Height gauge

Abstract

The utility model discloses a height gauge. The height gauge comprises a base, a first stand column and a measuring mechanism. The measuring mechanism is installed on the first stand column and can move in the first direction. The measuring mechanism comprises a movable seat and a measuring needle assembly, the movable seat is movably installed on the first stand column in the first direction, the measuring needle assembly comprises a first probe, a second probe and a bearing piece, and the first probe and the second probe are movably arranged on the bearing piece and extend towards the placing face. The first probe is used for measuring the height of the first to-be-measured surface, and the second probe is used for measuring the height of the second to-be-measured surface. In the height gauge disclosed by the invention, the first probe and the second probe can move on the bearing piece, so that the first probe and the second probe can respectively measure the height of the first to-be-measured surface and the height of the second to-be-measured surface of the to-be-measured object. In other words, the two to-be-measured surfaces of the to-be-measured object can be measured at the same time through the two probes, the position of the to-be-measured object on the placing surface does not need to be adjusted, and the measurement precision can be improved.

Description

Technical Field

[0001] This application relates to the field of measuring equipment technology, and in particular to a height gauge. Background Technology

[0002] In electronic products, to meet the demands for high performance and advanced technology, the precision requirements for the manufacturing of components are constantly increasing, typically necessitating the use of high-precision measuring equipment. Taking height measurement as an example, existing height gauges usually first measure a reference surface of the object to be measured, and then measure the surface to be measured, thus achieving the relative height of the object. However, during the measurement process, because different surfaces of the object need to be moved for measurement, the placement of the object may not remain consistent, introducing variables that affect measurement accuracy. Utility Model Content

[0003] This application discloses a height gauge for improving the accuracy of measuring the height of an object.

[0004] To achieve the above objectives, this application discloses a height gauge for measuring the height difference between a first and a second surface of an object to be measured, the height gauge comprising:

[0005] A base having a placement surface configured to place an object to be tested;

[0006] A first column is disposed on the base and extends along a first direction;

[0007] The measuring mechanism includes:

[0008] A movable base, which is movably mounted on the first column along the first direction;

[0009] A measuring probe assembly includes a carrier, a first probe, and a second probe. The carrier is connected to the movable seat. The first probe and the second probe are movably disposed on the carrier and extend toward the placement surface. The first probe is configured to measure the height of the first surface to be measured, and the second probe is configured to measure the height of the second surface to be measured.

[0010] As an optional implementation, the carrier is provided with a first mounting part and a second mounting part, the first mounting part and the second mounting part being spaced apart, and along the first direction, the first probe is movably disposed on the first mounting part, and the second probe is movably disposed on the second mounting part.

[0011] As an optional implementation, the first mounting portion is configured as a first groove extending along a second direction and / or a third direction, and the first probe is configured to move within the first groove along the second direction or the third direction; and / or,

[0012] The second mounting portion is configured as a second groove extending along a second direction and / or a third direction, and the second probe is configured to move within the second groove along the second direction or the third direction;

[0013] The first direction, the second direction, and the third direction intersect each other.

[0014] As an optional implementation, the carrier includes:

[0015] The second column has a first end and a second end, the first end being movably mounted on the movable seat along the first direction;

[0016] A support body is disposed at the second end of the second column, and the first probe and the second probe are disposed on the support body.

[0017] As an optional implementation, the movable seat includes:

[0018] The first base body is movably mounted on the first column along the first direction;

[0019] The second base is movably connected to the first base along the second direction, and the second column is movably installed on the second base;

[0020] The second direction intersects with the first direction.

[0021] As an optional implementation, the first base body is provided with a first connecting hole along the first direction, the first column passes through the first connecting hole, and the first base body can rotate around the first direction to drive the second base body to rotate; and / or,

[0022] The second column includes a first section and a second section. The first section extends along the first direction to connect to the second base body. The second section extends along the second direction. The support base body is connected to the second section. The second base body is provided with a second connecting hole along the first direction. The first section passes through the second connecting hole. The second section can rotate around the first direction to drive the support base body to rotate.

[0023] As an optional implementation, the outer peripheral surface of the first column is provided with threads, the first connecting hole is constructed as a threaded hole, and the first column is threadedly connected to the first connecting hole.

[0024] As an optional implementation, the first base body is provided with a first limiting hole along the second direction, the first limiting hole communicating with the first connecting hole. The measuring mechanism further includes a first limiting member disposed in the first limiting hole. When the first limiting member restricts the movement of the first base body, the first limiting member is at least partially located in the first connecting hole to abut against the first column; and / or,

[0025] The second base is provided with a second limiting hole along a third direction, and the second limiting hole communicates with the second connecting hole. The measuring mechanism also includes a second limiting member, which is disposed in the second limiting hole. When the second limiting member restricts the movement of the second column, the second limiting member is at least partially located in the second connecting hole to abut against the second column.

[0026] The third direction intersects with the first direction and the second direction, respectively.

[0027] As an optional implementation, along the second direction, the second seat has a first connecting surface facing the first seat, the first seat is correspondingly provided with a second connecting surface, the first connecting surface is provided with a rotating shaft, the second connecting surface is provided with a third connecting hole corresponding to the rotating shaft, and the rotating shaft is rotatably connected to the third connecting hole;

[0028] The first base body is provided with a third limiting hole along the first direction, the third limiting hole communicating with the third connecting hole. The measuring mechanism further includes a third limiting member, the third limiting member being disposed in the third limiting hole. When the third limiting member restricts the rotation of the rotating shaft, the third limiting member is at least partially located in the third connecting hole to abut against the rotating shaft; and / or,

[0029] Around the circumferential direction of the rotating shaft, the first connecting surface is provided with a plurality of first mating parts, and the second connecting surface is provided with a plurality of second mating parts. Each first mating part is connected to each second mating part. One of the first mating parts and the second mating part is concave, and the other is convex.

[0030] As an optional implementation, the carrier is provided with a sensor configured to detect the measured height of the first probe and / or the second probe;

[0031] The measuring probe assembly further includes a first display and a first button. The first display is disposed on the carrier, and the first button is disposed adjacent to the first display. The first display is electrically connected to the sensor and configured to display the measured height. The first button is electrically connected to the first display and configured to control the measured height displayed on the first display; and / or,

[0032] The movable seat is provided with a second display and a second button. The second button is located adjacent to the second display. The second display is electrically connected to the sensor and is configured to display the measured height. The second button is electrically connected to the second display and is configured to control the measured height displayed on the second display.

[0033] Compared with the prior art, the beneficial effects of this application are as follows:

[0034] The height gauge disclosed in this application comprises a measuring probe assembly including a first probe, a second probe, and a carrier. The first and second probes are movably mounted on the carrier and extend toward the placement surface. The first probe measures the height of a first surface to be measured, and the second probe measures the height of a second surface to be measured. In this height gauge, because the first and second probes are movable on the carrier, they can respectively measure the height of the first and second surfaces of the object under test. This eliminates the need to adjust the position of the object under test on the placement surface, avoiding changes in the object's position that could affect measurement accuracy due to movement of the object switching contact with the probes. In other words, the two probes can simultaneously measure both surfaces of the object under test, thus improving measurement accuracy without needing to adjust the object's position on the placement surface. Attached Figure Description

[0035] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0036] Figure 1 This is a schematic diagram of the height gauge structure disclosed in the embodiments of this application;

[0037] Figure 2 This is a schematic diagram of the structure of the measuring mechanism disclosed in an embodiment of this application;

[0038] Figure 3 This is a top view of the height gauge disclosed in the embodiments of this application;

[0039] Figure 4 for Figure 3 Sectional view at point AA;

[0040] Figure 5 for Figure 4 Enlarged view of point C in the middle;

[0041] Figure 6 for Figure 3 Sectional view at point BB;

[0042] Figure 7 This is an exploded view of the height gauge disclosed in the embodiments of this application;

[0043] Figure 8 This is a schematic diagram of another structure of the measuring mechanism according to an embodiment of this application.

[0044] Icons: 100, Height gauge; 1, Base; 1a, Placement surface; 2, First column; 3, Measuring mechanism; 31, Movable seat; 311, First seat body; 311a, First connecting hole; 311b, First limiting hole; 311c, Second connecting surface; 311d, Third connecting hole; 311e, Third limiting hole; 311f, Second mating part; 312, Second seat body; 312a, Second connecting hole; 312b, Second limiting hole; 312c, First connecting surface; 312d, Rotating shaft; 312e, First mating part; 313 314. Second display; 32. Second button; 32. Measuring probe assembly; 321. Carrier; 321a. First mounting part (first groove); 321b. Second mounting part (second groove); 3211. Second column; a. First end; b. Second end; 3211a. First section; 3211b. Second section; 3212. Carrier base; 322. First probe; 323. Second probe; 324. First display; 325. First button; 33. First limiting member; 34. Second limiting member; 35. Third limiting member;

[0045] 200, Object to be tested; 201, First surface to be tested; 202, Second surface to be tested. Detailed Implementation

[0046] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0047] In this application, the terms "upper," "lower," "horizontal," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are primarily for the purpose of better describing this application and its embodiments, and are not intended to limit the indicated device, element, or component to having a specific orientation, or to be constructed and operated in a specific orientation.

[0048] Furthermore, in addition to indicating location or positional relationship, some of the aforementioned terms may also have other meanings. For example, the term "above" may also be used in some cases to indicate a certain dependency or connection relationship. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0049] Furthermore, the terms "installation," "setup," "equipped with," and "connection" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0050] Furthermore, the terms "first," "second," etc., are primarily used to distinguish different devices, elements, or components (which may be the same or different in specific type and construction), and are not intended to indicate or imply the relative importance or quantity of the indicated devices, elements, or components. Unless otherwise stated, "a plurality of" means two or more.

[0051] In electronic products, to meet the demands for high performance and advanced technology, the precision requirements for the manufacturing of components are constantly increasing. This typically necessitates the use of high-precision measuring equipment. Taking height measurement as an example, height gauges in related technologies usually first measure the reference surface of the object to be measured, and then measure the surface to be measured, thus achieving the measurement of the relative height of the object. Specifically, after the first contact with the reference surface (or the surface to be measured), the height gauge reading is zeroed. The second contact with the surface to be measured (or the reference surface) yields the measured value, which is the height difference of the measured object. This process requires moving the object to change the contact surface of the height gauge probe. Since the measuring probe of the height gauge only moves vertically during measurement and its position cannot be fixed (it must remain stationary horizontally), it is generally necessary to move the object to align it with the probe. During the measurement process, because different surfaces of the object need to be moved for measurement, the placement of the object may not remain consistent, introducing variables that affect measurement accuracy.

[0052] In response, this application discloses a height gauge that uses two probes to measure two different surfaces of an object, thereby obtaining the relative height of the two surfaces in a single measurement. Furthermore, the height gauge allows for fine-tuning of the probe positions in the vertical or horizontal direction, resulting in better alignment with the surface being measured and further improving the accuracy of the probe's height measurement.

[0053] The technical solution of this application will be further described below with reference to the embodiments and accompanying drawings.

[0054] Please see Figure 1 This application discloses a height gauge 100 for measuring the height difference between a first test surface 201 and a second test surface 202 of a test object 200. In other words, the height gauge 100 of this application can be used to measure test objects with different surfaces having a height difference. The test object can be, for example, a machined plate-shaped or block-shaped workpiece, and the height gauge 100 can be used to measure whether the height between the two test surfaces after machining meets the machining requirements. Alternatively, it can be an assembled piece of equipment, and the height gauge 100 can be used to measure whether there is an error in its assembled height.

[0055] The height gauge 100 includes a base 1, a first column 2, and a measuring mechanism 3. The base 1 has a placement surface 1a configured to place the object to be measured 200. The first column 2 is mounted on the base 1 and extends along a first direction. The measuring mechanism 3 includes a movable seat 31 and a measuring probe assembly 32. The movable seat 31 is movably mounted on the first column 2 along the first direction. The measuring probe assembly 32 includes a carrier 321, a first probe 322, and a second probe 323. The carrier 321 is connected to the movable seat 31. The first probe 322 and the second probe 323 are movably mounted on the carrier 321 and extend toward the placement surface 1a. The first probe 322 is configured to measure the height of the first object to be measured 201, and the second probe 323 is configured to measure the height of the first object to be measured 201.

[0056] It is understandable that when the movable seat 31 of the height gauge 100 moves along the first direction, the height of the movable seat 31 can be adjusted, that is, the first direction is the height direction of the height gauge 100.

[0057] For example, the first probe 322 and the second probe 323 can move on the carrier 321, for example, by moving along a first direction, so as to adapt to the height of the test surface of the object 200, or they can be translated in the horizontal direction to adjust the distance between the two probes to adapt to the distance of different test surfaces of the object 200.

[0058] It is understandable that one of the first test surface 201 and the second test surface 202 can be a reference surface and the other can be a measurement surface. The relative height difference between the first test surface 201 and the second test surface 202 can be obtained by measuring the height of the two surfaces.

[0059] Optionally, the base 1 can be circular, elliptical, square, etc., and this application does not make a specific limitation. For ease of understanding of the solution of this application, the following description uses a square base as an example.

[0060] In the height gauge 100 of this application, since the first probe 322 and the second probe 323 are movable on the support member 321, for example, the first probe 322 and the second probe 323 can move along a first direction, along the length direction or the width direction of the square base 1, so that the first probe 322 and the second probe 323 can move to the first test surface 201 and the second test surface 202 of the object to be measured 200, respectively, to measure the height of the first test surface 201 and the second test surface 202 of the object to be measured 200. In this way, only the measuring probe assembly 32 and the movable seat 31 need to be adjusted, without adjusting the position of the object to be measured 200 on the placement surface 1a. This avoids the change in the position of the object to be measured 200 on the placement surface 1a due to the movement of the object to be measured 200 switching the contact between the test surface and the probe, which would affect the measurement accuracy. In other words, the two probes can simultaneously measure the two test surfaces of the object to be measured 200 without adjusting the position of the object to be measured 200 on the placement surface 1a, reducing the influence of interference factors on the measurement accuracy and helping to improve the measurement accuracy.

[0061] Furthermore, to improve the probe's adaptability to contact with surfaces of different shapes on the test object 200, please refer to [link to relevant documentation]. Figure 2 In some embodiments, the carrier 321 is provided with a first mounting portion 321a and a second mounting portion 321b, the first mounting portion 321a and the second mounting portion 321b are spaced apart, and along the first direction, the first probe 322 is movably disposed in the first mounting portion 321a and the second probe 323 is movably disposed in the second mounting portion 321b.

[0062] For example, when the first probe 322 and the second probe 323 approach the first test surface 201 and the second test surface 202 of the test object 200 respectively, since the heights of the first test surface 201 and the second test surface 202 are different, it is necessary to adjust the positions of the first probe 322 and the second probe 323 on the carrier 321 along the first direction so that the first probe 322 and the second probe 323 can adapt to the heights of the first test surface 201 and the second test surface 202 of the test object 200, so that the heights of the first test surface 201 and the second test surface 202 can be accurately measured so as to obtain the height difference between the two.

[0063] Optionally, the first mounting portion 321a and the second mounting portion 321b may be configured as holes or slots to provide space for the first probe 322 and the second probe 323 to move in the first direction.

[0064] It is understood that the hole can be a through hole or a blind hole, and the groove can be a through groove or a blind groove; this application does not make any specific limitations here.

[0065] To facilitate understanding of the technical solution of this application, the first mounting part 321a and the second mounting part 321b are described below as being constructed as a tank.

[0066] In some embodiments, the first mounting portion 321a is configured as a first groove 321a, the first groove 321a extending along a second direction and / or a third direction, and the first probe 322 is configured to move within the first groove 321a along the second direction or the third direction.

[0067] For example, when the first groove 321a extends along the second direction or the third direction, the first groove 321a is a single strip groove. When the first groove 321a extends simultaneously along the second direction and the third direction, the first groove 321a forms multiple groove portions, and two groove portions intersect, such as... Figure 2 In the example, one tank section extends in a third direction, and then two other tank sections connect to the middle tank section and extend in a second direction.

[0068] For example, when the first mounting part 321a is configured as the first groove 321a, the first probe 322 can move within the first groove 321a along the second direction or the third direction to adjust the distance between the first probe 322 and the second probe 323 in the second direction or the third direction. Since the first surface 201 to be measured and the second surface 202 to be measured of the object 200 may be a certain distance apart in the second direction or the third direction, in order to allow the first probe 322 and the second probe 323 to be adaptively adjusted to effectively align the first surface 201 to be measured and the second surface 202 to be measured, for example, during the use of the height gauge 100, the user can manually move the first probe 322 within the first groove 321a to adjust the distance between the first probe 322 and the second probe 323 so that the first probe 322 and the second probe 323 are respectively aligned with the first surface 201 to be measured and the second surface 202 to be measured of the object 200, so that the height gauge 100 can measure the object 200.

[0069] It is understandable that the first direction can be the height direction of the first column 2, such as... Figure 1 As shown, when the base 1 is a square base, the second direction and the third direction can be the length direction and the width direction of the base 1.

[0070] like Figure 1In the example, X indicates the first direction, Y indicates the second direction, and Z indicates the third direction.

[0071] Optionally, the second mounting portion 321b is configured as a second groove 321b, the second groove 321b extending along a second direction and / or a third direction, and the second probe 323 is configured to move within the second groove 321b along the second direction or a third direction.

[0072] For example, when the second groove 321b extends along the second direction or the third direction, the second groove 321b is a single strip groove. When the second groove 321b extends simultaneously along the second direction and the third direction, the second groove 321b forms multiple groove portions, and two groove portions intersect, such as... Figure 2 In the example, one tank section extends in a third direction, and then two other tank sections connect to the middle tank section and extend in a second direction.

[0073] For example, when the second mounting part 321b is configured as the second groove 321b, the second probe 323 can move within the second groove 321b along the second direction or the third direction to adjust the distance between the second probe 323 and the first probe 322 in the second direction or the third direction. Since the first surface 201 and the second surface 202 of the object to be measured 200 may be a certain distance apart in the second direction or the third direction, in order to allow the first probe 322 and the second probe 323 to be adaptively adjusted to effectively align the first surface 201 and the second surface 202, for example, during the use of the height gauge 100, the user can manually move the second probe 323 within the second groove 321b to adjust the distance between the first probe 322 and the second probe 323, so that the first probe 322 and the second probe 323 are respectively aligned with the first surface 201 and the second surface 202 of the object to be measured 200, so that the height gauge 100 can measure the object to be measured 200.

[0074] In the first direction, the approximate measuring height of the measuring needle assembly 32 can be adjusted by the first column 2. To obtain a more accurate measuring height, the height of the measuring needle assembly 32 needs to be adjusted. In some embodiments, the carrier 321 includes a second column 3211 and a carrier body 3212. The second column 3211 has a first end a and a second end b. The first end a is movably mounted on the movable seat 31 along the first direction, and the carrier body 3212 is disposed on the second end b. The first probe 322 and the second probe 323 are both disposed on the carrier body 3212.

[0075] It is understandable that the first mounting part 321a and the second mounting part 321b are also correspondingly mounted on the support body 3212.

[0076] For example, when the second column 3211 is mounted on the movable seat 31, the first end a of the second column 3211 can move along the first direction on the movable seat 31, thereby adjusting the height of the support body 3212. In this way, the height of the movable seat 31 on the first column 2 can be adjusted first to roughly align the support body 3212 with the object to be measured 200, and then the height of the second column 3211 can be adjusted to precisely adjust the height of the support body 3212. Thus, by calibrating the height of the support body 3212 multiple times, it is beneficial to achieve accurate measurement of the height of the object to be measured 200 by the first probe 322 and the second probe 323.

[0077] Please see also Figures 3 to 6 In some embodiments, the movable seat 31 includes a first seat body 311 and a second seat body 312. The first seat body 311 is movably mounted on the first column 2 along a first direction. The second seat body 312 is movably connected to the first seat body 311 along a second direction, and the second column 3211 is movably mounted on the second seat body 312.

[0078] To enable the height gauge 100 to more flexibly measure the relative height of different surfaces of the object to be measured 200, the movable base 31 is divided into a first base 311 and a second base 312, wherein the second base 312 is movable relative to the first base 311. In this way, the positions of the first probe 322 and the second probe 323 of the bearing base 3212 set on the second column 3211 relative to the object to be measured 200 can be adjusted not only by the first column 2 and the second column 3211, but also by the relative position between the first base 311 and the second base 312, thereby improving the flexibility of the first probe 322 and the second probe 323 toward different surfaces of the object to be measured 200, so that the first probe 322 and the second probe 323 can more flexibly measure different surfaces of the object to be measured 200.

[0079] Please see also Figure 4 and Figure 5 In some embodiments, the first base 311 is provided with a first connecting hole 311a along the first direction, the first column 2 passes through the first connecting hole 311a, and the first base 311 can rotate around the first direction to drive the second base 312 to rotate.

[0080] It is understandable that when the base 1 is square and the object to be tested 200 is placed on the placement surface 1a, the position of the surface to be tested of the object to be tested 200 may be different on the placement surface 1a, for example, in the width direction of the base 1. When the surface to be tested is located on one side of the width direction of the base 1, since the initial position of the measuring mechanism 3 is in the center position of the base 1, it is necessary to adjust the first seat body 311 to rotate around the first direction and swing the first seat body 311 parallel to the placement surface so that the first seat body 311 swings closer to the width direction of the base 1 so that the first probe 322 and the second probe 323 can approach the surface to be tested of the object to be tested 200.

[0081] In other words, by adjusting the first base 311 to the position of the placement surface 1a where the object to be measured 200 is located, the first probe 322 and the second probe 323 can be aligned with the surface to be measured of the object to be measured 200, thereby improving the measurement accuracy of the height gauge 100 on the object to be measured 200.

[0082] Optionally, the second column 3211 includes a first segment 3211a and a second segment 3211b. The first segment 3211a extends along a first direction to connect to the second base 312, and the second segment 3211b extends along a second direction. The support base 3212 is connected to the second segment 3211b. The second base 312 is provided with a second connecting hole 312a along the first direction. The first segment 3211a passes through the second connecting hole 312a. The second segment 3211b can rotate around the first direction to drive the support base 3212 to rotate.

[0083] It is understandable that when the base 1 is a square base and the object to be tested 200 is placed on the placement surface 1a, the position of the surface to be tested of the object to be tested 200 may be different on the placement surface 1a, for example, in the width direction of the base 1. When the surface to be tested is located on one side of the width direction of the base 1, since the initial position of the measuring mechanism 3 is in the center position of the base 1, it is necessary to adjust the second column 3211 to rotate around the first direction and the second segment 3211b to swing parallel to the placement surface 1a, so that the second segment 3211b of the second column 3211 swings close to the width direction of the base 1, so that the first probe 322 and the second probe 323 mounted on the support body 3212 can approach the surface to be tested of the object to be tested 200.

[0084] In other words, by adjusting the second section 3211b of the second column 3211 to the position of the placement surface 1a where the object to be measured 200 is located, the first probe 322 and the second probe 323 can be aligned with the surface to be measured of the object to be measured 200, thereby improving the measurement accuracy of the height gauge 100 on the object to be measured 200.

[0085] For example, when adjusting the position of the measuring mechanism 3 close to the object to be measured 200 on the placement surface 1a, the first base 311 can be adjusted to rotate relative to the first column 2, and the first probe 322 and the second probe 323 can be adjusted to be approximately close to the object to be measured 200. Then, the second column 3211 can be adjusted to rotate relative to the second base 312, so that the second segment 3211b swings to move closer to the object to be measured 200, thereby enabling the first probe 322 and the second probe 323 to be accurately aligned with the object to be measured 200, and realizing the accurate measurement of the object to be measured 200 by the height gauge 100.

[0086] It is understood that the height positions of the first probe 322 and the second probe 323 can be adjusted first, and then the rotation positions of the first probe 322 and the second probe 323 can be adjusted. Alternatively, the rotation positions of the first probe 322 and the second probe 323 can be adjusted first, and then the height positions of the first probe 322 and the second probe 323 can be adjusted. Or, the height positions and rotation positions of the first probe 322 and the second probe 323 can be coarsely adjusted first, and then the height positions and rotation positions of the first probe 322 and the second probe 323 can be finely adjusted. This application does not make specific limitations here.

[0087] To improve the ease of adjusting the height of the first base 311, in some embodiments, the outer peripheral surface of the first column 2 is provided with threads, the first connecting hole 311a is constructed as a threaded hole, and the first column 2 is threadedly connected to the first connecting hole 311a.

[0088] Understandably, when the first column 2 is threaded into the first connecting hole 311a, the first seat 311 can self-lock onto the first column 2, thereby preventing it from falling off the first column 2.

[0089] For example, when the first column 2 and the first connecting hole 311a have a smooth surface fit, if the relative position of the first seat 311 and the first column 2 is not locked by the limiting member, the first seat 311 may fall off the first column 2. When the first seat 311 forms a self-locking connection on the first column 2 through a threaded fit, it is not necessary to lock the first seat 311. The positions of the first probe 322 and the second probe 323 can be further fine-tuned first, and then the position of the first seat 311 can be locked by the limiting member. This helps to prevent the first seat 311 from falling off the first column 2 and also improves the convenience of the calibration operation.

[0090] It is understandable that the limiting member can be a screw. By opening a threaded hole in the first seat 311 that is connected to the first connecting hole 311a, the screw is screwed into the threaded hole and into the first connecting hole. The screw abuts against the first column, thus limiting the position of the first seat on the first column.

[0091] Please see Figure 5 In some embodiments, the first seat 311 is provided with a first limiting hole 311b along the second direction. The first limiting hole 311b is connected to the first connecting hole 311a. The measuring mechanism 3 also includes a first limiting member 33, which is disposed in the first limiting hole 311b. When the first limiting member 33 restricts the movement of the first seat 311, the first limiting member 33 is at least partially located in the first connecting hole 311a, so as to abut against the first column 2 located in the first connecting hole 311a. In this way, when the first limiting member 33 locks the movement of the first seat 311, the first seat 311 is limited on the first column 2, preventing the first seat 311 from falling off or rotating from the first column 2, so as to ensure the stability of the height gauge 100 measurement.

[0092] For example, the first limiting member 33 may be a screw, and the first limiting hole 311b may be a threaded hole. After the first limiting member 33 is screwed into the first limiting hole 311b, the end of the first limiting member 33 is screwed out from the first limiting hole 311b and abuts against the surface of the first column 2, so that the first limiting member 33 locks the movement of the first seat 311.

[0093] Please see Figure 6 Optionally, the second base 312 is provided with a second limiting hole 312b along a third direction, the second limiting hole 312b communicating with the second connecting hole 312a. The measuring mechanism 3 also includes a second limiting member 34, the second limiting member 34 being disposed in the second limiting hole 312b. When the second limiting member 34 restricts the movement of the second column 3211, the second limiting member 34 is at least partially located in the second connecting hole 312a, abutting against the second column 3211. In this way, when the second limiting member 34 locks the movement of the second column 3211, the second column 3211 is limited on the second base 312, preventing the second column 3211 from falling off or rotating from the second base 312, thus ensuring the stability of the height gauge 100 measurement.

[0094] For example, the second limiting member 34 may be a screw, and the second limiting hole 312b may be a threaded hole. After the second limiting member 34 is screwed into the second limiting hole 312b, the end of the second limiting member 34 is screwed out from the second limiting hole 312b and abuts against the surface of the second column 3211, so that the second limiting member 34 locks the movement of the second column 3211.

[0095] Please see Figure 5 and Figure 7 In some embodiments, along the second direction, the second seat 312 has a first connecting surface 312c facing the first seat 311, the first seat 311 is correspondingly provided with the second connecting surface 311c, the first connecting surface 312c is provided with a rotating shaft 312d, the second connecting surface 311c is provided with a third connecting hole 311d corresponding to the rotating shaft 312d, and the rotating shaft 312d is rotatably connected to the third connecting hole 311d.

[0096] For example, when the second seat 312 is rotatably connected to the first seat 311, the second seat 312 rotates about the second direction. By adjusting the rotation angle of the second seat 312 relative to the first seat 311, the angle of the first probe 322 and the second probe 323 toward the placement surface 1a can be adjusted. For example, when the test surface of the object 200 is at an angle to the placement surface 1a, the second seat 312 can be rotated so that the first probe 322 and the second probe 323 can be aligned with the inclined test surface, which is beneficial to the effective measurement of the object 200.

[0097] Considering the need to maintain the stability of the second seat 312 after it rotates relative to the first seat 311, in some embodiments, the first seat 311 is provided with a third limiting hole 311e along a first direction. The third limiting hole 311e communicates with the third connecting hole 311d. The measuring mechanism 3 also includes a third limiting member 35, which is disposed in the third limiting hole 311e. When the third limiting member 35 restricts the rotation of the rotating shaft 312d, the third limiting member 35 is at least partially located in the third connecting hole 311d to abut against the rotating shaft 312d. In this way, when the third limiting member 35 locks the movement of the rotating shaft 312d, the rotation of the rotating shaft 312d is blocked, preventing the rotating shaft 312d from continuing to rotate, and maintaining the suspension of the rotation angle after the second seat 312 rotates, so as to ensure the stability of the height gauge 100 measurement.

[0098] For example, the third limiting member 35 can be a screw, and the third limiting hole 311e can be a threaded hole. After the third limiting member 35 is screwed into the third limiting hole 311e, the end of the third limiting member 35 is screwed out from the third limiting hole 311e and abuts against the surface of the rotating shaft 312d, so that the third limiting member 35 locks the rotation of the rotating shaft 312d.

[0099] Please see Figure 7 Optionally, in the circumferential direction around the axis of rotation 312d, the first connecting surface 312c is provided with a plurality of first mating parts 312e, and the second connecting surface 311c is provided with a plurality of second mating parts 311f. Each first mating part 312e is connected to each second mating part 311f. One of the first mating part 312e and the second mating part 311f is concave and the other is convex.

[0100] For example, when the second seat 312 rotates relative to the first seat 311, and when the first mating part 312e engages with different second mating parts 311f, the second seat 312 can maintain different hovering angles relative to the first seat 311. In this way, the rotating shaft 312d does not need to be locked by the third limiting member 35 to maintain its hovering position. At this time, while the second seat 312 is hovering, the positions of the first probe 322 and the second probe 323 in the height and horizontal directions can be aligned with the object to be measured 200 for calibration, and then the third limiting member 35 can be used to lock the hovering angle of the rotating shaft 312d. This avoids the situation where the third limiting member 35 needs to be removed when readjusting the hovering angle after the rotation angle of the second seat 312 is locked, thus improving the ease of operation of the height gauge 100.

[0101] Optionally, when either the first mating part 312e or the second mating part 311f is a protrusion, the protrusion can be constructed as a dot, a post, etc., and the outer peripheral surface of the dot or post is an arc surface. When the outer peripheral surface of the dot or post is an arc surface, it is advantageous for the dot or post to slide out of the recess when the second seat 312 needs to rotate to change the hovering angle.

[0102] In some embodiments, the carrier 321 is provided with a sensor (not shown) configured to detect the measurement height of the first probe 322 and / or the second probe 323.

[0103] For example, the sensor can be a position sensor. When the first probe 322 contacts the first surface to be measured 201, the height position of the first probe 322 is detected by the sensor. When the second probe 323 contacts the second surface to be measured 202, the height position of the second probe 323 is detected by the sensor. In this way, the relative height between the first surface to be measured 201 and the second surface to be measured 202 can be obtained by the sensor.

[0104] Please see Figure 8 In order to provide users with an intuitive understanding of the measured height detected by the sensor, the measuring needle assembly 32 may optionally include a first display 324 and a first button 325. The first display 324 is disposed on the carrier 321, and the first button 325 is disposed adjacent to the first display 324. The first display 324 is connected to the sensor and is configured to display the measured height. The first button 325 is electrically connected to the first display 324 and is configured to control the measured height displayed by the first display 324.

[0105] For example, the first button 325 can control the first display 324 to power on, displaying the measured height measured by the sensor. Pressing the first button 325 can also clear the measured height displayed on the first display 324 to zero. Additionally, the first button 325 can also control the first display 324 to display the measured height of either the first probe 322 or the second probe 323 separately. In this way, the first display 324 can be flexibly controlled to display the measured height to meet different user needs.

[0106] Please see Figure 8 Optionally, the movable seat 31 is provided with a second display 313 and a second button 314. The second button 314 is located adjacent to the second display 313. The second display 313 is electrically connected to the sensor and is configured to display the measured height. The second button 314 is electrically connected to the second display 313 and is configured to control the measured height displayed by the second display 313.

[0107] For example, the second button 314 can control the second display 313 to power on, displaying the measured height measured by the sensor. Pressing the second button 314 can also clear the measured height displayed on the second display 313. Additionally, the second button 314 can also control the second display 313 to display the measured height of either the first probe 322 or the second probe 323 separately. In this way, the second display 313 can be flexibly controlled to display the measured height to meet different user needs.

[0108] It is understood that either the first display 324 or the second display 313 may display the measured height of the first probe 322 or the second probe 323, or the first display 324 or the second display 313 may display the measured height of the first probe 322 or the second probe 323 respectively. This application does not make any specific limitation here.

[0109] The height gauge disclosed in the embodiments of this application has been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the height gauge and its core ideas. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A height gauge, characterized in that, The height gauge is used to measure the height difference between a first and a second surface of an object to be measured, and includes: A base having a placement surface configured to place an object to be tested; A first column is disposed on the base and extends along a first direction; The measuring mechanism includes: A movable base, which is movably mounted on the first column along the first direction; A measuring probe assembly includes a carrier, a first probe, and a second probe. The carrier is connected to the movable seat. The first probe and the second probe are movably disposed on the carrier and extend toward the placement surface. The first probe is configured to measure the height of the first surface to be measured, and the second probe is configured to measure the height of the second surface to be measured.

2. The height gauge according to claim 1, characterized in that, The carrier is provided with a first mounting part and a second mounting part, which are spaced apart. Along the first direction, the first probe is movably mounted on the first mounting part and the second probe is movably mounted on the second mounting part.

3. The height gauge according to claim 2, characterized in that, The first mounting portion is configured as a first groove extending along a second direction and / or a third direction, and the first probe is configured to move within the first groove along the second direction or the third direction; and / or, The second mounting portion is configured as a second groove extending along a second direction and / or a third direction, and the second probe is configured to move within the second groove along the second direction or the third direction; The first direction, the second direction, and the third direction intersect each other.

4. The height gauge according to claim 1, characterized in that, The carrier includes: The second column has a first end and a second end, the first end being movably mounted on the movable seat along the first direction; A support body is provided at the second end of the second column, and the first probe and the second probe are provided on the support body.

5. The height gauge according to claim 4, characterized in that, The movable seat includes: The first base body is movably mounted on the first column along the first direction; The second base is movably connected to the first base along a second direction, and the second column is movably installed on the second base; The second direction intersects with the first direction.

6. The height gauge according to claim 5, characterized in that, The first base body is provided with a first connecting hole along the first direction, and the first column passes through the first connecting hole. The first base body can rotate around the first direction to drive the second base body to rotate; and / or, The second column includes a first section and a second section. The first section extends along the first direction to connect to the second base body. The second section extends along the second direction. The support base body is connected to the second section. The second base body is provided with a second connecting hole along the first direction. The first section passes through the second connecting hole. The second section can rotate around the first direction to drive the support base body to rotate.

7. The height gauge according to claim 6, characterized in that, The outer circumferential surface of the first column is provided with threads, and the first connecting hole is constructed as a threaded hole, and the first column is threadedly connected to the first connecting hole.

8. The height gauge according to claim 6, characterized in that, The first base body is provided with a first limiting hole along the second direction, the first limiting hole communicating with the first connecting hole. The measuring mechanism further includes a first limiting member, the first limiting member being disposed in the first limiting hole. When the first limiting member restricts the movement of the first base body, the first limiting member is at least partially located in the first connecting hole to abut against the first column; and / or, The second base is provided with a second limiting hole along a third direction, and the second limiting hole communicates with the second connecting hole. The measuring mechanism also includes a second limiting member, which is disposed in the second limiting hole. When the second limiting member restricts the movement of the second column, the second limiting member is at least partially located in the second connecting hole to abut against the second column. The third direction intersects with the first direction and the second direction, respectively.

9. The height gauge according to claim 5, characterized in that, Along the second direction, the second seat has a first connecting surface facing the first seat, the first seat has a corresponding second connecting surface, the first connecting surface has a rotating shaft, the second connecting surface has a third connecting hole corresponding to the rotating shaft, and the rotating shaft is rotatably connected to the third connecting hole; The first base body is provided with a third limiting hole along the first direction, the third limiting hole communicating with the third connecting hole. The measuring mechanism further includes a third limiting member, the third limiting member being disposed in the third limiting hole. When the third limiting member restricts the rotation of the rotating shaft, the third limiting member is at least partially located in the third connecting hole to abut against the rotating shaft; and / or, Around the circumferential direction of the rotating shaft, the first connecting surface is provided with a plurality of first mating parts, and the second connecting surface is provided with a plurality of second mating parts. Each first mating part is connected to each second mating part. One of the first mating parts and the second mating part is concave, and the other is convex.

10. The height gauge according to any one of claims 1-9, characterized in that, The carrier is equipped with a sensor configured to detect the measured height of the first probe and / or the second probe; The measuring needle assembly further includes a first display and a first button. The first display is disposed on the carrier, and the first button is disposed adjacent to the first display. The first display is electrically connected to the sensor and is configured to display the measured height. The first button is electrically connected to the first display and is configured to control the first display to display the measured height. And / or, The movable seat is provided with a second display and a second button. The second button is located adjacent to the second display. The second display is electrically connected to the sensor and is configured to display the measured height. The second button is electrically connected to the second display and is configured to control the second display to display the measured height.

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