Functional testing equipment
By adopting a dual-drive mechanism design in the functional testing equipment, functional testing of test pieces with long test strokes is realized, solving the problem of insufficient versatility of existing equipment and improving the testing range and adaptability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- PHOENIX CONTACT NANJING R&D ENG CENT
- Filing Date
- 2025-05-22
- Publication Date
- 2026-05-26
AI Technical Summary
Existing functional testing equipment is unable to perform effective functional testing on test pieces with long test strokes, resulting in insufficient versatility and adaptability.
The test connector is designed with a dual-drive mechanism. The first and second drive mechanisms work together to drive the test connector, allowing it to move between the initial state and the test state, thus achieving a longer test stroke and increasing the test range.
It improves the versatility and adaptability of functional testing equipment, enabling functional testing of test pieces with longer test strokes and increasing the testing range.
Smart Images

Figure CN224286948U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of functional testing technology, and in particular to a functional testing device. Background Technology
[0002] In the manufacturing industries of communications, electronic equipment, and industrial automation, which involve the production of electronic products such as network ports, terminal blocks, and circuit boards, functional testing is required after the electronic equipment is manufactured to improve the assurance of correct electrical and signal transmission within the electronic products, reduce the output of defective products, and lower complaints.
[0003] In related technologies, functional testing of electronic products requires testing equipment. The functional testing equipment has connectors that match the corresponding electronic device's interface. Therefore, functional testing can be performed simply by connecting the connectors on the functional testing equipment to the interface of the electronic device. During this process, the movement of the connectors from their initial position to the insertion position of the interface is called the test stroke.
[0004] However, due to the limited distance of the test travel, there is a technical problem in the related technologies that makes it impossible to perform functional testing on test pieces with long test travel distances. Utility Model Content
[0005] This application provides a functional testing device, which aims to solve the technical problem that testing devices cannot perform functional testing on test pieces with long test strokes, so that the functional testing device can perform functional testing on test pieces with even longer test strokes, thereby increasing the testing range of the functional testing device and improving its versatility and adaptability.
[0006] To achieve the above objectives, this application adopts the following technical solution:
[0007] This application provides a functional testing device suitable for performing functional testing on optical modules, including:
[0008] The equipment body includes a base, a first tooling component, a second tooling component, and a loading platform. The first tooling component is movably disposed on the base, the second tooling component is movably disposed on the first tooling component, and the second tooling component has a test connector. The loading platform is movably disposed on the base and configured to load the test piece, and the test piece has a test interface.
[0009] The drive unit includes a first drive mechanism and a second drive mechanism. The first drive mechanism is movably connected to the first tooling and drives the first tooling to move the second tooling toward the loading platform, so that the first tooling moves from an initial state to a test state. The second drive mechanism is movably connected to the second tooling and drives the second tooling to move relative to the first tooling toward the loading platform, so that the test connector is plugged into the test interface.
[0010] In some embodiments, the base has a first slider on the side facing the first tooling, and the first tooling has a first sliding structure on the side facing the base. The first sliding structure matches the first slider, and the first tooling can slide relative to the base via the first slider and the first sliding structure; and / or,
[0011] The first tooling has a second sliding member on the side facing the second tooling, and the second tooling has a second sliding structure on the side facing the first tooling. The second sliding structure matches the second sliding member, and the second tooling can slide relative to the first tooling through the second sliding member and the second sliding structure.
[0012] In some embodiments, the base has a first limiting structure and a second limiting structure, both of which are disposed on the sliding path of the first tooling. When the first tooling is in the initial state, the first tooling abuts against the first limiting structure, and when the first tooling is in the test state, the first tooling abuts against the second limiting structure.
[0013] In some embodiments, the first limiting structure includes at least one of a limiting block, a magnetic limiter, and an inductive limit switch; and / or,
[0014] The second limiting structure includes at least one of a limiting block, a magnetic limiter, and an inductive limit switch.
[0015] In some embodiments, when the base has the first sliding member, the first tooling has the first sliding structure and the second sliding member, and the second tooling has the second sliding structure, the first sliding member and the second sliding member are slide rails, the first sliding structure and the second sliding structure are sliders, and the slider has a groove that matches the slide rail.
[0016] In some embodiments, the functional testing equipment further includes an elastic reset member, one end of which is fixedly connected to the end of the first tooling away from the loading platform, and the other end of which is fixedly connected to the end of the second tooling close to the loading platform.
[0017] In some embodiments, the elastic reset member includes at least one of a reset spring, an elastic band, and an elastic rope.
[0018] In some embodiments, the second tooling has a clearance structure and the second drive mechanism has an abutment structure, wherein when the first tooling moves between the initial state and the test state, the abutment structure moves relative to the clearance structure within the clearance structure.
[0019] In some embodiments, the avoidance structure has a first abutting portion and the abutting structure has a second abutting portion, and when the first tooling is in the initial state, the first abutting portion abuts against the second abutting portion.
[0020] In some embodiments, the avoidance structure is an avoidance groove, and the first abutment portion is the inner wall surface of the avoidance groove near the loading platform.
[0021] The functional testing equipment provided in this application embodiment is suitable for functional testing of optical modules. The functional testing equipment includes a device body and a driving unit. The device body includes a base, a first tooling, a second tooling, and a loading platform. The first tooling is movably disposed on the base, and the second tooling is movably disposed on the first tooling, having a test connector. The loading platform is movably disposed on the base and configured to load a test piece, which has a test interface. The driving unit includes a first driving mechanism and a second driving mechanism. The first driving mechanism is movably connected to the first tooling and drives the first tooling to move the second tooling towards the loading platform, so that the first tooling moves from an initial state to a test state. The second driving mechanism is movably connected to the second tooling and drives the second tooling to move relative to the first tooling towards the loading platform, so that the test connector... In this embodiment of the application, a first driving mechanism drives a first tooling component to move a second tooling component toward the loading platform, and a second driving mechanism drives the second tooling component to move toward the loading platform. This allows the test connector on the second tooling component to connect with the test interface on the loading platform after two movements. The total movement distance of the test connector during this process is called the test stroke. Compared to a system with only one driving mechanism where the test connector can only move once, this embodiment uses two driving mechanisms in combination, allowing the test connector to have a longer test stroke. This means that functional testing can be performed on test pieces with longer test strokes, and functional testing can be performed on test pieces with arbitrary test stroke sizes within this test stroke. This increases the testing range of the functional testing equipment, thereby improving its versatility and adaptability.
[0022] In addition to the technical problems solved by the embodiments of this application, the technical features constituting the technical solutions, and the beneficial effects brought about by the technical features of these technical solutions described above, other technical problems that can be solved by the functional testing equipment provided by the embodiments of this application, other technical features included in the technical solutions, and the beneficial effects brought about by these technical features will be further explained in detail in the specific implementation. Attached Figure Description
[0023] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0024] Figure 1 A schematic diagram of the structure of a functional testing device provided in an embodiment of this application;
[0025] Figure 2 for Figure 1 A magnified view of a portion of point A in the middle;
[0026] Figure 3 This is a schematic diagram of the structure of a first tooling and a second tooling provided in an embodiment of this application.
[0027] Explanation of reference numerals in the attached figures:
[0028] 10- Functional testing equipment;
[0029] 100 - Equipment body; 110 - Base; 120 - First tooling; 121 - First part; 122 - Second part; 130 - Second tooling; 131 - Test connector; 132 - Clearance structure; 133 - First contact part; 140 - Loading platform; 141 - Test piece; 142 - Test interface; 150 - First sliding member; 151 - First sliding structure; 160 - Second sliding member; 161 - Second sliding structure;
[0030] 200 - Drive unit; 210 - First drive mechanism; 220 - Second drive mechanism; 221 - Abutting structure; 222 - Second abutting part;
[0031] 300 - Elastic reset component. Detailed Implementation
[0032] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application. Unless otherwise specified, the following embodiments and features can be combined with each other.
[0033] In some electronic product manufacturing industries, functional testing is performed on electronic products after they are manufactured in order to reduce the output of defective products. This application provides a functional testing device for performing functional testing on electronic products.
[0034] In some implementations, the functional testing equipment includes a test fixture with a test connector, a drive cylinder, and a piston. When performing functional testing on a corresponding electronic product, the drive cylinder, through the piston, moves the test fixture toward the electronic product, causing the test connector on the test fixture to connect with the test interface on the electronic product, thus enabling subsequent functional testing. The total moving distance of the test connector during this process is called the test stroke. Different electronic products require different test strokes for functional testing. For example, when performing functional testing on routers, switches, and industrial control computers, one aspect is testing the connectivity, speed, and stability of their network ports. When performing functional testing on terminals, it is necessary to perform functional tests such as conductivity, insulation, accuracy, and stability of data transmission. When performing functional testing on optical modules on a circuit board, it is necessary to perform functional tests such as transmitted optical power, received sensitivity, and optical wavelength. When performing functional tests on either network ports or terminals, the test stroke is 5mm; when performing functional tests on optical modules, the test stroke is 50mm. This means that different electronic products using the same functional testing equipment will have different test strokes, and the values of these test strokes may vary significantly. In this embodiment, the functional testing equipment has only one cylinder and piston. Therefore, the test stroke of the functional testing equipment is limited by the movable distance of the piston in the cylinder. If the movable distance of the piston in the cylinder is between 5mm and 50mm, the functional testing equipment cannot perform functional tests on any electronic product with an optical module. In other words, the functional testing equipment provided in this embodiment is only suitable for functional testing of test pieces with a test stroke within the drivable range of its drive mechanism, and it cannot perform functional tests on test pieces with longer test strokes.
[0035] To address the problem of being unable to perform functional testing on test pieces with longer test strokes, this application designs a functional testing device that enables functional testing on test pieces with longer test strokes. This increases the testing range of the functional testing device, thereby improving its versatility and adaptability. An embodiment of this application takes an optical module on a printed circuit board with a longer test stroke as an example.
[0036] The contents of this application will now be described in detail with reference to the accompanying drawings, so that those skilled in the art can have a clearer and more detailed understanding of the contents of this application.
[0037] like Figure 1 and Figure 2As shown in the figure, this application embodiment provides a functional testing device 10, suitable for performing functional testing on optical modules. The functional testing device 10 includes a device body 100 and a drive unit 200. The device body 100 includes a base 110, a first tooling 120, a second tooling 130, and a loading platform 140. The first tooling 120 is movably disposed on the base 110, and the second tooling 130 is movably disposed on the first tooling 120. The second tooling 130 has a test connector 131. The loading platform 140 is movably disposed on the base 110. The loading platform 140 is configured to load a test piece 141, which has a test interface 142. The drive unit 200 includes a first drive mechanism 210 and a second drive mechanism 220. The first drive mechanism 210 is movably connected to the first tooling 120 and drives the first tooling 120 to move the second tooling 130 toward the loading platform 140, so that the first tooling 120 moves from the initial state to the test state. The second drive mechanism 220 is movably connected to the second tooling 130 and drives the second tooling 130 relative to the loading platform 140. The first tooling 120 moves toward the loading platform 140 to allow the test connector 131 to be inserted into the test interface 142. Therefore, the first drive mechanism 210 drives the first tooling 120 to move the second tooling 130 toward the loading platform 140, and the second drive mechanism 220 drives the second tooling 130 to move toward the loading platform 140. This allows the test connector 131 on the second tooling 130 to be inserted into the test interface 142 after two movements toward the test interface 142. In this process, the test stroke of the test connector 131 is longer than that of a test connector 131 with only one drive mechanism, which can only move once. The combination of two drive mechanisms allows the test connector 131 to have a longer test stroke. That is, the functional testing equipment 10 can perform functional testing on the test piece 141 with a longer test stroke, and can perform functional testing on the test piece 141 with any test stroke size within this test stroke. This increases the testing range of the functional testing equipment 10, thereby improving the versatility and adaptability of the functional testing equipment 10.
[0038] In some embodiments, the test connector 131 can first be driven by the first drive mechanism 210 in the drive unit 200 to move the first tooling 120 toward the second tooling 130 toward the loading platform 140, so that the test connector 131 moves toward the test interface 142 on the loading platform 140 once. Then, the second drive mechanism 220 in the drive unit 200 drives the second tooling 130 to move relative to the first tooling 120 toward the loading platform 140, so that the test connector 131 moves toward the test interface 142 on the loading platform 140 a second time. After the test interface 142 has undergone the superposition of the first and second movements, the test connector 131 is inserted into the test interface 142 to perform functional testing.
[0039] In other embodiments, the test connector 131 can first be driven by the second drive mechanism 220 in the drive unit 200 to move the second tooling 130 relative to the first tooling 120 toward the loading platform 140, so that the test connector 131 moves toward the test interface 142 on the loading platform 140 once. Then, the first drive mechanism 210 in the drive unit 200 drives the first tooling 120 to move the second tooling 130 toward the loading platform 140, so that the test connector 131 moves toward the test interface 142 on the loading platform 140 a second time. After the test interface 142 has undergone the superposition of the first and second movements in this process, the test connector 131 is plugged into the test interface 142 to perform functional testing.
[0040] Therefore, regardless of whether the test connector 131 is driven by the first drive mechanism 210 first and then by the second drive mechanism 220, or by the second drive mechanism 220 first and then by the first drive mechanism 210, the maximum test stroke that the test connector 131 can move is greater than that driven by only one drive mechanism. Thus, the functional testing device 10 in the above embodiment can make the test connector 131 have a longer test stroke, that is, the functional testing device 10 can perform functional testing on the test piece 141 with a longer test stroke, thereby increasing the testing range of the functional testing device 10 and improving the versatility and adaptability of the functional testing device 10.
[0041] It should be noted that, in any of the above embodiments, during the process of the first drive mechanism 210 driving the first tooling 120 to move the second tooling 130 toward the loading platform 140, the first tooling 120 and the second tooling 130 are relatively fixed and do not undergo displacement during this process. That is, during the operation of the first drive mechanism 210, the first tooling 120 and the second tooling 130 move synchronously relative to the base 110; during the process of the second drive mechanism 220 driving the second tooling 130 to move relative to the first tooling 120 toward the loading platform 140... In this process, the first tooling 120 and the base 110 are relatively fixed and no displacement occurs between them. The second tooling 130 moves relative to the first tooling 120, which is equivalent to the second tooling 130 moving relative to the base 110. That is, during the operation of the second drive mechanism 220, only the second tooling 130 moves relative to the base 110. Therefore, the movement of the first tooling 120 relative to the base 110 only occurs during the operation of the first drive mechanism 210. Thus, during the operation of the first drive mechanism 210, the first tooling 120 moves from the initial state to the test state.
[0042] Furthermore, during the operation of each drive mechanism in the aforementioned drive unit 200, the variable that causes the test connector 131 to move is determined by only one of the moving parts, namely, the moving distance of one of the first tooling 120 and the second tooling 130 relative to the base 110. This makes the control variable unique, thereby reducing stroke error and making the test stroke of the test connector 131 more accurate and the movement more stable.
[0043] Furthermore, after the functional testing equipment 10 completes the functional test on the test piece 141, it can be driven in reverse order, following the opposite driving sequence to the insertion process during the functional test. For example, if the first driving mechanism 210 operates first, and then the second driving mechanism 220 operates, causing the test connector 131 to be inserted into the test interface 142 of the test piece 141, then the process of removing the test connector 131 is as follows: first, the second driving mechanism 220 drives the second tooling 130 in reverse to move away from the loading platform 140 relative to the first tooling 120; then, the first driving mechanism 210 drives the first tooling 120 in reverse to move the second tooling 130 away from the loading platform 140. The first tooling can be moved from the test state to the initial state by moving the stage 140 in the direction of the movement. Similarly, if the second drive mechanism 220 operates first and then the first drive mechanism 210 operates to make the test connector 131 plug into the test interface 142 of the test piece 141, then the process of removing the test connector 131 is as follows: the first drive mechanism 210 first drives the first tooling 120 in the reverse direction to move the second tooling 130 away from the loading stage 140, so that the first tooling moves from the test state to the initial state. Then the second drive mechanism 220 drives the second tooling 130 in the reverse direction relative to the first tooling 120 to move away from the loading stage 140.
[0044] In some embodiments, the first drive mechanism 210 and the second drive mechanism 220 include, but are not limited to, pneumatic drive, motor drive, hydraulic drive, gear drive, chain drive, belt drive, etc., for example, such as Figure 1 and Figure 2 As shown, both the first drive mechanism 210 and the second drive mechanism 220 adopt a combination of cylinder and piston in pneumatic drive. The pistons in the first drive mechanism 210 and the second drive mechanism 220 are respectively connected to the first tooling part 120 and the second tooling part 130.
[0045] In addition, when the test stroke required for the test interface 142 of the test piece 141 is short, only one of the first drive mechanism 210 or the second drive mechanism 220 needs to be used. For example, the first drive mechanism 210 can be used to drive the first tooling 120 to move the second tooling 130 toward the loading table 140, so that the test connector 131 moves a test stroke of the corresponding size and plugs into the test interface 142 to perform functional testing on the test piece 141.
[0046] In some embodiments, the loading platform 140 is movably disposed on the base 110, and the test piece 141 is fixedly disposed on the loading platform 140. The loading platform 140 can move up and down relative to the base 110 so that the test interface 142 of the test piece 141 on the loading platform 140 can be flexibly adjusted in height, thereby making it easier to insert with the test connector 131.
[0047] Furthermore, such as Figure 2 As shown, the base 110 has a first sliding member 150 on the side facing the first tooling 120, and the first tooling 120 has a first sliding structure 151 on the side facing the base 110. The first sliding structure 151 matches the first sliding member 150. The first tooling 120 can slide relative to the base 110 through the first sliding member 150 and the first sliding structure 151, so that the first tooling 120 can be flexibly adjusted in position under the drive of the first driving mechanism 210. Moreover, the combination of the first sliding member 150 and the first sliding structure 151 can realize the relative movement of the first tooling 120 relative to the base 110 in a small space, which helps to save space and make the overall structure of the functional testing equipment 10 more compact.
[0048] Similarly, the first tooling 120 has a second sliding member 160 on the side facing the second tooling 130, and the second tooling 130 has a second sliding structure 161 on the side facing the first tooling 120. The second sliding structure 161 matches the second sliding member 160. The second tooling 130 can slide relative to the first tooling 120 through the second sliding member 160 and the second sliding structure 161, so that the second tooling 130 can be flexibly adjusted in position under the drive of the second drive mechanism 220, and further makes the overall structure of the functional testing equipment 10 more compact.
[0049] Therefore, the disassembly and installation between the first tooling 120 and the base 110, and between the second tooling 130 and the first tooling 120, are relatively complex. When the functional testing equipment 10 performs functional testing on the test piece 141, different types of test pieces 141 may have test interfaces 142 of different shapes. Therefore, when changing to a different type of test piece 141, the functional testing equipment 10 needs to select a corresponding matching test connector 131. Thus, when changing to other types of test pieces 141, the corresponding matching test connector 131 needs to be replaced. The test connector 131 is located on the second tooling 130, such as... Figure 2As shown, the test connector 131 may be composed of multiple single heads, and the operating space for disassembly and installation at the test connector 131 is small. Therefore, directly replacing the test connector 131 is quite complicated. Thus, the first tooling 120 is divided into upper and lower parts, including a first part 121 and a second part 122. The first part 121 and the second part 122 are detachably connected. When it is necessary to replace the test connector 131, the second part 122 can be detached from the first part 121. The second part 122 and the second tooling 130 can be removed simultaneously. The removed second part 122 and the second tooling 130 are a whole. The test connector 131 can be obtained by replacing the test connector 131 on the second tooling 130, or by replacing the second part 122 and the second tooling 130 with the corresponding type of test connector 131. Then, the second part 122 and the second tooling can be installed on the first part 121 to perform functional testing again.
[0050] In some embodiments, the first part 121 and the second part 122 are detachably connected. For example, the first part 121 is provided with one of a slide rail and a slide groove on the side facing the second part 122, and the second part 122 is provided with the other of a slide rail and a slide groove on the side facing the first part 121. The slide rail and the slide groove are matched, and the second part 122 is installed onto the first part 121 by the cooperation of the slide rail and the slide groove. Therefore, during the process of removing or installing the second part 122 from the first part 121, the second part 122 slides relative to the first part 121. Compared with the direct contact between the second part 122 and the first part 121, the friction between the second part 122 and the first part 121 is reduced, thereby making the removal and installation of the second part 122 less laborious, and thus increasing the speed of removal and installation of the second part 122, realizing the rapid replacement of the second part 122 together with the second tooling part 130.
[0051] Of course, after the second part 122 is installed onto the first part 121 via a slide rail or groove, a detachable fixed connection must be made between the second part 122 and the first part 121. The detachable fixed connection methods between the first part 121 and the second part 122 include, but are not limited to, bolt and screw hole connections, snap-fit connections, pin connections, and magnetic connections. For example, a bolt and screw hole connection can be used, with vertically extending screw holes provided at the connection points of the first part 121 and the second part 122. When it is necessary to fix the first part 121 and the second part 122, bolts can be inserted into or rotated into the first part 121. In the screw holes corresponding to the first part 121 and the second part 122, when it is necessary to remove the second part 122 from the first part 121, the bolts must first be pulled out or rotated out of the screw holes, and then the second part 122 can be slid off the first part 121. It should be noted that both the first part 121 and the second part 122 are provided with screw holes, and the extension direction of the screw holes on both is vertical. The axes of the screw holes on both can coincide during the sliding of the second part 122 and the first part 121. Therefore, the positions of the screw holes and the length of the slide rail groove can be planned in advance to avoid the screw holes on both being non-overlapping, i.e., the axes cannot coincide. The sliding method between the first part 121 and the second part 122 through the cooperation of the slide rail groove, combined with the detachable fixed connection method, enables quick assembly and disassembly of the second part 122 and the first part 121, while improving the stability of the second part 122 and the first part 121 during the operation of the functional testing equipment 10.
[0052] In addition, the base 110 has a first limiting structure and a second limiting structure. Both the first limiting structure and the second limiting structure are set on the sliding path of the first tooling 120. When the first tooling 120 is in the initial state, the first tooling 120 abuts against the first limiting structure. When the first tooling 120 is in the test state, the first tooling 120 abuts against the second limiting structure. For example, the first limiting structure and the second limiting structure can be set at both ends of the first sliding member 150, which helps to achieve accurate positioning of the component on the first sliding member 150. When the component slides to the limiting position, it can stop accurately. In addition, during the operation of the second drive mechanism 220, the first tooling 120 is always in the test state and no displacement occurs between it and the base 110. Therefore, the setting of the first limiting structure and the second limiting mechanism improves the precise control of the functional test equipment 10 on the movement of the test interface 142.
[0053] For example, the first limiting structure includes at least one of a limiting block, a magnetic limiter, and an inductive limit switch. The limiting block can be a block-shaped part, a plate-shaped part, a sheet-shaped part, a shaft-shaped part, etc. The magnetic limiter can be magnetically attracted to the first tooling 120 when the first tooling 120 moves to the initial state, and demagnetize the first tooling 120 when the first tooling 120 needs to move or when the first drive mechanism 210 needs to perform operations. The inductive limit switch can be a light signal sensor linked to the first drive mechanism 210, triggering a light signal when the first tooling 120 moves to the initial state, and the first drive mechanism 210 stops driving at the same time.
[0054] Similarly, the second limiting structure may also include at least one of a limiting block, a magnetic limiter, or an inductive limit switch.
[0055] Furthermore, specifically, in combination Figure 1 and Figure 2 As shown, when the base 110 has a first sliding member 150, the first tooling 120 has a first sliding structure 151 and a second sliding member 160, and the second tooling 130 has a second sliding structure 161, the first sliding member 150 and the second sliding member 160 are slide rails, and the first sliding structure 151 and the second sliding structure 161 are sliders. The sliders have grooves that match the slide rails. Through the mutual sliding of the slide rails and the grooves, the sliding of the first tooling 120 relative to the base 110 and the sliding of the second tooling 130 relative to the first tooling 120 are realized. The combination of the slide rails and the grooves reduces the friction between the first tooling 120 and the base 110, and between the second tooling 130 and the first tooling 120, making the movement between the first tooling 120 and the base 110, and between the second tooling 130 and the first tooling 120, smoother.
[0056] Multiple slide rails can be arranged side-by-side on both the base 110 and the first tooling 120. The number of slide rails can be two, three, four, etc. For example, Figure 2 As shown, there are two slide rails; multiple sets of sliders can also be arranged side by side on the first tooling 120 and the second tooling 130. The number of slider sets is the same as the number of slide rails. Each set of sliders can consist of multiple small sliders spaced apart along the direction from the test connector 131 to the test interface 142. This can improve the sliding stability of the first tooling 120 and the second tooling 130 while reducing the weight of the first tooling 120 and the second tooling 130.
[0057] In other embodiments, grooves can also be directly excavated on the side of the first tooling 120 facing the base 110 and the side of the second tooling 130 facing the first tooling 120, and a groove shape matching the slide rail can be provided in the groove.
[0058] In addition, such as Figure 2 and Figure 3 As shown, the functional testing equipment 10 also includes an elastic reset member 300. One end of the elastic reset member 300 is fixedly connected to the end of the first tooling 120 away from the loading platform 140, and the other end of the elastic reset member 300 is fixedly connected to the end of the second tooling 130 close to the loading platform 140. This arrangement allows the second tooling 130 to be subjected to a force in the opposite direction to the driving direction of the second driving mechanism 220 during the driving process of the second driving mechanism 220. This avoids displacement error of the second tooling 130 due to inertia under the driving force of the second driving mechanism 220, thereby improving the accuracy and precision of the sliding of the second tooling 130 and the test interface 142, and reducing the stroke error of the functional testing equipment 10.
[0059] In some embodiments, the elastic reset member includes at least one of a reset spring, an elastic band, and an elastic cord.
[0060] like Figure 2 and Figure 3 As shown, the second tooling 130 has a clearance structure 132, and the second drive mechanism 220 has an abutment structure 221. When the first tooling 120 moves between the initial state and the test state, the abutment structure 221 moves relative to the clearance structure 132 within the clearance structure 132, thereby avoiding the impact on the second drive mechanism 220 when the first drive mechanism 210 is operating, thereby improving the reliability of the functional test equipment 10.
[0061] Specifically, such as Figure 2 and Figure 3 As shown, the avoidance structure 132 has a first abutting part 133, and the abutting structure 221 has a second abutting part 222. When the first tooling part 120 is in the initial state, the first abutting part 133 abuts against the second abutting part 222. Thus, when the first drive mechanism 210 drives the first tooling part 120 to move the second tooling part 130 toward the loading platform 140, the first abutting part 133 moves toward the loading platform 140 along with the avoidance structure 132, the abutting structure 221 remains stationary, and the first abutting part 133 moves relative to the second abutting part 222, thereby preventing the avoidance structure 132 from exerting a force on the second drive mechanism 220 and affecting the second drive mechanism 220.
[0062] For example, such as Figure 2 and Figure 3 As shown, the avoidance structure 132 is an avoidance groove, and the first abutment part 133 is the inner wall surface of the avoidance groove near the loading platform 140.
[0063] In general, the operation process of the functional testing equipment 10 when performing functional tests on the optical module on the printed circuit board is as follows:
[0064] The first drive mechanism 210 is activated, driving the first tooling 120 to slide the second tooling 130 towards the loading platform 140. During this process, the first tooling 120 and the second tooling 130 slide synchronously relative to the base 110. The first tooling 120 moves from the initial state to the test state. The second drive mechanism 220 does not operate. The first abutment portion 133 in the avoidance structure 132 of the second tooling 130 moves away from the second abutment portion 222 from the state of abutting against the second abutment portion 222. The test connector 131 is displaced once during the test stroke. Then, the first drive mechanism 210 stops operating, and the second drive mechanism 220 is activated. First, the first... The second drive mechanism 220 first drives the abutment structure 221 to the position where the second abutment part 222 abuts the first abutment part 133. Then it continues to drive the abutment structure 221 to move toward the support platform, so that the second abutment part 222 exerts a force on the first abutment part 133, thereby causing the second tooling part 130 to slide relative to the first tooling part 120. During the sliding process of the second tooling part 130 relative to the first tooling part 120, the first tooling part 120 is always in the test state and does not have relative displacement with the base 110. The test connector 131 is displaced by a second test stroke. The first test stroke and the second test stroke together make the test connector 131 and the test interface 142 of the optical module plug into place.
[0065] After the functional testing equipment 10 completes the functional testing of the optical module, firstly, the second drive mechanism 220 drives the abutment structure 221 to run in reverse. During this process, the first abutment part 133 abuts against the second abutment part 222, and the second tooling part 130 moves away from the support platform under the elastic force of the elastic reset member 300 until there is no more relative displacement between the second tooling part 130 and the first tooling part 120. Then, the second drive mechanism 220 continues to drive the abutment structure 221 to run in reverse, driving the first abutment part 133... Move away from the second abutment 222; then, the second drive mechanism 220 stops operating, the first drive mechanism 210 starts, driving the first tooling 120 to move the second tooling 130 away from the loading platform 140. During this process, the first tooling 120 moves from the test state to the initial state, and the second abutment 222 moves closer to the first abutment 133. When the first tooling 120 is in the initial state, the second abutment 222 abuts against the first abutment 133, and the functional test equipment 10 completes the functional test.
[0066] Then, according to the type of test interface 142 of the test piece 141 that needs to be functionally tested later, the first part 121 of the first tooling 120 and the second tooling 130 are disassembled and replaced with the first part 121 and the second tooling 130 with the corresponding test connector 131. After installation, the above process is repeated to perform functional testing on the new test piece 141.
[0067] It should be noted that the terms "one embodiment," "embodiment," "exemplary embodiment," "some embodiments," etc., mentioned in the specification indicate that the described embodiment may include a specific feature, structure, or characteristic, but not every embodiment necessarily includes that specific feature, structure, or characteristic. Furthermore, such phrases do not necessarily refer to the same embodiment. Moreover, when a specific feature, structure, or characteristic is described in connection with an embodiment, implementing such a feature, structure, or characteristic in conjunction with other embodiments, whether explicitly described or not, is within the knowledge scope of those skilled in the art.
[0068] Generally speaking, terms should be understood at least in part by their use in context. For example, at least in part by context, the term "one or more" as used in the text can be used to describe any feature, structure, or characteristic of the singular meaning, or a combination of features, structures, or characteristics of the plural meaning. Similarly, at least in part by context, terms such as "a" or "the" can also be understood to convey either singular or plural usage.
[0069] It should be readily understood that the terms “on,” “above,” and “on top of” in this application should be interpreted in the broadest possible sense, such that “on” means not only “directly on something” but also “on something” with an intermediate feature or layer therebetween, and that “above” or “on top of” means not only “on top of something” but also “on top of something” without an intermediate feature or layer therebetween (i.e., directly on something).
[0070] Furthermore, for ease of explanation, spatially relative terms such as "below," "below," "under," "above," "above," etc., may be used to describe the relationship of one element or feature relative to other elements or features as shown in the figures. Spatially relative terms are intended to encompass different orientations of the device in use or operation other than those shown in the figures. The device may have other orientations (rotated 90° or in other orientations), and the spatially relative descriptive terms used herein may be interpreted accordingly.
[0071] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. A functional testing device, suitable for performing functional testing on optical modules, characterized in that, include: The equipment body (100) includes a base (110), a first tooling component (120), a second tooling component (130), and a loading platform (140). The first tooling component (120) is movably disposed on the base (110), and the second tooling component (130) is movably disposed on the first tooling component (120). The second tooling component (130) has a test connector (131). The loading platform (140) is movably disposed on the base (110) and is configured to load a test piece (141). The test piece (141) has a test interface (142). The drive unit (200) includes a first drive mechanism (210) and a second drive mechanism (220). The first drive mechanism (210) is movably connected to the first tooling (120) and drives the first tooling (120) to move the second tooling (130) toward the loading platform (140) so that the first tooling (120) moves from the initial state to the test state. The second drive mechanism (220) is movably connected to the second tooling (130) and drives the second tooling (130) to move relative to the first tooling (120) toward the loading platform (140) so that the test connector (131) is inserted into the test interface (142).
2. The functional testing equipment according to claim 1, characterized in that, The base (110) has a first sliding member (150) on the side facing the first tooling (120), and the first tooling (120) has a first sliding structure (151) on the side facing the base (110). The first sliding structure (151) matches the first sliding member (150), and the first tooling (120) can slide relative to the base (110) through the first sliding member (150) and the first sliding structure (151); and / or, The first tooling (120) has a second sliding member (160) on the side facing the second tooling (130), and the second tooling (130) has a second sliding structure (161) on the side facing the first tooling (120). The second sliding structure (161) matches the second sliding member (160), and the second tooling (130) can slide relative to the first tooling (120) through the second sliding member (160) and the second sliding structure (161).
3. The functional testing equipment according to claim 2, characterized in that, The base (110) has a first limiting structure and a second limiting structure. Both the first limiting structure and the second limiting structure are disposed on the sliding path of the first tooling (120). When the first tooling (120) is in the initial state, the first tooling (120) abuts against the first limiting structure. When the first tooling (120) is in the test state, the first tooling (120) abuts against the second limiting structure.
4. The functional testing equipment according to claim 3, characterized in that, The first limiting structure includes at least one of a limiting block, a magnetic limiter, and an inductive limit switch; and / or, The second limiting structure includes at least one of a limiting block, a magnetic limiter, and an inductive limit switch.
5. The functional testing equipment according to claim 2, characterized in that, When the base (110) has the first sliding member (150), the first tooling (120) has the first sliding structure (151) and the second sliding member (160), and the second tooling (130) has the second sliding structure (161), the first sliding member (150) and the second sliding member (160) are slide rails, the first sliding structure (151) and the second sliding structure (161) are sliders, and the sliders have grooves that match the slide rails.
6. The functional testing equipment according to any one of claims 1-5, characterized in that, The functional testing equipment (10) further includes an elastic reset member (300), one end of which is fixedly connected to the end of the first tooling (120) away from the loading platform (140), and the other end of which is fixedly connected to the end of the second tooling (130) close to the loading platform (140).
7. The functional testing equipment according to claim 6, characterized in that, The elastic reset member (300) includes at least one of a reset spring, an elastic band, and an elastic rope.
8. The functional testing equipment according to claim 6, characterized in that, The second tooling (130) has a clearance structure (132), and the second drive mechanism (220) has an abutment structure (221). When the first tooling (120) moves between the initial state and the test state, the abutment structure (221) moves relative to the clearance structure (132) within the clearance structure (132).
9. The functional testing equipment according to claim 8, characterized in that, The avoidance structure (132) has a first abutting part (133), and the abutting structure (221) has a second abutting part (222). When the first tooling part (120) is in the initial state, the first abutting part (133) abuts against the second abutting part (222).
10. The functional testing equipment according to claim 9, characterized in that, The avoidance structure (132) is an avoidance groove, and the first abutment part (133) is the inner wall surface of the avoidance groove near the loading platform (140).