save various data.
[0022] Compared with the prior art, the utility model has the advantages that:
[0023] 1. The integrated circuit chip test protection seat provided by the utility model can fix or take out the chip through the fixed rod, the moving shell, the fixed clamp, the first spring, the second spring and the push rod, so that the chip can be conveniently inserted and pulled out, the test period is shortened, the efficiency is improved, the chip position is stabilized, the contact failure is reduced, the signal transmission is ensured, the operation difficulty and the mistake are reduced, the structure is simple and easy to maintain, and the first rubber pad and the second rubber pad protect the chip from scratching and static electricity, and improve the safety.
[0024] 2. The integrated circuit chip test protection seat provided by the utility model can cool the chip through the fixed seat, the heat dissipation fin and the heat dissipation fan, so that the chip works at an appropriate temperature, the heat dissipation is quickly performed according to the heat change, the performance is stabilized, the damage is reduced, the service life is prolonged, the cost is reduced, the heat dissipation fin can be quickly installed and dismounted through the button, the pin, the third spring, the steel ball, the lock shell and the lock box, the heat dissipation fin can be flexibly configured according to the chip heat, cleaning and maintenance are facilitated, a variety of chips can be adapted, and the diversified test heat dissipation demand is met. BRIEF DESCRIPTION OF DRAWINGS
[0025] Figure 1 It is a perspective view of the utility model;
[0026] Figure 2 It is a perspective view of the moving shell of the utility model;
[0027] Figure 3 is a sectional view of the protective cover of the utility model;
[0028] Figure 4 is a sectional view of the fixing seat of the utility model.
[0029] Legend:
[0030] 1, protective cover; 2, lock shell; 3, cooling fan; 4, fixing seat; 5, protective seat; 6, moving shell; 7, chip; 8, fixing clamp; 9, first rubber pad; 10, second rubber pad; 11, first spring; 12, fixing rod; 13, lever; 14, second spring; 15, cooling fin; 16, button; 17, pin body; 18, third spring; 19, steel ball; 20, lock box; 21, pin hole. DETAILED DESCRIPTION
[0031] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.
[0032] In order to further understand the content of the utility model, the utility model will be described in detail with reference to the drawings.
[0033] Combined Figure 1The utility model discloses an integrated circuit chip test protection seat, including protection seat 5, protection seat 5 provides the basic support frame for whole test protection structure, provides a stable physical environment for chip 7 test, the top rear end of protection seat 5 is provided with protection cover 1, when protection cover 1 covers on protection seat 5, can form a relatively closed space with protection seat 5, improve the protection degree to chip 7, this closed space can reduce the influence of outside electromagnetic interference etc. to chip 7 test, one side of protection cover 1 is provided with cooling assembly for cooling chip, in the chip 7 test process, chip 7 will produce heat because of operation, and cooling assembly can take away the heat of chip 7 in time, makes chip 7 keep in a suitable working temperature range, if chip 7 temperature is too high, will influence its performance, even lead to chip 7 damage, and cooling assembly can effectively avoid the occurrence of this situation, by maintaining the temperature stability of chip 7, cooling assembly helps to improve the stability of chip 7 test, and the stable temperature can ensure that the electrical performance of chip 7 keeps relatively constant, to make the test result more accurate, reliable, the top middle of protection seat 5 is provided with chip 7, the top of chip 7 and the bottom of first rubber pad 9 contact, and the two sides of chip 7 and the side of second rubber pad 10 contact, and chip 7 can carry out complex operation and signal processing again, and data storage can be realized.
[0034] In combination Figures 1-2The inner wall of the moving shell 6 is rotatably connected with the fixed clamp 8 on one side, the bottom of one side of the fixed clamp 8 is fixedly connected with the first rubber pad 9, the bottom of one side of the fixed clamp 8 is fixedly connected with the fixed rod 12, the fixed rod 12 penetrates through the inner wall of the lock shell 2 and is slidably connected, the outer wall of the fixed rod 12 is sleeved with the first spring 11, one side of the first spring 11 is fixedly connected with one side of the lock shell 2, one side of the fixed rod 12 is fixedly connected with the second rubber pad 10, the first rubber pad 9 and the second rubber pad 10 effectively prevent the direct scratching of the fixed clamp 8 on the surface of the chip 7, guarantee the integrity of the chip 7, significantly reduce the static electricity generated by the contact friction, improve the safety of the chip 7, one side of the second rubber pad 10 is fixedly connected with the other side of the first spring 11, the chip 7 is placed in the protective seat 5, the chip 7 will extrude the second rubber pad 10, the extrusion force promotes the movement of the fixed rod 12, and then extrudes the first spring 11, with the movement of the fixed rod 12, pressure is applied to the fixed clamp 8, one side of the moving shell 6 limits the fixed clamp 8, and finally the fixed clamp 8 rotates, thereby realizing the fixation of the chip 7, the inner wall of both ends of the moving shell 6 is fixedly connected with the second spring 14, one end of the second spring 14 is fixedly connected with the push rod 13, the outer wall of the push rod 13 penetrates through and is slidably connected with the top of both ends of the protective seat 5, when the chip 7 needs to be taken out, the push rod 13 is moved, the push rod 13 extrudes the second spring 14, the moving shell 6 moves, and the movement of the moving shell 6 drives the fixed clamp 8 to move synchronously, thereby releasing the fixation of the chip 7, so that the chip 7 can be easily taken out, and the fixation or taking-out process of the chip 7 becomes simple and efficient.
[0035] In combination Figure 1 And Figures 3-4The cooling assembly comprises a fixing seat 4, the periphery of the fixing seat 4 is in sliding connection with the inner wall of the protective cover 1, one side of the protective cover 1 is fixedly connected with uniformly distributed radiating fins 15, when the chip 7 generates heat, the heat is transferred to the fixing seat 4, and then is transferred to the radiating fins 15 by the fixing seat 4, the radiating fins 15 can increase the heat dissipation area, the larger radiating area can accelerate the heat dissipation speed from the chip 7 to the surrounding environment, improve the heat dissipation efficiency, the inner walls of the two sides of the protective cover 1 are fixedly connected with uniformly distributed radiating fans 3, the radiating fans 3 can accelerate the flowing speed of the air around the protective cover 1, the heat dissipated by the radiating fins 15 is blown away from the protective cover 1 faster, so that the temperature environment around the chip 7 is kept lower all the time, the periphery of the protective cover 1 is in sliding connection with a lock shell 2, the inner wall bottom of the lock shell 2 is in sliding connection with a pin body 17, the top of the pin body 17 is fixedly connected with a button 16, the outer wall top of the pin body 17 is sleeved with a third spring 18, the inner wall of the lock shell 2 is provided with a steel ball 19, the periphery of the inner wall of the fixing seat 4 is fixedly connected with a lock box 20, the inner wall of the lock box 20 is in sliding connection with the outer wall bottom of the lock shell 2, the button 16 is pressed, the button 16 drives the pin body 17 to move, the pin body 17 extrudes the third spring 18, and the steel ball 19 is loose, so that the lock shell 2 can be taken out, and the replacement of the fixing seat 4 is completed, when the new fixing seat 4 is replaced, the button 16 is loosened, the third spring 18 is reset, the pin body 17 and the button 16 are reset, the pin body 17 extrudes the steel ball 19, the steel ball 19 is clamped into the lock hole of the lock box 20, and finally the fixing seat 4 and the protective cover 1 are fixedly connected, so that the radiating fins 15 can be quickly installed and dismounted.
[0036] Working principle: Put the chip 7 into the protective seat 5, the chip 7 extrudes the second rubber pad 10, thereby driving the fixed rod 12 to move and extrude the first spring 11, when the fixed rod 12 moves, it extrudes the fixed clamp 8, due to the limiting of one side of the moving shell 6 to the fixed clamp 8, thereby making the fixed clamp 8 rotate, fixing the chip 7, moving the shift lever 13, the shift lever 13 extrudes the second spring 14, moving the moving shell 6, the moving shell 6 drives the fixed clamp 8 to move, thereby taking out the chip 7, which can make the insertion and extraction process of the chip 7 simple and fast, the operator can quickly insert the chip 7 into the protective seat 5 and automatically lock it, after the test is completed, the chip 7 can also be quickly unlocked and taken out, which greatly shortens the test period of a single chip 7, thereby significantly improving the test efficiency, without complex alignment and fixing procedures, reducing the time waste caused by slow manual operation, ensuring that the chip 7 is in a stable position in the protective seat 5, preventing the chip 7 from loosening due to vibration, shaking or accidental collision, thereby effectively reducing the test data error or test failure phenomenon caused by poor contact, ensuring accurate transmission and reception of test signals, improving the reliability and repeatability of test results, the operator does not need to use complex tools or special skills to complete the insertion and extraction of the chip 7, reducing the skill requirement for the operator, reducing the possibility of human operation errors, the structure is relatively simple, easy for maintenance personnel to maintain, reducing the maintenance time and cost of the protective seat 5, the first rubber pad 9 and the second rubber pad 10 avoid scratching the surface of the chip 7 by the fixed clamp 8, ensuring the integrity of the chip 7, reducing static electricity generated by friction during contact, improving the safety of the chip 7, heat will be generated during testing, the fixed seat 4 absorbs the heat of the chip 7, the heat dissipation fin 15 dissipates heat, the heat dissipation fan 3 quickly takes out the heat dissipated by the heat dissipation fin 15, which can quickly take away the heat generated by the chip 7, ensuring that the chip 7 works in a suitable temperature environment, avoiding performance degradation or damage due to overheating, the chip 7 generates heat in different test conditions, which can quickly respond to the change of the chip 7, enhance the heat dissipation effect, make the chip 7 temperature quickly and stably in the safe range, control the temperature of the chip 7 in a stable range, ensure the stability of the electrical performance of the chip 7, thereby improving the reliability of the test results, reducing the damage of high temperature to the chip 7, prolonging the service life of the chip 7, reducing the test cost, press the button 16, the button 16 drives the pin body 17 to move and extrude the third spring 18, the pin body 17 moves, the steel ball 19 loosens, the lock shell 2 is taken out, thereby replacing the fixed seat 4, after replacing the new fixed seat 4, loosen the button 16, the third spring 18 resets the pin body 17 and the button 16 to move, thereby driving the pin body 17 to extrude the steel ball 19, extruding the steel ball 19 into the lock hole of the lock box 20, fixing the fixed seat 4 with the protective cover 1, the pin hole 21 prevents the steel ball 19 from falling off, different integrated circuit chips 7 have different power consumption during testing, the heat generated is also different,The detachable heat dissipation fin 15 can be flexibly configured according to the actual heat generation of the chip 7, ensures that the chip 7 can be effectively cooled during the test process, maintains the normal working temperature, can be adjusted according to the change of the heat generation degree in different test stages, better meets the diversified heat dissipation demand in the test process, the detachable heat dissipation fin 15 is convenient to be taken off from the protective cover 1, and the heat dissipation fin 15 itself can be cleaned, repaired or replaced, etc., dust accumulated on the heat dissipation fin 15 can be cleaned, and the good heat dissipation performance can be restored, more types of chip 7 tests can be applied, and the situation that the protective seat 5 needs to be frequently replaced due to different heat generation characteristics of the chip 7 is reduced.
[0037] Finally, it should be noted that: the above only for the preferred embodiments of the utility model have described, and do not limit the utility model, although the utility model is described in detail with reference to the foregoing embodiments, for the person skilled in the art, it still can modify the technical scheme recorded in the foregoing each embodiment, or equivalent replacement to part of technical features, any modification, equivalent replacement, improvement etc. made within the spirit and principle of the utility model, should be included in the protection scope of the utility model.
Claims
1. An integrated circuit chip test socket comprising a socket (5) characterised in that: Both sides of the protection seat (5) are slidably connected with a moving shell (6), one side of the inner wall of the moving shell (6) is rotatably connected with a fixed clamp (8), the bottom of one side of the fixed clamp (8) is fixedly connected with a first rubber pad (9), the bottom of one side of the fixed clamp (8) is fixedly connected with a fixed rod (12), the fixed rod (12) penetrates through the inner wall of the lock shell (2) and is slidably connected, the outer wall of the fixed rod (12) is sleeved with a first spring (11), one side of the first spring (11) is fixedly connected with one side of the lock shell (2), one side of the fixed rod (12) is fixedly connected with a second rubber pad (10), one side of the second rubber pad (10) is fixedly connected with the other side of the first spring (11), the top rear end of the protection seat (5) is provided with a protection cover (1), one side of the protection cover (1) is provided with a cooling assembly for cooling the chip.
2. The IC chip test socket according to claim 1, wherein: The cooling assembly comprises a fixed seat (4), the periphery of the fixed seat (4) is slidably connected with the inner wall of the protection cover (1), and the protection cover (1) is fixedly connected with evenly distributed radiating fins (15) on one side.
3. The IC chip test socket according to claim 1, wherein: The both sides of the protection cover (1) are fixedly connected with evenly distributed radiating fans (3).
4. The IC chip test socket according to claim 1, wherein: The periphery of the protection cover (1) is slidably connected with a lock shell (2), the inner wall bottom of the lock shell (2) is slidably connected with a pin body (17), the top of the pin body (17) is fixedly connected with a button (16), and the outer wall top of the pin body (17) is sleeved with a third spring (18).
5. A test socket according to claim 4, wherein: The inner wall of the lock shell (2) is provided with a steel ball (19).
6. The IC chip test socket according to claim 2, wherein: The periphery of the fixed seat (4) is fixedly connected with a lock box (20), and the inner wall of the lock box (20) is slidably connected with the outer wall bottom of the lock shell (2).
7. The IC chip test socket according to claim 1, wherein: Both ends of the inner wall of the moving shell (6) are fixedly connected with a second spring (14), one end of the second spring (14) is fixedly connected with a lever (13), and the outer wall of the lever (13) penetrates through and is slidably connected with the top of both ends of the protection seat (5).
8. The IC chip test socket according to claim 1, wherein: The top of the protection seat (5) is provided with a chip (7), the top of the chip (7) is in contact with the bottom of the first rubber pad (9), and the two sides of the chip (7) are in contact with one side of the second rubber pad (10).