Intelligent glasses test equipment

Abstract

The utility model discloses intelligent glasses test equipment, which comprises a test board, a lifting mechanism, a test fixture, a butt-joint plate and an ampere meter, the lifting mechanism is arranged on the test bench, and the lifting mechanism is used for driving the butt joint plate to do lifting motion; the test fixture is arranged on the test board, a mainboard is placed on the test fixture, the test fixture is provided with a first probe, and the first probe is used for being in contact with the lower surface of the mainboard; a butt-joint plate is arranged on the test fixture, a second probe is arranged on the butt-joint plate, a glasses leg is placed on the butt-joint plate, the glasses leg is connected with the upper end of the second probe through an electric wire, the butt-joint plate is located above the test fixture, and when the butt-joint plate descends, the lower end of the second probe is in contact with a mainboard; and the ammeter is arranged on the test board and is used for testing the current of the mainboard.

Description

Technical Field

[0001] This utility model relates to the field of smart glasses technology, and in particular to a smart glasses testing device. Background Technology

[0002] Smart glasses refer to "glasses that, like smartphones, have their own independent operating system and can have users install software, games, and other programs provided by software service providers. Smart glasses can be controlled by voice or gestures to add schedules, navigate maps, interact with friends, take photos and videos, and make video calls with friends. They can also access wireless networks through mobile communication networks."

[0003] After the smart glasses are manufactured, a series of tests are required, such as startup tests, motherboard tests, charging tests, operation tests, and programming. However, some existing testing equipment has limited functionality and can only test one function at a time, resulting in low testing efficiency. Utility Model Content

[0004] In order to overcome the shortcomings of the existing technology, the purpose of this utility model is to provide an intelligent glasses testing device to solve the technical problem of low testing efficiency in the existing technology.

[0005] This utility model is achieved by the following technical solution: a smart glasses testing device, including a test platform, a lifting mechanism, a test fixture, a docking plate, and an ammeter;

[0006] The lifting mechanism is mounted on the test platform and is used to drive the docking plate to perform lifting and lowering movements.

[0007] The test fixture is set on the test platform, the motherboard is placed on the test fixture, and the test fixture is provided with a first probe, which is used to contact the lower surface of the motherboard.

[0008] The docking plate is provided with a second probe, the temple of the scope is placed on the docking plate, and the upper end of the temple is connected to the upper end of the second probe by wire. The docking plate is located above the test fixture. When the docking plate is lowered, the lower end of the second probe contacts the main board.

[0009] The ammeter is mounted on the test bench and is used to test the current of the motherboard.

[0010] In one possible implementation, the test fixture includes a fixing plate, a positioning plate, and an elastic element;

[0011] The fixing plate is disposed on the test platform, and the fixing plate is provided with a first guide post;

[0012] The positioning plate is slidably sleeved on the first guide post;

[0013] The upper end of the elastic element is connected to the positioning plate, and the lower end of the elastic element is connected to the fixing plate.

[0014] In one possible implementation, the positioning plate is provided with a positioning groove, and the motherboard is placed in the positioning groove.

[0015] In one possible implementation, the bottom of the positioning groove is provided with a through hole for the first probe to pass through.

[0016] In one possible implementation, the lifting mechanism includes a handle, a rotating connector, and a connecting rod;

[0017] The handle is L-shaped, with the bent part of the handle rotatably connected to one end of the rotating connector, and the end of the handle rotatably connected to the test bench.

[0018] The other end of the rotating connector is rotatably connected to the upper end of the connecting rod;

[0019] The lower end of the connecting rod is connected to the docking plate.

[0020] In one possible implementation, the test stand has a fixed frame with a support member on it. The upper end of the support member is rotatably connected to the end of the handle, and the lower end of the support member has a guide cylinder through which the connecting rod passes.

[0021] In one possible implementation, the mounting bracket is provided with a strip-shaped mounting hole that extends along the height direction, and the support member is mounted to the mounting hole by fastening bolts.

[0022] In one possible implementation, the fixing frame is provided with a second guide post, and the corner of the docking plate is sleeved on the second guide post.

[0023] In one possible implementation, the mating plate is provided with a linear bearing, which is sleeved on the second guide post.

[0024] In one possible implementation, the test bench is equipped with a start switch and a control button.

[0025] Compared with the prior art, the advantages of this utility model are as follows: the user manually drives the lifting mechanism, which in turn drives the docking plate to descend so that the docking plate docks with the test fixture, thereby making the second probe contact the main board on the test fixture, and with the cooperation of the telescope, a series of tests are performed on the main board. The ammeter tests the main board through the first probe to measure the current of the main board for the user's reference. The operation is simple and greatly improves the testing efficiency. Attached Figure Description

[0026] Figure 1 This is a schematic diagram of the structure of the intelligent glasses testing device of this utility model;

[0027] Figure 2 This is an exploded view of the test fixture in the intelligent glasses testing device of this utility model;

[0028] Figure 3 This is a partial structural schematic diagram of the intelligent glasses testing device of this utility model;

[0029] Figure 4 This is a schematic diagram of the intelligent glasses testing device of this utility model from another perspective.

[0030] In the picture:

[0031] 1. Test stand; 11. Fixture; 111. Mounting hole; 112. Second guide post; 12. Support component; 121. Guide cylinder; 13. Start switch; 14. Control button;

[0032] 2. Lifting mechanism; 21. Handle; 22. Rotating connector; 23. Connecting rod;

[0033] 3. Test fixture; 31. First probe; 32. Fixing plate; 321. First guide post; 33. Positioning plate; 331. Positioning groove; 34. Elastic element;

[0034] 4. Docking plate; 41. Second probe; 42. Linear bearing;

[0035] 5. Ammeter. Detailed Implementation

[0036] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0037] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in the embodiments of this application are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.

[0038] Furthermore, the use of terms such as "first" and "second" in this application is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. When the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed in this application.

[0039] like Figure 1-4 The smart glasses testing device shown includes a test platform 1, a lifting mechanism 2, a test fixture 3, a docking plate 4, and an ammeter 5. The lifting mechanism 2 is mounted on the test platform 1 and is used to drive the docking plate 4 to move up and down. The test fixture 3 is mounted on the test platform 1, and the main board is placed on the test fixture 3. The test fixture 3 is provided with a first probe 31, which is used to contact the lower surface of the main board. The docking plate 4 is provided with a second probe 41, and the temples are placed on the docking plate 4. The temples are wired to the upper end of the second probe 41. The docking plate 4 is located above the test fixture 3. When the docking plate 4 is lowered, the lower end of the second probe 41 contacts the main board. The ammeter 5 is mounted on the test platform 1 and is used to test the current of the main board. It should be noted that the user manually drives the lifting mechanism 2, which causes the docking plate 4 to descend and dock with the test fixture 3. The test fixture 3 is used to position the motherboard. The temple can be glued to the docking plate 4 to assist the equipment in testing the motherboard. The ammeter 5 can display the current of the motherboard for the tester to refer to and determine whether the motherboard is qualified. In addition, the test bench 1 has two sets of testing devices so that the equipment can test two motherboards at the same time, improving the testing efficiency.

[0040] The beneficial effects of this utility model are as follows: the user manually drives the lifting mechanism 2, which in turn drives the docking plate 4 to descend, so that the docking plate 4 docks with the test fixture 3, thereby making the second probe 41 contact the main board on the test fixture 3, and with the cooperation of the telescope, a series of tests are performed on the main board. The ammeter 5 tests the main board through the first probe 31 to test the current of the main board for the user's reference. The operation is simple and greatly improves the testing efficiency.

[0041] Please refer to Figure 2In one possible implementation, the test fixture 3 includes a fixed plate 32, a positioning plate 33, and an elastic element 34; the fixed plate 32 is disposed on the test table 1, and a first guide post 321 is provided on the fixed plate 32; the positioning plate 33 is slidably sleeved on the first guide post 321; the upper end of the elastic element 34 is connected to the positioning plate 33, and the lower end of the elastic element 34 is connected to the fixed plate 32. It should be noted that when the motherboard to be tested is placed on the positioning plate 33, the first guide post 321 can guide the positioning plate 33. When the docking plate 4 descends and docks with the positioning plate 33, the positioning plate 33 can be pressed down so that the positioning plate 33 slowly descends a certain distance under the force of the elastic member 34, ensuring the stability of the connection between the docking plate 4 and the positioning plate 33, making the second probe 41 contact the motherboard tightly enough, and avoiding damage to the motherboard. At the same time, when the positioning plate 33 is not descending, the first probe 31 cannot contact the motherboard. When the positioning plate 33 descends, the first probe 31 contacts the motherboard, and the first probe 31 can perform the programming function on the motherboard. The ammeter 5 measures the current of the motherboard through the first probe 31. In addition, there are two first guide posts 321 and two elastic members 34. The two first guide posts 321 are set diagonally, and the two elastic members 34 are set opposite each other.

[0042] Please refer to Figure 2 In one possible implementation, the positioning plate 33 is provided with a positioning groove 331, and the motherboard is placed in the positioning groove 331. It should be noted that the positioning groove 331 can quickly position the motherboard, and the shape of the positioning groove 331 is adapted to the motherboard under test to improve the stability of the motherboard in the positioning groove 331.

[0043] Furthermore, the bottom of the positioning groove 331 is provided with a through hole for the first probe 31 to pass through. It should be noted that the first probe 31 is set on the fixing plate 32, and there are multiple first probes 31 and through holes. Each through hole corresponds to each first probe 31. When the positioning plate 33 is lowered, the first probe 31 passes through the through hole and contacts the lower surface of the main board.

[0044] Please refer to Figure 3In one possible implementation, the lifting mechanism 2 includes a handle 21, a rotating connector 22, and a connecting rod 23. The handle 21 is L-shaped, with its bent portion rotatably connected to one end of the rotating connector 22, and its end rotatably connected to the test platform 1. The other end of the rotating connector 22 is rotatably connected to the upper end of the connecting rod 23, and the lower end of the connecting rod 23 is connected to the docking plate 4. It should be noted that initially, the short arm portion of the L-shaped handle 21 is located inside and parallel to the rotating connector 22. When the user grips the handle 21 and rotates it forward 180°, the rotating connector 22 also rotates 180°. At this time, the short arm portion is located above the rotating connector 22. When the rotating connector 22 rotates, it can descend a certain distance, causing the connecting rod 23 to descend, which in turn drives the docking plate 4 to descend, thereby achieving docking between the second probe 41 plate and the main plate on the positioning plate 33.

[0045] Please refer to Figure 1 In one possible implementation, the test bench 1 has a fixed frame 11, and a support member 12 is provided on the fixed frame 11. The upper end of the support member 12 is rotatably connected to the end of the handle 21, and the lower end of the support member 12 has a guide cylinder 121 through which the connecting rod 23 passes. It should be noted that the fixed frame 11 is perpendicular to the test bench 1, and the back of the fixed frame 11 is provided with reinforcing ribs to improve the structural strength of the fixed frame 11. The support member 12 is installed on the upper end of the fixed frame 11 to support the lifting mechanism 2. Specifically, the support member 12 includes a plate-shaped mounting part and a support arm provided on the mounting part. The upper end of the support arm is rotatably connected to the handle 21, and the guide cylinder 121 is provided at the lower end of the support arm. The guide cylinder 121 can guide the connecting rod 23, so that the connecting rod 23 can only move in the vertical direction, which is beneficial to improving the stability of the movement of the connecting rod 23.

[0046] Please refer to Figure 4 In one possible implementation, the mounting bracket 11 is provided with a strip-shaped mounting hole 111 extending along the height direction, and the support member 12 is mounted at the mounting hole 111 by fastening bolts. It should be noted that the support member 12 is connected to the mounting bracket 11 by fastening bolts, and the user can adjust the height of the support member 12 according to actual needs by adjusting the position of the support member 12 at the mounting hole 111, which is very convenient.

[0047] Please refer to Figure 1In one possible implementation, the fixing frame 11 is provided with a second guide post 112, and the corner of the docking plate 4 is fitted onto the second guide post 112. It should be noted that the upper end of the second guide post 112 is connected to the fixing frame 11, and the lower end of the second guide post 112 is connected to the test platform 1. The second guide post 112 can guide the docking plate 4 to improve the movement stability of the docking plate 4. Furthermore, there are two second guide posts 112, which pass through the two corners of the docking plate 4 respectively.

[0048] Furthermore, the mating plate 4 is provided with a linear bearing 42, which is sleeved on the second guide post 112. It is easy to understand that by providing the linear bearing 42, direct contact between the mating plate 4 and the second guide post 112 can be avoided, thereby reducing friction and improving the smoothness of sliding of the mating plate 4.

[0049] Please refer to Figure 1 In one possible implementation, the test bench 1 is equipped with a start switch 13 and control buttons 14. It should be noted that the test bench 1 also contains a control host, a battery, etc. The start switch 13 is used to start or stop the test equipment, and there are multiple control buttons 14, each used to control different functions of the smart glasses.

[0050] The above embodiments are merely preferred embodiments of this utility model and should not be construed as limiting the scope of protection of this utility model. Any non-substantial changes and substitutions made by those skilled in the art based on this utility model shall fall within the scope of protection claimed by this utility model.

Claims

1. A smart glasses testing device, characterized in that, Includes a test bench, lifting mechanism, test fixture, docking plate, and ammeter; The lifting mechanism is mounted on the test platform and is used to drive the docking plate to perform lifting and lowering movements. The test fixture is set on the test platform, the motherboard is placed on the test fixture, and the test fixture is provided with a first probe, which is used to contact the lower surface of the motherboard. The docking plate is provided with a second probe, the temple of the scope is placed on the docking plate, and the upper end of the temple is connected to the upper end of the second probe by wire. The docking plate is located above the test fixture. When the docking plate is lowered, the lower end of the second probe contacts the main board. The ammeter is mounted on the test bench and is used to test the current of the motherboard.

2. The intelligent glasses testing device as described in claim 1, characterized in that, The test fixture includes a fixing plate, a positioning plate, and an elastic element; The fixing plate is disposed on the test platform, and the fixing plate is provided with a first guide post; The positioning plate is slidably sleeved on the first guide post; The upper end of the elastic element is connected to the positioning plate, and the lower end of the elastic element is connected to the fixing plate.

3. The intelligent glasses testing device as described in claim 2, characterized in that, The positioning plate is provided with a positioning groove, and the motherboard is placed in the positioning groove.

4. The intelligent glasses testing device as described in claim 3, characterized in that, The bottom of the positioning groove is provided with a through hole for the first probe to pass through.

5. The intelligent glasses testing device as described in claim 1, characterized in that, The lifting mechanism includes a handle, a rotating connector, and a connecting rod; The handle is L-shaped, with the bent part of the handle rotatably connected to one end of the rotating connector, and the end of the handle rotatably connected to the test bench. The other end of the rotating connector is rotatably connected to the upper end of the connecting rod; The lower end of the connecting rod is connected to the docking plate.

6. The intelligent glasses testing device as described in claim 5, characterized in that, The test stand has a fixed frame, and the fixed frame is provided with a support member. The upper end of the support member is rotatably connected to the end of the handle, and the lower end of the support member has a guide cylinder, through which the connecting rod passes.

7. The intelligent glasses testing device as described in claim 6, characterized in that, The mounting bracket is provided with strip-shaped mounting holes that extend along the height direction, and the support member is installed at the mounting holes by fastening bolts.

8. The intelligent glasses testing device as described in claim 6, characterized in that, The fixing frame is provided with a second guide post, and the corner of the docking plate is sleeved on the second guide post.

9. The intelligent glasses testing device as described in claim 8, characterized in that, The docking plate is equipped with a linear bearing, which is sleeved on the second guide post.

10. The intelligent glasses testing device as described in claim 1, characterized in that, The test bench is equipped with a start switch and control buttons.

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