Mainboard FCT testing device
By designing a motherboard FCT testing device with a fixing mechanism and a cleaning mechanism, the problems of cumbersome test board installation and incomplete probe cleaning in the existing technology are solved, realizing rapid fixing and automatic cleaning, and improving testing efficiency and accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-29
- Publication Date
- 2026-04-21
AI Technical Summary
Existing motherboard FCT testing equipment is cumbersome and time-consuming to install the test board, and manual cleaning of the probe surface for dust and impurities is not thorough, affecting the accuracy of the test.
A motherboard FCT testing device was designed, which includes a fixing mechanism and a cleaning mechanism. The test board is quickly fixed by a screw and a bidirectional lead screw, and the probe surface is automatically cleaned by a cylinder and a sponge block combined with an air jet pipe and an air suction pipe.
It simplifies the test board installation process, ensures test stability, and automatically cleans the probe surface after testing, improving test efficiency and accuracy.
Smart Images

Figure CN224152542U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of FCT testing technology, and in particular to a motherboard FCT testing device. Background Technology
[0002] FCT, or Functional Testing, is a testing method that verifies the functional performance of electronic devices by simulating actual operating environments. Its core principle is to provide simulated excitation signals and load conditions to the unit under test, allowing it to operate under different design states. By collecting and analyzing various performance parameters, the functional integrity of the product is evaluated. FCT test fixtures are mainly used for functional testing of products, such as voltage, current, power, and frequency. FCT test fixtures can test semi-finished or finished products.
[0003] Existing motherboard FCT testing equipment often requires operators to manually tighten each fixing point one by one when installing the test board. This not only involves numerous steps but also consumes a lot of time and energy, reducing work efficiency. Furthermore, it requires manual cleaning of the test probe surface, which is not only labor-intensive but also prone to leaving dust and impurities due to untimely or incomplete manual operation, thus affecting the accuracy of subsequent tests.
[0004] Therefore, those skilled in the art have provided a motherboard FCT testing device to solve the problems mentioned in the background art. Utility Model Content
[0005] The purpose of this invention is to address the shortcomings of existing technologies by proposing a motherboard FCT testing device. The device features a fixing mechanism for easy installation of different test boards, convenient operation, and a cleaning mechanism that effectively cleans dust and impurities from the test probe surface, thereby improving testing results.
[0006] To achieve the above objectives, the present invention provides the following technical solution:
[0007] A motherboard FCT testing device includes a main body with a fixing mechanism inside. The fixing mechanism includes a mounting plate, a connecting block, and an upper test plate. A screw is threaded to the rear end of the mounting plate, and a slider is rotatably mounted at the front end of the screw. Rotating blocks are rotatably mounted on both sides of the slider, and fixing blocks are rotatably mounted on opposite sides of the two rotating blocks. A lower test plate is mounted on the upper end of the mounting plate, and multiple fixing grooves are formed on both sides of the lower test plate. A support plate is slidably mounted on the upper end of the lower test plate, and a sponge block is fixedly mounted on the lower end of the support plate.
[0008] The connecting block has a bidirectional lead screw rotatably mounted at its front end. The bidirectional lead screw is externally threaded with two L-shaped blocks. The upper end of the upper test plate is fixedly mounted with an installation block. The upper end of the device body is equipped with a cleaning mechanism, which includes multiple cylinders. Each cylinder output end is fixedly equipped with an air jet pipe. The lower end of the device body is fixedly mounted with an air pump. The output end of the air pump is fixedly equipped with two suction pipes.
[0009] Furthermore, the lower end of the mounting plate is fixedly disposed inside the main body of the device, the slider is externally slidably disposed inside the rear end of the mounting plate, the two fixing blocks are externally slidably disposed on the upper end of the mounting plate, and the multiple fixing grooves are respectively disposed on opposite sides of the two fixing blocks.
[0010] Furthermore, a plurality of guide rods are fixedly provided at the lower end of the support plate, and the lower ends of the plurality of guide rods are slidably provided inside the lower end of the lower test plate. A plurality of lower test probes are fixedly provided inside the lower end of the lower test plate.
[0011] Furthermore, a plurality of springs are fixedly installed at the lower end of the support plate, and the lower ends of the plurality of springs are all fixedly installed at the lower end of the lower test plate, with the interior of the plurality of springs respectively sleeved on the exterior of the plurality of guide rods.
[0012] Furthermore, the exterior of both L-shaped blocks is disposed on the upper part of the mounting block, and the exterior of both L-shaped blocks is slidably disposed on the lower part of the connecting block. Multiple upper test probes are fixedly disposed on the lower end of the upper test plate.
[0013] Furthermore, an electric cylinder is fixedly installed at the upper end of the main body of the device, and the output end of the electric cylinder is fixedly installed at the upper end of the connecting block.
[0014] Furthermore, the upper end of the connecting block is fixedly disposed at the lower end of multiple cylinders, the upper ends of multiple cylinders are all fixedly disposed at the upper end of the device body, and the two air intake pipe output ends are respectively fixedly disposed at the upper end of the two fixed blocks.
[0015] Furthermore, a collection frame is slidably disposed at the rear end of the main body of the device, and the air pump output end is disposed at the upper end of the collection frame.
[0016] This utility model has the following beneficial effects:
[0017] 1. The motherboard FCT testing device proposed in this utility model, when installing the lower test board, rotates the screw to make the slider drive the rotating block to rotate, causing the fixed blocks to slide towards each other. When the opposite side of the fixed blocks is fully embedded in the fixing groove, the lower test board is fixed. When installing the upper test board, the mounting block is aligned with the L-shaped block and inserted. Then, the bidirectional screw is rotated to make the L-shaped block slide in the opposite direction inside the mounting block. Then, the upper test board is fixed. The installation process is simple and efficient, which not only shortens the installation time, but also ensures that the upper and lower test boards are stable and without displacement during the test, thus improving the stability of the test.
[0018] 2. The motherboard FCT testing device proposed in this utility model, during motherboard testing, the electric cylinder pushes the connecting block downwards, causing the cylinder to gradually fill with gas. When the upper test probe contacts the motherboard on the upper part of the support plate, the electric cylinder continues to push, causing the support plate to slide downwards in the lower test plate. The sponge block gradually passes through the lower test probe, and then the motherboard test is completed. After the test is completed, the connecting block moves upwards, causing the upper and lower test probes to gradually detach from the motherboard. The spring pushes the support plate to reset, and the sponge block slides upwards on the surface of the lower test probe, completing the cleaning of the lower test probe surface. At this time, the cylinder output end contracts, causing the gas inside to be ejected through the jet pipe, completing the cleaning of the upper test probe surface. At the same time, the air pump sucks dust and impurities near the fixed block into the collection box through the suction pipe, completing the cleaning work. This not only makes the cleaning process closely integrated with the testing process and convenient to operate, but also can thoroughly clean the area near the test probe and the fixed block, effectively removing dust and impurities and preventing impurities from affecting the accuracy of the next test. Attached Figure Description
[0019] Figure 1 This is an isometric schematic diagram of the entire utility model;
[0020] Figure 2 This is a partial side sectional isometric schematic diagram of the present invention;
[0021] Figure 3 This is a partial rear-view axonometric schematic diagram of the present invention near the mounting plate;
[0022] Figure 4 This is a bottom-view side section axonometric schematic diagram of the present invention;
[0023] Figure 5 This is a partial isometric view of the present invention near the screw.
[0024] Figure 6 This is an isometric view of the present invention near the electric cylinder;
[0025] Figure 7 This is a side sectional isometric view of the present invention near the connecting block;
[0026] Figure 8 This is a partial isometric view of the present invention near the air pump.
[0027] Legend:
[0028] 1. Main body of the device; 2. Fixing mechanism; 3. Cleaning mechanism; 201. Mounting plate; 202. Lower test plate; 203. Support plate; 204. Upper test plate; 205. Two-way lead screw; 206. Connecting block; 207. Upper test probe; 208. Fixing block; 209. Screw; 210. Fixing groove; 211. Spring; 212. Sponge block; 213. Lower test probe; 214. Guide rod; 215. Slider; 216. Rotating block; 217. L-shaped block; 218. Mounting block; 301. Cylinder; 302. Jet pipe; 303. Electric cylinder; 304. Suction pipe; 305. Air pump; 306. Collection frame. Detailed Implementation
[0029] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0030] Reference Figures 1-7 One embodiment provided by this utility model:
[0031] A motherboard FCT testing device includes a device body 1. A fixing mechanism 2 is provided inside the device body 1. The fixing mechanism 2 includes a mounting plate 201, a connecting block 206, and an upper test plate 204. A screw 209 is threadedly connected to the rear end of the mounting plate 201. A slider 215 is rotatably provided at the front end of the screw 209. Rotating blocks 216 are rotatably provided on both sides of the slider 215. Fixing blocks 208 are rotatably provided on opposite sides of the two rotating blocks 216. A lower test plate 202 is provided at the upper end of the mounting plate 201. Multiple fixing grooves 210 are provided on both sides of the lower test plate 202. A support plate 203 is slidably provided at the upper end of the lower test plate 202. A sponge block 212 is fixedly provided at the lower end of the support plate 203.
[0032] The lower end of the mounting plate 201 is fixedly installed inside the main body 1 of the device. The slider 215 is externally slidably installed at the rear end of the mounting plate 201. The two fixing blocks 208 are externally slidably installed at the upper end of the mounting plate 201. Multiple fixing slots 210 are respectively installed on opposite sides of the two fixing blocks 208. Multiple guide rods 214 are fixedly installed at the lower end of the support plate 203. The lower ends of the multiple guide rods 214 are slidably installed inside the lower end of the lower test plate 202. Multiple lower test probes 213 are fixedly installed at the lower end of the support plate 203. Multiple springs 211 are fixedly installed at the lower end of the lower test plate 202. The lower ends of the multiple springs 211 are fixedly installed inside the multiple guide rods 214. The two L-shaped blocks 217 are externally installed at the upper end of the mounting block 218. The two L-shaped blocks 217 are externally slidably installed inside the lower end of the connecting block 206. Multiple upper test probes 207 are fixedly installed at the lower end of the upper test plate 204.
[0033] The connecting block 206 has a bidirectional lead screw 205 rotatably mounted inside the front end, and two L-shaped blocks 217 are externally threaded to the bidirectional lead screw 205. An installation block 218 is fixedly mounted on the upper end of the upper test plate 204.
[0034] Specifically, during the installation of the lower test plate 202, the lower test plate 202 is first placed stably on the upper end of the mounting plate 201. Then, the screw 209 at the rear end of the mounting plate 201 is rotated clockwise. Due to the threaded connection between the screw 209 and the rear end of the mounting plate 201, the rotation of the screw 209 is converted into axial thrust, which drives the slider 215 to slide forward along a specific track inside the mounting plate 201. As the slider 215 moves, the rotating blocks 216 rotatably connected on both sides of it will rotate accordingly. The rotation of 216 causes the fixed block 208, which is rotatably connected to it, to slide towards each other on the upper end of the mounting plate 201. During this process, the opposite side of the fixed block 208 gradually approaches the fixing grooves 210 on both sides of the lower test plate 202. When the opposite side of the fixed block 208 is fully embedded in the fixing groove 210, the lower test plate 202 is firmly fixed on the mounting plate 201, and the installation process is successfully completed. By rotating the screw 209 in the opposite direction, the fixed block 208 can be moved in the opposite direction, thereby releasing the fixation of the lower test plate 202.
[0035] For the installation of the upper test plate 204, first precisely align the mounting block 218 at the upper end of the upper test plate 204 with the L-shaped block 217, and then slowly insert it. Next, rotate the bidirectional screw 205 at the front end of the connecting block 206. Since the bidirectional screw 205 is threadedly connected to the two L-shaped blocks 217, the rotation of the bidirectional screw 205 will cause the two L-shaped blocks 217 to slide in opposite directions inside the connecting block 206. Because the lower outer end of the L-shaped block 217 is inside the mounting block 218, when the L-shaped block 217 slides in the opposite direction, they will simultaneously move in the opposite direction inside the mounting block 218. When the L-shaped block 217 slides to the preset position, the mounting block 218 is firmly fixed, thereby firmly fixing the upper test plate 204 to the lower end of the connecting block 206. By rotating the bidirectional screw 205 in the opposite direction, the fixing of the upper test plate 204 can be released. The operation is quick and easy.
[0036] When conducting motherboard testing, the motherboard is carefully placed on the support plate 203. The support plate 203 has a groove of a certain depth on its surface, which is designed to fit the shape of the motherboard, facilitating the initial positioning and fixation of the motherboard. After starting the electric cylinder 303, the output end of the electric cylinder 303 begins to move, pushing the connecting block 206 to slide downward inside the main body 1 of the device. The sliding of the connecting block 206 not only moves the upper test plate 204 at its lower end downward, but also causes the output end of the cylinder 301 to gradually extend, causing the cylinder 301 to slowly inflate. When it moves to the upper test probe at the lower end of the upper test plate 204... When the needle 207 contacts the main board at the upper end of the support plate 203, the electric cylinder 303 continues to push. At this time, the support plate 203 and the main board will continue to slide downward in the lower test plate 202. During this period, the guide rod 214 at the lower end of the support plate 203 slides downward along the guide channel inside the lower test plate 202. The spring 211 connected to the guide rod 214 also contracts. As the support plate 203 moves downward, the sponge block 212 gradually passes through the lower test probe 213 until the lower test probe 213 finally contacts the lower end of the main board. This completes the electrical connection to the main board and starts the FCT test process.
[0037] Reference Figures 1-8The upper part of the device body 1 is provided with a cleaning mechanism 3, which includes multiple cylinders 301. Each cylinder 301 has a jet pipe 302 fixedly installed at its output end. The lower part of the device body 1 is provided with an air pump 305. The output end of the air pump 305 is fixedly installed with two suction pipes 304. The upper part of the device body 1 is provided with an electric cylinder 303. The output end of the electric cylinder 303 is fixedly installed on the upper part of the connecting block 206. The upper part of the connecting block 206 is fixedly installed on the lower part of the multiple cylinders 301. The upper parts of the multiple cylinders 301 are all fixedly installed on the upper part of the device body 1. The output ends of the two suction pipes 304 are respectively fixedly installed on the upper part of the two fixed blocks 208. The rear end of the device body 1 is provided with a collection frame 306, and the output end of the air pump 305 is installed on the upper part of the collection frame 306.
[0038] Specifically, after the FCT test of the motherboard is completed, the electric cylinder 303 immediately starts to operate in reverse. Its output end pulls the connecting block 206 to move steadily upward inside the main body 1 of the device. During this process, the upper test plate 204 connected to the lower end of the connecting block 206 rises synchronously, causing the upper test probe 207 to gradually disengage from the motherboard. At the same time, the spring 211, which was originally compressed, under the lower test plate 202 begins to rebound, generating an upward thrust, pushing the support plate 203 to quickly reset along the guide channel inside the lower test plate 202. During the reset process of the support plate 203, the sponge block 212 fixed at its lower end also slides upward. During the sliding process, the sponge block 212 fully contacts and rubs the surface of the lower test probe 213, effectively removing various stains that have adhered to the surface of the lower test probe 213 during the test, thus cleaning the lower test probe 213.
[0039] As the connecting block 206 continues to move upward, the output end of the cylinder 301 connected to the upper end of the connecting block 206 begins to contract, the internal space of the cylinder 301 decreases accordingly, the pressure increases, and the gas stored inside is ejected at high speed through the jet pipe 302 under pressure. The ejected airflow precisely impacts the surface of the upper test probe 207, blowing away the dust and impurities on the surface of the upper test probe 207, completing the cleaning work of the upper test probe 207. At the same time, the air pump 305 also begins to operate efficiently. The air pump 305 generates a strong suction through the suction pipe 304, which quickly sucks in the dust and impurities generated near the fixed block 208 due to the movement of the motherboard and contact with the probe during the test, and finally gathers them into the collection frame 306. Thus, the cleaning work of the entire testing device is fully completed.
[0040] Working principle: When installing the lower test plate 202, first place it on the upper end of the mounting plate 201. Then, rotate the screw 209 at the rear end of the mounting plate 201, causing the slider 215 to slide inside the mounting plate 201. The sliding of the slider 215 will cause the rotating block 216 to rotate. The rotation of the rotating block 216 will cause the fixing blocks 208 to slide towards each other on the upper end of the mounting plate 201, thereby causing the opposite sides of the fixing blocks 208 to gradually approach and contact the fixing grooves 210 on both sides of the lower test plate 202. When the opposite sides of the fixing blocks 208 are completely embedded in the fixing grooves 210, the installation of the lower test plate 202 is completed. For fixing 02, when installing the test plate 204, first align the mounting block 218 at its upper end with the L-shaped block 217 and insert it. Then, rotate the double-acting screw 205 at the front end of the connecting block 206 so that the L-shaped block 217, which is threaded to it, slides in the opposite direction inside the connecting block 206. Since the lower outer end of the L-shaped block 217 is inside the mounting block 218, when the L-shaped block 217 slides in the opposite direction, it will slide in the opposite direction synchronously inside the mounting block 218. When it slides to the set position, the L-shaped block 217 will complete the fixing of the mounting block 218, thereby completing the fixing of the test plate 204.
[0041] When testing the motherboard, the motherboard is first placed on the support plate 203. Then, the electric cylinder 303 is activated, and its output end pushes the connecting block 206 to slide downward inside the main body 1 of the device. This not only causes the upper test plate 204 at its lower end to slide downward, but also causes the output end of the cylinder 301 at its upper end to gradually extend, so that the cylinder 301 gradually fills with gas. When the upper test probe 207 at the lower end of the upper test plate 204 contacts the motherboard at the upper end of the support plate 203, the continued pushing of the electric cylinder 303 will cause the support plate 203 and the motherboard to slide downward in the lower test plate 202. This will cause the guide rod 214 at the lower end of the support plate 203 to slide downward in the lower test plate 202, and cause the spring 211 connected to it to contract. At this time, the sponge block 212 will gradually pass through the lower test probe 213, and finally, the lower test probe 213 will contact the lower end of the motherboard, thus completing the test of the motherboard.
[0042] After the test is completed, the electric cylinder 303 drives the connecting block 206 to move upward, so that the upper test probe 207 and the lower test probe 213 gradually release their contact with the main board, causing the spring 211 to rebound and push the support plate 203 to reset. During the reset process of the support plate 203, the sponge block 212 slides upward, thereby releasing its contact with the lower test probe 213 and cleaning the surface of the lower test probe 213. When the connecting block 206 moves upward, the output end of the cylinder 301 at its upper end will contract, causing the gas inside to be ejected through the jet pipe 302, cleaning the surface of the upper test probe 207. At the same time, the air pump 305 sucks the dust and impurities near the fixed block 208 into the collection frame 306 through the suction pipe 304, thus completing the cleaning work.
[0043] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A mainboard FCT testing device comprising a device main body (1), characterized in that: The main body (1) of the device is provided with a fixing mechanism (2). The fixing mechanism (2) includes a mounting plate (201), a connecting block (206) and an upper test plate (204). The mounting plate (201) has a screw (209) threadedly connected to its rear end. The front end of the screw (209) is provided with a slider (215). Both sides of the slider (215) are provided with rotating blocks (216). The opposite sides of the two rotating blocks (216) are provided with fixing blocks (208). The upper end of the mounting plate (201) is provided with a lower test plate (202). Both sides of the lower test plate (202) are provided with multiple fixing slots (210). The upper end of the lower test plate (202) is provided with a support plate (203). The lower end of the support plate (203) is fixed with a sponge block (212). The connecting block (206) has a bidirectional lead screw (205) rotatably mounted at its front end. The bidirectional lead screw (205) has two L-shaped blocks (217) threadedly connected to its exterior. The upper end of the upper test plate (204) has an installation block (218) fixedly mounted. The upper end of the device body (1) has a cleaning mechanism (3) mounted inside. The cleaning mechanism (3) includes multiple cylinders (301). The output ends of the multiple cylinders (301) are all fixedly mounted with jet pipes (302). The lower end of the device body (1) has an air pump (305) fixedly mounted inside. The output end of the air pump (305) has two suction pipes (304) fixedly mounted.
2. The mainboard FCT testing device according to claim 1, wherein: The lower end of the mounting plate (201) is fixedly installed inside the main body (1) of the device. The slider (215) is externally slidably installed at the rear end of the mounting plate (201). The two fixing blocks (208) are externally slidably installed at the upper end of the mounting plate (201). The multiple fixing grooves (210) are respectively installed on opposite sides of the two fixing blocks (208).
3. The mainboard FCT testing device according to claim 1, wherein: The lower end of the support plate (203) is fixedly provided with a plurality of guide rods (214), and the lower ends of the plurality of guide rods (214) are slidably provided inside the lower end of the lower test plate (202). The lower end of the lower test plate (202) is fixedly provided with a plurality of lower test probes (213).
4. The mainboard FCT testing device according to claim 3, wherein: The lower end of the support plate (203) is fixedly provided with a plurality of springs (211), and the lower ends of the plurality of springs (211) are all fixedly provided at the lower end of the lower test plate (202). The interior of the plurality of springs (211) is respectively sleeved on the exterior of the plurality of guide rods (214).
5. The mainboard FCT testing device according to claim 1, wherein: Both L-shaped blocks (217) are externally disposed on the upper part of the mounting block (218), and both L-shaped blocks (217) are externally slidably disposed on the lower part of the connecting block (206). Multiple upper test probes (207) are fixedly disposed on the lower part of the upper test plate (204).
6. The motherboard FCT testing device of claim 1, wherein: An electric cylinder (303) is fixedly installed at the upper end of the main body (1) of the device, and the output end of the electric cylinder (303) is fixedly installed at the upper end of the connecting block (206).
7. The mainboard FCT testing device according to claim 1, wherein: The upper end of the connecting block (206) is fixedly installed at the lower end of multiple cylinders (301), and the upper ends of multiple cylinders (301) are fixedly installed inside the upper end of the main body (1) of the device. The output ends of the two suction pipes (304) are respectively fixedly installed inside the upper end of the two fixed blocks (208).
8. The mainboard FCT testing device according to claim 1, wherein: The device body (1) has a collection frame (306) slidably arranged at the rear end, and the output end of the air pump (305) is located at the upper end of the collection frame (306).