POGO flip cover with pins convenient to replace

Abstract

The utility model relates to the technical field of electronic connectors, in particular to a POGO flip cover convenient for replacing pins, which comprises a test seat main body, a mounting plate is fixedly mounted in the test seat main body, a placement groove is formed in the top of the mounting plate, a sliding rail is fixedly connected to the bottom of the mounting plate, a sliding strip is slidably connected to the interior of the sliding rail, and the sliding strip is fixedly connected with the test seat main body. A contact groove is formed in the side face of the contact plate, the spring is fixedly connected with the inner wall of the sliding rail, a through hole is formed in the middle of the installation plate, a pin body is installed in the middle of the through hole, a limiting ring is fixedly connected with the outer wall of the pin body, and the limiting ring is matched with the through hole. According to the utility model, the movable plate corresponding to the pin main body is shifted to move towards the outer side, the contact plate moves, the damaged pin main body is taken out, a new pin main body is placed, the movable plate is loosened, and the contact plate moves, so that the pin main body with the design can be independently replaced.

Description

Technical Field

[0001] This utility model relates to the field of electronic connector technology, and in particular to a POGO flip cover that facilitates pin replacement. Background Technology

[0002] POGO flip covers typically consist of an upper flip cover and a lower base, connected by a hinge. This ingenious design, utilizing a linkage-type snap-fit ​​structure, allows for one-handed opening and closing. During testing, it ensures perpendicular contact between the probe and the product, guaranteeing effective conductivity and ensuring test accuracy and stability. As a common electronic connector, POGO flip covers are widely used in various electronic devices.

[0003] As a common type of electronic connector, the existing POGO flip cover suffers from pin damage due to frequent use, leading to poor contact and affecting the accuracy and stability of testing. POGO flip cover pins are usually fixed, so once a pin is damaged, the entire POGO flip cover needs to be repaired or replaced, which not only increases maintenance costs and wastes resources but also causes great inconvenience during use. Therefore, it is necessary to design a POGO flip cover that facilitates pin replacement. Utility Model Content

[0004] The purpose of this invention is to address the problems existing in the background technology by proposing a POGO flip cover that facilitates pin replacement.

[0005] The technical solution of this utility model: A POGO flip cover for easy pin replacement includes a test base body. An installation plate is fixedly installed inside the test base body. A placement groove is formed on the top of the installation plate. A slide rail is fixedly connected to the bottom of the installation plate. A slide bar is slidably connected inside the slide rail. A contact plate is fixedly connected to one side of the slide bar. A contact groove is formed on the side of the contact plate. The top surface of the contact plate is flush with the bottom surface of the installation plate. A spring is fixedly connected to the other side of the slide bar. The spring is fixedly connected to the inner wall of the slide rail. A through hole is formed in the middle of the installation plate. A pin body is installed in the middle of the through hole. A limiting ring is fixedly connected to the outer wall of the pin body. The limiting ring cooperates with the through hole. The outer side of the limiting ring is flush with the bottom surface of the installation plate. The contact groove cooperates with the lower part of the pin body.

[0006] Preferably, a top cover is rotatably mounted on the top of the test seat body, and a protrusion is fixedly connected to the front side of the top cover, the protrusion cooperating with the placement groove.

[0007] Preferably, a buckle is fixedly installed on the upper part of the cover.

[0008] Preferably, a movable plate is fixedly connected to the bottom of the slide bar, and the movable plate is slidably connected to the slide rail.

[0009] Preferably, a wire is fixedly connected to the side of the movable plate, and the wire is fixedly connected to the mounting plate.

[0010] Preferably, the contact plate is slidably connected to the slide rail.

[0011] Preferably, the side fixing block of the test seat body is connected to a plug interface.

[0012] Compared with the prior art, the present invention has the following beneficial technical effects: by moving the movable plate corresponding to the pin body outward, the contact plate moves, the damaged pin body is removed, a new pin body is placed, the movable plate is released, and the contact plate moves. The pin body of this design can be replaced individually, avoiding the problem that if a pin body is damaged, the entire POGO flip cover needs to be repaired or replaced. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0014] Figure 2 This is a schematic diagram of the bottom structure of the mounting plate of this utility model;

[0015] Figure 3 This is a schematic diagram of the side cross-sectional structure of the slide rail of this utility model;

[0016] Figure 4 This is a schematic diagram of the slider structure of this utility model.

[0017] Reference numerals in the attached drawings: 1. Test base body; 101. Top cover; 102. Protrusion; 103. Buckle; 104. Insertion interface; 2. Mounting plate; 201. Placement groove; 3. Slide rail; 301. Slide bar; 302. Moving plate; 303. Wire; 304. Contact plate; 305. Contact groove; 306. Spring; 4. Pin body; 401. Limiting ring. Detailed Implementation

[0018] The technical solution of this utility model will be further described below with reference to the accompanying drawings and specific embodiments.

[0019] Example

[0020] like Figure 1-4As shown, the present invention proposes a POGO flip cover that facilitates pin replacement, including a test socket body 1. The test socket body 1 can test QFN packaged chips to check whether the chips can work normally. The soldering surface of the QFN packaged chip has small contacts around the perimeter and large contacts in the center. The side fixing block of the test socket body 1 is connected to an interface 104, which can be used to insert test wire plugs for testing. An installation plate 2 is fixedly installed inside the test socket body 1. The top of the installation plate 2 has a placement slot 201. The placement slot 201 is square in shape and has the same size as the chip to be tested, so that the chip can be placed in it. The four sides of the placement slot 201 are empty to facilitate chip removal.

[0021] The test base body 1 has a top cover 101 rotatably mounted on its top. The top cover 101 can be opened and closed. A buckle 103 is fixedly mounted on the upper part of the top cover 101. After the top cover 101 is closed, it can be fixed by the buckle 103. A protrusion 102 is fixedly connected to the front side of the top cover 101. The protrusion 102 is square and smaller than the size of the placement groove 201. The protrusion 102 cooperates with the placement groove 201. After the chip is placed into the placement groove 201, the chip is blocked by the placement groove 201 and will not move to the sides. After the top cover 101 is closed, the protrusion 102 corresponds to the chip position and can press the chip down.

[0022] The bottom of the mounting plate 2 is fixedly connected to a slide rail 3. The slide rail 3 is made of insulating material and is non-conductive. There are multiple slide rails 3. Different test socket bodies 1 correspond to different chips, and the number of slide rails 3 varies for different test socket bodies 1. The slide rails 3 on the four sides correspond to the small contacts around the chip, and the slide rails 3 in the four corners correspond to the large contacts in the middle of the chip. The slide rail 3 is slidably connected to a slide bar 301. There are as many slide bars 301 as there are slide rails 3. The slide rail 3 restricts the slide bars 301 so that the slide bars 301 can only slide along the direction of the slide rail 3 and the slide bars 301 will not detach from the slide rail 3. The bottom of the slide bar 301 is fixedly connected to a moving plate 302. The moving plate 302 and the slide bar 301 are a whole and move together. The moving plate 302 is slidably connected to the slide rail 3.

[0023] A wire 303 is fixedly connected to the side of the movable plate 302. Both the movable plate 302 and the slide bar 301 are conductors and can conduct electricity. The wire 303 is fixedly connected to the mounting plate 2. The mounting plate 2 is an insulator as a whole, but wires are installed inside the mounting plate 2. One end of the wire is connected to the wire 303, and the other end is connected to the corresponding position of the plug interface 104. The wires are not shown in the figure. A contact plate 304 is fixedly connected to one side of the slide bar 301. The contact plate 304 is also a conductor and is slidably connected to the slide rail 3. The side of the contact plate 304 has an opening. The contact groove 305 and the slide bar 301 can only slide along the direction of the slide rail 3, so that the contact plate 304 and the contact groove 305 can only slide along the direction of the slide rail 3 and cannot move up and down. The top surface of the contact plate 304 is flush with the bottom surface of the mounting plate 2. When the contact plate 304 moves, it will stick to the bottom surface of the mounting plate 2. A spring 306 is fixedly connected to the other side of the slide bar 301. The spring 306 is fixedly connected to the inner wall of the slide rail 3. The spring 306 can provide elastic force to make the slide bar 301 move, and make the contact plate 304 and the contact groove 305 move.

[0024] The mounting plate 2 has multiple through holes in its center, the specific locations of which are determined by the contact positions of the chip under test. The contact positions and numbers vary depending on the chip model. A pin body 4 is mounted in the center of the through hole. The pin body 4 contains an internal spring mechanism (not shown in the figure). The upper end of the pin body 4 is movable and connects to the contacts of the chip under test. A limit ring 401 is fixedly connected to the outer wall of the pin body 4, engaging with the through hole. The outer surface of the limit ring 401 is flush with the bottom surface of the mounting plate 2. A contact groove 305 engages with the lower part of the pin body 4. The bottom of the test socket body 1 is not closed. The bottom surface of the mounting plate 2 faces... At this point, the pin body 4 cannot move forward, backward, left, or right. The limiting ring 401 and the through hole cooperate, preventing the pin body 4 from moving downward. The contact groove 305 contacts the pin body 4 to conduct electricity. The contact plate 304 blocks the limiting ring 401 from moving upward, preventing the pin body 4 from moving upward. The pin body 4 is fixed. Moving the moving plate 302 outward causes the slider 301 to move and the contact plate 304 to move. The contact groove 305 no longer contacts the pin body 4. At this point, the contact plate 304 no longer blocks the limiting ring 401, and the pin body 4 can move upward. At this point, the damaged pin body 4 can be removed and a new pin body 4 can be placed.

[0025] In this embodiment, the QFN packaged chip to be tested is placed in the placement slot 201 with the solder side facing down at the correct angle. At this time, the pin body 4 will contact the chip's contacts, and testing can be performed. With the bottom surface of the mounting plate 2 facing up, all pin bodies 4 cannot move forward, backward, left, or right. The limiting ring 401 and the through hole cooperate, preventing the pin body 4 from moving downward. The contact plate 304 blocks the limiting ring 401 from moving upward, preventing the pin body 4 from moving upward, thus fixing the pin body 4. When a pin body 4 is damaged, the corresponding moving plate 302 is moved outward, compressing the spring 306 and activating the slider. When 301 moves, contact plate 304 moves, and contact groove 305 no longer contacts pin body 4. At this time, contact plate 304 no longer blocks limit ring 401, and pin body 4 can move upward. Remove the damaged pin body 4, place a new pin body 4, release moving plate 302, spring 306 is released, slide bar 301 moves, contact plate 304 and contact groove 305 move, contact plate 304 blocks limit ring 401 to move upward, and new pin body 4 is fixed. The pin body 4 of this design can be replaced individually, avoiding the problem that if a pin body 4 is damaged, the entire POGO flip cover needs to be repaired or replaced.

[0026] The above-described specific embodiments are merely preferred embodiments of the present invention. Based on the technical solution of the present invention and the relevant teachings of the above embodiments, those skilled in the art can make various alternative improvements and combinations to the above-described specific embodiments.

Claims

1. A POGO flip cover for easy pin replacement, comprising a test socket body (1), characterized in that: An installation plate (2) is fixedly installed inside the main body (1) of the test seat. A placement groove (201) is provided on the top of the installation plate (2). A slide rail (3) is fixedly connected to the bottom of the installation plate (2). A slide bar (301) is slidably connected inside the slide rail (3). A contact plate (304) is fixedly connected to one side of the slide bar (301). A contact groove (305) is provided on the side of the contact plate (304). The top surface of the contact plate (304) is flush with the bottom surface of the installation plate (2). The slide bar (301) is fixedly connected to the bottom of the test seat (1). 1) A spring (306) is fixedly connected to the other side. The spring (306) is fixedly connected to the inner wall of the slide rail (3). A through hole is opened in the middle of the mounting plate (2). A pin body (4) is installed in the middle of the through hole. A limit ring (401) is fixedly connected to the outer wall of the pin body (4). The limit ring (401) cooperates with the through hole. The outer side of the limit ring (401) is flush with the bottom surface of the mounting plate (2). The contact groove (305) cooperates with the lower part of the pin body (4).

2. The POGO flip cover with easily replaceable pins according to claim 1, characterized in that: The test seat body (1) is rotatably mounted with a top cover (101), and a protrusion (102) is fixedly connected to the front side of the top cover (101), which cooperates with the placement groove (201).

3. A POGO flip cover with easily replaceable pins as described in claim 2, characterized in that: The upper part of the cover (101) is fixedly installed with a buckle (103).

4. A POGO flip cover with easily replaceable pins as described in claim 1, characterized in that: The bottom of the slide bar (301) is fixedly connected to a movable plate (302), and the movable plate (302) is slidably connected to the slide rail (3).

5. A POGO flip cover with easily replaceable pins as described in claim 4, characterized in that: A wire (303) is fixedly connected to the side of the movable plate (302), and the wire (303) is fixedly connected to the mounting plate (2).

6. A POGO flip cover with easily replaceable pins as described in claim 1, characterized in that: The contact plate (304) is slidably connected to the slide rail (3).

7. A POGO flip cover with easily replaceable pins as described in claim 1, characterized in that: The test base body (1) has a side fixing block connected to an interface (104).

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