Chip high and low temperature test tool

Abstract

The utility model discloses a chip high and low temperature test tool which comprises a bottom plate, one side of the upper end face of the bottom plate is fixedly provided with a stand column, the top of the stand column is fixedly connected with an upper cross beam, the stand column penetrates through a middle sliding block in a sliding mode, the middle of the upper end face of the upper cross beam is fixedly provided with an air cylinder barrel, and the output end of the air cylinder barrel is fixedly connected with the middle sliding block. Two mounting seats are mounted on the middle sliding block, a rotating plate is rotationally arranged on the bottom plate, a rotating motor is arranged at the bottom of each mounting seat, an output shaft of each rotating motor is connected with the corresponding rotating plate, and a workbench is arranged on the upper end face of each rotating plate. The chip high and low temperature test tool can be used for testing two groups of chips at one time and testing cold and heat exchange, is convenient to test and very practical, can be used for testing one or more chips due to the arrangement of the replaceable connecting cover, and is high in applicability.

Description

Technical Field

[0001] This utility model belongs to the field of chip testing technology, specifically relating to a chip high and low temperature testing fixture. Background Technology

[0002] After the chip is packaged at the packaging plant, it needs to undergo temperature testing. The commonly used testing method is to test it on an automated chip testing system. However, the automated chip testing system is not equipped with the function of testing the ambient temperature of the chip. The testing process involves placing the chip in a high and low temperature test chamber, which is quite cumbersome. Some testing fixtures can only perform a single test, such as high temperature or low temperature. After one test is completed, the other test is performed, which is very troublesome. Utility Model Content

[0003] The purpose of this invention is to provide a high and low temperature testing fixture for chips to solve the problems mentioned in the background art.

[0004] To achieve the above objectives, this utility model provides the following technical solution: a chip high and low temperature testing fixture, comprising a base plate, a column fixedly mounted on one side of the upper surface of the base plate, an upper crossbeam fixedly connected to the top of the column, the column sliding through an intermediate slider, a cylinder fixedly mounted in the middle of the upper surface of the upper crossbeam, the output end of the cylinder fixedly connected to the intermediate slider, two mounting seats mounted on the intermediate slider, a rotating plate rotatably mounted on the base plate, a rotary motor mounted at the bottom of the mounting seats, the output shaft of the rotary motor connected to the rotating plate, and a worktable provided on the upper surface of the rotating plate.

[0005] Preferably, the intermediate slider includes a main board, a connecting plate, a first clamping plate, and a second clamping plate. The connecting plate is integrally disposed at one end of the main board. The first clamping plate is disposed on one side of the connecting plate and fixedly connected to the main board. The inner end of the second clamping plate is connected to the connecting plate, and the second clamping plate is disposed on the outer side of the first clamping plate. A mounting socket is provided between the first clamping plate and the connecting plate, and a mounting socket is also provided between the second clamping plate and the connecting plate.

[0006] Preferably, both the outer ends of the first and second clamping plates are provided with screw holes, and bolts pass through the screw holes and are screwed onto the connecting plate.

[0007] Preferably, the lower end of the mounting base is snapped with a connecting cover, and the side of the connecting cover is screwed with a locking screw.

[0008] Preferably, a heat insulation pad is provided between the rotating plate and the worktable.

[0009] Preferably, the workbench includes a tabletop, on which a chip placement platform is movably disposed. A groove is provided on the chip placement platform, and a lifting plate is provided at the bottom of the groove. A connecting rod is provided on the lifting plate, and a movable opening is provided on the chip placement platform corresponding to the connecting rod. A pulley is provided at the bottom of the tabletop, and one end of the connecting rod is connected to a lower pressure plate via a rope, with the rope passing through the pulley. The lower pressure plate is movably disposed on the tabletop.

[0010] The technical effects and advantages of this utility model are as follows: This chip high and low temperature testing fixture can test two sets of chips at one time and perform cold and heat exchange tests. It is convenient and very practical. Moreover, the replaceable connection cover can be used to test single or multiple chips, making it highly applicable.

[0011] The groove on the workbench is an inverted trapezoidal structure, which automatically adjusts the placed chip to the center position, eliminating the need for multiple manual adjustments and ensuring accurate chip placement. The lifting plate can also be moved upwards, bringing the chip closer to the upper cold and heat sources for convenient high and low temperature testing. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the structure of this utility model;

[0013] Figure 2 This is a side view of the structure of this utility model;

[0014] Figure 3 This is a schematic diagram of the intermediate slider structure of this utility model;

[0015] Figure 4 This is a schematic diagram of the workbench structure of this utility model.

[0016] In the diagram: 1. Base plate; 2. Column; 3. Upper crossbeam; 4. Middle slider; 41. Main board; 42. Connecting plate; 43. First clamping plate; 44. Second clamping plate; 45. Screw hole; 46. Mounting base socket; 5. Cylinder cylinder; 6. Mounting base; 7. Connecting cover; 8. Turning plate; 9. Workbench; 91. Table; 92. Chip placement platform; 93. Lifting plate; 94. Movable opening; 95. Connecting rod; 96. Rope; 97. Pulley; 98. Lower pressure plate; 10. Rotary motor. Detailed Implementation

[0017] The specific embodiments of this utility model will be further described below with reference to the accompanying drawings. It should be noted that these descriptions are for the purpose of aiding understanding of this utility model, but do not constitute a limitation thereof. Furthermore, the technical features involved in the various embodiments of this utility model described below can be combined with each other as long as they do not conflict with each other.

[0018] This utility model provides, for example Figure 1-3 The illustrated chip high and low temperature testing fixture includes a base plate 1, a column 2 fixedly mounted on one side of the upper surface of the base plate 1, an upper crossbeam 3 fixedly connected to the top of the column 2, the column 2 sliding through a middle slider 4, a cylinder 5 fixedly mounted in the middle of the upper surface of the upper crossbeam 3, the output end of the cylinder 5 fixedly connected to the middle slider 4, two mounting seats 6 mounted on the middle slider 4, a connecting cover 7 snapped onto the lower end of the mounting seat 6, and a locking screw screw threaded onto the side of the connecting cover 7. The connecting cover 7 is replaceable, and by replacing the connecting cover 7 with different sizes, single or multiple chips can be tested. A rotating plate 8 is rotatably mounted on the base plate 1, and a support bearing is mounted on the lower surface of the rotating plate 8 to allow the rotating plate 8 to rotate smoothly. A rotary motor 10 is mounted at the bottom of the mounting seat 6, and the output shaft of the rotary motor 10 is connected to the rotating plate 8. A worktable 9 is provided on the upper surface of the rotating plate 8. A heat insulation pad is placed between the rotating plate 8 and the worktable 9 to reduce temperature transfer and avoid damage to the equipment. The rotary motor 10 drives the rotating plate 8 to rotate, thereby rotating the worktable 9 and causing the chips on the worktable 9 to change position.

[0019] The intermediate slider 4 includes a main board 41, a connecting plate 42, a first clamping plate 43, and a second clamping plate 44. The connecting plate 42 is integrally disposed at one end of the main board 41. The first clamping plate 43 is disposed on one side of the connecting plate 42 and is fixedly connected to the main board 41. The inner end of the second clamping plate 44 is connected to the connecting plate 42, and the second clamping plate 44 is disposed on the outer side of the first clamping plate 43. A mounting socket 46 is provided between the first clamping plate 43 and the connecting plate 42, and a mounting socket 46 is also provided between the second clamping plate 44 and the connecting plate 42. The outer ends of the first clamping plate 43 and the second clamping plate 44 are provided with screw holes 45. Bolts pass through the screw holes 45 and are screwed onto the connecting plate 42. The mounting seat 6 is inserted into the mounting socket 46, and the bolts inserted into the screw holes 45 are used to fix the mounting seat 6 firmly.

[0020] During use, the high and low temperature testing fixture for this chip is first placed on the workbench 9, with each set positioned below a separate mounting base 6. After the mounting base 6 is connected to the high and low temperature impact testing machine, one mounting base 6 outputs high temperature data, while the other outputs low temperature data. The middle slider 4 moves downwards, causing the connecting cover 7 to engage with the chip for testing. After the test, the middle slider rises, and the rotary motor 10 rotates the workbench 9 180°, switching the positions of the two sets of chips for another temperature test. This allows for both high and low temperature testing, which is very convenient. It can also be used to test a single set of chips, making it highly practical, flexible, and easy to use.

[0021] As an example of this application: Figure 4As shown, the workbench 9 includes a platform 91, on which a chip placement platform 92 is movably mounted. The chip placement platform 92 has a groove, and a lifting plate 93 is located at the bottom of the groove. A connecting rod 95 is mounted on the lifting plate 93, and a movable opening 94 is formed on the chip placement platform 92 corresponding to the connecting rod 95. A pulley 97 is located at the bottom of the platform 91. One end of the connecting rod 95 is connected to a lower pressure plate 98 via a rope 96, and the rope 96 passes through the pulley 97. The lower pressure plate 98 is movably mounted on the platform 91. In practical use, the chip is placed in the groove, which has an inverted trapezoidal structure. This allows the chip to be automatically adjusted to the center position without requiring multiple manual adjustments, ensuring accurate chip placement. During testing, the mounting base 6 and other structures move downwards, pressing down on the lower pressure plate 98. This, in conjunction with the rope 96, causes the lifting plate 93 to move upwards, bringing the chip closer to the upper cold and heat sources for convenient high and low temperature testing.

[0022] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A chip high and low temperature testing fixture, comprising a base plate (1), a column (2) fixedly installed on one side of the upper end face of the base plate (1), an upper crossbeam (3) fixedly connected to the top of the column (2), the column (2) slidingly passing through an intermediate slider (4), a cylinder (5) fixedly installed in the middle of the upper end face of the upper crossbeam (3), and the output end of the cylinder (5) fixedly connected to the intermediate slider (4), characterized in that: Two mounting seats (6) are installed on the intermediate slider (4), a rotating plate (8) is rotatably set on the base plate (1), a rotary motor (10) is set at the bottom of the mounting seat (6), the output shaft of the rotary motor (10) is connected to the rotating plate (8), and a worktable (9) is provided on the upper end surface of the rotating plate (8).

2. The chip high and low temperature testing fixture according to claim 1, characterized in that: The intermediate slider (4) includes a main board (41), a connecting plate (42), a first clamping plate (43), and a second clamping plate (44). The connecting plate (42) is integrally disposed at one end of the main board (41). The first clamping plate (43) is disposed on one side of the connecting plate (42) and fixedly connected to the main board (41). The inner end of the second clamping plate (44) is connected to the connecting plate (42), and the second clamping plate (44) is disposed on the outer side of the first clamping plate (43). A mounting socket (46) is provided between the first clamping plate (43) and the connecting plate (42), and a mounting socket (46) is also provided between the second clamping plate (44) and the connecting plate (42).

3. The chip high and low temperature testing fixture according to claim 2, characterized in that: The outer ends of the first clamping plate (43) and the second clamping plate (44) are provided with screw holes (45), and bolts pass through the screw holes (45) and are screwed onto the connecting plate (42).

4. The chip high and low temperature testing fixture according to claim 1, characterized in that: The lower end of the mounting base (6) is fitted with a connecting cover (7), and the side of the connecting cover (7) is screwed with a locking screw.

5. The chip high and low temperature testing fixture according to claim 1, characterized in that: A heat insulation pad is provided between the rotating plate (8) and the workbench (9).

6. The chip high and low temperature testing fixture according to claim 1, characterized in that: The workbench (9) includes a table (91), on which a chip placement stage (92) is movably mounted. A groove is provided on the chip placement stage (92), and a lifting plate (93) is provided at the bottom of the groove. A connecting rod (95) is provided on the lifting plate (93). An opening (94) is provided on the chip placement stage (92) corresponding to the connecting rod (95). A pulley (97) is provided at the bottom of the table (91). One end of the connecting rod (95) is connected to a lower pressure plate (98) via a rope (96), and the rope (96) passes through the pulley (97). The lower pressure plate (98) is movably mounted on the table (91).

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