A semiconductor discrete device testing device

Abstract

This utility model relates to the field of semiconductor discrete device testing technology, and discloses a semiconductor discrete device testing device, including a housing, a testing stage disposed on the outer wall of the housing, a display screen fixedly connected to the outer wall of the housing, a temperature control component disposed on the outer wall of the housing, a connecting wire disposed on the outer wall of the housing, a fixing component disposed on the inner wall of the housing, and a positioning clamping component disposed on the inner wall of the testing stage. The positioning clamping component includes a moving block, the outer wall of which is disposed on the upper surface of the testing stage, and a motor disposed on the inner wall of the testing stage. A gear one is fixedly connected to the output end of the motor, and a gear two is rotatably connected to the upper surface of the testing stage. The tooth ends of gear two mesh with the tooth ends of gear one. In this utility model, excessive compression is avoided, and the clamping position is precisely controlled by using gear transmission and sliding column linkage, ensuring that the probe and the device maintain stable contact during the testing process, thereby improving the repeatability and reliability of the test.

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