Flying probe testing machine

Abstract

The utility model discloses a flying probe testing machine, which relates to the field of flying probe testing and comprises a support frame, an upper cross beam, a lower cross beam, a mounting plate, a flying probe testing mechanism and a workbench used for fixing a plate to be tested, the flying probe testing mechanism and the workbench are sequentially arranged along the horizontal direction, and the upper cross beam, the mounting plate and the lower cross beam are arranged along the gravity direction. The workbench is embedded in the center of the mounting plate, the upper end and the lower end of the flying probe testing mechanism are arranged on the upper cross beam and the lower cross beam respectively, the upper cross beam and the lower cross beam are arranged at the upper end and the lower end of the supporting frame respectively, and the mounting plate is parallel to the gravity direction and detachably arranged in the center of the supporting frame. The mounting plate is made of marble, and the cross beam and the supporting frame are high in strength and heavy in weight, so that shaking of the mounting plate in the inserting groove is reduced. When circuit boards of different specifications need to be tested, the original mounting plate is dismounted, the workbench and the testing mechanism are adjusted, and then the mounting plate is mounted back to the supporting frame, so that the time required for replacement can be shortened.

Description

Technical Field

[0001] This utility model relates to the field of flying probe testing, and in particular to a flying probe testing machine. Background Technology

[0002] Flying probe testers are devices used to test the quality of circuit boards. The fixture plate of a flying probe tester has a positioning mechanism and a testing mechanism. The circuit board is mounted on the positioning mechanism, and the testing mechanism performs contact testing on the solder joints of the circuit board. When testing different types of circuit boards, different positioning mechanisms and test probes need to be changed. However, on common flying probe testers, the small distance between the test probes and the fixture results in limited operating space, making it difficult to remove the fixture and test probes. Generally, the fixture is first removed from the mounting plate, then the positioning mechanism on the fixture is removed, and then a suitable positioning mechanism is selected and installed according to the different types of circuit boards. Current flying probe testers involve multiple steps in disassembling the fixture and test probes, resulting in a long replacement time.

[0003] Therefore, this utility model provides a flying probe testing machine to solve the problems mentioned in the background art. Utility Model Content

[0004] To achieve the above objectives, this utility model adopts the following technical solution: a flying probe tester, comprising: a support frame, an upper crossbeam, a lower crossbeam, a mounting plate, a flying probe testing mechanism, and a worktable for fixing the board under test. The flying probe testing mechanism and the worktable are arranged sequentially along the horizontal direction. The upper crossbeam, mounting plate, and lower crossbeam are arranged along the direction of gravity. The worktable is embedded in the center of the mounting plate. The upper and lower ends of the flying probe testing mechanism are respectively located on the upper and lower crossbeams. The upper and lower crossbeams are respectively located on the upper and lower ends of the support frame. The mounting plate is parallel to the direction of gravity and is detachably mounted in the center of the support frame along the direction of gravity, allowing for removal and replacement of the mounting plate from the support frame. The board under test is vertically fixed on the worktable. The test probe moves horizontally and contacts the contacts on the board under test for testing. Because the board under test is vertically fixed, it is possible to test circuit boards of excessive size, avoiding the limitation imposed by a horizontally placed worktable on the specifications of the board under test.

[0005] Preferably, the support frame includes two symmetrically arranged support plates. The two ends of the mounting plate are detachably disposed at the center of the two support plates. The two ends of the upper crossbeam are detachably disposed at the upper ends of the two support plates. The two ends of the lower crossbeam are detachably disposed at the lower ends of the two support plates, so as to remove and replace the mounting plate between the two support plates.

[0006] Preferably, the upper end of the support plate has a slot along the direction of gravity, and one end of the mounting plate is inserted into the slot along the direction of gravity. The upper and lower crossbeams are projected horizontally into the mounting plate, allowing the mounting plate to be installed vertically downwards or removed vertically upwards. This avoids the upper and lower crossbeams obstructing the mounting plate in the vertical direction.

[0007] Preferably, the upper crossbeam and the lower crossbeam are detachably mounted on the upper and lower ends of the support frame by screws. Both ends of the support frame are provided with threaded holes that match the screws. The threaded holes are symmetrically arranged about the slot, so as to selectively install the upper crossbeam at the two end corners of the upper end of the support frame, and to selectively install the lower crossbeam at the two end corners of the lower end of the support frame.

[0008] Preferably, a < L, where a is the length of the slot and L is the height of the support plate. The mounting plate is inserted vertically downwards into the slot or pulled vertically upwards from inside the slot. The upper crossbeam, lower crossbeam, mounting plate, and support plate are all made of marble to ensure high structural strength and weight. The mounting plate can be supported and fixed by two support plates, and different widths of mounting plates can be accommodated by adjusting the position of the two support plates.

[0009] Preferably, the mounting plate has a rectangular ring-shaped cross-section along the direction of gravity, an opening for the workbench to be embedded in the center of the mounting plate, and a lifting hole at the upper end of the mounting plate for a lifting device to pass through in order to vertically lift and lower the mounting plate.

[0010] Preferably, the flying probe testing mechanism includes a three-axis motion platform, a probe holder, and a test probe connected in sequence. The three-axis motion platform includes an X-axis linear motor, a Y-axis linear motor, and a Z-axis linear motor. The X-axis linear motor, Y-axis linear motor, Z-axis linear motor, and probe holder are connected in sequence to facilitate precise movement of the test probe and improve the accuracy of the alignment between the test probe and the contact point.

[0011] Preferably, the X-axis linear motor, Y-axis linear motor and Z-axis linear motor each include a stator and a mover, and the upper and lower crossbeams are detachably equipped with brackets, with the stators of the X-axis linear motors correspondingly installed inside the brackets.

[0012] Preferably, the worktable is a suction cup worktable, and the surface of the suction cup worktable near the flying probe testing mechanism is provided with a plurality of vacuum adsorption holes. A limiting strip is provided on the surface of the suction cup worktable near the flying probe testing mechanism, and the limiting strip surrounds the test plate. The suction cup worktable is made of marble.

[0013] Preferably, the support frame further includes a base plate, with the lower ends of the two support plates respectively vertically disposed at both ends of the base plate, so that the two base plates are symmetrical. This facilitates the simultaneous movement of the two support plates.

[0014] The beneficial effects of this utility model are as follows: a support frame is provided, and the tooling and testing mechanism are respectively mounted on the mounting plate and the crossbeam. The mounting plate and the crossbeam are detachably mounted on the support frame. When different specifications of circuit boards need to be tested, it is only necessary to remove the original mounting plate, adjust the testing mechanism between the worktable on the mounting plate and the two crossbeams, and then reinstall the mounting plate on the support frame. This reduces the time required for replacement, saves time, and the tooling does not need to be removed from the mounting plate.

[0015] The mounting plate, crossbeams, and support frames are made of marble, which increases their weight and reduces vibration during equipment operation, thereby reducing vibration of the mounting plate within the slot. The marble-material construction of the mounting plate, crossbeams, and support frames provides high strength and stability, making them less prone to deformation and improving the stability and accuracy of circuit board testing.

[0016] Both support plates of the support frame are made of marble, which increases the weight of the support plates. The two support plates can support and fix the mounting plate, and the position of the two support plates can be adjusted to accommodate mounting plates of different widths. Attached Figure Description

[0017] The accompanying drawings further illustrate the present invention, but the embodiments in the drawings do not constitute any limitation on the present invention.

[0018] Figure 1 This is a front view of a flying probe testing machine provided in an embodiment of the present invention;

[0019] Figure 2 A schematic diagram of the structure of a flying probe testing machine provided in an embodiment of this utility model. Figure 1 ;

[0020] Figure 3 A schematic diagram of the structure of a flying probe testing machine provided in an embodiment of this utility model. Figure 2 ;

[0021] Figure 4 This is a schematic diagram of the structure of a support plate provided in one embodiment of the present invention;

[0022] Reference numerals in the attached drawings: 1: support frame; 2: upper crossbeam; 3: lower crossbeam; 4: mounting plate; 5: support plate; 6: workbench; 7: flying probe testing mechanism. Detailed Implementation

[0023] The specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit the scope of this utility model.

[0024] It should be noted that, in this utility model, unless otherwise stated, when an element is referred to as "set on" or "connected to" another element, it can be directly on the other element or may have an intervening element present simultaneously. The directional terms used, such as "upper," "lower," "left," and "right," generally refer to... Figure 1 The directions shown are up, down, left, and right. "Far" and "near" refer to distance relative to a certain component.

[0025] like Figures 1-4 As shown in the figure, an embodiment of the present invention provides a flying probe testing machine, comprising: a support frame 1, an upper crossbeam 2, a lower crossbeam 3, a mounting plate 4, a flying probe testing mechanism 7, and a worktable 6 for fixing the board under test. The flying probe testing mechanism 7 and the worktable 6 are arranged sequentially in the horizontal direction, while the upper crossbeam 2, mounting plate 4, and lower crossbeam 3 are arranged in the direction of gravity. The worktable 6 is embedded in the center of the mounting plate 4. The upper and lower ends of the flying probe testing mechanism 7 are respectively located on the upper crossbeam 2 and the lower crossbeam 3. The upper crossbeam 2 and the lower crossbeam 3 are respectively located on the upper and lower ends of the support frame 1. The mounting plate 4 is parallel to the direction of gravity and is detachably mounted in the center of the support frame 1 in the direction of gravity, allowing it to be removed and replaced from the support frame 1. The board under test is vertically fixed on the worktable 6, and the test probe moves horizontally to contact the contacts on the board under test for testing. Because the board under test is vertically fixed, it is possible to test circuit boards of excessive size, avoiding the limitation imposed by the horizontally placed worktable 6 on the specifications of the board under test.

[0026] The support frame 1 includes two symmetrically arranged support plates 5. The mounting plate 4 is detachably mounted at the center of the two support plates 5 at both ends. The upper crossbeam 2 is detachably mounted at the upper ends of the two support plates 5 at both ends. The lower crossbeam 3 is detachably mounted at the lower ends of the two support plates 5 at both ends, so that the mounting plate 4 can be removed and replaced between the two support plates 5.

[0027] The support plate 5 has a slot at its upper end along the direction of gravity. One end of the mounting plate 4 is inserted into the slot along the direction of gravity. The upper crossbeam 2 and the lower crossbeam 3 are projected horizontally into the mounting plate 4, allowing the mounting plate 4 to be installed vertically downwards or removed vertically upwards. This prevents the upper crossbeam 2 and the lower crossbeam 3 from obstructing the mounting plate 4 in the vertical direction.

[0028] The upper crossbeam 2 and the lower crossbeam 3 are detachably mounted on the upper and lower ends of the support frame 1 by screws. The upper and lower ends of the support frame 1 are provided with threaded holes that match the screws. The threaded holes are symmetrically arranged about the slot, so as to selectively install the upper crossbeam 2 at the two end corners of the upper end of the support frame 1, and to selectively install the lower crossbeam 3 at the two end corners of the lower end of the support frame 1.

[0029] a < L, where a is the length of the slot and L is the height of the support plate 5. The mounting plate 4 is inserted vertically downwards into the slot or pulled vertically upwards from inside the slot. The upper crossbeam 2, lower crossbeam 3, mounting plate 4, and support plate 5 are all made of marble to ensure high structural strength and weight. The mounting plate 4 can be supported and fixed by two support plates 5, and different widths of mounting plates 4 can be accommodated by adjusting the position of the two support plates 5.

[0030] The mounting plate 4 has a rectangular ring-shaped cross section along the direction of gravity. An opening for the workbench 6 to be embedded is provided at the center of the mounting plate 4. A lifting hole is provided at the upper end of the mounting plate 4 for a lifting device to pass through, so as to vertically lift and lower the mounting plate 4.

[0031] The flying probe testing mechanism 7 includes a three-axis motion platform, a probe holder, and a test probe connected in sequence. The three-axis motion platform includes an X-axis linear motor, a Y-axis linear motor, and a Z-axis linear motor. The X-axis linear motor, Y-axis linear motor, and Z-axis linear motor are connected to the probe holder in sequence to facilitate precise movement of the test probe and improve the accuracy of the alignment between the test probe and the contact point.

[0032] The X-axis linear motor, Y-axis linear motor and Z-axis linear motor all include a stator and a mover. The upper crossbeam 2 and the lower crossbeam 3 are detachably equipped with brackets. The stators of the X-axis linear motors are correspondingly installed inside the brackets.

[0033] The worktable 6 is a suction cup worktable 6. The surface of the suction cup worktable 6 near the flying probe testing mechanism 7 is provided with a plurality of vacuum adsorption holes. The surface of the suction cup worktable 6 near the flying probe testing mechanism 7 is provided with a limiting strip, which surrounds the plate to be tested. The suction cup worktable 6 is made of marble.

[0034] In one embodiment, the support frame 1 further includes a base plate, with the lower ends of the two support plates 5 respectively vertically disposed at both ends of the base plate, so that the two base plates are symmetrical. This facilitates the simultaneous movement of the two support plates 5.

[0035] The technical features of the embodiments described above can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of this utility model, and these should all be considered to be within the scope of this specification.

Claims

1. A flying probe testing machine, characterized in that: include: The system comprises a support frame, an upper crossbeam, a lower crossbeam, a mounting plate, a flying probe testing mechanism, and a worktable for fixing the test plate. The flying probe testing mechanism and the worktable are arranged sequentially along the horizontal direction. The upper crossbeam, the mounting plate, and the lower crossbeam are arranged along the direction of gravity. The worktable is embedded in the center of the mounting plate. The upper and lower ends of the flying probe testing mechanism are respectively located on the upper and lower crossbeams. The upper and lower crossbeams are respectively located on the upper and lower ends of the support frame. The mounting plate is parallel to the direction of gravity and is detachably located in the center of the support frame.

2. The flying probe testing machine according to claim 1, characterized in that: The support frame includes two symmetrically arranged support plates. The two ends of the mounting plate are detachably mounted at the center of the two support plates. The two ends of the upper crossbeam are detachably mounted at the upper ends of the two support plates. The two ends of the lower crossbeam are detachably mounted at the lower ends of the two support plates.

3. The flying probe testing machine according to claim 2, characterized in that: The upper end of the support plate has a slot along the direction of gravity, one end of the mounting plate is inserted into the slot along the direction of gravity, and the upper crossbeam is projected into the mounting plate in the horizontal direction.

4. The flying probe testing machine according to claim 3, characterized in that: The upper and lower crossbeams are detachably mounted on the upper and lower ends of the support frame by screws. The upper and lower ends of the support frame are provided with threaded holes that match the screws, and the threaded holes are symmetrically arranged about the slot.

5. The flying probe testing machine according to claim 3, characterized in that: a < L, where a is the length of the slot and L is the height of the support plate. The upper crossbeam, lower crossbeam, mounting plate and support plate are all made of marble.

6. The flying probe testing machine according to claim 5, characterized in that: The mounting plate has a rectangular ring-shaped cross-section along the direction of gravity, and an opening for the workbench to be embedded is provided at the center of the mounting plate.

7. The flying probe testing machine according to claim 1, characterized in that: The flying probe testing mechanism includes a three-axis motion platform, a probe holder, and a test probe connected in sequence. The three-axis motion platform includes an X-axis linear motor, a Y-axis linear motor, and a Z-axis linear motor, which are connected to the probe holder in sequence.

8. The flying probe testing machine according to claim 7, characterized in that: The X-axis linear motor, Y-axis linear motor and Z-axis linear motor all include a stator and a mover. The upper and lower crossbeams are detachably equipped with brackets, and the stators of the X-axis linear motors are correspondingly installed inside the brackets.

9. The flying probe testing machine according to claim 1, characterized in that: The worktable is a suction cup worktable. The surface of the suction cup worktable near the flying probe testing mechanism is provided with a plurality of vacuum adsorption holes. The surface of the suction cup worktable near the flying probe testing mechanism is provided with a limiting strip, which surrounds the plate to be tested.

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