Automatic sampler sample disc of elemental analyzer
By designing a sample tray structure that includes an upper plate, a lower plate, and an air interference-proof cover, the problems of complex sample tray structure and air interference in the prior art are solved, achieving efficient automatic sample introduction and convenient maintenance, and improving the detection efficiency and data accuracy of the elemental analyzer.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- LIMAN INSTRUMENT (CHENYANG) CO LTD
- Filing Date
- 2025-04-23
- Publication Date
- 2026-04-17
AI Technical Summary
The existing automatic sampler of elemental analyzers has a complex sample tray structure, which is inconvenient to disassemble and maintain, and lacks air isolation measures, affecting the results of trace element analysis.
A sample tray structure including an upper plate, a lower plate, and an air interference-proof cover was designed. The air interference-proof cover isolates the sample from contact with the outside air, and helium gas is used to purge and eliminate interference. Combined with the Peek grinding disc and steel ball structure, it can achieve accurate sample introduction and convenient disassembly.
It achieves efficient and automated sample introduction, isolates the influence of external air on the sample, and facilitates quick disassembly and maintenance, thereby improving detection efficiency and data consistency.
Smart Images

Figure CN224137310U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of sample trays for autosamplers of elemental analyzers, specifically an autosampler sample tray for an elemental analyzer. Background Technology
[0002] An elemental analyzer is a precision instrument used to determine the elemental composition and content of substances. It is widely used in fields such as chemistry, materials science, environmental monitoring, pharmaceuticals, and geological exploration. Its core principle is to decompose the sample using physical or chemical methods, then use chromatographic separation techniques to separate the individual components to be analyzed, thereby quantitatively analyzing the target components. These instruments play an irreplaceable role in quality control, new material development, and pollutant tracing, and are key analytical tools in scientific research and industry.
[0003] The autosampler is a key component of an elemental analyzer, primarily used to achieve high-throughput, standardized, and unattended sample processing, significantly improving detection efficiency and data consistency. The sample tray is snapped onto the top of the autosampler, which then rotates the tray for automated sample introduction. However, existing sample tray structures are complex, difficult to disassemble and maintain, and lack air isolation measures, affecting the results for trace amounts of nitrogen and oxygen in the sample. Therefore, we propose a new sample tray design for an elemental analyzer autosampler. Utility Model Content
[0004] The technical problem to be solved by this utility model is to overcome the existing defects and provide an automatic sample tray for an elemental analyzer that can eliminate the original air interference and effectively solve the problems in the background art.
[0005] To achieve the above objectives, this utility model provides the following technical solution: an automatic sampler sample tray for an elemental analyzer, comprising an upper tray, a lower tray, and an air interference-proof cover;
[0006] Lower plate: The middle part is rotatably connected to the upper plate. A second through hole is opened on the edge of the lower plate, and a first through hole is evenly distributed on the edge of the upper plate. The second through hole corresponds vertically to the first through hole, and there are grooves connecting each locking hole.
[0007] Air interference prevention cover: It is movably sleeved on the upper surface of the upper plate, and the through hole is located at the lower end of the air interference prevention cover, which can be used with helium gas purging to eliminate the original air interference.
[0008] Furthermore, a Peek abrasive disc is placed on the upper surface of the lower plate, which is located between the upper surface of the lower plate and the top wall of the upper plate to help alleviate friction between the lower and upper plates.
[0009] Furthermore, the outer arc surface of the lower plate is provided with embedded holes, and springs and steel balls are placed inside the embedded holes. The inner arc surface of the upper plate is provided with evenly distributed locking holes, and the steel balls are locked inside the left and right adjacent locking holes to achieve precise single injection.
[0010] Furthermore, an axial retaining spring is engaged at the lower middle part of the upper plate, and the axial retaining spring is located inside the lower plate to fix the upper plate.
[0011] Furthermore, a limiting groove is provided on the edge of the lower plate to fix the lower plate.
[0012] Furthermore, a limiting groove is provided at the lower middle part of the upper plate to enable the upper plate to rotate.
[0013] Furthermore, grooves are provided between each slot on the lower and upper plates, allowing helium gas to pass through the through holes and be intercepted by the anti-air interference cover before being distributed to each slot to purge the sample surface.
[0014] Furthermore, the air interference-proof cover is a transparent cover, which isolates air and does not affect the observation of sample introduction while being purged with helium gas.
[0015] Compared with the prior art, the beneficial effects of this utility model are as follows: The sample tray of the automatic sampler of this elemental analyzer has the following advantages:
[0016] 1. By using an air interference-proof cover to isolate the sample from the outside air and intercept the helium purge gas, the helium is distributed to each locator. When the sample tray rotates once, the sample falls from the through hole into the instrument's injector, thus achieving efficient automatic sample injection and isolating the influence of outside air on the sample blank.
[0017] 2. When disassembling, take out the whole assembly consisting of the lower and upper plates, remove the axial retaining ring, and you can separate the individual parts for quick disassembly and easy maintenance. Attached Figure Description
[0018] Figure 1 This is a schematic diagram of the structure of this utility model;
[0019] Figure 2 This is a schematic diagram of the exploded structure of this utility model;
[0020] Figure 3 This is a cross-sectional structural diagram of the present invention.
[0021] In the diagram: 1 Lower plate, 2 Upper plate, 3 Anti-air interference cover, 4 Peek grinding disc, 5 Spring, 6 Steel ball, 7 Through hole one, 8 Through hole two, 9 Limiting groove one, 10 Axial snap ring, 11 Limiting groove two, 12 Embedded hole. Detailed Implementation
[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0023] Please see Figure 1-3 This embodiment provides a technical solution: an automatic sampler sample tray for an elemental analyzer, including an upper tray 2, a lower tray 1, and an air interference-proof cover 3;
[0024] Lower plate 1: Its central part is rotatably connected to upper plate 2. A through hole 2 8 is provided on the edge of lower plate 1, and evenly distributed through holes 7 are provided on the edge of upper plate 2. The through holes 2 8 correspond vertically to the adjacent through holes 7. A Peek grinding disc 4 is placed on the upper surface of lower plate 1, located between the upper surface of lower plate 1 and the top wall of upper plate 2. A recessed hole 12 is provided on the outer arc surface of lower plate 1, inside which a spring 5 and a steel ball 6 are placed. Evenly distributed locking holes are provided on the inner arc surface of upper plate 2, with the steel ball 6 engaging with adjacent locking holes on the left and right sides. An axial retaining spring 10 is engaged at the lower middle part of upper plate 2, located inside lower plate 1. A limiting groove 9 is provided on the edge of the upper plate 1, and a limiting groove 11 is provided at the lower middle part of the upper plate 2. The Peek grinding disc 4 is placed on the upper surface of the lower plate 1 to help reduce the friction between the lower plate 1 and the upper plate 2. A spring 5 and a steel ball 6 are placed inside the buried hole 12. The upper plate 2 is installed in the middle of the lower plate 1 by an axial retaining spring 10. The steel ball 6 is engaged in the inside of the left and right adjacent retaining holes. The retaining holes correspond one-to-one with the adjacent through holes 7 for precise positioning and to realize the single movement of the sample plate. The upper surface of the upper plate 2 is marked with numbers, which correspond to each through hole 7. Solid samples are placed into the inside of each through hole 7. Finally, the anti-air interference cover 3 is put on.
[0025] Air interference prevention cover 3: It is movably sleeved on the upper surface of the upper plate 2. The through hole 7 is located at the lower end of the air interference prevention cover 3. The air interference prevention cover 3 is a transparent cover, which isolates the air and cooperates with helium purging, while not affecting the observation of sample injection.
[0026] The working principle of the sample tray of the automatic sampler of the elemental analyzer provided by this utility model is as follows: A Peek grinding disc 4 is placed on the upper surface of the lower tray 1 to help alleviate friction between the lower tray 1 and the upper tray 2. A spring 5 and a steel ball 6 are placed inside the buried hole 12. The upper tray 2 is installed in the middle of the lower tray 1 by an axial retaining spring 10. The steel ball 6 is engaged with the interior of adjacent retaining holes on the left and right sides. The retaining holes correspond one-to-one with adjacent through holes 7, achieving precise positioning and realizing single movement of the sample tray. The upper surface of the upper tray 2 is marked with numbers, each corresponding to one of the through holes 7. Solid samples are placed into each of the through holes 7. Inside, finally cover with the air interference prevention cover 3. The air interference prevention cover 3 is a transparent cover used to isolate air, intercept the helium used for purging and distribute the helium to each card hole, while not affecting the observation of the sample injection. Then, place the whole assembly of the lower plate 1 and the upper plate 2 into the upper end of the autosampler of the elemental analyzer. The rotating shaft of the autosampler is externally connected to a pin 1, which is engaged in the inside of the limiting groove 2 11, driving the upper plate to rotate. The upper surface of the autosampler is fixedly connected to a pin 2, which is engaged in the inside of the limiting groove 1 9 to prevent the lower plate 1 from rotating. When cleaning, simply remove the axial retaining spring 10.
[0027] The above description is merely an embodiment of this utility model and does not limit the patent scope of this utility model. Any equivalent structural or procedural transformations made based on the content of this utility model specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this utility model.
Claims
1. An autosampler sample tray for an elemental analyzer, characterized by: It includes an upper plate (2), a lower plate (1), and an air interference shield (3); Lower plate (1): The middle part is rotatably connected to the upper plate (2). A through hole 2 (8) is opened on the edge of the lower plate (1), and a through hole 1 (7) is evenly distributed on the edge of the upper plate (2). The through hole 2 (8) corresponds vertically to the vertically adjacent through hole 1 (7). Air interference prevention cover (3): It is movably sleeved on the upper surface of the upper plate (2), and the through hole (7) is located at the lower end of the air interference prevention cover (3).
2. An autosampler sample tray for an elemental analyzer as defined in claim 1, characterized in that: Peek grinding discs (4) are placed on the upper surface of the lower plate (1), and the Peek grinding discs (4) are located between the upper surface of the lower plate (1) and the top wall of the upper plate (2).
3. An autosampler sample tray for an elemental analyzer as defined in claim 1, wherein: The lower plate (1) has a recessed hole (12) on its outer arc surface. A spring (5) and a steel ball (6) are placed inside the recessed hole (12). The upper plate (2) has evenly distributed locking holes on its inner arc surface. The steel ball (6) is locked inside the left and right adjacent locking holes.
4. An autosampler sample tray for an elemental analyzer as defined in claim 1, wherein: An axial retaining ring (10) is attached to the lower middle part of the upper plate (2), and the axial retaining ring (10) is located inside the lower plate (1).
5. An autosampler sample tray for an elemental analyzer as defined in claim 1, wherein: The lower plate (1) has a limiting groove (9) on its edge.
6. An autosampler sample tray for an elemental analyzer as defined in claim 1, wherein: The upper plate (2) has a limiting groove 2 (11) at the lower middle part.
7. An autosampler sample tray for an elemental analyzer as defined in claim 1, wherein: The anti-air interference cover (3) is a transparent cover.