Battery in-situ test sample cell

Abstract

The utility model relates to the field of batteries, and discloses a battery in-situ test sample cell, which comprises a first shell and a second shell, a first accommodating cavity with one closed end is arranged in the first shell, the first accommodating cavity is used for accommodating a sample to be tested, and the second shell covers the first shell so that the other end of the first accommodating cavity is closed. The top of the second shell is provided with an observation window, the observation window can observe the to-be-tested sample in the first containing cavity through the observation channel, an annular second containing cavity is formed outside the first containing cavity, and a semiconductor temperature control chip is installed in the second containing cavity. The device can be combined with synchrotron radiation analysis and gas product detection, has a lateral visual observation function, is reasonable in whole structural design and high in compatibility, can stably operate in a temperature range of-20 DEG C to 70 DEG C, and is adaptive to various in-situ characterization platforms.

Description

Technical Field

[0001] This utility model relates to the field of batteries, specifically to a battery in-situ test sample cell. Background Technology

[0002] With the rapid development of technologies such as new energy vehicles, aerospace, and grid energy storage, higher requirements have been placed on lithium-ion batteries for energy density, safety, and environmental adaptability. High-energy-density batteries, represented by lithium metal anodes, high-nickel ternary cathode materials, and lithium-rich layered cathode material systems, are widely considered important candidates for next-generation energy storage systems. However, in practical applications, especially under wide temperature ranges (e.g., -20℃ to 70℃), these batteries still face serious problems such as decreased safety and shortened cycle life, which restricts their widespread application in complex climates and extreme operating conditions.

[0003] The specific failure process typically involves the combined effects of multiple factors, including changes in the cathode crystal structure, lattice oxygen release, electrolyte decomposition, lithium dendrite growth, and the migration and deposition of transition metal ions. It exhibits highly dynamic, localized, and multi-scale coupled characteristics. Therefore, an in-situ testing device capable of adapting to extreme environmental changes and possessing multi-modal functionality is needed to deeply analyze these material evolution and performance degradation mechanisms. However, existing in-situ testing devices usually lack integrated temperature control components, making it impossible to precisely adjust and stably maintain the battery operating environment over a wide temperature range. Utility Model Content

[0004] The purpose of this invention is to overcome the problem that the existing technology cannot control the operating temperature of batteries in a wide temperature range, and to provide a battery in-situ test sample cell that can control the temperature of the battery operating environment in a wide temperature range.

[0005] To achieve the above objectives, this utility model provides a battery in-situ test sample cell, comprising a first housing and a second housing. The first housing has a first accommodating cavity with one end closed, which is used to accommodate the sample to be tested. The second housing is attached to the first housing to close the other end of the first accommodating cavity. An observation window is provided on the top of the second housing, through which the sample to be tested in the first accommodating cavity can be observed. An annular second accommodating cavity is provided outside the first accommodating cavity, and a semiconductor temperature control chip is installed in the second accommodating cavity.

[0006] Using the above technical solution, the semiconductor temperature control chip, based on the Peltier effect, can actively heat or cool the environment of the sample under test by adjusting the direction and magnitude of the input current. Compared with traditional temperature control methods using heating plates or liquid circulation systems, the semiconductor temperature control chip has significant advantages such as small size, high integration, fast response speed, and high temperature control accuracy. It can complete the heating or cooling process of the sample chamber in a short time, supports stable operation in a wide temperature range of -20℃ to 70℃, and does not require large external auxiliary equipment, greatly improving the compactness of the overall structure and space utilization efficiency.

[0007] Preferably, the second housing has a first gas channel and a second gas channel, the outer ends of which are connected to the outside, and the inner ends of which are connected to the first accommodating cavity. The outside refers to the external environment. With this structure, gas can be blown in through the first channel, allowing the gas generated during battery operation to flow out through the second channel along with the blown-in gas, facilitating collection and analysis, thereby meeting the detection requirements of DEMS (Differential Electrochemical Mass Spectrometry).

[0008] Preferably, the first housing has a light-transmitting window and a light signal collecting window, with their axes coinciding. External light can pass through the light-transmitting window into the first accommodating cavity, and light within the first accommodating cavity can pass through the light signal collecting window back to the outside. With this structure, when performing X-ray or other optical analyses, the corresponding light beam can be incident through the light-transmitting window. This incident light beam passes through the sample to be tested and exits through the light signal collecting window, thus facilitating analysis. If necessary, two sets of light-transmitting windows and light signal collecting windows can be provided. One set can be used to incident the corresponding analytical light, while the other set can be used to increase the light intensity when the light intensity is insufficient. Unlike traditional devices with only a top observation window, the sample cell provided in this application has a light-transmitting window and a light signal collecting window specifically formed on the first housing. This window is essential for observing the formation of lithium dendrites in the battery (traditional top windows cannot be used to observe lithium dendrites).

[0009] Preferably, a limiting sleeve is provided inside the first accommodating cavity. The limiting sleeve is made of transparent material, and its inner cavity forms the first accommodating cavity. With this structure, the sample to be tested is placed inside the limiting sleeve, which can provide circumferential restraint. At the same time, the limiting sleeve is made of transparent material, allowing light to pass through and ensuring the smooth passage of the optical observation path.

[0010] Preferably, a pre-tightening structure is provided between the second housing and the sample to be tested. This pre-tightening structure is used to apply a preset axial pre-tightening force to the sample to be tested. Using this structure, the required pressure can be pre-loaded through the pre-tightening device. On the one hand, this serves as an axial limit for the sample to be tested; on the other hand, for some applications requiring pressure analysis, the pre-loaded pressure can be set within a desired range.

[0011] Preferably, a first gasket is provided at the bottom of the first accommodating cavity, and the limiting sleeve is disposed on the first gasket. The first gasket is made of metal. One of the positive or negative electrodes of the sample to be tested is in contact with the first gasket, and the first gasket is connected to the corresponding electrode of the power supply.

[0012] A second gasket is provided on the surface of the sample to be tested near the pre-tightening structure. The second gasket is made of metal. Both the pre-tightening structure and the second housing are made of metal. One end of the pre-tightening structure presses the second gasket against the other pole of the sample to be tested, and the other end of the pre-tightening structure presses against the second housing. The second housing is connected to the corresponding pole of the power supply.

[0013] With the above structure, the sample to be tested can be easily connected to the positive and negative terminals of the power supply through the first and second gaskets, thereby enabling the test to be completed when power is applied.

[0014] Preferably, the pre-tensioning structure includes at least one pre-tensioning spring, with the uppermost pre-tensioning spring abutting against the second housing and the lowermost pre-tensioning spring abutting against the sample to be tested. This structure is simple, and a certain number of springs can be selected according to the required pre-applied pressure.

[0015] Preferably, the preload spring is a butterfly spring, and all the butterfly springs are stacked together along the axial direction of the first accommodating cavity. A first hole is opened through the interior of each butterfly spring. A hollow limiting post is installed on the surface of the second housing near the butterfly spring. The limiting post extends into the hole of the uppermost butterfly spring, and the uppermost butterfly spring abuts against the second housing. The lowermost butterfly spring abuts against the second gasket, and a second hole is opened on the second gasket.

[0016] The cavity within the limiting post, the first hole, and the second hole are connected to form the observation channel.

[0017] Using the above technical solution, the disc spring itself is approximately butterfly-shaped, that is, it is larger at one end and smaller at the other. By stacking them, the disc springs can be positioned and limited. The uppermost disc spring is limited by the limiting post, and the lowermost one is limited by the sample to be tested. Through the holes in the disc springs, the inner cavity of the limiting post, and the second hole on the first gasket, their axes overlap to form a through channel, that is, to form an observation channel, which facilitates the observation of the sample from the observation window.

[0018] Preferably, the observation window is covered with optical glass. By installing optical glass in the observation window, the entire structure is sealed, meeting some testing requirements that necessitate closed-loop operation.

[0019] Preferably, a third hole is provided on the first housing corresponding to the second accommodating cavity, and the power line of the semiconductor temperature control chip passes through the third hole and connects to the semiconductor temperature control chip. This structure facilitates the connection between the semiconductor temperature control chip and the power supply through the third hole.

[0020] Through the above technical solution, the sample cell provided in this application is suitable for wide temperature range conditions, can be used in conjunction with synchrotron radiation analysis and gas product detection, and has lateral visualization observation function. The entire structure is reasonably designed and highly compatible, and can operate stably in the temperature range of -20℃ to 70℃. It is compatible with a variety of in-situ characterization platforms and is suitable for the study of the structure, interface and reaction process mechanism of high-energy-density lithium battery materials in complex environments, providing a solution for the analysis of battery failure mechanisms under extreme conditions. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the three-dimensional structure of the sample cell for in-situ battery testing;

[0022] Figure 2 This is an exploded view of the sample cell for in-situ battery testing;

[0023] Figure 3 This is a three-dimensional structural diagram of the second shell;

[0024] Figure 4 This is a schematic diagram of the planar structure of the second shell;

[0025] Figure 5 yes Figure 4 AA section view;

[0026] Figure 6 This is a three-dimensional structural diagram of the first shell.

[0027] Explanation of reference numerals in the attached figures

[0028] 1-First housing; 1a-Housing base; 1b-Base plate; 2-Second housing; 3-First accommodating cavity; 4-Observation window; 5-Optical glass; 6-Sealing ring; 7-First gas channel; 8-Limiting post; 9-Butterfly spring; 10-First hole; 11-Second gasket; 12-Second hole; 13-Limiting sleeve; 14-First gasket; 15-Semiconductor temperature control plate; 16-Light-transmitting window; 17-Light signal collection window; 18-Second gas channel; 19-Sealing groove; 20-Third hole; 21-Second accommodating cavity. Detailed Implementation

[0029] In the description of this application, it should be understood that the terms "upper", "lower", "vertical", "horizontal", "top", "bottom", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0030] The terms “first”, “second”, etc. are used to distinguish similar objects, not to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein. The objects distinguished by “first”, “second”, etc. are usually of the same class and the number of objects is not limited. For example, the first object can be one or more.

[0031] Furthermore, the term "and / or" in the specification and claims is used to describe the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0032] In the description of this application, unless otherwise stated, "a plurality of" means two or more.

[0033] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0034] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0035] One embodiment discloses a battery in-situ test sample cell, such as Figure 1-6 As shown, the device includes a first housing 1 and a second housing 2. The first housing 1 has a first accommodating cavity 3 with one end closed, which is used to accommodate the sample to be tested. The second housing 2 is placed on top of the first housing 1, thereby closing the other end of the first accommodating cavity 3. An observation window 4 is provided on the top of the second housing 2, through which the sample to be tested in the first accommodating cavity 3 can be observed. An annular second accommodating cavity 21 is provided outside the first accommodating cavity 3, and a semiconductor temperature control chip 15 is installed in the second accommodating cavity 21.

[0036] Generally, bolt holes can be made in the first housing 1, and the second housing 2 can be tightened onto the first housing 1 with bolts.

[0037] In one embodiment, a third hole 20 is provided on the first housing corresponding to the second accommodating cavity 21, and the power line of the semiconductor temperature control chip 15 passes through the third hole 20 and is connected to the semiconductor temperature control chip 15.

[0038] In one embodiment, the second housing 2 has a first gas channel 7 and a second gas channel 18. The outer ends of both the first gas channel 7 and the second gas channel 18 are connected to the outside, and their inner ends are connected to the first accommodating cavity 3. Thus, the gas generated by the sample during testing can be supplied to the first accommodating cavity 3 through the first gas channel 7. The supplied gas, carrying the gas generated by the sample, flows out through the second gas channel 18, and the outflowing gas is collected for further component analysis.

[0039] like Figure 6As shown, in one embodiment, the first housing has a light-transmitting window 16 and a light signal collecting window 17, whose axes coincide. External light can pass through the light-transmitting window 16 into the first accommodating cavity 3, and light within the first accommodating cavity 3 can pass through the light signal collecting window 17 back to the outside. Generally, the light-transmitting window 16 is larger than the light signal collecting window 17. To improve the overall airtightness of the structure, optical glass is installed inside both the light-transmitting window 16 and the light signal collecting window 17, and the optical glass is sealed around its perimeter with sealant. Of course, to facilitate different detection needs, such as X-ray inspection and fluorescence detection, two sets of the light-transmitting window 16 and the light signal collecting window 17 can be provided.

[0040] like Figure 2 As shown, in one embodiment, a limiting sleeve 13 is provided inside the first accommodating cavity 3. The limiting sleeve 13 is made of transparent material, and the inner cavity of the limiting sleeve 13 forms the first accommodating cavity 3.

[0041] In one embodiment, a pre-tightening structure is still provided between the second housing 2 and the sample to be tested. This pre-tightening structure is used to apply a preset axial pre-tightening force to the sample to be tested. In this application, the axial direction coincides with the axial direction of the first accommodating cavity.

[0042] In one embodiment, a first gasket 14 is provided at the bottom of the first accommodating cavity 3, and the limiting sleeve 13 is installed on the first gasket 14. The first gasket 14 is made of metal. One of the positive or negative electrodes of the sample to be tested is in contact with the first gasket 14. The first gasket 14 is connected to the corresponding electrode of the power supply. A second gasket 11 is provided on the surface of the sample to be tested near the pre-tightening structure. The second gasket 11 is made of metal. The pre-tightening structure and the second housing 2 are both made of metal. One end of the pre-tightening structure presses the second gasket 11 against the other electrode of the sample to be tested, and the other end of the pre-tightening structure presses against the second housing 2. The second housing 2 is connected to the corresponding electrode of the power supply.

[0043] Generally, the negative electrode of the sample to be tested can be brought into contact with the first pad 14, the first pad 14 is connected to the negative electrode of the power supply, and the second pad 11 is pressed against the positive electrode of the sample to be tested by the pre-tightening structure. Then the second housing 2 is connected to the positive electrode of the power supply. Since the second pad 11, the pre-tightening structure and the second housing 2 are all made of metal, the connection between the positive electrode of the sample to be tested and the positive electrode of the power supply is achieved.

[0044] In one embodiment, the pretensioning structure includes at least one pretensioning spring, with the uppermost pretensioning spring tightly attached to the second housing 2 and the lowermost pretensioning spring abutting against the sample to be tested.

[0045] In one embodiment, the preload spring is a butterfly spring 9, and all the butterfly springs 9 are stacked together along the axial direction of the first accommodating cavity 3. A first hole 10 is opened through each of the butterfly springs 9. A hollow limiting post 8 is installed on the surface of the second housing 2 near the butterfly springs 9. The limiting post 8 extends into the hole of the uppermost butterfly spring 9, and the uppermost butterfly spring 9 abuts against the second housing 2. The lowermost butterfly spring 9 abuts against the second gasket 11. A second hole 12 is opened on the second gasket 11. The axis of the cavity inside the limiting post 8, the axis of the first hole 10, and the axis of the second hole 12 coincide with the axis of the first accommodating cavity 3. The cavity inside the limiting post 8, the first hole 10, and the second hole 12 are connected to form the observation channel. The observation window 4 is directly opposite the observation channel and is connected to it.

[0046] In one embodiment, the observation window 4 is covered with optical glass 5, which seals the observation window 4, thereby keeping the interior of the sample cell sealed. To further improve the sealing performance, a sealing ring 6 can be provided between the optical glass 5 and the observation window 4. Furthermore, the sealing ring 6 consists of two rings, one large and one small. Two sealing grooves 19 can be provided at the bottom of the observation window 4, surrounding the cavity end of the limiting post 8 from the inside out. The smaller sealing ring 6 is installed in the sealing groove 19 near the cavity end of the limiting post 8, and the larger sealing ring 6 is installed in the outer sealing groove 19.

[0047] In one embodiment, such as Figure 5 As shown, to increase ventilation, two first gas channels 7 can be opened. The two first gas channels 7 and one second gas channel 18 are arranged in a "Y" shape. Their inner ends are all connected to the cavity inside the limiting post 8. The cavity inside the limiting post 8 is connected to the first accommodating cavity 3 through the first hole 10 and the second hole 12. Thus, the inner ends of the first gas channels 7 and one second gas channel 18 are all connected to the first accommodating cavity 3, and their outer ends are all connected to the outside.

[0048] In one embodiment, such as Figure 2 As shown, the first housing 1 includes a housing base 1a, which has an internal cavity open at both ends. A base plate 1b is installed on the surface of the housing base 1a away from the second housing 2, and the two are connected by bolts. The base plate 1b closes one end of the internal cavity open at both ends to form the first accommodating cavity 3. The second accommodating cavity 21 is opened on the surface of the housing base 1a for covering the second housing 2. The light-transmitting window 16 and the light signal collecting window 17 are opened on the side wall of the housing base 1a.

[0049] Furthermore, in one embodiment, to facilitate observation of the other end of the sample to be tested, another observation window can be opened on the base plate 1b. This observation window faces the cavity inside the shell base 1a. The observation window on the base plate 1b is also equipped with optical glass, just like the observation window on the second shell 2. A fourth hole is opened on the first gasket 14, and the other end of the sample to be tested can be observed through the fourth hole from the observation window on the base plate 1b.

[0050] The preferred embodiments of this utility model have been described in detail above; however, this utility model is not limited thereto. Within the scope of the technical concept of this utility model, various simple modifications can be made to the technical solution of this utility model, including combining the various technical features in any other suitable manner. These simple modifications and combinations should also be considered as the content disclosed by this utility model and are all within the protection scope of this utility model.

Claims

1. A battery in-situ test sample cell, comprising a first housing and a second housing, characterized in that, The first housing has a first accommodating cavity with one end closed, which is used to accommodate the sample to be tested. The second housing is attached to the first housing so that the other end of the first accommodating cavity is closed. An observation window is provided on the top of the second housing, through which the sample to be tested in the first accommodating cavity can be observed. An annular second accommodating cavity is provided outside the first accommodating cavity, and a semiconductor temperature control chip is installed in the second accommodating cavity.

2. The sample cell according to claim 1, characterized in that, The second housing has a first gas channel and a second gas channel. The outer ends of the first gas channel and the second gas channel are connected to the outside, and the inner ends of the two are connected to the first accommodating cavity.

3. The sample cell according to claim 1 or 2, characterized in that, The first housing has a light-transmitting window and a light signal collecting window, and their axes coincide. External light can pass through the light-transmitting window into the first accommodating cavity, and light in the first accommodating cavity can pass through the light signal collecting window back to the outside.

4. The sample cell according to claim 3, characterized in that, A limiting sleeve is provided inside the first accommodating cavity. The limiting sleeve is made of transparent material, and the inner cavity of the limiting sleeve forms the first accommodating cavity.

5. The sample cell according to claim 4, characterized in that, A pre-tightening structure is provided between the second housing and the test sample, which is used to apply a preset axial pre-tightening force to the test sample.

6. The sample cell according to claim 5, characterized in that, A first gasket is provided at the bottom of the first accommodating cavity, and a limiting sleeve is provided on the first gasket. The first gasket is made of metal. One of the positive or negative electrodes of the sample to be tested is in contact with the first gasket, and the first gasket is connected to the corresponding electrode of the power supply. A second gasket is provided on the surface of the sample to be tested near the pre-tightening structure. The second gasket is made of metal. Both the pre-tightening structure and the second housing are made of metal. One end of the pre-tightening structure presses the second gasket against the other pole of the sample to be tested, and the other end of the pre-tightening structure presses against the second housing. The second housing is connected to the corresponding pole of the power supply.

7. The sample cell according to claim 6, characterized in that, The preload structure includes at least one preload spring, with the uppermost preload spring pressing against the second housing and the lowermost preload spring pressing against the sample to be tested.

8. The sample cell according to claim 7, characterized in that, The preload spring is a butterfly spring. All the butterfly springs are stacked together along the axial direction of the first accommodating cavity. A first hole is opened through the inside of each butterfly spring. A hollow limiting post is installed on the surface of the second housing near the butterfly spring. The limiting post extends into the hole of the uppermost butterfly spring. The uppermost butterfly spring abuts against the second housing. The lowermost butterfly spring abuts against the second gasket. A second hole is opened on the second gasket. The cavity within the limiting post, the first hole, and the second hole are connected to form the observation channel.

9. The sample cell according to any one of claims 4-8, characterized in that, The observation window is covered with optical glass.

10. The sample cell according to claim 9, characterized in that, A third hole is provided on the first housing corresponding to the second accommodating cavity, and the power line of the semiconductor temperature control chip passes through the third hole and is connected to the semiconductor temperature control chip.

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