Nonlinear resistance tester with temperature and humidity detection function

Abstract

The utility model discloses a nonlinear resistance tester with a temperature and humidity detection function, relates to the technical field of resistance testing, and discloses a nonlinear resistance tester with a temperature and humidity detection function, which comprises a temperature and humidity detection module, an acquisition switch, an upper computer and a resistance testing module, the temperature and humidity detection module comprises a comparison unit, and a temperature gear selection unit, a humidity gear selection unit, a temperature detection unit, a humidity detection unit and a trigger unit which are connected with the comparison unit; the trigger unit is also connected with the acquisition switch, the acquisition switch is respectively connected with the upper computer, the resistor to be tested and the resistor test module, and the resistor test module is also connected with the resistor to be tested. According to the application, the temperature and humidity detection module is integrated, so that the nonlinear resistance tester can monitor environmental temperature and humidity changes during testing, the influence of the temperature and humidity changes on resistance characteristic measurement is avoided, and the accuracy and reliability of a test result are improved.

Description

Technical Field

[0001] This application relates to the field of resistance testing technology, and in particular to a nonlinear resistance tester with temperature and humidity detection function. Background Technology

[0002] A nonlinear resistance tester is a device specifically designed to evaluate the resistance characteristics of nonlinear resistive elements under varying voltage or current. It analyzes and judges the performance of the nonlinear resistor by applying different voltage or current signals and measuring the corresponding resistance values ​​in real time. In the resistance testing process, nonlinear resistance testers and related testing devices play a crucial role in accurately capturing and evaluating the nonlinear characteristics of resistive elements.

[0003] Traditional nonlinear resistance testers only measure a single electrical quantity. In reality, temperature and humidity have a significant impact on the electrical parameters of nonlinear resistors. For example, widely used silicon carbide (SiC) and zinc oxide (ZnO) nonlinear resistors have a negative humidity coefficient, meaning that within a certain humidity range, the resistance decreases as humidity increases. Therefore, when testing nonlinear resistors, it is necessary to consider changes in ambient temperature and humidity to ensure the accuracy of the test results. Utility Model Content

[0004] The main purpose of this application is to provide a nonlinear resistance tester with temperature and humidity detection function, which aims to solve the technical problem that the lack of temperature and humidity detection means in traditional nonlinear resistance testers affects the accuracy of test results.

[0005] To achieve the above objectives, this application proposes a nonlinear resistance tester with temperature and humidity detection function, comprising a temperature and humidity detection module, a data acquisition switch, a host computer, and a resistance testing module, wherein...

[0006] The temperature and humidity detection module includes a comparison unit and a temperature range selection unit, a humidity range selection unit, a temperature detection unit, a humidity detection unit, and a trigger unit connected to the comparison unit;

[0007] The trigger unit is also connected to the acquisition switch, which is connected to the host computer, the resistor under test, and the resistance test module. The resistance test module is also connected to the resistor under test.

[0008] In one embodiment, the comparison unit includes a temperature comparison unit and a humidity comparison unit, both of which are connected to the trigger unit.

[0009] The temperature comparison unit is also connected to the temperature detection unit and the temperature range selection unit, respectively;

[0010] The humidity comparison unit is also connected to the humidity detection unit and the humidity level selection unit.

[0011] In one embodiment, the temperature setting selection unit includes a temperature range selection component, a temperature upper limit adjustment component, and a temperature lower limit adjustment component; the humidity setting selection unit includes a humidity range selection component, a humidity upper limit adjustment component, and a humidity lower limit adjustment component, wherein...

[0012] The temperature range selection component is connected to the upper temperature limit adjustment component and the lower temperature limit adjustment component, respectively. The upper temperature limit adjustment component and the lower temperature limit adjustment component are also connected to the temperature comparison unit.

[0013] The humidity range selection component is connected to the upper humidity limit adjustment component and the lower humidity limit adjustment component, respectively. The upper humidity limit adjustment component and the lower humidity limit adjustment component are also connected to the humidity comparison unit.

[0014] In one embodiment, the temperature comparison unit includes an upper temperature limit comparator, a lower temperature limit comparator, a first diode, a second diode, a first resistor, a second resistor, and a first Zener diode, wherein,

[0015] The first input terminal of the upper temperature limit comparator is connected to the upper temperature limit adjustment component, the second input terminal of the upper temperature limit comparator is connected to the temperature detection unit, the output terminal of the upper temperature limit comparator is connected to the anode of the first diode, the cathode of the first diode is connected to one end of the first resistor, the other end of the first resistor is connected to one end of the second resistor, the cathode of the first Zener diode and the trigger unit respectively, and the other end of the second resistor and the anode of the first Zener diode are grounded.

[0016] The first input terminal of the lower limit comparator is connected to the lower limit adjustment component, the second input terminal of the lower limit comparator is connected to the temperature detection unit, the output terminal of the lower limit comparator is connected to the anode of the second diode, and the cathode of the second diode is connected to one end of the first resistor.

[0017] In one embodiment, the humidity comparison unit includes a humidity upper limit comparator, a humidity lower limit comparator, a third diode, a fourth diode, a third resistor, a fourth resistor, and a second Zener diode, wherein...

[0018] The first input terminal of the humidity upper limit comparator is connected to the humidity upper limit adjustment component, the second input terminal of the humidity upper limit comparator is connected to the humidity detection unit, the output terminal of the humidity upper limit comparator is connected to the anode of the third diode, the cathode of the third diode is connected to one end of the third resistor, the other end of the third resistor is connected to one end of the fourth resistor, the cathode of the second Zener diode and the trigger unit respectively, and the other end of the fourth resistor and the anode of the second Zener diode are grounded.

[0019] The first input terminal of the humidity lower limit comparator is connected to the humidity lower limit adjustment component, the second input terminal of the humidity lower limit comparator is connected to the humidity detection unit, the output terminal of the humidity lower limit comparator is connected to the anode of the fourth diode, and the cathode of the fourth diode is connected to one end of the first resistor.

[0020] In one embodiment, the triggering unit includes an XNOR gate logic component, wherein,

[0021] The first input port of the XNOR gate logic component is connected to the cathode of the first Zener diode, the second input port of the XNOR gate logic component is connected to the cathode of the second Zener diode, and the output terminal of the XNOR gate logic component is connected to the sampling switch.

[0022] In one embodiment, the acquisition switch includes a voltage sampling control switch and a current sampling control switch, wherein,

[0023] The control terminal of the voltage sampling control switch is connected to the trigger unit, the input terminal of the voltage sampling control switch is connected to the resistor under test through the voltage sampling module, and the output terminal of the voltage sampling control switch is connected to the host computer.

[0024] The control terminal of the current sampling control switch is connected to the trigger unit, the input terminal of the current sampling control switch is connected to the resistor under test through the current sampling module, and the output terminal of the current sampling control switch is connected to the host computer.

[0025] In one embodiment, the voltage sampling control switch includes a first switching transistor, the current sampling control switch includes a second switching transistor, the control terminal of the first switching transistor is connected to the output terminal of the XOR gate logic component, the input terminal of the first switching transistor is connected to the resistor under test through the voltage sampling module, and the output terminal of the first switching transistor is connected to the host computer.

[0026] The control terminal of the second switch is connected to the output terminal of the XOR gate logic component, the input terminal of the second switch is connected to the resistor under test through the current sampling module, and the output terminal of the second switch is connected to the host computer.

[0027] In one embodiment, the resistor to be measured is a varistor.

[0028] One or more technical solutions proposed in this application have at least the following technical effects:

[0029] This application proposes a nonlinear resistance tester with temperature and humidity detection function. By integrating a temperature and humidity detection module, the nonlinear resistance tester can monitor changes in ambient temperature and humidity in real time during testing. A comparison unit determines whether changes in temperature and humidity affect the resistance characteristic analysis, and a trigger unit controls the acquisition switch state to ensure that resistance testing is carried out under suitable temperature and humidity conditions. This avoids the influence of temperature and humidity changes on resistance characteristic measurement, improves the accuracy and reliability of test results, and provides accurate parameter references for subsequent data analysis. Attached Figure Description

[0030] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0031] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, those skilled in the art can obtain other drawings based on these drawings without creative effort.

[0032] Figure 1 This is a schematic diagram of the module connection of a nonlinear resistance tester with temperature and humidity detection function in related technologies.

[0033] Figure 2 This is a module connection structure diagram of one embodiment of the nonlinear resistance tester with temperature and humidity detection function of this application.

[0034] Figure 3 This is a circuit connection diagram of one embodiment of the nonlinear resistance tester with temperature and humidity detection function of this application.

[0035] The purpose, features, and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0036] It should be understood that the specific embodiments described herein are merely illustrative of the technical solutions of this application and are not intended to limit this application.

[0037] To better understand the technical solution of this application, a detailed description will be provided below in conjunction with the accompanying drawings and specific implementation methods.

[0038] The main solution of this application embodiment is that the temperature and humidity of the test environment are detected by the temperature and humidity detection module, and the voltage and current acquisition of the resistor under test are selectively controlled according to the changes in the ambient temperature and humidity and the selection of the temperature and humidity range.

[0039] Temperature and humidity significantly affect the electrical parameters of nonlinear resistors. For example, widely used silicon carbide (SiC) and zinc oxide (ZnO) nonlinear resistors exhibit negative humidity coefficients, meaning that within a certain humidity range, resistance decreases as humidity increases. Therefore, changes in ambient temperature and humidity must be considered during nonlinear resistor testing to ensure accurate results. In fact, evaluating the electrical parameters of nonlinear resistors is only meaningful under identical temperature and humidity conditions. This application addresses the unstable temperature and humidity variations in the testing environment by measuring ambient temperature and humidity data and controlling the electrical parameters to meet specific requirements for output, thereby improving the accuracy of nonlinear resistance characteristic assessment.

[0040] To better understand the above technical solutions, this application provides a nonlinear resistance tester with temperature and humidity detection function, referring to... Figure 1 , Figure 1 This is a schematic diagram of the module connection of the first embodiment of the nonlinear resistance tester with temperature and humidity detection function of this application.

[0041] In this embodiment, the resistor under test is a varistor. The nonlinear resistance tester with temperature and humidity detection function includes a temperature and humidity detection module, a data acquisition switch, a host computer, and a resistance testing module. The temperature and humidity detection module includes a comparison unit and a temperature range selection unit, a humidity range selection unit, a temperature detection unit, a humidity detection unit, and a trigger unit connected to the comparison unit. The trigger unit is also connected to the data acquisition switch, which is connected to the host computer, the resistor under test, and the resistance testing module. The resistance testing module is also connected to the resistor under test.

[0042] Specifically, the temperature and humidity detection module is used to detect and compare the ambient temperature and humidity. The temperature range selection unit outputs the standard temperature signal corresponding to the currently selected range, and the humidity range selection unit outputs the standard humidity signal corresponding to the currently selected range. The comparison unit compares the standard temperature signal with the temperature signal detected by the temperature detection unit and outputs the temperature comparison result to the trigger unit. Similarly, the comparison unit compares the standard humidity signal with the humidity signal detected by the humidity detection unit and outputs the humidity comparison result to the trigger unit. The trigger unit outputs an acquisition control signal to the acquisition switch based on the temperature and humidity comparison results. The acquisition switch controls the connection between the host computer and the resistor under test based on the acquisition control signal. The resistance testing module tests the terminal voltage and current flowing through the resistor under test. The host computer can acquire the voltage applied to the resistor under test and the current flowing through it through the voltage sampling module and current sampling module, and then calculate the resistance value of the resistor under test under the current voltage and current conditions to analyze the nonlinear characteristics of the resistor under test.

[0043] It is understandable that the trigger unit can control the state of the acquisition switch based on the output of the comparison unit, thereby affecting the upper computer's acquisition of voltage and current of the resistor under test.

[0044] In one example, if the current test temperature or humidity environment is inconsistent with the standard temperature signal or standard humidity signal corresponding to the current setting of the temperature or humidity setting selection unit, the unit is triggered to control the acquisition switch to turn off, thereby eliminating the need for the host computer to acquire the voltage and current of the resistor under test in the current temperature and humidity environment to avoid the impact of these data on the accuracy of subsequent nonlinear characteristic analysis.

[0045] In another example, if the current test temperature or humidity environment is inconsistent with the standard temperature signal or standard humidity signal corresponding to the current setting of the temperature or humidity setting selection unit, the unit is triggered to control the acquisition switch to switch the acquisition channel. This allows the host computer to classify and store the voltage and current of the resistor under test in the current temperature and humidity environment according to the channel change result, so as to avoid the impact of these data on the accuracy of subsequent nonlinear characteristic analysis.

[0046] Furthermore, refer to Figure 2 , Figure 2 A module connection diagram of one embodiment of a nonlinear resistance tester with temperature and humidity detection function is shown.

[0047] like Figure 2 As shown, in a feasible embodiment, the comparison unit includes a temperature comparison unit and a humidity comparison unit, both of which are connected to the trigger unit. The temperature comparison unit is also connected to a temperature detection unit and a temperature range selection unit, respectively; the humidity comparison unit is also connected to a humidity detection unit and a humidity range selection unit, respectively. The temperature range selection unit includes a temperature range selection component, a temperature upper limit adjustment component, and a temperature lower limit adjustment component. The humidity range selection unit includes a humidity range selection component, a humidity upper limit adjustment component, and a humidity lower limit adjustment component, respectively. The temperature range selection component is connected to the temperature upper limit adjustment component and the temperature lower limit adjustment component, respectively, and both are also connected to the temperature comparison unit. The humidity range selection component is connected to the humidity upper limit adjustment component and the humidity lower limit adjustment component, respectively, and both are also connected to the humidity comparison unit.

[0048] It is easy to understand that the humidity range selection unit is used to make coarse adjustments to the humidity range, while the upper and lower humidity limit adjustment units are used to make fine adjustments to the upper and lower humidity limits. Similarly, the temperature range selection unit is used to make coarse adjustments to the temperature range, while the upper and lower temperature limit adjustment units are used to make fine adjustments to the upper and lower temperature limits.

[0049] The temperature comparison unit is used to confirm whether the temperature signal to be compared is within the temperature range specified by the upper and lower temperature limits, and outputs the temperature comparison result to the trigger unit. The humidity comparison unit is used to confirm whether the humidity signal to be compared is within the humidity range specified by the upper and lower humidity limits, and outputs the humidity comparison result to the trigger unit. The trigger unit controls the acquisition switch state according to the temperature comparison result and the humidity comparison result.

[0050] In one example, if the temperature signal to be compared is between the upper temperature limit and the lower temperature limit, and the humidity signal to be compared is between the upper humidity limit and the lower humidity limit, the trigger unit controls the acquisition switch to turn on; otherwise, it controls the acquisition switch to turn off.

[0051] In one feasible implementation, the acquisition switch includes a voltage sampling control switch and a current sampling control switch, wherein,

[0052] The control terminal of the voltage sampling control switch is connected to the trigger unit, the input terminal of the voltage sampling control switch is connected to the resistor under test through the voltage sampling module, and the output terminal of the voltage sampling control switch is connected to the host computer.

[0053] The control terminal of the current sampling control switch is connected to the trigger unit, the input terminal of the current sampling control switch is connected to the resistor under test through the current sampling module, and the output terminal of the current sampling control switch is connected to the host computer.

[0054] It is easy to understand that the voltage sampling control switch is used to affect the voltage sampling results of the host computer, and the current sampling control switch is used to affect the current sampling results of the host computer.

[0055] In another feasible implementation, refer to Figure 3 , Figure 3 A circuit connection diagram of one embodiment of a nonlinear resistance tester with temperature and humidity detection function is shown.

[0056] like Figure 3As shown, the temperature comparison unit includes a temperature upper limit comparator U1, a temperature lower limit comparator U2, a first diode D1, a second diode D2, a first resistor R1, a second resistor R2, and a first Zener diode DZ1. The first input terminal (-) of the temperature upper limit comparator U1 is connected to the temperature upper limit adjustment component K2, the second input terminal (+) of the temperature upper limit comparator U1 is connected to the temperature detection unit G1, the output terminal of the temperature upper limit comparator U1 is connected to the anode of the first diode D1, the cathode of the first diode D1 is connected to one end of the first resistor R1, the other end of the first resistor R1 is connected to one end of the second resistor R2, the cathode of the first Zener diode DZ1, and the trigger unit, and the other end of the second resistor R2 and the anode of the first Zener diode are grounded. The first input terminal (+) of the temperature lower limit comparator U2 is connected to the temperature lower limit adjustment component K3, the second input terminal (-) of the temperature lower limit comparator U2 is connected to the temperature detection unit G1, the output terminal of the temperature lower limit comparator U2 is connected to the anode of the second diode D2, and the cathode of the second diode D2 is connected to one end of the first resistor R1.

[0057] The humidity comparison unit includes a humidity upper limit comparator U3, a humidity lower limit comparator U4, a third diode D3, a fourth diode D4, a third resistor R3, a fourth resistor R4, and a second Zener diode DZ2. The first input terminal (-) of the humidity upper limit comparator U3 is connected to the humidity upper limit adjustment component K5, the second input terminal (+) of the humidity upper limit comparator U3 is connected to the humidity detection unit G2, the output terminal of the humidity upper limit comparator U3 is connected to the anode of the third diode D3, the cathode of the third diode D3 is connected to one end of the third resistor R3, the other end of the third resistor R3 is connected to one end of the fourth resistor R4, the cathode of the second Zener diode DZ2, and the trigger unit, and the other end of the fourth resistor R4 and the anode of the second Zener diode DZ2 are grounded. The first input terminal (+) of the humidity lower limit comparator U4 is connected to the humidity lower limit adjustment component K6, the second input terminal (-) of the humidity lower limit comparator U4 is connected to the humidity detection unit G2, the output terminal of the humidity lower limit comparator U4 is connected to the anode of the fourth diode D4, and the cathode of the fourth diode D4 is connected to one end of the first resistor R1.

[0058] The triggering unit includes an NOR gate logic component, wherein the first input port of the NOR gate logic component is connected to the cathode of the first Zener diode DZ1, the second input port of the NOR gate logic component is connected to the cathode of the second Zener diode DZ2, and the output terminal of the NOR gate logic component is connected to a sampling switch.

[0059] The voltage sampling control switch includes a first switching transistor Q1, and the current sampling control switch includes a second switching transistor Q2. The control terminal of the first switching transistor Q1 is connected to the output terminal of the NOR gate logic component. The input terminal of the first switching transistor Q1 is connected to the resistor under test through the voltage sampling module. The output terminal of the first switching transistor Q1 is connected to the host computer.

[0060] The control terminal of the second switch Q2 is connected to the output terminal of the NOR gate logic component. The input terminal of the second switch Q2 is connected to the resistor under test through the current sampling module. The output terminal of the second switch Q2 is connected to the host computer.

[0061] Specifically, in this embodiment, the range adjustment of the standard temperature upper and lower limits is achieved by adjusting the resistance values ​​of the temperature range selection component K1, the upper temperature limit adjustment component K2, and the lower temperature limit adjustment component K3. The range adjustment of the standard temperature upper and lower limits is achieved by adjusting the resistance values ​​of the humidity range selection component K4, the upper humidity limit adjustment component K5, and the lower humidity limit adjustment component K6.

[0062] The temperature and humidity comparison units employ a window comparator design. The input temperature and humidity signals to be compared, as well as the standard temperature and humidity signals, are both voltage signals. When the temperature signal to be compared is between the upper and lower temperature limits, the cathode of the first Zener diode DZ1 is at a low potential; otherwise, it outputs a high level. When the humidity signal to be compared is between the upper and lower humidity limits, the cathode of the second Zener diode DZ2 is at a low potential; otherwise, it is at a high potential. When both the cathodes of the first Zener diode DZ1 and the second Zener diode DZ2 are at low potentials, the output of the NOR gate logic component is high, causing the first switch Q1 and the second switch Q2 to conduct. At this point, it indicates that the current ambient temperature meets the testing requirements. The voltage and current sampling data are acquired by the host computer for subsequent analysis.

[0063] To aid in understanding the nonlinear resistance tester with temperature and humidity detection function obtained in this embodiment, a specific example is provided for illustration:

[0064] When measuring the resistance characteristics of a nonlinear resistor, this nonlinear resistance tester is used to accurately measure a varistor. Before testing, the temperature and humidity range for the varistor test is selected using the temperature and humidity selection units. The temperature and humidity detection module then monitors the laboratory environment, comparing the collected actual temperature and humidity values ​​with preset standard temperature and humidity signals. When the detected environmental temperature and humidity parameters are within the set range, the trigger unit controls the acquisition switch to close, allowing the host computer to simultaneously acquire the voltage and current data across the varistor and calculate the accurate resistance value. If the environmental temperature and humidity deviate from the set range, the acquisition switch automatically disconnects or switches channels to prevent substandard data from being included in the test results, thus ensuring the accuracy and reliability of the test results. It is understandable that this example improves the accuracy of the test results by selecting appropriate data (removing abnormal environmental data and retaining data from normal ambient temperature and humidity conditions). Compared to the approach of controlling changes in ambient temperature, this method is less complex and, combined with external environmental control, can further eliminate abnormal data, avoiding the impact of changes in ambient temperature and humidity on the accuracy of nonlinear resistance characteristic assessment. In summary, this solution helps reduce the workload of staff in data screening, and improves work efficiency and data collection accuracy.

[0065] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

[0066] The above are only some embodiments of this application and do not limit the patent scope of this application. All equivalent structural transformations made under the technical concept of this application and using the contents of the specification and drawings of this application, or direct / indirect applications in other related technical fields, are included in the patent protection scope of this application.

Claims

1. A nonlinear resistance tester with temperature and humidity detection function, characterized in that, It includes a temperature and humidity detection module, a data acquisition switch, a host computer, and a resistance testing module. The temperature and humidity detection module includes a comparison unit and a temperature setting selection unit, a humidity setting selection unit, a temperature detection unit, a humidity detection unit, and a trigger unit connected to the comparison unit; The triggering unit is also connected to the acquisition switch, which is connected to the host computer, the resistor under test, and the resistance testing module. The resistance testing module is also connected to the resistor under test.

2. The nonlinear resistance tester with temperature and humidity detection function as described in claim 1, characterized in that, The comparison unit includes a temperature comparison unit and a humidity comparison unit, both of which are connected to the trigger unit. The temperature comparison unit is also connected to the temperature detection unit and the temperature range selection unit respectively; The humidity comparison unit is also connected to the humidity detection unit and the humidity level selection unit.

3. The nonlinear resistance tester with temperature and humidity detection function as described in claim 2, characterized in that, The temperature setting selection unit includes a temperature range selection component, a temperature upper limit adjustment component, and a temperature lower limit adjustment component; the humidity setting selection unit includes a humidity range selection component, a humidity upper limit adjustment component, and a humidity lower limit adjustment component. The temperature range selection component is connected to the upper temperature limit adjustment component and the lower temperature limit adjustment component, respectively. The upper temperature limit adjustment component and the lower temperature limit adjustment component are also connected to the temperature comparison unit. The humidity range selection component is connected to the upper humidity limit adjustment component and the lower humidity limit adjustment component, respectively. The upper humidity limit adjustment component and the lower humidity limit adjustment component are also connected to the humidity comparison unit.

4. The nonlinear resistance tester with temperature and humidity detection function as described in claim 3, characterized in that, The temperature comparison unit includes an upper temperature comparator, a lower temperature comparator, a first diode, a second diode, a first resistor, a second resistor, and a first Zener diode. The first input terminal of the upper temperature limit comparator is connected to the upper temperature limit adjustment component, the second input terminal of the upper temperature limit comparator is connected to the temperature detection unit, the output terminal of the upper temperature limit comparator is connected to the anode of the first diode, the cathode of the first diode is connected to one end of the first resistor, the other end of the first resistor is connected to one end of the second resistor, the cathode of the first Zener diode and the trigger unit, and the other end of the second resistor and the anode of the first Zener diode are grounded. The first input terminal of the lower temperature limit comparator is connected to the lower temperature limit adjustment component, the second input terminal of the lower temperature limit comparator is connected to the temperature detection unit, the output terminal of the lower temperature limit comparator is connected to the anode of the second diode, and the cathode of the second diode is connected to one end of the first resistor.

5. The nonlinear resistance tester with temperature and humidity detection function as described in claim 4, characterized in that, The humidity comparison unit includes a humidity upper limit comparator, a humidity lower limit comparator, a third diode, a fourth diode, a third resistor, a fourth resistor, and a second Zener diode. The first input terminal of the humidity upper limit comparator is connected to the humidity upper limit adjustment component, the second input terminal of the humidity upper limit comparator is connected to the humidity detection unit, the output terminal of the humidity upper limit comparator is connected to the anode of the third diode, the cathode of the third diode is connected to one end of the third resistor, the other end of the three resistors is connected to one end of the fourth resistor, the cathode of the second Zener diode and the trigger unit respectively, and the other end of the fourth resistor and the anode of the second Zener diode are grounded. The first input terminal of the humidity lower limit comparator is connected to the humidity lower limit adjustment component, the second input terminal of the humidity lower limit comparator is connected to the humidity detection unit, the output terminal of the humidity lower limit comparator is connected to the anode of the fourth diode, and the cathode of the fourth diode is connected to one end of the first resistor.

6. The nonlinear resistance tester with temperature and humidity detection function as described in claim 5, characterized in that, The triggering unit includes an XNOR gate logic component, wherein... The first input port of the XNOR gate logic component is connected to the cathode of the first Zener diode, the second input port of the XNOR gate logic component is connected to the cathode of the second Zener diode, and the output terminal of the XNOR gate logic component is connected to the acquisition switch.

7. The nonlinear resistance tester with temperature and humidity detection function as described in claim 6, characterized in that, The data acquisition switch includes a voltage sampling control switch and a current sampling control switch, wherein... The control terminal of the voltage sampling control switch is connected to the trigger unit, the input terminal of the voltage sampling control switch is connected to the resistor under test through the voltage sampling module, and the output terminal of the voltage sampling control switch is connected to the host computer. The control terminal of the current sampling control switch is connected to the trigger unit, the input terminal of the current sampling control switch is connected to the resistor under test through the current sampling module, and the output terminal of the current sampling control switch is connected to the host computer.

8. The nonlinear resistance tester with temperature and humidity detection function as described in claim 7, characterized in that, The voltage sampling control switch includes a first switching transistor, and the current sampling control switch includes a second switching transistor. The control terminal of the first switching transistor is connected to the output terminal of the XOR gate logic component. The input terminal of the first switching transistor is connected to the resistor under test through a voltage sampling module. The output terminal of the first switching transistor is connected to the host computer. The control terminal of the second switch is connected to the output terminal of the XOR gate logic component, the input terminal of the second switch is connected to the resistor under test through a current sampling module, and the output terminal of the second switch is connected to the host computer.

9. The nonlinear resistance tester with temperature and humidity detection function as described in any one of claims 1-8, characterized in that, The resistor to be tested is a varistor.

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