Semiconductor field effect transistor reliability testing device

Abstract

The utility model discloses a semiconductor field effect transistor reliability testing device, and relates to the technical field of transistor testing. The device comprises a housing, and the housing is provided with a clamping mechanism and a testing mechanism. And the clamping mechanism comprises a rotating assembly, a clamping assembly and a buffering assembly, the rotating assembly comprises a clamp shell arranged on the shell, the clamp shell is fixedly connected with a partition plate, the clamp shell is rotationally connected with a first rotating shaft, and the first rotating shaft is fixedly connected with a main connecting block. According to the utility model, through the clamping mechanism, the motor is used for driving the first rotating shaft to rotate, through the connection relation of the connecting strip, the bearing rod is pushed, the two top blocks are driven to be away from each other to synchronously clamp the transistors on the detection port and the conveying belt synchronously, the clamp housing is driven to rotate and lift in cooperation with the test mechanism, and the two transistors are synchronously exchanged. The operation time under single clamping and transportation is relatively shortened, and the overall time of test operation is prolonged to a certain extent.

Description

Technical Field

[0001] This utility model belongs to the field of transistor testing technology, and in particular relates to a semiconductor field-effect transistor reliability testing device. Background Technology

[0002] In the prior art, a search revealed a Chinese patent entitled "A Reliability Testing Device for Field-Effect Transistors," with publication number "CN213517425U." This patent mainly benefits from the use of a material handling component to insert transistors at the transistor mounting end before testing and to remove them after testing. A pressing component is used to press a switch during or after testing to test the transistors mounted at the transistor mounting end, or to de-energize the transistor tester body after testing. This semi-manual, semi-mechanical method replaces the purely manual method of installing each transistor individually, improving testing efficiency and reducing production costs for enterprises.

[0003] However, the clamping structure of this device is relatively simple, and it can only clamp one transistor at a time. It is necessary to repeatedly pick up and place the transistor in the test position, and wait for the test to be completed before taking the transistor out and putting it back into the collection box. It is impossible to perform the two processes of taking out the transistor after the test and taking out the untested transistor simultaneously, which reduces efficiency. Utility Model Content

[0004] The purpose of this invention is to provide a semiconductor field-effect transistor reliability testing device. By setting up a clamping mechanism, the first rotating shaft is driven by a motor to rotate. Through the connection relationship between the connecting bar, the secondary connecting block and the main connecting block, the receiving rod is pushed, which drives the two top blocks to move away from each other synchronously and clamp the transistors on the test port and the conveyor belt. This solves the problem that it is impossible to synchronize the two processes of taking out the transistors after the test and taking out the untested transistors, which reduces efficiency.

[0005] To solve the above-mentioned technical problems, this utility model is achieved through the following technical solution:

[0006] This utility model is a semiconductor field-effect transistor reliability testing device, including a housing, on which a clamping mechanism and a testing mechanism are provided;

[0007] The clamping mechanism includes a rotating assembly, a clamping assembly, and a buffer assembly. The rotating assembly includes a clamp housing mounted on a housing. A partition is fixedly connected to the inner wall of the clamp housing. A first rotating shaft is rotatably connected to the inner wall of the clamp housing. The outer wall of the first rotating shaft is rotatably connected to the inner wall of the partition. A main connecting block is fixedly connected to the outer wall of the first rotating shaft. Sub-connecting blocks are hinged to both the front and rear ends of the main connecting block. Two connecting strips are hinged to the ends of the two sub-connecting blocks that are far apart from each other.

[0008] Furthermore, the clamping assembly includes two first limiting grooves formed on the top surface of the partition, a plurality of connecting strips are hinged to each other, and a receiving rod is hinged to the inner wall of each of the connecting strips. The inner wall of the clamp housing has two first sliding grooves, and the outer walls of the two receiving rods are slidably connected to the inner wall of the first sliding grooves.

[0009] Furthermore, guide rods are fixedly connected to the inner walls of the two first slide grooves, and top blocks are slidably connected to the outer walls of the two guide rods. The top surfaces of the two top blocks are fixedly connected to the bottom surfaces of the receiving rods.

[0010] Furthermore, the buffer assembly includes two springs that are fixedly connected to the two top blocks on opposite sides, and the opposite ends of the two springs are fixedly connected to the inner wall of the first slide groove. The bottom surface of the clamp housing is fixedly connected to two receiving blocks.

[0011] Furthermore, the testing mechanism includes a lifting assembly, a driving assembly, and a testing assembly. The lifting assembly includes a lifting groove formed on the inner wall of the housing. A hydraulic cylinder is fixedly connected to the inner wall of the lifting groove. A fixing block is fixedly connected to the output end of the hydraulic cylinder. The outer wall of the fixing block is slidably connected to the inner wall of the lifting groove.

[0012] Furthermore, the drive assembly includes a motor fixedly connected to the inner wall of the fixed block, the output end of the motor is fixedly connected to a second rotating shaft, the inner wall of the second rotating shaft is provided with a second sliding groove, the inner wall of the second sliding groove is slidably connected to a rectangular shaft, and the top end of the rectangular shaft is fixedly connected to the bottom end of the first rotating shaft.

[0013] Furthermore, a locking block is fixedly connected to the outer wall of the second rotating shaft, and several locking slots are opened on the bottom surface of the fixture housing. Two second limiting slots are opened on the bottom surface of the fixture housing. Limiting blocks are slidably connected to the inner walls of the two second limiting slots, and the bottom surfaces of the two limiting blocks are fixedly connected to the top surface of the housing.

[0014] Furthermore, the testing component includes a detection port on the top surface of the housing, a transistor tester is fixedly connected to the front of the housing, and a conveyor belt is provided on the right side of the housing.

[0015] This utility model has the following beneficial effects:

[0016] By setting up a clamping mechanism, the first rotating shaft is driven by a motor to rotate. Through the connection relationship between the connecting bar, the secondary connecting block and the main connecting block, the receiving rod is pushed, which drives the two top blocks to move away from each other synchronously to clamp the transistors on the detection port and the conveyor belt. In conjunction with the testing mechanism, the fixture housing is rotated and raised to synchronously switch the transistors in the two locations. This relatively shortens the operation time under individual clamping and transportation, and improves the overall testing operation time to a certain extent.

[0017] 2. By setting up a testing mechanism, the transistors held by the clamping mechanism are rotated, transported, and exchanged using a combination of motor and hydraulic cylinder. At the same time, the clamping mechanism is raised and lowered simultaneously. This simple mechanical operation, combined with the clamping mechanism, ensures smooth testing and further improves the reliability of the device.

[0018] Of course, any product implementing this utility model does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0021] Figure 2 This is a front cross-sectional view of the present invention.

[0022] Figure 3 This is a cross-sectional structural diagram of the clamping mechanism of this utility model;

[0023] Figure 4 for Figure 3 Enlarged structural diagram at point A;

[0024] Figure 5 for Figure 2 A magnified structural diagram at point B in the middle.

[0025] The attached diagram lists the components represented by each number as follows:

[0026] 1. Housing; 2. Clamping mechanism; 3. Testing mechanism; 21. Fixture housing; 22. Partition plate; 23. First rotating shaft; 24. Main connecting block; 25. Secondary connecting block; 26. Connecting strip; 27. First limiting groove; 28. Supporting rod; 29. ​​First sliding groove; 210. Guide rod; 211. Top block; 212. Spring; 213. Supporting block; 31. Lifting groove; 32. Hydraulic cylinder; 33. Fixing block; 34. Motor; 35. Second rotating shaft; 36. Second sliding groove; 37. Rectangular shaft; 38. Locking block; 39. Locking groove; 310. Second limiting groove; 311. Limiting block; 312. Detection port; 313. Transistor tester; 314. Conveyor belt. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0028] Please see Figure 1-5 As shown, this utility model is a semiconductor field-effect transistor reliability testing device, including a housing 1, on which a clamping mechanism 2 and a testing mechanism 3 are provided;

[0029] The clamping mechanism 2 includes a rotating assembly, a clamping assembly, and a buffer assembly. The rotating assembly includes a clamp housing 21 mounted on the outer casing 1. A partition 22 is fixedly connected to the inner wall of the clamp housing 21. A first rotating shaft 23 is rotatably connected to the inner wall of the clamp housing 21. The outer wall of the first rotating shaft 23 is rotatably connected to the inner wall of the partition 22. A main connecting block 24 is fixedly connected to the outer wall of the first rotating shaft 23. A secondary connecting block 25 is hinged to both the front and rear ends of the main connecting block 24. Two connecting strips 26 are hinged to the ends of the two secondary connecting blocks 25 that are far apart from each other. The clamping assembly includes two first limiting grooves 27 formed on the top surface of the partition 22. Several connecting strips 26 are hinged to each other. The inner wall of the fixture 6 is hinged with a support rod 28. The inner wall of the fixture housing 21 has two first sliding grooves 29. The outer walls of the two support rods 28 are slidably connected to the inner walls of the first sliding grooves 29. The inner walls of the two first sliding grooves 29 are fixedly connected with guide rods 210. The outer walls of the two guide rods 210 are slidably connected with top blocks 211. The top surfaces of the two top blocks 211 are fixedly connected to the bottom surfaces of the support rods 28. The buffer assembly includes two springs 212 that are fixedly connected to the two top blocks 211 on opposite sides. The opposite ends of the two springs 212 are fixedly connected to the inner walls of the first sliding grooves 29. The bottom surface of the fixture housing 21 is fixedly connected with two support blocks 213.

[0030] By setting up the clamping mechanism 2, the first rotating shaft 23 is driven to rotate by the motor 34. Through the connection relationship between the connecting bar 26, the secondary connecting block 25 and the main connecting block 24, the receiving rod 28 is pushed, which drives the two top blocks 211 to move away from each other synchronously and clamp the transistors on the detection port 312 and the conveyor belt 314. In conjunction with the testing mechanism 3, the fixture housing 21 is rotated and raised and lowered to synchronously switch the two transistors. This relatively shortens the operation time under individual clamping and transportation, and improves the overall time of the testing operation to a certain extent.

[0031] The testing mechanism 3 includes a lifting assembly, a driving assembly, and a testing assembly. The lifting assembly includes a lifting groove 31 formed on the inner wall of the outer casing 1. A hydraulic cylinder 32 is fixedly connected to the inner wall of the lifting groove 31. A fixing block 33 is fixedly connected to the output end of the hydraulic cylinder 32. The outer wall of the fixing block 33 is slidably connected to the inner wall of the lifting groove 31. The driving assembly includes a motor 34 fixedly connected to the inner wall of the fixing block 33. A second rotating shaft 35 is fixedly connected to the output end of the motor 34. A second sliding groove 36 is formed on the inner wall of the second rotating shaft 35. A rectangular shaft 37 is slidably connected to the inner wall of the second sliding groove 36. The top end of shaft 37 is fixedly connected to the bottom end of the first rotating shaft 23. A locking block 38 is fixedly connected to the outer wall of the second rotating shaft 35. Several slots 39 are opened on the bottom surface of the fixture housing 21. Two second limiting grooves 310 are opened on the bottom surface of the fixture housing 21. Limiting blocks 311 are slidably connected to the inner walls of the two second limiting grooves 310. The bottom surfaces of the two limiting blocks 311 are fixedly connected to the top surface of the housing 1. The test assembly includes a detection port 312 opened on the top surface of the housing 1. A transistor tester 313 is fixedly connected to the front of the housing 1. A conveyor belt 314 is provided on the right side of the housing 1.

[0032] By setting up the testing mechanism 3, the transistor held by the clamping mechanism 2 is rotated, transported, and exchanged using the motor 34 and hydraulic cylinder 32. At the same time, the clamping mechanism 2 is raised and lowered simultaneously. The simple mechanical operation of the clamping mechanism 2 ensures the smooth progress of the testing operation and further improves the reliability of the device.

[0033] One specific application of this embodiment is as follows: The transistor tester 313 is an instrument used to detect and test the performance and function of transistors. Its main principle is to verify whether each pin of the transistor is working properly by applying appropriate voltage and current to the transistor, and to determine its type, gain, and whether there is a fault. The tester first applies a small voltage between the base and emitter to measure whether the transistor can conduct normally. If the transistor is good, there should be a certain current between the base and emitter after applying a certain voltage. Then, the current between the collector and emitter is tested. Under normal circumstances, the base current controls the collector current, so the collector current should be proportional to the base current. If this ratio is too low or there is no collector current, it indicates that the transistor may have a problem.

[0034] By setting the clamping mechanism 2, the drive motor 34 drives the rectangular shaft 37 and the second first shaft 23 to rotate via the second rotating shaft 35. The first rotating shaft 23 rotates within the clamp housing 21, causing the main connecting block 24 to rotate. The main connecting block 24 causes the two auxiliary connecting blocks 25 hinged to it to flip. Due to the limiting effect of the first limiting groove 27, the front and rear sides of the connecting strips 26 hinged to the connecting posts within the two auxiliary connecting blocks 25 are brought closer together as the two auxiliary connecting blocks 25 flip. Since the connecting strips 26 are hinged to each other in a prismatic shape, according to the geometric principle of the prismatic shape, the front and rear sides are brought closer together, while the left and right sides of the prismatic connecting strips 26 are moved away from each other. The receiving rods 28 hinged to the left and right sides of the connecting strips 26 slide in the first sliding groove 29, moving away from each other. This causes the receiving rods 28 to drive the top block 211 to compress the spring 212 under the limiting guidance of the guide rod 210, thus releasing the transistors located on the detection port 312 and the conveyor belt 314. The transistors on the left and right sides of the fixture housing 21 are synchronously clamped and fixed on the receiving block 213. When it is necessary to release them, the main connecting block 24 is rotated in the same way, and the two receiving rods 28 drive the top block 211 to release the transistors on the receiving block 213. The spring 212 elastically returns to its original position, and the ends of the two receiving rods 28 that are close to each other are pressed against the outer wall of the partition 22. The spring 212 is set to buffer the clamping force of the top block 211. The motor 34 drives the first rotating shaft 23 to rotate. Through the connection relationship between the connecting bar 26, the secondary connecting block 25 and the main connecting block 24, the receiving rods 28 are pushed, and the two top blocks 211 are driven to move away from each other synchronously to clamp the transistors on the detection port 312 and the conveyor belt 314. With the cooperation of the testing mechanism 3, the fixture housing 21 is rotated and raised and lowered to synchronously switch the two transistors. This relatively shortens the operation time of individual clamping and transportation, and improves the overall time of the testing operation to a certain extent.

[0035] After the testing mechanism 3 is set up and the clamping mechanism 2 completes the clamping at two points, the hydraulic cylinder 32 is driven to drive the motor 34 to rise through the fixed block 33. Under the gravity of the fixture housing 21, the motor 34 rises, causing the second slide groove 36 on the second rotating shaft 35 to slide on the outer wall of the rectangular shaft 37, locking the two locking blocks 38 on the second rotating shaft 35 into the slots 39, thus locking the first rotating shaft 23. The motor 34 drives the second rotating shaft 35 to rotate, which in turn drives the fixture housing 21 to rotate through the locking blocks 38 and the slots 39. Meanwhile, the first rotating shaft 23 is not affected by the conical limit of the rectangular shaft 37. The clamped transistors, still in a clamped state, are released due to the influence of the hydraulic cylinder 32. The hydraulic cylinder 32 continues to drive, and because the locking block 38 is pressed against the slot 39, the hydraulic cylinder 32 lifts the fixture housing 21 via the second rotating shaft 35, causing the limiting block 311 to disengage from the second limiting groove 310. This, combined with the clamping mechanism 2, causes the two clamped transistors to rise and be removed from the detection port 312 and the conveyor belt 314. Then, the drive motor 34, via the second rotating shaft 35 and under the limitation of the second locking block 38 in the slot 39, rotates the fixture housing 21, swapping the positions of the tested and untested transistors. Following the same principle, after the jig housing 21 completes the turning, it descends under the action of the hydraulic cylinder 32, locking the second limiting groove 310 back into the limiting block 311. This provides limiting support for the overall turning of the jig housing 21. Simultaneously, the two transistors, after being swapped, have the untested transistor inserted into the detection port 312, while the tested transistor is placed on the conveyor belt 314. The hydraulic cylinder 32 continues to drive, causing the rectangular shaft 37 to rise in the second slide groove 36 via the fixing block 33 and the motor 34. This disengages the locking block 38 from the locking groove 39, preventing the motor 34 from rotating the jig housing. 21. Then, the drive motor 34 drives the second rotating shaft 35 to rotate the first rotating shaft 23. In conjunction with the clamping mechanism 2, the clamped transistor is released, and the replacement process is completed. Then, the transistor tester 313 is driven to test the transistor inserted into the test port 312. This realizes that by using the motor 34 and the hydraulic cylinder 32 to drive the transistor under the clamping mechanism 2 to rotate, transport and replace it, the lifting and lowering of the clamping mechanism 2 is also completed simultaneously. The simple mechanical structure operation of the clamping mechanism 2 ensures the smooth operation of the test and further improves the reliability of the device.

[0036] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0037] The preferred embodiments of this utility model disclosed above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.

Claims

1. A semiconductor field-effect transistor reliability testing device, comprising a housing (1), wherein a clamping mechanism (2) and a testing mechanism (3) are disposed on the housing (1), characterized in that: The clamping mechanism (2) includes a rotating component, a clamping component and a buffer component. The rotating component includes a clamp housing (21) disposed on the housing (1). A partition (22) is fixedly connected to the inner wall of the clamp housing (21). A first rotating shaft (23) is rotatably connected to the inner wall of the clamp housing (21). The outer wall of the first rotating shaft (23) is rotatably connected to the inner wall of the partition (22). A main connecting block (24) is fixedly connected to the outer wall of the first rotating shaft (23). A secondary connecting block (25) is hinged to both the front end and the end of the main connecting block (24). Two connecting strips (26) are hinged to the ends of the two secondary connecting blocks (25) that are far apart from each other.

2. The apparatus of claim 1, wherein: The clamping assembly includes two first limiting grooves (27) formed on the top surface of the partition (22), a plurality of connecting strips (26) are hinged to each other, and the inner walls of the plurality of connecting strips (26) are all hinged with receiving rods (28). The inner wall of the clamp housing (21) is provided with two first sliding grooves (29), and the outer walls of the two receiving rods (28) are slidably connected to the inner walls of the first sliding grooves (29).

3. The apparatus of claim 2, wherein the apparatus is configured to: The inner walls of the two first slide grooves (29) are fixedly connected with guide rods (210), and the outer walls of the two guide rods (210) are slidably connected with top blocks (211). The top surfaces of the two top blocks (211) are fixedly connected to the bottom surfaces of the receiving rods (28).

4. The apparatus of claim 3, wherein the means for applying a voltage to the gate of the field effect transistor comprises a means for applying a voltage to the gate of the field effect transistor to induce a current through the field effect transistor. The buffer assembly includes two springs (212) that are fixedly connected to the two top blocks (211) on opposite sides. The opposite ends of the two springs (212) are fixedly connected to the inner wall of the first slide groove (29). The bottom surface of the clamp housing (21) is fixedly connected to two receiving blocks (213).

5. The semiconductor field-effect transistor reliability testing device according to claim 4, characterized in that, The testing mechanism (3) includes a lifting assembly, a driving assembly and a testing assembly. The lifting assembly includes a lifting groove (31) opened on the inner wall of the outer shell (1). A hydraulic cylinder (32) is fixedly connected to the inner wall of the lifting groove (31). A fixing block (33) is fixedly connected to the output end of the hydraulic cylinder (32). The outer wall of the fixing block (33) is slidably connected to the inner wall of the lifting groove (31).

6. The apparatus of claim 5, wherein the means for applying a voltage to the gate of the field effect transistor comprises a means for applying a voltage to the gate of the field effect transistor to induce a current through the field effect transistor. The drive assembly includes a motor (34) fixedly connected to the inner wall of the fixed block (33). The output end of the motor (34) is fixedly connected to a second rotating shaft (35). The inner wall of the second rotating shaft (35) is provided with a second sliding groove (36). The inner wall of the second sliding groove (36) is slidably connected to a rectangular shaft (37). The top end of the rectangular shaft (37) is fixedly connected to the bottom end of the first rotating shaft (23).

7. The apparatus of claim 6, wherein the means for applying a voltage comprises a means for applying a voltage to the gate of the field effect transistor. The outer wall of the second rotating shaft (35) is fixedly connected with a locking block (38). The bottom surface of the fixture housing (21) is provided with several locking slots (39). The bottom surface of the fixture housing (21) is provided with two second limiting slots (310). The inner walls of the two second limiting slots (310) are slidably connected with limiting blocks (311). The bottom surfaces of the two limiting blocks (311) are fixedly connected to the top surface of the housing (1).

8. The apparatus of claim 7, wherein the means for applying a voltage to the gate of the field effect transistor comprises a means for applying a voltage to the gate of the field effect transistor to induce a current through the field effect transistor. The test assembly includes a test port (312) on the top surface of the housing (1), a transistor tester (313) is fixedly connected to the front of the housing (1), and a conveyor belt (314) is provided on the right side of the housing (1).

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