LED support material inspection system

Abstract

The utility model provides an LED support material inspection system, which comprises a falling particle inspection device, the falling particle inspection device comprises a plurality of support columns and a bottom plate, the bottom end of the falling particle inspection device is provided with a falling area, the bottom plate is connected with the plurality of support columns, the bottom plate is used for bearing an LED support plate, the top surface of the bottom plate is abutted against a plurality of grippers, and the grippers are arranged on the bottom surface of the bottom plate. The gripper is detachably connected with the LED support plate, a label group is arranged on the supporting column, the label group is used for marking the height, a recorder is arranged at the top end of the supporting column, the recorder is used for recording pictures of the LED support plate falling into the falling area, and the recorder is in communication connection with an intelligent terminal. Through the arrangement of the drop grain inspection device, the quality of the LED bracket material is inspected, the LED bracket which is unstable in connection and easy to loosen is effectively prevented from flowing into the subsequent device production process, and the damage of processing equipment is prevented.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor technology, and in particular to an LED bracket material inspection system. Background Technology

[0002] With the development of the LED industry, LED devices are being used in increasingly wider fields, and the demand for production is also increasing, leading to higher and higher quality requirements for LED devices.

[0003] In the production process of LED devices, it is usually necessary to cut the entire board material, make pads, make cups, and perform die bonding, so as to make multiple LED brackets on one LED bracket board, and then further make multiple LED devices based on the LED brackets.

[0004] Existing technologies have relatively complete electrical testing methods and standards for LED device quality inspection. However, for materials used in the production of LED devices, there is a lack of fixed inspection procedures, equipment, and standards. Non-standardized sampling inspections of raw materials can easily lead to inconsistent test results, further affecting the judgment of material quality. If, during subsequent LED device processing, the LED bracket becomes loose or detaches from the support plate, it will damage the machine, and even if processing is completed, it can easily result in poor-quality LED devices. Utility Model Content

[0005] In view of the shortcomings of the existing technology, the purpose of this utility model is to provide an LED bracket material inspection system, which aims to solve the problem that there is no fixed inspection method and equipment for materials used in manufacturing LED devices.

[0006] To achieve the above objectives, this utility model is implemented through the following technical solution:

[0007] An LED bracket material inspection system includes a particle dropping inspection device. The particle dropping inspection device includes several support columns and a base plate. A dropping area is set at the bottom of the particle dropping inspection device, and the dropping area is vertically corresponding to the position of the base plate. The base plate is used to support the LED bracket plate. The base plate is detachably connected to several of the support columns so that the LED bracket plate falls into the dropping area. A gripper is slidably connected to the support columns. The top surface of the base plate abuts against several of the grippers. The grippers are detachably connected to the LED bracket plate to fix or release the LED bracket plate. A label group is set on the support columns for marking the height. A recorder is set at the top of the support columns for recording the scene of the LED bracket plate falling into the dropping area. The recorder is communicatively connected to a smart terminal to compare the number of dropped particles with an allowable particle dropping threshold.

[0008] Compared with the prior art, the beneficial effects of this utility model are as follows: By setting the drop test device, a drop test can be performed on the LED bracket plate to check the connection quality between the LED bracket and the bracket frame. This effectively prevents unstable or loose LED brackets from flowing into the subsequent LED device production process, preventing damage to processing equipment. Efficient screening of LED bracket materials helps increase the sampling volume and improve material quality, thereby improving the quality of LED devices. By setting the label group and the recorder, the drop test process is quantified. The quality of the material can be intuitively judged by the number of dropped particles on the LED bracket plate after the drop. Furthermore, the mechanical gripper and the base plate avoid the uncertainty of manual operation and inconsistent test results.

[0009] Furthermore, the base plate is parallel to the horizontal plane, and the support column is perpendicular to the horizontal plane.

[0010] Furthermore, a gripper switch is provided on the support column, and a level sensor is provided on the base plate. The level sensor is used to detect whether the LED support plate is level, and the gripper switch is used to control the gripper to fix or release the LED support plate.

[0011] Furthermore, the label group includes a first label, a second label, a third label, and a fourth label. The distance between the first label and the bottom of the support is 100cm, the distance between the second label and the bottom of the support is 70cm, the distance between the third label and the bottom of the support is 60cm, and the distance between the fourth label and the bottom of the support is 30cm.

[0012] Furthermore, a fixing area is provided on the edge of the base plate, which is used to connect external transmission equipment.

[0013] Furthermore, the top of the support column is connected to the support plate oven via a first conveyor belt, which corresponds to the position of the base plate, so as to transport the LED support plate from the support plate oven to the base plate.

[0014] Furthermore, the drop area is connected to a second conveyor belt, and a support plate storage box is provided at the end of the second conveyor belt facing away from the drop area.

[0015] Furthermore, the support plate oven is connected to a whiteness meter via a third conveyor belt, the whiteness meter is connected to a gloss meter via a fourth conveyor belt, the gloss meter is connected to a film thickness gauge via a fifth conveyor belt, and the film thickness gauge is connected to an AOI inspection device via a track. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the particle dropping inspection device in the LED bracket material inspection system of this utility model embodiment;

[0017] Figure 2 This is a schematic diagram of the LED bracket plate being transported to the base plate in the LED bracket material inspection system of this utility model embodiment;

[0018] Figure 3 This is a schematic diagram of the gripper in the LED bracket material inspection system of this utility model embodiment;

[0019] Figure 4 This is a schematic diagram of the structure of the base plate and fixing area in the LED bracket material inspection system of this utility model embodiment;

[0020] Explanation of key component symbols:

[0021] pillar 100 base plate 110 Level sensor 111 grip 120 support pillar 121 First movable arm 122 Second movable arm 123 Matching Department 124 movable rod 125 First tag 131 Second tag 132 Third label 133 Fourth label 134 recorder 140 gripper switch 150 Drop Zone 160 LED bracket board 200 Fixed area 201 External transmission equipment 202 First conveyor belt 210 Second conveyor belt 220 shelf storage box 230

[0022] The following detailed description, in conjunction with the accompanying drawings, will further illustrate this utility model. Detailed Implementation

[0023] To facilitate understanding of this utility model, a more complete description will be given below with reference to the accompanying drawings. Several embodiments of this utility model are shown in the drawings. However, this utility model can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this utility model will be more thorough and complete.

[0024] It should be noted that when a component is said to be "fixed to" another component, it can be directly on the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0026] Please see Figures 1 to 4The LED bracket material inspection system in this embodiment includes a particle dropping inspection device. The particle dropping inspection device includes several support columns 100 and a base plate 110. A drop area 160 is provided at the bottom of the particle dropping inspection device. The drop area 160 is vertically aligned with the base plate 110. The base plate 110 supports the LED bracket plate 200. Several support columns 100 are detachably connected to the base plate 110 so that the LED bracket plate 200 falls into the drop area 160. The base plate 110 is parallel to the horizontal plane, and the support columns 100 are perpendicular to the horizontal plane. A slidable gripper is connected to each support column 100. A gripper 120 is provided on the top surface of the base plate 110, and several grippers 120 are attached to it. The grippers 120 are detachably connected to the LED bracket plate to fix or release the LED bracket plate 200. A gripper switch 150 is provided on the support column 100. A level sensor 111 is provided on the base plate 110 to detect whether the LED bracket plate 200 is level. The gripper switch 150 is used to control the grippers 120 to fix or release the LED bracket plate 200. A fixing area 201 is provided on the edge of the base plate 110, and the fixing area 201 is used to connect an external transmission device 202. Preferably, the fixing area 201 is a positioning groove opened on the edge of the base plate 110, the external transmission device 202 is a robotic arm with the function of lifting objects, the LED support plate 200 includes a support plate frame and a plurality of LED supports connected to the support plate frame, the number of the support columns 100 is 4, the four corners of the base plate 110 are slidably connected to the four support columns 100 respectively and are detachable, the gripper 120 is a mechanical gripper that can be opened and closed by electrical control, the base plate 110 is driven by the external transmission device 202 to reach a designated height, the base plate 110 is removed, and the LED support plate 200 can be dropped from the designated height by the gripper switch 150, the drop area 160 can be a concrete slab to simulate the effect of the LED support plate 200 falling to the ground. Understandably, mechanical devices can avoid the irregularities and uncertainties of manual operation, greatly improving the reliability of inspection results. The LED bracket plate 200 is inspected by dropping test through the aforementioned chip dropping inspection device, preventing easily loosened and detached LED brackets from flowing into the subsequent LED device processing process and avoiding damage to the machine due to LED bracket detachment.

[0027] Preferably, the gripper 120 includes a stop post 121, a first movable arm 122, a second movable arm 123, and a matching part 124. The support post 100 and the matching part 124 are a matching guide rail and slider. The matching part 124 can slide on the support post 100 and stop at a designated position. The side of the matching part 124 facing the base plate 110 is connected to the stop post 121 and two movable rods 125. The two movable rods 125 are respectively connected to the first movable arm 122 and the second movable arm 123, so that the first movable arm 122 and the second movable arm 123 can move in a direction perpendicular to the base plate 110 and can rotate towards each other to grip the LED bracket plate 200. The movable rods 123 are driven by a motor. It can be understood that each of the support posts... Each column 100 is equipped with the same gripper 120, and the four abutment columns 121 are all of the same length. When the base plate 110 is lifted by an external force, the matching part 123 also rises to the same height as the base plate 110 through the four abutment columns 121. When the LED bracket plate 200 is transported from one side of the base plate 110 to the base plate 110, the first movable arm 122 and the second movable arm 123 are raised in advance to prevent obstruction of the transport path of the LED bracket plate 200. When the LED bracket plate 200 moves into place, the first movable arm 122 and the second movable arm 123 are lowered and abut against the base plate 110. The gripping action is completed by the drive of the movable rod 125 to fix the LED bracket plate.

[0028] A set of labels is provided on the support column 100 to mark the height. The label set includes a first label 131, a second label 132, a third label 133, and a fourth label 134. The distance between the first label 131 and the bottom of the support column 100 is 100cm, the distance between the second label 132 and the bottom of the support column 100 is 70cm, the distance between the third label 133 and the bottom of the support column 100 is 60cm, and the distance between the fourth label 134 and the bottom of the support column 100 is 30cm. Understandably, different drop tests are conducted on LED bracket plates 200 of different models and characteristics, and the LED bracket material inspection system has a certain degree of flexibility and adaptability.

[0029] A recorder 140 is installed at the top of the support column 100. The recorder 140 records the LED bracket plate 200 falling into the drop area 160. The recorder 140 is communicatively connected to a smart terminal to compare the number of fallen LEDs with the allowable drop threshold. Preferably, the recorder 140 uses a camera, combined with an image recognition program in the smart terminal, to perform efficient and standardized inspection of the drop results. By quantifying the drop results and comparing them with the allowable drop threshold, the inspection of the LED bracket material becomes quantitatively standardized.

[0030] The top of the particle dropping inspection device is connected to the support plate oven via a first conveyor belt 210, which corresponds to the position of the base plate 110, so as to transport the LED support plate 200 from the support plate oven to the base plate 110. The dropping area 160 is connected to a second conveyor belt 220. A support plate storage box 230 is provided at the end of the second conveyor belt 200 facing away from the dropping area 160. The support plate oven is connected to a whiteness meter via a third conveyor belt. The whiteness meter is connected to a gloss meter via a fourth conveyor belt. The gloss meter is connected to a film thickness gauge via a fifth conveyor belt. The film thickness gauge is connected to an AOI inspection device via a track. Preferably, the baking temperature of the LED support plate 200 in the support plate oven is 180°C, and the baking time is 3 hours. The first conveyor belt 210 transports the baked LED support plate to the base plate 110. The LED brackets on the LED support plate 200 are located on the side of the LED support plate 200 facing away from the base plate 110. The whiteness meter is used to test the whiteness of the LED bracket plastic. The gloss meter is used to test the reflectivity of the bottom of the LED bracket cup. The reflectivity is affected by factors such as the flatness of the silver layer, the presence or absence of color change, the flatness of the plastic, and the depth of the cup. The film thickness tester is used to test the thickness of the coating on the surface of the LED bracket, specifically testing the coating thickness of the four corners and the middle area of ​​the LED support plate 200. The support plate storage box 230 facilitates the operator to transfer the LED support plate 200. The LED support plate 200 that has passed the drop test is transported to the breaking force tester to test the torsional resistance of the LED bracket. Understandably, the LED bracket material inspection system can inspect multiple indicators of LED bracket materials, and can conduct large-scale sampling inspections of LED bracket materials in a standardized and efficient manner, which is beneficial to improving the quality of LED devices and preventing process abnormalities caused by poor quality LED bracket materials.

[0031] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0032] The embodiments described above are merely illustrative of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of this utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. An LED bracket material inspection system, characterized in that, The device includes a chip drop inspection device, which comprises several support columns and a base plate. A drop zone is provided at the bottom of the device, vertically corresponding to the position of the base plate. The base plate supports an LED bracket plate. Several support columns are detachably connected to the base plate to allow the LED bracket plate to drop into the drop zone. Handles are slidably connected to the support columns, and the top surface of the base plate abuts against several handles. The handles are detachably connected to the LED bracket plate to fix or release it. Label sets are provided on the support columns to mark the height. A recorder is provided at the top of the support columns to record the LED bracket plate falling into the drop zone. The recorder is communicatively connected to a smart terminal to compare the number of dropped chips with an allowable chip drop threshold.

2. The LED bracket material inspection system according to claim 1, characterized in that, The base plate is parallel to the horizontal plane, and the support column is perpendicular to the horizontal plane.

3. The LED bracket material inspection system according to claim 1, characterized in that, A gripper switch is installed on the support column, and a level sensor is installed on the base plate. The level sensor is used to detect whether the LED support plate is level, and the gripper switch is used to control the gripper to fix or release the LED support plate.

4. The LED bracket material inspection system according to claim 1, characterized in that, The label group includes a first label, a second label, a third label, and a fourth label. The first label is 100cm away from the bottom of the support column, the second label is 70cm away from the bottom of the support column, the third label is 60cm away from the bottom of the support column, and the fourth label is 30cm away from the bottom of the support column.

5. The LED bracket material inspection system according to claim 1, characterized in that, The base plate has a fixing area on its edge, which is used to connect external transmission equipment.

6. The LED bracket material inspection system according to claim 1, characterized in that, The top of the support column is connected to the support plate oven via a first conveyor belt, which is positioned corresponding to the base plate to transport the LED support plate from the support plate oven to the base plate.

7. The LED bracket material inspection system according to claim 1, characterized in that, The drop zone is connected to a second conveyor belt, and a support plate storage box is provided at the end of the second conveyor belt facing away from the drop zone.

8. The LED bracket material inspection system according to claim 6, characterized in that, The support plate oven is connected to a whiteness meter via a third conveyor belt, the whiteness meter is connected to a gloss meter via a fourth conveyor belt, the gloss meter is connected to a film thickness gauge via a fifth conveyor belt, and the film thickness gauge is connected to an AOI inspection device via a track.

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