Test system applied to electrical performance test of electronic component

Abstract

The utility model provides a test system applied to an electrical performance test of an electronic component, particularly relates to the technical field of electronic test, and comprises a main control computer, a vector network analyzer, a multi-channel switching module and a tested electronic component interface module. The system is communicated with the vector network analyzer through the main control computer, so that sending and receiving of a test instruction are realized. The vector network analyzer outputs test signals, and the test signals are distributed to a plurality of test ports of the tested electronic component interface module through the multi-channel switching module. The tested electronic component interface module is connected with a plurality of electronic components, transmits test signals and receives feedback. According to the system, the efficiency and the accuracy of the electrical performance test of the electronic component are remarkably improved, the labor cost and the operation error rate are reduced, and the technical problems of low test efficiency and large error are effectively solved.

Description

Technical Field

[0001] This utility model relates to the field of electronic testing technology, and more specifically, to a testing system for testing the electrical performance of electronic components. Background Technology

[0002] With the rapid development of the electronic components industry, the types and quantities of electronic components are constantly increasing, and the demand for testing their electrical performance is also growing. Traditional testing methods mainly rely on manual operation, which is inefficient, prone to errors, and difficult to meet the needs of large-volume, high-precision testing. Especially in high-frequency, high-precision testing scenarios, the limitations of manual operation are even more obvious, and the accuracy and consistency of test results are difficult to guarantee, seriously affecting the R&D and production efficiency of electronic components.

[0003] In existing technologies, the electrical performance testing of electronic components typically involves manually connecting test leads to a vector network analyzer. While this method can accomplish the testing task to some extent, it has significant drawbacks: First, each test requires manual reconnection of the test leads, which is not only time-consuming but also prone to inconsistent connection states, affecting the accuracy of the test results. Second, the testing process requires collaboration among multiple people, and prolonged high-intensity work can easily lead to fatigue among test personnel, increasing the error rate. Finally, the storage and processing of test data rely on manual operation, which is time-consuming and prone to errors, further reducing testing efficiency.

[0004] In conclusion, solving the technical problems of low efficiency and large errors in the electrical performance testing of electronic components is an urgent issue that needs to be addressed. Utility Model Content

[0005] The main objective of this invention is to provide a testing system for testing the electrical performance of electronic components, thereby addressing the technical problems of low efficiency and large errors in testing the electrical performance of electronic components. Through one-time connection, automated testing, and multi-channel design, the system significantly improves the efficiency and accuracy of testing the electrical performance of electronic components, while reducing labor costs and operational error rates.

[0006] Firstly, in order to achieve the above objectives, this utility model provides a testing system for testing the electrical performance of electronic components, the testing system comprising:

[0007] Main control computer, vector network analyzer, multi-channel switching module, and interface module for the electronic components under test;

[0008] The main control computer is communicatively connected to the vector network analyzer;

[0009] The vector network analyzer is connected to the interface module of the electronic component under test through the multi-channel switching module, and the interface module of the electronic component under test is connected to the electronic component under test.

[0010] The main control computer is used to send test commands to the vector network analyzer and control the channel switching of the multi-channel switching module; the vector network analyzer is used to respond to the test commands and output test signals to the multi-channel switching module, and the vector network analyzer is also used to receive feedback signals from the electronic components under test; the multi-channel switching module is used to switch and distribute the test signals to multiple test ports of the electronic component under test interface module; the electronic component under test interface module is used to connect multiple electronic components under test and transmit the test signals to each electronic component under test.

[0011] Furthermore, the multi-channel switching module includes a switch matrix and multiple cable assemblies. The input end of the switch matrix is ​​connected to the test port of the vector network analyzer, and the output end of the switch matrix is ​​connected to the interface module of the electronic component under test through the cable assemblies.

[0012] Furthermore, the switch matrix includes multiple radio frequency switches, which are connected to the vector network analyzer and the interface module of the electronic component under test respectively via the cable assembly.

[0013] Furthermore, the cable assembly includes:

[0014] The first cable group connects the vector network analyzer to the input terminal of the switch matrix;

[0015] The second cable group connects the output terminal of the switch matrix to the interface module of the electronic component under test.

[0016] The first and second cable groups adopt a double-layer shielding structure, the connector types of the first and second cable groups are 2.92-J or 2.4-K, and the operating frequency range of the first and second cable groups is DC to 40GHz.

[0017] Furthermore, the interface module for the electronic component under test includes:

[0018] Multiple test ports, each test port corresponds to one electronic component under test;

[0019] The test ports are connected one-to-one with the output terminals of the switch matrix via the second cable group.

[0020] Furthermore, the main control computer also includes:

[0021] An automatic save module is connected to the vector network analyzer to store the test data generated by the vector network analyzer; wherein, the automatic save module supports multiple data formats, including S2P format and image format.

[0022] Furthermore, the switch matrix consists of 10 40GHz radio frequency switches, and the circuit layout of the switch matrix supports 24-channel parallel signal transmission.

[0023] Furthermore, the shielding layer thickness of the first cable group and the second cable group is 0.5 mm, and the conductor spacing is 0.1 mm; the amplitude consistency of the first cable group and the second cable group is less than 0.2 dB, the phase consistency is less than ±5°, and the standing wave ratio is less than 1.25.

[0024] Furthermore, the main control computer and the vector network analyzer are connected via a GPIB interface or a LAN interface.

[0025] This invention provides a testing system for electrical performance testing of electronic components. The system includes a main control computer, a vector network analyzer, a multi-channel switching module, and an interface module for the electronic components under test (DUT). The main control computer communicates with the vector network analyzer, which in turn connects to the DUT interface module via the multi-channel switching module. The DUT interface module further connects to the DUT. The main control computer sends test commands to the vector network analyzer and controls the channel switching of the multi-channel switching module. The vector network analyzer responds to the commands by outputting test signals and simultaneously receives feedback signals from the DUT. The multi-channel switching module distributes the test signals to multiple test ports of the DUT interface module, which in turn connects multiple DUTs and transmits the test signals. This system significantly improves the efficiency and accuracy of electrical performance testing of electronic components while reducing labor costs and operational error rates. Attached Figure Description

[0026] The accompanying drawings, which form part of this application, are used to provide a further understanding of the present invention. The illustrative embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an undue limitation of the present invention. In the drawings:

[0027] Figure 1 This is a connection diagram of a test system for testing the electrical performance of electronic components, which is an optional embodiment of this utility model. Detailed Implementation

[0028] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0029] According to the embodiments of this utility model, a test system for testing the electrical performance of electronic components is provided, such as... Figure 1 As shown, this utility model provides a testing system for electrical performance testing of electronic components. The system includes: a main control computer, a vector network analyzer, a multi-channel switching module, and an interface module for the electronic component under test. The main control computer is communicatively connected to the vector network analyzer. The vector network analyzer is connected to the interface module for the electronic component under test through the multi-channel switching module, and the interface module for the electronic component under test is connected to the electronic component under test. The main control computer sends test commands to the vector network analyzer and controls the channel switching of the multi-channel switching module. The vector network analyzer responds to the test commands and outputs test signals to the multi-channel switching module. The vector network analyzer also receives feedback signals from the electronic component under test. The multi-channel switching module distributes the test signals to multiple test ports of the interface module for the electronic component under test. The interface module for the electronic component under test connects multiple electronic components under test and transmits the test signals to each electronic component under test. In specific implementation, the system includes the following components and their connection methods:

[0030] 1. Main control computer

[0031] The main control computer, serving as the system's control center, is equipped with dedicated testing software for generating and sending test commands to the vector network analyzer. This computer uses a standard PC configuration and communicates with the vector network analyzer via Ethernet or USB interface to ensure the accuracy and stability of command transmission.

[0032] 2. Vector Network Analyzer

[0033] The vector network analyzer is the core device of the test system, used to generate and receive test commands. This analyzer possesses high-precision and high-stability measurement capabilities, responding to test commands sent by the main control computer and generating corresponding test signals. These test signals are processed by internal circuitry and output to the multi-channel switching module. Simultaneously, the vector network analyzer is also responsible for receiving feedback signals from the electronic components under test (DUT), performing signal processing and data analysis, and ultimately returning the test results to the main control computer. Test commands are digital control commands sent by the main control computer to the test equipment (such as the vector network analyzer). Essentially, they are coded signals following specific communication protocols (such as SCPI and GPIB). They are transmitted through digital interfaces (such as GPIB, LAN, and USB) and are used to configure test parameters (such as frequency range and power level), trigger device actions (such as starting measurement and switching channels), and manage the test process (such as executing automated scripts). The core function of the test commands is to act as the system's "control center," coordinating the collaborative work of various modules through logical instructions. However, they do not directly act on the DUT itself, but rather indirectly achieve the test objectives by controlling downstream equipment. Test signals are analog or radio frequency electrical signals generated by a vector network analyzer (VNA), and are essentially continuous time-domain waveforms (such as sine waves, pulse signals, and swept-frequency signals). They are applied to the device under test (DUT) through a physical transmission medium (such as coaxial cable or microwave waveguide) to simulate actual operating conditions or measure device characteristics (such as S-parameters, impedance, and transmission loss). Test signals act directly on the input terminals of the DUT, acquiring physical response data through an excitation-feedback mechanism, and are the core tool for functional verification in a test system.

[0034] In summary, the essential difference between test commands and test signals lies in:

[0035] Signal type: The test command is a digital protocol command, and the test signal is an analog / RF electrical signal;

[0036] Generation Components: Test commands are generated by the main control computer, and test signals are generated by the VNA;

[0037] Transmission path: Test commands are transmitted to the device control terminal via the control bus, and test signals are transmitted to the device under test via the physical link;

[0038] Functional positioning: Test commands are used for system control and parameter configuration, and test signals are used for device excitation and data acquisition.

[0039] 3. Multi-channel switching module

[0040] The multi-channel switching module employs a high-speed relay array or solid-state relay array design to achieve the switching and distribution of test signals. This module receives test signals from the vector network analyzer and, according to instructions from the host computer, switches the test signals to one of the multiple test ports of the interface module of the electronic component under test. The design of the multi-channel switching module ensures rapid switching of test signals between multiple electronic components under test, improving testing efficiency.

[0041] 4. Interface module of the electronic component under test

[0042] The Component Under Test (DUT) interface module is used to connect multiple DUTs and transmit test signals to each DUT. This module includes multiple test ports, each equipped with an interface (such as SMA, BNC, etc.) compatible with the DUT. The DUTs connect to the test ports through the corresponding interfaces, ensuring accurate transmission of test signals. Simultaneously, feedback signals from the DUTs are also returned to the vector network analyzer through this interface module.

[0043] 5. Connection Method Instructions

[0044] The main control computer communicates with the vector network analyzer via an Ethernet or USB interface.

[0045] The vector network analyzer is connected to a multi-channel switching module via internal circuitry, and outputs test signals to this module.

[0046] The multi-channel switching module receives test signals from the vector network analyzer and, according to the instructions of the main control computer, switches the test signals to the designated test port of the interface module of the electronic component under test.

[0047] The electronic component under test is connected to the test port of the electronic component under test interface module through the corresponding interface to realize the transmission of test signals and the reception of feedback signals.

[0048] 6. System Working Principle

[0049] Under the control of the main control computer, the vector network analyzer generates test signals and switches them to the designated test port of the interface module of the electronic component under test (ECU) via a multi-channel switching module. Upon receiving the test signals, the ECU generates corresponding feedback signals. These feedback signals are then returned to the vector network analyzer through the ECU's interface module, where they undergo signal processing and data analysis. Finally, the test results are displayed or stored by the main control computer. This system solves the technical problems of low efficiency and large errors in the electrical performance testing of electronic components. Through one-time connection, automated testing, and multi-channel design, it significantly improves the efficiency and accuracy of electronic component electrical performance testing while reducing labor costs and operational error rates.

[0050] Specifically, the multi-channel switching module includes a switch matrix and multiple cable assemblies. The input terminal of the switch matrix is ​​connected to the test port of the vector network analyzer, and the output terminal of the switch matrix is ​​connected to the interface module of the electronic component under test via the cable assemblies. The specific structure and connection method of the multi-channel switching module are described below:

[0051] 1. Multi-channel switching module

[0052] The multi-channel switching module is a key component of the test system, responsible for efficiently switching the test signals generated by the vector network analyzer to multiple test ports of the interface module of the electronic component under test. This module specifically includes a switch matrix and multiple cable assemblies.

[0053] 2. Switching Matrix

[0054] The switch matrix is ​​the core component of the multi-channel switching module. Its design employs high-performance relay arrays or solid-state relay arrays to ensure stable signal transmission and rapid switching. The input terminals of the switch matrix are directly connected to the test ports of the vector network analyzer, allowing test signals generated by the analyzer to be directly input into the switch matrix.

[0055] 3. Cable assembly

[0056] The cable assemblies are responsible for transmitting the output signals of the switch matrix to the interface module of the electronic component under test (ECU). One end of each cable assembly connects to an output terminal of the switch matrix, and the other end connects to a test port of the ECU interface module. The selection of cable assemblies must consider factors such as signal attenuation, impedance matching, and transmission speed to ensure accurate transmission of the test signals.

[0057] 4. Connection method

[0058] Connection between the switch matrix and the vector network analyzer: The input terminals of the switch matrix are connected to the test ports of the vector network analyzer via a dedicated coaxial cable or fiber optic cable. This connection method ensures the stability and accuracy of the test signal during transmission.

[0059] Connection between the switch matrix and the cable assembly: Each output of the switch matrix is ​​connected to the corresponding cable assembly via a dedicated connector (such as SMA, BNC, etc.). This connection method ensures stable signal transmission and facilitates the replacement and maintenance of the cable assembly.

[0060] Connection between cable assemblies and the interface module of the electronic component under test: The other end of each cable assembly is also connected to a test port of the interface module of the electronic component under test via a dedicated connector. In this way, when the switch matrix switches the test signal according to the instructions of the main control computer, the signal can be quickly and accurately transmitted to the designated test port of the interface module of the electronic component under test.

[0061] 5. System Working Principle

[0062] Under the control of the main control computer, the vector network analyzer generates test signals and switches them to a designated cable assembly via a switch matrix. These test signals are then transmitted through the cable assembly to the corresponding test port of the interface module of the electronic component under test (ECU), thereby performing electrical performance testing on the ECU. The feedback signal from the ECU returns to the vector network analyzer via the same path, where it undergoes signal processing and data analysis.

[0063] Specifically, the switch matrix includes multiple radio frequency (RF) switches, which are connected to the vector network analyzer and the interface module of the electronic component under test (ECU) via cable assemblies. Specifically, the switch matrix includes ten 40GHz RADIALL switches (i.e., RF switches), which are connected to the vector network analyzer and the ECU interface module via 60 semi-steel cable assemblies. Two cable assemblies connect the vector network analyzer to the switch matrix panel VNA, two cable assemblies connect the switch matrix panel VNA to primary switches SW1-SW2, eight cable assemblies connect primary switches SW1-SW2 to secondary switches SW3-SW10, and finally, 48 cable assemblies connect secondary switches SW3-SW10 to switch matrix panels 1-1-2-24. Both ends (A and B) of these cable assemblies use 2.92-J connectors, and the technical specifications are: frequency range DC to 40GHz, amplitude consistency <0.2dB, phase consistency <±5°, and VSWR <1.25. Furthermore, the connection relationships between the RF switches and the switch matrix panel interfaces are clearly defined. For example, the C-code of SW1 is connected to VNA1, and the I-code of SW1 is responsible for connecting to channels 1-13, etc. See Table 1 for a detailed table of the connection relationships between the switches and the panel interfaces. This ensures that each RF switch is correctly connected to the corresponding interface module of the electronic component under test. This connection method enables the construction of a multi-channel test system, allowing for efficient and accurate batch testing of the electrical performance parameters of electronic components.

[0064] Table 1: Correspondence between Switches and Panel Interfaces

[0065]

[0066]

[0067] Specifically, the cable assembly includes a first cable group and a second cable group. The first cable group connects the vector network analyzer to the input terminal of the switch matrix; the second cable group connects the output terminal of the switch matrix to the interface module of the electronic component under test. The first and second cable groups employ a double-shielded structure, and the connector types of both are 2.92-J or 2.4-K. The operating frequency range of both the first and second cable groups is DC to 40GHz. In specific implementations, the cable assembly includes a first cable group and a second cable group, both employing a double-shielded structure to ensure signal stability and anti-interference capability. The first cable group is responsible for connecting the vector network analyzer to the input terminal of the switch matrix. Specifically, each cable in the first cable group includes a 2.92-J or 2.4-K type connector, which is designed for high-frequency signal transmission and ensures good electrical performance within the DC to 40GHz operating frequency range. The other end of the first cable group is connected to the input terminal of the switch matrix, enabling signal input through a specific interface. The second cable assembly connects the output of the switch matrix to the interface module of the electronic component under test (ECU). Similar to the first cable assembly, each cable in the second assembly uses a 2.92-J or 2.4-K type connector and also features a double-shielded structure to support an operating frequency range from DC to 40GHz. The other end of the second cable assembly connects to the ECU interface module, transmitting the signal output from the switch matrix to the ECU for electrical performance testing. This cable assembly design achieves an efficient and stable connection between the vector network analyzer, the switch matrix, and the ECU interface module. When constructing a multi-channel test system, an appropriate number of cable assemblies can be selected based on actual needs to ensure accurate and reliable test results for each test channel.

[0068] Specifically, the electronic component under test (DUT) interface module includes multiple test ports, each corresponding to a DUT. These test ports are connected one-to-one to the output of the switch matrix via the second cable group. Specifically, each test port in the DUT interface module is equipped with a dedicated connection interface, which corresponds one-to-one with the cables in the second cable group. Each cable in the second cable group is connected to the output of the switch matrix via a specific connector (such as a 2.92-J or 2.4-K type connector) to ensure accurate signal transmission. Simultaneously, the other end of these cables is connected to the test port in the DUT interface module via a corresponding connector, forming a complete signal transmission path. In practical applications, when a specific DUT needs to be tested, simply connect the DUT to the corresponding test port. Subsequently, the switch matrix opens the corresponding signal channel according to the test requirements, allowing the test signal generated by the vector network analyzer to be transmitted to the DUT via the second cable group. After the test is completed, the signal is transmitted back to the switch matrix via the second cable group and finally analyzed and processed by the vector network analyzer to obtain the test results. This design allows the interface module for the electronic components under test to support simultaneous testing of multiple electronic components, significantly improving testing efficiency. Furthermore, since each test port corresponds to a specific electronic component, the accuracy and reliability of the tests are ensured. In addition, the double-shielded structure and specific connector type of the second cable group further enhance the stability and anti-interference capabilities of signal transmission.

[0069] Specifically, the main control computer also includes an automatic save module, which is connected to the vector network analyzer to store the test data generated by the analyzer. The automatic save module supports multiple data formats, including S2P and image formats. As the core control unit of the test system, the main control computer's hardware configuration includes, but is not limited to, a processor, memory, storage devices, and network interfaces. At the software level, the main control computer runs dedicated test control software, which includes multiple functional modules to support various stages of the test process. The automatic save module is a crucial component of the main control computer's software architecture. This module is designed to communicate directly with the vector network analyzer to receive and store the test data generated by the analyzer in real time. To achieve this, the automatic save module establishes a connection with the vector network analyzer through standard communication interfaces (such as GPIB, LAN, or USB). Regarding data format support, the automatic save module exhibits high flexibility and compatibility. Specifically, this module can recognize and store multiple data formats, including but not limited to S2P and image formats. The S2P format is a standard data format widely used in the microwave and radio frequency fields for storing measurement results of scattering parameters (such as S-parameters). Image formats (such as PNG and JPEG) are used to store graphical representations of test results, facilitating intuitive analysis by testers. In actual operation, after the vector network analyzer completes a test, the generated test data is immediately transmitted to the main control computer's automatic saving module. This module then saves the data to the specified storage location according to the preset configuration information, storing it in the appropriate data format. For example, if the tester wants to save the S-parameter data, the automatic saving module will save the data as an S2P file; if they want to save the graphical representation of the test results, it will automatically generate and save it as an image file. In this way, the main control computer's automatic saving module not only ensures the integrity and accuracy of the test data but also greatly improves the automation and efficiency of the testing process. Testers can easily acquire and analyze test data without manual intervention, thereby accelerating the product development and verification process.

[0070] Specifically, the switch matrix consists of 10 40GHz RF switches, and its circuit layout supports 24-channel parallel signal transmission. The switch matrix comprises precisely configured 10 40GHz RF switches. These RF switches operate stably in a frequency range up to 40GHz and feature low loss, high isolation, and fast switching speeds. These characteristics are crucial for ensuring signal transmission integrity and reducing signal interference. In terms of circuit layout, the switch matrix employs an advanced design to support 24-channel parallel signal transmission. Specifically, each RF switch is cleverly connected to a specific signal path to form a complex switch network. This network can flexibly select and activate specific signal channels as needed, thereby achieving 24-channel parallel transmission. To achieve this, wiring techniques and signal isolation measures are used in the circuit layout. Wiring techniques ensure the continuity and stability of the signal path, reducing signal loss and interference during transmission. Signal isolation measures effectively prevent crosstalk between different channels, ensuring that each channel can transmit signals independently and accurately. Furthermore, the switch matrix is ​​equipped with necessary control and interface circuits to achieve precise control of the RF switches. The control circuit is responsible for receiving commands or signals from the outside and controlling the switching states of the RF switches accordingly. The interface circuit provides a communication interface with external devices or systems to enable data transmission and exchange. In summary, the switch matrix in this embodiment successfully achieves 24-channel parallel signal transmission by employing 10 40GHz RF switches and an advanced circuit layout design. This switch matrix not only boasts advantages such as high performance, high reliability, and flexibility, but is also widely used in various high-frequency signal transmission scenarios, such as wireless communication and radar systems.

[0071] Specifically, the shielding layer thickness of the first and second cable groups is 0.5 mm, and the conductor spacing is 0.1 mm. The amplitude consistency of the first and second cable groups is less than 0.2 dB, the phase consistency is less than ±5°, and the VSWR is less than 1.25. Both the first and second cable groups employ rigorous manufacturing processes to ensure a shielding layer thickness of 0.5 mm. This thickness design aims to provide sufficient electromagnetic shielding, effectively reducing the impact of external electromagnetic interference on signal transmission, while maintaining the flexibility and durability of the cables. Regarding conductor layout, the conductor spacing of the first and second cable groups is precisely controlled at 0.1 mm. This minute spacing design not only helps reduce electromagnetic coupling between conductors and improve signal transmission quality but also ensures effective cable group layout within a compact space, meeting the requirements of high-density integration. In terms of electrical performance, the first and second cable groups exhibit excellent consistency. Specifically, their amplitude consistency is less than 0.2 dB, meaning that during signal transmission, the amplitude difference between different cables is strictly controlled within a very small range, thereby ensuring signal stability and accuracy. Furthermore, phase consistency is controlled within ±5°, ensuring minimal phase shift during signal transmission and contributing to the maintenance of signal coherence and accurate phase relationships. This is particularly important for systems requiring precise phase control, such as radar, communication, and measurement systems. Simultaneously, the standing wave ratio (VSWR), a crucial indicator of signal reflection, is controlled below 1.25 in both the first and second cable assemblies. This low VSWR design helps reduce signal reflection on the transmission line, improving transmission efficiency and power utilization, thereby optimizing overall system performance. In summary, the first and second cable assemblies in this embodiment, through precisely controlled shielding thickness, conductor spacing, and superior electrical performance, provide a stable, reliable, and efficient solution for high-frequency signal transmission. These cable assemblies are particularly suitable for applications with extremely high requirements for signal quality and consistency, such as high-speed communication, precision measurement, and radar detection.

[0072] Specifically, the main control computer and the vector network analyzer communicate via either a GPIB interface or a LAN interface. The communication connection between the main control computer and the vector network analyzer employs one of two interface methods: a GPIB interface or a LAN interface. Both interface methods are widely used in the test and measurement field to achieve stable and efficient communication between devices. When using the GPIB interface, the main control computer connects to the GPIB interface of the vector network analyzer through its built-in GPIB controller or an external GPIB interface card. The GPIB interface is a standardized instrument interface that supports serial communication between multiple instruments and provides a transmission channel for commands, data, status, and other signals. Through the GPIB interface, the main control computer can send control commands to the vector network analyzer, receive test data, and monitor the instrument status in real time. On the other hand, when using the LAN interface, both the main control computer and the vector network analyzer are connected to the same local area network (LAN). Through the TCP / IP protocol, the main control computer can establish a network connection with the vector network analyzer and perform data transmission and control. LAN interfaces offer advantages such as high transmission speed, long communication distance, and easy expansion, making them suitable for scenarios requiring long-distance communication or multi-device networking. Regardless of the interface method used, the communication connection between the main control computer and the vector network analyzer ensures accurate data transmission and precise instrument control. This provides strong support for achieving functions such as automated testing, data analysis, and remote monitoring. In summary, this embodiment achieves a stable and efficient communication connection between the main control computer and the vector network analyzer through either a GPIB or LAN interface, providing reliable technical support for applications in the test and measurement field.

[0073] The above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A testing system for testing the electrical performance of electronic components, characterized in that, include: Main control computer, vector network analyzer, multi-channel switching module, and interface module for the electronic components under test; The main control computer is communicatively connected to the vector network analyzer; The vector network analyzer is connected to the interface module of the electronic component under test through the multi-channel switching module, and the interface module of the electronic component under test is connected to the electronic component under test. The main control computer is used to send test commands to the vector network analyzer and control the channel switching of the multi-channel switching module; the vector network analyzer is used to respond to the test commands and output test signals to the multi-channel switching module, and the vector network analyzer is also used to receive feedback signals from the electronic components under test; the multi-channel switching module is used to switch and distribute the test signals to multiple test ports of the electronic component under test interface module; the electronic component under test interface module is used to connect multiple electronic components under test and transmit the test signals to each electronic component under test.

2. The testing system according to claim 1, characterized in that, The multi-channel switching module includes a switch matrix and multiple cable assemblies. The input end of the switch matrix is ​​connected to the test port of the vector network analyzer, and the output end of the switch matrix is ​​connected to the interface module of the electronic component under test through the cable assemblies.

3. The testing system according to claim 2, characterized in that, The switch matrix includes multiple radio frequency switches, which are connected to the vector network analyzer and the interface module of the electronic component under test respectively through the cable assembly.

4. The testing system according to claim 2, characterized in that, The cable assembly includes: The first cable group connects the vector network analyzer to the input terminal of the switch matrix; The second cable group connects the output terminal of the switch matrix to the interface module of the electronic component under test. The first and second cable groups adopt a double-layer shielding structure, the connector types of the first and second cable groups are 2.92-J or 2.4-K, and the operating frequency range of the first and second cable groups is DC to 40GHz.

5. The testing system according to claim 4, characterized in that, The interface module for the electronic component under test includes: Multiple test ports, each test port corresponds to one electronic component under test; The test ports are connected one-to-one with the output terminals of the switch matrix via the second cable group.

6. The testing system according to claim 1, characterized in that, The main control computer also includes: An automatic save module is connected to the vector network analyzer to store the test data generated by the vector network analyzer; wherein, the automatic save module supports multiple data formats, including S2P format and image format.

7. The testing system according to claim 2, characterized in that, The switch matrix consists of 10 40GHz radio frequency switches, and the circuit layout of the switch matrix supports 24-channel parallel signal transmission.

8. The testing system according to claim 4, characterized in that, The shielding layer thickness of the first cable group and the second cable group is 0.5 mm, and the conductor spacing is 0.1 mm; the amplitude consistency of the first cable group and the second cable group is less than 0.2 dB, the phase consistency is less than ±5°, and the standing wave ratio is less than 1.

25.

9. The testing system according to claim 1, characterized in that, The main control computer and the vector network analyzer communicate with each other via a GPIB interface or a LAN interface.

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