Multifunctional flash memory chip test frame

Abstract

The utility model provides a multifunctional flash memory chip test frame, relates to the technical field of flash memory testing, and aims to solve the problems that during testing, a single flash memory chip needs to be clamped and fixed, a test result needs to be memorized manually after testing, and defective products are easy to omit and reject even if the defective products appear. A supporting frame is fixedly installed on the top plane of the base in a vertically upward mode. A conveying frame is transversely mounted at the upper end of the supporting frame, a motor is arranged at the right end of the conveying frame, and a conveying belt conveys from right to left; a test vertical frame is fixedly mounted on the base on the rear side of the support frame in a vertically upward manner; and a test cylinder is vertically mounted at the upper end of the test vertical frame. According to the utility model, when the clamping electric cylinder pushes the clamping block to move, the clamping electric cylinder extrudes the extrusion switch, and the extrusion switch controls the test cylinder to work, so that the test probe of the test cylinder tests the flash memory chip on the flash memory chip tray, and the whole process is efficient, stable and orderly.

Description

Technical Field

[0001] This utility model relates to the field of flash memory testing technology, and more specifically, to a multifunctional flash memory chip testing fixture. Background Technology

[0002] Flash memory's advantage lies in its fast data storage speed. A flash memory test fixture is a tool used to test the quality, lifespan, and other indicators of flash memory. In addition to these functions, a flash memory test fixture can also be used as a flash memory speed testing tool.

[0003] Currently, most flash memory test racks on the market are card-type test racks. For example, patent application CN202021426607.3 describes a multi-functional flash memory chip test rack, including a main test board and an auxiliary test board. The auxiliary test board is movably connected to one side of the main test board. When using the auxiliary board, it can be rotated out of the placement slot using a hinge. When not in use or when storing the test rack, the auxiliary board can also be rotated into the inner cavity of the placement slot using the hinge. This test rack has several first slots on the surface of the main board. A main test socket is inserted into the inner cavity of each first slot. Each main test socket can have a corresponding flash memory chip installed in its upper inner cavity, and each auxiliary test socket can also have a corresponding flash memory chip installed in its upper inner cavity. This allows multiple flash memory chips to be placed in the main and auxiliary test sockets respectively, and connected to USB and power interfaces respectively, enabling simultaneous testing of multiple flash memory chips. Compared with traditional single flash memory chip testing methods, this method offers higher testing efficiency. It can be observed that during testing, individual clips need to be inserted and fixed, and the test results need to be manually memorized after the test. Even if defective products are found, they are easy to miss and discard. Utility Model Content

[0004] To address the aforementioned technical problems, this utility model provides a multifunctional flash memory chip test fixture, which solves the issues of needing to individually insert and fix the chip during testing, requiring manual memorization of test results after testing, and easily overlooking or rejecting defective products.

[0005] The purpose and effectiveness of this multifunctional flash memory chip test fixture are achieved through the following specific technical means:

[0006] A multifunctional flash memory chip test rack includes a base; a support frame is vertically fixedly mounted on the top plane of the base; a conveyor frame is horizontally mounted on the upper end of the support frame, and a motor is located at the right end of the conveyor frame, with the conveyor belt conveying from right to left; a test stand is vertically fixedly mounted on the base behind the support frame; a test cylinder is vertically mounted on the upper end of the test stand; a stop frame is vertically fixedly mounted on the conveyor frame to the left of the test cylinder; a clamping frame is obliquely mounted on the conveyor frame to the right front of the test cylinder; a flash memory chip tray is conveyed on the conveyor belt of the conveyor frame, and flash memory chips are held on the flash memory chip tray.

[0007] Furthermore, a convex guide plate is horizontally fixedly installed at the rear edge of the upper end of the conveyor frame, and a squeeze switch is vertically embedded on the conveyor frame on the left side of the clamping frame. The upper end of the squeeze switch has a ball-shaped structure and the upper end of the squeeze switch is exposed on the upper end of the conveyor frame.

[0008] Furthermore, a control box is fixedly installed on the test stand, and the squeeze switch is electrically connected to the control circuit of the test cylinder.

[0009] Furthermore, a test probe is fixedly installed at the lower end of the piston rod of the test cylinder, and a marking cylinder is vertically installed on the right side wall of the test probe. A fluorescent pen is vertically installed at the end of the piston rod of the marking cylinder, and the marking cylinder is electrically linked to the signal recognition of the test probe.

[0010] Furthermore, a rail is fixedly mounted longitudinally on the top plane of the stop bracket, and a stop block is slidably mounted longitudinally on the rail. A longitudinal stop cylinder is fixedly mounted on the stop bracket on the left side of the rail, and the piston rod end of the stop cylinder is fixedly connected to the stop block. A tactile switch is embedded in the side wall on the right side of the stop block.

[0011] Furthermore, the clamping frame is equipped with a clamping electric cylinder tilted towards the test cylinder, and the tactile switch is electrically connected to the control circuit of the clamping electric cylinder. A V-shaped clamping block is fixedly connected to the end of the piston rod of the clamping electric cylinder, and the moving path of the clamping block passes through the location of the squeeze switch.

[0012] Compared with the prior art, the present invention has the following beneficial effects:

[0013] 1. In this utility model, during the process of the clamping electric cylinder pushing the clamping block to move, it squeezes the squeeze switch. The squeeze switch controls the test cylinder to work, so that the test probe of the test cylinder can test the flash memory chip on the flash memory chip tray. The whole process is efficient, stable and orderly.

[0014] 2. In this utility model, the flash memory chip tray comes into contact with the stop block, and when the tactile switch is squeezed, the clamping electric cylinder works, pushing the clamping block to clamp and fix the flash memory chip tray between the stop block and the guide side plate, thereby facilitating rapid testing.

[0015] 3. In this utility model, when the test cylinder moves the test probe downward to test the flash memory chip, if a problem is detected in the flash memory chip, the marking cylinder pushes the fluorescent pen to the flash memory chip tray to leave a mark, so as to remove the flash memory chip and avoid the flash memory chips being mixed together again and difficult to distinguish. It has multiple functions.

[0016] Other advantages, objectives and features of this invention will be partly apparent from the following description, and partly understood by those skilled in the art through study and practice of this invention. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the right front upper axis view structure of this utility model.

[0018] Figure 2 This is the utility model Figure 1 Schematic diagram of the A-section of the middle section.

[0019] Figure 3 This is a schematic diagram of the left front upper axis structure of this utility model.

[0020] Figure 4 This is the utility model Figure 3 Schematic diagram of the B-type amplification section.

[0021] Figure 5 This is an axial view structural diagram of the flash memory chip tray in the removed state of this utility model.

[0022] In the diagram, the correspondence between component names and drawing numbers is as follows:

[0023] 1. Base; 2. Support frame; 3. Conveyor frame; 301. Guide side plate; 302. Press switch; 4. Test stand; 401. Control box; 5. Test cylinder; 501. Test probe; 502. Marking cylinder; 503. Highlighter; 6. Stop frame; 601. Rail; 602. Stop cylinder; 603. Stop block; 604. Tactile switch; 7. Clamping frame; 701. Clamping electric cylinder; 702. Clamping block; 8. Flash memory chip tray. Detailed Implementation

[0024] The embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples.

[0025] Example 1:

[0026] As attached Figure 1 To be continued Figure 5 As shown:

[0027] This utility model provides a multifunctional flash memory chip test rack, including a base 1; a support frame 2 is vertically fixedly installed on the top plane of the base 1; a conveyor frame 3 is horizontally installed on the upper end of the support frame 2, and a motor is located at the right end of the conveyor frame 3, with the conveyor belt conveying from right to left; a test stand 4 is vertically fixedly installed on the base 1 behind the support frame 2; a test cylinder 5 is vertically installed on the upper end of the test stand 4; a stop frame 6 is vertically fixedly installed on the conveyor frame 3 to the left of the test cylinder 5; a clamping frame 7 is obliquely installed on the conveyor frame 3 to the right front of the test cylinder 5; a flash memory chip tray 8 is conveyed on the conveyor belt of the conveyor frame 3, and flash memory chips are held on the flash memory chip tray 8.

[0028] Among them, a convex guide plate 301 is horizontally fixedly installed at the upper rear end edge of the conveyor frame 3, which can guide the flash memory chip tray 8 to move in a specific direction.

[0029] The control box 401 is fixedly installed on the test stand 4.

[0030] The test cylinder 5 has a test probe 501 fixedly mounted on the lower end of its piston rod. A marking cylinder 502 is vertically mounted on the right side wall of the test probe 501. A fluorescent pen 503 is vertically mounted on the end of the piston rod of the marking cylinder 502. The marking cylinder 502 is electrically linked to the signal recognition of the test probe 501. When the test cylinder 5 moves the test probe 501 down to test the flash memory chip, if a problem is detected in the flash memory chip, the marking cylinder 502 pushes the fluorescent pen 503 onto the flash memory chip tray 8 to leave a mark, so that the flash memory chip can be removed and the flash memory chips can be removed again and prevented from being mixed together and difficult to distinguish.

[0031] Example 2: This utility model provides a multifunctional flash memory chip test rack, which also includes a longitudinally fixed rail 601 on the top plane of the stop frame 6, a longitudinally sliding stop block 603 on the rail 601, a longitudinally fixed stop cylinder 602 on the stop frame 6 on the left side of the rail 601, and the piston rod end of the stop cylinder 602 is fixedly connected to the stop block 603; a tactile switch 604 is embedded in the side wall on the right side of the stop block 603. The stop cylinder 602 drives the stop block 603 to move onto the conveyor belt of the conveyor frame 3 to stop the flash memory chip tray 8. When the flash memory chip tray 8 contacts the stop block 603 and squeezes the tactile switch 604, the clamping electric cylinder 701 works, pushing the clamping block 702 to clamp and fix the flash memory chip tray 8 between the stop block 603 and the guide side plate 301, thereby facilitating rapid testing.

[0032] Example 3: This utility model provides a multifunctional flash memory chip test rack, which also includes a squeeze switch 302 electrically connected to the control circuit of the test cylinder 5. The squeeze switch 302 is vertically embedded in the conveyor frame 3 on the left side of the clamping frame 7. The upper end of the squeeze switch 302 has a ball-shaped structure and is exposed on the upper end of the conveyor frame 3. The clamping frame 7 is provided with a clamping electric cylinder 701 tilted towards the test cylinder 5. The tactile switch 604 is electrically connected to the control circuit of the clamping electric cylinder 701. A V-shaped clamping block 702 is fixedly connected to the end of the piston rod of the clamping electric cylinder 701. The movement path of the clamping block 702 passes through the location of the squeeze switch 302. When the clamping electric cylinder 701 pushes the clamping block 702 to move, it squeezes the squeeze switch 302. The squeeze switch 302 controls the test cylinder 5 to work, so that the test probe 501 of the test cylinder 5 tests the flash memory chip on the flash memory chip tray 8. The whole process is efficient, stable and orderly.

[0033] The specific usage and function of this embodiment are as follows:

[0034] During use, the flash memory chip is placed on the flash memory chip tray 8, which is placed on the conveyor belt of the conveyor frame 3. A convex guide plate 301 is horizontally fixed to the upper rear edge of the conveyor frame 3, guiding the flash memory chip tray 8 to move in a specific direction. A rail 601 is vertically fixed to the top plane of the stop frame 6, and a stop block 603 is vertically slidably mounted on the rail 601. A longitudinal stop cylinder 602 is fixedly mounted on the stop frame 6 to the left of the rail 601, with the piston rod end of the stop cylinder 602 fixedly connected to the stop block 603. A tactile switch 604 is embedded in the side wall on the right side of the stop block 603. The stop cylinder 602 moves the stop block 603 onto the conveyor belt of the conveyor frame 3 to stop the flash memory chip tray 8. When the flash memory chip tray 8 contacts the stop block 603 and the tactile switch 604 is pressed, the clamping electric cylinder 701 operates, pushing the clamping block 702 to clamp and fix the flash memory chip tray 8 between the stop block 603 and the guide side plate 301. As the clamping electric cylinder 701 pushes the clamping block 702 to move, it presses the squeeze switch 302. The squeeze switch 302 controls the test cylinder 5 to operate, so that the test probe 501 of the test cylinder 5 tests the flash memory chips on the flash memory chip tray 8. Finally, when the test cylinder 5 moves the test probe 501 down to test the flash memory chips, if a problem is detected in the flash memory chip, the marking cylinder 502 pushes the fluorescent pen 503 to the flash memory chip tray 8 to leave a mark so that the flash memory chip can be removed.

Claims

1. A multi-functional flash memory chip test fixture, characterized by: The system includes a base (1); a support frame (2) is vertically fixed on the top plane of the base (1); a conveyor frame (3) is horizontally installed on the upper end of the support frame (2), and a motor is located at the right end of the conveyor frame (3), with the conveyor belt conveying from right to left; a test stand (4) is vertically fixed on the base (1) behind the support frame (2); a test cylinder (5) is vertically installed on the upper end of the test stand (4); a stop frame (6) is vertically fixed on the conveyor frame (3) to the left of the test cylinder (5); a clamping frame (7) is obliquely installed on the conveyor frame (3) to the right front of the test cylinder (5); a flash memory chip tray (8) is conveyed on the conveyor belt of the conveyor frame (3), and a flash memory chip is held on the flash memory chip tray (8).

2. The multi-functional flash memory chip test fixture of claim 1, wherein: A convex guide plate (301) is horizontally fixed at the rear edge of the upper end of the conveyor frame (3). A squeeze switch (302) is vertically embedded in the conveyor frame (3) on the left side of the clamping frame (7). The upper end of the squeeze switch (302) is a ball-shaped structure, and the upper end of the squeeze switch (302) is exposed on the upper end of the conveyor frame (3).

3. The multi-functional flash memory chip test fixture of claim 2, wherein: A control box (401) is fixedly installed on the test stand (4), and the squeeze switch (302) is electrically connected to the control circuit of the test cylinder (5).

4. The multifunctional flash memory chip test fixture as described in claim 1, characterized in that: The lower end of the piston rod of the test cylinder (5) is fixedly equipped with a test probe (501). A marking cylinder (502) is vertically installed on the right side wall of the test probe (501). A fluorescent pen (503) is vertically installed at the end of the piston rod of the marking cylinder (502). The marking cylinder (502) and the test probe (501) are electrically linked in signal recognition.

5. The multi-functional flash memory chip test fixture of claim 1, wherein: the plurality of test sockets are arranged in a plurality of rows and columns; and the plurality of test sockets are arranged in a plurality of rows and columns in a staggered pattern. 5 A rail (601) is fixedly mounted longitudinally on the top plane of the stop bracket (6). A stop block (603) is slidably mounted longitudinally on the rail (601). A longitudinal stop cylinder (602) is fixedly mounted on the stop bracket (6) on the left side of the rail (601). The piston rod end of the stop cylinder (602) is fixedly connected to the stop block (603). A tactile switch (604) is embedded in the side wall on the right side of the stop block (603). ​ 6. The multi-functional flash memory chip test fixture of claim 2, wherein: The clamping frame (7) is inclined toward the test cylinder (5) and a clamping electric cylinder (701) is provided. The tactile switch (604) is electrically connected to the control circuit of the clamping electric cylinder (701). A V-shaped clamping block (702) is fixedly connected to the end of the piston rod of the clamping electric cylinder (701). The movement path of the clamping block (702) passes through the location of the squeeze switch (302).

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