Charging port short circuit burn prevention test device

Abstract

The utility model relates to electronic equipment performance test technical field provides a kind of short-circuit burn-in test device for charging port, comprising: charging power supply, appliance, galvanometer, temperature measuring element and test host computer;Charging power supply is configured to be electrically connected with the charging port of electronic equipment;Appliance is used to add test liquid to the charging port when charging electronic equipment, to promote the short-circuit of charging port;Galvanometer is used to detect the charging current of electronic equipment before and after charging port short-circuit;Temperature measuring element is used to collect the temperature of electronic equipment before and after charging port short-circuit;Test host computer is respectively connected with galvanometer and temperature measuring element communication connection.The utility model can conveniently carry out short-circuit burn-in test for charging port, without test personnel continuously observing the whole machine state of electronic equipment in test, reduce the detection workload of detection personnel, ensure the accuracy of detection result.

Description

Technical Field

[0001] This utility model relates to the field of electronic device performance testing technology, and in particular to a charging port short-circuit burn-out prevention test device. Background Technology

[0002] Currently, electronic devices such as smartphones, learning machines, and scanning pens are equipped with charging ports. When charging, these devices are usually connected to a power source via a charging cable. Water entering the charging port can cause a short circuit, which can burn out the charging port or even cause a fire.

[0003] In related technologies, to ensure charging safety, some electronic devices are equipped with short-circuit protection designs for the charging port. To verify the reliability of the short-circuit protection design of the charging port, testers mainly add water to the charging port while the electronic device is charging and then observe whether the electronic device is burned. This test method requires testers to continuously observe the overall status of the electronic device while it is charging, and the test results depend on the testers' subjective judgment. Not only is the testing operation cumbersome, but it is also difficult to ensure the accuracy of the test results. Utility Model Content

[0004] This utility model provides a charging port short-circuit burn-out prevention test device, which can at least solve or improve the current problems of cumbersome testing operations and difficulty in ensuring the accuracy of test results in the short-circuit burn-out prevention test of charging ports.

[0005] This utility model provides a charging port short-circuit burn-out prevention test device, comprising:

[0006] The charging power supply is configured to be electrically connected to the charging port of the electronic device;

[0007] An apparatus for adding test liquid to the charging port during charging of the electronic device to induce a short circuit in the charging port;

[0008] A galvanometer is used to detect the charging current of the electronic device before and after the charging port is short-circuited.

[0009] A temperature sensing element is used to collect the temperature of the electronic device before and after the charging port is short-circuited.

[0010] The test host is communicatively connected to both the ammeter and the temperature measuring element.

[0011] According to the present invention, a charging port short-circuit burn-out prevention test device is provided, the test device further includes a test stand, the test stand comprising:

[0012] A placement platform for placing the electronic device;

[0013] A collection tank for collecting the test liquid flowing out from the placement platform.

[0014] According to the present invention, a charging port short circuit prevention and burn-out test device is provided, wherein the placement platform includes: a body having a flow guiding slope, the flow guiding slope being used to place the electronic device, and the lower end of the flow guiding slope extending into the collection groove.

[0015] According to the present invention, a short-circuit protection test device for a charging port is provided, wherein the angle of inclination of the guide slope relative to the horizontal plane is 30° to 60°.

[0016] According to the present invention, a charging port short circuit prevention and burn-out test device is provided, wherein the placement platform further includes a fixing member, which is connected to the main body to fix the electronic device on the guide slope.

[0017] According to the present invention, a short-circuit protection test device for a charging port is provided, wherein a positioning groove is provided on the flow guiding slope, and the positioning groove is configured to accommodate at least part of the electronic device to position the electronic device on the flow guiding slope.

[0018] According to the present invention, a charging port short-circuit anti-burn test device is provided, wherein a first baffle and a second baffle are provided on the current guiding inclined surface;

[0019] The first and second baffles are spaced apart from each other and both extend toward the collection trough along the extending direction of the guide slope;

[0020] The area between the first and second baffles, where the guide slope is used to place the electronic device.

[0021] According to the present invention, a short-circuit protection test device for a charging port is provided, wherein the device includes a syringe, and the test liquid injected into the charging port by the syringe is a NaCl solution.

[0022] According to the present invention, a charging port short-circuit burn-out prevention test device is provided, wherein the temperature measuring element includes two infrared thermal imagers, which are arranged opposite to each other on both sides of the electronic device to detect the temperature of the front and back of the electronic device.

[0023] According to the present invention, a charging port short-circuit burn-out prevention test device is provided, wherein the test host has a display screen, which is used to display the data collected by the ammeter and the temperature measuring element.

[0024] According to the present invention, a short-circuit protection test device for a charging port is provided. The test device further includes a housing and a door for controlling the opening and closing of the housing. The charging power supply, the ammeter, the temperature measuring element and the test stand are respectively disposed in the housing.

[0025] The charging port short-circuit burn-out prevention test device provided by this utility model, by configuring a charging power supply, an instrument, an ammeter, a temperature measuring element, and a test host, can charge electronic devices using the charging power supply. During the charging process, the instrument adds test fluid to the charging port of the electronic device to induce a short circuit. The ammeter can then detect the charging current of the electronic device before and after the short circuit, and the temperature measuring element can collect the temperature of the electronic device before and after the short circuit. The test host then analyzes the data detected by the ammeter and the temperature measuring element to make a relatively accurate judgment on the reliability of the charging port short-circuit burn-out prevention. This test operation is simple and convenient, realizing convenient short-circuit burn-out prevention testing of the charging port. It eliminates the need for testers to continuously observe the overall status of the electronic device during the test, reducing the workload of testers and ensuring the accuracy of the test results. Attached Figure Description

[0026] To more clearly illustrate the technical solutions in this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0027] Figure 1 This is a schematic diagram of the charging port short-circuit burn-out prevention test device provided by this utility model.

[0028] Figure 2 This is a schematic diagram of the electronic device provided by this utility model placed on a test bench.

[0029] Figure label:

[0030] 100. Electronic devices; 1001. Charging port; 200. Charging cable;

[0031] 1. Charging power supply; 2. Appliance; 3. Ammeter; 4. Temperature measuring element; 5. Test host; 6. Test stand; 61. Placement platform; 6101. Flow guide slope; 611. Body; 612. Fixture; 62. Collection tank. Detailed Implementation

[0032] To make the objectives, technical solutions, and advantages of this utility model clearer, the technical solutions of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0033] The following is combined with Figures 1-2 The present invention provides a detailed description of the charging port short-circuit burn-out test device provided by the present invention through specific embodiments and application scenarios.

[0034] like Figure 1 As shown, this utility model embodiment provides a charging port short circuit protection test device, including: a charging power supply 1, an appliance 2, an ammeter 3, a temperature measuring element 4, and a test host 5;

[0035] The charging power supply 1 is configured to be electrically connected to the charging port 1001 of the electronic device 100; the device 2 is used to add test liquid to the charging port 1001 when the electronic device 100 is charging, so as to cause the charging port 1001 to be short-circuited; the ammeter 3 is used to detect the charging current of the electronic device 100 before and after the charging port 1001 is short-circuited; the temperature measuring element 4 is used to collect the temperature of the electronic device 100 before and after the charging port 1001 is short-circuited; the test host 5 is communicatively connected to the ammeter 3 and the temperature measuring element 4 respectively.

[0036] It is understood that the electronic device 100 used for short-circuit protection testing of the charging port in this embodiment can be a smartphone, a learning machine, a scanning pen, etc., and the charging port 1001 can be a USB-A interface, a USB-C interface (Type-C interface), or a Lightning interface, without any specific limitation.

[0037] like Figure 1 As shown, this embodiment is equipped with a charging cable 200 adapted to the charging port 1001 of the electronic device 100. The charging power supply 1 is plugged into the first end of the charging cable 200, and the second end of the charging cable 200 is plugged into the charging port 1001 of the electronic device 100. Thus, the charging power supply 1 and the charging port 1001 of the electronic device 100 can be conveniently connected based on the charging cable 200. The charging power supply 1 can be a power bank or an AC / DC converter.

[0038] The ammeter 3 can be a Hall sensor or a digital ammeter with a communication interface to conveniently upload the detected current data to the test host 5 in real time.

[0039] To facilitate the detection of the heat generated by the electronic device 100 when the charging port 1001 is short-circuited, the temperature sensing element 4 can be a non-contact temperature measuring instrument used to detect the thermal radiation of an object, such as an infrared thermometer, laser thermometer, spectrometer, and colorimetric thermometer, etc., without specific limitations. The temperature sensing element 4 is equipped with a communication interface that connects to the test host 5, so that the temperature data detected by the temperature sensing element 4 can be uploaded to the test host 5 in real time.

[0040] Apparatus 2 can be a syringe, measuring cup, etc. The tester can use apparatus 2 to add test liquid at a set frequency, such as every 10 minutes, to conduct a short circuit protection test for the charging port. When conducting multiple short circuit protection tests for the charging port, it should be ensured that the amount of test liquid added to the charging port 1001 using apparatus 2 is consistent each time. The test liquid can be a conductive liquid, such as water and soluble salt solutions such as sodium chloride (NaCl), potassium nitrate (KNO3), and copper sulfate (CuSO4).

[0041] In practical applications, when the charging power supply 1 is charging the electronic device 100 normally, the charging current detected by the ammeter 3 is usually a stable current value, which can be labeled as I1. The temperature of the electronic device 100 is approximately a stable temperature value, which can be labeled as T1. After adding test liquid to the charging port 1001, the charging port 1001 short-circuits, and the charging current detected by the ammeter 3 will increase significantly, for example, the charging current will increase from I1 to I2. If the short-circuit protection structure near the charging port 1001 does not fail, the temperature of the electronic device 100 will remain near T1 for a period of time. However, if the short-circuit protection structure near the charging port 1001 fails, the temperature of the electronic device 100 will increase sharply for a period of time. For example, when the temperature of the electronic device 100 exceeds T2 (T2 is greater than T1), the electronic device 100 will burn out due to high temperature. Thus, the test host 5 can make a relatively accurate judgment on the reliability of the short-circuit protection of the charging port 1001 based on the charging current and temperature before and after the short circuit of the charging port 1001.

[0042] As can be seen from the above, the charging port short-circuit burn-out test device shown in this utility model, by configuring a charging power supply 1, an instrument 2, an ammeter 3, a temperature measuring element 4, and a test host 5, can use the charging power supply 1 to charge the electronic device 100. During the charging process, the instrument 2 adds test liquid to the charging port 1001 of the electronic device 100 to cause a short circuit in the charging port 1001. The ammeter 3 can detect the charging current of the electronic device 100 before and after the short circuit in the charging port 1001, and the temperature measuring element 4 can collect the temperature of the electronic device 100 before and after the short circuit in the charging port 1001. Then, the test host 5 analyzes the data detected by the ammeter 3 and the temperature measuring element 4 to make a relatively accurate judgment on the reliability of the short-circuit burn-out protection of the charging port 1001. This test operation is simple and convenient, realizing convenient short-circuit burn-out protection testing of the charging port 1001. It eliminates the need for testers to continuously observe the overall status of the electronic device 100 during the test, reducing the workload of testers and ensuring the accuracy of the test results.

[0043] It should be noted that the test host 5 in this embodiment can be a device capable of executing simple logic judgment programs, such as a laptop computer or an industrial control computer. The process of using the test host 5 to analyze the data detected by the ammeter 3 and the temperature measuring element 4 only involves comparing the data of the charging port 1001 before and after the short circuit, which is a conventional technical means in this field and does not involve any improvement to the method.

[0044] In some embodiments, such as Figure 1 As shown, the testing device also includes a test stand 6, which includes a placement platform 61 and a collection tank 62.

[0045] The placement platform 61 is used to place the electronic device 100, and the collection tank 62 is used to collect the test liquid flowing out from the placement platform 61.

[0046] Understandably, the collection tank 62 can be configured to face upwards. By collecting the test liquid flowing out of the placement platform 61 in a concentrated manner through the collection tank 62, the test liquid can be prevented from being scattered on the placement platform 61, effectively avoiding a messy test surface, which is conducive to building a user-friendly test environment and ensuring the quality of test results.

[0047] For example, a collection port for discharging test liquid can be provided on the placement platform 61, with the liquid outlet of the collection port extending into the collection tank 62.

[0048] Of course, a purging mechanism or a drainage structure can also be provided on the placement stage 61 to collect the test liquid on the placement stage 61 into the collection tank 62 based on the purging mechanism or drainage structure.

[0049] In some embodiments, such as Figure 1 and Figure 2As shown, the placement platform 61 includes: a body 611 having a flow guide slope 6101, on which an electronic device 100 is placed, and the lower end of the flow guide slope 6101 extends toward the collection tank 62.

[0050] It is understandable that the body 611 can be configured as a triangular structure, with the bottom surface of the body 611 placed on the ground or other horizontal foundation, and the side surface of the body 611 forming a flow guide slope 6101.

[0051] When the electronic device 100 is a scanning pen, the scanning pen can be set on the guiding slope 6101 along the extension direction of the guiding slope 6101, and the end of the scanning pen with the charging port 1001 is set upward so that the test liquid can be added to the charging port 1001 to cause the charging port 1001 to be short-circuited.

[0052] In practical applications, the collection tank 62 can be connected to the area of ​​the main body 611 corresponding to the lower end of the guide slope 6101 to ensure that the lower end of the guide slope 6101 extends into the collection tank 62. Thus, when the device 2 adds test liquid to the charging port 1001, a portion of the test liquid flows towards the area where the charging port 1001 is located, while the remaining portion that spills onto the guide slope 6101 flows along the guide slope 6101 under its own gravity and is finally collected in the collection tank 62.

[0053] Furthermore, a hydrophobic coating, such as a hydrophobic nanofilm, can be provided on the guide slope 6101. This design ensures that the test liquid dripping onto the hydrophobic coating can quickly roll into the collection tank 62.

[0054] In some embodiments, the angle of inclination of the guide slope 6101 relative to the horizontal plane is 30° to 60°. For example, the angle of inclination of the guide slope 6101 relative to the horizontal plane can be 30°, 45°, 60° and other suitable angles.

[0055] In some embodiments, such as Figure 2 As shown, in order to ensure that the electronic device 100 is reliably placed on the guide slope 6101 during the test, the placement platform 61 further includes a fixing member 612, which is connected to the body 611 to fix the electronic device 100 on the guide slope 6101.

[0056] For example, the fixing member 612 can be a pressure plate, which includes a first fixing section, a holding section, and a second fixing section. The first fixing section, the holding section, and the second fixing section are connected in sequence. The first fixing section and the second fixing section are detachably connected to the flow guiding slope 6101, and the holding section presses against the side of the electronic device 100 opposite to the flow guiding slope 6101. The holding section can be configured as a "U"-shaped structure adapted to the electronic device 100.

[0057] In some embodiments, the flow guide slope 6101 is provided with a positioning groove, which is configured to accommodate at least a portion of the electronic device 100 to position the electronic device 100 on the flow guide slope 6101.

[0058] It is understood that the positioning groove has a groove-shaped structure corresponding to the electronic device 100. By using the positioning groove to accommodate the electronic device 100, the electronic device 100 can be positioned on the guide slope 6101 without the need to use related accessories to fix the electronic device 100. The operation is simple and convenient.

[0059] For example, when the electronic device 100 is a smartphone, the positioning groove is a rectangular groove adapted to the smartphone; when the electronic device 100 is a scanning pen, the positioning groove is a strip-shaped groove adapted to the smartphone.

[0060] In some embodiments, in order to prevent the test liquid applied by the device 2 from escaping to the side of the placement platform 61, a first baffle and a second baffle can be provided on the flow guide slope 6101; the first baffle and the second baffle are spaced apart from each other and both extend toward the collection tank 62 along the extension direction of the flow guide slope 6101; wherein, the area between the first baffle and the second baffle of the flow guide slope 6101 is used to place the electronic device 100.

[0061] It is understood that this embodiment can utilize the blocking effect of the first and second baffles to ensure that the test liquid can only flow downward along the guide slope 6101 until it reaches the collection tank 62, and the test liquid will not flow to other areas of the placement platform 61.

[0062] In some embodiments, such as Figure 1 As shown, the device 2 includes a syringe, and the test solution injected into the charging port 1001 by the syringe is a NaCl solution.

[0063] Understandably, by configuring the device 2 as a syringe, it is convenient to apply the test liquid to the area where the charging port 1001 is located using the syringe; since the side of the syringe is usually provided with graduation lines, the amount of test liquid applied to the charging port 1001 each time can be precisely controlled by the syringe.

[0064] Meanwhile, using NaCl solution as the test solution facilitates the application of NaCl solution's good conductivity. When the NaCl solution is added to the area where the charging port 1001 is located, it causes the charging port 1001 to quickly short-circuit. Since the NaCl solution exhibits the best conductivity at a concentration of 24%, a 24% NaCl solution is preferred as the test solution.

[0065] In some embodiments, such as Figure 1As shown, the temperature measuring element 4 includes two infrared thermal imagers, which are arranged opposite each other on both sides of the electronic device 100 to detect the temperature of the front and back of the electronic device 100.

[0066] For example, two infrared thermal imagers can be fixedly mounted on both sides of the placement platform 61 using brackets or other mounting structures, with the detection end of one infrared thermal imager facing the front of the electronic device 100 and the detection end of the other infrared thermal imager facing the back of the electronic device 100.

[0067] The two infrared thermal imagers can be configured to be set horizontally opposite each other, and both infrared thermal imagers extend towards the charging port 1001 of the electronic device 100.

[0068] In some embodiments, such as Figure 1 As shown, in order to facilitate the testing personnel to intuitively observe the test data of the ammeter 3 and the temperature measuring element 4, the test host 5 has a display screen, which is used to display the data collected by the ammeter 3 and the temperature measuring element 4.

[0069] The test host 5 also includes a host, which is connected to the display screen. The ammeter 3 and the temperature measuring element 4 can be connected to the host via cables.

[0070] In some embodiments, the testing device further includes a housing and a door for controlling the opening and closing of the housing, with the charging power supply 1, ammeter 3, temperature measuring element 4 and test bench 6 respectively disposed inside the housing.

[0071] It is understandable that by placing the charging power supply 1, ammeter 3, temperature measuring element 4, and test bench 6 inside the enclosure, it is convenient to arrange the charging power supply 1, ammeter 3, temperature measuring element 4, and test bench 6 within the enclosure. Vias can be provided on the enclosure to allow for the routing of cables for communication between the test host 5 and the ammeter 3 and temperature measuring element 4.

[0072] In actual testing, the door can be opened first to add test fluid to the charging port 1001 through the device 2. Then, the door can be closed to ensure that the electronic device 100 under test is stored in the box to prevent accidental situations such as fire or explosion of the electronic device 100 during the test from affecting the test personnel.

[0073] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and not to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A charging port short-circuit burn-out prevention test device, characterized in that, include: The charging power supply is configured to be electrically connected to the charging port of the electronic device; An apparatus for adding test liquid to the charging port during charging of the electronic device to induce a short circuit in the charging port; A galvanometer is used to detect the charging current of the electronic device before and after the charging port is short-circuited. A temperature sensing element is used to collect the temperature of the electronic device before and after the charging port is short-circuited. The test host is communicatively connected to both the ammeter and the temperature measuring element.

2. The charging port short-circuit burn-out prevention test device according to claim 1, characterized in that, The testing apparatus further includes a test bench, which comprises: A placement platform for placing the electronic device; A collection tank for collecting the test liquid flowing out from the placement platform.

3. The charging port short-circuit burn-out prevention test device according to claim 2, characterized in that, The placement platform includes: The body has a flow-guiding slope for placing the electronic device, and the lower end of the flow-guiding slope extends into the collection groove.

4. The charging port short-circuit burn-out prevention test device according to claim 3, characterized in that, The angle of inclination of the guide slope relative to the horizontal plane is 30° to 60°.

5. The charging port short-circuit burn-out prevention test device according to claim 3, characterized in that, The placement platform also includes: A fastener is connected to the body to secure the electronic device to the flow guide slope.

6. The charging port short-circuit burn-out prevention test device according to claim 3, characterized in that, The flow guide slope is provided with a positioning groove, which is configured to accommodate at least a portion of the electronic device to position the electronic device on the flow guide slope.

7. The charging port short-circuit burn-out prevention test device according to claim 3, characterized in that, The guide slope is provided with a first baffle and a second baffle; The first and second baffles are spaced apart from each other and both extend toward the collection trough along the extending direction of the guide slope; The area between the first and second baffles, where the guide slope is used to place the electronic device.

8. The charging port short-circuit burn-out prevention test device according to any one of claims 1 to 7, characterized in that, The apparatus includes a syringe, and the test solution injected into the charging port by the syringe is a NaCl solution.

9. The charging port short-circuit burn-out protection test device according to any one of claims 1 to 7, characterized in that, The temperature sensing element includes: Two infrared thermal imagers are positioned opposite each other on both sides of the electronic device to detect the temperature of the front and back of the electronic device.

10. The charging port short-circuit burn-out protection test device according to any one of claims 1 to 7, characterized in that, The test host has a display screen, which is used to display the data collected by the ammeter and the temperature measuring element.

11. The charging port short-circuit burn-out prevention test device according to any one of claims 2 to 7, characterized in that, The testing device also includes a housing and a door for controlling the opening and closing of the housing. The charging power supply, the ammeter, the temperature measuring element and the test bench are respectively disposed inside the housing.

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