Butt-clamping electrical testing device

Abstract

The utility model relates to a butt-clamping electrical testing device which comprises a first probe, a second probe and a probe driving unit. The probe driving unit includes: a probe driving cam having an outer edge including a region in which a distance from a center point gradually increases and a region in which a distance from the center point gradually decreases; the probe driving motor drives the probe driving cam to rotate; a hollow area exists in the sliding seat, and the first probe is fixed at one end part in the hollow area of the sliding seat; the base is located in the hollow area of the sliding seat, the second probe is arranged on the side, facing the first probe, of the base, and the probe driving cam is located at the other end in the hollow area of the base and the sliding seat; the outer edges of the two sides of the probe driving cam abut against the sliding base and the base respectively, and the sliding base and the base are driven to move in the opposite direction or the reverse direction when the probe driving cam rotates, so that the first probe and the second probe move in the opposite direction or the reverse direction to clamp an electronic element to be tested. The clamp electricity testing device has the advantages of being compact and efficient in structure and capable of meeting the design requirement for compactness of the rotating auxiliary tower.

Description

Technical Field

[0001] This utility model relates to a detection device, and more particularly to a clamp-on electrical measuring device. Background Technology

[0002] With the trend towards miniaturization and integration of electronic components, rotating sub-towers (such as SMT pick-and-place machine feeders and semiconductor testing turntables) are increasingly widely used in the electronics manufacturing industry. Please refer to... Figure 1 The rotating sub-tower A is a compactly arranged tower-like structure with a ring-shaped turntable B at its top. Electronic component C is fixed to a position on the turntable of the rotating sub-tower. The probe mechanism includes a probe D for detecting the electronic component and a probe driving mechanism E. When the electronic component is placed on the rotating sub-tower, it needs to be detected by the probe mechanism to ensure that the electronic component functions correctly.

[0003] Existing technologies for inspecting electronic components on a rotating sub-tower typically employ a multi-drive system to drive multiple probe mechanisms to work collaboratively, bringing these probes into contact with the electronic component under test to complete the inspection. Because each probe has its own drive system, the space occupied by the drive system is excessive when multiple probes work together, resulting in a bulky structure in existing inspection devices that conflicts with the compact design requirements of the rotating sub-tower. Utility Model Content

[0004] Based on this, the purpose of this utility model is to provide a clamping electrical testing device that can drive two probes to move towards each other and clamp the electronic component to be tested by rotating a cam.

[0005] A clamp-on electrical testing device includes a first probe, a second probe, and a probe driving unit; the probe driving unit includes:

[0006] The probe-driven cam has two outer edges on both sides of its cross-section that include regions where the distance from the center point gradually increases and regions where the distance gradually decreases.

[0007] A probe drive motor drives the probe drive cam to rotate.

[0008] The sliding seat has a hollow area inside, and the first probe is fixed to one end of the hollow area of ​​the sliding seat.

[0009] The base is located in the hollow area of ​​the sliding seat, the second probe is located on the side of the base facing the first probe, and the probe driving cam is located at the other end of the hollow area of ​​the base and the sliding seat;

[0010] The outer edges of the probe-driven cam abut against the sliding seat and the base, respectively. When the probe-driven cam rotates, it drives the sliding seat and the base to move in opposite directions, thereby driving the first probe and the second probe to move in opposite directions, clamping the electronic component to be tested to complete the test. The sliding seat positions the first probe and the second probe on the same side of the probe-driven cam, causing the first probe and the second probe to extend outward relative to the probe-driven cam by a certain distance, so that they can extend above the annular tray of the rotating sub-tower and be aligned with the electronic component to be tested.

[0011] Compared with the prior art, the clamping electrical testing device of this utility model improves the utilization rate of the testing space by driving the rotation of a probe-driven cam to move the first probe unit and the second probe unit toward each other to clamp the electronic component to be tested.

[0012] Furthermore, the probe driving unit also includes a fixed base, a first guide rail, a second guide rail, a first spring, and a second spring; the first guide rail and the second guide rail are arranged parallel to each other on the fixed base; the sliding seat is disposed on the first guide rail and can slide on the first guide rail, and the base is disposed on the second guide rail and can slide on the second guide rail; both ends of the first spring are fixed to the fixed base and the sliding seat respectively, and one end of the second spring is fixed to the fixed base and the other end is fixed to the base; the first spring applies a force to the sliding seat pointing towards the probe driving cam; the second spring applies a force to the second probe pointing towards the probe driving cam. This ensures that the second rotating component disposed on the second probe unit always remains in contact with the probe driving cam.

[0013] Furthermore, the sliding seat is provided with a first rotating member fixed to its axis, and the base is provided with a second rotating member fixed to its axis. One outer edge of the probe driving cam abuts against the sliding seat through the first rotating member, and the other outer edge of the probe driving cam abuts against the base through the second rotating member. The first rotating member and the sliding seat slide in the first guide rail, and the second rotating member and the base slide in the second guide rail, through a region where the distance between the outer edge of the probe driving cam and the center point gradually increases and decreases. When the probe driving cam rotates, it drives the first rotating member and the second rotating member to rotate, thereby reducing the friction between the probe driving cam and the sliding seat and the second probe.

[0014] Furthermore, a proximity sensor is also provided on the mounting base, which detects the distance moved by the first probe and the second probe. This allows for feedback correction of the rotational error of the probe drive motor using the sensing data from the proximity sensor, and the proximity sensor's identification data is used as calibration for resetting the probe drive motor.

[0015] Furthermore, the first probe is mounted on a base and can slide within the base, the base being fixed to one end of the hollow region of the sliding seat; a first buffer spring is provided between the first probe and the base; a second buffer spring is provided between the second probe and the base. When the first probe and the second probe contact the electronic component to be tested, due to the pressure, the first probe and the second probe slide within the first probe unit and the second probe unit; at this time, the first buffer spring and the second buffer spring are compressed, applying pressure to the first probe and the second probe pointing towards the electronic component to be tested, keeping the first probe and the second probe in contact with the electronic component to be tested and providing a certain buffering effect.

[0016] Furthermore, it also includes a height adjustment unit, which comprises a height adjustment base, a height adjustment guide rail, a height adjustment slider, a height adjustment motor, a height adjustment cam, and a height adjustment rotating component. The height adjustment guide rail is disposed on the height adjustment base; the height adjustment slider is fixed to the fixed base and is embedded in the height adjustment guide rail and can slide within the guide rail; the height adjustment cam is fixed to the output end of the height adjustment motor and can be driven to rotate by the motor; the height adjustment rotating component is fixed to the bottom of the height adjustment slider and abuts against the edge of the cam; when the cam rotates, it causes the slider and the fixed base to slide on the guide rail. When the motor drives the cam to rotate, the slider moves in the height direction through the interaction between the rotating component and the cam, thereby causing the probe drive unit, the first probe unit, and the second probe unit to move in the height direction, thus adapting to different height detection requirements.

[0017] Furthermore, the height adjustment unit also includes a height adjustment spring; one end of the height adjustment spring is fixed to the height adjustment seat, and the other end is fixed to the height adjustment slider; the height adjustment spring applies a force to the height adjustment slider pointing towards the height adjustment cam, ensuring that the height adjustment rotating member disposed on the height adjustment slider is always in contact with the edge of the height adjustment cam.

[0018] Furthermore, it also includes a lateral position adjustment unit, which includes a mounting base with a linear guide rail on the mounting base. The height adjustment seat is embedded in the linear guide rail and can slide along the linear guide rail. This allows adjustment of the lateral positions of the height adjustment unit, probe driving unit, first probe unit, and second probe unit to adapt to different detection requirements.

[0019] Furthermore, the lateral position adjustment unit also includes a locking block and a locking handle. The locking block is disposed on the mounting base, and the locking handle is disposed at the end of the locking block. By rotating the locking handle, the locking block can lock the position of the height adjustment seat in the linear guide rail.

[0020] To better understand and implement this invention, the following detailed description is provided in conjunction with the accompanying drawings. Attached Figure Description

[0021] Figure 1 A schematic diagram of the rotating auxiliary tower and detection device in the prior art;

[0022] Figure 2 This is a schematic diagram of the overall structure of the clamp-on electrical measuring device of this utility model;

[0023] Figure 3 This is an exploded view of the probe unit of this utility model;

[0024] Figure 4 This is an exploded view of the probe driving unit structure of this utility model;

[0025] Figure 5 This is a side sectional view of the clamp-on electrical measuring device of this utility model;

[0026] Figure 6 This is a side sectional view of the sliding seat structure;

[0027] Figure 7 This is a top view of the sliding seat structure;

[0028] Figure 8 This is a schematic diagram of a probe-driven cam structure.

[0029] Figure 9 This is a schematic diagram of the height adjustment unit structure of this utility model;

[0030] Figure 10 This is a schematic diagram of the lateral position adjustment unit structure of this utility model.

[0031] Reference numerals: 10-First probe unit; 12-First probe; 14-Base; 141-Probe sliding groove; 142-Buffer spring receiving hole; 143-Pin sliding groove; 16-First pin; 18-First buffer spring; 20-Second probe unit; 22-Second probe; 24-Base; 26-Second pin; 28-Second buffer spring; 30-Probe drive unit; 31-Fixed seat; 311-Insulating gasket; 32-First guide rail; 33-Second guide rail; 34-Sliding seat; 35-Probe drive motor; 36-Probe drive cam; 37A - First rotating component; 37B - Second rotating component; 38A - First spring; 38B - Second spring; 38C - Second spring stop; 39 - Sensor mounting base; 391 - Proximity sensor; 40 - Height adjustment unit; 41 - Height adjustment seat; 42 - Height adjustment guide rail; 43 - Height adjustment slider; 44 - Height adjustment motor; 45 - Height adjustment cam; 46 - Height adjustment rotating component; 47 - Height adjustment spring; 50 - Lateral position adjustment unit; 51 - Mounting base; 511 - Linear guide rail; 52 - Locking block; 53 - Locking handle. Detailed Implementation

[0032] This invention redesigns the structure of a clamping electrical measuring device. By using a cam to simultaneously drive two probes to move towards each other, the two probes clamp the electronic component to be tested to measure the electrical performance of the electronic component. It has the advantages of compact structure and high efficiency, and is suitable for the compact design requirements of the rotating sub-tower.

[0033] Please see Figure 2 The clamping and testing device of this utility model includes a first probe unit 10, a second probe unit 20, a probe driving unit 30, a height adjustment unit 40, and a lateral position adjustment unit 50. The probe driving unit 30 drives the first probe 12 of the first probe unit 10 and the second probe 22 of the second probe unit 20 to move towards each other to clamp the electronic component under test, or to move in opposite directions to release the electronic component under test, via a probe driving cam 36. The height adjustment unit 40 drives the probe driving unit 30, the first probe unit 10, and the second probe unit 20 to rise and fall in the height direction to adapt to different rotating sub-tower heights. The lateral position adjustment unit 50 adjusts the position of the height adjustment unit 40 in the horizontal plane to adjust the horizontal position of the first probe 12 and the second probe 22.

[0034] For details, please refer to Figure 3The first probe unit 10 includes a first probe 12, a base 14, a first pin 16, and a first buffer spring 18. The base 14 is a square box with a probe sliding groove 141 inside. The first probe 12 is disposed within the probe sliding groove 141, with its probe tip exposed outside the base 14. The first probe 12 can slide along the probe sliding groove 141. The top cover of the base 14 has a pin sliding groove 143. One end of the first pin 16 is embedded in and fixed to the first probe 12, while the other end is located within the pin sliding groove 143. The first pin 16 slides within the pin sliding groove 143 as the first probe 12 slides, and is limited by the pin sliding groove 143. A buffer spring receiving hole 142 is provided on the side wall of the base 14, and the buffer spring receiving hole 142 and the pin sliding groove 143 form a communicating space inside the base 14. The first buffer spring 18 is placed in the buffer spring receiving hole 142, with one end fixedly connected to the first pin 16 and the other end fixedly connected to the base 14. When the probe tip of the first probe contacts the electronic component to be tested, it generates a contact force with the electronic component, causing the probe tip of the first probe 12 to slide inward into the base 14 within the probe sliding groove 141. At this time, the first buffer spring 18 is compressed, and a pressure is applied to the first probe 12 pointing towards the electronic component to be tested, keeping the first probe 12 in contact with the electronic component to be tested and providing a certain buffering effect.

[0035] The second probe unit 20 includes a second probe 22, a base 24, a second pin 26, and a second buffer spring 28. Its structure is the same as that of the first probe unit 10, and will not be described again in this embodiment.

[0036] Please see Figure 4 and Figure 5 The probe driving unit 30 includes a fixed base 31, a first guide rail 32, a second guide rail 33, a sliding base 34, a probe driving motor 35, and a probe driving cam 36.

[0037] The first guide rail 32 has two parallel tracks and is mounted on the fixed base 31.

[0038] The second guide rail 33 also has two parallel tracks. The second guide rail is disposed on the fixed base 31 and is located between the two tracks of the first guide rail 32, and is parallel to the first guide rail 32.

[0039] Please see Figure 7 and Figure 8The sliding seat 34 is an annular plate structure with a hollow area. The base 14 of the first probe unit 10 is fixed to one end of the annular structure of the sliding seat 34, and the detection tip of the first probe 12 points to the hollow area of ​​the sliding seat 34. The bottom of the sliding seat 34 is placed on the first guide rail 32 and slides along the first guide rail 32. The base 24 of the second probe unit 20 is disposed on the second guide rail 33 and slides along the second guide rail 33. When the second probe unit 20 slides on the second guide rail 33, it is always located in the hollow area of ​​the sliding seat 34, and the detection tip of the second probe 22 points to the detection tip of the first probe 12.

[0040] Please see Figure 8 The distance between the outer edge of the probe-driven cam 36 and its rotation axis varies continuously, including regions where the distance from the center point gradually increases and regions where the distance gradually decreases. In this embodiment, the cross-section of the probe-driven cam 36 is a centrally symmetrical shape, and the outer edge of one half of the probe-driven cam includes regions where the distance from the center point gradually increases and regions where the distance from the center point gradually decreases. Specifically, the distance from the outer edge of the probe-driven cam 36 to its rotation axis is maximized at 0°, and the distance from its outer edge to the rotation axis first decreases and then increases from 0° to 180°, and the outer edge shape of the probe-driven cam from 180° to 360° is centrally symmetrical to the outer edge shape from 0° to 180°.

[0041] The probe drive motor 35 is mounted on the fixed base 31, and the probe drive cam 36 is fixed on the motor shaft of the probe drive motor 35. The rotation axis of the probe drive cam 36 is the motor shaft of the probe drive motor 35, and the probe drive motor 35 drives the probe drive cam 36 to rotate.

[0042] In another embodiment, the outer edges of the probe driving cam 36 on both sides directly abut against the sliding seat 34 and the base 24, respectively.

[0043] Preferably, in this embodiment, the probe driving unit 30 further includes a first rotating member 37A and a second rotating member 37B. The axis of the first rotating member 37A is fixed to the bottom of the end of the sliding seat 34 opposite to the mounting position of the first probe unit 10, and the outer edge of the first rotating member 37A abuts against the outer edge of the probe driving cam 36. The axis of the second rotating member 37B is fixed to the bottom of the end of the base 24 of the second probe unit 20 away from the detection tip of the second probe 22, and the outer edge of the second rotating member 37B abuts against the outer edge of the probe driving cam 36. The first rotating member 37A and the second rotating member 37B symmetrically abut against the outer edge of the probe driving cam 36. When the probe driving cam 36 rotates, it can drive the first rotating member 37A and the second rotating member 37B that abut against it to rotate, thereby reducing friction.

[0044] When the sliding seat 34 contacts the probe drive cam 36 via the first rotating member 37A, and the second probe unit 20 contacts the probe drive cam 36 via the second rotating member 37B, the first probe unit 10 and the second probe unit 20 are located on the same side of the probe drive cam 36, such that the first probe 12 and the second probe 22 extend a distance relative to the probe drive cam 36 to one side, so as to extend above the annular tray of the rotating sub-tower and align with the electronic component to be tested.

[0045] When the first rotating member 37A and the second rotating member 37B move in the region where the distance from the outer edge of the probe driving cam 36 to the axis gradually increases, the outer edge of the probe driving cam 36 pushes the first rotating member 37A and the second rotating member 37B to move in opposite directions. Through the sliding seat 34, the first probe unit 10 moves closer to the probe driving cam 36, and the second probe unit 20 moves away from the probe driving cam 36, thereby shortening the straight-line distance between the first probe 12 and the second probe 22, thus clamping the electronic component under test.

[0046] Furthermore, the probe driving unit 30 also includes a first spring 38A. When the sliding seat 34 is placed on the first guide rail 32, the two ends of the first spring 38A are respectively fixed to the sliding seat 34 and the fixed seat 31. When the first rotating member 37A abuts against the point where the distance from the outer edge of the probe driving cam 36 to the axis is minimum, the first spring 38A is in a free state; otherwise, the first spring 38A is in a stretched state, which applies a force to the sliding seat 34 pointing towards the probe driving cam 36, so that the first rotating member 37A disposed on the sliding seat 34 always remains in contact with the probe driving cam 36.

[0047] The probe driving unit 30 further includes a second spring 38B and a second spring stop 38C. A second spring receiving hole is also provided on the fixed base 31, located below the second guide rail 33. The second spring stop 38C is disposed at the bottom of the base 24 of the second probe unit 20. When the second probe unit 20 is placed on the second guide rail 33, both ends of the second spring 38B are fixed to the inner wall of the second spring receiving hole and the second spring stop 38C, respectively, i.e., both ends are fixed to the fixed base 31 and the base 24. When the second rotating member 37B abuts against the point where the distance from the outer edge of the probe driving cam 36 to the axis is minimum, the second spring 38B is in a free state; otherwise, the second spring 38B is in a stretched state, applying a force pointing towards the center of the probe driving cam 36 to the second spring stop 38C, ensuring that the second rotating member 37B disposed on the base 24 always remains in contact with the probe driving cam 36.

[0048] Preferably, a sensor mounting base 39 is also erected on the fixed base 31, and a proximity sensor 391 is mounted on the sensor mounting base 39. The sensing end of the proximity sensor 391 is perpendicular to the sliding direction of the first probe unit 10 and the second probe unit 20 and points towards the first probe unit 10 and the second probe unit 20. When the probe drive cam 36 rotates, the proximity sensor 391 detects the displacement of the first probe unit 10 and the second probe unit 20. This allows for feedback correction of the rotation error of the probe drive motor 35 using the sensing data of the proximity sensor 391, and the identification data of the proximity sensor 391 is used as calibration for resetting the probe drive motor 35.

[0049] Please see Figure 9 The height adjustment unit 40 includes a height adjustment seat 41, a height adjustment guide rail 42, a height adjustment slider 43, a height adjustment motor 44, a height adjustment cam 45, a height adjustment rotating component 46, and a height adjustment spring 47. The height adjustment seat 41 is an L-shaped plate with a long side block and a short side block. The height adjustment guide rail 42 is disposed on the outer surface of the long side block of the height adjustment seat 41. The height adjustment slider 43 is also an L-shaped plate with a long side block and a short side block. The inner surface of the long side block of the height adjustment slider 43 is embedded in the height adjustment guide rail 42 and can slide along the height adjustment guide rail 42 in the height direction. An insulating pad 311 is also fixed to the bottom of the fixed base 31. The outer surface of the short side block of the height adjustment slider 43 is fixed to the insulating pad 311, thereby being fixedly connected to the fixed base 31.

[0050] The height adjustment motor 44 is fixed to the long side block of the height adjustment seat 41, with its motor shaft exposed on the outer side of the long side block. The height adjustment cam 45 is fixed to the motor shaft of the height adjustment motor 44 and rotates with the motor shaft. In this embodiment, the outer edge of the height adjustment cam 45 is elliptical. The axis of the height adjustment rotating member 46 is fixed to the bottom end of the long side block of the height adjustment slider 43, and the outer edge of the height adjustment rotating member 46 abuts against the outer edge of the height adjustment cam 45 to prevent wear of the height adjustment cam 45 during transmission. The height adjustment spring 47 is disposed on the outer side surface of the long side block of the height adjustment seat 41, with one end fixed to the height adjustment seat 41 and the other end fixed to the height adjustment slider 43. In this embodiment, the height adjustment spring 47 is always in a stretched state to apply a force to the height adjustment slider 43 pointing towards the height adjustment cam 45, so that the height adjustment rotating member 46 disposed on the height adjustment slider 43 is always in contact with the edge of the height adjustment cam 45.

[0051] When the height adjustment motor 44 drives the height adjustment cam 45 to rotate, the height adjustment slider 43 moves in the height direction through the cooperation between the height adjustment rotating member 46 and the height adjustment cam 45, thereby driving the probe drive unit 30, the first probe unit 10 and the second probe unit 20 to move in the height direction to adapt to the detection requirements of different heights.

[0052] Please see Figure 10 The lateral position adjustment unit 50 includes a mounting base 51, a locking block 52, and a locking handle 53. The bottom surface of the mounting base 51 can be fixed to a testing station next to the rotating sub-tower. A linear guide rail 511 is provided on the top surface of the mounting base 51. The short side block of the height adjustment seat 41 can be embedded in the linear guide rail 511 and slide along it to adjust the lateral position of the height adjustment seat 41, thereby adjusting the intrusion positions of the first probe 12 and the second probe 22 within the rotating sub-tower to adapt to different testing requirements. The locking block 52 is handle-shaped and is disposed on the mounting base 51, locking the position of the height adjustment seat 41 within the linear guide rail 511. In this embodiment, the locking block 52 can rotate around the mounting base 51 to adjust its elevation angle, preventing interference between the height adjustment seat 41 and the locking block 52 when moving within the linear guide rail 511. The locking handle 53 is located at the end of the locking block 52. By rotating the locking handle 53, the locking block 52 can be locked and the height adjustment seat 41 can be locked in the linear guide rail 511.

[0053] In this embodiment, the first guide rail 32, the second guide rail 33, the height adjustment guide rail 42, and the linear guide rail 511 are all cross roller guide rails; the first rotating component 37A, the second rotating component 37B, and the height adjustment rotating component 46 are bearings.

[0054] In practical use, the mounting base 51 of the lateral position adjustment unit 50 is first fixed to the detection station next to the rotating sub-tower. Then, the height adjustment seat 41 of the height adjustment unit 40 is pushed to slide in the linear guide rail 511 to adjust the lateral intrusion position of the first probe 12 and the second probe 22 in the rotating sub-tower. The locking handle 53 is rotated to lock the locking block 52 and lock the position of the height adjustment seat 41 in the linear guide rail 511. The height adjustment cam 45 is driven to rotate by the height adjustment motor 44 of the height adjustment unit 40. When the height adjustment rotating part 46 abuts against the outer edge of the height adjustment cam 45, it drives the height adjustment slider 43 to slide in the height adjustment guide rail 42, so that the height adjustment slider 43 moves in the height direction, causing the first probe 12 and the second probe 22 to rise and fall. Finally, the probe drive motor 35 of the probe drive unit 30 drives the probe drive cam 36 to rotate. The sliding seat 34 and the second probe unit 20 slide in opposite directions in the first guide rail 32 and the second guide rail 33 through the abutment relationship between the first rotating member 37A and the second rotating member 37B and the probe drive cam 36, so that the first probe unit 10 and the second probe unit 20 fixed on the sliding seat 34 move towards or away from each other to clamp or release the electronic component to be tested, thus completing the entire testing process.

[0055] Compared to existing technologies, the clamping electrical testing device of this invention uses a probe-driven cam to simultaneously drive the first and second probe units to move towards each other, thereby clamping the electronic component to be tested. Its compact design reduces the overall space occupied by the testing mechanism and facilitates testing of electronic components in a rotating sub-tower. It also provides a height adjustment unit to adjust the height of the first and second probe units, and a lateral position adjustment unit to adjust their lateral positions, thus adapting to rotating sub-towers of different specifications. This invention boasts the advantages of a compact and efficient structural design.

[0056] The terminology used in the embodiments of this application is for the purpose of describing particular embodiments only and is not intended to limit the embodiments of this application. The singular forms “a,” “the,” and “the” used in the embodiments and claims of this application are also intended to include the plural forms, unless the context clearly indicates otherwise. It should also be understood that, unless otherwise stated, “a plurality” means two or more; the terms “first,” “second,” “third,” etc., are used only to distinguish and not to describe a particular order or sequence, nor should they be construed as indicating or implying relative importance. The term “and / or” as used herein refers to and includes any or all possible combinations of one or more associated listed items. When the above description relates to drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. In the description of this application, those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0057] The above-described embodiments are merely one specific implementation of this utility model, and while the descriptions are detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these modifications and improvements all fall within the protection scope of this utility model.

Claims

1. A clamp-on electrical measuring device, characterized in that: It includes a first probe, a second probe, and a probe driving unit; the probe driving unit includes: The probe-driven cam has two outer edges on both sides of its cross-section that include regions where the distance from the center point gradually increases and regions where the distance gradually decreases. A probe drive motor drives the probe drive cam to rotate. The sliding seat has a hollow area inside, and the first probe is fixed to one end of the hollow area of ​​the sliding seat. The base is located in the hollow area of ​​the sliding seat, the second probe is located on the side of the base facing the first probe, and the probe driving cam is located at the other end of the hollow area of ​​the base and the sliding seat; The outer edges of the probe driving cam abut against the sliding seat and the base respectively. When the probe driving cam rotates, it drives the sliding seat and the base to move in opposite directions, thereby driving the first probe and the second probe to move in opposite directions.

2. The clamp-on electrical measuring device according to claim 1, characterized in that: The probe driving unit further includes a fixed base, a first guide rail, a second guide rail, a first spring, and a second spring; the first guide rail and the second guide rail are arranged parallel to each other on the fixed base; the sliding seat is disposed on the first guide rail and can slide on the first guide rail, and the base is disposed on the second guide rail and can slide on the second guide rail; both ends of the first spring are fixed to the fixed base and the sliding seat respectively, and one end of the second spring is fixed to the fixed base and the other end is fixed to the base; the first spring applies a force to the sliding seat pointing towards the probe driving cam; The second spring applies a force to the second probe that points toward the probe drive cam.

3. The clamp-on electrical measuring device according to claim 2, characterized in that: The sliding seat is provided with a first rotating member with a fixed axis, and the base is provided with a second rotating member with a fixed axis. One outer edge of the probe driving cam abuts against the sliding seat through the first rotating member, and the other outer edge of the probe driving cam abuts against the base through the second rotating member. The first rotating member and the sliding seat are pushed to slide in the first guide rail by the region where the distance between the outer edge of the probe driving cam and the center point gradually increases and gradually decreases, and the second rotating member and the base are pushed to slide in the second guide rail.

4. The clamp-on electrical measuring device according to claim 2, characterized in that: The mounting base is also equipped with a proximity sensor, which detects the distance moved by the first probe and the second probe.

5. The clamp-on electrical measuring device according to any one of claims 1-4, characterized in that: The first probe is mounted on a base and can slide within the base, the base being fixed to one end of the hollow area of ​​the sliding seat; a first buffer spring is provided between the first probe and the base; a second buffer spring is provided between the second probe and the base.

6. The clamp-on electrical measuring device according to claim 2, characterized in that: It also includes a height adjustment unit, which comprises a height adjustment base, a height adjustment guide rail, a height adjustment slider, a height adjustment motor, a height adjustment cam, and a height adjustment rotating component. The height adjustment guide rail is mounted on the height adjustment base. The height adjustment slider is fixed to the fixed base and is embedded in the height adjustment guide rail, allowing it to slide within the guide rail. The height adjustment cam is fixed to the output end of the height adjustment motor and can be driven to rotate by the motor. The height adjustment rotating component is fixed to the bottom of the height adjustment slider and abuts against the outer edge of the height adjustment cam. When the height adjustment cam rotates, it causes the height adjustment slider and the fixed base to slide on the height adjustment guide rail.

7. The clamp-on electrical measuring device according to claim 6, characterized in that: The height adjustment unit also includes a height adjustment spring; one end of the height adjustment spring is fixed to the height adjustment seat, and the other end is fixed to the height adjustment slider; the height adjustment spring applies a force to the height adjustment slider that points towards the height adjustment cam.

8. The clamp-on electrical measuring device according to claim 7, characterized in that: It also includes a lateral position adjustment unit, which includes a mounting base and a linear guide rail. The height adjustment seat is embedded in the linear guide rail and can slide along the linear guide rail.

9. The clamp-on electrical measuring device according to claim 8, characterized in that: The lateral position adjustment unit also includes a locking block and a locking handle. The locking block is disposed on the mounting base, and the locking handle is disposed at the end of the locking block. By rotating the locking handle, the locking block can lock the position of the height adjustment seat in the linear guide rail.

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