Adjustable test probe structure

Abstract

The utility model discloses an adjustable test probe structure, which comprises a probe fixing seat and a probe assembly, a probe mounting hole is arranged in the probe fixing seat, the probe assembly comprises a probe seat, a movable probe and an elastic piece, the probe seat is fixedly inserted in the probe mounting hole of the probe fixing seat, and the movable probe is arranged in the probe mounting hole of the probe fixing seat. One end of the probe seat can be connected and conducted with a communication line, one end of the movable probe can be inserted into the probe seat in a sliding mode by a set distance, the movable probe is kept conducted with the probe seat, and the other end of the movable probe extends out of the outer side of the other end of the probe seat to form a test contact end. And the elastic piece is arranged on the probe seat and provides elastic holding force towards the direction of the other end of the probe seat for the movable probe. The signal transmission device can be suitable for signal transmission data of conductors in various tested products, so that trepanning of the conductors is avoided, the signal transmission stability of the tested products is ensured, and the accuracy of test data is ensured.

Description

Technical Field

[0001] This utility model relates to a test probe, and more particularly to an adjustable test probe structure. Background Technology

[0002] Many electronic products require signal detection of conductors embedded in plastic casings during the manufacturing process. Currently, the method for testing conductors in such electronic products involves leading a communication line from the testing equipment, with a probe with a tip installed at the end of the communication line. Openings for testing are designed on both the plastic casing and the conductor of the product under test. The tip of the probe is then inserted into the opening in the conductor through the opening in the plastic casing, with the sidewall of the probe tip in close contact with the inner side of the opening in the conductor to achieve conductivity. This type of testing weakens the conductor strength of the product under test, affecting the signal transmission within the product. Utility Model Content

[0003] To overcome the above-mentioned defects, this utility model provides an adjustable test probe structure. When performing signal detection on the product under test, this adjustable test probe structure does not require opening holes in the conductor, thus ensuring the signal transmission stability of the electronic product.

[0004] The technical solution adopted by this utility model to solve its technical problem is as follows: an adjustable test probe structure, including a probe holder and a probe assembly. The probe holder has a probe mounting hole. The probe assembly includes a probe base, a movable probe, and an elastic element. The probe base is fixedly inserted into the probe mounting hole of the probe holder. One end of the probe base can be connected to a communication line for conduction. One end of the movable probe can be slidably inserted into the probe base by a set distance, and the movable probe and the probe base maintain communication. The other end of the movable probe extends out of the other end of the probe base to form a test contact end. The elastic element is installed on the probe base and provides the movable probe with an elastic holding force towards the other end of the probe base.

[0005] As a further improvement of this utility model, one end of the probe holder forms a gripping operation end, and the other end of the probe holder is provided with a mushroom head coaxial with the probe mounting hole. The mushroom head can be tightly inserted into the needle insertion hole on the plastic shell of the product to be tested.

[0006] As a further improvement of this utility model, the probe holder is a tubular structure, and a fixed probe is fixedly inserted into one end of the probe holder. The elastic element is a spring, which is inserted into the probe holder. The two ends of the spring elastically extend and retract tightly abut against one end face of the fixed probe and the movable probe, respectively.

[0007] As a further improvement of this utility model, the fixed probe has a guide hole, one end of the movable probe has a guide post with a reduced diameter, and the other end of the movable probe has an extension section with a reduced diameter. The middle section of the movable probe can slide and make contact with the inner wall of the probe seat. The spring is sleeved on the outside of the guide post of the movable probe. The guide post of the movable probe can be slidably inserted into the guide hole of the fixed probe. The spring is clamped between the end face of the fixed probe facing the movable probe and the surface of one end of the middle section of the movable probe. An inner convex stop ring is formed on the inner side of the probe seat, or the probe mounting hole is a T-shaped hole with one end inner diameter larger than the other end inner diameter. The probe seat is fixedly inserted into the end with the larger diameter of the probe mounting hole. The other surface of the middle section of the movable probe stops on the stepped surface between the two ends of the inner convex stop ring or the probe mounting hole.

[0008] As a further improvement of this utility model, the other end of the movable probe is formed with a probe contact with an outwardly expanding diameter.

[0009] As a further improvement of this utility model, the communication line is directly connected to one end of the probe holder, and the communication line extends out through the probe mounting hole to the outside of the probe holder and connects with the test equipment.

[0010] As a further improvement of this utility model, a wiring cavity is also formed inside the probe holder, and an inlet hole communicating with the wiring cavity is provided on the side wall of the probe holder. One end of the probe holder extends into the wiring cavity, and a conductive plate is fixedly installed inside the wiring cavity. An elastic clip is also provided inside the wiring cavity. One end of the elastic clip is fixedly installed inside the wiring cavity, and the other end of the elastic clip can elastically clamp the communication line entering through the inlet hole with the conductive plate, thereby realizing the conduction between the conductive plate and the communication line. One end of the probe holder is connected to at least one of the conductive plate and the elastic clip.

[0011] As a further improvement of this utility model, a wiring operation handle is also installed on the probe fixing base, which can move within a certain range. One end of the wiring operation handle extends into the wiring cavity and is connected to the other end of the elastic clip. The other end of the wiring operation handle protrudes from the surface of the probe fixing base to form an operation end. Pressing the operation end of the wiring operation handle can drive the other end of the elastic clip to move, so that it overcomes its own elasticity and moves away from the conductive plate, thereby releasing the communication line.

[0012] As a further improvement of this utility model, the operating end of the wiring operation handle is connected to the outer side of the probe fixing seat through a connecting piece that can be elastically deformed. The connecting piece provides the wiring operation handle with an elastic restoring force to keep the other end of the elastic clip clamping the communication line. Pressing the operating end of the wiring operation handle can simultaneously drive the connecting piece and the elastic clip to deform.

[0013] As a further improvement of this utility model, the conductive plate has an L-shaped structure. The outer side of the conductive plate is fixedly positioned against the inner sidewall of the wiring cavity. The inner side of one sidewall of the L-shaped conductive plate forms a conductive contact surface, and the other sidewall of the L-shaped conductive plate forms a two-branch structure with a central opening. Concave arc surfaces are also formed on the opposite sidewalls of the two-branch structure. One end of the probe holder can be tightly clamped between the concave arc surfaces of the two-branch structure on the other sidewall of the L-shaped conductive plate. A support plate parallel to the other sidewall of the L-shaped conductive plate is also formed on one sidewall of the L-shaped conductive plate by bending. One end of the elastic clip is a fixed end of a U-shaped structure, and the other end of the elastic clip is a U-shaped end. The L-shaped structure has a cantilever structure formed by an arc bend on one side wall. The bottom surface of the U-shaped structure at one end of the elastic clip has an avoidance perforation structure. The side wall of the L-shaped structure of the conductive plate can extend into the inside of the U-shaped structure of the elastic clip through the avoidance perforation structure. The bottom surface of the U-shaped structure at one end of the elastic clip stops on the upper side of the support plate on the side wall of the L-shaped structure of the conductive plate. A plug-in piece is formed at the root of the side wall of the U-shaped structure at one end of the elastic clip, extending outward from the U-shaped structure. The plug-in piece can be inserted into the plug-in groove in the wiring cavity for positioning. The ends and outer surfaces of the two side walls of the U-shaped structure at one end of the elastic clip are tightly attached to the inner side of the wiring cavity and fixedly positioned.

[0014] The beneficial effects of this invention are as follows: This invention designs the test probe as a structure that can elastically extend and retract. When performing signal detection on the product under test, the movable probe only needs to be inserted into the opening of the plastic shell of the product under test. The movable probe makes close contact with the conductor surface inside the plastic shell of the product under test to achieve electrical conduction. This structure can be applied to the signal transmission data of the conductors inside various products under test, avoiding the need to open the conductor and ensuring the stability of the signal transmission of the product under test. This invention also sets a mushroom head on the probe holder. During testing, the mushroom head on the probe holder is inserted into the opening of the plastic shell of the product under test to achieve fixed positioning of the probe holder and the plastic shell of the product under test. This ensures that the movable probe makes stable and close contact with the conductor surface inside the plastic shell of the product under test during testing, ensuring accurate test data. Attached Figure Description

[0015] Figure 1 This is a three-dimensional view of the first structure of this utility model;

[0016] Figure 2 This is the first structural front view of the present invention;

[0017] Figure 3 for Figure 2 Sectional view along line AA;

[0018] Figure 4 This is a top view of the first structural embodiment of this utility model;

[0019] Figure 5 This is a state diagram of the probe using the first structure of this utility model before detection;

[0020] Figure 6 This is a state diagram of the probe using the first structure of this utility model during detection;

[0021] Figure 7 This is a perspective view of the second structure of this utility model;

[0022] Figure 8 This is a second structural front view of the present invention;

[0023] Figure 9 for Figure 8 Sectional view along the BB direction;

[0024] Figure 10 This is a top view of the second structural embodiment of this utility model;

[0025] Figure 11 This is a state diagram of the probe using the second structure of this utility model before detection;

[0026] Figure 12 This is a state diagram of the probe using the second structure of this utility model during detection;

[0027] Figure 13 A 3D view of the product under test;

[0028] Figure 14 The main view of the product under test;

[0029] Figure 15 for Figure 14 C-axis sectional view;

[0030] Figure 16 A top view of the product being tested;

[0031] Figure 17 This is a perspective view of the first type of probe holder of this utility model;

[0032] Figure 18 This is a perspective view of the probe holder of the first type of probe assembly of this utility model;

[0033] Figure 19 This is a three-dimensional view of the elastic telescopic probe inside the first probe assembly of this utility model;

[0034] Figure 20 This is a perspective view of the second type of probe holder of this utility model;

[0035] Figure 21 This is a front view of the second type of probe holder of this utility model;

[0036] Figure 22 This is a perspective view of the wiring operation handle on the second type of probe holder of this utility model;

[0037] Figure 23 This is a front view of the wiring operation handle on the second type of probe holder of this utility model;

[0038] Figure 24 This is a perspective view of the elastic clip inside the second type of probe holder of this utility model;

[0039] Figure 25 This is a perspective view of the conductive plate inside the second type of probe holder of this utility model;

[0040] Figure 26 This is a perspective view of the second probe assembly of this utility model. Detailed Implementation

[0041] Example: An adjustable test probe structure includes a probe holder 1 and a probe assembly. The probe holder 1 has a probe mounting hole 2. The probe assembly includes a probe base 3, a movable probe 4, and an elastic element. The probe base 3 is fixedly inserted into the probe mounting hole 2 of the probe holder 1. One end of the probe base 3 can be connected to a communication line 5 for conduction. One end of the movable probe 4 can be slidably inserted into the probe base 3 by a set distance, and the movable probe 4 maintains communication with the probe base 3. The other end of the movable probe 4 extends outward from the other end of the probe base 3 to form a test contact end. The elastic element is installed on the probe base 3 and provides the movable probe 4 with an elastic holding force towards the other end of the probe base 3.

[0042] During testing, the movable probe 4 is inserted into the needle insertion hole 8 of the plastic shell of the product under test. The test contact end of the movable probe 4 is in close contact with the conductor surface inside the plastic shell of the product under test, forming a conductive circuit, thereby realizing the test of the signal transmission data of the product under test. The end face of the test contact end of the movable probe 4 is preferably formed into a convex spherical test contact surface.

[0043] One end of the probe holder 1 forms a gripping operating end, and the other end of the probe holder 1 is provided with a mushroom head 6 coaxial with the probe mounting hole 2. The mushroom head 6 can be tightly inserted into the needle insertion hole 8 on the plastic shell of the product under test 7. During testing, the mushroom head 6 of the test probe structure is inserted into the needle insertion hole 8 on the plastic shell of the product under test to achieve positioning of the product under test and the probe holder 1, ensuring stable contact between the movable probe 4 and the conductor inside the product under test during testing.

[0044] The probe holder 3 is a tubular structure, with a fixed probe 9 fixedly inserted into one end. The elastic element is a spring 10, which is inserted into the probe holder 3. The two ends of the spring 10 elastically extend and retract, respectively pressing against one end face of the fixed probe 9 and the movable probe 4. The spring 10 provides elastic force to the movable probe 4, thereby creating contact pressure between the movable probe 4 and the surface of the product being tested.

[0045] The fixed probe 9 has a guide hole, and the movable probe 4 has a guide post 11 with a reduced diameter at one end and an extension section 12 with a reduced diameter at the other end. The middle section 13 of the movable probe can slide and make contact with the inner wall of the probe seat 3. The spring 10 is sleeved on the outside of the guide post 11 of the movable probe 4. The guide post 11 of the movable probe 4 can slide and be inserted into the guide hole of the fixed probe 9. The spring 10 is clamped between the end face of the fixed probe 9 facing the movable probe 4 and the surface of one end of the middle section 13 of the movable probe. The inner side of the probe seat 3 has an inwardly convex stop ring or the probe mounting hole 2 is a T-shaped hole with one end inner diameter larger than the other end inner diameter. The probe seat 3 is fixedly inserted into the end with the larger diameter of the probe mounting hole 2. The other surface of the middle section 13 of the movable probe stops on the stepped surface between the two ends of the inwardly convex stop ring or the probe mounting hole 2.

[0046] The guide post 11 at one end of the movable probe 4 slides within the guide hole of the fixed probe 9 to achieve telescopic guidance of the movable probe 4. At the same time, one end of the movable probe 4 is in contact with the fixed probe 9 and conducts electricity, while the middle of the movable probe 4 is in contact with the probe seat 3 and conducts electricity. The movable probe 4 is also connected to the fixed probe 9 through the spring 10. This structure ensures stable conduction between the movable probe 4 and the probe seat 3, ensuring stable and continuous transmission of the detection signal.

[0047] The other end of the movable probe 4 has a probe contact 14 with an outwardly expanding diameter. The probe contact 14 is used to contact the conductor of the product being tested, and at the same time, the probe contact head can also block the probe fixing seat 1 from being compressed and shrinking, which would severely damage the spring 10.

[0048] The communication line 5 is directly connected to one end of the probe base 3. The communication line 5 extends through the probe mounting hole 2 to the outside of the probe fixing base 1 and is connected to the test equipment.

[0049] The probe holder 1 also has a wiring cavity 15, and the side wall of the probe holder 1 is provided with an inlet hole 16 communicating with the wiring cavity 15. One end of the probe holder 3 extends into the wiring cavity 15. A conductive plate 17 is also fixedly installed in the wiring cavity 15. An elastic clip 18 is also provided in the wiring cavity 15. One end of the elastic clip 18 is fixedly installed in the wiring cavity 15, and the other end of the elastic clip 18 can elastically clamp the communication line 5 entering through the inlet hole 16 with the conductive plate 17, thereby realizing the conduction between the conductive plate 17 and the communication line 5. One end of the probe holder 3 is connected to at least one of the conductive plate 17 and the elastic clip 18. This structure allows the probe base 3 to be electrically connected to the conductive plate 17 or the elastic clip 18 in the wiring cavity 15. After the wire of the communication line 5 enters through the inlet hole 16, it is clamped between the conductive plate 17 and the elastic clip 18 to achieve conduction with the probe base 3. This structure allows the entire test probe to be connected to different test equipment for in-line testing, realizing the sharing of various test equipment.

[0050] A wiring operation handle 19 is also installed on the probe holder 1, which can move within a certain range. One end of the wiring operation handle 19 extends into the wiring cavity 15 and is connected to the other end of the elastic clip 18. The other end of the wiring operation handle 19 protrudes from the surface of the probe holder 1, forming an operating end. Pressing the operating end of the wiring operation handle 19 can drive the other end of the elastic clip 18 to move away from the conductive plate 17 and release the communication line 5. By pressing the wiring operation handle 19, the elastic clip 18 can be moved to clamp, retract, and advance the wire. One end of the wiring operation handle 19 can be provided with a slot or a socket. A protrusion is provided on the side wall of the other end of the elastic clip 18. The protrusion is inserted into the slot or socket of one end of the wiring operation handle 19. The operating handle can be rotated or slidably mounted on the probe holder 1. By pressing the operating handle, it can be rotated or slidably, causing the other end of the elastic clip 18 to swing.

[0051] The operating end of the wiring operation handle 19 is connected to the outer side of the probe fixing seat 1 via a flexible connecting piece 20. The connecting piece 20 provides the wiring operation handle 19 with an elastic restoring force to keep the other end of the elastic clamp 18 clamping the communication line 5. Pressing the operating end of the wiring operation handle 19 can simultaneously drive the connecting piece 20 and the elastic clamp 18 to deform.

[0052] The wiring operation handle 19 is connected to the probe fixing seat 1 by a highly elastic deformation connecting piece 20, which can prevent the wiring handle from falling off. At the same time, it also provides a reset elastic force to the wiring operation handle 19, so that it can quickly reset after the loss of external force, reducing the burden on the elastic clip 18. In addition, a limiting structure can be set on the probe fixing seat 1 to limit the range of motion of the operation handle to prevent the wiring operation handle 19 from falling off. These are all equivalent replacement structures that can be easily conceived by those skilled in the art based on this patent, and they fall within the scope of protection of this patent.

[0053] The conductive plate 17 has an L-shaped structure. The outer side of the conductive plate 17 is fixedly positioned against the inner wall of the wiring cavity 15. The inner side of one side wall of the L-shaped structure of the conductive plate 17 forms a conductive contact surface 21. The other side wall of the L-shaped structure of the conductive plate 17 forms a two-branch structure 22 with a central opening. The opposite side walls of the two-branch structure 22 also have concave arc surfaces 23. One end of the probe seat 3 can be tightly clamped between the concave arc surfaces 23 of the two-branch structure 22 on the other side wall of the L-shaped structure of the conductive plate 17. A support plate 24 parallel to the other side wall of the L-shaped structure of the conductive plate 17 is also formed on one side wall of the L-shaped structure by bending. One end of the elastic clip 18 is a fixed end of a U-shaped structure, and the other end of the elastic clip 18 is a recess of the U-shaped structure. A cantilever structure formed by an arc bend on one side wall has an avoidance perforation structure 25 formed on the bottom surface of the U-shaped structure at one end of the elastic clip 18. The side wall of the L-shaped structure of the conductive plate 17 can extend into the inner side of the U-shaped structure of the elastic clip 18 through the avoidance perforation structure 25. The bottom surface of the U-shaped structure at one end of the elastic clip 18 stops on the upper side of the support plate 24 on the side wall of the L-shaped structure of the conductive plate 17. A plug-in piece 26 is formed at the root of the side wall of the U-shaped structure at one end of the elastic clip 18 extending outward from the U-shaped structure. The plug-in piece 26 can be inserted into the plug-in groove in the wiring cavity 15 for positioning. The ends of both sides of the U-shaped structure at one end of the elastic clip 18 and the outer surface are tightly attached to the inner side of the wiring cavity 15 and fixedly positioned.

[0054] After the probe holder 3 is inserted into the wiring cavity 15, it is inserted into the clamping space formed by the concave arc surface 23 of the two-branch structure 22 on the other side wall of the conductive plate 17. It is clamped between the two-branch structure 22 on the other side wall of the conductive plate 17, forming a fixed connection with the conductive plate 17. This structure can adjust the length of the probe holder 3 extending out of the probe fixing seat 1 as needed to meet different test space requirements.

Claims

1. An adjustable test probe structure, comprising a probe holder (1) and a probe assembly, wherein the probe holder has a probe mounting hole (2), characterized in that: The probe assembly includes a probe base (3), a movable probe (4), and an elastic element. The probe base is fixedly inserted into the probe mounting hole of the probe mounting base. One end of the probe base can be connected to the communication line (5) for conduction. One end of the movable probe can be slidably inserted into the probe base by a set distance, and the movable probe and the probe base are in communication. The other end of the movable probe extends out of the other end of the probe base to form a test contact end. The elastic element is installed on the probe base and provides the movable probe with an elastic holding force toward the other end of the probe base.

2. The adjustable test probe structure according to claim 1, characterized in that: One end of the probe holder forms a gripping operation end, and the other end of the probe holder is provided with a mushroom head (6) coaxial with the probe mounting hole. The mushroom head can be tightly inserted into the needle insertion hole (8) on the plastic shell of the product to be tested (7).

3. The adjustable test probe structure according to claim 1, characterized in that: The probe holder is a tubular structure, with a fixed probe (9) fixedly inserted into one end of the probe holder. The elastic element is a spring (10), which is inserted into the probe holder. The two ends of the spring elastically extend and retract tightly abut against one end face of the fixed probe and the movable probe, respectively.

4. The adjustable test probe structure according to claim 3, characterized in that: The fixed probe has a guide hole, and the movable probe has a guide post (11) with a reduced diameter at one end and an extension section (12) with a reduced diameter at the other end. The middle section (13) of the movable probe can slide and make contact with the inner wall of the probe seat. The spring is sleeved on the outside of the guide post of the movable probe. The guide post of the movable probe can be slidably inserted into the guide hole of the fixed probe. The spring is clamped between the end face of the fixed probe facing the movable probe and the surface of one end of the middle section of the movable probe. The inner side of the probe seat has an inner convex stop ring or a T-shaped hole with one end inner diameter larger than the other end inner diameter. The probe seat is fixedly inserted into the end with the larger diameter of the probe mounting hole. The other surface of the middle section of the movable probe stops on the stepped surface between the two ends of the inner convex stop ring or the probe mounting hole.

5. The adjustable test probe structure according to claim 1, characterized in that: The other end of the movable probe has a probe contact (14) with an outwardly widened diameter.

6. The adjustable test probe structure according to claim 1, characterized in that: The communication line is directly connected to one end of the probe holder, and extends through the probe mounting hole to the outside of the probe holder to connect and conduct with the test equipment.

7. The adjustable test probe structure according to claim 1, characterized in that: The probe holder also has a wiring cavity (15) and an inlet hole (16) communicating with the wiring cavity on the side wall of the probe holder. One end of the probe holder extends into the wiring cavity. A conductive plate (17) is fixedly installed in the wiring cavity. An elastic clip (18) is also provided in the wiring cavity. One end of the elastic clip is fixedly installed in the wiring cavity. The other end of the elastic clip can elastically clamp the communication line entering through the inlet hole with the conductive plate, thereby realizing the conduction between the conductive plate and the communication line. One end of the probe holder is connected to at least one of the conductive plate and the elastic clip.

8. The adjustable test probe structure according to claim 7, characterized in that: A wiring operation handle (19) is also installed on the probe holder, which can move within a certain range. One end of the wiring operation handle extends into the wiring cavity and is connected to the other end of the elastic clip. The other end of the wiring operation handle protrudes from the surface of the probe holder to form an operation end. Pressing the operation end of the wiring operation handle can drive the other end of the elastic clip to move, so that it overcomes its own elasticity and moves away from the conductive plate, thus releasing the communication line.

9. The adjustable test probe structure according to claim 8, characterized in that: The operating end of the wiring operation handle is connected to the outer side of the probe fixing seat through a flexible connecting piece (20). The connecting piece provides the wiring operation handle with an elastic restoring force to keep the other end of the elastic clip clamping the communication line. Pressing the operating end of the wiring operation handle can simultaneously drive the connecting piece and the elastic clip to deform.

10. The adjustable test probe structure according to claim 7, characterized in that: The conductive plate has an L-shaped structure. The outer side of the conductive plate is fixedly positioned against the inner sidewall of the wiring cavity. The inner side of one sidewall of the L-shaped conductive plate forms a conductive contact surface (21). The other sidewall of the L-shaped conductive plate forms a two-branch structure with a central opening (22). Concave arc surfaces (23) are formed on the opposite sidewalls of the two-branch structure. One end of the probe holder can be tightly clamped between the concave arc surfaces of the two-branch structure on the other sidewall of the L-shaped conductive plate. A support plate (24) parallel to the other sidewall of the L-shaped conductive plate is also formed on one sidewall of the L-shaped conductive plate by bending. One end of the elastic clip is the fixed end of the U-shaped structure, and the other end of the elastic clip is the end of the U-shaped structure. A cantilever structure is formed by an arc bend on one side wall. A clearance perforation structure (25) is formed on the bottom surface of the U-shaped structure at one end of the elastic clip. The side wall of the L-shaped structure of the conductive plate can extend into the inner side of the U-shaped structure of the elastic clip through the clearance perforation structure. The bottom surface of the U-shaped structure at one end of the elastic clip stops on the upper side of the support plate on the side wall of the L-shaped structure of the conductive plate. A plug-in piece (26) is formed at the root of the side wall of the U-shaped structure at one end of the elastic clip, extending outward from the U-shaped structure. The plug-in piece can be inserted into the plug-in groove in the wiring cavity for positioning. The ends of the two side walls and the outer surface of the U-shaped structure at one end of the elastic clip are tightly attached to the inner side of the wiring cavity and fixedly positioned.

Images